CN105981133B - 具有注入组件的上部圆顶 - Google Patents

具有注入组件的上部圆顶 Download PDF

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Publication number
CN105981133B
CN105981133B CN201580008431.5A CN201580008431A CN105981133B CN 105981133 B CN105981133 B CN 105981133B CN 201580008431 A CN201580008431 A CN 201580008431A CN 105981133 B CN105981133 B CN 105981133B
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China
Prior art keywords
dome
coupled
flange plate
holes
gas
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English (en)
Chinese (zh)
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CN105981133A (zh
Inventor
保罗·布里尔哈特
常安忠
埃德里克·唐
建·彭·陆
詹姆斯·弗朗西斯·麦克
叶祉渊
卡尔蒂克·沙阿
埃罗尔·安东尼奥·C·桑切斯
戴维·K·卡尔森
萨瑟施·库珀奥
约瑟夫·M·拉内什
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Applied Materials Inc
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Applied Materials Inc
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Publication of CN105981133A publication Critical patent/CN105981133A/zh
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/08Reaction chambers; Selection of materials therefor
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/10Heating of the reaction chamber or the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67115Apparatus for thermal treatment mainly by radiation

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Vapour Deposition (AREA)
CN201580008431.5A 2014-02-14 2015-01-28 具有注入组件的上部圆顶 Active CN105981133B (zh)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US201461940178P 2014-02-14 2014-02-14
US61/940,178 2014-02-14
US201461943625P 2014-02-24 2014-02-24
US61/943,625 2014-02-24
US201461992053P 2014-05-12 2014-05-12
US61/992,053 2014-05-12
PCT/US2015/013347 WO2015123022A1 (en) 2014-02-14 2015-01-28 Upper dome with injection assembly

Publications (2)

Publication Number Publication Date
CN105981133A CN105981133A (zh) 2016-09-28
CN105981133B true CN105981133B (zh) 2019-06-28

Family

ID=53797591

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580008431.5A Active CN105981133B (zh) 2014-02-14 2015-01-28 具有注入组件的上部圆顶

Country Status (7)

Country Link
US (2) US9845550B2 (enExample)
JP (1) JP6542245B2 (enExample)
KR (1) KR102381816B1 (enExample)
CN (1) CN105981133B (enExample)
SG (1) SG11201606004PA (enExample)
TW (1) TWI665329B (enExample)
WO (1) WO2015123022A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105981133B (zh) * 2014-02-14 2019-06-28 应用材料公司 具有注入组件的上部圆顶
US10053777B2 (en) * 2014-03-19 2018-08-21 Applied Materials, Inc. Thermal processing chamber
CN106463344B (zh) * 2014-05-16 2019-10-11 应用材料公司 喷头设计
TWI677593B (zh) * 2016-04-01 2019-11-21 美商應用材料股份有限公司 用於提供均勻流動的氣體的設備及方法
KR102553629B1 (ko) * 2016-06-17 2023-07-11 삼성전자주식회사 플라즈마 처리 장치
US10446420B2 (en) * 2016-08-19 2019-10-15 Applied Materials, Inc. Upper cone for epitaxy chamber
US11670490B2 (en) 2017-09-29 2023-06-06 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated circuit fabrication system with adjustable gas injector
JP7060427B2 (ja) * 2018-03-29 2022-04-26 イビデン株式会社 Cvd装置用ノズル、cvd装置およびcvd膜の製造方法
CN112840444A (zh) * 2018-10-01 2021-05-25 应用材料公司 用于外延反应器的石英圆顶的净化的视口
US11032945B2 (en) * 2019-07-12 2021-06-08 Applied Materials, Inc. Heat shield assembly for an epitaxy chamber
CN115161764B (zh) * 2022-06-23 2024-02-06 江苏天芯微半导体设备有限公司 一种控温装置及其外延设备
US12492487B2 (en) * 2023-04-28 2025-12-09 Applied Materials, Inc. Movable central reflectors of semiconductor processing equipment, and related systems and methods

