CN106464218B - 关于改进的射频模块的系统、设备和方法 - Google Patents

关于改进的射频模块的系统、设备和方法 Download PDF

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Publication number
CN106464218B
CN106464218B CN201580021854.0A CN201580021854A CN106464218B CN 106464218 B CN106464218 B CN 106464218B CN 201580021854 A CN201580021854 A CN 201580021854A CN 106464218 B CN106464218 B CN 106464218B
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naked core
radio
frequency module
module according
package substrate
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CN106464218A (zh
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R.A.赖斯纳
J.R.金
Z.阿朗
T.W.关
A.A.利亚林
X.徐
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Conexant Systems LLC
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Conexant Systems LLC
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
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    • H04B1/38Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
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Abstract

关于改进的射频(RF)模块的系统、设备和方法。在一些实施例中,RF模块可以包括封装基板、在安装在所述封装基板上的第一裸芯上实现的功率放大器(PA)组件、以及在安装在所述第一裸芯上的第二裸芯上实现的控制器电路。所述控制器电路可以配置为提供所述PA组件的至少一些控制。所述RF模块还可以包括一个或多个输出匹配网络(OMN)器件,其安装在所述封装基板上并且配置为提供所述PA组件的输出匹配功能。所述RF模块还可以包括安装在每个OMN器件上的带选择开关器件。

Description

关于改进的射频模块的系统、设备和方法
相关申请的交叉引用
本申请要求于2014年2月25日提交的、名称为“SYSTEMS,DEVICES AND METHODSRELATED TO IMPROVED RADIO-FREQUENCY MODULES(关于改进的射频模块的系统、设备和方法)”的美国临时申请No.61/944,563的优先权,在此通过引用明确地将其公开全部并入本文。
技术领域
本公开涉及射频(RF)模块。
背景技术
在射频(RF)应用中,用于提供诸如放大的信号的发送和/或接收的信号的处理的功能的电路和组件可以作为封装的模块的部分实现。这种模块然后可以被安装在诸如电话板的电路板上。
发明内容
根据一些实施方式,本公开涉及射频(RF)模块,其包括配置为容纳多个组件的封装基板。所述RF模块还包括在安装所述封装基板上的第一裸芯上实现的功率放大器(PA)组件、以及在安装在所述第一裸芯上的第二裸芯上实现的控制器电路。所述控制器电路配置为提供PA组件的至少一些控制。所述RF模块还包括一个或多个输出匹配网络(OMN)器件,其安装在所述封装基板上并且配置为提供所述PA组件的输出匹配功能。所述RF模块还包括安装在每个OMN器件上的带选择开关器件。
在一些实施例中,所述第一裸芯可以是砷化镓(GaAs)裸芯。所述GaAs裸芯可以配置用于多个异质结双极晶体管(HBT)PA的实现。所述HBT PA可以包括多个配置用于3G/4G操作的PA。所述配置用于3G/4G操作的PA可以包括四个或更多个PA。所述HBT PA还可以包括多个配置用于2G操作的PA。
在一些实施例中,所述第二裸芯可以是硅(Si)裸芯。所述控制器电路可以包括用于3G/4G操作和2G操作任一者或两者的控制功能。
在一些实施例中,所述GaAs裸芯和所述Si裸芯可以通过多个焊线互连。在一些实施例中,所述Si裸芯和所述封装基板可以通过多个焊线互连。在一些实施例中,所述GaAs裸芯和所述封装基板可以通过多个焊线互连。
在一些实施例中,所述一个或多个OMN器件可以包括配置用于3G/4G操作的第一OMN器件。所述第一OMN器件可以是以倒装芯片配置实现的集成无源器件(IPD)。所述IPD倒装芯片器件可以包括与安装侧相对的表面,所述表面配置为容纳所述带选择开关器件。所述带选择开关器件在诸如硅绝缘体(SOI)裸芯的裸芯上实现。在一些实施例中,所述带选择开关裸芯和所述封装基板可以通过多个焊线互连。
在一些实施例中,所述RF模块还可以包括在所述IPD倒装芯片器件的表面上实现的调谐电路。所述调谐电路可以作为IPD实现。所述调谐电路可以包括谐波谐振电路。
在一些实施例中,所述第二裸芯上的所述控制器电路和所述带选择开关裸芯可以通过一个或多个飞焊线互连。
在一些实施例中,所述封装基板可以包括层压封装基板。所述层压封装基板包括第一数量的层压层,所述第一数量小于第二数量的层压层,所述第二数量的层压层与没有所述一个或多个OMN器件的模块相关联。
在一些实施例中,所述RF模块还可以包括多个安装在所述封装基板上的双工器。所述RF模块还可以包括多个安装在所述封装基板上的滤波器器件。所述滤波器器件的至少一些可以配置为便利于所述封装基板上的第一区域和第二区域之间的RF屏蔽。
在一些教导中,本公开涉及一种用于制造射频(RF)模块的方法。所述方法包括提供或形成配置用于容纳多个组件的封装基板。所述方法还包括在所述封装基板上安装功率放大器(PA)裸芯,以及在所述PA裸芯上堆叠控制器电路裸芯。所述方法还包括在所述封装基板上安装一个或多个输出匹配网络(OMN)器件,以及在每个OMN器件上堆叠带选择开关。
