CN107424901B - 具有方位角与径向分布控制的多区域气体注入组件 - Google Patents
具有方位角与径向分布控制的多区域气体注入组件 Download PDFInfo
- Publication number
- CN107424901B CN107424901B CN201710705541.8A CN201710705541A CN107424901B CN 107424901 B CN107424901 B CN 107424901B CN 201710705541 A CN201710705541 A CN 201710705541A CN 107424901 B CN107424901 B CN 107424901B
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- CN
- China
- Prior art keywords
- gas
- slot
- nozzle
- ring
- side air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/32—Plasma torches using an arc
- H05H1/34—Details, e.g. electrodes, nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361777225P | 2013-03-12 | 2013-03-12 | |
| US61/777,225 | 2013-03-12 | ||
| CN201480003019.XA CN104798446B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480003019.XA Division CN104798446B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107424901A CN107424901A (zh) | 2017-12-01 |
| CN107424901B true CN107424901B (zh) | 2019-06-11 |
Family
ID=51658780
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710705541.8A Active CN107424901B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
| CN201480003019.XA Active CN104798446B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
| CN201610852971.8A Active CN106304597B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480003019.XA Active CN104798446B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
| CN201610852971.8A Active CN106304597B (zh) | 2013-03-12 | 2014-02-03 | 具有方位角与径向分布控制的多区域气体注入组件 |
Country Status (6)
| Country | Link |
|---|---|
| US (3) | US10008368B2 (enExample) |
| JP (3) | JP6473131B2 (enExample) |
| KR (3) | KR102152858B1 (enExample) |
| CN (3) | CN107424901B (enExample) |
| TW (1) | TWI586829B (enExample) |
| WO (1) | WO2014163742A1 (enExample) |
Families Citing this family (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9574268B1 (en) | 2011-10-28 | 2017-02-21 | Asm America, Inc. | Pulsed valve manifold for atomic layer deposition |
| KR102152858B1 (ko) * | 2013-03-12 | 2020-09-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 방위각 및 방사상 분배 제어되는 다중-구역 가스 주입 조립체 |
| JP6359627B2 (ja) * | 2013-03-15 | 2018-07-18 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 高対称四重ガス注入によるプラズマリアクタ |
| US20150118416A1 (en) * | 2013-10-31 | 2015-04-30 | Semes Co., Ltd. | Substrate treating apparatus and method |
| CN105529237B (zh) * | 2014-10-23 | 2018-05-01 | 中微半导体设备(上海)有限公司 | 气体导流环、气体供应装置及等离子体处理装置 |
| JP6258184B2 (ja) * | 2014-11-13 | 2018-01-10 | 東京エレクトロン株式会社 | 基板処理装置 |
| US10658222B2 (en) * | 2015-01-16 | 2020-05-19 | Lam Research Corporation | Moveable edge coupling ring for edge process control during semiconductor wafer processing |
| US10957561B2 (en) * | 2015-07-30 | 2021-03-23 | Lam Research Corporation | Gas delivery system |
| US10279417B2 (en) * | 2015-10-06 | 2019-05-07 | Hypertherm, Inc. | Controlling and delivering gases in a plasma arc torch and related systems and methods |
| CN106876299B (zh) * | 2015-12-11 | 2019-08-23 | 北京北方华创微电子装备有限公司 | 半导体加工设备 |
| US10825659B2 (en) | 2016-01-07 | 2020-11-03 | Lam Research Corporation | Substrate processing chamber including multiple gas injection points and dual injector |
