CN116041047B - 一种溅镀用izo掺杂靶材及其制备方法 - Google Patents
一种溅镀用izo掺杂靶材及其制备方法 Download PDFInfo
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- 239000013077 target material Substances 0.000 title claims abstract description 24
- 238000002360 preparation method Methods 0.000 title claims abstract description 21
- 238000004544 sputter deposition Methods 0.000 title claims abstract description 19
- 239000002002 slurry Substances 0.000 claims abstract description 47
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims abstract description 45
- 239000000843 powder Substances 0.000 claims abstract description 43
- 239000011701 zinc Substances 0.000 claims abstract description 27
- 238000005469 granulation Methods 0.000 claims abstract description 22
- 230000003179 granulation Effects 0.000 claims abstract description 22
- 229910003437 indium oxide Inorganic materials 0.000 claims abstract description 22
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000007921 spray Substances 0.000 claims abstract description 22
- 238000002156 mixing Methods 0.000 claims abstract description 21
- 238000005245 sintering Methods 0.000 claims abstract description 19
- 239000011787 zinc oxide Substances 0.000 claims abstract description 18
- 239000011230 binding agent Substances 0.000 claims abstract description 17
- 239000002270 dispersing agent Substances 0.000 claims abstract description 17
- 238000009694 cold isostatic pressing Methods 0.000 claims abstract description 13
- 238000003825 pressing Methods 0.000 claims abstract description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 13
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 claims abstract description 9
- 238000004537 pulping Methods 0.000 claims abstract description 8
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910000420 cerium oxide Inorganic materials 0.000 claims abstract description 4
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 claims abstract description 4
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims abstract description 4
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical group [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 claims abstract description 4
- 229910001195 gallium oxide Inorganic materials 0.000 claims abstract description 3
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 claims abstract description 3