在一些实施例中,本公开涉及一种无线设备,所述无线设备包括配置为产生射频(RF)信号的收发器、与所述收发器通信的前端模块(FEM)。所述FEM还包括配置为容纳多个组件的封装基板、在安装在所述封装基板上的第一裸芯上实现的功率放大器(PA)组件,其中所述PA组件配置为放大所述RF信号。所述FEM还包括在安装在所述第一裸芯上的第二裸芯上实现的控制器电路,其中所述控制器电路配置为提供PA器件的至少一些控制。所述FEM还包括一个或多个安装在所述封装基板上并配置为提供用于所述PA组件的输出匹配功能的输出匹配网络(OMN)器件、以及安装在每个OMN器件上的带选择开关器件。所述无线设备还包括与所述FEM通信并配置为发送放大的RF信号的天线。
在一些实施例中,所述FEM还包括多个双工器,使得所述FEM是含双工器的FEM(FEMiD)。
出于概括本公开的目的,已在这里描述了本发明的某些方面、益处和新颖的特征。应当理解,根据本发明的任何特定实施例并不一定必须实现所有所述益处。因此,本发明可以以实现或优化如这里所教导的一个益处或一组益处、而不必实现如这里可能教导或启示的其他益处的方式来体现或执行。
附图说明
图1描绘了具有多个可以便利于射频(RF)信号的发送和/或接收的组件的模块。
图2示出了具有例如在诸如砷化镓(GaAs)基板的半导体基板上实现的、配置用于3G/4G操作的多个功率放大器(PA)的示例性PA裸芯。
图3示出了具有一个或多个例如在硅(Si)基板上实现的控制器电路的示例性裸芯。
图4示出了其中PA裸芯被安装在层压封装基板上,以及Si控制器裸芯被安装在PA裸芯上的配置。
图5A和图5B示出了其中图4的Si控制器裸芯、PA裸芯和层压基板之间的连接可以实现为焊线的示例性配置的侧视图和主视图。
图6示出了可以在匹配网络器件中实现的各种电路的示例性配置。
图7描绘了在放大处理期间RF信号可以传输经过的示例性路径。
图8示出了输出匹配网络(OMN)器件可以被安装在层压基板上,以及对应的带选择开关可以被堆叠在该OMN器件上。
图9A和9B示出了其中带选择开关、OMN器件和层压基板之间的连接可以实现为倒装芯片连接和焊线的示例性配置的侧视图和主视图。
图10A和图10B示出了其中OMN器件可被放置为相当接近于PA裸芯的示例性配置的侧视图和主视图。
图11A和图11B示出了其中诸如调谐电路的额外的器件可以被堆叠在OMN器件上的示例性配置的侧视图和主视图。
图12示出了可以由通过如此处所描述的组件的堆叠提供的空间节省导致的模块的横向尺寸的减小的示例。
图13示出了具有多个层压层的示例层压基板,其中匹配网络电路的一些或全部在一个或多个这种层压层中实现。
图14示出了如此处所描述的在层压基板上实现的OMN器件允许与层压基板相关的横向空间量和/或层数量的减少。
图15示出了类似于参考图1所描述的模块的示例布局的配置,其中可以在模块内的不同位置之间提供RF屏蔽功能。
图16描绘了具有此处所描述的一个或多个有利特征的示例性无线设备。
图17示出了可以在如此处所描述的控制器裸芯和如此处所描述的PA裸芯之间实现的互连配置的框图。
图18示出了可以实现的互连配置的更具体的示例。
图19示出了可以用于便利于图18的互连示例的操作的三电平逻辑状态的示例。
图20示出了其中可以在例如驱动器级和输出级之间共享参考电流(Iref)以便提供(例如)PA裸芯和Si控制器裸芯之间I/O连接的减少、相关联的滤波器的数量和/或尺寸的减少、以及PA和/或控制器裸芯的尺寸的减小的PA控制配置。
图21示出了可以被实现以包括和/或便利于例如图20的共享Iref特征和图18和图19的三电平逻辑特征的示例性PA控制架构。
图22示出了可以包括输入开关的示例性PA配置,其中该输入开关可以实现为合并到例如堆叠的Si控制器裸芯的CMOS器件。
图23A示出了其中Y1电容可以在多个PA之间共享的示例性PA配置。
图23B示出了其中三个示例PA的每个可以具有其自己单独的Y1电容示例性PA配置,。
图24A-图24D示出了可以在例如图11A和图11B的调谐电路中实现的谐波谐振(tank)电路的示例。
具体实施方式
这里所提供的标题(如果有的话)仅是为了方便,并不必然地影响所要求保护的发明的范围或含义。
用于无线设备的设计继续要求包括功率放大器(PA)电路和其他射频(RF)电路的各种组件的更小的外形尺寸,同时保持高的性能水平。例如,期望具有更小外形尺寸和高功率附加效率(PAE)规格的含双工器的PA(PAiD)模块。这种特征可以应用到例如平均功率跟踪(APT)和包络跟踪(ET)3G/4G PA应用。
图1示意性地描绘了具有多个可以便利于RF信号的发送和/或接收的组件的模块100。模块100示出为包括配置为容纳多个组件的封装基板102。这种封装基板可以包括例如层压基板。尽管在这种层压基板的上下文中描述了各种示例,将理解的是,本公开的一个或多个特征还可以利用其他类型的封装基板来实现。
模块100示出为包括诸如以异质结双极晶体管(HBT)工艺技术实现的砷化镓(GaAs)PA裸芯160的裸芯。尽管在HBT PA的上下文中进行描述,将理解的是,本公开的一个或多个特征还可以在包括其它类型的半导体材料和/或其它晶体管工艺技术的其它类型的PA裸芯中实现。
图1示出了在硅(Si)裸芯162上实现的控制器电路可以安装在HBT PA裸芯160上。在这里更详细地描述关于其中Si控制器裸芯162安装在HBT PA裸芯160上的这种配置的示例。
模块100示出为还包括输出匹配网络(OMN)器件140和OMN器件150。如这里所述,带开关电路可以实现并堆叠在这种OMN器件的一些或全部之上。更具体地,示出了开关电路裸芯142被堆叠在OMN器件140上;以及示出了开关电路裸芯152被堆叠在OMN器件150上。在这里更详细地描述关于其中开关电路裸芯(142或152)被安装在OMN器件(140或150)上的这种配置的示例。
在一些实施例中,OMN器件140、150可以配置为提供用于3G/4G频带的匹配功能。在这里更详细地描述这种3G/4G频带的示例。
在一些实施例中,模块100还可以包括用于2G频带的匹配网络器件130。诸如低通滤波器(LPF)132的滤波器件被示出为堆叠在2G匹配网络器件130上。
在图1中,还示出了多个滤波器件和多个双工器器件被安装在封装基板102上。例如,示出了用于频带B1的带通滤波器(106)、用于频带B3的带通滤波器(110)、用于频带B17的带通滤波器(118)和用于频带B25的带通滤波器(112)被安装在封装基板102上。在另一示例中,示出了用于频带B4的双工器(104)、用于频带B8的双工器(116)、用于频带B20的双工器(120)和用于频带B26的双工器(114)被安装在封装基板102上。尽管在这种频带的示例性上下文中进行描述,将理解的是,本公开的一个或多个特征还可以被应用到具有更多或更少频带的模块、以及具有频带的其他组合的模块。
在一些实施例中,图1的HBT PA裸芯160可以包括多个PA以便利于3G/4G操作。例如,可以实现为四个PA而不是两个PA,以实现多个频带上更好的性能。在多PA配置(例如,四个PA)中,每个PA可以被设计用于相对窄的带宽。因此,诸如谐波抑制器(trap)和级间匹配网络的RF信号调节电路可以以更高效的调谐方式实现。