| US10699878B2 (en) | 2016-02-12 | 2020-06-30 | Lam Research Corporation | Chamber member of a plasma source and pedestal with radially outward positioned lift pins for translation of a substrate c-ring |
| US10651015B2 (en) | 2016-02-12 | 2020-05-12 | Lam Research Corporation | Variable depth edge ring for etch uniformity control |
| US10438833B2 (en) | 2016-02-16 | 2019-10-08 | Lam Research Corporation | Wafer lift ring system for wafer transfer |
| US10304668B2 (en) * | 2016-05-24 | 2019-05-28 | Tokyo Electron Limited | Localized process control using a plasma system |
| US10662527B2 (en) | 2016-06-01 | 2020-05-26 | Asm Ip Holding B.V. | Manifolds for uniform vapor deposition |
| US10410832B2 (en) | 2016-08-19 | 2019-09-10 | Lam Research Corporation | Control of on-wafer CD uniformity with movable edge ring and gas injection adjustment |
| CN106783500A (zh) * | 2017-01-03 | 2017-05-31 | 京东方科技集团股份有限公司 | 镀膜设备 |
| KR20240118902A (ko) * | 2017-04-10 | 2024-08-05 | 피코순 오와이 | 균일한 증착 |
| KR101979599B1 (ko) * | 2017-05-11 | 2019-05-21 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| WO2018222430A2 (en) * | 2017-05-31 | 2018-12-06 | Lam Research Corporation | Detection system for tunable/replaceable edge coupling ring |
| US10927459B2 (en) | 2017-10-16 | 2021-02-23 | Asm Ip Holding B.V. | Systems and methods for atomic layer deposition |
| CN118380374A (zh) | 2017-11-21 | 2024-07-23 | 朗姆研究公司 | 底部边缘环和中部边缘环 |
| US10751765B2 (en) * | 2018-08-13 | 2020-08-25 | Applied Materials, Inc. | Remote plasma source cleaning nozzle for cleaning a gas distribution plate |
| JP2022515081A (ja) * | 2018-12-20 | 2022-02-17 | アプライド マテリアルズ インコーポレイテッド | 処理チャンバの処理空間に改善されたガス流を供給するための方法および装置 |
| US11486038B2 (en) * | 2019-01-30 | 2022-11-01 | Applied Materials, Inc. | Asymmetric injection for better wafer uniformity |
| US11492701B2 (en) | 2019-03-19 | 2022-11-08 | Asm Ip Holding B.V. | Reactor manifolds |
| US12467139B2 (en) | 2019-03-29 | 2025-11-11 | Applied Materials Inc. | Multizone flow distribution system |
| CN112017932B (zh) * | 2019-05-31 | 2022-11-29 | 中微半导体设备(上海)股份有限公司 | 等离子体处理装置中气体输送系统的耐腐蚀结构 |
| US11150120B2 (en) * | 2019-09-22 | 2021-10-19 | Applied Materials, Inc. | Low temperature thermal flow ratio controller |
| KR20210048408A (ko) | 2019-10-22 | 2021-05-03 | 에이에스엠 아이피 홀딩 비.브이. | 반도체 증착 반응기 매니폴드 |
| JP7330079B2 (ja) * | 2019-11-28 | 2023-08-21 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| CN115088053A (zh) * | 2019-12-13 | 2022-09-20 | 瑞士艾发科技 | 用于pvd源的气环 |
| JP7333762B2 (ja) * | 2020-02-05 | 2023-08-25 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| CN115315775A (zh) | 2020-03-23 | 2022-11-08 | 朗姆研究公司 | 衬底处理系统中的中环腐蚀补偿 |
| CN111564399B (zh) * | 2020-05-25 | 2023-12-22 | 北京北方华创微电子装备有限公司 | 半导体工艺设备中的匀流机构及半导体工艺设备 |
| JP7743509B2 (ja) * | 2020-09-28 | 2025-09-24 | ラム リサーチ コーポレーション | 真のラジカル処理のためのリモートプラズマアーキテクチャ |
| JP7614051B2 (ja) * | 2020-10-05 | 2025-01-15 | 東京エレクトロン株式会社 | ガス供給リングおよび基板処理装置 |
| CN114381717A (zh) * | 2020-10-05 | 2022-04-22 | 东京毅力科创株式会社 | 气体供给环和基片处理装置 |
| CN112981371B (zh) * | 2021-02-03 | 2023-05-30 | 上海大学绍兴研究院 | 一种化学气相沉积模具 |
| US20230057145A1 (en) * | 2021-08-23 | 2023-02-23 | Applied Materials, Inc. | Plasma chamber with a multiphase rotating cross-flow with uniformity tuning |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002530860A (ja) * | 1998-11-13 | 2002-09-17 | アプライド マテリアルズ インコーポレイテッド | Cvd処理チャンバのガス分配システム |
