CN103426725B - 由锌金属和过氧化锌的反应性结合形成的层状结合的结构 - Google Patents
由锌金属和过氧化锌的反应性结合形成的层状结合的结构 Download PDFInfo
- Publication number
- CN103426725B CN103426725B CN201310174108.8A CN201310174108A CN103426725B CN 103426725 B CN103426725 B CN 103426725B CN 201310174108 A CN201310174108 A CN 201310174108A CN 103426725 B CN103426725 B CN 103426725B
- Authority
- CN
- China
- Prior art keywords
- zinc
- structures
- layer
- zinc oxide
- peroxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- DLINORNFHVEIFE-UHFFFAOYSA-N hydrogen peroxide;zinc Chemical compound [Zn].OO DLINORNFHVEIFE-UHFFFAOYSA-N 0.000 title claims abstract description 42
- 239000011701 zinc Substances 0.000 title claims abstract description 42
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 41
- 239000002184 metal Substances 0.000 title claims abstract description 41
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 title claims abstract description 39
- 229910052725 zinc Inorganic materials 0.000 title claims abstract description 39
- 229940105296 zinc peroxide Drugs 0.000 title claims abstract description 39
- 230000009257 reactivity Effects 0.000 title 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims abstract description 93
- 239000011787 zinc oxide Substances 0.000 claims abstract description 46
- 238000000034 method Methods 0.000 claims abstract description 45
- 230000003647 oxidation Effects 0.000 claims description 17
- 238000007254 oxidation reaction Methods 0.000 claims description 17
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 15
- 229910052760 oxygen Inorganic materials 0.000 claims description 15
- 239000001301 oxygen Substances 0.000 claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000008569 process Effects 0.000 abstract description 20
- 238000006243 chemical reaction Methods 0.000 abstract description 7
- 235000012431 wafers Nutrition 0.000 description 26
- 239000000463 material Substances 0.000 description 25
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000010348 incorporation Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- KTSFMFGEAAANTF-UHFFFAOYSA-N [Cu].[Se].[Se].[In] Chemical compound [Cu].[Se].[Se].[In] KTSFMFGEAAANTF-UHFFFAOYSA-N 0.000 description 1
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical compound [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 description 1
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000002238 carbon nanotube film Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000021615 conjugation Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 150000004972 metal peroxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000010587 phase diagram Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/185—Joining of semiconductor bodies for junction formation
- H01L21/187—Joining of semiconductor bodies for junction formation by direct bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/123—Active materials comprising only Group II-VI materials, e.g. CdS, ZnS or HgCdTe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31536—Including interfacial reaction product of adjacent layers
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Laminated Bodies (AREA)
- Photovoltaic Devices (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/471,306 US9105561B2 (en) | 2012-05-14 | 2012-05-14 | Layered bonded structures formed from reactive bonding of zinc metal and zinc peroxide |
| US13/471,306 | 2012-05-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103426725A CN103426725A (zh) | 2013-12-04 |
| CN103426725B true CN103426725B (zh) | 2017-10-27 |
Family
