CN106057823B - 一种阵列基板及其制作方法、显示装置 - Google Patents

一种阵列基板及其制作方法、显示装置 Download PDF

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CN106057823B
CN106057823B CN201610619516.3A CN201610619516A CN106057823B CN 106057823 B CN106057823 B CN 106057823B CN 201610619516 A CN201610619516 A CN 201610619516A CN 106057823 B CN106057823 B CN 106057823B
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conductive line
underlay substrate
insulating layer
signal
signal wire
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CN106057823A (zh
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郝金刚
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BOE Technology Group Co Ltd
Beijing BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing BOE Optoelectronics Technology Co Ltd
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Priority to CN201610619516.3A priority Critical patent/CN106057823B/zh
Publication of CN106057823A publication Critical patent/CN106057823A/zh
Priority to PCT/CN2017/086083 priority patent/WO2018019022A1/en
Priority to US15/578,560 priority patent/US10304682B2/en
Priority to US16/380,499 priority patent/US10573595B2/en
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    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
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    • G02F1/136286Wiring, e.g. gate line, drain line
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    • GPHYSICS
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    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
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    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
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    • G02F2201/123Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode pixel

Abstract

本发明实施例提供一种阵列基板及其制作方法、显示装置,涉及液晶面板的制造技术领域,在制作过程中避免了由于两条信号线之间的相邻电压差而导致静电的产生和累积,防止阵列基板上累积过量静电而发生静电击穿。在衬底基板上,通过构图工艺形成第一信号线;在衬底基板上,形成用于将至少两条第一信号线相连接的第一导通线;在形成有第一信号线和第一导通线的衬底基板上,形成第一绝缘层;在第一绝缘层上,在位于任意两条相连通的第一信号线之间,且对应第一导通线的位置处形成第一过孔;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开。

Description

一种阵列基板及其制作方法、显示装置
技术领域
本发明涉及液晶面板的制造技术领域,尤其涉及一种阵列基板及其制作方法、显示装置。
背景技术
在TFT-LCD(Thin Film Transistor Liquid Crystal Display,薄膜晶体管液晶显示装置)阵列基板的制造技术领域,静电(Electro-Static discharge,ESD)一直是一个难以解决的问题,静电会导致产品良率降低、成本增加、产能下降,一直影响着液晶显示装置的品质。
在液晶面板的制作工艺中,尤其是在真空成膜以及干刻蚀刻等等离子体的工作过程中,由于在相邻的两条信号线之间产生电压差,从而不可避免的会在阵列基板的玻璃表面上产生并累积静电。由于在阵列基板的制作工艺中,需要通过移动机械手支撑柱、滚轮等工具支撑阵列基板或对阵列基板进行工序间的转运,而移动机械手支撑柱、滚轮等工具与阵列基板之间的接触面积小,大量累积在阵列基板上的静电电荷可能会在阵列基板与移动机械手支撑柱、滚轮等工具的接触点处形成静电聚集点,引起静电击穿,导致阵列基板的损坏。
发明内容
本发明的实施例提供一种阵列基板及其制作方法、显示装置,在制作过程中避免了由于相邻的两条信号线之间存在电压差而导致静电的产生和累积,防止阵列基板上累积过量静电而发生静电击穿。
为达到上述目的,本发明的实施例采用如下技术方案:
本发明实施例提供一种阵列基板的制作方法,包括:在衬底基板上,通过构图工艺形成第一信号线;在衬底基板上,形成用于将至少两条第一信号线相连接的第一导通线;在形成有第一信号线和第一导通线的衬底基板上,形成第一绝缘层;在第一绝缘层上,在位于任意两条相连通的第一信号线之间,且对应第一导通线的位置处形成第一过孔;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开。
进一步的,还包括:在形成有第一绝缘层的衬底基板上,通过构图工艺形成第二信号线;第二信号线在衬底基板上的投影与第一信号线在衬底基板上的投影相互交叉;在衬底基板上,形成用于将至少两条第二信号线相连通的第二导通线;在形成有第二导通线的衬底基板上,形成第二绝缘层;在第二绝缘层上,在位于任意两条相连通的第二信号线之间,且对应第二导通线的位置形成第二过孔;通过刻蚀工艺,将对应第二过孔位置处的第二导通线断开。
优选的,在衬底基板上通过构图工艺形成第一信号线的同时,形成TFT的源极和漏极。
进一步的,形成第一导通线包括:在衬底基板上通过构图工艺形成像素电极的同时,形成第一导通线。
优选的,在形成第一信号线的同时,通过构图工艺形成将至少两条第一信号线相连接的第一导通线。
优选的,在衬底基板上,通过构图工艺形成第一信号线的同时,形成TFT的栅极,栅极与第一信号线相连接。
进一步的,形成第一导通线之前,制作方法包括:在形成有第一信号线的衬底基板上,形成栅极绝缘层,且通过构图工艺,在栅极绝缘层对应第一信号线的位置形成第三过孔;在形成有第一信号线和第一导通线的衬底基板上,形成第一绝缘层之前,形成第一导通线包括:在形成有栅极绝缘层的衬底基板上,通过构图工艺形成像素电极的同时,形成第一导通线,第一导通线通过第三过孔将至少两条第一信号线相连通。
优选的,在形成第一信号线的同时,通过构图工艺形成将至少两条第一信号线相连通的第一导通线。
优选的,在形成有第一信号线和第一导通线的衬底基板上,形成第一绝缘层之前还包括:通过构图工艺形成TFT源极和漏极的同时,形成第二信号线,第二信号线在衬底基板上的投影与第一信号线在衬底基板上的投影相互交叉;其中,第一导通线将至少两条第二信号线相连接;在形成有第二信号线的衬底基板上,形成第一绝缘层;在第一绝缘层上,在位于任意两条相连通的第一信号线之间,且对应第一导通线的位置处形成第一过孔的同时,还包括:在第一绝缘层上,在位于任意两条相连通的第二信号线之间,且对应第一导通线的位置处形成第四过孔;通过刻蚀工艺,将对应第一过孔和第四过孔位置处的第一导通线断开。