| CN101197271A (zh) * | 2006-12-06 | 2008-06-11 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 气体注射装置 |
| JP2009194125A (ja) * | 2008-02-14 | 2009-08-27 | Seiko Epson Corp | 半導体装置の製造装置 |
| WO2011021539A1 (ja) * | 2009-08-20 | 2011-02-24 | 東京エレクトロン株式会社 | プラズマ処理装置とプラズマ処理方法 |
Family Cites Families (107)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5742362A (en) * | 1980-08-22 | 1982-03-09 | Ikeuchi:Kk | Atomized spray generator |
| US5000113A (en) * | 1986-12-19 | 1991-03-19 | Applied Materials, Inc. | Thermal CVD/PECVD reactor and use for thermal chemical vapor deposition of silicon dioxide and in-situ multi-step planarized process |
| JP2655685B2 (ja) | 1988-07-01 | 1997-09-24 | 沖電気工業株式会社 | 音声帯域信号処理プロセッサ |
| JPH0726840Y2 (ja) * | 1988-07-13 | 1995-06-14 | セイコー電子工業株式会社 | 集束イオンビーム装置のガス導入装置 |
| US5188671A (en) * | 1990-08-08 | 1993-02-23 | Hughes Aircraft Company | Multichannel plate assembly for gas source molecular beam epitaxy |
| US6165311A (en) | 1991-06-27 | 2000-12-26 | Applied Materials, Inc. | Inductively coupled RF plasma reactor having an overhead solenoidal antenna |
| CH687258A5 (de) * | 1993-04-22 | 1996-10-31 | Balzers Hochvakuum | Gaseinlassanordnung. |
| US5614055A (en) * | 1993-08-27 | 1997-03-25 | Applied Materials, Inc. | High density plasma CVD and etching reactor |
| JPH07161688A (ja) * | 1993-12-03 | 1995-06-23 | Toshiba Corp | エッチング装置 |
| US5522934A (en) * | 1994-04-26 | 1996-06-04 | Tokyo Electron Limited | Plasma processing apparatus using vertical gas inlets one on top of another |
| US5702530A (en) * | 1995-06-23 | 1997-12-30 | Applied Materials, Inc. | Distributed microwave plasma reactor for semiconductor processing |
| TW283250B (en) * | 1995-07-10 | 1996-08-11 | Watkins Johnson Co | Plasma enhanced chemical processing reactor and method |
| DE29517100U1 (de) * | 1995-10-17 | 1997-02-13 | Zimmer, Johannes, Klagenfurt | Strömungsteilungs- und -umformungskörper |
| TW356554B (en) * | 1995-10-23 | 1999-04-21 | Watkins Johnson Co | Gas injection system for semiconductor processing |
| US5772771A (en) * | 1995-12-13 | 1998-06-30 | Applied Materials, Inc. | Deposition chamber for improved deposition thickness uniformity |
| US5746834A (en) * | 1996-01-04 | 1998-05-05 | Memc Electronics Materials, Inc. | Method and apparatus for purging barrel reactors |
| US6200412B1 (en) * | 1996-02-16 | 2001-03-13 | Novellus Systems, Inc. | Chemical vapor deposition system including dedicated cleaning gas injection |
| US6070551A (en) * | 1996-05-13 | 2000-06-06 | Applied Materials, Inc. | Deposition chamber and method for depositing low dielectric constant films |
| JP2000514136A (ja) * | 1996-06-28 | 2000-10-24 | ラム リサーチ コーポレイション | 高密度プラズマ化学蒸着装置および方法 |
| US6013155A (en) * | 1996-06-28 | 2000-01-11 | Lam Research Corporation | Gas injection system for plasma processing |
| US6626185B2 (en) * | 1996-06-28 | 2003-09-30 | Lam Research Corporation | Method of depositing a silicon containing layer on a semiconductor substrate |
| US5885358A (en) * | 1996-07-09 | 1999-03-23 | Applied Materials, Inc. | Gas injection slit nozzle for a plasma process reactor |
| JPH10242129A (ja) * | 1997-02-26 | 1998-09-11 | Ebara Corp | ガスエッチング方法、ガス噴出用ノズル及びガスエッチング装置 |
