CN108802436B - 电子零件试验装置用的载体 - Google Patents
电子零件试验装置用的载体 Download PDFInfo
- Publication number
- CN108802436B CN108802436B CN201810367833.XA CN201810367833A CN108802436B CN 108802436 B CN108802436 B CN 108802436B CN 201810367833 A CN201810367833 A CN 201810367833A CN 108802436 B CN108802436 B CN 108802436B
- Authority
- CN
- China
- Prior art keywords
- socket
- electronic component
- main body
- carrier
- testing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Environmental & Geological Engineering (AREA)
- Connecting Device With Holders (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017089448A JP6809978B2 (ja) | 2017-04-28 | 2017-04-28 | 電子部品試験装置用のキャリア |
JP2017-089448 | 2017-04-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108802436A CN108802436A (zh) | 2018-11-13 |
CN108802436B true CN108802436B (zh) | 2021-09-07 |
Family
ID=64093946
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810367833.XA Active CN108802436B (zh) | 2017-04-28 | 2018-04-23 | 电子零件试验装置用的载体 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6809978B2 (ko) |
KR (1) | KR102352458B1 (ko) |
CN (1) | CN108802436B (ko) |
TW (1) | TWI787250B (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102112810B1 (ko) * | 2019-02-22 | 2020-06-04 | 에이엠티 주식회사 | 단자의 피치가 좁은 패키지의 얼라인장치 및 그 방법 |
KR102405774B1 (ko) * | 2020-06-16 | 2022-06-07 | 미래산업 주식회사 | 필름 타입 캐리어 장치 |
JP2023055016A (ja) * | 2021-10-05 | 2023-04-17 | 株式会社アドバンテスト | 電子部品試験装置、ソケット、及び、キャリア |
CN114035018B (zh) * | 2022-01-07 | 2022-04-19 | 江苏明芯微电子股份有限公司 | 一种新型分立器件半自动复检装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1561656A (zh) * | 1998-12-04 | 2005-01-05 | 佛姆法克特股份有限公司 | 用于安装电子元件的方法 |
CN101149395A (zh) * | 2006-09-22 | 2008-03-26 | 株式会社爱德万测试 | 连接器组装体、插座型连接器及接口装置 |
CN102183716A (zh) * | 2009-12-18 | 2011-09-14 | 株式会社爱德万测试 | 载体装配装置 |
WO2016182289A1 (ko) * | 2015-05-08 | 2016-11-17 | (주)제이티 | 테스트소켓용 어댑터 |
CN106561084A (zh) * | 2014-04-28 | 2017-04-12 | 黄东源 | 半导体器件测试用插座装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4279413B2 (ja) * | 1999-07-16 | 2009-06-17 | 株式会社アドバンテスト | 電子部品試験装置用インサート |
JP2003066095A (ja) * | 2001-08-23 | 2003-03-05 | Ando Electric Co Ltd | デバイスキャリア及びオートハンドラ |
DE10297654B4 (de) * | 2002-03-06 | 2010-08-05 | Advantest Corp. | Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente |
KR100966169B1 (ko) * | 2005-10-13 | 2010-06-25 | 가부시키가이샤 어드밴티스트 | 인서트, 테스트 트레이 및 반도체 시험 장치 |
JP4065898B2 (ja) * | 2006-01-30 | 2008-03-26 | アルプス電気株式会社 | 接続ボード |
US7652495B2 (en) * | 2006-03-14 | 2010-01-26 | Micron Technology, Inc. | Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies |
JP5291632B2 (ja) * | 2007-11-26 | 2013-09-18 | 株式会社アドバンテスト | インサート、トレイ及び電子部品試験装置 |
JP5268629B2 (ja) * | 2008-12-26 | 2013-08-21 | 株式会社エンプラス | 電気部品用キャリア |
JP2012077769A (ja) * | 2010-09-30 | 2012-04-19 | Nippon Pop Rivets & Fasteners Ltd | ブラインドリベット及びその締結方法 |
JP2013168196A (ja) | 2012-02-14 | 2013-08-29 | Hitachi-Lg Data Storage Inc | 光ディスク装置 |
WO2016159316A1 (ja) * | 2015-03-31 | 2016-10-06 | 日本発條株式会社 | 合金材料、コンタクトプローブおよび接続端子 |
-
2017
- 2017-04-28 JP JP2017089448A patent/JP6809978B2/ja active Active
-
2018
- 2018-04-02 TW TW107111631A patent/TWI787250B/zh active
- 2018-04-09 KR KR1020180040857A patent/KR102352458B1/ko active IP Right Grant
- 2018-04-23 CN CN201810367833.XA patent/CN108802436B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1561656A (zh) * | 1998-12-04 | 2005-01-05 | 佛姆法克特股份有限公司 | 用于安装电子元件的方法 |
CN101149395A (zh) * | 2006-09-22 | 2008-03-26 | 株式会社爱德万测试 | 连接器组装体、插座型连接器及接口装置 |
CN102183716A (zh) * | 2009-12-18 | 2011-09-14 | 株式会社爱德万测试 | 载体装配装置 |
CN106561084A (zh) * | 2014-04-28 | 2017-04-12 | 黄东源 | 半导体器件测试用插座装置 |
WO2016182289A1 (ko) * | 2015-05-08 | 2016-11-17 | (주)제이티 | 테스트소켓용 어댑터 |
Non-Patent Citations (1)
Title |
---|
集成电路老化测试插座的结构形式;肖颖 等;《电子产品世界》;20110504(第五期);第45-48页 * |
Also Published As
Publication number | Publication date |
---|---|
KR102352458B1 (ko) | 2022-01-17 |
TWI787250B (zh) | 2022-12-21 |
JP6809978B2 (ja) | 2021-01-06 |
KR20180121361A (ko) | 2018-11-07 |
JP2018189392A (ja) | 2018-11-29 |
TW201842345A (zh) | 2018-12-01 |
CN108802436A (zh) | 2018-11-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108802436B (zh) | 电子零件试验装置用的载体 | |
JP7281518B2 (ja) | 試験用キャリア | |
KR100942527B1 (ko) | 전자부품 시험장치 | |
KR100810380B1 (ko) | 집적회로 시험장치 | |
CN1188238A (zh) | 半导体器件测试装置 | |
JP2003066104A (ja) | インサートおよびこれを備えた電子部品ハンドリング装置 | |
KR19990006956A (ko) | 반도체 집적회로 시험장치 | |
TWI387769B (zh) | 用於檢測微型sd裝置之方法 | |
TWI387761B (zh) | 用於檢測微型sd裝置的方法 | |
CN114994424A (zh) | 测试用载具 | |
CN108802595B (zh) | 电子部件试验装置用的载体 | |
CN108957285B (zh) | 电子部件试验装置用的载体 | |
KR101214808B1 (ko) | 전자부품 이송과 적재장치 및 이를 구비한 전자부품 시험장치 | |
TWI384242B (zh) | 用於檢測系統整合型封裝裝置的方法 | |
US20230105734A1 (en) | Electronic component testing apparatus, socket, and carrier | |
JP2000131384A (ja) | 電子部品試験装置用吸着装置 | |
JP2023008202A (ja) | 電子部品ハンドリング装置用のキャリアのコア、及び、キャリア、並びに、コアの取外方法 | |
JP2023167499A (ja) | キャリア、及び、テストトレイ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |