CN109154633B - 全垫覆盖边界扫描 - Google Patents

全垫覆盖边界扫描 Download PDF

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Publication number
CN109154633B
CN109154633B CN201780031966.3A CN201780031966A CN109154633B CN 109154633 B CN109154633 B CN 109154633B CN 201780031966 A CN201780031966 A CN 201780031966A CN 109154633 B CN109154633 B CN 109154633B
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China
Prior art keywords
pads
signals
test
state
scan
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CN201780031966.3A
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English (en)
Chinese (zh)
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CN109154633A (zh
Inventor
P·纳拉亚南
R·米塔尔
R·梅赫罗特拉
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Texas Instruments Inc
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Texas Instruments Inc
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Priority to CN202110742245.1A priority Critical patent/CN113484719B/zh
Publication of CN109154633A publication Critical patent/CN109154633A/zh
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Publication of CN109154633B publication Critical patent/CN109154633B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CN201780031966.3A 2016-04-29 2017-05-01 全垫覆盖边界扫描 Active CN109154633B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202110742245.1A CN113484719B (zh) 2016-04-29 2017-05-01 全垫覆盖边界扫描

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/143,454 US9791505B1 (en) 2016-04-29 2016-04-29 Full pad coverage boundary scan
US15/143,454 2016-04-29
PCT/US2017/030359 WO2017190123A1 (en) 2016-04-29 2017-05-01 Full pad coverage boundary scan

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN202110742245.1A Division CN113484719B (zh) 2016-04-29 2017-05-01 全垫覆盖边界扫描

Publications (2)

Publication Number Publication Date
CN109154633A CN109154633A (zh) 2019-01-04
CN109154633B true CN109154633B (zh) 2021-08-24

Family

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Family Applications (2)

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CN202110742245.1A Active CN113484719B (zh) 2016-04-29 2017-05-01 全垫覆盖边界扫描
CN201780031966.3A Active CN109154633B (zh) 2016-04-29 2017-05-01 全垫覆盖边界扫描

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN202110742245.1A Active CN113484719B (zh) 2016-04-29 2017-05-01 全垫覆盖边界扫描

Country Status (5)

Country Link
US (4) US9791505B1 (enExample)
JP (3) JP7004316B2 (enExample)
KR (1) KR102247968B1 (enExample)
CN (2) CN113484719B (enExample)
WO (1) WO2017190123A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113484719B (zh) * 2016-04-29 2025-03-14 德州仪器公司 全垫覆盖边界扫描

Families Citing this family (6)

* Cited by examiner, † Cited by third party
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JP7385651B2 (ja) * 2018-08-31 2023-11-22 エヌビディア コーポレーション 自動車用途のための配置中にビルトイン・セルフテストを実行するためのテスト・システム
US11249134B1 (en) * 2020-10-06 2022-02-15 Qualcomm Incorporated Power-collapsible boundary scan
CN112526327B (zh) * 2020-10-28 2022-07-08 深圳市紫光同创电子有限公司 边界扫描测试方法及存储介质
CN113589154B (zh) * 2021-08-31 2025-07-08 成都海光集成电路设计有限公司 一种边界扫描电路
CN113655376B (zh) * 2021-09-13 2025-04-04 成都海光集成电路设计有限公司 一种扫描测试交换网络和扫描测试方法
CN113938125B (zh) * 2021-10-19 2023-02-24 浙江大学 多通道可配置可测试与修调的数字信号隔离器

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CN113484719B (zh) * 2016-04-29 2025-03-14 德州仪器公司 全垫覆盖边界扫描

Also Published As

Publication number Publication date
US20190235020A1 (en) 2019-08-01
JP2022043194A (ja) 2022-03-15
JP2019515282A (ja) 2019-06-06
KR102247968B1 (ko) 2021-05-03
WO2017190123A1 (en) 2017-11-02
JP7239913B2 (ja) 2023-03-15
CN113484719A (zh) 2021-10-08
US20210215757A1 (en) 2021-07-15
JP2023063323A (ja) 2023-05-09
CN109154633A (zh) 2019-01-04
CN113484719B (zh) 2025-03-14
US20180045778A1 (en) 2018-02-15
JP7004316B2 (ja) 2022-02-04
KR20180133926A (ko) 2018-12-17
US10274538B2 (en) 2019-04-30
US10983161B2 (en) 2021-04-20
JP7505845B2 (ja) 2024-06-25
US9791505B1 (en) 2017-10-17
US11821945B2 (en) 2023-11-21
US20170315174A1 (en) 2017-11-02

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