CN104600051B - 半导体模块 - Google Patents
半导体模块 Download PDFInfo
- Publication number
- CN104600051B CN104600051B CN201410520494.6A CN201410520494A CN104600051B CN 104600051 B CN104600051 B CN 104600051B CN 201410520494 A CN201410520494 A CN 201410520494A CN 104600051 B CN104600051 B CN 104600051B
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- base plate
- semiconductor module
- positioning
- module according
- insulating substrate
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- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/37—Effects of the manufacturing process
- H01L2924/3701—Effects of the manufacturing process increased through put
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Geometry (AREA)
- Dispersion Chemistry (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013226731A JP6165025B2 (ja) | 2013-10-31 | 2013-10-31 | 半導体モジュール |
| JP2013-226731 | 2013-10-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104600051A CN104600051A (zh) | 2015-05-06 |
| CN104600051B true CN104600051B (zh) | 2017-11-24 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410520494.6A Active CN104600051B (zh) | 2013-10-31 | 2014-09-30 | 半导体模块 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9159676B2 (enExample) |
| JP (1) | JP6165025B2 (enExample) |
| CN (1) | CN104600051B (enExample) |
| DE (1) | DE102014218389B4 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5852609B2 (ja) * | 2013-06-10 | 2016-02-03 | 長野計器株式会社 | センサ |
| JP6299120B2 (ja) * | 2013-09-05 | 2018-03-28 | 富士電機株式会社 | 半導体モジュール |
| CN112133654B (zh) * | 2016-07-18 | 2024-07-09 | 圆益Ips股份有限公司 | 对齐模块 |
| US11201101B2 (en) * | 2017-10-26 | 2021-12-14 | Shindengen Electric Manufacturing Co., Ltd. | Electronic component |
| DE102019206260A1 (de) | 2019-05-02 | 2020-11-05 | Abb Schweiz Ag | Verfahren zur Herstellung eines Halbleitermoduls |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01281760A (ja) | 1988-05-07 | 1989-11-13 | Mitsubishi Electric Corp | 半導体装置 |
| JPH02266557A (ja) * | 1989-04-06 | 1990-10-31 | Mitsubishi Electric Corp | 半導体装置 |
| JPH10321651A (ja) * | 1997-05-19 | 1998-12-04 | Mitsubishi Electric Corp | 半導体装置 |
| JP3347279B2 (ja) * | 1997-12-19 | 2002-11-20 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JP2000031358A (ja) | 1998-07-08 | 2000-01-28 | Sansha Electric Mfg Co Ltd | 電力用半導体モジュール |
| JP2000068446A (ja) * | 1998-08-25 | 2000-03-03 | Hitachi Ltd | パワー半導体モジュール |
| JP3619708B2 (ja) * | 1999-06-02 | 2005-02-16 | 株式会社日立製作所 | パワー半導体モジュール |
| US6774465B2 (en) * | 2001-10-05 | 2004-08-10 | Fairchild Korea Semiconductor, Ltd. | Semiconductor power package module |
| DE102009002992B4 (de) * | 2009-05-11 | 2014-10-30 | Infineon Technologies Ag | Leistungshalbleitermodulanordnung mit eindeutig und verdrehsicher auf einem Kühlkörper montierbarem Leistungshalbleitermodul und Montageverfahren |
| US8860210B2 (en) * | 2009-06-10 | 2014-10-14 | Toyota Jidosha Kabushiki Kaisha | Semiconductor device |
| JP5884291B2 (ja) * | 2011-04-20 | 2016-03-15 | 三菱マテリアル株式会社 | ヒートシンク付パワーモジュール用基板ユニット |
| JP5716637B2 (ja) * | 2011-11-04 | 2015-05-13 | 住友電気工業株式会社 | 半導体モジュール及び半導体モジュールの製造方法 |
| JP2013161961A (ja) * | 2012-02-06 | 2013-08-19 | Calsonic Kansei Corp | 半導体モジュールの製造方法 |
-
2013
- 2013-10-31 JP JP2013226731A patent/JP6165025B2/ja active Active
-
2014
- 2014-07-10 US US14/328,112 patent/US9159676B2/en active Active
- 2014-09-12 DE DE102014218389.8A patent/DE102014218389B4/de active Active
- 2014-09-30 CN CN201410520494.6A patent/CN104600051B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| DE102014218389B4 (de) | 2021-06-17 |
| US20150115478A1 (en) | 2015-04-30 |
| CN104600051A (zh) | 2015-05-06 |
| JP6165025B2 (ja) | 2017-07-19 |
| US9159676B2 (en) | 2015-10-13 |
| DE102014218389A1 (de) | 2015-04-30 |
| JP2015088654A (ja) | 2015-05-07 |
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