- 229910001936 tantalum oxide Inorganic materials 0.000 claims abstract description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims abstract description 3
- 239000002245 particle Substances 0.000 claims description 48
- 238000010438 heat treatment Methods 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 16
- 239000011268 mixed slurry Substances 0.000 claims description 14
- 239000004372 Polyvinyl alcohol Substances 0.000 claims description 11
- 229920002451 polyvinyl alcohol Polymers 0.000 claims description 11
- 229920000036 polyvinylpyrrolidone Polymers 0.000 claims description 11
- 239000001267 polyvinylpyrrolidone Substances 0.000 claims description 11
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 claims description 11
- 239000011148 porous material Substances 0.000 claims description 10
- 238000000227 grinding Methods 0.000 claims description 5
- 239000002253 acid Substances 0.000 claims description 4
- 238000005507 spraying Methods 0.000 claims description 3
- 229920002134 Carboxymethyl cellulose Polymers 0.000 claims description 2
- 239000002202 Polyethylene glycol Substances 0.000 claims description 2
- 239000001768 carboxy methyl cellulose Substances 0.000 claims description 2
- 235000010948 carboxy methyl cellulose Nutrition 0.000 claims description 2
- 239000008112 carboxymethyl-cellulose Substances 0.000 claims description 2
- 150000001875 compounds Chemical class 0.000 claims description 2
- 229920002401 polyacrylamide Polymers 0.000 claims description 2
- 229920000058 polyacrylate Polymers 0.000 claims description 2
- 229920001223 polyethylene glycol Polymers 0.000 claims description 2
- 150000003839 salts Chemical class 0.000 claims description 2
- 229920002554 vinyl polymer Polymers 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 239000000463 material Substances 0.000 abstract description 3
- 229910052725 zinc Inorganic materials 0.000 description 9
- 238000001816 cooling Methods 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 6
- 239000010409 thin film Substances 0.000 description 4
- 229940119177 germanium dioxide Drugs 0.000 description 3
- 239000010408 film Substances 0.000 description 2
- 102220042174 rs141655687 Human genes 0.000 description 2
- 102220043159 rs587780996 Human genes 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- QZQVBEXLDFYHSR-UHFFFAOYSA-N gallium(III) oxide Inorganic materials O=[Ga]O[Ga]=O QZQVBEXLDFYHSR-UHFFFAOYSA-N 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
