CN108802436B - 电子零件试验装置用的载体 - Google Patents

电子零件试验装置用的载体 Download PDF

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Publication number
CN108802436B
CN108802436B CN201810367833.XA CN201810367833A CN108802436B CN 108802436 B CN108802436 B CN 108802436B CN 201810367833 A CN201810367833 A CN 201810367833A CN 108802436 B CN108802436 B CN 108802436B
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Prior art keywords
socket
electronic component
main body
carrier
testing apparatus
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Chinese (zh)
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CN108802436A (zh
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筬部明浩
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Advantest Corp
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Advantest Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Environmental & Geological Engineering (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN201810367833.XA 2017-04-28 2018-04-23 电子零件试验装置用的载体 Active CN108802436B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017089448A JP6809978B2 (ja) 2017-04-28 2017-04-28 電子部品試験装置用のキャリア
JP2017-089448 2017-04-28

Publications (2)

Publication Number Publication Date
CN108802436A CN108802436A (zh) 2018-11-13
CN108802436B true CN108802436B (zh) 2021-09-07

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CN201810367833.XA Active CN108802436B (zh) 2017-04-28 2018-04-23 电子零件试验装置用的载体

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JP (1) JP6809978B2 (ko)
KR (1) KR102352458B1 (ko)
CN (1) CN108802436B (ko)
TW (1) TWI787250B (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102112810B1 (ko) * 2019-02-22 2020-06-04 에이엠티 주식회사 단자의 피치가 좁은 패키지의 얼라인장치 및 그 방법
KR102405774B1 (ko) * 2020-06-16 2022-06-07 미래산업 주식회사 필름 타입 캐리어 장치
JP2023055016A (ja) * 2021-10-05 2023-04-17 株式会社アドバンテスト 電子部品試験装置、ソケット、及び、キャリア
CN114035018B (zh) * 2022-01-07 2022-04-19 江苏明芯微电子股份有限公司 一种新型分立器件半自动复检装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1561656A (zh) * 1998-12-04 2005-01-05 佛姆法克特股份有限公司 用于安装电子元件的方法
CN101149395A (zh) * 2006-09-22 2008-03-26 株式会社爱德万测试 连接器组装体、插座型连接器及接口装置
CN102183716A (zh) * 2009-12-18 2011-09-14 株式会社爱德万测试 载体装配装置
WO2016182289A1 (ko) * 2015-05-08 2016-11-17 (주)제이티 테스트소켓용 어댑터
CN106561084A (zh) * 2014-04-28 2017-04-12 黄东源 半导体器件测试用插座装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4279413B2 (ja) * 1999-07-16 2009-06-17 株式会社アドバンテスト 電子部品試験装置用インサート
JP2003066095A (ja) * 2001-08-23 2003-03-05 Ando Electric Co Ltd デバイスキャリア及びオートハンドラ
DE10297654B4 (de) * 2002-03-06 2010-08-05 Advantest Corp. Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente
KR100966169B1 (ko) * 2005-10-13 2010-06-25 가부시키가이샤 어드밴티스트 인서트, 테스트 트레이 및 반도체 시험 장치
JP4065898B2 (ja) * 2006-01-30 2008-03-26 アルプス電気株式会社 接続ボード
US7652495B2 (en) * 2006-03-14 2010-01-26 Micron Technology, Inc. Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies
JP5291632B2 (ja) * 2007-11-26 2013-09-18 株式会社アドバンテスト インサート、トレイ及び電子部品試験装置
JP5268629B2 (ja) * 2008-12-26 2013-08-21 株式会社エンプラス 電気部品用キャリア
JP2012077769A (ja) * 2010-09-30 2012-04-19 Nippon Pop Rivets & Fasteners Ltd ブラインドリベット及びその締結方法
JP2013168196A (ja) 2012-02-14 2013-08-29 Hitachi-Lg Data Storage Inc 光ディスク装置
WO2016159316A1 (ja) * 2015-03-31 2016-10-06 日本発條株式会社 合金材料、コンタクトプローブおよび接続端子

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1561656A (zh) * 1998-12-04 2005-01-05 佛姆法克特股份有限公司 用于安装电子元件的方法
CN101149395A (zh) * 2006-09-22 2008-03-26 株式会社爱德万测试 连接器组装体、插座型连接器及接口装置
CN102183716A (zh) * 2009-12-18 2011-09-14 株式会社爱德万测试 载体装配装置
CN106561084A (zh) * 2014-04-28 2017-04-12 黄东源 半导体器件测试用插座装置
WO2016182289A1 (ko) * 2015-05-08 2016-11-17 (주)제이티 테스트소켓용 어댑터

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
集成电路老化测试插座的结构形式;肖颖 等;《电子产品世界》;20110504(第五期);第45-48页 *

Also Published As

Publication number Publication date
KR102352458B1 (ko) 2022-01-17
TWI787250B (zh) 2022-12-21
JP6809978B2 (ja) 2021-01-06
KR20180121361A (ko) 2018-11-07
JP2018189392A (ja) 2018-11-29
TW201842345A (zh) 2018-12-01
CN108802436A (zh) 2018-11-13

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