图2示出了具有多个例如在GaAs基板200上实现的、配置用于3G/4G操作的PA的示例性HBT PA裸芯160。例如,PA 202可以配置用于B1和B25频带中的操作;PA 204可以配置用于B3和B4频带中的操作;PA 206可以配置用于低频带(LB)操作;以及PA 208可以配置用于甚低频带(VLB)操作。尽管以这种示例性频带进行描述,将理解的是,HBT PA裸芯160可以包括更多或更少数量的3G/4G PA,并且这种PA可以配置用于频带的其他组合中的操作。
在图2的示例中,可以在GaAs基板200上实现一个或多个用于2G操作的PA。例如,可以实现两个2G PA(210、212);并且这种PA可以便利于传统2G频带中的操作。
图3示出了具有一个或多个例如在硅(Si)基板230上实现的控制器电路的示例性裸芯162。例如,控制器电路232可以配置用于3G/4G操作;以及控制器电路234可以配置用于2G操作。尽管在这两种控制电路的上下文中进行描述,将理解的是,在Si控制器裸芯162上可以实现更多或更少数量的控制器电路。
如参考图2所描述的,示例性HBT PA裸芯160可以包括六个PA,其中四个被配置用于3G/4G操作,以及两个被配置用于2G操作。如参考图3所描述的,示例性Si控制器裸芯162可以包括用于HBT PA裸芯160的六个PA的两个控制器电路,其中一个被配置为控制所述四个3G/4G PA,以及另一个被配置为控制所述两个2G PA。
图4示出了在一些实施例中,HBT PA裸芯160可以被安装在诸如层压基板102的封装基板上,以及Si控制器裸芯162可以被堆叠在HBT PA裸芯160上。图5A和5B示出了用于前述HBT PA裸芯160和Si控制器裸芯162的堆叠、以及可以形成以便利于各种操作的电连接的示例性配置的侧视图和主视图。
在图4的示例中,示出了HBT PA裸芯160被安装在层压封装基板102上。示出了Si控制器裸芯162被安装在HBT PA裸芯160上。HBT PA裸芯160可以以多种方式配置,包括例如其中电连接可以包括焊线的焊线配置。尽管在这种焊线配置的上下文中进行描述,将理解的是,本公开的一个或多个特征也可以以用于HBT PA裸芯160的其它裸芯配置实现。
Si控制器裸芯162可以以多种方式配置,包括例如其中电连接可以包括焊线的焊线配置。尽管在这种焊线配置的上下文中进行描述,将理解的是,本公开的一个或多个特征也可以以用于Si控制器裸芯162的其它裸芯配置实现。
图5A和图5B示出了其中Si控制器裸芯162、HBT PA裸芯160和层压基板102之间的连接实现为焊线的示例性配置240的侧视图和主视图。例如,如在图5A的简化视图中所描绘的,可以在Si控制器裸芯162和HBT PA裸芯160之间形成焊线244以提供各种电连接。HBT PA裸芯160和层压基板102之间的电连接可以由焊线242提供。Si控制器裸芯162和层压基板102之间的直接电连接可以由焊线246提供。
如在图5B的示例性布局配置中所示,前述焊线连接可以在形成在Si控制器裸芯162、HBT PA裸芯160和层压基板102上的接触焊盘(pad)之间形成。在图5B所示的示例中,将HBT PA裸芯160和层压基板102之间的焊线242描绘为实线;并且这种焊线可以在形成在HBTPA裸芯160上的接触焊盘256和形成在层压基板102上的接触焊盘258之间形成。将Si控制器裸芯162和HBT PA裸芯160之间的焊线244描绘为虚线;并且这种焊线可以在形成在Si控制器裸芯162上的接触焊盘250和HBT PA裸芯160之间形成。将Si控制器裸芯162和层压基板102之间的焊线246描绘为点划线;并且这种焊线可以在形成在Si控制器裸芯162上的接触焊盘252和形成在层压基板102上的接触焊盘260之间形成。
如进一步在图5B的示例性布局配置中所示,可以在层压基板102上提供接地焊盘262以便允许从HBT PA裸芯160和/或Si控制器裸芯162形成接地连接。此外,将理解的是,焊线长度和接触焊盘布置可以被配置为提供例如一些电连接中所期望的电感。例如,可能期望向公共的接触焊盘提供多个焊线以在连接中产生所期望的电感。
图6示出了可以在匹配网络器件130、140、150中实现的各种电路的示例性配置270。2G匹配网络器件130被示出为包括两个2G输出匹配网络(OMN)电路272、274。两个3G/4GOMN器件140、150的每个可以包括两个OMN电路,以使得两个OMN器件140、150覆盖如这里所述的示例性3G/4G频带。例如,第一OMN器件140可以包括配置为提供用于B1/B25和B3/B4频带的匹配功能的OMN电路282、284。第二OMN器件150可以包括配置为提供用于低频带(LB)和甚低频带(VLB)的匹配功能的OMN电路292、294。
在图6中,将HBT PA裸芯160描绘为包括四个对应于前述3G/4G频带的PA电路202、204、206、208、以及两个对应于2G频带的PA电路210、212。在一些实施例中,匹配网络器件130、140、150可被放置为相当接近于HBT PA裸芯160。各个OMN电路和PA可以配置为使得各个PA级的输出阵列接近地隔开并且与OMN电路的输入端口对齐。这种配置可以允许RF信号路径更短,从而减少损耗。
图7示意性地描绘了RF信号在放大处理期间可以传播经过的示例性路径。示出了输入信号(RF_IN)由PA 310接收,其可以包括例如驱动级302和输出级304。在一些实施例中,可以在两个示例性的级之间提供级间匹配网络。示出了来自输出级304的放大的RF信号通过输出匹配网络(OMN)306和带选择开关308作为RF_OUT输出。如参考图6所描述的,OMN器件可以被配置并且相对于PA裸芯适当地放置,使得输出级的输出相当接近于OMN电路的输入。
如图7所示,可以期望使带选择开关308相当接近于OMN 306。如这里所述的,这种带选择开关可以被堆叠在OMN器件上以提供这种接近,以及减小模块的整体横向面积。
图8示出了图1和图6的OMN器件140、150的任一者或两者可以被安装在诸如层压基板102的封装基板上,以及它们各自的带选择开关142、152可以被堆叠在OMN器件140、150上。图9A和9B示出用于前述OMN器件(140或150)和带选择开关(142或152)的堆叠、以及可以形成以便利于各种操作的电连接的示例性配置的侧视图和主视图。