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Abstract
本发明属于半导体材料制备技术领域,公开了一种溅镀用IZO掺杂靶材及其制备方法。所述IZO掺杂靶材由氧化铟、氧化锌和掺杂氧化物组成;所述IZO掺杂靶材中Zn与In的原子比为Zn/(Zn+In)=0.1%~7%;所述掺杂氧化物为氧化钽、氧化铈、氧化钛、氧化锗或氧化镓。所述制备方法为:将氧化铟粉末、氧化锌粉末、掺杂氧化物粉末与水、分散剂和粘结剂混合制浆,得到浆料;将所得浆料进行喷雾造粒,得到造粒粉末,然后经过干压和冷等静压后,进行常压烧结,得到所述溅镀用IZO掺杂靶材。本发明IZO掺杂靶材具有较低的ZnO加入量,且掺杂元素具有更多的选择,同时能够达到较高的致密度和导电性。
Description
技术领域
本发明属于半导体材料制备技术领域,具体涉及一种溅镀用IZO掺杂靶材及其制备方法。
背景技术
氧化物半导体薄膜具有高电子迁移率、高透光率和低生长温度的优异特性,有望取代传统的硅基薄膜晶体管,成为下一代显示技术驱动器件。在已知的氧化物半导体薄膜中,非晶态IZO薄膜又是最优异的材料之一。现今,IZO薄膜主要采用磁控溅射进行制备,该方法需要使用高性能的IZO靶材,而IZO靶材的相对密度、微结构等性质又对溅射薄膜性能的影响关系密切。因此,要想得到高性能的a-IZO,首先需要获取高品质的IZO靶材。
为了改善IZO靶材中的性能,现在技术进行了多种改善;通过向IZO靶材中共掺入Ga、Sn和Nb元素,得到了更高致密度、抗压强度和导电性的靶材。
如专利CN 113651598 A公开了一种IZO掺杂靶材,所述靶材的靶胚由下列质量份数的氧化物烧结而成:In2O3 90份、ZnO 8份、Ga2O3 1-1.5份、SnO2 1-1.5份、Nb2O5 0.01-1份。所得IZO掺杂靶材具有较高的纯度和致密度,强度、导电率等性能较佳。专利CN113735564A公开了一种Nb掺杂IZO靶胚,所述靶胚由下列质量份数的氧化物烧结而成:In2O390份、ZnO 8份、Nb2O5 0.01-0.1份。通过调整掺杂配方及制备方法来克服ZnO的固有缺陷,从而提高IZO靶材的性能。
上述掺杂靶材仍存在ZnO添加量过多,且掺杂元素选择性不多。因此,有必要提供一种降低ZnO加入量,掺杂元素选择多样,且靶材致密度、导电性等性能较佳的IZO掺杂靶材及制备方法。
发明内容
针对以上现有技术存在的缺点和不足之处,本发明的首要目的在于提供一种溅镀用IZO掺杂靶材。
本发明的另一目的在于提供上述溅镀用IZO掺杂靶材的制备方法。
本发明目的通过以下技术方案实现:
一种溅镀用IZO掺杂靶材,由氧化铟(In2O3)、氧化锌(ZnO)和掺杂氧化物组成;所述IZO掺杂靶材中Zn与In的原子比为Zn/(Zn+In)=0.1%~7%;所述掺杂氧化物为氧化钽、氧化铈、氧化钛、氧化锗或氧化镓。
进一步地,所述IZO掺杂靶材的质量百分含量组成为:氧化铟95.58%~99.74%,氧化锌0.06%~4.22%,掺杂氧化物≤0.2%。
进一步地,所述IZO掺杂靶材相对密度大于98.5%,电阻率<5mΩ﹒cm,50~300nm的气孔<10个/2600μm2。
上述溅镀用IZO掺杂靶材的制备方法,包括如下制备步骤:
(1)将氧化铟粉末、氧化锌粉末、掺杂氧化物粉末与水、分散剂和粘结剂混合制浆,得到浆料;
(2)将步骤(1)所得浆料进行喷雾造粒,得到造粒粉末;
(3)将步骤(2)所得造粒粉末经过干压和冷等静压后,进行常压烧结,得到所述溅镀用IZO掺杂靶材。
进一步地,步骤(1)中所述分散剂为聚乙烯吡咯烷酮、聚羧酸系化合物、聚乙烯酸盐中的一种或多种。
进一步地,步骤(1)中所述分散剂的加入量为氧化铟粉末和氧化锌粉末总质量的3%~10%。
进一步地,步骤(1)中所述粘结剂为聚乙烯醇、羧甲基纤维素、聚丙烯酰胺、聚丙烯酸盐、聚乙二醇中的一种或多种。
进一步地,步骤(1)中所述粘结剂的加入量为氧化铟粉末和氧化锌粉末总质量的3%~10%。
进一步地,步骤(1)中所述浆料的固含量为45%~70%之间。
进一步地,步骤(1)中所述浆料粒度D50<0.5μm,D90<1μm。
进一步地,步骤(2)中所述喷雾造粒的温度为80~110℃。
进一步地,步骤(2)中所述造粒粉末的粒径介于0.5~2μm之间。
进一步地,步骤(3)中所述烧结的程序为:以0.1~1℃/min升温至1300~1550℃,保温5~12h。
优选地,上述溅镀用IZO掺杂靶材的制备方法,包括如下制备步骤:
(1)将氧化铟粉末、氧化锌粉末、掺杂氧化物粉末与水、分散剂和粘结剂混合制浆,通过细磨分别得到粒度0.3μm<D50<0.5μm,0.75μm<D90<1μm的大颗粒浆料和粒度0.15μm<D50<0.3μm,0.5μm<D90<0.75μm的小颗粒浆料;
(2)将步骤(1)所得大颗粒浆料和小颗粒浆料按质量比为1~4:1混合得到混合浆料;
(3)将步骤(2)所得混合浆料进行喷雾造粒,得到造粒粉末;
(4)将步骤(3)所得造粒粉末经过干压和冷等静压后,进行常压烧结,得到所述溅镀用IZO掺杂靶材。
与现有技术相比,本发明的有益效果是:
(1)本发明IZO掺杂靶材具有较低的ZnO加入量,且掺杂元素具有更多的选择,同时能够达到较高的致密度和导电性。
