CN111799206A - 剥离装置 - Google Patents
剥离装置 Download PDFInfo
- Publication number
- CN111799206A CN111799206A CN202010248733.2A CN202010248733A CN111799206A CN 111799206 A CN111799206 A CN 111799206A CN 202010248733 A CN202010248733 A CN 202010248733A CN 111799206 A CN111799206 A CN 111799206A
- Authority
- CN
- China
- Prior art keywords
- plate
- protective member
- peeling
- recovery box
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000001681 protective effect Effects 0.000 claims abstract description 146
- 238000011084 recovery Methods 0.000 claims description 88
- 230000007246 mechanism Effects 0.000 abstract description 16
- 210000000078 claw Anatomy 0.000 description 16
- 229920005989 resin Polymers 0.000 description 11
- 239000011347 resin Substances 0.000 description 11
- 238000000926 separation method Methods 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 10
- 239000012790 adhesive layer Substances 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 230000001105 regulatory effect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 239000010410 layer Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 208000027418 Wounds and injury Diseases 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/6834—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019074057A JP7252819B2 (ja) | 2019-04-09 | 2019-04-09 | 剥離装置 |
JP2019-074057 | 2019-04-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN111799206A true CN111799206A (zh) | 2020-10-20 |
Family
ID=72806672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010248733.2A Pending CN111799206A (zh) | 2019-04-09 | 2020-04-01 | 剥离装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7252819B2 (ko) |
KR (1) | KR20200119195A (ko) |
CN (1) | CN111799206A (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113513005B (zh) | 2021-04-22 | 2022-08-26 | 杜同 | 海上浮岛 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004327898A (ja) | 2003-04-28 | 2004-11-18 | Matsushita Electric Ind Co Ltd | 部品供給用テープ類回収装置及び同回収方法、並びに部品実装装置及び部品実装方法 |
JP6450634B2 (ja) | 2015-04-13 | 2019-01-09 | 株式会社ディスコ | テープ剥離装置 |
JP6833542B2 (ja) | 2017-02-08 | 2021-02-24 | 日東電工株式会社 | テープ回収方法およびテープ回収装置 |
JP6845087B2 (ja) | 2017-05-25 | 2021-03-17 | 株式会社ディスコ | 剥離装置 |
JP6770487B2 (ja) | 2017-06-12 | 2020-10-14 | ヤマハ発動機株式会社 | テープ回収装置および同装置を備えた部品実装装置 |
-
2019
- 2019-04-09 JP JP2019074057A patent/JP7252819B2/ja active Active
-
2020
- 2020-03-27 KR KR1020200037770A patent/KR20200119195A/ko active IP Right Grant
- 2020-04-01 CN CN202010248733.2A patent/CN111799206A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
KR20200119195A (ko) | 2020-10-19 |
JP7252819B2 (ja) | 2023-04-05 |
JP2020174082A (ja) | 2020-10-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW575900B (en) | Wafer transfer apparatus | |
JP4851415B2 (ja) | 紫外線照射方法およびこれを用いた装置 | |
KR102464297B1 (ko) | 보호 테이프의 첩착 방법 및 보호 테이프 첩착 장치 | |
CN111489999A (zh) | 剥离装置 | |
CN110802509B (zh) | 保护部件形成装置 | |
JP5312997B2 (ja) | 紫外線照射装置 | |
CN114284171A (zh) | 加工装置 | |
TW201518177A (zh) | 自動包裝設備 | |
JP6845003B2 (ja) | 搬送装置 | |
CN111799206A (zh) | 剥离装置 | |
CN110911333A (zh) | 带粘贴装置 | |
CN115995407A (zh) | 加工装置 | |
KR100441128B1 (ko) | 반도체패키지용웨이퍼마운팅방법및그장치 | |
JP6762864B2 (ja) | 加工装置 | |
KR100240578B1 (ko) | 반도체패키지용 웨이퍼 마운팅 시스템의 웨이퍼 이송장치 | |
JP2017175055A (ja) | パッケージ基板のハンドリング方法 | |
KR100199826B1 (ko) | 반도체패키지용 웨이퍼마운팅시스템의 롤러장치 | |
KR100653571B1 (ko) | 필름을 인덱스하고 절단하는 장치 및 방법 | |
CN109994406B (zh) | 切削装置 | |
KR100199823B1 (ko) | 반도체패키지용 웨이퍼마운팅시스템의 웨이퍼척 | |
JP2023093880A (ja) | 剥離装置、及び、エキスパンド装置 | |
KR100199821B1 (ko) | 반도체패키지용 웨이퍼마운팅시스템의 얼라이먼트 | |
CN114613695A (zh) | 带剥离装置 | |
KR100199827B1 (ko) | 반도체패키지용 웨이퍼마운팅시스템의 테이프 정량이송장치 | |
JP2011060898A (ja) | ワーク収納カセット |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |