CN108603288B - 生产氧化铝和/或氮化铝的方法 - Google Patents
生产氧化铝和/或氮化铝的方法 Download PDFInfo
- Publication number
- CN108603288B CN108603288B CN201680067039.2A CN201680067039A CN108603288B CN 108603288 B CN108603288 B CN 108603288B CN 201680067039 A CN201680067039 A CN 201680067039A CN 108603288 B CN108603288 B CN 108603288B
- Authority
- CN
- China
- Prior art keywords
- aluminum
- aluminium
- layer
- substrate
- base layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
- C23C14/5846—Reactive treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/08—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal halides
- C23C16/12—Deposition of aluminium only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1560933A FR3043699B1 (fr) | 2015-11-16 | 2015-11-16 | Procede de formation d'oxyde et/ou de nitrure d'aluminium et dispositif pour la mise en oeuvre d'un tel procede |
| FR1560933 | 2015-11-16 | ||
| PCT/FR2016/052956 WO2017085392A1 (fr) | 2015-11-16 | 2016-11-15 | Procede de formation d'oxyde et/ou de nitrure d'aluminium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108603288A CN108603288A (zh) | 2018-09-28 |
| CN108603288B true CN108603288B (zh) | 2020-01-14 |
Family
ID=55073006
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680067039.2A Active CN108603288B (zh) | 2015-11-16 | 2016-11-15 | 生产氧化铝和/或氮化铝的方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20180327907A1 (enExample) |
| EP (1) | EP3377672B1 (enExample) |
| JP (1) | JP6956099B2 (enExample) |
| CN (1) | CN108603288B (enExample) |
| FR (1) | FR3043699B1 (enExample) |
| WO (1) | WO2017085392A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110218362A (zh) * | 2018-03-04 | 2019-09-10 | 盐城增材科技有限公司 | 一种石墨烯/氧化铝/氮化铝界面导热导电增强橡胶及其制备方法 |
| KR102620219B1 (ko) * | 2018-11-02 | 2024-01-02 | 삼성전자주식회사 | 기판 처리 방법 및 기판 처리 장치 |
| CN111455351A (zh) * | 2020-04-10 | 2020-07-28 | 厦门大学 | 一种氮化铝-氧化铝薄膜及其制备方法和应用 |
| US20220320417A1 (en) * | 2021-04-01 | 2022-10-06 | Applied Materials, Inc. | Method of manufacturing aluminum nitride films |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004009861A3 (en) * | 2002-07-19 | 2004-07-22 | Asm Inc | Method to form ultra high quality silicon-containing compound layers |
| CN102400091A (zh) * | 2010-09-10 | 2012-04-04 | 鸿富锦精密工业(深圳)有限公司 | 铝合金的表面处理方法及由铝合金制得的壳体 |
| CN102409293A (zh) * | 2011-12-04 | 2012-04-11 | 中国航天科技集团公司第五研究院第五一〇研究所 | 一种氧化铝薄膜的制备方法 |
| CN104561928A (zh) * | 2014-12-24 | 2015-04-29 | 浙江大学 | 一种在玻璃基底上沉积二氧化硅薄膜的方法 |
| CN104851796A (zh) * | 2014-02-18 | 2015-08-19 | 朗姆研究公司 | 用于保形氮化铝的高增长速率的工艺 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06101019A (ja) * | 1992-09-18 | 1994-04-12 | Fujitsu Ltd | アルミナ膜形成方法 |
| JP3781787B2 (ja) * | 1993-10-26 | 2006-05-31 | 株式会社半導体エネルギー研究所 | 多目的基板処理装置およびその動作方法および薄膜集積回路の作製方法 |
| JP4531145B2 (ja) * | 1997-05-27 | 2010-08-25 | 株式会社アルバック | 極薄絶縁膜形成方法 |
| JP3708940B2 (ja) * | 2003-10-27 | 2005-10-19 | 株式会社東芝 | Cvd装置の反応室のコーティング方法 |
| US7595967B1 (en) * | 2004-09-07 | 2009-09-29 | Western Digital (Fremont), Llp | Method for fabricating a spacer layer for a magnetoresistive element |
| JP2006086468A (ja) * | 2004-09-17 | 2006-03-30 | Canon Anelva Corp | 磁気抵抗膜の製造方法及び製造装置 |
| US7723205B2 (en) * | 2005-09-27 | 2010-05-25 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device, manufacturing method thereof, liquid crystal display device, RFID tag, light emitting device, and electronic device |
| JP4680140B2 (ja) * | 2006-07-14 | 2011-05-11 | 日本碍子株式会社 | AlN単結晶膜の形成方法 |
| US8383439B2 (en) * | 2007-10-25 | 2013-02-26 | Showa Denko K.K. | Apparatus for manufacturing group-III nitride semiconductor layer, method of manufacturing group-III nitride semiconductor layer, group-III nitride semiconductor light-emitting device, method of manufacturing group-III nitride semiconductor light-emitting device, and lamp |
| JP5304070B2 (ja) * | 2007-10-25 | 2013-10-02 | 豊田合成株式会社 | Iii族窒化物半導体層の製造装置、iii族窒化物半導体層の製造方法、及びiii族窒化物半導体発光素子の製造方法 |
| US20140124788A1 (en) * | 2012-11-06 | 2014-05-08 | Intermolecular, Inc. | Chemical Vapor Deposition System |
-
2015
- 2015-11-16 FR FR1560933A patent/FR3043699B1/fr active Active
-
2016
- 2016-11-15 US US15/775,984 patent/US20180327907A1/en active Pending
- 2016-11-15 WO PCT/FR2016/052956 patent/WO2017085392A1/fr not_active Ceased
- 2016-11-15 EP EP16809496.9A patent/EP3377672B1/fr active Active
- 2016-11-15 JP JP2018544434A patent/JP6956099B2/ja active Active
- 2016-11-15 CN CN201680067039.2A patent/CN108603288B/zh active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004009861A3 (en) * | 2002-07-19 | 2004-07-22 | Asm Inc | Method to form ultra high quality silicon-containing compound layers |
| CN102400091A (zh) * | 2010-09-10 | 2012-04-04 | 鸿富锦精密工业(深圳)有限公司 | 铝合金的表面处理方法及由铝合金制得的壳体 |
| CN102409293A (zh) * | 2011-12-04 | 2012-04-11 | 中国航天科技集团公司第五研究院第五一〇研究所 | 一种氧化铝薄膜的制备方法 |
| CN104851796A (zh) * | 2014-02-18 | 2015-08-19 | 朗姆研究公司 | 用于保形氮化铝的高增长速率的工艺 |
| CN104561928A (zh) * | 2014-12-24 | 2015-04-29 | 浙江大学 | 一种在玻璃基底上沉积二氧化硅薄膜的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3377672A1 (fr) | 2018-09-26 |
| EP3377672B1 (fr) | 2019-08-07 |
| CN108603288A (zh) | 2018-09-28 |
| US20180327907A1 (en) | 2018-11-15 |
| FR3043699A1 (fr) | 2017-05-19 |
| WO2017085392A1 (fr) | 2017-05-26 |
| FR3043699B1 (fr) | 2019-06-14 |
| JP2018535329A (ja) | 2018-11-29 |
| JP6956099B2 (ja) | 2021-10-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI862632B (zh) | 使用氟移除形成一結構之方法 | |
| JP2023015253A (ja) | 半導体処理装置 | |
| CN110050329B (zh) | 在衬底上形成结构的方法 | |
| TWI426547B (zh) | 用於批次原子層沈積反應器之處理製程 | |
| JP6813983B2 (ja) | アルミニウム及び窒素を含む材料の選択的堆積 | |
| CN108603288B (zh) | 生产氧化铝和/或氮化铝的方法 | |
| TWI605147B (zh) | 在批式反應器中循環氮化鋁沈積 | |
| US9219006B2 (en) | Flowable carbon film by FCVD hardware using remote plasma PECVD | |
| JP4133659B2 (ja) | CMOSアプリケーション用の多重高κゲート誘電体を堆積する方法 | |
| TW201712140A (zh) | 選擇性地沉積材料的方法及選擇性地沉積金屬氧化物膜的方法 | |
| CN108411281A (zh) | 通过热ald和peald沉积氧化物膜的方法 | |
| TW201715071A (zh) | 以peald形成氮化鋁基膜的方法 | |
| TW201234425A (en) | In situ vapor phase surface activation of SiO2 | |
| JP2003068732A (ja) | 原子層堆積法を用いて基板上に高誘電率材料を堆積する方法 | |
| TW200525648A (en) | Nitridation of high-k dielectric films | |
| CN112514051A (zh) | 3d nand蚀刻 | |
| TW201220397A (en) | Method of depositing cyclic thin film | |
| TW202107527A (zh) | 加強材料結構的處置 | |
| CN113423864B (zh) | 氮化硅的选择性沉积 | |
| JP2006245089A (ja) | 薄膜形成方法 | |
| US20080305646A1 (en) | Atomic layer deposition | |
| JP2018535329A5 (enExample) | ||
| CN100461343C (zh) | 用于半导体器件的使用预处理的材料原子层沉积的方法 | |
| KR100958265B1 (ko) | 기판 처리 방법, 컴퓨터 판독 가능 기록 매체, 기판 처리장치, 및 기판 처리 시스템 | |
| JP4933720B2 (ja) | 成膜方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |