CN1286116C - 通过双向电流写入数据的薄膜磁体存储装置 - Google Patents

通过双向电流写入数据的薄膜磁体存储装置 Download PDF

Info

Publication number
CN1286116C
CN1286116C CNB021593892A CN02159389A CN1286116C CN 1286116 C CN1286116 C CN 1286116C CN B021593892 A CNB021593892 A CN B021593892A CN 02159389 A CN02159389 A CN 02159389A CN 1286116 C CN1286116 C CN 1286116C
Authority
CN
China
Prior art keywords
mentioned
data
write
node
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB021593892A
Other languages
English (en)
Chinese (zh)
Other versions
CN1430226A (zh
Inventor
日高秀人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of CN1430226A publication Critical patent/CN1430226A/zh
Application granted granted Critical
Publication of CN1286116C publication Critical patent/CN1286116C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1653Address circuits or decoders
    • G11C11/1655Bit-line or column circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1659Cell access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1675Writing or programming circuits or methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)
CNB021593892A 2001-12-26 2002-12-26 通过双向电流写入数据的薄膜磁体存储装置 Expired - Fee Related CN1286116C (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP394285/01 2001-12-26
JP2001394285 2001-12-26
JP394285/2001 2001-12-26
JP2002288755A JP4262954B2 (ja) 2001-12-26 2002-10-01 薄膜磁性体記憶装置
JP288755/02 2002-10-01
JP288755/2002 2002-10-01

Publications (2)

Publication Number Publication Date
CN1430226A CN1430226A (zh) 2003-07-16
CN1286116C true CN1286116C (zh) 2006-11-22

Family

ID=26625287

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB021593892A Expired - Fee Related CN1286116C (zh) 2001-12-26 2002-12-26 通过双向电流写入数据的薄膜磁体存储装置

Country Status (5)

Country Link
JP (1) JP4262954B2 (de)
KR (1) KR100518644B1 (de)
CN (1) CN1286116C (de)
DE (1) DE10260344B4 (de)
TW (1) TW578150B (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100568542B1 (ko) * 2004-08-19 2006-04-07 삼성전자주식회사 자기 램 소자의 기록방법
US7508702B2 (en) * 2007-04-17 2009-03-24 Macronix International Co., Ltd. Programming method of magnetic random access memory
JP2010040658A (ja) * 2008-08-01 2010-02-18 Renesas Technology Corp 不揮発性半導体記憶装置
WO2011055420A1 (ja) * 2009-11-04 2011-05-12 ルネサスエレクトロニクス株式会社 半導体装置
JP2013222285A (ja) * 2012-04-16 2013-10-28 Fujitsu Semiconductor Ltd バス回路および半導体装置
JP2018147530A (ja) * 2017-03-03 2018-09-20 東芝メモリ株式会社 半導体記憶装置
CN116209252B (zh) * 2022-09-23 2024-02-23 北京超弦存储器研究院 存储单元、动态存储器、其读取方法及电子设备
CN116209253B (zh) * 2022-09-23 2024-02-20 北京超弦存储器研究院 存储单元、动态存储器、其读取方法及电子设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6256224B1 (en) * 2000-05-03 2001-07-03 Hewlett-Packard Co Write circuit for large MRAM arrays
JP2002170377A (ja) * 2000-09-22 2002-06-14 Mitsubishi Electric Corp 薄膜磁性体記憶装置
JP5019681B2 (ja) * 2001-04-26 2012-09-05 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP4780878B2 (ja) * 2001-08-02 2011-09-28 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置

Also Published As

Publication number Publication date
JP4262954B2 (ja) 2009-05-13
JP2003257176A (ja) 2003-09-12
KR20030055167A (ko) 2003-07-02
CN1430226A (zh) 2003-07-16
DE10260344B4 (de) 2006-06-14
TW200301480A (en) 2003-07-01
KR100518644B1 (ko) 2005-10-05
TW578150B (en) 2004-03-01
DE10260344A1 (de) 2003-07-17

Similar Documents

Publication Publication Date Title
CN1213435C (zh) 利用电阻值的变化来存储数据的数据读出容限大的存储装置
CN1419241A (zh) 通过双向数据写入磁场实施数据写入的薄膜磁体存储装置
CN1231917C (zh) 可进行稳定的数据读出和数据写入的薄膜磁性体存储器
CN1263040C (zh) 通过磁场的施加进行数据写入的薄膜磁性体存储装置
CN1241204C (zh) 具有数据读出电流调节功能的薄膜磁性体存储器
CN1207718C (zh) 容易控制数据写入电流的薄膜磁性体存储器
CN1276436C (zh) 在多个存储单元间共有存取元件的薄膜磁性体存储器
CN1210718C (zh) 具备高集成化的存储器阵列的薄膜磁性体存储器
CN100338682C (zh) 非易失性存储器和半导体集成电路器件
CN1402254A (zh) 具有含磁隧道结的存储器单元的薄膜磁存储装置
CN1199186C (zh) 备有具有磁隧道接合部的存储单元的薄膜磁性体存储装置
CN1186780C (zh) 高速且稳定地进行数据读出工作的薄膜磁性体存储器
CN1310253C (zh) 磁随机存取存储器及其制造方法
CN1448943A (zh) 磁存储装置
CN1295708C (zh) 具有高精度的数据读出结构的薄膜磁体存储装置
CN1448944A (zh) 设有数据读出参照用伪单元的薄膜磁性体存储装置
CN1428786A (zh) 磁随机存取存储器及其制造方法
CN1305140C (zh) 磁性随机防问存储器及其数据读取方法
CN1490818A (zh) 薄膜磁性体存储器及与之相关的半导体集成电路器件
CN1610001A (zh) 具有磁阻元件的半导体存储器件及其数据写入方法
CN1956207A (zh) 自旋注入磁随机存取存储器
CN1495798A (zh) 适合于超高速缓冲存储器的非易失性存储器
CN1419242A (zh) 薄膜磁性体存储器及其信息编程方法
CN1505038A (zh) 实现冗长置换且可高速读出的存储装置
CN1263041C (zh) 并行处理数据读出与写入的薄膜磁性体存储器

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Owner name: RENESAS ELECTRONICS CORPORATION

Free format text: FORMER OWNER: MISSUBISHI ELECTRIC CORP.

Effective date: 20140416

C41 Transfer of patent application or patent right or utility model
TR01 Transfer of patent right

Effective date of registration: 20140416

Address after: Kawasaki, Kanagawa, Japan

Patentee after: Renesas Electronics Corporation

Address before: Tokyo, Japan, Japan

Patentee before: Missubishi Electric Co., Ltd.

CP02 Change in the address of a patent holder

Address after: Tokyo, Japan, Japan

Patentee after: Renesas Electronics Corporation

Address before: Kawasaki, Kanagawa, Japan

Patentee before: Renesas Electronics Corporation

CP02 Change in the address of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20061122

Termination date: 20181226

CF01 Termination of patent right due to non-payment of annual fee