DE2555439C2 - Monolithische hochintegrierte Halbleiterschaltung - Google Patents

Monolithische hochintegrierte Halbleiterschaltung

Info

Publication number
DE2555439C2
DE2555439C2 DE2555439A DE2555439A DE2555439C2 DE 2555439 C2 DE2555439 C2 DE 2555439C2 DE 2555439 A DE2555439 A DE 2555439A DE 2555439 A DE2555439 A DE 2555439A DE 2555439 C2 DE2555439 C2 DE 2555439C2
Authority
DE
Germany
Prior art keywords
memory
register
address
semiconductor circuit
output signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2555439A
Other languages
German (de)
English (en)
Other versions
DE2555439A1 (de
Inventor
Joseph R. Cavaliere
Rocco Hopewell Junction N.Y. Robortaccio
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2555439A1 publication Critical patent/DE2555439A1/de
Application granted granted Critical
Publication of DE2555439C2 publication Critical patent/DE2555439C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/32—Serial access; Scan testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE2555439A 1974-12-20 1975-12-10 Monolithische hochintegrierte Halbleiterschaltung Expired DE2555439C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/534,608 US3961254A (en) 1974-12-20 1974-12-20 Testing embedded arrays

Publications (2)

Publication Number Publication Date
DE2555439A1 DE2555439A1 (de) 1976-06-24
DE2555439C2 true DE2555439C2 (de) 1982-10-21

Family

ID=24130797

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2555439A Expired DE2555439C2 (de) 1974-12-20 1975-12-10 Monolithische hochintegrierte Halbleiterschaltung

Country Status (4)

Country Link
US (1) US3961254A (enExample)
DE (1) DE2555439C2 (enExample)
FR (1) FR2295530A1 (enExample)
IT (1) IT1043513B (enExample)