ID=48128151
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310174108.8A Expired - Fee Related CN103426725B (zh) | 2012-05-14 | 2013-05-13 | 由锌金属和过氧化锌的反应性结合形成的层状结合的结构 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9105561B2 (enExample) |
| EP (1) | EP2665088B1 (enExample) |
| JP (2) | JP6351211B2 (enExample) |
| KR (1) | KR102082009B1 (enExample) |
| CN (1) | CN103426725B (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102015111040A1 (de) * | 2015-07-08 | 2017-01-12 | Osram Opto Semiconductors Gmbh | Verfahren zum Verbinden von zumindest zwei Komponenten |
| DE112019006574T5 (de) * | 2019-01-07 | 2021-10-28 | Sony Group Corporation | Strukturkörper, strukturkörperherstellungsverfahren und elektronisches gerät |
| CN110739285A (zh) * | 2019-10-30 | 2020-01-31 | 北京工业大学 | 硅基金属中间层化合物半导体晶圆的结构及制备方法 |
| FR3117666B1 (fr) * | 2020-12-15 | 2022-10-28 | Commissariat Energie Atomique | Procede de fabrication d’une structure semi-conductrice comprenant une zone d’interface incluant des agglomerats |
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| US3392312A (en) * | 1963-11-06 | 1968-07-09 | Carman Lab Inc | Glass encapsulated electronic devices |
| GB1306727A (en) * | 1970-06-05 | 1973-02-14 | English Electric Co Ltd | Solder glasses |
| JPS62132371A (ja) * | 1985-12-05 | 1987-06-15 | Matsushita Electric Ind Co Ltd | 太陽電池モジュール |
| US5846844A (en) * | 1993-11-29 | 1998-12-08 | Toyoda Gosei Co., Ltd. | Method for producing group III nitride compound semiconductor substrates using ZnO release layers |
| US6054198A (en) * | 1996-04-29 | 2000-04-25 | Parker-Hannifin Corporation | Conformal thermal interface material for electronic components |
| US5907903A (en) * | 1996-05-24 | 1999-06-01 | International Business Machines Corporation | Multi-layer-multi-chip pyramid and circuit board structure and method of forming same |
| US6316332B1 (en) | 1998-11-30 | 2001-11-13 | Lo Yu-Hwa | Method for joining wafers at a low temperature and low stress |
| US20020048900A1 (en) | 1999-11-23 | 2002-04-25 | Nova Crystals, Inc. | Method for joining wafers at a low temperature and low stress |
| FR2894990B1 (fr) * | 2005-12-21 | 2008-02-22 | Soitec Silicon On Insulator | Procede de fabrication de substrats, notamment pour l'optique,l'electronique ou l'optoelectronique et substrat obtenu selon ledit procede |
| US8507361B2 (en) * | 2000-11-27 | 2013-08-13 | Soitec | Fabrication of substrates with a useful layer of monocrystalline semiconductor material |
| US6593213B2 (en) * | 2001-09-20 | 2003-07-15 | Heliovolt Corporation | Synthesis of layers, coatings or films using electrostatic fields |
| US6786390B2 (en) * | 2003-02-04 | 2004-09-07 | United Epitaxy Company Ltd. | LED stack manufacturing method and its structure thereof |
| US7052587B2 (en) * | 2003-06-27 | 2006-05-30 | General Motors Corporation | Photoelectrochemical device and electrode |
| US7186461B2 (en) * | 2004-05-27 | 2007-03-06 | Delaware Capital Formation, Inc. | Glass-ceramic materials and electronic packages including same |
| DE102004028197B4 (de) * | 2004-06-09 | 2006-06-29 | Jenoptik Automatisierungstechnik Gmbh | Verfahren zur Vorbehandlung verzinkter Stahlbleche oder Aluminiumbleche zum Schweißen |
| JP2007245176A (ja) * | 2006-03-15 | 2007-09-27 | Kobe Steel Ltd | 接合体の製造方法 |
| WO2007118815A2 (en) * | 2006-04-13 | 2007-10-25 | Ciba Holding Inc. | Photovoltaic cell |
| JP5003033B2 (ja) * | 2006-06-30 | 2012-08-15 | 住友電気工業株式会社 | GaN薄膜貼り合わせ基板およびその製造方法、ならびにGaN系半導体デバイスおよびその製造方法 |
| JP2010512664A (ja) * | 2006-12-11 | 2010-04-22 | ルーメンツ リミテッド ライアビリティ カンパニー | 酸化亜鉛多接合光電池及び光電子装置 |