在图8中,示出了OMN器件(140或150)被安装在叠压封装基板102上。示出了带选择开关(142或152)被安装在OMN器件上。OMN器件140、150的任一者或两者可以以多种方式配置,包括例如其中通常通过凸块焊料(bump solder)形成电连接的倒装芯片配置。尽管在这种倒装芯片配置的上下文中进行描述,将理解的是,本公开的一个或多个特征还可以以用于OMN器件140、150的其它配置实现。带选择开关142、152可以以多种方式配置,包括例如作为具有其中电连接可以包括焊线的焊线配置的裸芯。尽管在这种焊线配置的上下文中进行描述,将理解的是,本公开的一个或多个特征也可以以用于带选择开关142、152的其它裸芯配置实现。
如这里所述的可以实现为OMN器件(例如140、150)的OMN电路和器件的示例在名称为“AUTOTRANSFORMER-BASED IMPEDENCE MATCHING CIRCUITS AND METHODS FOR RADIO-FREQUENCY APPLICATIONS(用于射频应用的基于自耦变压器的阻抗匹配电路和方法)”的美国专利申请公开No.2014/0320205进行描述,明确地通过引用将其全部并入本文,并且将其视为本申请的说明书的一部分。
图9A和9B示出了其中带选择开关(142或152)、OMN器件(140或150)和层压基板102之间的连接实现为倒装芯片连接和焊线的示例性配置320的侧视图和主视图。例如,如在图9A的简化视图中所示,可以在带选择开关(142或152)和层压基板102之间形成焊线324以提供各种电连接。OMN器件(140或150)和层压基板102之间的电连接和机械安装功能可以由凸块焊料322提供。
如图9B的示例性布局的配置所示,前述焊线连接可以在形成在带选择开关裸芯(142或152)和层压基板102上的接触焊盘之间形成。在图9B所示的示例中,带选择开关裸芯(142或152)和层压基板102之间的焊线324可以在形成在频段选择开关裸芯上的接触焊盘326和形成在层压基板102上的接触焊盘328之间形成。
在一些实施例中,OMN器件140、150的任一者或两者可以实现为以倒装芯片配置封装的集成无源器件(IPD)。当被安装到图9A所示的层压基板102时,OMN器件(140或150)的上表面可以提供用于对应的带选择开关裸芯(142或152)的安装表面。
在一些实施例中,2G匹配网络设备130(例如,在图1和图6中)可以作为非倒装芯片的IPD实现,并且这种IPD可以配置为提供如参考图6所描述的示例性匹配功能,并且还包括如参考图1所描述的示例性滤波功能。
如参考图6所描述的,HBT PA裸芯和OMN器件优选地被放置为彼此相对接近。图10A和图10B示出了其中OMN器件(140或150)被示出为放置得相当接近于HBT PA 160的示例性配置330的侧视图和主视图。更具体地,堆叠在OMN器件上的带选择开关(142或152)和堆叠在HBT PA 160上的控制器裸芯162之间的电连接可以通过“飞(flying)”焊线334实现。示出了这种焊线在带选择开关(142或152)上的接触焊盘332和控制器裸芯162上的接触焊盘336之间形成。这种焊线实际上可以在层压基板102之上的空间中创建另一布线层。
出于描述的目的,将理解的是,图6和图10的PA裸芯160和OMN器件(140或150)相对接近可以包括,例如,其中PA裸芯160和OMN器件被彼此相邻地放置的配置、其中单个焊线可以提供与PA裸芯160相关联的堆叠和与OMN器件(140或150)相关联的堆叠之间的电互连的配置、及其任何组合。在单个焊线互连两个堆叠的上下文中,这种焊线可以是例如如参考图10A和图10B所描述的飞焊线。将理解的是,这种单个焊线还可以包括涉及这两个堆叠的其它配置。例如,这种单个焊线可以提供第一堆叠的任意层和第二堆叠的任意层之间的互连。
如这里所述,OMN器件140、150的倒装芯片配置可以提供用于在其上堆叠例如一个或多个带开关裸芯的相当大的平台。在一些实施例中,在这种倒装芯片OMN器件上可能存在足够的空间以堆叠除了带开关裸芯以外的其他器件。
图11A和11B示出其中额外的器件被堆叠在OMN器件(140或150)上的示例性配置340的侧视图和主视图。还示出了带开关裸芯(142或152)被堆叠在OMN器件上。在一些实施例中,这种额外的器件可包括例如调谐电路。这种调谐电路可以包括例如谐波谐振(harmonic tank),并实现为双工器调谐IPD。将这种IPD放置在OMN器件之上提供了层压基板102上的额外的空间节省。
图12示出了可以由通过如这里描述的组件的堆叠提供的空间节省导致的模块的横向尺寸的减小的示例。将具有如这里描述的一个或多个特征的模块100与没有这种特征的模块10比较。模块10示出为具有d1'×d2'的横向尺寸;而模块100示出为具有d1×d2的减小的尺寸。例如,没有如这里所述的堆叠特征的多模多频带(MMMB)PA模块可以具有大约5毫米×7毫米的横向尺寸。使用如这里所述的一个或多个堆叠特征实现的PA模块(包括用于改进性能的两个额外的3G/4G路径)可以具有大约4毫米×7毫米的横向尺寸,其在横向尺寸上减少大约20%。
图13和14示出了可以导致具有如这里所述的一个或多个特征的模块的另一有利特征。图13示出了没有这种特征的示例性配置20,以及图14示出了具有这种特征的示例性配置350。具体地,图13示出具有例如6个层压层的层压基板12。如通常所理解的,匹配网络电路的一些或全部可以在一个或多个这种层压层中实现。因此,将示例性输出匹配网络(OMN)22描绘为层压基板12的一部分。
在图14中,OMN器件(140或150)可以在层压基板102上实现。由于这种OMN器件可以包括与OMN 22(图13)的基板中的部分相关联的组件和/或功能的一些或全部,因此可以减少横向空间量和/或层压层中层的数量。例如,图13的示例中的层压基板12包括六个层;而图14的示例中的层压基板102包括四个层。层压层的数量的如此显著的减少可以提供许多益处,包括降低模块的高度和降低与该模块相关联的成本(例如,与层压基板相关联的成本)。
在一些实施例中,具有如这里所述的一个或多个特征的模块可以包括RF屏蔽特征。这种屏蔽特征可以包括,例如共形屏蔽、屏蔽焊线、提供上部屏蔽层和接地平面之间的接地连接的组件、或其一些组合。
图15示出了类似于参考图1所描述的模块100的示例性布局的配置370。在示例性配置370中,滤波器器件(例如,B1滤波器106、B3滤波器110、B25滤波器112和B17滤波器118)的一些或全部可以配置为提供它们的上部分和下部分之间的导通路径,从而便利于屏蔽功能。关于这种屏蔽的额外的细节在名称为“APPARATUS AND METHODS RELATED TO GROUNDPATHS IMPLEMENTED WITH SURFACE MOUNT DEVICE(关于利用表面安装器件实现的接地路径的装置和方法)”的美国专利申请公开No.2014/0308907中进行描述,明确地通过引用将其全部并入本文,并将其视为本申请的说明书的一部分。
