CN1134016C - 动态存储器 - Google Patents

动态存储器 Download PDF

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Publication number
CN1134016C
CN1134016C CNB951165518A CN95116551A CN1134016C CN 1134016 C CN1134016 C CN 1134016C CN B951165518 A CNB951165518 A CN B951165518A CN 95116551 A CN95116551 A CN 95116551A CN 1134016 C CN1134016 C CN 1134016C
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CN
China
Prior art keywords
data
memory
sub
arrays
data input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB951165518A
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English (en)
Chinese (zh)
Other versions
CN1142115A (zh
Inventor
高濑觉
ʷ
樱井清史
荻原正毅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of CN1142115A publication Critical patent/CN1142115A/zh
Application granted granted Critical
Publication of CN1134016C publication Critical patent/CN1134016C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/08—Addressing or allocation; Relocation in hierarchically structured memory systems, e.g. virtual memory systems
    • G06F12/0802—Addressing of a memory level in which the access to the desired data or data block requires associative addressing means, e.g. caches
    • G06F12/0893—Caches characterised by their organisation or structure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches 

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Databases & Information Systems (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
CNB951165518A 1994-09-22 1995-09-21 动态存储器 Expired - Fee Related CN1134016C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP06227639A JP3135795B2 (ja) 1994-09-22 1994-09-22 ダイナミック型メモリ
JP227639/94 1994-09-22
JP227639/1994 1994-09-22

Publications (2)

Publication Number Publication Date
CN1142115A CN1142115A (zh) 1997-02-05
CN1134016C true CN1134016C (zh) 2004-01-07

Family

ID=16864038

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB951165518A Expired - Fee Related CN1134016C (zh) 1994-09-22 1995-09-21 动态存储器

Country Status (7)

Country Link
US (1) US5586078A (enExample)
EP (2) EP0704847B1 (enExample)
JP (1) JP3135795B2 (enExample)
KR (1) KR0184091B1 (enExample)
CN (1) CN1134016C (enExample)
DE (2) DE69536100D1 (enExample)
TW (1) TW303522B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1707447B (zh) * 2004-05-28 2010-10-06 三星电子株式会社 高速缓冲存储器

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US5901105A (en) * 1995-04-05 1999-05-04 Ong; Adrian E Dynamic random access memory having decoding circuitry for partial memory blocks
US5787267A (en) * 1995-06-07 1998-07-28 Monolithic System Technology, Inc. Caching method and circuit for a memory system with circuit module architecture
JPH09161476A (ja) 1995-10-04 1997-06-20 Toshiba Corp 半導体メモリ及びそのテスト回路、並びにデ−タ転送システム
JP3277108B2 (ja) * 1995-10-31 2002-04-22 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｄｒａｍアレイ
TW348266B (en) * 1996-03-11 1998-12-21 Toshiba Co Ltd Semiconductor memory device
JP3477018B2 (ja) * 1996-03-11 2003-12-10 株式会社東芝 半導体記憶装置
JPH09288888A (ja) * 1996-04-22 1997-11-04 Mitsubishi Electric Corp 半導体記憶装置
JP2927344B2 (ja) * 1996-08-09 1999-07-28 日本電気株式会社 半導体記憶回路
US6044433A (en) * 1996-08-09 2000-03-28 Micron Technology, Inc. DRAM cache
JP3280867B2 (ja) * 1996-10-03 2002-05-13 シャープ株式会社 半導体記憶装置
DE69731307T2 (de) * 1996-12-26 2006-03-09 Rambus Inc., Los Altos Verfahren und anordnung zur gemeinsamen verwendung von leseverstärkern zwischen speicherbänken
US6075743A (en) * 1996-12-26 2000-06-13 Rambus Inc. Method and apparatus for sharing sense amplifiers between memory banks
US6134172A (en) * 1996-12-26 2000-10-17 Rambus Inc. Apparatus for sharing sense amplifiers between memory banks
KR100242998B1 (ko) * 1996-12-30 2000-02-01 김영환 잡음특성을 개선한 셀 어레이 및 센스앰프의 구조
US5774408A (en) * 1997-01-28 1998-06-30 Micron Technology, Inc. DRAM architecture with combined sense amplifier pitch
US5995437A (en) * 1997-06-02 1999-11-30 Townsend And Townsend And Crew Llp Semiconductor memory and method of accessing memory arrays
US6084816A (en) 1998-04-16 2000-07-04 Kabushiki Kaisha Toshiba Semiconductor memory device
US6141286A (en) * 1998-08-21 2000-10-31 Micron Technology, Inc. Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines
US6442666B1 (en) * 1999-01-28 2002-08-27 Infineon Technologies Ag Techniques for improving memory access in a virtual memory system
KR100363079B1 (ko) * 1999-02-01 2002-11-30 삼성전자 주식회사 이웃한 메모리 뱅크들에 의해 입출력 센스앰프가 공유된 멀티 뱅크 메모리장치
US6118717A (en) * 1999-07-15 2000-09-12 Stmicroelectronics, Inc. Method and apparatus for loading directly onto bit lines in a dynamic random access memory
TW434538B (en) * 1999-07-28 2001-05-16 Sunplus Technology Co Ltd Cache data access memory structure
KR100339428B1 (ko) * 1999-09-07 2002-05-31 박종섭 불휘발성 강유전체 메모리의 셀 블록 구조
TW519646B (en) 2000-03-13 2003-02-01 Infineon Technologies Ag Write-read-amplifier for a DRAM-memory cell as well as DRAM-memory and method to evaluate the DRAM-memory cells of said DRAM-memory
US7215595B2 (en) * 2003-11-26 2007-05-08 Infineon Technologies Ag Memory device and method using a sense amplifier as a cache
US7050351B2 (en) * 2003-12-30 2006-05-23 Intel Corporation Method and apparatus for multiple row caches per bank
US6990036B2 (en) 2003-12-30 2006-01-24 Intel Corporation Method and apparatus for multiple row caches per bank
KR100533977B1 (ko) * 2004-05-06 2005-12-07 주식회사 하이닉스반도체 셀영역의 면적을 감소시킨 반도체 메모리 장치
DE102004059723B4 (de) * 2004-12-11 2010-02-25 Qimonda Ag Speicherbauelement mit neuer Anordnung der Bitleitungen
KR100735527B1 (ko) * 2006-02-13 2007-07-04 삼성전자주식회사 2개의 패드 행을 포함하는 반도체 메모리 장치
JP2009009633A (ja) * 2007-06-27 2009-01-15 Elpida Memory Inc 半導体記憶装置
JP5743045B2 (ja) * 2008-07-16 2015-07-01 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 半導体記憶装置及び半導体記憶装置におけるメモリアクセス方法
JP2011146094A (ja) 2010-01-14 2011-07-28 Renesas Electronics Corp 半導体集積回路
US10276230B2 (en) 2016-08-31 2019-04-30 Micron Technology, Inc. Memory arrays
EP3507829B1 (en) 2016-08-31 2022-04-06 Micron Technology, Inc. Memory cells and memory arrays
EP3507831B1 (en) 2016-08-31 2021-03-03 Micron Technology, Inc. Memory arrays
US10079235B2 (en) 2016-08-31 2018-09-18 Micron Technology, Inc. Memory cells and memory arrays
US10355002B2 (en) 2016-08-31 2019-07-16 Micron Technology, Inc. Memory cells, methods of forming an array of two transistor-one capacitor memory cells, and methods used in fabricating integrated circuitry
EP3507832B1 (en) 2016-08-31 2025-07-23 Micron Technology, Inc. Memory cells and memory arrays
CN109196584B (zh) 2016-08-31 2022-07-19 美光科技公司 感测放大器构造
US11211384B2 (en) 2017-01-12 2021-12-28 Micron Technology, Inc. Memory cells, arrays of two transistor-one capacitor memory cells, methods of forming an array of two transistor-one capacitor memory cells, and methods used in fabricating integrated circuitry
EP3676835A4 (en) * 2017-08-29 2020-08-19 Micron Technology, Inc. MEMORY CIRCUITS
KR102792404B1 (ko) * 2021-08-17 2025-04-04 연세대학교 산학협력단 Ram 메모리에 기반한 pim 연산 장치 및 ram 메모리에 기반한 pim 연산 방법
GB2634496A (en) * 2023-10-04 2025-04-16 Ibm Banked sense amplifier circuit for a memory core and a memory core complex