| JP4362635B2 (ja) * | 2007-02-02 | 2009-11-11 | ローム株式会社 | ZnO系半導体素子 |
| JP2009046541A (ja) * | 2007-08-15 | 2009-03-05 | Seiko Epson Corp | 接合膜付き基材、接合膜付き基材の製造方法、接合方法および接合体 |
| KR100872263B1 (ko) * | 2007-10-29 | 2008-12-05 | 삼성전기주식회사 | 구속용 그린시트 및 이를 이용한 다층 세라믹 기판의 제조방법 |
| JP5160201B2 (ja) * | 2007-11-20 | 2013-03-13 | 株式会社豊田中央研究所 | はんだ材料及びその製造方法、接合体及びその製造方法、並びにパワー半導体モジュール及びその製造方法 |
| US20110132437A1 (en) * | 2007-12-10 | 2011-06-09 | Alan Kost | Methods to bond or seal glass pieces of photovoltaic cell modules |
| EP2161758A1 (en) * | 2008-09-05 | 2010-03-10 | Flexucell ApS | Solar cell and method for the production thereof |
| KR101046006B1 (ko) * | 2008-10-23 | 2011-07-01 | 삼성전기주식회사 | 무수축 다층 세라믹 기판의 제조방법 |
| TW201027594A (en) | 2009-01-07 | 2010-07-16 | Advanced Optoelectronic Tech | Method for bonding two matertials |
| EP2214213A2 (de) * | 2009-01-29 | 2010-08-04 | SCHOTT Solar AG | Photovoltaisches Modul |
| JP4871973B2 (ja) * | 2009-04-28 | 2012-02-08 | 株式会社沖データ | 半導体薄膜素子の製造方法並びに半導体ウエハ、及び、半導体薄膜素子 |
| DE102009025428A1 (de) * | 2009-06-16 | 2010-12-23 | Schott Solar Ag | Dünnschichtsolarzelle und Verfahren zur Herstellung |
| US8304759B2 (en) * | 2009-06-22 | 2012-11-06 | Banpil Photonics, Inc. | Integrated image sensor system on common substrate |
| US8653546B2 (en) * | 2009-10-06 | 2014-02-18 | Epistar Corporation | Light-emitting device having a ramp |
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| JP2011151271A (ja) * | 2010-01-22 | 2011-08-04 | Rohm Co Ltd | 光電変換装置およびその製造方法、および固体撮像装置 |
| JP5288299B2 (ja) * | 2010-06-21 | 2013-09-11 | 株式会社村田製作所 | 紫外線センサ、及び紫外線センサの製造方法 |
| FR2971879B1 (fr) * | 2011-02-18 | 2015-11-20 | Wysips | Dispositif d'affichage avec cellules photovoltaiques integrees, a luminosite amelioree |
| JP5445989B2 (ja) * | 2011-03-09 | 2014-03-19 | 株式会社村田製作所 | 紫外線センサ、及び紫外線センサの製造方法 |
| JP5746997B2 (ja) * | 2011-06-07 | 2015-07-08 | 富士フイルム株式会社 | 電子内視鏡装置の製造方法 |
| JP5783966B2 (ja) * | 2011-08-08 | 2015-09-24 | 株式会社東芝 | 水中摺動部材、及び水中摺動部材の製造方法、並びに水力機械 |
| US9221713B2 (en) * | 2011-12-21 | 2015-12-29 | Centre Luxembourgeois De Recherches Pour Le Verre Et La Ceramique S.A. (C.R.V.C.) | Coated article with low-E coating having barrier layer system(s) including multiple dielectric layers, and/or methods of making the same |
| US8884157B2 (en) * | 2012-05-11 | 2014-11-11 | Epistar Corporation | Method for manufacturing optoelectronic devices |
-
2012
- 2012-05-14 US US13/471,306 patent/US9105561B2/en not_active Expired - Fee Related
-
2013
- 2013-03-04 KR KR1020130022804A patent/KR102082009B1/ko not_active Expired - Fee Related
- 2013-04-16 EP EP13163891.8A patent/EP2665088B1/en active Active
- 2013-05-13 CN CN201310174108.8A patent/CN103426725B/zh not_active Expired - Fee Related
- 2013-05-13 JP JP2013101464A patent/JP6351211B2/ja not_active Expired - Fee Related
-
2015
- 2015-07-02 US US14/791,119 patent/US9978893B2/en not_active Expired - Fee Related
-
2018
- 2018-02-26 JP JP2018031600A patent/JP2018093222A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN103426725A (zh) | 2013-12-04 |
| US20150303316A1 (en) | 2015-10-22 |
| EP2665088A2 (en) | 2013-11-20 |
| US20130302622A1 (en) | 2013-11-14 |
| JP2013243360A (ja) | 2013-12-05 |
| EP2665088B1 (en) | 2021-06-02 |
| US9105561B2 (en) | 2015-08-11 |
| KR102082009B1 (ko) | 2020-02-26 |
| JP6351211B2 (ja) | 2018-07-04 |
| KR20130127361A (ko) | 2013-11-22 |
| JP2018093222A (ja) | 2018-06-14 |
| EP2665088A3 (en) | 2014-06-04 |
| US9978893B2 (en) | 2018-05-22 |
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Granted publication date: 20171027 |