在图15的示例中,可以提供模块100内的分区(compartmentalized)屏蔽。例如,来自B17频带的操作(例如,来自与带开关152相关联的区域374)的三次谐波辐射可以干扰B4接收操作的操作(例如,在与B4双工器104相关联的区域376中)。将这种从区域374到区域376的不期望的辐射描绘为箭头372。示出了通过例如B1滤波器106和B3滤波器110的布置屏蔽或减少这种辐射。
在一些实现中,具有这里描述的一个或多个特征的器件和/或电路可以包含在诸如无线设备的RF设备中。这种器件和/或电路可以直接在无线设备中实现、以如这里描述的模块化形式实现、或以其一些组合实现。在一些实施例中,这种无线设备可以包括,例如,蜂窝电话、智能电话、具有或不具有电话功能的手持式无线设备、无线平板等。
图16示意性地描绘了具有这里描述的一个或多个有利特征的示例性无线设备400。在具有如这里描述的一个或多个特征的模块的上下文中,这种模块可以由虚线框100来总体描述,并可以实现为前端模块(FEM),诸如含双工器的FEM(FEMiD)。
PA 310可以从收发器410接收它们各自的RF信号,所述收发器410可以配置和操作为产生待放大和发送的RF信号以及处理接收到的信号。示出了收发器410与配置为提供适合于用户的数据和/或语音信号与适用于收发器410的RF信号的之间的转换的基带子系统408进行交互。还示出了收发器410被连接到配置为管理用于无线设备的操作的功率的功率管理组件406。这种功率管理还可以控制基带子系统408和模块300的操作。
示出了基带子系统408被连接到用户接口402以便利于提供给用户和从用户接收的语音和/或数据的各种输入和输出。该基带子系统408还可以被连接到存储器404,该存储器404配置为存储数据和/或指令以便利于无线设备的操作和/或为用户提供信息的存储。
在示例性无线设备400中,示出了PA310的输出被匹配(经由相应的匹配电路306)并且通过带选择开关308、其各自的双工器412和天线开关414被路由到天线416。在一些实施例中,每个双工器412可以允许使用公共天线(例如,416)来同时进行发送和接收操作。在图16中,示出了接收到的信号被路由到“Rx”路径(未示出),其可以包括例如低噪声放大器(LNA)。
多个其他无线设备配置可利用这里所述的一个或多个特征。例如,无线器件不必要是多频带设备。在另一示例中,无线器件可以包括诸如分集天线的额外的天线、以及诸如Wi-Fi、蓝牙和GPS的额外的连接功能。
图17-24示出了可以实现以便利于本公开的一个或多个特征的各种电路、设备、架构和/或方法的非限制性的示例。尽管在这种特征的上下文中进行描述,将理解的是,这种电路、设备、架构和/或方法还可以在例如其他类型的PA系统和封装应用中实现。
图17示出了可以在如这里描述的控制器裸芯162和如这里描述的PA裸芯160之间实现的互连配置506的框图。控制器裸芯162可以包括配置为便利于与例如PA裸芯160的互连的接口部分502。PA裸芯160可以包括配置为便利于与例如控制器裸芯162的互连的接口部分500。
在图17中,将控制器裸芯162、162的接口502、500之间的互连描绘为线504。如这里描述的在图18的更具体的示例中,这种互连可以包括一个或多个焊线(例如,图5A和图5B中的一个或多个焊线244)。
图18示出了可以实现的互连配置506的示例。指示了对应于控制器裸芯和PA裸芯的接口部分502、500。在图18的示例中,焊线244可以提供与图17的互连504相关联的功能。图18中所示的示例性配置可以减少堆叠的Si控制器裸芯(例如,图5A和图5B中的162)和HBTPA裸芯(例如,图5A和图5B中的160)之间的输入/输出连接的数量。因此,这种连接的数量的减少可以在控制器裸芯和PA裸芯的任一者或两者中产生减小的裸芯尺寸。
图18中的示例可以被配置和操作以产生三电平逻辑状态,用于控制PA裸芯中的PA电路的各种操作。这种逻辑输出的示例在图19中示出。例如,第一电平可以包括大约0V的V_input;并且当这种电压电平被提供到接口500时,输出OUT1和OUT2两者可以具有高逻辑状态。第二电平可以包括大约1.65V的V_input;并且当这种电压水平被提供到接口500时,OUT1可以处于低逻辑状态,以及OUT2可以处于高逻辑状态。第三水平可以包括大约3V的V_input;并且当这种电压水平被提供到接口500时,OUT1和OUT2两者可以具有低逻辑状态。
如这里所述(例如,参考图7),PA可以包括两个或更多个放大级。例如,驱动器级后可以跟随输出级。图20示出了其中参考电流(Iref)可以在例如驱动器级和输出级之间共享的PA控制配置510。这种配置可以提供多个期望的特征,包括HBT PA裸芯和Si控制器裸芯之间I/O的连接(例如,焊线)的减少、相关联的滤波器的数量和/或尺寸以及PA和/或控制器裸芯的尺寸的减小。
图21示出了可以实现以包括和/或便利于例如图20的共享Iref特征和图18和图19的三电平逻辑特征的示例性PA控制架构520。
图22示出了包括输入开关532的示例性的PA配置530。在图20中,这种输入开关也被表示为532。这种输入开关可以实现为合并到例如堆叠的Si控制器裸芯(例如,图4和图5中的162)的CMOS器件。这种输入开关作为Si控制器裸芯的一部分可以是期望的,因为在分离的裸芯中实现它会在模块上消耗更多的空间。
图23A示出了其中Y1电容(例如,电容器)570可以在多个PA之间共享的示例性PA配置540。在示出的示例中,三个PA 542、552、562共享公共的Y1电容570。由于Y1电容570通常是大的表面安装器件(例如,通常为10,000pF),这种电容的共享可以在模块中节省空间。
在一些实施例中,可以提供谐振电路544、554、564,并且这些谐振电路被调谐以阻止由于例如BiFET开关泄漏而导致的相关联的PA频带。在一些实施例中,可以提供开关546、556、566,并且这些开关配置为抑制或减少其他频带中的负荷。
图23B示出了其中三个示例PA 582、584、586的每个可以具有其自己独立的Y1电容(例如,电容器)592的示例性PA配置580。如参考图23A所描述的,这种独立的Y1电容器可以比单个公共Y1电容器占据更多的空间。
图24A-图24D示出可以在例如图11A和图11B的调谐电路342中实现的谐波谐振电路的示例。图24A示出了可以被调谐到例如频带B8的二次谐波或频带B26的三次谐波的示例性谐波谐振电路。这种电路可以实现为基于变压器的IPD。图24B示出了可以被调谐到例如频带B13的二次谐波或频带B17的三次谐波的示例性谐波谐振电路。这种电路可以实现为IPD,并且可以与堆叠在OMN器件上的带开关(例如,SOI开关)一起使用。图24C示出了可以被调谐到例如频带B2的二次谐波的示例性谐波谐振电路。这种电路可以实现为基于变压器的IPD。图24D示出了可以被调谐到例如频带B3/B4的二次谐波的示例性谐波谐振电路。这种电路可以实现为基于变压器的IPD。
