DE2648646A1 - Integrierte halbleiterschaltung - Google Patents

Integrierte halbleiterschaltung

Info

Publication number
DE2648646A1
DE2648646A1 DE19762648646 DE2648646A DE2648646A1 DE 2648646 A1 DE2648646 A1 DE 2648646A1 DE 19762648646 DE19762648646 DE 19762648646 DE 2648646 A DE2648646 A DE 2648646A DE 2648646 A1 DE2648646 A1 DE 2648646A1
Authority
DE
Germany
Prior art keywords
semiconductor
layer
voltage
aforementioned
semiconductor circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19762648646
Other languages
German (de)
English (en)
Other versions
DE2648646C2 (enExample
Inventor
Taketoshi Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Publication of DE2648646A1 publication Critical patent/DE2648646A1/de
Application granted granted Critical
Publication of DE2648646C2 publication Critical patent/DE2648646C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] 
    • H10D62/108—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]  having localised breakdown regions, e.g. built-in avalanching regions 
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/112—Constructional design considerations for preventing surface leakage or controlling electric field concentration for preventing surface leakage due to surface inversion layers, e.g. by using channel stoppers

Landscapes

  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Bipolar Transistors (AREA)
DE19762648646 1975-10-29 1976-10-27 Integrierte halbleiterschaltung Granted DE2648646A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50130240A JPS5267276A (en) 1975-10-29 1975-10-29 Manufacture of semiconductor unit

Publications (2)

Publication Number Publication Date
DE2648646A1 true DE2648646A1 (de) 1977-05-05
DE2648646C2 DE2648646C2 (enExample) 1988-01-21

Family

ID=15029463

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19762648646 Granted DE2648646A1 (de) 1975-10-29 1976-10-27 Integrierte halbleiterschaltung

Country Status (3)

Country Link
JP (1) JPS5267276A (enExample)
DE (1) DE2648646A1 (enExample)
GB (1) GB1564130A (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2052671A1 (de) * 1969-10-27 1971-05-27 Nippon Electric Co Integrierte Haltleiterschaltung
DE2352762A1 (de) * 1972-11-01 1974-05-16 Ibm Verfahren zur herstellung einer halbleiteranordnung mit komplementaeren feldeffekt-transistoren

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5056189A (enExample) * 1973-09-14 1975-05-16

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2052671A1 (de) * 1969-10-27 1971-05-27 Nippon Electric Co Integrierte Haltleiterschaltung
DE2352762A1 (de) * 1972-11-01 1974-05-16 Ibm Verfahren zur herstellung einer halbleiteranordnung mit komplementaeren feldeffekt-transistoren

Also Published As

Publication number Publication date
GB1564130A (en) 1980-04-02
JPS5267276A (en) 1977-06-03
DE2648646C2 (enExample) 1988-01-21

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Legal Events

Date Code Title Description
8127 New person/name/address of the applicant

Owner name: KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee