TWI229620B - Component testing and screening machine - Google Patents
Component testing and screening machine Download PDFInfo
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- TWI229620B TWI229620B TW93100081A TW93100081A TWI229620B TW I229620 B TWI229620 B TW I229620B TW 93100081 A TW93100081 A TW 93100081A TW 93100081 A TW93100081 A TW 93100081A TW I229620 B TWI229620 B TW I229620B
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12296201229620
五、發明說明(1) 【發明所屬之技術領 本發明係有關於 動偵測分類每一不同V. Description of the invention (1) [Technical field to which the invention belongs The invention relates to each of the different categories of motion detection
域】 一種元件剛試分選機,尤指一種可自 屬性元件之測試分選機者。 【先前技術 按現今 展自動化生 業製程中相 值要求相對 ’而傳統檢 進行測試後 檢測項目的 來配合檢測 人為疏忽而 緣此, 開發、設計 加以突破改 本發明「元 為了有 產設備 當重要 更為嚴 測的方 ,再進 複雜程 ,且在 導致出 本案發 、製造 良,並 件測試 效節省 為導向 一環, 謹,因 式係由 行良品 度的增 實際製 品不良 明人乃 等豐碩 經由多 分選機 人力以 ,其中 尤為精 此於出 人力利 與不良 加,往 造上, 率增加 累積多 經驗, 次之測 及提南 品質的 密化之 品前皆 用治具 品的分 往需耗 為爭取 生產效率,皆以發 控管亦為自動化工 電子零件,其誤差 需先進行品質篩選 分別針對每一元件 類篩選,如此隨著 費更多的人力成本 產能時效,常易因 年從事該項產品之研究、 積極投入大量心血及精力 試後,終於成功的開發出 發明内容】 μ 目的即在於提供-種元件測試分選機, 納分類: 實際值之待測試元件’予以執行歸 本發月之3目的乃在提供_種元件測試分選機,其 1229620 ---- 係可4+ u 。對该待測試元件彈性調整執行及儲存射頻通道選擇 ^讀1之量測項目與量測值。 ^ 本發明之又一目的乃在提供一種元件測試分選機,其 係可根據實際需求設定執行及儲存射頻訊號是否異常的規 格判斷程式。 為了達成上述之目的,本發明主要包括: 振動入料組,具有可容納待測試元件之料斗,並於該 料斗一端延伸一導料管,該導料管末端形成定位架; 轉盤,其周圍環設有數溝槽洞,藉以依序接收及輸送 上述定位架之每一待測試元件; 测試系統機構,係依行進程序逐一探測每一溝槽洞之 待測試元件,並執行既定之射頻測試校驗項目及儲存校驗 修正值的比對分析後,再根據測試項目與測試值之預設屬 性進行分類;及 收料管架,具有複數組收納區,以分別收納經由分類 後之已測試元件者。 其中所述之待測試元件係為經表面黏著處理 (Surface-Mount Technology )之無線電射頻分片模組。 而本發明之另一實施例更包括: 振動入料組,具有可容納待測試元件之料斗,並於該 料斗一端延伸一導料管,該導料管末端形成定位架; 轉盤,其周圍環設有數溝槽洞,藉以依序接收及輸送上述 定位架之每一待測試元件; 測試系統機構,係依行進程序逐一探測每一溝槽洞之Domain] A component just sorting machine, especially a test sorting machine that can be self-property components. [Previous technology is based on the relative requirements of phase value in today ’s automated manufacturing process, and traditional inspections are performed after testing to cope with the detection of human negligence. Development, design and breakthroughs have been made. To rigorously measure, go further into the complex process, and lead to the occurrence of this case, good manufacturing, and test efficiency savings as a part of the guide. Sincerely, the factors are based on the increase of good quality and poor product quality. Through the use of multiple sorting machine manpower, which is particularly good at manpower benefits and bad additions, to build, increase the rate and accumulate more experience, and then test and improve the quality of the South densified products are all used in the distribution of fixtures In order to strive for production efficiency, both production control and automation are also used for automated industrial electronic parts. The errors need to be screened for each component category first. In this way, as more labor is spent and production capacity is time-effective, it is often easy to After working on this product and actively investing a lot of effort and energy, finally successfully developed the invention content】 μ Purpose The purpose is to provide-a kind of component test and sorting machine, which is