CN1341964A - 集成电磁屏蔽装置 - Google Patents
集成电磁屏蔽装置 Download PDFInfo
- Publication number
- CN1341964A CN1341964A CN01135759A CN01135759A CN1341964A CN 1341964 A CN1341964 A CN 1341964A CN 01135759 A CN01135759 A CN 01135759A CN 01135759 A CN01135759 A CN 01135759A CN 1341964 A CN1341964 A CN 1341964A
- Authority
- CN
- China
- Prior art keywords
- substrate
- spacer assembly
- separator
- electric
- path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims abstract description 76
- 239000004020 conductor Substances 0.000 claims abstract description 66
- 239000004065 semiconductor Substances 0.000 claims abstract description 13
- 125000006850 spacer group Chemical group 0.000 claims description 21
- 230000004888 barrier function Effects 0.000 claims description 11
- 239000011810 insulating material Substances 0.000 claims description 8
- 238000009413 insulation Methods 0.000 claims description 8
- 230000015572 biosynthetic process Effects 0.000 claims description 7
- 238000000926 separation method Methods 0.000 claims description 3
- 238000002955 isolation Methods 0.000 abstract description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 35
- 239000000377 silicon dioxide Substances 0.000 description 17
- 235000012239 silicon dioxide Nutrition 0.000 description 15
- 239000000463 material Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 229920005591 polysilicon Polymers 0.000 description 3
- 230000000644 propagated effect Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5222—Capacitive arrangements or effects of, or between wiring layers
- H01L23/5225—Shielding layers formed together with wiring layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0007—Casings
- H05K9/002—Casings with localised screening
- H05K9/0039—Galvanic coupling of ground layer on printed circuit board [PCB] to conductive casing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/58—Structural electrical arrangements for semiconductor devices not otherwise provided for
- H01L2223/64—Impedance arrangements
- H01L2223/66—High-frequency adaptations
- H01L2223/6605—High-frequency electrical connections
- H01L2223/6616—Vertical connections, e.g. vias
- H01L2223/6622—Coaxial feed-throughs in active or passive substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Element Separation (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0011307 | 2000-09-05 | ||
FR00/11307 | 2000-09-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1341964A true CN1341964A (zh) | 2002-03-27 |
CN100565869C CN100565869C (zh) | 2009-12-02 |
Family
ID=8853987
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB011357592A Expired - Lifetime CN100565869C (zh) | 2000-09-05 | 2001-09-01 | 集成电磁屏蔽装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7030455B2 (zh) |
EP (1) | EP1187206B1 (zh) |
JP (1) | JP2002093810A (zh) |
KR (1) | KR100867457B1 (zh) |
CN (1) | CN100565869C (zh) |
DE (1) | DE60140722D1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7566971B2 (en) | 2005-05-27 | 2009-07-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE0200715D0 (sv) * | 2001-12-14 | 2002-03-11 | Optillion Ab | Feedthrough Interconnection Assembly |
DE10309614A1 (de) * | 2003-03-05 | 2004-09-23 | Infineon Technologies Ag | Halbleiterstruktur und Verfahren zur Herstellung derselben |
US7186924B2 (en) * | 2003-10-21 | 2007-03-06 | International Business Machines Corporation | Dielectric structure for printed circuit board traces |
ATE388520T1 (de) * | 2004-05-06 | 2008-03-15 | Nxp Bv | Elektronische einrichtung |
TWI294681B (en) * | 2006-01-25 | 2008-03-11 | Ind Tech Res Inst | Image ground shielding structure |
DE102006022360B4 (de) | 2006-05-12 | 2009-07-09 | Infineon Technologies Ag | Abschirmvorrichtung |
DE102006062844B4 (de) * | 2006-05-12 | 2016-11-17 | Infineon Technologies Ag | Abschirmvorrichtung zum Abschirmen von elektromagnetischer Strahlung |
US7609125B2 (en) * | 2006-10-13 | 2009-10-27 | Avago Technologies Enterprise IP (Singapore) Pte. Ltd. | System, device and method for reducing cross-talk in differential signal conductor pairs |
KR100898247B1 (ko) | 2007-10-24 | 2009-05-18 | 주식회사 동부하이텍 | 반도체형 rf소자 |
US8106474B2 (en) * | 2008-04-18 | 2012-01-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2010106839A1 (ja) * | 2009-03-19 | 2010-09-23 | 株式会社村田製作所 | 回路基板及びマザー積層体 |
KR101361058B1 (ko) * | 2009-12-09 | 2014-02-12 | 한국전자통신연구원 | 광 소자를 포함하는 반도체 장치의 형성 방법 |
US9318785B2 (en) | 2011-09-29 | 2016-04-19 | Broadcom Corporation | Apparatus for reconfiguring an integrated waveguide |
US8508029B2 (en) * | 2011-09-29 | 2013-08-13 | Broadcom Corporation | Semiconductor package including an integrated waveguide |
US8670638B2 (en) | 2011-09-29 | 2014-03-11 | Broadcom Corporation | Signal distribution and radiation in a wireless enabled integrated circuit (IC) using a leaky waveguide |
