DE2804500C2 - Sperrschicht-Feldeffekttransistor - Google Patents
Sperrschicht-FeldeffekttransistorInfo
- Publication number
- DE2804500C2 DE2804500C2 DE2804500A DE2804500A DE2804500C2 DE 2804500 C2 DE2804500 C2 DE 2804500C2 DE 2804500 A DE2804500 A DE 2804500A DE 2804500 A DE2804500 A DE 2804500A DE 2804500 C2 DE2804500 C2 DE 2804500C2
- Authority
- DE
- Germany
- Prior art keywords
- zone
- current channel
- gate
- channel zone
- impurity concentration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H10W10/014—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
- H10D84/403—Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
- H10D84/406—Combinations of FETs or IGBTs with vertical BJTs and with one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
- H10D84/403—Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
- H10D84/409—Combinations of FETs or IGBTs with lateral BJTs and with one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/211—Design considerations for internal polarisation
- H10D89/213—Design considerations for internal polarisation in field-effect devices
- H10D89/217—Design considerations for internal polarisation in field-effect devices comprising arrangements for charge injection in static induction transistor logic [SITL] devices
-
- H10W10/0145—
-
- H10W10/041—
-
- H10W10/17—
-
- H10W10/40—
Landscapes
- Junction Field-Effect Transistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2858820A DE2858820C2 (de) | 1977-02-02 | 1978-02-02 | I·2·L-Schaltungsstruktur |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1046077A JPS5396681A (en) | 1977-02-02 | 1977-02-02 | Semiconductor ic |
| JP52015880A JPS5853517B2 (ja) | 1977-02-15 | 1977-02-15 | 半導体集積回路 |
| JP1732777A JPS53102661A (en) | 1977-02-18 | 1977-02-18 | Semiconductor ic |
| JP52019466A JPS5924549B2 (ja) | 1977-02-24 | 1977-02-24 | 半導体論理集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2804500A1 DE2804500A1 (de) | 1978-08-03 |
| DE2804500C2 true DE2804500C2 (de) | 1994-02-10 |
Family
ID=27455395
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2804500A Expired - Lifetime DE2804500C2 (de) | 1977-02-02 | 1978-02-02 | Sperrschicht-Feldeffekttransistor |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4608582A (esLanguage) |
| DE (1) | DE2804500C2 (esLanguage) |
| FR (1) | FR2379913A1 (esLanguage) |
| GB (1) | GB1600825A (esLanguage) |
| NL (1) | NL191525C (esLanguage) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL188061C (nl) * | 1977-05-15 | 1992-03-16 | Zaidan Hojin Handotai Kenkyu | Geintegreerde halfgeleiderinrichting. |
| FR2480505A1 (fr) * | 1980-04-14 | 1981-10-16 | Thomson Csf | Transistor a effet de champ a jonction de puissance a fonctionnement vertical et procede de fabrication |
| JPS59119848A (ja) * | 1982-12-27 | 1984-07-11 | Fujitsu Ltd | 半導体装置の製造方法 |
| IT1213171B (it) * | 1984-05-21 | 1989-12-14 | Ates Componenti Elettron | Transistore bipolare di potenza. |
| JP2578600B2 (ja) * | 1987-04-28 | 1997-02-05 | オリンパス光学工業株式会社 | 半導体装置 |
| US5066603A (en) * | 1989-09-06 | 1991-11-19 | Gte Laboratories Incorporated | Method of manufacturing static induction transistors |
| US5126830A (en) * | 1989-10-31 | 1992-06-30 | General Electric Company | Cryogenic semiconductor power devices |
| CA2056087C (en) * | 1990-11-27 | 1998-01-27 | Masakazu Morishita | Photoelectric converting device and information processing apparatus employing the same |
| JP2689057B2 (ja) * | 1992-09-16 | 1997-12-10 | 本田技研工業株式会社 | 静電誘導型半導体装置 |
| DE4423619A1 (de) | 1994-07-06 | 1996-01-11 | Bosch Gmbh Robert | Laterale Halbleiterstruktur zur Bildung einer temperaturkompensierten Spannungsbegrenzung |
| FR2969815B1 (fr) * | 2010-12-27 | 2013-11-22 | Soitec Silicon On Insulator Tech | Procédé de fabrication d'un dispositif semi-conducteur |
| KR20170097712A (ko) * | 2014-12-18 | 2017-08-28 | 라이프 테크놀로지스 코포레이션 | 대형 fet 어레이를 사용한 분석물 측정을 위한 방법과 장치 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US29971A (en) * | 1860-09-11 | Cotton-cleaner | ||
| US3409812A (en) * | 1965-11-12 | 1968-11-05 | Hughes Aircraft Co | Space-charge-limited current triode device |
| JPS526076B1 (esLanguage) * | 1971-04-28 | 1977-02-18 | ||
| JPS5217720B1 (esLanguage) * | 1971-07-31 | 1977-05-17 | ||
| USRE29971E (en) | 1971-07-31 | 1979-04-17 | Zaidan Hojin Hondotai Kenkyn Shinkokai | Field effect semiconductor device having an unsaturated triode vacuum tube characteristic |
| US3808515A (en) * | 1972-11-03 | 1974-04-30 | Bell Telephone Labor Inc | Chopper devices and circuits |
| JPS5811102B2 (ja) | 1975-12-09 | 1983-03-01 | ザイダンホウジン ハンドウタイケンキユウシンコウカイ | 半導体集積回路 |
| JPS608628B2 (ja) | 1976-07-05 | 1985-03-04 | ヤマハ株式会社 | 半導体集積回路装置 |
| US4115797A (en) * | 1976-10-04 | 1978-09-19 | Fairchild Camera And Instrument Corporation | Integrated injection logic with heavily doped injector base self-aligned with injector emitter and collector |
-
1978
- 1978-01-31 NL NL7801082A patent/NL191525C/xx not_active IP Right Cessation
- 1978-02-01 GB GB4100/78A patent/GB1600825A/en not_active Expired
- 1978-02-02 FR FR7802938A patent/FR2379913A1/fr active Granted
- 1978-02-02 DE DE2804500A patent/DE2804500C2/de not_active Expired - Lifetime
-
1983
- 1983-07-20 US US06/515,462 patent/US4608582A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4608582A (en) | 1986-08-26 |
| DE2804500A1 (de) | 1978-08-03 |
| NL191525C (nl) | 1995-08-21 |
| GB1600825A (en) | 1981-10-21 |
| FR2379913A1 (fr) | 1978-09-01 |
| NL7801082A (nl) | 1978-08-04 |
| NL191525B (nl) | 1995-04-18 |
| FR2379913B1 (esLanguage) | 1985-02-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OB | Request for examination as to novelty | ||
| OC | Search report available | ||
| 8110 | Request for examination paragraph 44 | ||
| 8172 | Supplementary division/partition in: |
Ref country code: DE Ref document number: 2858803 Format of ref document f/p: P |
|
| Q171 | Divided out to: |
Ref country code: DE Ref document number: 2858803 |
|
| 8172 | Supplementary division/partition in: |
Ref country code: DE Ref document number: 2858820 Format of ref document f/p: P |
|
| Q171 | Divided out to: |
Ref country code: DE Ref document number: 2858820 |
|
| AH | Division in |
Ref country code: DE Ref document number: 2858820 Format of ref document f/p: P |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| AH | Division in |
Ref country code: DE Ref document number: 2858820 Format of ref document f/p: P |