classified as follows: The actual value of the component to be tested is to be implemented. The purpose of the 3 months is to provide _ kind of component test and sorting machine, which is 1229620 ---- can be 4+ u. Flexible adjustment of the component to be tested and storage of RF channel selection ^ Read 1 measurement items and values. ^ Another object of the present invention is to provide a component test sorting machine, which can be based on actual needs The specification judgment program for executing and storing the radio frequency signal is abnormal. In order to achieve the above-mentioned object, the present invention mainly includes: a vibrating feeding group, which has a hopper capable of containing the component to be tested, and a guide tube extending at one end of the hopper, the A positioning frame is formed at the end of the guide tube; a turntable is provided with a plurality of groove holes around the ring to sequentially receive and transport each of the components of the positioning frame to be tested; a testing system mechanism is to detect each groove one by one according to the traveling procedure The components to be tested and perform the comparison analysis of the established RF test calibration items and stored calibration correction values, and then perform the analysis based on the preset properties of the test items and test values. Classification; and a receiving tube rack, which has a plurality of array storage areas to separately receive the tested components after classification. The components to be tested are radio frequency (RF) chips with surface-mount technology (Surface-Mount Technology). And another embodiment of the present invention further includes: a vibrating feeding group having a hopper capable of accommodating the component to be tested, and a guide tube extending at one end of the hopper, the end of the guide tube forming a positioning frame; a turntable, The surrounding ring is provided with a number of groove holes to sequentially receive and transport each of the components to be tested of the positioning frame; the test system mechanism is to detect each groove hole one by one according to the traveling procedure.
$ 6頁 1229620 五、發明說明(3) 待測試元件,1 修正值的比對分 性進行分類; 收料管架, 入料臂,用 入溝槽洞上; 旋轉臂,用 進行翻轉;| 出料臂,用 入於指定吹料管 其中上返之 導料管,並包括 ,以當待測試元 測試分片重新篩 其中上述之轉盤 執行既定之射頻測試校驗項目及儲存校驗 析後,再根據測試項目與測試值之預設屬 具有複數組收納區; 以由定位架依序吸起(取)待測試元件置 以依序由溝槽洞上吸起(取)待測試元件 以吸起(取 架的收納區 振動入料組 一氣壓元件 件定位異常 選。 更包括: 一伺服角度定位馬達, 度; 具,以預定 )經測試後之待測試元件,置 者。 更包括振動器分別振動料斗及 ’及於料斗内設有光電感測器 時,啟動該氣壓元件振出該待 次輸送的拖轉角 盤面待測載 光電感測器,設 待測試元件狀態 其中上述之 高頻測試頭 滑台,係定位該 定位機構, 係由電腦控制接收的時序與每 間距排設於每一溝槽洞内;及 待側載具上,以檢測所接收之 於每一盤面 者。 測試系統機構更包括: ,用以檢測每一待測試元件 高頻測試頭; 用以定位該 滑台與轉盤之相對高# 及位$ 6 页 1229620 V. Description of the invention (3) Classification of the comparison of the components to be tested, 1 correction value; receiving tube rack, feeding arm, used in the groove hole; rotating arm, used to flip; | The discharge arm is used in the designated blowing tube and the upper guide tube is included, and includes: when the test piece to be tested is re-screened, the above-mentioned turntable performs the predetermined radio frequency