CN104655117B - 封装件、物理量传感器、电子设备及移动体 - Google Patents

封装件、物理量传感器、电子设备及移动体 Download PDF

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Publication number
CN104655117B
CN104655117B CN201410676341.0A CN201410676341A CN104655117B CN 104655117 B CN104655117 B CN 104655117B CN 201410676341 A CN201410676341 A CN 201410676341A CN 104655117 B CN104655117 B CN 104655117B
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Prior art keywords
wiring
terminal
substrate
physical quantity
internal terminal
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Chinese (zh)
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CN104655117A (zh
Inventor
青木信也
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Seiko Epson Corp
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Seiko Epson Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5607Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5607Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
    • G01C19/5628Manufacturing; Trimming; Mounting; Housings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5607Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
    • G01C19/5621Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks the devices involving a micromechanical structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49175Parallel arrangements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Manufacturing & Machinery (AREA)
  • Gyroscopes (AREA)
CN201410676341.0A 2013-11-25 2014-11-21 封装件、物理量传感器、电子设备及移动体 Active CN104655117B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-242556 2013-11-25
JP2013242556A JP6357758B2 (ja) 2013-11-25 2013-11-25 物理量センサー、電子機器および移動体

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CN104655117A CN104655117A (zh) 2015-05-27
CN104655117B true CN104655117B (zh) 2019-09-06

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US (1) US9823071B2 (enExample)
JP (1) JP6357758B2 (enExample)
CN (1) CN104655117B (enExample)

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JP6641874B2 (ja) * 2015-10-20 2020-02-05 セイコーエプソン株式会社 物理量検出装置、電子機器および移動体
JP6805697B2 (ja) * 2016-10-03 2020-12-23 セイコーエプソン株式会社 電子部品用パッケージ、発振器、電子機器、および移動体
JP6819216B2 (ja) * 2016-10-26 2021-01-27 セイコーエプソン株式会社 ジャイロセンサー、ジャイロセンサーの製造方法、電子機器および移動体
JP6926568B2 (ja) * 2017-03-24 2021-08-25 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
JP7119478B2 (ja) 2018-03-23 2022-08-17 セイコーエプソン株式会社 回路装置、物理量測定装置、電子機器及び移動体
JP2019174234A (ja) * 2018-03-28 2019-10-10 セイコーエプソン株式会社 センサー素子、センサーデバイス、力検出装置、およびロボット
JP2020139879A (ja) 2019-02-28 2020-09-03 セイコーエプソン株式会社 慣性センサー、電子機器および移動体
JP7251383B2 (ja) * 2019-07-29 2023-04-04 セイコーエプソン株式会社 振動デバイス、電子機器および移動体
US11522120B1 (en) * 2021-07-02 2022-12-06 Yoketan Corp. Micro crystal oscillator

Citations (2)

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CN102132128A (zh) * 2008-09-02 2011-07-20 株式会社村田制作所 音叉振荡器和其制造方法以及角速度传感器
CN102401653A (zh) * 2010-09-07 2012-04-04 精工爱普生株式会社 角速度检测装置以及电子设备

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JPH10284605A (ja) 1997-04-08 1998-10-23 Mitsubishi Electric Corp 半導体集積回路およびセルベース方式によりレイアウト設計された半導体集積回路
CN100381804C (zh) * 2003-08-26 2008-04-16 松下电工株式会社 传感器装置
JP4237611B2 (ja) * 2003-12-22 2009-03-11 東芝マイクロエレクトロニクス株式会社 半導体集積回路のレイアウト設計方法及びレイアウト設計装置
JP2005241380A (ja) 2004-02-25 2005-09-08 Seiko Epson Corp 圧電デバイスならびに圧電デバイスを利用した携帯電話装置および圧電デバイスを利用した電子機器
US20070164378A1 (en) * 2006-01-13 2007-07-19 Honeywell International Inc. Integrated mems package
JP5092462B2 (ja) * 2006-06-13 2012-12-05 株式会社デンソー 力学量センサ
JP5186774B2 (ja) 2007-02-15 2013-04-24 セイコーエプソン株式会社 電荷検出型センサおよびそれに用いるパッケージ容器
EP2011762B1 (en) * 2007-07-02 2015-09-30 Denso Corporation Semiconductor device with a sensor connected to an external element
JP5487672B2 (ja) * 2009-03-27 2014-05-07 パナソニック株式会社 物理量センサ
JP5368181B2 (ja) * 2009-06-12 2013-12-18 セイコーエプソン株式会社 物理量検出装置並びに物理量検出装置の制御方法、異常診断システム及び異常診断方法
TW201103107A (en) * 2009-07-07 2011-01-16 Jung-Tang Huang Method for packaging micromachined devices
US20120109574A1 (en) * 2010-10-27 2012-05-03 Mihai-Costin Manolescu Multi-dimensional vector determining circuit in a sensor integrated circuit package
JP2012098033A (ja) * 2010-10-29 2012-05-24 Panasonic Corp 角速度センサ
JP5678727B2 (ja) * 2011-03-03 2015-03-04 セイコーエプソン株式会社 振動デバイス、振動デバイスの製造方法、電子機器
JP2013156127A (ja) * 2012-01-30 2013-08-15 Seiko Epson Corp 振動片、振動デバイス、物理量検出装置、および電子機器
JP2013178179A (ja) * 2012-02-28 2013-09-09 Seiko Epson Corp センサー素子、センサーデバイスおよび電子機器

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CN102132128A (zh) * 2008-09-02 2011-07-20 株式会社村田制作所 音叉振荡器和其制造方法以及角速度传感器
CN102401653A (zh) * 2010-09-07 2012-04-04 精工爱普生株式会社 角速度检测装置以及电子设备

Also Published As

Publication number Publication date
JP6357758B2 (ja) 2018-07-18
JP2015102403A (ja) 2015-06-04
US20150143903A1 (en) 2015-05-28
CN104655117A (zh) 2015-05-27
US9823071B2 (en) 2017-11-21

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