Family Cites Families (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2707719A (en) 1954-04-23 1955-05-03 Leibowitz Jack Richard Apparatus for the vacuum melting of high purity materials
US3717439A (en) * 1970-11-18 1973-02-20 Tokyo Shibaura Electric Co Vapour phase reaction apparatus
US4115163A (en) * 1976-01-08 1978-09-19 Yulia Ivanovna Gorina Method of growing epitaxial semiconductor films utilizing radiant heating
DE2951667A1 (de) * 1979-12-21 1981-07-02 Merck Patent Gmbh, 6100 Darmstadt Transport- und entnahmevorrichtung
US4347431A (en) * 1980-07-25 1982-08-31 Bell Telephone Laboratories, Inc. Diffusion furnace
DE3130680A1 (de) 1981-08-03 1983-02-17 Heraeus Quarzschmelze Gmbh, 6450 Hanau "rohrfoermiger koerper mit flansch"
JPH0693452B2 (ja) * 1986-01-29 1994-11-16 株式会社日立製作所 枚葉式薄膜形成法および薄膜形成装置
US5098662B1 (en) * 1990-08-10 1994-04-19 Corning Inc Modular solvent extractory concentrator apparatus
US5156812A (en) * 1990-08-10 1992-10-20 Corning Incorporated Modular solvent extractor/concentrator apparatus with in-line drying adaptor
JPH0544038A (ja) * 1991-08-14 1993-02-23 Toshiba Corp Cvd装置
JPH05299370A (ja) * 1992-04-23 1993-11-12 Tokyo Electron Tohoku Ltd 熱処理装置
JPH06283500A (ja) * 1993-03-30 1994-10-07 Hitachi Ltd 半導体製造装置および半導体装置
JP3171222B2 (ja) * 1994-06-14 2001-05-28 日本電気株式会社 マイクロ波プラズマ処理装置
USH1960H1 (en) * 1995-04-10 2001-06-05 Alpha Therapeutic Corp. Automated method and system for testing blood samples
JPH0922875A (ja) * 1995-07-06 1997-01-21 Nissin Electric Co Ltd 薄膜気相成長装置
US6093252A (en) * 1995-08-03 2000-07-25 Asm America, Inc. Process chamber with inner support
JPH09246195A (ja) * 1996-03-07 1997-09-19 Nissin Electric Co Ltd 縦型気相成長装置
US6031211A (en) * 1997-07-11 2000-02-29 Concept Systems Design, Inc. Zone heating system with feedback control
US6706334B1 (en) * 1997-06-04 2004-03-16 Tokyo Electron Limited Processing method and apparatus for removing oxide film
US6086679A (en) * 1997-10-24 2000-07-11 Quester Technology, Inc. Deposition systems and processes for transport polymerization and chemical vapor deposition
US6360562B1 (en) * 1998-02-24 2002-03-26 Superior Micropowders Llc Methods for producing glass powders
US6027569A (en) * 1998-06-03 2000-02-22 Seh America, Inc. Gas injection systems for a LPCVD furnace
JP2000286251A (ja) * 1999-03-31 2000-10-13 Japan Storage Battery Co Ltd 紫外線処理装置
JP4313470B2 (ja) * 1999-07-07 2009-08-12 東京エレクトロン株式会社 プラズマ処理装置およびプラズマ処理方法
US6383330B1 (en) 1999-09-10 2002-05-07 Asm America, Inc. Quartz wafer processing chamber
JP2002057150A (ja) * 2000-08-08 2002-02-22 Crystage Co Ltd 薄膜形成装置
JP3775500B2 (ja) * 2002-03-12 2006-05-17 ソニー株式会社 半導体薄膜の形成方法及びその装置、並びに触媒ノズル
JP4226597B2 (ja) * 2003-03-04 2009-02-18 株式会社日立国際電気 基板処理装置およびデバイスの製造方法
US20050082002A1 (en) * 2003-08-29 2005-04-21 Yuusuke Sato Method of cleaning a film-forming apparatus and film-forming apparatus
JPWO2005083760A1 (ja) * 2004-03-01 2007-11-29 株式会社日立国際電気 基板処理装置および半導体装置の製造方法
KR100782369B1 (ko) * 2004-11-11 2007-12-07 삼성전자주식회사 반도체 제조장치
JP4761442B2 (ja) * 2005-08-08 2011-08-31 芝浦メカトロニクス株式会社 プラズマ発生装置及びプラズマ処理装置
US20070084406A1 (en) * 2005-10-13 2007-04-19 Joseph Yudovsky Reaction chamber with opposing pockets for gas injection and exhaust
US20070084408A1 (en) * 2005-10-13 2007-04-19 Applied Materials, Inc. Batch processing chamber with diffuser plate and injector assembly
US8585820B2 (en) * 2006-11-22 2013-11-19 Soitec Abatement of reaction gases from gallium nitride deposition
US20080124670A1 (en) * 2006-11-29 2008-05-29 Frank Jansen Inductively heated trap
US8610033B1 (en) * 2007-03-29 2013-12-17 Moore Epitaxial, Inc. Rapid thermal process reactor utilizing a low profile dome