进一步的,在形成有TFT的源极和漏极的衬底基板上,通过构图工艺形成钝化层;在第一绝缘层上,在位于任意两条相连通的第一信号线之间,且对应第一导通线的位置形成第一过孔包括:在钝化层对应第一导通线的位置形成第一过孔;在形成有钝化层的衬底基板上,形成透明导电层,透明导电层通过第一过孔与第一导通线相连接;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开之前包括,对透明导电层进行掩膜、曝光;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开还包括去除第一过孔中的透明导电层,且在进行该刻蚀工艺的同时形成公共电极。
优选的,在形成有TFT的栅极的衬底基板上,通过构图工艺形成栅极绝缘层;在形成有TFT的源极和漏极的衬底基板上,通过构图工艺形成钝化层;在第一绝缘层上,在位于任意两条相连通的第一信号线之间,且对应第一导通线的位置形成第一过孔包括:在钝化层以及栅极绝缘层上,在位于任意两条相连通的第一信号线之间,对应第一导通线的位置形成第一过孔;在形成有钝化层的衬底基板上,形成透明导电层,透明导电层通过第一过孔与第一导通线相连接;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开之前包括,对透明导电层进行掩膜、曝光;通过刻蚀工艺,将对应第一过孔位置处的第一导通线断开还包括去除第一过孔中的透明导电层,且在进行该刻蚀工艺的同时形成公共电极。
优选的,在阵列基板的显示区域,以及位于显示区域周边的非显示区域均形成有第一导通线。
优选的,显示区域还包括有效区域以及位于有效区域周边的虚拟区域,在显示区域形成的第一导通线设置在虚拟区域。
本发明实施例的另一方面提供一种阵列基板,采用上述的阵列基板的制作方法制得。
本发明实施例的再一方面提供一种显示装置,包括上述的阵列基板。
本发明提供一种阵列基板及其制作方法、显示装置,在制作过程中将至少两条第一信号线通过第一导通线连通,消除了第一信号线之间的电压差,从而避免由于相邻两条第一信号线之间具有电压差而在阵列基板上产生并累积静电,导致在阵列基板上的静电累积处引起静电击穿而损坏阵列基板,在制作第一绝缘层时制作对应于第一导通线位置处的第一过孔,并在刻蚀工艺中通过第一过孔将第一导通线断开,从而恢复阵列基板的使用功能。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为本发明提供的一种阵列基板的制作方法的流程图;
图2为本发明提供的一种阵列基板的制作方法中阵列基板的结构示意图;
图3为本发明提供的一种阵列基板的制作方法的流程图;
图4为本发明提供的一种阵列基板的制作方法中阵列基板的俯视图;
图5为图4中沿A1-A2-A3方向的剖视图;
图6为图4中沿A1-A2-A3方向的剖视图;
图7为图4中沿A1-A2-A3方向的剖视图;
图8为图4中沿A1-A2-A3方向的剖视图;
图9为图4中沿A1-A2-A3方向的剖视图;
图10为图4中沿A1-A2-A3方向的剖视图;
图11为图4中沿B1-B2-B3方向的剖视图;
图12为本发明提供的一种阵列基板的制作方法中阵列基板的俯视图;
图13为图4中沿A1-A2-A3方向的剖视图;
图14为图4中沿A1-A2-A3方向的剖视图;
图15为图4中沿A1-A2-A3方向的剖视图;
图16为图4中沿A1-A2-A3方向的剖视图;
图17为图4中沿A1-A2-A3方向的剖视图;
图18为本发明提供的一种阵列基板的制作方法中阵列基板的俯视图;
图19为图18中沿A1-A2-A3-A4方向的剖视图;
图20为本发明提供的一种阵列基板的制作方法中阵列基板的俯视图;
图21为图20中沿A1-A2-A3-A4方向的剖视图;
图22为本发明提供的一种阵列基板的制作方法中阵列基板的俯视图;
图23为图20中沿A1-A2-A3-A4方向的剖视图;
图24为本发明提供的一种阵列基板的制作方法中阵列基板非显示区域的结构示意图。
附图标记:
10-衬底基板;11-第一信号线;12-第一导通线;13-第一绝缘层;131-栅极绝缘层;132-钝化层;133-具有绝缘性质的膜层;20-透明导电层;201-公共电极;21-第二信号线;22-第二导通线;23-第二绝缘层;30-源极;31,31,-引线;40漏极;50-栅极;60-像素电极;a-第一过孔;b-第二过孔;c-第三过孔;d-第四过孔;X-显示区域;Y-非显示区域。
具体实施方式