| US5846330A (en) * | 1997-06-26 | 1998-12-08 | Celestech, Inc. | Gas injection disc assembly for CVD applications |
| JP3266567B2 (ja) | 1998-05-18 | 2002-03-18 | 松下電器産業株式会社 | 真空処理装置 |
| US6486081B1 (en) * | 1998-11-13 | 2002-11-26 | Applied Materials, Inc. | Gas distribution system for a CVD processing chamber |
| US6230651B1 (en) * | 1998-12-30 | 2001-05-15 | Lam Research Corporation | Gas injection system for plasma processing |
| US6372291B1 (en) * | 1999-12-23 | 2002-04-16 | Applied Materials, Inc. | In situ deposition and integration of silicon nitride in a high density plasma reactor |
| US6503368B1 (en) * | 2000-06-29 | 2003-01-07 | Applied Materials Inc. | Substrate support having bonded sections and method |
| US6896737B1 (en) * | 2000-08-28 | 2005-05-24 | Micron Technology, Inc. | Gas delivery device for improved deposition of dielectric material |
| US6333272B1 (en) * | 2000-10-06 | 2001-12-25 | Lam Research Corporation | Gas distribution apparatus for semiconductor processing |
| US6589868B2 (en) * | 2001-02-08 | 2003-07-08 | Applied Materials, Inc. | Si seasoning to reduce particles, extend clean frequency, block mobile ions and increase chamber throughput |
| US20030192645A1 (en) * | 2002-04-16 | 2003-10-16 | Applied Materials, Inc. | Method and apparatus for creating circumferential process gas flow in a semiconductor wafer plasma reactor chamber |
| JP3861036B2 (ja) * | 2002-08-09 | 2006-12-20 | 三菱重工業株式会社 | プラズマcvd装置 |
| KR100862658B1 (ko) * | 2002-11-15 | 2008-10-10 | 삼성전자주식회사 | 반도체 처리 시스템의 가스 주입 장치 |
| US7169231B2 (en) * | 2002-12-13 | 2007-01-30 | Lam Research Corporation | Gas distribution system with tuning gas |
| KR100500246B1 (ko) * | 2003-04-09 | 2005-07-11 | 삼성전자주식회사 | 가스공급장치 |
| US7250114B2 (en) * | 2003-05-30 | 2007-07-31 | Lam Research Corporation | Methods of finishing quartz glass surfaces and components made by the methods |
| US7323231B2 (en) * | 2003-10-09 | 2008-01-29 | Micron Technology, Inc. | Apparatus and methods for plasma vapor deposition processes |
| JP4550507B2 (ja) * | 2004-07-26 | 2010-09-22 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US20060021633A1 (en) * | 2004-07-27 | 2006-02-02 | Applied Materials, Inc. | Closed loop clean gas control |
| US20060042754A1 (en) | 2004-07-30 | 2006-03-02 | Tokyo Electron Limited | Plasma etching apparatus |
| JP4559202B2 (ja) | 2004-07-30 | 2010-10-06 | 東京エレクトロン株式会社 | プラズマエッチング装置 |
| US7722737B2 (en) * | 2004-11-29 | 2010-05-25 | Applied Materials, Inc. | Gas distribution system for improved transient phase deposition |
| US20060124169A1 (en) * | 2004-12-09 | 2006-06-15 | Tokyo Electron Limited | Gas supply unit, substrate processing apparatus, and supply gas setting method |
| US7510624B2 (en) * | 2004-12-17 | 2009-03-31 | Applied Materials, Inc. | Self-cooling gas delivery apparatus under high vacuum for high density plasma applications |
| US7722719B2 (en) * | 2005-03-07 | 2010-05-25 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
| US20070021935A1 (en) * | 2005-07-12 | 2007-01-25 | Larson Dean J | Methods for verifying gas flow rates from a gas supply system into a plasma processing chamber |
| US7651587B2 (en) * | 2005-08-11 | 2010-01-26 | Applied Materials, Inc. | Two-piece dome with separate RF coils for inductively coupled plasma reactors |
