CN112955754A - 探针和检查工具 - Google Patents

探针和检查工具 Download PDF

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Publication number
CN112955754A
CN112955754A CN201980071406.XA CN201980071406A CN112955754A CN 112955754 A CN112955754 A CN 112955754A CN 201980071406 A CN201980071406 A CN 201980071406A CN 112955754 A CN112955754 A CN 112955754A
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CN
China
Prior art keywords
probe
housing
elastic
portions
inspection tool
Prior art date
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Application number
CN201980071406.XA
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English (en)
Chinese (zh)
Other versions
CN112955754B (zh
Inventor
笹野直哉
寺西宏真
酒井贵浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
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Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Publication of CN112955754A publication Critical patent/CN112955754A/zh
Application granted granted Critical
Publication of CN112955754B publication Critical patent/CN112955754B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
CN201980071406.XA 2018-11-08 2019-10-23 探针和检查工具 Active CN112955754B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018210797A JP7354534B2 (ja) 2018-11-08 2018-11-08 プローブピンおよび検査治具
JP2018-210797 2018-11-08
PCT/JP2019/041489 WO2020095679A1 (fr) 2018-11-08 2019-10-23 Broche de sonde et gabarit d'inspection

Publications (2)

Publication Number Publication Date
CN112955754A true CN112955754A (zh) 2021-06-11
CN112955754B CN112955754B (zh) 2024-08-06

Family

ID=70610983

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980071406.XA Active CN112955754B (zh) 2018-11-08 2019-10-23 探针和检查工具

Country Status (5)

Country Link
JP (1) JP7354534B2 (fr)
KR (1) KR102600799B1 (fr)
CN (1) CN112955754B (fr)
TW (1) TWI708441B (fr)
WO (1) WO2020095679A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111579836B (zh) * 2020-05-18 2023-01-17 武汉精毅通电子技术有限公司 一种适用于大电流高速信号测试的探针及连接器

Citations (11)

* Cited by examiner, † Cited by third party
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WO2008133089A1 (fr) * 2007-04-20 2008-11-06 Nhk Spring Co., Ltd. Unité de contact conducteur
JP2009052913A (ja) * 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
JP2010025844A (ja) * 2008-07-23 2010-02-04 Unitechno Inc コンタクトプローブおよび検査用ソケット
CN103238077A (zh) * 2010-11-29 2013-08-07 株式会社精研 接触检查用工具
CN103782453A (zh) * 2011-10-14 2014-05-07 欧姆龙株式会社 触头及使用其的探测器
CN107038983A (zh) * 2016-02-03 2017-08-11 普罗-2000有限公司 针式插接板
CN107615077A (zh) * 2015-08-07 2018-01-19 欧姆龙株式会社 探针以及具备探针的检查夹具
CN107850624A (zh) * 2016-06-17 2018-03-27 欧姆龙株式会社 探针
CN107850623A (zh) * 2016-06-17 2018-03-27 欧姆龙株式会社 探针
KR20180094627A (ko) * 2017-02-16 2018-08-24 (주)에이피텍 테스트 핀 및 이를 포함하는 테스트 장치
KR101903319B1 (ko) * 2018-01-11 2018-10-01 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2790074B2 (ja) * 1995-03-31 1998-08-27 日本電気株式会社 プローブ装置
JP2002134202A (ja) 2000-10-27 2002-05-10 Otax Co Ltd 電子部品用ソケット
JP2004138405A (ja) * 2002-10-15 2004-05-13 Renesas Technology Corp 半導体装置測定用プローブ
JP4854612B2 (ja) * 2007-07-09 2012-01-18 センサータ テクノロジーズ マサチューセッツ インコーポレーテッド ソケット用アダプタ
US8970238B2 (en) * 2011-06-17 2015-03-03 Electro Scientific Industries, Inc. Probe module with interleaved serpentine test contacts for electronic device testing
JP5821432B2 (ja) * 2011-09-05 2015-11-24 日本電産リード株式会社 接続端子及び接続治具
JP2017130421A (ja) * 2016-01-22 2017-07-27 山一電機株式会社 コンタクト端子、コンタクト支持体、および、それを備える接続装置
JP6740630B2 (ja) * 2016-02-15 2020-08-19 オムロン株式会社 プローブピンおよびこれを用いた検査装置
JP6624999B2 (ja) * 2016-03-31 2019-12-25 日鉄日新製鋼株式会社 自動車用端子
CN114441813A (zh) * 2018-01-11 2022-05-06 欧姆龙株式会社 探针、检查工具、检查单元和检查装置

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008133089A1 (fr) * 2007-04-20 2008-11-06 Nhk Spring Co., Ltd. Unité de contact conducteur
JP2009052913A (ja) * 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
JP2010025844A (ja) * 2008-07-23 2010-02-04 Unitechno Inc コンタクトプローブおよび検査用ソケット
CN103238077A (zh) * 2010-11-29 2013-08-07 株式会社精研 接触检查用工具
CN103782453A (zh) * 2011-10-14 2014-05-07 欧姆龙株式会社 触头及使用其的探测器
CN107615077A (zh) * 2015-08-07 2018-01-19 欧姆龙株式会社 探针以及具备探针的检查夹具
CN107038983A (zh) * 2016-02-03 2017-08-11 普罗-2000有限公司 针式插接板
CN107850624A (zh) * 2016-06-17 2018-03-27 欧姆龙株式会社 探针
CN107850623A (zh) * 2016-06-17 2018-03-27 欧姆龙株式会社 探针
KR20180094627A (ko) * 2017-02-16 2018-08-24 (주)에이피텍 테스트 핀 및 이를 포함하는 테스트 장치
KR101903319B1 (ko) * 2018-01-11 2018-10-01 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치

Also Published As

Publication number Publication date
KR102600799B1 (ko) 2023-11-10
JP2020076666A (ja) 2020-05-21
KR20210062046A (ko) 2021-05-28
TWI708441B (zh) 2020-10-21
CN112955754B (zh) 2024-08-06
TW202019031A (zh) 2020-05-16
WO2020095679A1 (fr) 2020-05-14
JP7354534B2 (ja) 2023-10-03

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