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。
本发明实施例提供一种步骤如图1所示的阵列基板的制作方法,包括:
S101、如图2所示,在衬底基板10上,通过构图工艺形成多条第一信号线11。
S102、在衬底基板10上,形成用于将至少两条第一信号线11相连接的第一导通线12。通过第一导通线12消除至少两条互相连通的第一信号线11之间的电压差,从而减少静电的产生。
优选的,采用一条第一导通线12将所有的第一信号线11之间均连通为优选的方案,这样一来,能够通过第一导通线12的连通,消除所有第一信号线11之间的电压差。
S103、在形成有第一信号线11和第一导通线12的衬底基板10上,形成第一绝缘层13。
S104、在第一绝缘层13上,在位于任意两条相连通的第一信号线11之间,且对应第一导通线12的位置处形成第一过孔a。
S105、通过刻蚀工艺,将对应第一过孔a位置处的第一导通线12断开。
需要说明的是,阵列基板如图4所示划分有显示区域X、非显示区域Y。对于显示区域X而言,上述第一信号线11可以为栅线,在此情况下,将至少两条栅线互相连通的第一导通线12可以与栅线同层同材料。
具体的,如图5所示(为图4中沿A1-A2-A3方向的剖视图),在通过构图工艺形成TFT的栅极50和栅线的同时,形成将至少两条栅线之间互相连通的第一导通线12。
在形成有栅线的衬底基板10上,形成栅极绝缘层131。
如图6所示(为图4中沿A1-A2-A3方向的剖视图),通过构图工艺形成有源层和像素电极60以及TFT的源极和漏极。
在此基础上,对于应用于ADS型(Advanced-super Dimensional Switching,高级超维场转换型)显示装置的阵列基板而言,可以将公共电极201制作于阵列基板上,且该公共电极201与像素电极60之间具有钝化层132。
具体的,如图7所示(为图4中沿A1-A2-A3方向的剖视图),在形成有像素电极60的衬底基板10上,通过构图工艺形成钝化层132。在钝化层132和栅极绝缘层131对应第一导通线12的位置形成穿透钝化层132和栅极绝缘层131的第一过孔a。其中,上述钝化层132和栅极绝缘层131构成上述第一绝缘层13。
在此基础上,如图8所示(为图4中沿A1-A2-A3方向的剖视图),在形成有钝化层132的衬底基板10上,形成透明导电层20,透明导电层20通过第一过孔a与第一导通线12相连接。
如图9所示(为图4中沿A1-A2-A3方向的剖视图),对透明导电层20进行掩膜、曝光。使用能够同时刻蚀金属线和透明导电材料的刻蚀液,在形成公共电极201的图案同时,去除第一过孔a中形成公共电极201的透明导电材料,并将第一导通线12切断,使得连通的任意两条栅线之间断开,恢复栅线的功能。
此外,将任意两条栅线互相连通的第一导通线12还可以采用其它导电材料,例如透明导电材料ITO(Indium tin oxide,氧化铟锡),IZO(Indium zinc oxide,氧化铟锌)。
需要说明的是,阵列基板中的TFT根据其上的栅极和栅极绝缘层相对于衬底基板的上下位置关系不同,可以划分为底栅型和顶栅型。底栅型指的是栅极相对于栅极绝缘层而言,位于靠近衬底基板一侧;顶栅型指的是栅极相对于栅极绝缘层而言,位于远离衬底基板的一侧。
上述第一信号线11为栅线的具体举例说明中,是以上述阵列基板中的TFT为底栅型结构为例进行的说明。当上述TFT为顶栅型结构时,如图10所示,在形成有有源层和栅极绝缘层131的衬底基板10上,通过构图工艺形成TFT的栅极50和第一信号线11(即栅线),同时形成将至少两条第一信号线11(即栅线)之间互相连通的第一导通线12,此时第一导通线12与第一信号线11(即栅线)同层同材料。
在形成有栅线的衬底基板10上,通过构图工艺形成具有绝缘性质的膜层133。
在形成有具有绝缘性质的膜层133的衬底基板10上,形成像素电极60以及TFT的源极30和漏极40,并通过过孔将TFT的源极30和漏极40分别与有源层相连通。
在形成有TFT的源极30和漏极40的衬底基板10上,通过构图工艺形成钝化层132,在具有绝缘性质的膜层133和钝化层132对应第一导通线12的位置形成穿透具有绝缘性质的膜层133和钝化层132的第一过孔a。其中,上述具有绝缘性质的膜层133和钝化层132构成上述第一绝缘层13。
在形成有具有绝缘性质的膜层133和钝化层132的衬底基板10上,形成透明导电层20,透明导电层20通过第一过孔a与第一导通线12相连接。