| EP1949406B1 (en) * | 2005-10-05 | 2010-12-08 | PVA TePla AG | Plasma etching method and etching chamber |
| US7679024B2 (en) * | 2005-12-23 | 2010-03-16 | Lam Research Corporation | Highly efficient gas distribution arrangement for plasma tube of a plasma processing chamber |
| US20070151668A1 (en) * | 2006-01-04 | 2007-07-05 | Tokyo Electron Limited | Gas supply system, substrate processing apparatus, and gas supply method |
| US8088248B2 (en) * | 2006-01-11 | 2012-01-03 | Lam Research Corporation | Gas switching section including valves having different flow coefficients for gas distribution system |
| US7896967B2 (en) * | 2006-02-06 | 2011-03-01 | Tokyo Electron Limited | Gas supply system, substrate processing apparatus and gas supply method |
| US20070202701A1 (en) * | 2006-02-27 | 2007-08-30 | Tokyo Electron Limited | Plasma etching apparatus and method |
| US8187415B2 (en) * | 2006-04-21 | 2012-05-29 | Applied Materials, Inc. | Plasma etch reactor with distribution of etch gases across a wafer surface and a polymer oxidizing gas in an independently fed center gas zone |
| US8231799B2 (en) * | 2006-04-28 | 2012-07-31 | Applied Materials, Inc. | Plasma reactor apparatus with multiple gas injection zones having time-changing separate configurable gas compositions for each zone |
| US7431859B2 (en) * | 2006-04-28 | 2008-10-07 | Applied Materials, Inc. | Plasma etch process using polymerizing etch gases with different etch and polymer-deposition rates in different radial gas injection zones with time modulation |
| US7540971B2 (en) * | 2006-04-28 | 2009-06-02 | Applied Materials, Inc. | Plasma etch process using polymerizing etch gases across a wafer surface and additional polymer managing or controlling gases in independently fed gas zones with time and spatial modulation of gas content |
| US7680737B2 (en) * | 2006-07-06 | 2010-03-16 | Moneygram International, Inc. | Systems and methods for processing payments with payment review features |
| US20080078746A1 (en) * | 2006-08-15 | 2008-04-03 | Noriiki Masuda | Substrate processing system, gas supply unit, method of substrate processing, computer program, and storage medium |
| US7976671B2 (en) * | 2006-10-30 | 2011-07-12 | Applied Materials, Inc. | Mask etch plasma reactor with variable process gas distribution |
| US20080099437A1 (en) * | 2006-10-30 | 2008-05-01 | Richard Lewington | Plasma reactor for processing a transparent workpiece with backside process endpoint detection |
| US8012366B2 (en) * | 2006-10-30 | 2011-09-06 | Applied Materials, Inc. | Process for etching a transparent workpiece including backside endpoint detection steps |
| US7967930B2 (en) * | 2006-10-30 | 2011-06-28 | Applied Materials, Inc. | Plasma reactor for processing a workpiece and having a tunable cathode |
| US8002946B2 (en) * | 2006-10-30 | 2011-08-23 | Applied Materials, Inc. | Mask etch plasma reactor with cathode providing a uniform distribution of etch rate |
| US8017029B2 (en) * | 2006-10-30 | 2011-09-13 | Applied Materials, Inc. | Plasma mask etch method of controlling a reactor tunable element in accordance with the output of an array of optical sensors viewing the mask backside |