(2)本发明进一步通过大、小粒径浆料混配造粒的制备工艺,大、小粒径颗粒经浆料混合后造粒可使颗粒间接触更加紧密,经验证可以显著提高靶材的致密度和导电性。
具体实施方式
下面结合实施例对本发明作进一步详细的描述,但本发明的实施方式不限于此。
实施例1
(1)称取9.974kg氧化铟,0.006kg氧化锌和0.02kg的五氧化二钽混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和10kg纯水混合制浆,得到的浆料粒度D50=0.427μm,D90=0.815μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=0.1%。
(3)将步骤(2)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为98.9%的IZO,靶材电阻率为2.86mΩ﹒cm,50~300nm的气孔为8个/2600μm2。
实施例2
(1)称取9.558kg氧化铟,0.422kg氧化锌和0.02kg的二氧化铈混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和8kg纯水混合制浆,得到的浆料粒度D50=0.430μm,D90=0.805μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=7%。
(3)将步骤(2)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为99.1%的IZO,靶材电阻率为3.20mΩ﹒cm,50~300nm的气孔为7个/2600μm2。
实施例3
(1)称取9.710kg氧化铟,0.270kg氧化锌和0.02kg的二氧化钛混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和9kg纯水混合制浆,得到的浆料粒度D50=0.435μm,D90=0.795μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=4.5%。
(3)将步骤(2)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为98.7%的IZO,靶材电阻率为3.35mΩ﹒cm,50~300nm的气孔为7个/2600μm2。
实施例4
(1)称取9.921kg氧化铟,0.059kg氧化锌和0.02kg的二氧化锗混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和11kg纯水混合制浆,得到的浆料粒度D50=0.450μm,D90=0.801μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=1%。
(3)将步骤(2)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为98.8%的IZO,靶材电阻率为3.25mΩ﹒cm,50-300nm的气孔为7个/2600μm2。
实施例5
(1)称取9.617kg氧化铟,0.363kg氧化锌和0.02kg的三氧化二镓混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和7kg纯水混合制浆,得到的浆料粒度D50=0.430μm,D90=0.780μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=6%。
(3)将步骤(2)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为98.6%的IZO,靶材电阻率为3.39mΩ﹒cm,50-300nm的气孔为8个/2600μm2。
实施例6
本实施例与实施例3相比,成分组成相同,采用大、小粒径浆料混配造粒的工艺进行制备,具体步骤如下:
(1)称取9.710kg氧化铟,0.270kg氧化锌和0.02kg的二氧化钛混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和9kg纯水混合制浆,得到粒度D50=0.435μm,D90=0.795μm的大颗粒浆料;进一步通过细磨得到粒度D50=0.236μm,D90=0.572μm的小颗粒浆料。
(2)将步骤(1)所得大颗粒浆料和小颗粒浆料分别按质量比为5:1、4:1、3:1、2:1、1:1、1:2和0:1混合得到混合浆料。
(3)将步骤(2)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=4.5%。
(4)将步骤(3)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到溅镀用IZO掺杂靶材。测试不同比例下大、小粒径浆料混配造粒工艺所得靶材性能,结果如下表1所示。
表1
由表1结果可见,本发明通过特定比例大、小粒径浆料混配造粒的制备工艺,可以显著提高IZO靶材的致密度和导电性。
实施例7
本实施例与实施例4相比,成分组成相同,采用大、小粒径浆料混配造粒的工艺进行制备,具体步骤如下:
(1)称取9.921kg氧化铟,0.059kg氧化锌和0.02kg的二氧化锗混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和11kg纯水混合制浆,得到粒度D50=0.450μm,D90=0.801μm的大颗粒浆料;进一步通过细磨得到粒度D50=0.265μm,D90=0.580μm的小颗粒浆料。