除非上下文清楚地另外要求,贯穿整个说明书和权利要求,词语“包括”和“包含”等应以包含性的含义来解释,而非排他性或穷举性的含义;也就是说,以“包括但不限于”的含义来解释。如这里通常使用的,词语“耦接”是可以直接连接或通过一个或多个中间元件连接的两个或更多个元件。此外,当在本申请中使用时,词语“这里”、“上面”、“下面”和类似意思的词语应指本申请整体,而非本申请的任何特定部分。当上下文允许时,上面的说明书中的、使用单数或复数的词语也可以分别包括复数或单数。在提到两个或更多个项目的列表时的词语“或”,该词语覆盖该词语的全部下列解释:列表中的任何项目、列表中的全部项目以及列表中的项目的任何组合。
对本发明实施例的以上详细描述不是意图穷举性的或将本发明限制为上面公开的精确形式。如相关领域技术人员将认识到的,虽然为了说明的目的在上面描述了本发明的具体实施例和示例,但是在本发明的范围内各种等效修改是可能的。例如,虽然以给定顺序呈现处理或块,但是替换实施例可以执行具有不同顺序的步骤的例程,或采用具有不同顺序的块的系统,并且可以删除、移动、添加、细分、组合和/或修改一些处理或块。可以以多种不同方式实现这些处理或块中的每一个。此外,虽然处理或块有时被示出为串行执行,但是作为替代,这些处理或块可以并行执行,或可以在不同时间执行。
这里提供的本发明的教导可以应用于其他系统,而不一定是上面描述的系统。可以组合上面描述的各种实施例的元件和动作以提供进一步的实施例。
虽然已描述了本发明的某些实施例,但是这些实施例仅作为示例呈现,并且无意限制本公开的范围。实际上,这里描述的新方法和系统可以以多种其他形式实施;此外,可以做出这里描述的方法和系统的形式上的各种省略、替代和改变,而不背离本公开的精神。所附权利要求及其等效物意图覆盖将落入本公开的范围和精神内的形式或修改。

Claims (29)

1.一种射频模块,包括:
配置为容纳多个组件的封装基板;
在安装在所述封装基板上的第一裸芯上实现的功率放大器组件;
在安装在所述第一裸芯上的第二裸芯上实现的控制器电路,所述控制器电路配置为提供所述功率放大器组件的至少一些控制;
一个或多个输出匹配网络器件,其安装在所述封装基板上并且配置为提供所述功率放大器组件的输出匹配功能;以及
安装在每个输出匹配网络器件上的带选择开关器件。
2.根据权利要求1所述的射频模块,其中,所述第一裸芯是砷化镓裸芯。
3.根据权利要求2所述的射频模块,其中,所述砷化镓裸芯配置用于多个异质结双极晶体管功率放大器的实现。
4.根据权利要求3所述的射频模块,其中,所述异质结双极晶体管功率放大器包含多个配置用于3G/4G操作的功率放大器。
5.根据权利要求4所述的射频模块,其中,所述配置用于3G/4G操作的功率放大器包含四个或更多个功率放大器。
6.根据权利要求4所述的射频模块,其中,所述异质结双极晶体管功率放大器还包含多个配置用于2G操作的功率放大器。
7.根据权利要求2所述的射频模块,其中,所述第二裸芯是硅裸芯。
8.根据权利要求7所述的射频模块,其中,所述控制器电路包含用于3G/4G操作和2G操作中任一者或两者的控制功能。
9.根据权利要求7所述的射频模块,其中,所述砷化镓裸芯和所述硅裸芯通过多个焊线互连。
10.根据权利要求7所述的射频模块,其中,所述硅裸芯和所述封装基板通过多个焊线互连。
11.根据权利要求7所述的射频模块,其中,所述砷化镓裸芯和所述封装基板通过多个焊线互连。
12.根据权利要求1所述的射频模块,其中,其中所述一个或多个输出匹配网络器件包含配置用于3G/4G操作的第一输出匹配网络器件。
13.根据权利要求12所述的射频模块,其中,所述第一输出匹配网络器件是以倒装芯片配置实现的集成无源器件。
14.根据权利要求13所述的射频模块,其中,所述集成无源器件倒装芯片器件包含与安装侧相对的表面,所述表面配置为容纳所述带选择开关器件。
15.根据权利要求14所述的射频模块,其中,所述带选择开关器件在裸芯上实现。
16.根据权利要求15所述的射频模块,其中,用于所述带选择开关的裸芯是硅绝缘体裸芯。
17.根据权利要求15所述的射频模块,其中,所述带选择开关裸芯和所述封装基板通过多个焊线互连。
18.根据权利要求17所述的射频模块,还包括在所述集成无源器件倒装芯片器件的表面上实现的调谐电路。
19.根据权利要求18所述的射频模块,其中,所述调谐电路实现为集成无源器件。
20.根据权利要求18所述的射频模块,其中,所述调谐电路包含谐波谐振电路。
21.根据权利要求15所述的射频模块,其中,所述第二裸芯上的控制器电路与所述带选择开关裸芯通过一个或多个飞焊线互连。
22.根据权利要求1所述的射频模块,其中,所述封装基板包含层压封装基板。
23.根据权利要求22所述的射频模块,其中,所述层压封装基板包含第一数量的层压层,所述第一数量小于第二数量的层压层,所述第二数量的层压层与没有所述一个或多个输出匹配网络器件的模块相关联。
24.根据权利要求1所述的射频模块,还包括多个安装在所述封装基板上的双工器。
25.根据权利要求24所述的射频模块,还包括多个安装在所述封装基板上的滤波器器件。
26.根据权利要求25所述的射频模块,其中所述滤波器器件的至少一些被配置为便利于所述封装基板上的第一区域和第二区域之间的射频屏蔽。
27.一种用于制造射频模块的方法,所述方法包括:
提供或形成配置用于容纳多个组件的封装基板;
在所述封装基板上安装功率放大器裸芯;
在所述功率放大器裸芯上堆叠控制器电路裸芯;
在所述封装基板上安装一个或多个输出匹配网络器件;以及
在每个输出匹配网络器件上堆叠带选择开关。
28.一种无线设备,包括:
收发器,配置为产生射频信号;
与所述收发器通信的前端模块,所述前端模块包含配置为容纳多个组件的封装基板,所述前端模块还包含在安装在所述封装基板上的第一裸芯上实现的功率放大器组件,所述功率放大器组件配置为放大所述射频信号,所述前端模块还包含在安装在所述第一裸芯上的第二裸芯上实现的控制器电路,所述控制器电路配置为提供所述功率放大器组件的至少一些控制,所述前端模块还包含一个或多个安装在所述封装基板上并且配置为提供所述功率放大器组件的输出匹配功能的输出匹配网络器件,所述前端模块还包含安装在每个输出匹配网络器件上的带选择开关器件;以及
与所述前端模块通信并且配置为发送放大的射频信号的天线。
29.根据权利要求28所述的无线设备,其中所述前端模块还包含多个双工器,以使得所述前端模块是含双工器的前端模块。
