DE06014164T1 - Vorrichtung und Verfahren zur Kompensation und Bereitstellung eines nachgiebigen Bereichs für einen Prüfkopf - Google Patents
Vorrichtung und Verfahren zur Kompensation und Bereitstellung eines nachgiebigen Bereichs für einen Prüfkopf Download PDFInfo
- Publication number
- DE06014164T1 DE06014164T1 DE06014164T DE06014164T DE06014164T1 DE 06014164 T1 DE06014164 T1 DE 06014164T1 DE 06014164 T DE06014164 T DE 06014164T DE 06014164 T DE06014164 T DE 06014164T DE 06014164 T1 DE06014164 T1 DE 06014164T1
- Authority
- DE
- Germany
- Prior art keywords
- load
- force
- lock
- latch
- following step
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Manipulator (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Supporting Of Heads In Record-Carrier Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Cable Accessories (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US23459800P | 2000-09-22 | 2000-09-22 | |
US234598P | 2000-09-22 | ||
US30122801P | 2001-06-27 | 2001-06-27 | |
US301228P | 2001-06-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE06014164T1 true DE06014164T1 (de) | 2007-06-06 |
Family
ID=26928107
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE06014164T Pending DE06014164T1 (de) | 2000-09-22 | 2001-09-20 | Vorrichtung und Verfahren zur Kompensation und Bereitstellung eines nachgiebigen Bereichs für einen Prüfkopf |
DE60122911T Expired - Lifetime DE60122911T2 (de) | 2000-09-22 | 2001-09-20 | Manipulator für einen testkopf mit aktiver nachgiebigkeit |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60122911T Expired - Lifetime DE60122911T2 (de) | 2000-09-22 | 2001-09-20 | Manipulator für einen testkopf mit aktiver nachgiebigkeit |
Country Status (12)
Country | Link |
---|---|
US (2) | US7084358B2 (fr) |
EP (1) | EP1322965B1 (fr) |
JP (1) | JP2004523729A (fr) |
KR (1) | KR20030043966A (fr) |
CN (2) | CN101788643A (fr) |
AT (1) | ATE338952T1 (fr) |
AU (1) | AU2001291171A1 (fr) |
DE (2) | DE06014164T1 (fr) |
HK (1) | HK1095884A1 (fr) |
MY (2) | MY127154A (fr) |
TW (1) | TW515893B (fr) |
WO (1) | WO2002025292A2 (fr) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100383534C (zh) * | 2002-10-02 | 2008-04-23 | 因泰斯特Ip公司 | 测试头定位装置 |
US7235964B2 (en) | 2003-03-31 | 2007-06-26 | Intest Corporation | Test head positioning system and method |
EP1947466B1 (fr) * | 2003-08-06 | 2012-07-04 | inTEST Corporation | Système de positionnement de la tête de test |
SG137846A1 (en) * | 2003-08-06 | 2007-12-28 | Intest Corp | Test head positioning system |
DE102004018474A1 (de) * | 2004-04-16 | 2005-11-10 | Esmo Ag | Manipulator |
US7913971B2 (en) * | 2005-04-29 | 2011-03-29 | Cameron International Corporation | Hydraulic override |
US20070099555A1 (en) * | 2005-11-03 | 2007-05-03 | Beauchamp Dale A | Pneumatic animal confinement house air inlet actuation system and method |
DE102005057508B4 (de) * | 2005-12-01 | 2011-11-17 | Multitest Elektronische Systeme Gmbh | Dockingvorrichtung zum Kuppeln einer Handhabungsvorrichtung mit einem Testkopf für elektronische Bauelemente |
US7598725B2 (en) * | 2005-12-30 | 2009-10-06 | Teradyne, Inc. | Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head |
TWI490513B (zh) * | 2006-12-29 | 2015-07-01 | Intest Corp | 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法 |