test verification items and storage verification analysis According to the preset of test items and test values, there is a complex array storage area; the components to be tested are sequentially picked up (taken) by the positioning frame; the components to be tested are sequentially picked up (taken) from the trench holes; Suction (the vibration of the storage area of the rack to pick up a pneumatic component is abnormally selected. It also includes: a servo angle positioning motor, degrees; with predetermined) after the test, the component to be tested is placed. It also includes a vibrator that vibrates the hopper and the photo sensor in the hopper respectively. When the photo sensor is installed in the hopper, the pneumatic element is activated to vibrate the to-be-transported towing angle disk surface to be tested, and the state of the component to be tested is set among the above. The high-frequency test head slide is used to position the positioning mechanism. It is controlled by the computer and is arranged in each trench hole at each interval; and on the side carrier to detect those received on each disk. . The test system mechanism further includes: a high-frequency test head for detecting each component to be tested; a relatively high # and position for positioning the slide table and the turntable;
1229620 五、發明說明(4) 置;及 附帶光電咸泪丨丨哭a i 頭進行探測者:°直線型氣缸,用以傳動該高頻測試 虹所::上ίΐίϊ臂係由電腦控制之旋轉及直線型氣壓 ^ 八、μ直線氣壓缸之末端設有一吸嘴。 具*中上述之ΐ自在 缸所組成,其中令Ϊ摩係由電腦控制之旋轉及直線型氣壓 氣壓缸則進行18(Γ度推轉氣壓缸之末端設有一吸嘴,該旋轉 其中上述之屮%L ΟΑ. 紅所組成,其中該直J =腦”直線型氣壓 φ ... 罝線^壓缸之末端設有一吸嘴。 1 ^ ^,L收料管架係由電腦控制之伺服胃# > ^ θ 達,光電感測器,營靼^ Μ么七 服角度定位馬 s条導槽,管架及收納管所組成。 【實施方式】 為使貝審查委員充分了解本發明之内☆ 成之功效、兹配合圖式列舉一 内二’ 土所能達 如下: K 坪細介紹說明 如第一圖所示,本發明係 其主要係包括一 te說 、’、 疋件測試分選機, ^振動入料組1、一轉盤?、、刀選機 構3及一收料管架4所組成,藉以將f —剛試系統機 序利用可程式控制進行單顆手動和‘:巧試元件A依 ,再個別予以分類收集,其中·· 勁連續測試等程序後 瀛振動入料組1 (請配合參閱第二一 可容納待測試元件A之料斗i !,並:該;= 第8頁 1229620 五、發明說明(5) 伸一導料管1 2,該導料管1 2末端形成定位'架丄3 ; 該轉盤2周圍環設有數溝槽洞2 1 ,藉以依序接收及 輸送上述定位架1 3之每一待測試元件a ; 該測試系統機構3 (請配合參閱第一、六圖所示)具 有高頻測試頭3 2,藉以依行進程序逐一探測每一溝槽洞 2 1之待測試兀件A,並執行既定之射頻測試校驗項目及 儲存杈驗修正值的比對分析後,再根據測試項目與測試值 之預設屬性進行分類; 4收料管架4 (請配合參閱第七圖所示)具有複數組1229620 V. Description of the invention (4) Placement; and attached photoelectric tear 丨 丨 cry ai head for detection: ° linear cylinder, used to drive the high-frequency test Rainbow Institute :: The upper arm is controlled by a computer-controlled rotation and Linear air pressure ^ 8. A suction nozzle is set at the end of the μ linear air cylinder. The above-mentioned ΐfree cylinder is composed of the above-mentioned, among which the 其中 摩 system is controlled by a computer and the linear pneumatic cylinder is 18 (Γ degree push-rotate the end of the pneumatic cylinder is provided with a nozzle, which rotates the above-mentioned 屮% L ΟΑ. Red, in which the straight J = brain "linear air pressure φ ... 罝 line ^ The end of the pressure cylinder is equipped with a suction nozzle. 