对于顶栅型结构,将至少两条第一信号线11(即栅线)之间互相连通的第一导通线12刻蚀断开的步骤与底栅型结构的刻蚀断开步骤相同,在底栅型结构的制作方法举例中已经进行了详细的说明,此处不再赘述。
或者,上述第一信号线11可以为数据线。在此情况下,用于将至少两条数据线互相连通的第一导通线12可以与数据线同层同材料,或者采用同上所述的透明导电材料。
综上所述,通过在显示区域X设置第一导通线12将多条栅线或多条数据线之间相互连通,从而可以减小显示区域X的静电产生。
对于非显示区域Y而言,如图4所示,第一信号线11可以为引线31,该引线31可以与栅线或者数据线同层同材料,且用于将至少两条引线31互相连通的第一导通线12的材料同上所述。通过在非显示区域Y设置第一导通线12将多条引线31之间相互连通,能够减小非显示区域Y的静电产生。
在此基础上,当引线31与数据线同层同材料,且该引线31与栅线相连接时,由于引线31与栅线异层设置,因此引线31与栅线之间具有绝缘层,通过在该绝缘层上制作过孔,并采用导电材料穿过该过孔使得引线31与栅线相连通。这样一来,由于引线31和栅线之间通过导电材料间接连接,引线31和栅线之间的导通性能会受到导电材料自身电阻的影响,导通性能降低。因此,如果仅在显示区域X制作第一导通线12,受到导电材料自身电阻的影响,非显示区域Y的引线31上的静电去除效果不理想,反之,如果仅在非显示区域Y的引线31上制作第一导通线12,同样的,显示区域X的栅线或数据线上的静电去除效果也不理想。
因此优选的,如图4所示,在显示区域X和非显示区域Y分别设置第一导通线12。
此外,本发明的阵列基板的制作方法中,对于步骤S101与步骤S102之间的先后顺序也不作限定,本领域技术人员可以根据需要选择先进行步骤S101或先进行步骤S102,亦或将步骤S101与S102同时进行。
本发明提供的一种阵列基板的制作方法,在制作过程中将至少两条第一信号线通过第一导通线连通,消除了第一信号线之间的电压差,从而避免由于相邻两条第一信号线之间具有电压差而在阵列基板上产生并累积静电,导致在阵列基板上的静电累积处引起静电击穿而损坏阵列基板,在制作第一绝缘层时制作对应于第一导通线位置处的第一过孔,并在刻蚀工艺中通过第一过孔将第一导通线断开,从而恢复阵列基板的使用功能。
在此基础上,阵列基板中通常具有异层且交叉设置的金属线,例如栅线和数据线,在此情况下,当第一信号线11为栅线,第二信号线21为数据线时,在形成有如图2所示的结构的衬底基板10上,所述阵列基板的制作方法,如图3所示,还包括:
S201、如图11所示(为图4中沿B1-B2-B3方向的剖视图),在形成有第一绝缘层13的衬底基板10上,通过构图工艺形成第二信号线21(即数据线),第二信号线21(即数据线)在衬底基板10上的投影与第一信号线11(即栅线)在衬底基板10上的投影相互交叉。
S202、在衬底基板10上,形成用于将至少两条第二信号线21相连通的第二导通线22。其中,第二导通线22如图11所示与第一导通线12相交。
S203、在形成有第二导通线22的衬底基板10上,形成第二绝缘层23。
S204、在第二绝缘层23上,在位于任意两条相连通的第二信号线21之间,且对应第二导通线22的位置形成第二过孔b。
S205、通过刻蚀工艺,将对应第二过孔b位置处的第二导通线22断开。
需要说明的是,用于将至少两条栅线(第一信号线11)相连接的第一导通线12可以与栅线同层同材料,或者采用上述透明导电材料。用于将至少两条数据线(第二信号线21)相连接的第二导通线22可以与数据线同层同材料,或者采用上述透明导电材料。
以下以第一导通线12或第二导通线22与如图9所示的像素电极60同层同材料,直接或通过过孔连通多条第一信号线11或多条第二信号线21为例,对阵列基板的制作方法进行详细的具体说明。
实施例一
本实施例中,阵列基板中设置有第一信号线11和第一导通线12,在此情况下,如图4所示,该第一信号线11为栅线。
如图13所示(为图4中沿A1-A2-A3方向的剖视图),形成TFT的栅极50的同时形成第一信号线11(栅线)。在形成有第一信号线11(栅线)的衬底基板10上,形成栅极绝缘层131,且通过构图工艺,在栅极绝缘层131对应第一信号线11(栅线)的位置形成第三过孔c。
如图14(为图4中沿A1-A2-A3方向的剖视图)所示,在通过构图工艺形成像素电极60的同时,形成第一导通线12(此时第一导通线12与像素电极60同层同材料),第一导通线12通过第三过孔c将至少两条第一信号线11(栅线)相连通。