US9075105B2 (en) | 2011-09-29 | 2015-07-07 | Broadcom Corporation | Passive probing of various locations in a wireless enabled integrated circuit (IC) |
US9570420B2 (en) | 2011-09-29 | 2017-02-14 | Broadcom Corporation | Wireless communicating among vertically arranged integrated circuits (ICs) in a semiconductor package |
TWI528525B (zh) * | 2013-09-03 | 2016-04-01 | 瑞昱半導體股份有限公司 | 金屬溝渠減噪結構及其製造方法 |
US10939541B2 (en) * | 2017-03-31 | 2021-03-02 | Huawei Technologies Co., Ltd. | Shield structure for a low crosstalk single ended clock distribution circuit |
KR102672313B1 (ko) * | 2022-07-08 | 2024-06-05 | 한국전자통신연구원 | 전자파 간섭 제거 기능을 갖는 수광 소자 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4608590A (en) * | 1978-12-20 | 1986-08-26 | At&T Bell Laboratories | High voltage dielectrically isolated solid-state switch |
US4956688A (en) * | 1984-10-29 | 1990-09-11 | Hitachi, Ltd. | Radiation resistant bipolar memory |
US4954929A (en) * | 1989-08-22 | 1990-09-04 | Ast Research, Inc. | Multi-layer circuit board that suppresses radio frequency interference from high frequency signals |
JPH03165058A (ja) | 1989-11-24 | 1991-07-17 | Mitsubishi Electric Corp | 半導体装置 |
DE9214898U1 (de) * | 1991-11-07 | 1992-12-17 | Siemens AG, 8000 München | Steuergerät |
US5262353A (en) * | 1992-02-03 | 1993-11-16 | Motorola, Inc. | Process for forming a structure which electrically shields conductors |
US5196920A (en) * | 1992-04-21 | 1993-03-23 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor integrated circuit device for limiting capacitive coupling between adjacent circuit blocks |
JP3283984B2 (ja) * | 1993-12-28 | 2002-05-20 | 株式会社東芝 | 半導体集積回路装置 |
US5631491A (en) * | 1994-09-27 | 1997-05-20 | Fuji Electric Co., Ltd. | Lateral semiconductor device and method of fixing potential of the same |
KR0175000B1 (ko) | 1994-12-14 | 1999-02-01 | 윤종용 | 전자파 억제구조를 갖는 반도체 소자 |
US5859466A (en) * | 1995-06-07 | 1999-01-12 | Nippon Steel Semiconductor Corporation | Semiconductor device having a field-shield device isolation structure and method for making thereof |
AU2187397A (en) * | 1996-03-22 | 1997-10-10 | Telefonaktiebolaget Lm Ericsson (Publ) | Semiconductor device shielded by an array of electrically conducting pins and a method to manufacture such a device |
US5994765A (en) * | 1996-07-01 | 1999-11-30 | Sun Microsystems, Inc. | Clock distribution network with efficient shielding |
US5780340A (en) * | 1996-10-30 | 1998-07-14 | Advanced Micro Devices, Inc. | Method of forming trench transistor and isolation trench |
US6157065A (en) * | 1999-01-14 | 2000-12-05 | United Microelectronics Corp. | Electrostatic discharge protective circuit under conductive pad |
US6075700A (en) * | 1999-02-02 | 2000-06-13 | Compaq Computer Corporation | Method and system for controlling radio frequency radiation in microelectronic packages using heat dissipation structures |
-
2001
- 2001-08-28 DE DE60140722T patent/DE60140722D1/de not_active Expired - Lifetime
- 2001-08-28 EP EP01203251A patent/EP1187206B1/fr not_active Expired - Lifetime
- 2001-09-01 CN CNB011357592A patent/CN100565869C/zh not_active Expired - Lifetime
- 2001-09-04 KR KR1020010054182A patent/KR100867457B1/ko not_active IP Right Cessation
- 2001-09-05 US US09/946,715 patent/US7030455B2/en not_active Expired - Lifetime
- 2001-09-05 JP JP2001268493A patent/JP2002093810A/ja not_active Withdrawn
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7566971B2 (en) | 2005-05-27 | 2009-07-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US7919861B2 (en) | 2005-05-27 | 2011-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
CN1870261B (zh) * | 2005-05-27 | 2013-11-20 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
DE60140722D1 (de) | 2010-01-21 |
CN100565869C (zh) | 2009-12-02 |
JP2002093810A (ja) | 2002-03-29 |
KR100867457B1 (ko) | 2008-11-06 |
EP1187206B1 (fr) | 2009-12-09 |
US20020074605A1 (en) | 2002-06-20 |
KR20020019413A (ko) | 2002-03-12 |
US7030455B2 (en) | 2006-04-18 |
EP1187206A1 (fr) | 2002-03-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: ROYAL PHILIPS ELECTRONICS CO., LTD. Effective date: 20071026 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20071026 Address after: Holland Ian Deho Finn Applicant after: Koninkl Philips Electronics NV Address before: Holland Ian Deho Finn Applicant before: Koninklike Philips Electronics N. V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20190715 Address after: Room 630, Haiheng Building, 6 Cuiwei Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee after: Changxin Storage Technology Co., Ltd. Address before: Holland Ian Deho Finn Patentee before: Koninkl Philips Electronics NV |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20091202 |