1 ^ ^, L receiving tube rack is a servo stomach controlled by a computer # > ^ θ, consisting of a photodetector, a battery, an angle positioning horse, a guide groove, a pipe rack, and a storage tube. [Embodiment] In order to make the review committee fully understand the present invention ☆ The effectiveness of this product is listed in the following figure. The detailed description of the soil can be as follows: K Ping detailed introduction and description as shown in the first figure, the present invention is mainly composed of a te said, ', test file sorting Machine, ^ vibrating feeding group 1, a turntable ?, a knife selection mechanism 3 and a receiving tube rack 4, so that f-just test system sequence using programmable control for a single manual and ': smart test Component A is collected separately and collected separately, among which ... Group 1 (please refer to the second hopper i that can hold the component A to be tested! And: this; = page 8 1229620 V. Description of the invention (5) Extend a guide tube 12 and the end of the guide tube 12 Form a positioning 'frame 丄 3; There are several groove holes 2 1 around the turntable 2 so as to sequentially receive and transport each of the components a to be tested a of the positioning frame 1 3; The test system mechanism 3 (please refer to the first (Shown in Fig. 6) with a high-frequency test head 3 2 to detect each of the trench holes 21 1 to be tested A in accordance with the travel procedure, and to perform the predetermined RF test calibration items and store the correction value After comparison and analysis, it is classified according to the preset attributes of the test items and test values; 4 receiving tube rack 4 (please refer to Figure 7 for cooperation) has a complex array
收納區4 0,以分別收納經由分類後之已測試元件。 其中上述待測試元件A係經表面黏著處理(Surface —The storage area 40 is used to store the tested components after classification respectively. The above-mentioned component A to be tested is surface-adhered (Surface —
Mc^nt/echnology )之無線電射頻元件分片模組,且該待 =忒70件A係採用印刷電路板或陶瓷基板,使該測試系統 二構3係可針對該待測試元件執行及儲存射頻通道選擇及 3之量測項目與量龍(其包括··功率、頻率、調變量 ,耗電源、靈敏度、相位雜訊儀器),以及執行及儲存 員15虎疋否異常的規格判斷程式(其包括:功率、頻率 、調變量:消耗電源、靈敏度、相位雜訊量測。 以下係將本發明針對上述實施例之細部構件進一步介Mc ^ nt / echnology) radio frequency component slice module, and the waiting = 件 70 pieces of A series use printed circuit boards or ceramic substrates, so that the test system II structure 3 series can execute and store RF for the test component Channel selection and 3 measurement items and measuring dragons (including power, frequency, adjustment variables, power consumption, sensitivity, phase noise instrument), and execution and storage of 15 standard specifications judgment program (whose abnormality) Including: power, frequency, tuning variables: power consumption, sensitivity, phase noise measurement. The following is a detailed description of the detailed components of the present invention with respect to the above embodiments.
、队二二★栝有振動入料組1、轉盤2、測試系統機構3 —圖2 ^ ^ 4、入料臂5、旋轉臂6及出料臂7 (再如第 圆所不);其中: 該振動入料組1 可容納待測試元件A (請配合參閱第二、三圖所示)具有 之圓形料斗1 1 ,並於該料斗1 1 一2. Team two and two ★ There are vibration feeding group 1, turntable 2, test system mechanism 3-Figure 2 ^ ^ 4, feeding arm 5, rotating arm 6 and discharging arm 7 (again, as the first circle does not); : The vibrating feeding group 1 can accommodate the round hopper 1 1 of the component A to be tested (please refer to Figures 2 and 3).
