DE102007024459A1 - Chemisch-mechanisches Polierkissen - Google Patents
Chemisch-mechanisches Polierkissen Download PDFInfo
- Publication number
- DE102007024459A1 DE102007024459A1 DE200710024459 DE102007024459A DE102007024459A1 DE 102007024459 A1 DE102007024459 A1 DE 102007024459A1 DE 200710024459 DE200710024459 DE 200710024459 DE 102007024459 A DE102007024459 A DE 102007024459A DE 102007024459 A1 DE102007024459 A1 DE 102007024459A1
- Authority
- DE
- Germany
- Prior art keywords
- polymeric
- polishing
- polishing pad
- polymeric matrix
- phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31551—Of polyamidoester [polyurethane, polyisocyanate, polycarbamate, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/442,077 US7445847B2 (en) | 2006-05-25 | 2006-05-25 | Chemical mechanical polishing pad |
| US11/442,077 | 2006-05-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102007024459A1 true DE102007024459A1 (de) | 2007-11-29 |
Family
ID=38622487
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE200710024459 Ceased DE102007024459A1 (de) | 2006-05-25 | 2007-05-25 | Chemisch-mechanisches Polierkissen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7445847B2 (https=) |
| JP (1) | JP5346446B2 (https=) |
| KR (1) | KR101360622B1 (https=) |
| CN (1) | CN100540225C (https=) |
| DE (1) | DE102007024459A1 (https=) |
| FR (1) | FR2901499B1 (https=) |
| TW (1) | TWI418443B (https=) |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101223016B (zh) * | 2005-07-15 | 2012-02-29 | 东洋橡胶工业株式会社 | 层叠片及其制造方法 |
| JP4884726B2 (ja) * | 2005-08-30 | 2012-02-29 | 東洋ゴム工業株式会社 | 積層研磨パッドの製造方法 |
| US20100009611A1 (en) * | 2006-09-08 | 2010-01-14 | Toyo Tire & Rubber Co., Ltd. | Method for manufacturing a polishing pad |
| KR100832106B1 (ko) * | 2006-12-05 | 2008-05-27 | 삼성전자주식회사 | 반도체 소자의 제조방법 |
| US8257153B2 (en) | 2007-01-15 | 2012-09-04 | Toyo Tire & Rubber Co., Ltd. | Polishing pad and a method for manufacturing the same |
| JP4593643B2 (ja) * | 2008-03-12 | 2010-12-08 | 東洋ゴム工業株式会社 | 研磨パッド |
| US20100035529A1 (en) * | 2008-08-05 | 2010-02-11 | Mary Jo Kulp | Chemical mechanical polishing pad |
| JP5846714B2 (ja) * | 2009-04-06 | 2016-01-20 | ニッタ・ハース株式会社 | 研磨パッド |
| US8697239B2 (en) * | 2009-07-24 | 2014-04-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multi-functional polishing pad |
| US8551201B2 (en) * | 2009-08-07 | 2013-10-08 | Praxair S.T. Technology, Inc. | Polyurethane composition for CMP pads and method of manufacturing same |
| US8822339B2 (en) | 2009-10-13 | 2014-09-02 | Lg Chem, Ltd. | Slurry composition for CMP, and polishing method |
| JP5606083B2 (ja) * | 2010-01-29 | 2014-10-15 | 日本発條株式会社 | 独泡ウレタンシート及びその製造方法 |
| US9156124B2 (en) * | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| EP2511236B1 (en) | 2011-04-14 | 2015-07-01 | Rohm and Haas Company | Improved quality multi-spectral zinc sulfide |
| JP5710353B2 (ja) * | 2011-04-15 | 2015-04-30 | 富士紡ホールディングス株式会社 | 研磨パッド及びその製造方法 |
| EP2634157B1 (en) | 2011-05-24 | 2016-08-10 | Rohm and Haas Company | Improved quality multi-spectral zinc sulfide |
| JP5373171B1 (ja) * | 2012-10-20 | 2013-12-18 | 株式会社ナノテム | 砥石およびそれを用いた研削・研磨装置 |
| US9199354B2 (en) | 2012-10-29 | 2015-12-01 | Wayne O. Duescher | Flexible diaphragm post-type floating and rigid abrading workholder |
| US9011207B2 (en) | 2012-10-29 | 2015-04-21 | Wayne O. Duescher | Flexible diaphragm combination floating and rigid abrading workholder |
| US8845394B2 (en) | 2012-10-29 | 2014-09-30 | Wayne O. Duescher | Bellows driven air floatation abrading workholder |
| US8998677B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Bellows driven floatation-type abrading workholder |
| US9604339B2 (en) | 2012-10-29 | 2017-03-28 | Wayne O. Duescher | Vacuum-grooved membrane wafer polishing workholder |
| US8998678B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Spider arm driven flexible chamber abrading workholder |
| US9039488B2 (en) | 2012-10-29 | 2015-05-26 | Wayne O. Duescher | Pin driven flexible chamber abrading workholder |
| US9233452B2 (en) | 2012-10-29 | 2016-01-12 | Wayne O. Duescher | Vacuum-grooved membrane abrasive polishing wafer workholder |
| JP6004966B2 (ja) * | 2013-02-22 | 2016-10-12 | 株式会社クラレ | 研磨パッドおよび研磨方法 |