JP4972444B2 (ja) * 2007-03-30 2012-07-11 株式会社ニューフレアテクノロジー 気相成長装置及び気相成長方法
US20090194024A1 (en) * 2008-01-31 2009-08-06 Applied Materials, Inc. Cvd apparatus
US8741062B2 (en) * 2008-04-22 2014-06-03 Picosun Oy Apparatus and methods for deposition reactors
JP2010084157A (ja) * 2008-09-29 2010-04-15 Tokyo Electron Ltd ガス導入機構及び成膜装置
US20100117309A1 (en) * 2008-11-13 2010-05-13 Applied Materials, Inc. Sealing apparatus for a process chamber
WO2010058813A1 (ja) * 2008-11-21 2010-05-27 国立大学法人長岡技術科学大学 基板処理方法及び基板処理装置
JP5470948B2 (ja) * 2009-03-23 2014-04-16 株式会社明電舎 オゾン供給装置
JP5317852B2 (ja) * 2009-06-29 2013-10-16 株式会社クォークテクノロジー 紫外線照射装置
DE212010000009U1 (de) * 2009-09-10 2011-05-26 LAM RESEARCH CORPORATION (Delaware Corporation), California Auswechselbare obere Kammerteile einer Plasmaverarbeitungsvorrichtung
JP2011171450A (ja) * 2010-02-17 2011-09-01 Nuflare Technology Inc 成膜装置および成膜方法
US9570328B2 (en) * 2010-06-30 2017-02-14 Applied Materials, Inc. Substrate support for use with multi-zonal heating sources
US8133349B1 (en) * 2010-11-03 2012-03-13 Lam Research Corporation Rapid and uniform gas switching for a plasma etch process
JP2012142324A (ja) * 2010-12-28 2012-07-26 Japan Steel Works Ltd:The プラズマ処理方法及び処理装置
US20120270384A1 (en) * 2011-04-22 2012-10-25 Applied Materials, Inc. Apparatus for deposition of materials on a substrate
US9512520B2 (en) * 2011-04-25 2016-12-06 Applied Materials, Inc. Semiconductor substrate processing system
US9499905B2 (en) * 2011-07-22 2016-11-22 Applied Materials, Inc. Methods and apparatus for the deposition of materials on a substrate
US8960235B2 (en) * 2011-10-28 2015-02-24 Applied Materials, Inc. Gas dispersion apparatus
US20130269613A1 (en) * 2012-03-30 2013-10-17 Applied Materials, Inc. Methods and apparatus for generating and delivering a process gas for processing a substrate
US20140026816A1 (en) 2012-07-27 2014-01-30 Applied Materials, Inc. Multi-zone quartz gas distribution apparatus
CN104471678B (zh) * 2012-07-27 2018-06-29 应用材料公司 用于输送工艺气体至基板的方法和设备
US20140137801A1 (en) * 2012-10-26 2014-05-22 Applied Materials, Inc. Epitaxial chamber with customizable flow injection
US9587993B2 (en) * 2012-11-06 2017-03-07 Rec Silicon Inc Probe assembly for a fluid bed reactor
US11015244B2 (en) * 2013-12-30 2021-05-25 Advanced Material Solutions, Llc Radiation shielding for a CVD reactor
CN105981133B (zh) * 2014-02-14 2019-06-28 应用材料公司 具有注入组件的上部圆顶
US20150376789A1 (en) * 2014-03-11 2015-12-31 Tokyo Electron Limited Vertical heat treatment apparatus and method of operating vertical heat treatment apparatus
JP6307984B2 (ja) * 2014-03-31 2018-04-11 東京エレクトロン株式会社 基板処理装置
WO2015195256A1 (en) * 2014-06-18 2015-12-23 Applied Materials, Inc. One-piece injector assembly
US20160033070A1 (en) * 2014-08-01 2016-02-04 Applied Materials, Inc. Recursive pumping member
DE112015004710T5 (de) * 2014-10-17 2017-07-06 Horiba Ltd. Gasanalysevorrichtung
WO2016164569A1 (en) * 2015-04-07 2016-10-13 Applied Materials, Inc. Process gas preheating systems and methods for double-sided multi-substrate batch processing

Also Published As

Publication number Publication date
CN105981133A (zh) 2016-09-28
TWI665329B (zh) 2019-07-11
TW201544622A (zh) 2015-12-01
SG11201606004PA (en) 2016-08-30
US20150233016A1 (en) 2015-08-20
US9845550B2 (en) 2017-12-19
JP6542245B2 (ja) 2019-07-10
US10458040B2 (en) 2019-10-29
KR102381816B1 (ko) 2022-04-04
KR20160121563A (ko) 2016-10-19
JP2017511974A (ja) 2017-04-27
US20180066382A1 (en) 2018-03-08
WO2015123022A1 (en) 2015-08-20

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