| US9218944B2 (en) | 2006-10-30 | 2015-12-22 | Applied Materials, Inc. | Mask etch plasma reactor having an array of optical sensors viewing the workpiece backside and a tunable element controlled in response to the optical sensors |
| US20080099450A1 (en) * | 2006-10-30 | 2008-05-01 | Applied Materials, Inc. | Mask etch plasma reactor with backside optical sensors and multiple frequency control of etch distribution |
| US20080124944A1 (en) * | 2006-11-28 | 2008-05-29 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
| US7758698B2 (en) * | 2006-11-28 | 2010-07-20 | Applied Materials, Inc. | Dual top gas feed through distributor for high density plasma chamber |
| US7740706B2 (en) * | 2006-11-28 | 2010-06-22 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
| US8043432B2 (en) * | 2007-02-12 | 2011-10-25 | Tokyo Electron Limited | Atomic layer deposition systems and methods |
| KR20100014501A (ko) * | 2007-03-22 | 2010-02-10 | 파나소닉 주식회사 | 플라즈마 처리 장치 및 플라즈마 처리 방법 |
| US7691755B2 (en) | 2007-05-15 | 2010-04-06 | Applied Materials, Inc. | Plasma immersion ion implantation with highly uniform chamber seasoning process for a toroidal source reactor |
| JP5051757B2 (ja) * | 2007-06-15 | 2012-10-17 | シャープ株式会社 | 気相成長装置および気相成長方法 |
| US7466506B1 (en) | 2007-06-19 | 2008-12-16 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetic recording disk drive with head positioning servo control system for disk surfaces with identical servo patterns |
| CN101802254B (zh) * | 2007-10-11 | 2013-11-27 | 瓦伦斯处理设备公司 | 化学气相沉积反应器 |
| JP5192214B2 (ja) * | 2007-11-02 | 2013-05-08 | 東京エレクトロン株式会社 | ガス供給装置、基板処理装置および基板処理方法 |
| US8329593B2 (en) * | 2007-12-12 | 2012-12-11 | Applied Materials, Inc. | Method and apparatus for removing polymer from the wafer backside and edge |
| US8512509B2 (en) * | 2007-12-19 | 2013-08-20 | Applied Materials, Inc. | Plasma reactor gas distribution plate with radially distributed path splitting manifold |
| US20090178714A1 (en) * | 2008-01-14 | 2009-07-16 | Tokyo Electron Limited | Flow control system and method for multizone gas distribution |
| US20090221149A1 (en) * | 2008-02-28 | 2009-09-03 | Hammond Iv Edward P | Multiple port gas injection system utilized in a semiconductor processing system |
| US20090275206A1 (en) * | 2008-05-05 | 2009-11-05 | Applied Materials, Inc. | Plasma process employing multiple zone gas distribution for improved uniformity of critical dimension bias |
| JP2009302324A (ja) * | 2008-06-13 | 2009-12-24 | Tokyo Electron Ltd | ガスリング、半導体基板処理装置および半導体基板処理方法 |
| CN102326458A (zh) * | 2009-02-06 | 2012-01-18 | 国立大学法人东北大学 | 等离子体处理装置 |
| US8382939B2 (en) * | 2009-07-13 | 2013-02-26 | Applied Materials, Inc. | Plasma processing chamber with enhanced gas delivery |
| KR200479181Y1 (ko) | 2009-09-10 | 2015-12-30 | 램 리써치 코포레이션 | 플라즈마 처리 장치의 교체가능한 상부 체임버 부품 |
| US9540731B2 (en) * | 2009-12-04 | 2017-01-10 | Applied Materials, Inc. | Reconfigurable multi-zone gas delivery hardware for substrate processing showerheads |
| KR101810532B1 (ko) * | 2010-03-12 | 2017-12-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 다중 인젝트를 이용하는 원자 층 증착 챔버 |
| JP2012004196A (ja) * | 2010-06-15 | 2012-01-05 | Tokyo Electron Ltd | プラズマ処理装置及びその処理ガス供給構造 |
| KR101772723B1 (ko) * | 2010-06-28 | 2017-08-29 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 방법 |