(2)将步骤(1)所得大颗粒浆料和小颗粒浆料按质量比为2:1混合得到混合浆料。
(3)将步骤(2)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=1%。
(4)将步骤(3)得到的造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为99.6%的IZO,靶材电阻率为0.89mΩ﹒cm,50-300nm的气孔为0个/2600μm2。
通过本实施例与实施例4的比较结果可以看出,本发明通过大、小粒径浆料混配造粒的制备工艺,可以显著提高IZO靶材的致密度和导电性。
对比例1
本对比例与实施例7相比,大颗粒浆料和小颗粒浆料分别进行喷雾造粒后进行混合压制烧结,具体步骤如下:
(1)称取9.921kg氧化铟,0.059kg氧化锌和0.02kg的二氧化锗混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和11kg纯水混合制浆,得到粒度D50=0.450μm,D90=0.801μm的大颗粒浆料;进一步通过细磨得到粒度D50=0.265μm,D90=0.580μm的小颗粒浆料。
(2)将步骤(1)所得大颗粒浆料和小颗粒浆料分别进行喷雾造粒,得到大颗粒造粒粉末和小颗粒造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=1%。
(3)将步骤(2)所得大颗粒造粒粉末和小颗粒造粒粉末按质量比为2:1混合,得到混合造粒粉末。
(4)将步骤(3)得到的混合造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降温至室温的烧结程序进行常压烧结,得到相对密度为99.0%的IZO,靶材电阻率为2.74mΩ﹒cm,50-300nm的气孔为4个/2600μm2。
通过本对比例与实施例7的比较结果可以看出,本发明制备工艺通过大、小粒径浆料混配的方式相比大、小粒径粉末混配的方式可显著提高IZO靶材的致密度和导电性。
对比例2
本对比例与实施例1相比,不加入掺杂氧化物,具体步骤如下:
(1)称取9.974kg氧化铟,0.006kg氧化锌混合,然后加入0.7kg的聚乙烯吡咯烷酮分散剂、0.8kg的聚乙烯醇粘结剂和10kg纯水混合制浆,得到的浆料粒度D50=0.435μm,D90=0.830μm。
(2)将步骤(1)得到的混合浆料进行喷雾造粒,得到造粒粉末。其中喷雾造粒的温度为85~92℃,Zn/Zn+In=0.1%。
(3)将步骤(2)得到造粒粉末经过干压和冷等静压后,以0.2℃/min升温至750℃,再以0.3℃/min升温至1450℃,再保温8h,最后以1℃/min降低室温的烧结程序进行常压烧结,得到相对密度为97%的IZO,靶材电阻率为6.15mΩ﹒cm,50~300nm的气孔为12个/2600μm2。
通过本对比例与实施例1的比较结果可以看出,本发明通过特定的掺杂元素,可以显著提高IZO靶材的致密度和导电性。
上述实施例为本发明较佳的实施方式,但本发明的实施方式并不受上述实施例的限制,其它的任何未背离本发明的精神实质与原理下所作的改变、修饰、替代、组合、简化,均应为等效的置换方式,都包含在本发明的保护范围之内。
Claims (6)
1.一种溅镀用IZO掺杂靶材的制备方法,其特征在于,所述IZO掺杂靶材由氧化铟、氧化锌和掺杂氧化物组成,其中Zn与In的原子比为Zn/(Zn+In)=0.1%~7%;所述掺杂氧化物为氧化钽、氧化铈、氧化钛、氧化锗或氧化镓;所述制备方法包括如下步骤:
(1)将氧化铟粉末、氧化锌粉末、掺杂氧化物粉末与水、分散剂和粘结剂混合制浆,通过细磨分别得到粒度0.3μm<D50<0.5μm,0.75μm<D90<1μm的大颗粒浆料和粒度0.15μm<D50<0.3μm,0.5μm<D90<0.75μm的小颗粒浆料;
(2)将步骤(1)所得大颗粒浆料和小颗粒浆料按质量比为1~4:1混合得到混合浆料;
(3)将步骤(2)所得混合浆料进行喷雾造粒,得到造粒粉末;
(4)将步骤(3)所得造粒粉末经过干压和冷等静压后,进行常压烧结,得到所述溅镀用IZO掺杂靶材;
所述IZO掺杂靶材的质量百分含量组成为:氧化铟95.58%~99.74%,氧化锌0.06%~4.22%,掺杂氧化物≤0.2%。
2.根据权利要求1所述的一种溅镀用IZO掺杂靶材的制备方法,其特征在于,所述IZO掺杂靶材相对密度大于98.5%,电阻率<5mΩ﹒cm,50~300nm的气孔<10个/2600μm2。
3.根据权利要求1所述的一种溅镀用IZO掺杂靶材的制备方法,其特征在于,步骤(1)中所述分散剂为聚乙烯吡咯烷酮、聚羧酸系化合物、聚乙烯酸盐中的一种或多种,分散剂的加入量为氧化铟粉末和氧化锌粉末总质量的3%~10%。
4.根据权利要求1所述的一种溅镀用IZO掺杂靶材的制备方法,其特征在于,步骤(1)中所述粘结剂为聚乙烯醇、羧甲基纤维素、聚丙烯酰胺、聚丙烯酸盐、聚乙二醇中的一种或多种,粘结剂的加入量为氧化铟粉末和氧化锌粉末总质量的3%~10%。
5.根据权利要求1所述的一种溅镀用IZO掺杂靶材的制备方法,其特征在于,步骤(3)中所述喷雾造粒的温度为80~110℃。
6.根据权利要求1所述的一种溅镀用IZO掺杂靶材的制备方法,其特征在于,步骤(4)中所述烧结的程序为:以0.1~1℃/min升温至1300~1550℃,保温5~12h。
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