如图15(为图4中沿A1-A2-A3方向的剖视图)所示,在形成有像素电极60的衬底基板10上,通过构图工艺形成TFT的源极30和漏极40。
在此基础上,对于用于构成ADS型(Advanced-super Dimensional Switching,高级超维场转换型)显示装置的阵列基板而言,该阵列基板还包括与上述像素电极60绝缘设置的公共电极201。具体的,如图15所示,在形成有TFT的源极30和漏极40的衬底基板10上,通过构图工艺形成钝化层132。在钝化层132对应第一导通线12的位置形成第一过孔a。其中,上述钝化层132构成上述的第一绝缘层13。
如图16所示(为图4中沿A1-A2-A3方向的剖视图),在形成有钝化层132的衬底基板10上,形成透明导电层20,透明导电层20通过第一过孔a与第一导通线12相连接。
如图17所示(为图4中沿A1-A2-A3方向的剖视图),对透明导电层20进行掩膜、曝光,以形成公共电极201的图案。
这样一来,可以在制作公共电极201图案的同时,将第一导通线12断开,避免增加工艺步骤。
具体的,可以在用于透明导电层20的掩膜版上对应第一过孔a的位置形成与第一过孔a相同的图案,在对透明导电层20进行掩膜、曝光后,通过刻蚀工艺,在形成公共电极201的图案的同时,去除第一过孔a中的透明导电层20,由于第一导通线12为形成像素电极60的透明导电材料,且像素电极60和公共电极201的材料相同,因此采用一种刻蚀液能够同时通过第一过孔a将用于形成像素电极60和公共电极201的透明导电材料刻蚀,并将对应第一过孔a位置处的第一导通线12断开。即将连通的至少两条栅线之间断开,恢复栅线的功能。
此外,对于上述第一信号线11为栅线,第一导通线12与像素电极60同层同材料制作的情况下,除了如图15所示的在形成像素电极60以及第一导通线12之后,通过构图工艺形成TFT的源极30和漏极40的设置方式之外,还可以为先通过构图工艺形成TFT的源极30和漏极40之后,再形成像素电极60以及与像素电极60同层同材料的第一导通线12。其他设置及刻蚀与实施例一所举例说明的方式相同,以上已进行了详细的说明,此处不再赘述。
实施例二
本实施例中,如图18所示,阵列基板中设置有第一信号线11和第一导通线12,该第一信号线11为数据线。即,如图19所示(为图18中沿A1-A2-A3–A4方向的剖视图),形成TFT的源极30、漏极40的同时形成第一信号线11(数据线)。
具体的,如图19所示,在衬底基板10上,通过构图工艺形成像素电极60的同时,形成第一导通线12。第一导通线12与像素电极60同层同材料。
在形成有像素电极60的衬底基板10上,形成第一信号线11的同时,形成TFT的源极30和漏极40。第一导通线12将至少两条第一信号线11相连接。
接下来,在形成有TFT的源极30和漏极40的衬底基板10上形成钝化层132(即第一绝缘层13)、第一过孔a、透明导电层20,以及在制作公共电极201的同时对第一导通线12刻蚀断开的步骤与实施例一相同,此处不再赘述。
实施例三
本实施例中,阵列基板中设置有第一信号线11和第二信号线21,以及第一导通线12,该第一信号线11为栅线,第二信号线21为数据线。如图20所示,该第一导通线12用于将多条栅线之间相互连通,将多条数据线之间相互连通。
如图21所示(为图20中沿A1-A2-A3–A4方向的剖视图),形成TFT的栅极50的同时形成第一信号线11,栅极50与第一信号线11相连接。
在通过构图工艺形成像素电极60的同时,形成第一导通线12,第一导通线12通过第三过孔c将至少两条第一信号线11相连通,第一导通线12如图20所示交叉设置。
在形成有像素电极60的衬底基板10上,通过构图工艺形成TFT的源极30和漏极40的同时,形成与第一信号线11交叉设置的第二信号线21,上述第一导通线12将至少两条第二信号线21相连接。
接下来,在形成有TFT的源极30和漏极40的衬底基板10上形成钝化层132(即第一绝缘层13)、第一过孔a、第四过孔d(在钝化层132位于任意两条相连通的第二信号线21之间对应第一导通线12的位置处形成的过孔)、透明导电层20以及在制作公共电极201的同时对第一导通线12刻蚀断开的步骤与实施例一相同,此处不再赘述。
此外,第一导通线12不仅可以如图20所示为L型,还可以为如图22所示,将该第一导通线12设置为折线的形状。