Ϊ229620 '' 一 五、發明說明⑻" '~' 一 端延伸一導料管1 2,該導料管1 2末端形成定位架1 3 ^该料斗1 1侧緣貼設一圓形振動器(圖未示),該導 =& 1 2側緣則貼設有一直線型振動器(圖未示),以將 ^測試元件A裝入該料斗1 1内後,藉由振動透過導料管 2之導弓丨送出至定位架1 3定位,以等待進行輸送。 呑亥轉般 9 ( I匕(請配合參閱第一、四圖所示)係由電腦控制之 词服g 7 、日丨1 位馬達(圖未示)與光電感測器2 3及盤面待 4所組成;其中該伺服角度定位馬達係由電腦控 制接收的時序與每次輸送的樞轉角度;該盤面待測載具2 4,以預定間距排設於每一溝槽洞2 1内;該光電感測器 2 3設於每一盤面待測載具2 4上’以檢測所接收之待測 試元件Α狀態。 該測試系統機構3 (請配合參閱第一、六圖所示)係 可包括:一高頻測試頭3 2,其中前端具有一探針3 1 , 用以檢測每一待測試元件A之測試端置狀態;滑台3 3, 係定位該高頻測試頭3 2 ;定位機構3 4,用以定位該滑 台3 3與轉盤2之相對高度及位置;及附帶光電感測器之 直線犁氣缸3 5 ’用以傳動該高頻測試頭3 2進行探測, 藉以依行進程序逐一探測每一溝槽洞2 1之待測試元件a ,並執行既定之射頻测試校驗項目及儲存校驗修正值的比 對分析後,再根據測試項目與測試值之預設屬性進行分類 ,其中該測試系統機構3之定位機構3 4係為X-Y-Z三軸 附帶米達尺之機構(圖未示),如此即可各沿著X轴,Y軸 及Z軸進行三度空間的位移,藉以精確微調定位該高頻測Ϊ229620 五一 、 Explanation of the invention⑻ " '~' One end extends a guide tube 12 which forms a positioning frame 1 3 at the end of the guide tube 1 2 ^ A circular vibrator is attached to the side edge of the hopper 11 (Figure (Not shown), the guide = & 1 2 is provided with a linear vibrator (not shown) on the side edge, so that the test element A is loaded into the hopper 1 1 and then passes through the guide tube 2 by vibration The guide bow 丨 is sent out to the positioning frame 1 3 for positioning, waiting for transportation. Zhuhai Zhuan 9 (I dagger (please refer to Figures 1 and 4 for details) is a computer-controlled word g7, Japan, 1-bit motor (not shown), optical sensor 23, and disk 4; wherein the servo angle positioning motor is controlled by the computer to receive the timing and the pivot angle of each conveyance; the disc surface test vehicle 24 is arranged in each groove hole 21 at a predetermined pitch; The photo-inductive sensor 2 3 is provided on each of the test vehicles 24 on the disk surface to detect the state of the component A to be tested. The test system mechanism 3 (please refer to Figures 1 and 6) is applicable. Including: a high-frequency test head 32, wherein the front end has a probe 3 1 for detecting the test end state of each component A to be tested; a slide table 3 3, which positions the high-frequency test head 3 2; positioning A mechanism 34 is used to position the relative height and position of the slide table 3 3 and the turntable 2; and a linear plough cylinder 3 5 'with a photo sensor is used to drive the high-frequency test head 32 to perform detection so as to proceed The program probes each of the trench holes 21 1 to be tested one by one, and executes the predetermined RF test verification items After the comparison analysis of the calibration correction value is stored, it is classified according to the preset attributes of the test item and the test value. Among them, the positioning mechanism 3 of the testing system mechanism 3 is a XYZ three-axis mechanism with a mid-scale ruler. (Shown), so that three-dimensional spatial displacements can be made along the X-axis, Y-axis, and Z-axis, so as to precisely fine-tune the high-frequency measurement.
1229620 五、發明說明(7) 試頭:f與轉盤2之相對位置與高度。 邊收料管架4 (請配合 制之伺服角 > 玄#民、* 閲第七圖所不)係由電腦控 、管卒4^ί 光電感測器41、管架導槽42 、&米4 3及收納管4 4所έ曰+ ^ 匕 成複數組收納= 成,俾於管架導槽42間形 入料身5 (請配合參閱第四圖所係由 之旋轉型氣壓缸5 i及直線型褒厥::不)係由電腦控制 古綠备厭各 3丄汉直踝型虱壓缸52所組成,其中該 末端設有一吸嘴53用以由定位架13 所示)&序吸起(取)待測試元件A置入轉盤 2之溝槽洞21(如第-圖所示)上。 得盤 夕妙:3 ί臂6 (請配合參閱第五圖所示)係由電腦控制 之紋轉型氣壓缸6i及直線型氣壓缸62所組成,其中核 直線氣壓缸6 2之末端設有一吸嘴6 3,該旋轉氣壓缸6 1則進行180度推轉,用以依序由轉盤2之溝槽洞2丄上 吸起(取)待測試元件A進行翻轉。 该出料臂7 (請配合參閱第七圖所示)係由電腦控制 之旋轉型氣壓缸7 1及直線型氣壓缸7 2所組成,其中該 直線氣壓缸7 2之末端設有一吸嘴7 3,用以吸起/取^ 經測试後之已測試元件’轉移至指定管架導槽4 2上方, 再置入相應預設條件之管架的收納管4 4區域。 