TWI787250B - 電子元件測試裝置用之載具 - Google Patents

電子元件測試裝置用之載具 Download PDF

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Publication number
TWI787250B
TWI787250B TW107111631A TW107111631A TWI787250B TW I787250 B TWI787250 B TW I787250B TW 107111631 A TW107111631 A TW 107111631A TW 107111631 A TW107111631 A TW 107111631A TW I787250 B TWI787250 B TW I787250B
Authority
TW
Taiwan
Prior art keywords
socket
electronic component
body part
carrier
testing device
Prior art date
Application number
TW107111631A
Other languages
English (en)
Chinese (zh)
Other versions
TW201842345A (zh
Inventor
筬部明浩
Original Assignee
日商阿德潘鐵斯特股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 日商阿德潘鐵斯特股份有限公司 filed Critical 日商阿德潘鐵斯特股份有限公司
Publication of TW201842345A publication Critical patent/TW201842345A/zh
Application granted granted Critical
Publication of TWI787250B publication Critical patent/TWI787250B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Environmental & Geological Engineering (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW107111631A 2017-04-28 2018-04-02 電子元件測試裝置用之載具 TWI787250B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017089448A JP6809978B2 (ja) 2017-04-28 2017-04-28 電子部品試験装置用のキャリア
JP2017-089448 2017-04-28

Publications (2)

Publication Number Publication Date
TW201842345A TW201842345A (zh) 2018-12-01
TWI787250B true TWI787250B (zh) 2022-12-21

Family

ID=64093946

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107111631A TWI787250B (zh) 2017-04-28 2018-04-02 電子元件測試裝置用之載具

Country Status (4)

Country Link
JP (1) JP6809978B2 (ko)
KR (1) KR102352458B1 (ko)
CN (1) CN108802436B (ko)
TW (1) TWI787250B (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102112810B1 (ko) * 2019-02-22 2020-06-04 에이엠티 주식회사 단자의 피치가 좁은 패키지의 얼라인장치 및 그 방법
KR102405774B1 (ko) * 2020-06-16 2022-06-07 미래산업 주식회사 필름 타입 캐리어 장치
JP2023055016A (ja) * 2021-10-05 2023-04-17 株式会社アドバンテスト 電子部品試験装置、ソケット、及び、キャリア
CN114035018B (zh) * 2022-01-07 2022-04-19 江苏明芯微电子股份有限公司 一种新型分立器件半自动复检装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200941832A (en) * 2007-11-26 2009-10-01 Advantest Corp Insert, tray and electronic component testing apparatus
TW201702392A (zh) * 2015-03-31 2017-01-16 日本發條股份有限公司 合金材料、接觸探針及連接端子

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69924152T2 (de) * 1998-12-04 2006-04-27 Formfactor, Inc., Livermore Verfahren zum Montieren eines elektronischen Beuteils
JP4279413B2 (ja) * 1999-07-16 2009-06-17 株式会社アドバンテスト 電子部品試験装置用インサート
JP2003066095A (ja) * 2001-08-23 2003-03-05 Ando Electric Co Ltd デバイスキャリア及びオートハンドラ
DE10297654B4 (de) * 2002-03-06 2010-08-05 Advantest Corp. Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente
KR100966169B1 (ko) * 2005-10-13 2010-06-25 가부시키가이샤 어드밴티스트 인서트, 테스트 트레이 및 반도체 시험 장치
JP4065898B2 (ja) * 2006-01-30 2008-03-26 アルプス電気株式会社 接続ボード
US7652495B2 (en) * 2006-03-14 2010-01-26 Micron Technology, Inc. Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies
JP4275163B2 (ja) * 2006-09-22 2009-06-10 株式会社アドバンテスト コネクタ組立体、リセプタクル型コネクタ及びインタフェース装置
JP5268629B2 (ja) * 2008-12-26 2013-08-21 株式会社エンプラス 電気部品用キャリア
JP5368290B2 (ja) * 2009-12-18 2013-12-18 株式会社アドバンテスト キャリア組立装置
JP2012077769A (ja) * 2010-09-30 2012-04-19 Nippon Pop Rivets & Fasteners Ltd ブラインドリベット及びその締結方法
JP2013168196A (ja) 2012-02-14 2013-08-29 Hitachi-Lg Data Storage Inc 光ディスク装置
KR101585182B1 (ko) * 2014-04-28 2016-01-14 황동원 반도체 소자 테스트용 소켓장치
TWI614507B (zh) * 2015-05-08 2018-02-11 宰體有限公司 測試插座用適配器

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200941832A (en) * 2007-11-26 2009-10-01 Advantest Corp Insert, tray and electronic component testing apparatus
TW201702392A (zh) * 2015-03-31 2017-01-16 日本發條股份有限公司 合金材料、接觸探針及連接端子

Also Published As

Publication number Publication date
KR102352458B1 (ko) 2022-01-17
CN108802436B (zh) 2021-09-07
JP6809978B2 (ja) 2021-01-06
KR20180121361A (ko) 2018-11-07
JP2018189392A (ja) 2018-11-29
TW201842345A (zh) 2018-12-01
CN108802436A (zh) 2018-11-13

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