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US4063080A (en) * 1976-06-30 1977-12-13 International Business Machines Corporation Method of propagation delay testing a level sensitive array logic system
JPS54121036A (en) * 1978-03-13 1979-09-19 Cho Lsi Gijutsu Kenkyu Kumiai Method of testing function of logic circuit
FR2432175A1 (fr) * 1978-07-27 1980-02-22 Cii Honeywell Bull Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
US4317200A (en) * 1978-10-20 1982-02-23 Vlsi Technology Research Association Method and device for testing a sequential circuit divided into a plurality of partitions
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
EP0028091B1 (en) * 1979-10-18 1983-05-11 Sperry Corporation Fault detection in integrated circuit chips and in circuit cards and systems including such chips
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
DE3030299A1 (de) 1980-08-09 1982-04-08 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
US4404519A (en) * 1980-12-10 1983-09-13 International Business Machine Company Testing embedded arrays in large scale integrated circuits
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4410987B1 (en) * 1981-07-13 1995-02-28 Texas Instruments Inc Preload test circuit for programmable logic arrays
US4808915A (en) * 1981-10-30 1989-02-28 Honeywell Bull, Inc. Assembly of electronic components testable by a reciprocal quiescent testing technique
US4481627A (en) * 1981-10-30 1984-11-06 Honeywell Information Systems Inc. Embedded memory testing method and apparatus
US4556840A (en) * 1981-10-30 1985-12-03 Honeywell Information Systems Inc. Method for testing electronic assemblies
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
DE3241412A1 (de) * 1982-11-09 1984-05-10 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zum testen eines hochintegrierten mikroprogramm-gesteuerten elektronischen bauteiles
DE3368770D1 (en) * 1982-11-20 1987-02-05 Int Computers Ltd Testing digital electronic circuits
US4527115A (en) * 1982-12-22 1985-07-02 Raytheon Company Configurable logic gate array
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
DE3686073T2 (de) * 1985-03-26 1993-01-07 Toshiba Kawasaki Kk Logischer schaltkreis.
GB8511188D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
GB8511187D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
US4726023A (en) * 1986-05-14 1988-02-16 International Business Machines Corporation Determination of testability of combined logic end memory by ignoring memory
KR880014482A (ko) * 1987-05-27 1988-12-24 미다 가쓰시게 반도체 집적회로 장치
US4853628A (en) * 1987-09-10 1989-08-01 Gazelle Microcircuits, Inc. Apparatus for measuring circuit parameters of a packaged semiconductor device
JP2521774B2 (ja) * 1987-10-02 1996-08-07 株式会社日立製作所 メモリ内蔵型論理ｌｓｉ及びそのｌｓｉの試験方法
US4841485A (en) * 1987-11-05 1989-06-20 International Business Machines Corporation Read/write memory device with an embedded read-only pattern and method for providing same
US4878209A (en) * 1988-03-17 1989-10-31 International Business Machines Corporation Macro performance test
US5189675A (en) * 1988-06-22 1993-02-23 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
US5392297A (en) * 1989-04-18 1995-02-21 Vlsi Technology, Inc. Method for automatic isolation of functional blocks within integrated circuits
JPH03211481A (ja) * 1990-01-17 1991-09-17 Nec Corp Ｌｓｉテスト回路
US5254940A (en) * 1990-12-13 1993-10-19 Lsi Logic Corporation Testable embedded microprocessor and method of testing same
JP3381929B2 (ja) * 1990-12-27 2003-03-04 株式会社東芝 半導体装置
US5271019A (en) * 1991-03-15 1993-12-14 Amdahl Corporation Scannable system with addressable scan reset groups
US5442640A (en) * 1993-01-19 1995-08-15 International Business Machines Corporation Test and diagnosis of associated output logic for products having embedded arrays
US5561607A (en) * 1993-10-12 1996-10-01 Harris Corporation Method of manufacture of multi-cell integrated circuit architecture
US5418470A (en) * 1993-10-22 1995-05-23 Tektronix, Inc. Analog multi-channel probe system
DE4425254A1 (de) * 1994-07-16 1996-01-18 Telefunken Microelectron Datenübertragungsverfahren in einem Echtzeitdatenverarbeitungssystem
GB9417297D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Method and apparatus for testing an integrated circuit device
GB9417266D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Testing a non-volatile memory
US5479127A (en) * 1994-11-10 1995-12-26 National Semiconductor Corporation Self-resetting bypass control for scan test
US5847561A (en) * 1994-12-16 1998-12-08 Texas Instruments Incorporated Low overhead input and output boundary scan cells
US5719879A (en) * 1995-12-21 1998-02-17 International Business Machines Corporation Scan-bypass architecture without additional external latches
US5760598A (en) * 1996-02-12 1998-06-02 International Business Machines Corporation Method and apparatus for testing quiescent current in integrated circuits
US5844921A (en) * 1996-02-28 1998-12-01 International Business Machines Corporation Method and apparatus for testing a hybrid circuit having macro and non-macro circuitry
US5835502A (en) * 1996-06-28 1998-11-10 International Business Machines Corporation Method and apparatus for handling variable data word widths and array depths in a serial shared abist scheme
US6260166B1 (en) * 1998-06-01 2001-07-10 Compaq Computer Corporation Observability register architecture for efficient production test and debug
US6088823A (en) * 1998-06-12 2000-07-11 Synopsys, Inc. Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuit
RU2178594C2 (ru) * 1999-11-12 2002-01-20 Закрытое акционерное общество "Фирма "Тэнси-техно" Способ записи в блок энергонезависимой памяти и устройство для его осуществления
FR2812948A1 (fr) * 2000-08-08 2002-02-15 Koninkl Philips Electronics Nv Procede pour tester un circuit integre a controle de cadencement flexible
US6795743B1 (en) 2000-09-18 2004-09-21 Dell Products L.P. Apparatus and method for electronically encoding an article with work-in-progress information
US6469949B1 (en) 2001-05-11 2002-10-22 International Business Machines Corp. Fuse latch array system for an embedded DRAM having a micro-cell architecture
US6971045B1 (en) * 2002-05-20 2005-11-29 Cyress Semiconductor Corp. Reducing tester channels for high pinout integrated circuits
JP3671948B2 (ja) * 2002-09-24 2005-07-13 ソニー株式会社 半導体集積回路とその試験方法

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Publication number Priority date Publication date Assignee Title
US3387276A (en) * 1965-08-13 1968-06-04 Sperry Rand Corp Off-line memory test
US3762027A (en) * 1970-05-18 1973-10-02 Reliable Electric Co Method of post-tensioning prestressed concrete
US3772595A (en) * 1971-03-19 1973-11-13 Teradyne Inc Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals
US3758761A (en) * 1971-08-17 1973-09-11 Texas Instruments Inc Self-interconnecting/self-repairable electronic systems on a slice
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US3781670A (en) * 1972-12-29 1973-12-25 Ibm Ac performance test for large scale integrated circuit chips

Also Published As

Publication number Publication date
DE2555439A1 (de) 1976-06-24
US3961254A (en) 1976-06-01
FR2295530A1 (fr) 1976-07-16
IT1043513B (it) 1980-02-29
FR2295530B1 (enExample) 1978-04-07

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Legal Events

Date Code Title Description
OD Request for examination
D2 Grant after examination
8339 Ceased/non-payment of the annual fee