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0428785A1 (de) * 1989-11-24 1991-05-29 Siemens Aktiengesellschaft Halbleiterspeicher
EP0454998A2 (en) * 1990-03-28 1991-11-06 Nec Corporation Semiconductor memory device
US5301162A (en) * 1992-03-26 1994-04-05 Nec Corporation Semiconductor random access memory device having shared sense amplifiers serving as a cache memory
US5384745A (en) * 1992-04-27 1995-01-24 Mitsubishi Denki Kabushiki Kaisha Synchronous semiconductor memory device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0814985B2 (ja) 1989-06-06 1996-02-14 富士通株式会社 半導体記憶装置
KR970004460B1 (ko) 1992-06-30 1997-03-27 니뽄 덴끼 가부시끼가이샤 반도체 메모리 회로

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0428785A1 (de) * 1989-11-24 1991-05-29 Siemens Aktiengesellschaft Halbleiterspeicher
EP0454998A2 (en) * 1990-03-28 1991-11-06 Nec Corporation Semiconductor memory device
US5301162A (en) * 1992-03-26 1994-04-05 Nec Corporation Semiconductor random access memory device having shared sense amplifiers serving as a cache memory
US5384745A (en) * 1992-04-27 1995-01-24 Mitsubishi Denki Kabushiki Kaisha Synchronous semiconductor memory device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1707447B (zh) * 2004-05-28 2010-10-06 三星电子株式会社 高速缓冲存储器

Also Published As

Publication number Publication date
CN1142115A (zh) 1997-02-05
US5586078A (en) 1996-12-17
DE69536100D1 (de) 2010-10-14
EP1081711B1 (en) 2010-09-01
DE69521095T2 (de) 2001-10-25
EP1081711A2 (en) 2001-03-07
KR0184091B1 (ko) 1999-04-15
DE69521095D1 (de) 2001-07-05
KR960012008A (ko) 1996-04-20
EP0704847B1 (en) 2001-05-30
JPH0896571A (ja) 1996-04-12
EP0704847A1 (en) 1996-04-03
EP1081711A3 (en) 2008-04-09
JP3135795B2 (ja) 2001-02-19
TW303522B (enExample) 1997-04-21

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Granted publication date: 20040107

Termination date: 20140921

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