上述实施例三中是以阵列基板中的TFT为底栅型结构为例进行说明的,对于顶栅型结构而言,如图23所示,在形成有有源层和栅极绝缘层131的衬底基板10上,通过构图工艺形成TFT的栅极50和第一信号线11(即栅线)。
在形成有TFT的栅极50和第一信号线11(栅线)的衬底基板10上,通过构图工艺形成具有绝缘性质的膜层133。且通过构图工艺,在具有绝缘性质的膜层133上形成有第三过孔c。
在形成有具有绝缘性质的膜层133的衬底基板10上,通过构图工艺形成像素电极60的同时,形成第一导通线12。
在形成有像素电极60的衬底基板10上,通过构图工艺形成TFT的源极30和漏极40的同时,形成第二信号线21(数据线),上述第一导通线12将至少两条第二信号线21(数据线)相连通。
在形成有第二信号线21(数据线)的衬底基板10上,形成钝化层132(即第一绝缘层13),在钝化层132(即第一绝缘层13)位于任意两条相连通的第一信号线11(栅线)之间对应第一导通线12的位置形成穿透钝化层132(即第一绝缘层13)的第一过孔a,在钝化层132(即第一绝缘层13)位于任意两条相连通的第二信号线21(数据线)之间对应第一导通线12的位置形成穿透钝化层132(即第一绝缘层13)的第四过孔d。在形成有钝化层132的衬底基板10上,形成透明导电层20,透明导电层20通过第一过孔a和第四过孔d与第一导通线12相连接。
对透明导电层20进行掩膜、曝光。使用能够同时刻蚀金属线和透明导电材料的刻蚀液,在形成公共电极201的图案同时,去除第一过孔a和第四过孔d中形成公共电极201的透明导电材料,并将第一导通线12切断,使得由第一导通线12连通的任意两条栅线之间,以及由第一导通线12连通的任意两条数据线之间均断开,恢复栅线和数据线的功能。
此外,对于非显示区域Y中如图24所示的多条平行的引线31而言,同样可以采用与像素电极60同层同材料的第一导通线12,将与栅线同层的多个引线31相连通的同时,通过该第一导通线12将与数据线同层的引线31’相连通。
为了保证显示面板的显示效果,在显示面板显示区域X的周边如图12所示,可以设置虚拟区域(Dummy),虚拟区域(Dummy)属于显示区域X,但虚拟区域(Dummy)的设置主要是使接入的信号在虚拟区域(Dummy)经过初始的不稳定状态,当信号进入有效的显示区域X后已经趋于稳定,这样一来可以保证有效的显示区域X的显示效果稳定,因此虚拟区域(Dummy)通常包裹于显示面板的壳体内不用于显示。因此为了不对显示效果造成影响,优选的,上述设置于显示区域X的第一导通线12和/或第二导通线22设置于虚拟区域(Dummy)内。
将第一导通线12和/或第二导通线22设置于虚拟区域(Dummy)内的阵列基板的制作过程同实施例一~三,此处不再赘述。
此外,由于阵列基板在制作过程中需要通过多次掩模、曝光、刻蚀等工艺过程,且第一导通线12和/或第二导通线22通常非常细小,极易在工艺过程中发生接触不良或断裂的情况,优选的,在显示区域X和/或非显示区域Y的第一导通线12和/或第二导通线22均设置为多条。
本发明实施例还提供一种阵列基板,采用上述阵列基板的制作方法制作而成。上述阵列基板的制作方法中,已经对阵列基板的结构以及制作过程进行了详细的说明,此处不再赘述。
本发明实施例还提供一种显示装置,包括上述阵列基板。上述阵列基板的制作方法中,已经对阵列基板的结构以及制作过程进行了详细的说明,此处不再赘述。
以上所述,仅为本发明的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本发明的保护范围之内。因此,本发明的保护范围应以所述权利要求的保护范围为准。

Claims (13)

1.一种阵列基板的制作方法,其特征在于,包括:
在衬底基板上,通过构图工艺形成第一信号线;
在所述衬底基板上,形成用于将至少两条所述第一信号线相连接的第一导通线;
在形成有所述第一信号线和第一导通线的衬底基板上,形成第一绝缘层;
在所述第一绝缘层上,在位于任意两条相连通的所述第一信号线之间,且对应所述第一导通线的位置处形成第一过孔;
在形成有所述第一绝缘层的衬底基板上,形成透明导电层,所述透明导电层通过所述第一过孔与所述第一导通线相连接;
对所述透明导电层进行掩膜、曝光;
通过刻蚀工艺,将对应所述第一过孔位置处的所述第一导通线断开;
其中,通过刻蚀工艺,将对应所述第一过孔位置处的所述第一导通线断开的步骤还包括:去除所述第一过孔中的透明导电层,且在进行该刻蚀工艺的同时形成公共电极。