一藉由上述之結構組成’即可將每一欲檢測分類之待測 試元件A裝入振動入料組1的料斗1 1内(如第二圖所 ,再依序藉由振動器一 一振動,並透過導料管 、,不 位架13上,再由入料臂5撿出放置轉盤2丄的溝=1229620 V. Description of the invention (7) Test head: relative position and height of f and turntable 2. Side-receiving tube rack 4 (please match the servo angle & xuan #Min, * see the seventh picture) is controlled by the computer, the tube 4 ^ ί photodetector 41, tube rack guide slot 42, & Mi 4 3 and storage tube 4 4 are called + ^ dagger into a complex array storage = Cheng, into the tube frame guide groove 42 into the shape of the body 5 (please refer to the rotation of the pneumatic cylinder shown in Figure 4) 5 i and linear type :: No) is composed of computer-controlled ancient green preparations and 3 straight Chinese ankle-type lice pressure cylinders 52, in which a suction nozzle 53 is provided at the end for the positioning frame 13) & Sequentially suck up (take) the component A to be tested and place it in the groove hole 21 (shown in FIG. 1) of the turntable 2. Wonderful banquet: 3 ίarm 6 (please refer to the fifth picture) is composed of computer-controlled grain-transformation pneumatic cylinder 6i and linear pneumatic cylinder 62, of which the end of the nuclear linear pneumatic cylinder 62 is provided with a suction Mouth 63, the rotary pneumatic cylinder 61 is pushed 180 degrees to sequentially suck (take) the component A to be tested from the groove hole 2 of the turntable 2 and turn it over. The discharge arm 7 (please refer to FIG. 7) is composed of a rotary pneumatic cylinder 7 1 and a linear pneumatic cylinder 7 2 controlled by a computer, wherein a nozzle 7 is provided at the end of the linear pneumatic cylinder 7 2 3, used to suck up / take ^ the tested components after the test 'transfer to the designated tube rack guide groove 4 2 and then place the tube 4 4 area of the tube rack corresponding to the preset conditions. With the above-mentioned structure and composition, each component A to be tested to be tested can be loaded into the hopper 11 of the vibration feeding group 1 (as shown in the second figure, and then sequentially vibrated by the vibrator one by one). , And through the guide tube, on the stand 13, and then pick out the groove where the turntable 2 丄 is placed by the feed arm 5 =
1々外20 五發明說明(8) 1中(如第 時’則利用 槽洞2 1中 統3藉由高 序接觸每— 測試得到不 測試值之屬 圖所示)。 此外該 構成,故可 短路而影響 再者( 一氣壓元件 器1 4 ,用 測試元件A 測試的方式 姿態送出) 往定位架1 且經篩選之 1 2之末端 以精確定位 依序吸起( 用上更具方 ϋ:;轉件〜 頻“:探針:,復以: 待測續_ Z之探針3 1透過滑A q 糸 同 > 二70件A之測試端(如第上二3位移依 以際剛試值後’再藉由出;以卜 範圍分類分別送入收料管¥ 4 f 7配合不同 叮^东4處理(如第七 :盤2之盤面待測載 與待測試元件八之測試端二=導電材料所 測試準確值。 等絕緣,以防止因 =圖所示),該振動入料組1更包括 圖未不)及於圓形料斗1 文匕括 以監測每-振動送出之待測試元;A、,f感測 定位異常時(如現今一般測試俜=接::待 右瓜測送出之待測試元件A係以蓋子朝上 ,則啟動控制該翕壓元侔w^ ^ h住、㈣ 軋壓吹襲將振出通 元件A吹下料斗11内重新筛選, 待測試70件A會進入導料管1 2,而該導2管 線ί不連續之定位架"所組成,藉 忒待測试疋件Α,以待入料臂5由定位 ::生待測試元件A置入轉盤2内,如此俾於使1々 外 20 5 Description of the invention (8) 1 in the middle (for example, when using the slot 2 2 in the system 3 by contacting each in a high order—test results are shown in the figure below). In addition, because of this structure, it can be short-circuited and affect the other (a pneumatic component device 1 4 is sent in the posture of the test component A test) to the positioning frame 1 and the end of the filtered 1 2 is sucked in order by precise positioning (using The above is more square ϋ :; turn ~ ~ frequency ": probe :, and repeat: to be tested continued _ Z of the probe 3 1 through sliding A q 糸 the same as> two 70 pieces of A test end (such as the first two 3 Displacement is based on the test value, and then it is used again; it is sent to the receiving tube according to the range classification. ¥ 4 f 7 with different Ding ^ East 4 treatment (such as the seventh: disk 2 to be tested and loaded The test terminal 2 of the test element 8 = the exact value tested by the conductive material. Such insulation as to prevent the cause = shown in the figure), the vibration feeding group 1 includes the figure) and the circular hopper 1 is enclosed for monitoring