| US20150306731A1 (en) * | 2014-04-25 | 2015-10-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad |
| US9649741B2 (en) * | 2014-07-07 | 2017-05-16 | Jh Rhodes Company, Inc. | Polishing material for polishing hard surfaces, media including the material, and methods of forming and using same |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10875145B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| KR20240015167A (ko) | 2014-10-17 | 2024-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성 |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US10399201B2 (en) | 2014-10-17 | 2019-09-03 | Applied Materials, Inc. | Advanced polishing pads having compositional gradients by use of an additive manufacturing process |
| SG11201707842PA (en) * | 2015-03-30 | 2017-10-30 | Nitta Haas Inc | Polishing pad |
| US9539694B1 (en) | 2015-06-26 | 2017-01-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Composite polishing layer chemical mechanical polishing pad |
| US9457449B1 (en) | 2015-06-26 | 2016-10-04 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with composite polishing layer |
| US9630293B2 (en) | 2015-06-26 | 2017-04-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad composite polishing layer formulation |
| WO2017019906A1 (en) * | 2015-07-30 | 2017-02-02 | Jh Rhodes Company, Inc. | Polymeric lapping materials, media and systems including polymeric lapping material, and methods of forming and using same |
| US9484212B1 (en) * | 2015-10-30 | 2016-11-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method |
| JP6940495B2 (ja) | 2015-10-30 | 2021-09-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US10086494B2 (en) | 2016-09-13 | 2018-10-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High planarization efficiency chemical mechanical polishing pads and methods of making |
| JP6389497B2 (ja) * | 2016-11-09 | 2018-09-12 | 株式会社Kri | 可撓性を有する透明耐熱フィルム |
| US20180304539A1 (en) | 2017-04-21 | 2018-10-25 | Applied Materials, Inc. | Energy delivery system with array of energy sources for an additive manufacturing apparatus |
| US10391606B2 (en) | 2017-06-06 | 2019-08-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads for improved removal rate and planarization |
| US10926378B2 (en) | 2017-07-08 | 2021-02-23 | Wayne O. Duescher | Abrasive coated disk islands using magnetic font sheet |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| US11072050B2 (en) | 2017-08-04 | 2021-07-27 | Applied Materials, Inc. | Polishing pad with window and manufacturing methods thereof |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| US10464187B2 (en) | 2017-12-01 | 2019-11-05 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High removal rate chemical mechanical polishing pads from amine initiated polyol containing curatives |
| WO2020050932A1 (en) | 2018-09-04 | 2020-03-12 | Applied Materials, Inc. | Formulations for advanced polishing pads |
| US11691241B1 (en) * | 2019-08-05 | 2023-07-04 | Keltech Engineering, Inc. | Abrasive lapping head with floating and rigid workpiece carrier |
| US11813712B2 (en) | 2019-12-20 | 2023-11-14 | Applied Materials, Inc. | Polishing pads having selectively arranged porosity |
| US11806829B2 (en) | 2020-06-19 | 2023-11-07 | Applied Materials, Inc. | Advanced polishing pads and related polishing pad manufacturing methods |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| JP7733464B2 (ja) * | 2021-03-30 | 2025-09-03 | 富士紡ホールディングス株式会社 | 研磨パッド及び研磨パッドの製造方法 |
| JP7587455B2 (ja) * | 2021-03-30 | 2024-11-20 | 富士紡ホールディングス株式会社 | 研磨パッド及び研磨パッドの製造方法 |
| WO2023034573A1 (en) | 2021-09-02 | 2023-03-09 | Cmc Materials, Inc. | Textured cmp pad comprising polymer particles |
| US11897082B2 (en) * | 2021-09-11 | 2024-02-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Heterogeneous fluoropolymer mixture polishing pad |
| US12544958B2 (en) * | 2022-06-02 | 2026-02-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of making low specific gravity polishing pads |
| US12528152B2 (en) | 2022-06-02 | 2026-01-20 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP pad having ultra expanded polymer microspheres |
| CN117020933B (zh) * | 2023-08-10 | 2025-10-31 | 安徽禾臣新材料有限公司 | 一种半导体抛光用白垫及其生产工艺 |