2.根据权利要求1所述的阵列基板的制作方法,其特征在于,还包括:
在形成有所述第一绝缘层的衬底基板上,通过构图工艺形成第二信号线;所述第二信号线在衬底基板上的投影与所述第一信号线在衬底基板上的投影相互交叉;
在所述衬底基板上,形成用于将至少两条所述第二信号线相连通的第二导通线;
在形成有所述第二导通线的衬底基板上,形成第二绝缘层;
在所述第二绝缘层上,在位于任意两条相连通的所述第二信号线之间,且对应所述第二导通线的位置形成第二过孔;
通过刻蚀工艺,将对应所述第二过孔位置处的所述第二导通线断开。
3.根据权利要求1所述的阵列基板的制作方法,其特征在于,
在衬底基板上通过构图工艺形成所述第一信号线的同时,形成TFT的源极和漏极。
4.根据权利要求3所述的阵列基板的制作方法,其特征在于,
在所述衬底基板上,形成用于将至少两条所述第一信号线相连接的第一导通线包括:
在所述衬底基板上通过构图工艺形成像素电极的同时,形成所述第一导通线。
5.根据权利要求3所述的阵列基板的制作方法,其特征在于,
所述在形成所述第一信号线的同时,通过构图工艺形成将至少两条所述第一信号线相连接的第一导通线。
6.根据权利要求1所述的阵列基板的制作方法,其特征在于,
在衬底基板上,通过构图工艺形成所述第一信号线的同时,形成TFT的栅极,所述栅极与所述第一信号线相连接。
7.根据权利要求6所述的阵列基板的制作方法,其特征在于,
形成所述第一导通线之前,所述制作方法包括:在形成有所述第一信号线的衬底基板上,形成栅极绝缘层,且通过构图工艺,在所述栅极绝缘层对应所述第一信号线的位置形成第三过孔;
所述在形成有所述第一信号线和第一导通线的衬底基板上,形成第一绝缘层之前,形成所述第一导通线包括:在形成有所述栅极绝缘层的衬底基板上,通过构图工艺形成像素电极的同时,形成所述第一导通线,所述第一导通线通过所述第三过孔将至少两条所述第一信号线相连通。
8.根据权利要求6所述的阵列基板的制作方法,其特征在于,
所述在形成所述第一信号线的同时,通过构图工艺形成将至少两条所述第一信号线相连通的第一导通线。
9.根据权利要求7所述的阵列基板的制作方法,其特征在于,在形成有所述第一信号线和第一导通线的衬底基板上,形成第一绝缘层之前还包括:
通过构图工艺形成所述TFT源极和漏极的同时,形成第二信号线,所述第二信号线在衬底基板上的投影与所述第一信号线在衬底基板上的投影相互交叉;
其中,所述第一导通线将至少两条所述第二信号线相连接;
在形成有所述第二信号线的衬底基板上,形成第一绝缘层;
所述在所述第一绝缘层上,在位于任意两条相连通的所述第一信号线之间,且对应所述第一导通线的位置处形成第一过孔的同时,所述方法还包括:
在所述第一绝缘层上,在位于任意两条相连通的所述第二信号线之间,且对应所述第一导通线的位置处形成第四过孔;
通过刻蚀工艺,将对应所述第一过孔和所述第四过孔位置处的所述第一导通线断开。
10.根据权利要求3-5或7任一项所述的阵列基板的制作方法,其特征在于,还包括:
在形成有所述TFT的源极和漏极的衬底基板上,通过构图工艺形成钝化层;
所述在所述第一绝缘层上,在位于任意两条相连通的所述第一信号线之间,且对应所述第一导通线的位置形成第一过孔包括:在所述钝化层上,在位于任意两条相连通的所述第一信号线之间,对应所述第一导通线的位置形成所述第一过孔;
所述在形成有所述第一绝缘层的衬底基板上,形成透明导电层的步骤包括:在形成有所述钝化层的衬底基板上,形成透明导电层。
11.根据权利要求8所述的阵列基板的制作方法,其特征在于,还包括:
在形成有TFT的栅极的衬底基板上,通过构图工艺形成栅极绝缘层;
在形成有所述TFT的源极和漏极的衬底基板上,通过构图工艺形成钝化层;
所述在所述第一绝缘层上,在位于任意两条相连通的所述第一信号线之间,且对应所述第一导通线的位置形成第一过孔包括:在所述钝化层以及所述栅极绝缘层上,在位于任意两条相连通的所述第一信号线之间,对应所述第一导通线的位置形成所述第一过孔;
所述在形成有所述第一绝缘层的衬底基板上,形成透明导电层的步骤包括:在形成有所述栅绝缘层和钝化层的衬底基板上,形成透明导电层。
12.一种阵列基板,其特征在于,采用如权利要求1-11任一项所述的制作方法制得。
13.一种显示装置,其特征在于,包括如权利要求12所述的阵列基板。
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