CN112955754A - 探针和检查工具 - Google Patents
探针和检查工具 Download PDFInfo
- Publication number
- CN112955754A CN112955754A CN201980071406.XA CN201980071406A CN112955754A CN 112955754 A CN112955754 A CN 112955754A CN 201980071406 A CN201980071406 A CN 201980071406A CN 112955754 A CN112955754 A CN 112955754A
- Authority
- CN
- China
- Prior art keywords
- probe
- housing
- elastic
- portions
- inspection tool
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 102
- 238000007689 inspection Methods 0.000 title claims description 53
- 239000004020 conductor Substances 0.000 claims abstract description 37
- 238000003466 welding Methods 0.000 claims description 9
- 238000005476 soldering Methods 0.000 description 7
- 238000012986 modification Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000003860 storage Methods 0.000 description 5
- 238000005452 bending Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018210797A JP7354534B2 (ja) | 2018-11-08 | 2018-11-08 | プローブピンおよび検査治具 |
JP2018-210797 | 2018-11-08 | ||
PCT/JP2019/041489 WO2020095679A1 (fr) | 2018-11-08 | 2019-10-23 | Broche de sonde et gabarit d'inspection |
Publications (2)
Publication Number | Publication Date |
---|---|
CN112955754A true CN112955754A (zh) | 2021-06-11 |
CN112955754B CN112955754B (zh) | 2024-08-06 |
Family
ID=70610983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201980071406.XA Active CN112955754B (zh) | 2018-11-08 | 2019-10-23 | 探针和检查工具 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7354534B2 (fr) |
KR (1) | KR102600799B1 (fr) |
CN (1) | CN112955754B (fr) |
TW (1) | TWI708441B (fr) |
WO (1) | WO2020095679A1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111579836B (zh) * | 2020-05-18 | 2023-01-17 | 武汉精毅通电子技术有限公司 | 一种适用于大电流高速信号测试的探针及连接器 |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008133089A1 (fr) * | 2007-04-20 | 2008-11-06 | Nhk Spring Co., Ltd. | Unité de contact conducteur |
JP2009052913A (ja) * | 2007-08-23 | 2009-03-12 | Yamaichi Electronics Co Ltd | 同軸型コンタクト及び同軸多芯コネクタ |
JP2010025844A (ja) * | 2008-07-23 | 2010-02-04 | Unitechno Inc | コンタクトプローブおよび検査用ソケット |
CN103238077A (zh) * | 2010-11-29 | 2013-08-07 | 株式会社精研 | 接触检查用工具 |
CN103782453A (zh) * | 2011-10-14 | 2014-05-07 | 欧姆龙株式会社 | 触头及使用其的探测器 |
CN107038983A (zh) * | 2016-02-03 | 2017-08-11 | 普罗-2000有限公司 | 针式插接板 |
CN107615077A (zh) * | 2015-08-07 | 2018-01-19 | 欧姆龙株式会社 | 探针以及具备探针的检查夹具 |
CN107850624A (zh) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | 探针 |
CN107850623A (zh) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | 探针 |
KR20180094627A (ko) * | 2017-02-16 | 2018-08-24 | (주)에이피텍 | 테스트 핀 및 이를 포함하는 테스트 장치 |
KR101903319B1 (ko) * | 2018-01-11 | 2018-10-01 | 오므론 가부시키가이샤 | 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2790074B2 (ja) * | 1995-03-31 | 1998-08-27 | 日本電気株式会社 | プローブ装置 |
JP2002134202A (ja) | 2000-10-27 | 2002-05-10 | Otax Co Ltd | 電子部品用ソケット |
JP2004138405A (ja) * | 2002-10-15 | 2004-05-13 | Renesas Technology Corp | 半導体装置測定用プローブ |
JP4854612B2 (ja) * | 2007-07-09 | 2012-01-18 | センサータ テクノロジーズ マサチューセッツ インコーポレーテッド | ソケット用アダプタ |
US8970238B2 (en) * | 2011-06-17 | 2015-03-03 | Electro Scientific Industries, Inc. | Probe module with interleaved serpentine test contacts for electronic device testing |
JP5821432B2 (ja) * | 2011-09-05 | 2015-11-24 | 日本電産リード株式会社 | 接続端子及び接続治具 |
JP2017130421A (ja) * | 2016-01-22 | 2017-07-27 | 山一電機株式会社 | コンタクト端子、コンタクト支持体、および、それを備える接続装置 |
JP6740630B2 (ja) * | 2016-02-15 | 2020-08-19 | オムロン株式会社 | プローブピンおよびこれを用いた検査装置 |
JP6624999B2 (ja) * | 2016-03-31 | 2019-12-25 | 日鉄日新製鋼株式会社 | 自動車用端子 |
CN114441813A (zh) * | 2018-01-11 | 2022-05-06 | 欧姆龙株式会社 | 探针、检查工具、检查单元和检查装置 |
-
2018
- 2018-11-08 JP JP2018210797A patent/JP7354534B2/ja active Active
-
2019
- 2019-10-23 CN CN201980071406.XA patent/CN112955754B/zh active Active
- 2019-10-23 KR KR1020217011321A patent/KR102600799B1/ko active IP Right Grant
- 2019-10-23 WO PCT/JP2019/041489 patent/WO2020095679A1/fr active Application Filing
- 2019-11-01 TW TW108139674A patent/TWI708441B/zh active
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008133089A1 (fr) * | 2007-04-20 | 2008-11-06 | Nhk Spring Co., Ltd. | Unité de contact conducteur |
JP2009052913A (ja) * | 2007-08-23 | 2009-03-12 | Yamaichi Electronics Co Ltd | 同軸型コンタクト及び同軸多芯コネクタ |
JP2010025844A (ja) * | 2008-07-23 | 2010-02-04 | Unitechno Inc | コンタクトプローブおよび検査用ソケット |
CN103238077A (zh) * | 2010-11-29 | 2013-08-07 | 株式会社精研 | 接触检查用工具 |
CN103782453A (zh) * | 2011-10-14 | 2014-05-07 | 欧姆龙株式会社 | 触头及使用其的探测器 |
CN107615077A (zh) * | 2015-08-07 | 2018-01-19 | 欧姆龙株式会社 | 探针以及具备探针的检查夹具 |
CN107038983A (zh) * | 2016-02-03 | 2017-08-11 | 普罗-2000有限公司 | 针式插接板 |
CN107850624A (zh) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | 探针 |
CN107850623A (zh) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | 探针 |
KR20180094627A (ko) * | 2017-02-16 | 2018-08-24 | (주)에이피텍 | 테스트 핀 및 이를 포함하는 테스트 장치 |
KR101903319B1 (ko) * | 2018-01-11 | 2018-10-01 | 오므론 가부시키가이샤 | 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR102600799B1 (ko) | 2023-11-10 |
JP2020076666A (ja) | 2020-05-21 |
KR20210062046A (ko) | 2021-05-28 |
TWI708441B (zh) | 2020-10-21 |
CN112955754B (zh) | 2024-08-06 |
TW202019031A (zh) | 2020-05-16 |
WO2020095679A1 (fr) | 2020-05-14 |
JP7354534B2 (ja) | 2023-10-03 |
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