| US9245717B2 (en) * | 2011-05-31 | 2016-01-26 | Lam Research Corporation | Gas distribution system for ceramic showerhead of plasma etch reactor |
| KR101969611B1 (ko) * | 2011-10-07 | 2019-04-16 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 장치 |
| JP2014036148A (ja) * | 2012-08-09 | 2014-02-24 | Tokyo Electron Ltd | 多層膜をエッチングする方法、及びプラズマ処理装置 |
| JP6140412B2 (ja) * | 2012-09-21 | 2017-05-31 | 東京エレクトロン株式会社 | ガス供給方法及びプラズマ処理装置 |
| KR102152858B1 (ko) * | 2013-03-12 | 2020-09-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 방위각 및 방사상 분배 제어되는 다중-구역 가스 주입 조립체 |
| JP6359627B2 (ja) * | 2013-03-15 | 2018-07-18 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 高対称四重ガス注入によるプラズマリアクタ |
| JP2015130325A (ja) * | 2013-12-03 | 2015-07-16 | 東京エレクトロン株式会社 | 誘電体窓、アンテナ、及びプラズマ処理装置 |
| JP6320248B2 (ja) * | 2014-03-04 | 2018-05-09 | 東京エレクトロン株式会社 | プラズマエッチング方法 |
| JP2016036018A (ja) * | 2014-07-31 | 2016-03-17 | 東京エレクトロン株式会社 | プラズマ処理装置及びガス供給部材 |
| WO2016061475A1 (en) * | 2014-10-17 | 2016-04-21 | Lam Research Corporation | Gas supply delivery arrangement including a gas splitter for tunable gas flow control |
| JP6297509B2 (ja) * | 2015-01-26 | 2018-03-20 | 東京エレクトロン株式会社 | 基板処理装置 |
| JP2017045849A (ja) * | 2015-08-26 | 2017-03-02 | 東京エレクトロン株式会社 | シーズニング方法およびエッチング方法 |
| JP6504017B2 (ja) * | 2015-10-21 | 2019-04-24 | 東京エレクトロン株式会社 | 基板処理装置 |
| JP6590735B2 (ja) * | 2016-03-04 | 2019-10-16 | 東京エレクトロン株式会社 | 混合ガス複数系統供給システム及びこれを用いた基板処理装置 |
| US20180122655A1 (en) * | 2016-10-28 | 2018-05-03 | Applied Materials, Inc. | Endpoint gas line filter for substrate processing equipment |
-
2014
- 2014-02-03 KR KR1020157019717A patent/KR102152858B1/ko active Active
- 2014-02-03 KR KR1020187003128A patent/KR102104018B1/ko active Active
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- 2014-02-03 CN CN201710705541.8A patent/CN107424901B/zh active Active
- 2014-02-03 CN CN201480003019.XA patent/CN104798446B/zh active Active
- 2014-02-03 CN CN201610852971.8A patent/CN106304597B/zh active Active
- 2014-02-03 WO PCT/US2014/014389 patent/WO2014163742A1/en not_active Ceased
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002530860A (ja) * | 1998-11-13 | 2002-09-17 | アプライド マテリアルズ インコーポレイテッド | Cvd処理チャンバのガス分配システム |
| CN101197271A (zh) * | 2006-12-06 | 2008-06-11 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 气体注射装置 |
| JP2009194125A (ja) * | 2008-02-14 | 2009-08-27 | Seiko Epson Corp | 半導体装置の製造装置 |
| WO2011021539A1 (ja) * | 2009-08-20 | 2011-02-24 | 東京エレクトロン株式会社 | プラズマ処理装置とプラズマ処理方法 |
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| CN106304597A (zh) | 2017-01-04 |
| TWI586829B (zh) | 2017-06-11 |
| KR20200043538A (ko) | 2020-04-27 |
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| US10410841B2 (en) | 2019-09-10 |
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| KR102152858B1 (ko) | 2020-09-07 |
| KR102176189B1 (ko) | 2020-11-09 |
| WO2014163742A1 (en) | 2014-10-09 |
| JP6862505B2 (ja) | 2021-04-21 |
| CN104798446B (zh) | 2017-09-08 |
| KR20180014258A (ko) | 2018-02-07 |
| JP2019208049A (ja) | 2019-12-05 |
| KR102104018B1 (ko) | 2020-04-23 |
| JP2018113448A (ja) | 2018-07-19 |
| JP6473131B2 (ja) | 2019-02-20 |
| US20190385824A1 (en) | 2019-12-19 |
| CN107424901A (zh) | 2017-12-01 |
| KR20150127033A (ko) | 2015-11-16 |
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