WO2008085463A1 (fr) * | 2006-12-29 | 2008-07-17 | In Test Corporation | Système et procédé de positionnement de tête d'essai |
US9889239B2 (en) | 2007-03-23 | 2018-02-13 | Allegiance Corporation | Fluid collection and disposal system and related methods |
CN101765465A (zh) | 2007-03-23 | 2010-06-30 | 忠诚股份有限公司 | 流体收集和处理系统及相关方法 |
US8460256B2 (en) * | 2009-07-15 | 2013-06-11 | Allegiance Corporation | Collapsible fluid collection and disposal system and related methods |
JP5427343B2 (ja) * | 2007-04-20 | 2014-02-26 | 任天堂株式会社 | ゲームコントローラ |
EP2150823A4 (fr) * | 2007-05-07 | 2016-12-21 | Intest Corp | Arceau et système de manipulation de câble pour un manipulateur de tête d'essai |
US7602562B2 (en) | 2007-05-21 | 2009-10-13 | Electro Scientific Industries, Inc. | Fluid counterbalance for a laser lens used to scribe an electronic component substrate |
FR2931451B1 (fr) * | 2008-05-22 | 2010-12-17 | Fmc Technologies Sa | Dispositif de commande pour systeme de chargement et/ou dechargement de fluides |
CN101987448B (zh) * | 2009-08-07 | 2012-09-05 | 坤霖精密有限公司 | 自动送料机的改进型输送臂超负荷机构 |
US8408082B2 (en) * | 2009-11-18 | 2013-04-02 | General Electric Company | Apparatus to measure fluids in a conduit |
EP2732298A1 (fr) | 2011-07-12 | 2014-05-21 | Intest Corporation | Procédé et appareil pour connecter une tête d'essai à un périphérique |
JP5221719B2 (ja) * | 2011-08-18 | 2013-06-26 | ファナック株式会社 | エアバランスを利用して退避動作を行う位置決め装置 |
DE102014207457A1 (de) | 2014-04-08 | 2015-10-08 | Siemens Aktiengesellschaft | Anordnung, Prüfstand und Verfahren zur Prüfung eines Weichenantriebs |
US9454911B2 (en) * | 2014-07-30 | 2016-09-27 | The Boeing Company | Flight control test simulator system and method |
US9506961B2 (en) | 2014-12-04 | 2016-11-29 | Chicony Power Technology Co., Ltd. | Power supply detection apparatus and detecting method thereof |
US10094854B2 (en) * | 2015-10-23 | 2018-10-09 | Teradyne, Inc. | Manipulator in automatic test equipment |
JP7199374B2 (ja) * | 2017-04-19 | 2023-01-05 | レニショウ パブリック リミテッド カンパニー | 位置決め装置 |
CN108226647B (zh) * | 2018-04-13 | 2024-05-24 | 南方电网科学研究院有限责任公司 | 一种对电力线接入点阻抗的测量装置 |
CN108548685B (zh) * | 2018-04-26 | 2024-08-06 | 广东产品质量监督检验研究院(国家质量技术监督局广州电气安全检验所、广东省试验认证研究院、华安实验室) | 基于机器人静态柔顺性测试装置的三轴六向测试加载方法 |
FR3080880B1 (fr) * | 2018-05-04 | 2020-09-04 | Safran Landing Systems | Dispositif de verrouillage a verrou rotatif a commande impulsionnelle |
KR102202035B1 (ko) * | 2020-09-03 | 2021-01-12 | 주식회사 프로이천 | 오토 프로브장치 |
TWI737558B (zh) * | 2020-12-25 | 2021-08-21 | 致茂電子股份有限公司 | 可自主補償測試頭與待測件間接觸界面平整度之電子元件檢測設備 |
US11498207B2 (en) | 2021-01-08 | 2022-11-15 | Teradyne, Inc. | Test head manipulator configured to address uncontrolled test head rotation |
CN114325325B (zh) * | 2021-12-29 | 2023-12-01 | 日月新半导体(昆山)有限公司 | 用于测试集成电路产品的装置 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5149029A (en) * | 1982-08-25 | 1992-09-22 | Intest Corporation | Electronic test head positioner for test systems |
US4527942A (en) * | 1982-08-25 | 1985-07-09 | Intest Corporation | Electronic test head positioner for test systems |
US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
JPS61197079A (ja) * | 1985-02-28 | 1986-09-01 | Toyota Motor Corp | 耐チツピング性塗膜及びその形成方法 |