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Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9344140B2 (en) 2014-02-25 2016-05-17 Skyworks Solutions, Inc. Systems, devices and methods related to improved radio-frequency modules
US20160190995A1 (en) * 2014-08-17 2016-06-30 Skyworks Solutions, Inc. Power amplifier interface compatible with inputs separated by mode or frequency
US10033336B2 (en) * 2015-10-05 2018-07-24 Skyworks Solutions, Inc. Power amplification system with adaptive bias control
US10256863B2 (en) * 2016-01-11 2019-04-09 Qualcomm Incorporated Monolithic integration of antenna switch and diplexer
CN106160756B (zh) * 2016-06-25 2019-12-10 唯捷创芯(天津)电子技术股份有限公司 射频前端发射方法及发射模块、芯片和通信终端
US11233014B2 (en) * 2017-01-30 2022-01-25 Skyworks Solutions, Inc. Packaged module having a ball grid array with grounding shielding pins for electromagnetic isolation, method of manufacturing the same, and wireless device comprising the same
US11277165B2 (en) * 2017-06-23 2022-03-15 Vanchip (Tianjin) Technology Co., Ltd. Radio frequency front-end transmission module, chip, and communications terminal
WO2019003791A1 (ja) 2017-06-27 2019-01-03 株式会社村田製作所 通信モジュール
US10693422B2 (en) 2017-11-27 2020-06-23 Skyworks Solutions, Inc. Wideband power combiner and splitter
WO2019103898A1 (en) 2017-11-27 2019-05-31 Skyworks Solutions, Inc. Quadrature combined doherty amplifiers
WO2019119262A1 (en) * 2017-12-19 2019-06-27 Telefonaktiebolaget Lm Ericsson (Publ) Power amplifier and radio frequency device comprising the same
WO2019146284A1 (ja) * 2018-01-25 2019-08-01 株式会社村田製作所 高周波モジュールおよび通信装置
CN110137682A (zh) 2018-02-02 2019-08-16 康普技术有限责任公司 用于调节电调天线的组件以及电调天线系统
US11146269B1 (en) 2018-02-05 2021-10-12 Rambus Inc. Low power cryogenic switch
CN109672411B (zh) * 2018-12-19 2023-02-28 重庆邮电大学 一种适用于5G低频段全频段的非对称宽带Doherty功率放大器
JP6947153B2 (ja) 2018-12-20 2021-10-13 株式会社村田製作所 高周波モジュールおよび通信装置
JP6888606B2 (ja) * 2018-12-21 2021-06-16 株式会社村田製作所 高周波モジュール
US11469725B2 (en) 2019-06-07 2022-10-11 Skyworks Solutions, Inc. Apparatus and methods for power amplifier output matching
JP2021052378A (ja) * 2019-09-20 2021-04-01 株式会社村田製作所 高周波モジュールおよび通信装置
CN110768634A (zh) * 2019-09-23 2020-02-07 广州慧智微电子有限公司 一种射频前端架构
US11804435B2 (en) 2020-01-03 2023-10-31 Skyworks Solutions, Inc. Semiconductor-on-insulator transistor layout for radio frequency power amplifiers
CN115211042B (zh) * 2020-03-06 2024-04-09 华为技术有限公司 一种收发机装置、无线通信装置及芯片组
TWI785503B (zh) 2020-03-11 2022-12-01 日商村田製作所股份有限公司 Rf電路模組及其製造方法
JP2021145288A (ja) 2020-03-13 2021-09-24 株式会社村田製作所 高周波モジュールおよび通信装置
JP2021158556A (ja) * 2020-03-27 2021-10-07 株式会社村田製作所 高周波モジュールおよび通信装置
JP2021158554A (ja) * 2020-03-27 2021-10-07 株式会社村田製作所 高周波モジュールおよび通信装置
JP2021175053A (ja) * 2020-04-22 2021-11-01 株式会社村田製作所 高周波モジュールおよび通信装置
JP2021197569A (ja) 2020-06-09 2021-12-27 株式会社村田製作所 高周波モジュールおよび通信装置
WO2022124203A1 (ja) * 2020-12-11 2022-06-16 株式会社村田製作所 高周波モジュール及び通信装置
JP2022092959A (ja) * 2020-12-11 2022-06-23 株式会社村田製作所 高周波モジュール