Each-vibration element to be tested is sent; A ,, f is abnormal when the sensing position is abnormal (such as the current general test 俜 = connected :: the component to be tested sent by the right melon is A with the lid facing upward, then the control of the pressure is started. Yuan 侔 w ^ ^ h live, ㈣ Rolling blow will blow out the pass element A and blow down the hopper 11 for re-screening, 70 pieces to be tested will enter the guide Pipe 12, and the guide 2 pipeline is composed of a discontinuous positioning frame " by borrowing the piece A to be tested, and the feeding arm 5 is positioned by the positioning :: testing component A into the turntable 2, So embarrassed
第12頁 1229620Page 12 1229620
五、發明說明(9) 【特點及功效 本發明所提供之元件測試分選機,與其他習用技術相 互比較時,更具有下列之優點: 目 1、 可將不同屬性測試實際值,予以執行歸納分類。 2、 可針對該待测試元件彈性調整執行及儲存射頻通道選 擇及訊號之量測項目與量測值。 、 3、 可根據實際需求設定執行及儲存射頻訊號是否異常 規格判斷程式。 、 細上所述 ,1 ^ 不茶不但在技術思想上確屬創新,並能較 增進上述多項功效,應已充分符合新穎性及進^ 准本件件’爰依法提出申請’懇貴局核 上列▲、,專利申请案,以勵發明,至感德便。 明,惟泫^細說明係針對本發明之一可行實施例之具體說 脫離本二月用以限制本發明之專利範圍…未 本案之專利範^ *。所為之等效實施或變更,均應包含於V. Description of the invention (9) [Features and effects The component test and sorting machine provided by the present invention has the following advantages when compared with other conventional technologies: Item 1. The actual values of different attributes can be tested and summarized. classification. 2. It is possible to flexibly adjust the execution and storage of RF channel selection and signal measurement items and measurement values for the component under test. 3, According to the actual needs, it can be set to execute and store the radio frequency signal whether the specifications are judged. As detailed above, 1 ^ Not only tea is indeed an innovation in technical thinking, and it can enhance the above-mentioned multiple effects. It should have fully met the novelty and progress. ^ This document 'Apply according to the law'. Column ▲ ,, patent applications, to encourage invention, to the utmost. However, the detailed description is specific to one of the feasible embodiments of the present invention. It departs from the scope of patents used to limit the present invention in February ... not the patent scope of this case ^ *. All equivalent implementations or changes should be included in
第13頁 1229620 圖式簡單說明 【圖式簡單說明】 第一圖係為本發明試舉一較佳之實施外觀示意圖。 第二圖係為本發明實施例中振動入料組與轉盤間之外觀示 意圖。 第三圖係為本發明實施例中振動入料組與轉盤於另一角度 之外觀示意圖。 第四圖係為本發明實施例中將振動入料組之待測試元件移 至轉盤的動作示意圖。 第五圖係為本發明實施例中將轉盤内之待測試元件進行轉 向的動作示意圖。 第六圖係為本發明實施例中測試系統機構檢測待測試元件 之動作示意圖。 第七圖係為本發明實施例中將待測試元件分類移至收料管 架之動作示意圖。Page 13 1229620 Brief description of the drawings [Simplified description of the drawings] The first diagram is a schematic diagram of a preferred implementation of the present invention. The second figure is a schematic view showing the appearance between the vibration feeding group and the turntable in the embodiment of the present invention. The third figure is a schematic view of the appearance of the vibration feeding group and the turntable at another angle in the embodiment of the present invention. The fourth figure is a schematic diagram of the operation of moving the component to be tested of the vibration feeding group to the turntable in the embodiment of the present invention. The fifth figure is a schematic diagram of the operation of turning the component to be tested in the turntable in the embodiment of the present invention. The sixth diagram is a schematic diagram of the operation of the test system mechanism detecting the component to be tested in the embodiment of the present invention. The seventh diagram is a schematic diagram of the movement of sorting the components to be tested to the receiving pipe rack in the embodiment of the present invention.
