CN1207533C - 计测仪检查用计测校准器的设定装置 - Google Patents

计测仪检查用计测校准器的设定装置 Download PDF

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Publication number
CN1207533C
CN1207533C CNB018000290A CN01800029A CN1207533C CN 1207533 C CN1207533 C CN 1207533C CN B018000290 A CNB018000290 A CN B018000290A CN 01800029 A CN01800029 A CN 01800029A CN 1207533 C CN1207533 C CN 1207533C
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CN
China
Prior art keywords
chassis
instrumentation
measuring table
measuring
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB018000290A
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English (en)
Chinese (zh)
Other versions
CN1358267A (zh
Inventor
浅沼进
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asanuma Giken Co Ltd
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Asanuma Giken Co Ltd
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Publication date
Application filed by Asanuma Giken Co Ltd filed Critical Asanuma Giken Co Ltd
Publication of CN1358267A publication Critical patent/CN1358267A/zh
Application granted granted Critical
Publication of CN1207533C publication Critical patent/CN1207533C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CNB018000290A 2000-01-26 2001-01-19 计测仪检查用计测校准器的设定装置 Expired - Fee Related CN1207533C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000017583A JP2001208530A (ja) 2000-01-26 2000-01-26 計測機検査用計測マスタのセッティング装置
JP200017583 2000-01-26

Publications (2)

Publication Number Publication Date
CN1358267A CN1358267A (zh) 2002-07-10
CN1207533C true CN1207533C (zh) 2005-06-22

Family

ID=18544564

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB018000290A Expired - Fee Related CN1207533C (zh) 2000-01-26 2001-01-19 计测仪检查用计测校准器的设定装置

Country Status (9)

Country Link
US (1) US6601310B2 (ja)
EP (1) EP1178282A4 (ja)
JP (1) JP2001208530A (ja)
KR (1) KR100447418B1 (ja)
CN (1) CN1207533C (ja)
AU (1) AU754911B2 (ja)
CA (1) CA2365619C (ja)
TW (1) TW451058B (ja)
WO (1) WO2001055673A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0122357D0 (en) * 2001-09-15 2001-11-07 Secr Defence Sub-surface radar imaging
KR100435043B1 (ko) * 2001-12-28 2004-06-07 대우조선해양 주식회사 시준기 이송장치
JP2006043866A (ja) * 2004-06-30 2006-02-16 Fanuc Ltd パレット交換機能を有する工作機械及びパレット交換方法
CN103134450B (zh) * 2011-11-24 2016-04-20 昆山鑫昌泰模具科技有限公司 能够精准检测长尺寸工件的光标检测装置
CN102590890B (zh) * 2011-12-31 2014-05-14 同方威视技术股份有限公司 用于标定装置的运动平台及其定位控制方法
CN104019713A (zh) * 2014-05-20 2014-09-03 陕西法士特齿轮有限责任公司 一种螺纹孔位置度综合检具
DE102015226387B4 (de) 2015-12-21 2023-07-27 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Durchführung von Messungen mit einem Prüfelement in einem Koordinatenmessgerät oder einer Werkzeugmaschine
DE102017211067A1 (de) 2017-06-29 2019-01-03 Byk-Gardner Gmbh Aufnahmevorrichtung für ein Oberflächenmessgerät
US11152238B2 (en) * 2017-11-30 2021-10-19 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor processing stage profiler jig
CN109186428B (zh) * 2018-09-10 2020-10-27 上海共兴金属制品有限公司 一种镀锌钢板表面平整度精确检测与自动标记设备

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2768756A (en) * 1953-06-12 1956-10-30 Alfred E Horman Pallet loading machine
US2977002A (en) * 1957-09-02 1961-03-28 Abjorn Anderson Ab Apparatus for automatically loading bags on a pallet
US3710956A (en) * 1971-07-29 1973-01-16 H Meyer Vehicle packing facility with a vertically extensible mast
US4089203A (en) * 1976-04-07 1978-05-16 Wallis Bernard J Workpiece transfer mechanism
JPS6032564Y2 (ja) * 1978-07-14 1985-09-28 株式会社三豊製作所 被測定物の移動装置
JPS6032564A (ja) 1983-07-29 1985-02-19 Hitachi Ltd 平滑回路の実装構造体
US4594791A (en) * 1985-01-24 1986-06-17 The Warner & Swasey Company Bridge type coordinate measuring machine
US4671728A (en) * 1985-07-11 1987-06-09 Applied Power, Inc. Hydraulic system for a mobile transport vehicle that supports and positions a load relative to a docking structure
DE3806686A1 (de) * 1988-03-02 1989-09-14 Wegu Messtechnik Mehrkoordinatenmess- und -pruefeinrichtung
JP2697134B2 (ja) 1989-05-19 1998-01-14 三菱自動車工業株式会社 表面寸法測定装置
DE4038137A1 (de) * 1990-11-30 1992-06-04 Indura Ag Ind Automation Handhabungsgeraet zum transportieren und positionieren von werkstuecken
JP2521373B2 (ja) * 1990-12-21 1996-08-07 川崎製鉄株式会社 切板供試材の検査装置
JPH0632564A (ja) * 1992-06-29 1994-02-08 Otis Elevator Co 可動式バランスウェイト付エレベーター
JP3042270B2 (ja) * 1993-08-30 2000-05-15 トヨタ自動車株式会社 車輪の組付け装置
DE4438079A1 (de) * 1994-10-25 1996-05-02 Heidenhain Gmbh Dr Johannes Führung
JPH08187528A (ja) * 1994-12-29 1996-07-23 Murata Mach Ltd 板材位置決め装置
JPH1144527A (ja) 1997-07-25 1999-02-16 Asanuma Giken:Kk 寸法計測機とその計測精度確認方法
JP2000136921A (ja) * 1998-11-04 2000-05-16 Kubota Corp 塗膜厚検査装置の精度確認装置
JP2000136924A (ja) * 1998-11-04 2000-05-16 Kubota Corp 接触式管内径測定装置の校正装置

Also Published As

Publication number Publication date
AU2706701A (en) 2001-08-07
EP1178282A9 (en) 2002-04-03
AU754911B2 (en) 2002-11-28
US6601310B2 (en) 2003-08-05
KR100447418B1 (ko) 2004-09-04
TW451058B (en) 2001-08-21
KR20020006031A (ko) 2002-01-18
CA2365619A1 (en) 2001-08-02
CN1358267A (zh) 2002-07-10
EP1178282A4 (en) 2008-05-21
US20020152624A1 (en) 2002-10-24
CA2365619C (en) 2007-01-09
JP2001208530A (ja) 2001-08-03
EP1178282A1 (en) 2002-02-06
WO2001055673A1 (fr) 2001-08-02

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