| US12610793B2 (en) * | 2023-09-21 | 2026-04-21 | Macronix International Co., Ltd. | Method of manufacturing memory device |
| CN119458143B (zh) * | 2024-10-11 | 2025-11-14 | 广东粤港澳大湾区黄埔材料研究院 | 一种用于SiC晶圆的粗抛垫及其制备方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3577386A (en) * | 1968-10-07 | 1971-05-04 | Minnesota Mining & Mfg | Product and process |
| JPS63283857A (ja) * | 1987-05-15 | 1988-11-21 | Asahi Chem Ind Co Ltd | 研磨布 |
| MY114512A (en) | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US5814409A (en) | 1994-05-10 | 1998-09-29 | Asahi Kasei Kogyo Kabushiki Kaisha | Expanded fluorine type resin products and a preparation process thereof |
| EP1015176B1 (en) * | 1997-04-04 | 2003-03-12 | Rodel Holdings, Inc. | Improved polishing pads and methods relating thereto |
| US6022268A (en) | 1998-04-03 | 2000-02-08 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
| US6682402B1 (en) | 1997-04-04 | 2004-01-27 | Rodel Holdings, Inc. | Polishing pads and methods relating thereto |
| US6648733B2 (en) * | 1997-04-04 | 2003-11-18 | Rodel Holdings, Inc. | Polishing pads and methods relating thereto |
| US7718102B2 (en) | 1998-06-02 | 2010-05-18 | Praxair S.T. Technology, Inc. | Froth and method of producing froth |
| US6514301B1 (en) | 1998-06-02 | 2003-02-04 | Peripheral Products Inc. | Foam semiconductor polishing belts and pads |
| US6022903A (en) | 1998-07-09 | 2000-02-08 | Arco Chemical Technology L.P. | Permanent gas blown microcellular polyurethane elastomers |
| US6095902A (en) * | 1998-09-23 | 2000-08-01 | Rodel Holdings, Inc. | Polyether-polyester polyurethane polishing pads and related methods |
| US6267644B1 (en) | 1998-11-06 | 2001-07-31 | Beaver Creek Concepts Inc | Fixed abrasive finishing element having aids finishing method |
| US6454634B1 (en) | 2000-05-27 | 2002-09-24 | Rodel Holdings Inc. | Polishing pads for chemical mechanical planarization |
| US6860802B1 (en) | 2000-05-27 | 2005-03-01 | Rohm And Haas Electric Materials Cmp Holdings, Inc. | Polishing pads for chemical mechanical planarization |
| US6736709B1 (en) | 2000-05-27 | 2004-05-18 | Rodel Holdings, Inc. | Grooved polishing pads for chemical mechanical planarization |
| US6641471B1 (en) * | 2000-09-19 | 2003-11-04 | Rodel Holdings, Inc | Polishing pad having an advantageous micro-texture and methods relating thereto |
| JP2002151447A (ja) * | 2000-11-13 | 2002-05-24 | Asahi Kasei Corp | 研磨パッド |
| JP4313761B2 (ja) * | 2002-11-18 | 2009-08-12 | ドン ソン エイ アンド ティ カンパニー リミテッド | 微細気孔が含まれたポリウレタン発泡体の製造方法及びそれから製造された研磨パッド |
| JP2004303280A (ja) | 2003-03-28 | 2004-10-28 | Hoya Corp | 情報記録媒体用ガラス基板の製造方法 |
| US7074115B2 (en) | 2003-10-09 | 2006-07-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad |
| SG111222A1 (en) * | 2003-10-09 | 2005-05-30 | Rohm & Haas Elect Mat | Polishing pad |
| US20050171224A1 (en) | 2004-02-03 | 2005-08-04 | Kulp Mary J. | Polyurethane polishing pad |
| JP4783553B2 (ja) * | 2004-02-18 | 2011-09-28 | 三井化学ポリウレタン株式会社 | ポリウレタン水性分散系の製造方法 |
| US7169030B1 (en) * | 2006-05-25 | 2007-01-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad |
-
2006
- 2006-05-25 US US11/442,077 patent/US7445847B2/en active Active
-
2007
- 2007-05-04 TW TW96115814A patent/TWI418443B/zh active
- 2007-05-23 KR KR1020070050490A patent/KR101360622B1/ko active Active
- 2007-05-25 JP JP2007138566A patent/JP5346446B2/ja active Active
- 2007-05-25 DE DE200710024459 patent/DE102007024459A1/de not_active Ceased
- 2007-05-25 CN CNB2007101092532A patent/CN100540225C/zh active Active
- 2007-05-25 FR FR0755268A patent/FR2901499B1/fr not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7445847B2 (en) | 2008-11-04 |
| TW200806431A (en) | 2008-02-01 |
| KR20070114019A (ko) | 2007-11-29 |
| KR101360622B1 (ko) | 2014-02-07 |
| CN100540225C (zh) | 2009-09-16 |
| US20070275226A1 (en) | 2007-11-29 |
| FR2901499A1 (fr) | 2007-11-30 |
| JP2007313641A (ja) | 2007-12-06 |
| JP5346446B2 (ja) | 2013-11-20 |
| FR2901499B1 (fr) | 2010-09-03 |
| CN101077570A (zh) | 2007-11-28 |
| TWI418443B (zh) | 2013-12-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |
Effective date: 20140320 |
|
| R002 | Refusal decision in examination/registration proceedings | ||
| R003 | Refusal decision now final |