.....料斗 .....定位架 .....轉盤 .....伺服角度定位馬達 .....盤面待測載具 .....探針 .,...滑台 .....直線型氣缸..... Hopper ..... Positioning frame ..... Turntable ..... Servo angle positioning motor ..... Pallet to be tested ... Probe ... Slide table ... linear cylinder
【主要部分代表符號】 1… …振 動 入 料 組 1 2... …導 料 管 1 4… …光 電 感 測 器 2 1… …溝 槽 洞 2 3... …光 電 感 測 器 3… …測 試 系 統 機構 3 2… …高 頻 測 試 頭 3 4… …定 位 機 構[Representative symbols of main parts] 1…… Vibration feeding group 1 2…… Guide tube 1 4…… Photodetector 2 1… Trench hole 2 3 ...… Photodetector 3…… Test system mechanism 3 2…… high-frequency test head 3 4… positioning mechanism
第14頁 1229620Page 14 1229620
第15頁 圖式簡單說明 4____ ..收料管架 4 0____ ..收納區 4 1...... 光電感測器 4 2____ ..管架導槽 4 3...... 管架 4 4____ ..收納管 5...... 入料臂 6____ ..旋轉臂 7...... 出料臂 5 1、6 1、7 1____ ..旋轉型氣壓缸 5 2、6 2、7 2____ ..直線型氣壓缸 5 3 、6 3 、7 3____ ..吸嘴 A......待測試元件Brief description of the drawings on page 15 4____ .Receiving pipe rack 4 0____ ..Receiving area 4 1 ...... Photoelectric sensor 4 2____ .. Pipe rack guide groove 4 3 ...... Pipe rack 4 4____ .. storage tube 5 ...... feeding arm 6____ .. rotating arm 7 ...... discharging arm 5 1, 6 1, 7 1____ .. rotary pneumatic cylinder 5 2, 6 2 , 7 2____: Linear cylinders 5 3, 6 3, 7 3____: Nozzle A ... Components to be tested
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Cited By (3)
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TWI403367B (en) * | 2009-10-09 | 2013-08-01 | Semes Co Ltd | Apparatus and method of sorting electronic component devices |
TWI478776B (en) * | 2009-05-21 | 2015-04-01 | Shibuya Kogyo Co Ltd | Electronic parts of the distribution device |
TWI487575B (en) * | 2011-06-03 | 2015-06-11 | Kubota Kk | Granular material sorting apparatus |
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TWI409201B (en) * | 2010-12-14 | 2013-09-21 | Metal Ind Res & Dev Ct | Transporting device |
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TWI478776B (en) * | 2009-05-21 | 2015-04-01 | Shibuya Kogyo Co Ltd | Electronic parts of the distribution device |
TWI403367B (en) * | 2009-10-09 | 2013-08-01 | Semes Co Ltd | Apparatus and method of sorting electronic component devices |
TWI487575B (en) * | 2011-06-03 | 2015-06-11 | Kubota Kk | Granular material sorting apparatus |
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