US4696197A (en) | 1986-04-11 | 1987-09-29 | Lockheed Corporation | System for counterbalancing tool mount loads in a machine tool |
JP2578084B2 (ja) * | 1986-11-25 | 1997-02-05 | 東京エレクトロン株式会社 | ウエハプローバ |
JP2514820B2 (ja) * | 1986-11-25 | 1996-07-10 | 東京エレクトロン 株式会社 | ウエハプロ−バ |
US4893047A (en) * | 1988-09-20 | 1990-01-09 | Honda Electronic Co., Ltd. | Ultrasonic driving device |
JPH0785921B2 (ja) * | 1991-07-15 | 1995-09-20 | 徳寿工業株式会社 | 被覆用断熱シート |
JP2967798B2 (ja) * | 1993-12-16 | 1999-10-25 | 株式会社東京精密 | ウエハプローバ |
US5606262A (en) * | 1995-06-07 | 1997-02-25 | Teradyne, Inc. | Manipulator for automatic test equipment test head |
CN2279238Y (zh) * | 1996-10-17 | 1998-04-22 | 华南理工大学 | 封闭电流式开放功率型齿轮传动实验台 |
US6006616A (en) * | 1997-07-11 | 1999-12-28 | Credence Systems Corporation | Semiconductor tester with power assist for vertical test head movement |
US6271657B1 (en) * | 1997-07-25 | 2001-08-07 | Advantest Corporation | Test head positioner for semiconductor device testing apparatus |
US5949002A (en) | 1997-11-12 | 1999-09-07 | Teradyne, Inc. | Manipulator for automatic test equipment with active compliance |
MY144519A (en) * | 2000-03-01 | 2011-09-30 | Intest Corp | Vertical counter balanced test head manipulator |
CN100383534C (zh) * | 2002-10-02 | 2008-04-23 | 因泰斯特Ip公司 | 测试头定位装置 |
-
2001
- 2001-09-19 MY MYPI20014373 patent/MY127154A/en unknown
- 2001-09-19 MY MYPI20063779A patent/MY147595A/en unknown
- 2001-09-20 AT AT01971267T patent/ATE338952T1/de not_active IP Right Cessation
- 2001-09-20 US US10/381,322 patent/US7084358B2/en not_active Expired - Lifetime
- 2001-09-20 DE DE06014164T patent/DE06014164T1/de active Pending
- 2001-09-20 CN CN200910252632A patent/CN101788643A/zh active Pending
- 2001-09-20 KR KR10-2003-7004189A patent/KR20030043966A/ko not_active Application Discontinuation
- 2001-09-20 JP JP2002528839A patent/JP2004523729A/ja active Pending
- 2001-09-20 EP EP01971267A patent/EP1322965B1/fr not_active Expired - Lifetime
- 2001-09-20 CN CNB018192637A patent/CN1306277C/zh not_active Expired - Fee Related
- 2001-09-20 WO PCT/US2001/029530 patent/WO2002025292A2/fr active IP Right Grant
- 2001-09-20 AU AU2001291171A patent/AU2001291171A1/en not_active Abandoned
- 2001-09-20 DE DE60122911T patent/DE60122911T2/de not_active Expired - Lifetime
- 2001-09-21 TW TW090123368A patent/TW515893B/zh not_active IP Right Cessation
-
2006
- 2006-03-15 US US11/376,584 patent/US7340972B2/en not_active Expired - Lifetime
-
2007
- 2007-04-03 HK HK07103581.2A patent/HK1095884A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
AU2001291171A1 (en) | 2002-04-02 |
CN1484767A (zh) | 2004-03-24 |
EP1322965B1 (fr) | 2006-09-06 |
WO2002025292A2 (fr) | 2002-03-28 |
EP1322965A2 (fr) | 2003-07-02 |
US7084358B2 (en) | 2006-08-01 |
US20050020402A1 (en) | 2005-01-27 |
CN101788643A (zh) | 2010-07-28 |
DE60122911T2 (de) | 2007-02-22 |
ATE338952T1 (de) | 2006-09-15 |
CN1306277C (zh) | 2007-03-21 |
US20060156836A1 (en) | 2006-07-20 |
WO2002025292A3 (fr) | 2002-10-03 |
MY127154A (en) | 2006-11-30 |
US7340972B2 (en) | 2008-03-11 |
WO2002025292B1 (fr) | 2003-02-20 |
MY147595A (en) | 2012-12-31 |
JP2004523729A (ja) | 2004-08-05 |
TW515893B (en) | 2003-01-01 |
DE60122911D1 (de) | 2006-10-19 |
HK1095884A1 (en) | 2007-05-18 |
KR20030043966A (ko) | 2003-06-02 |
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