CN116583948A (zh) * 2020-12-14 2023-08-11 株式会社村田制作所 高频模块以及通信装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102769434A (zh) * 2011-05-04 2012-11-07 特里奎恩特半导体公司 倒装芯片功率放大器和阻抗匹配网络

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3378435B2 (ja) * 1995-09-29 2003-02-17 株式会社東芝 超高周波帯無線通信装置
US5869894A (en) * 1997-07-18 1999-02-09 Lucent Technologies Inc. RF IC package
JP3582460B2 (ja) * 2000-06-20 2004-10-27 株式会社村田製作所 高周波モジュール
JP4049239B2 (ja) * 2000-08-30 2008-02-20 Tdk株式会社 表面弾性波素子を含む高周波モジュール部品の製造方法
US7167688B2 (en) * 2003-07-30 2007-01-23 Chi Mei Communication Systems, Inc. RF transceiver module formed in multi-layered ceramic
JP2005117497A (ja) 2003-10-09 2005-04-28 Kyocera Corp 高周波モジュール及びそれを搭載した無線通信装置
JP2005235825A (ja) * 2004-02-17 2005-09-02 Renesas Technology Corp 電子回路モジュール
JP4521602B2 (ja) * 2005-06-06 2010-08-11 ルネサスエレクトロニクス株式会社 マルチモード高周波回路
EP1788626B1 (en) * 2005-11-17 2009-04-29 Seiko Epson Corporation Multilayer circuit with variable inductor, and method of manufacturing it
JP2007188916A (ja) * 2006-01-11 2007-07-26 Renesas Technology Corp 半導体装置
JP4892253B2 (ja) * 2006-02-28 2012-03-07 ルネサスエレクトロニクス株式会社 電子装置
US7514774B2 (en) * 2006-09-15 2009-04-07 Hong Kong Applied Science Technology Research Institute Company Limited Stacked multi-chip package with EMI shielding
US20090189269A1 (en) * 2008-01-24 2009-07-30 Lap-Wai Lydia Leung Electronic Circuit Package
WO2010087302A1 (ja) * 2009-01-28 2010-08-05 株式会社村田製作所 アンテナ共用モジュール
JP5583699B2 (ja) * 2009-02-18 2014-09-03 ホリンワース ファンド,エル.エル.シー. メタマテリアル電力増幅器システム
US8750810B2 (en) * 2009-07-24 2014-06-10 Qualcomm Incorporated Power amplifier with switched output matching for multi-mode operation
JP5234071B2 (ja) * 2010-09-03 2013-07-10 株式会社村田製作所 Rficモジュール
JP5087118B2 (ja) * 2010-09-28 2012-11-28 株式会社東芝 通信機器
CN103650337B (zh) 2011-05-13 2016-09-21 天工方案公司 用于偏置功率放大器的装置和方法
KR101208241B1 (ko) * 2011-07-12 2012-12-04 삼성전기주식회사 반도체 패키지
KR102052307B1 (ko) * 2011-11-09 2019-12-04 스카이워크스 솔루션즈, 인코포레이티드 전계 효과 트랜지스터 구조 및 관련된 무선-주파수 스위치
US9467940B2 (en) * 2011-11-11 2016-10-11 Skyworks Solutions, Inc. Flip-chip linear power amplifier with high power added efficiency
US9100060B2 (en) * 2011-12-14 2015-08-04 Infineon Technologies Ag System and method for a radio frequency switch
US20130214979A1 (en) * 2012-02-17 2013-08-22 Emily B. McMilin Electronic Device Antennas with Filter and Tuning Circuitry
US9048284B2 (en) * 2012-06-28 2015-06-02 Skyworks Solutions, Inc. Integrated RF front end system
US9837324B2 (en) * 2013-11-12 2017-12-05 Skyworks Solutions, Inc. Devices and methods related to radio-frequency switches having improved on-resistance performance
US9344140B2 (en) 2014-02-25 2016-05-17 Skyworks Solutions, Inc. Systems, devices and methods related to improved radio-frequency modules

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102769434A (zh) * 2011-05-04 2012-11-07 特里奎恩特半导体公司 倒装芯片功率放大器和阻抗匹配网络

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