CN101890410B - 电子部件分配装置 - Google Patents

电子部件分配装置 Download PDF

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Publication number
CN101890410B
CN101890410B CN200910206580.9A CN200910206580A CN101890410B CN 101890410 B CN101890410 B CN 101890410B CN 200910206580 A CN200910206580 A CN 200910206580A CN 101890410 B CN101890410 B CN 101890410B
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China
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mentioned
slideway
pipe
input
outlet
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CN200910206580.9A
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Chinese (zh)
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CN101890410A (zh
Inventor
堀俊一
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Shibuya Corp
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Shibuya Kogyo Co Ltd
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Publication of CN101890410A publication Critical patent/CN101890410A/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
CN200910206580.9A 2009-05-21 2009-10-22 电子部件分配装置 Active CN101890410B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009122778A JP5376226B2 (ja) 2009-05-21 2009-05-21 電子部品の分配装置
JP2009-122778 2009-05-21

Publications (2)

Publication Number Publication Date
CN101890410A CN101890410A (zh) 2010-11-24
CN101890410B true CN101890410B (zh) 2014-05-21

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ID=43099845

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200910206580.9A Active CN101890410B (zh) 2009-05-21 2009-10-22 电子部件分配装置

Country Status (4)

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JP (1) JP5376226B2 (ja)
KR (1) KR101633465B1 (ja)
CN (1) CN101890410B (ja)
TW (1) TWI478776B (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101305280B1 (ko) * 2011-03-28 2013-09-06 성원모 진동관이 구비된 소형 사출물 분리수거 장치
KR101254620B1 (ko) 2011-03-28 2013-04-15 성원모 정전기 방지용 분리수거 용기가 구비된 사출물 분리수거 장치
CN102357473A (zh) * 2011-09-14 2012-02-22 深圳市华腾半导体设备有限公司 电子元器件高速测试分选设备
CN102641855B (zh) * 2012-04-23 2014-05-07 上海信耀电子有限公司 Led自动检测分档系统及方法
CN102921647B (zh) * 2012-11-14 2014-09-03 深圳市华腾半导体设备有限公司 一种电子元器件的分类分选方法
TWI503184B (zh) * 2013-09-04 2015-10-11 All Ring Tech Co Ltd Dispenser and its material inspection of dust removal method
TWI555584B (zh) * 2014-03-04 2016-11-01 All Ring Tech Co Ltd Sorting machine shunt discharge pipe quick release method and device
TW201613699A (en) * 2014-10-02 2016-04-16 All Ring Tech Co Ltd Electronic component sorting method and device
TWI590876B (zh) * 2015-10-23 2017-07-11 All Ring Tech Co Ltd Electronic component classification method and device
KR102062029B1 (ko) * 2017-11-23 2020-01-03 범아유니텍(주) 테이퍼 롤러 공급장치
CN110732498B (zh) * 2018-07-19 2021-09-28 上野精机株式会社 分类装置
TWI771074B (zh) * 2021-06-22 2022-07-11 萬潤科技股份有限公司 電子元件測試裝置
CN117074939A (zh) * 2023-08-17 2023-11-17 潮州市汇能电机有限公司 一种水轮发电机组模拟试验系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3837485A (en) * 1972-03-24 1974-09-24 Philips Corp Automatic sorting device
DE2319488A1 (de) * 1973-04-17 1974-11-07 Pawel Alexandrowitsc Schewinow Sortiereinrichtung fuer miniaturbauteile
DD205625A1 (de) * 1982-04-26 1984-01-04 Franz Bahr Bewegungseinrichtung fuer das schwenkbare, in der laenge unveraenderliche in sich starre fallrohr eines bauelementesortierers
CN101234383A (zh) * 2007-02-01 2008-08-06 Qmc株式会社 半导体芯片分类装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6133441U (ja) * 1984-07-31 1986-02-28 日本電気株式会社 半導体装置の分類装置
JPS62216686A (ja) * 1986-03-19 1987-09-24 旭化成株式会社 自動測定仕分け装置
JPH0497731U (ja) * 1991-01-22 1992-08-24
JP2004226101A (ja) * 2003-01-20 2004-08-12 Tokyo Weld Co Ltd ワーク検査システム
TWI229620B (en) * 2004-01-02 2005-03-21 Darfon Electronics Corp Component testing and screening machine
JP4474612B2 (ja) * 2004-09-09 2010-06-09 澁谷工業株式会社 電子部品の分類装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3837485A (en) * 1972-03-24 1974-09-24 Philips Corp Automatic sorting device
DE2319488A1 (de) * 1973-04-17 1974-11-07 Pawel Alexandrowitsc Schewinow Sortiereinrichtung fuer miniaturbauteile
DD205625A1 (de) * 1982-04-26 1984-01-04 Franz Bahr Bewegungseinrichtung fuer das schwenkbare, in der laenge unveraenderliche in sich starre fallrohr eines bauelementesortierers
CN101234383A (zh) * 2007-02-01 2008-08-06 Qmc株式会社 半导体芯片分类装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP特开2005-219002A 2005.08.18
JP特开2006-78347A 2006.03.23

Also Published As

Publication number Publication date
KR20100126157A (ko) 2010-12-01
JP5376226B2 (ja) 2013-12-25
KR101633465B1 (ko) 2016-06-24
JP2010271161A (ja) 2010-12-02
CN101890410A (zh) 2010-11-24
TWI478776B (zh) 2015-04-01
TW201041664A (en) 2010-12-01

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