CN101652762B - 存储器系统 - Google Patents
存储器系统 Download PDFInfo
- Publication number
- CN101652762B CN101652762B CN2008800066497A CN200880006649A CN101652762B CN 101652762 B CN101652762 B CN 101652762B CN 2008800066497 A CN2008800066497 A CN 2008800066497A CN 200880006649 A CN200880006649 A CN 200880006649A CN 101652762 B CN101652762 B CN 101652762B
- Authority
- CN
- China
- Prior art keywords
- block
- piece
- selector
- time
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/16—Protection against loss of memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7211—Wear leveling
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- Memory System (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008114230A JP4439569B2 (ja) | 2008-04-24 | 2008-04-24 | メモリシステム |
| JP114230/2008 | 2008-04-24 | ||
| PCT/JP2008/066507 WO2009130809A1 (en) | 2008-04-24 | 2008-09-08 | Memory system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101652762A CN101652762A (zh) | 2010-02-17 |
| CN101652762B true CN101652762B (zh) | 2012-08-29 |
Family
ID=41216557
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008800066497A Expired - Fee Related CN101652762B (zh) | 2008-04-24 | 2008-09-08 | 存储器系统 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US7958411B2 (enExample) |
| EP (2) | EP2447849B1 (enExample) |
| JP (1) | JP4439569B2 (enExample) |
| KR (1) | KR100978302B1 (enExample) |
| CN (1) | CN101652762B (enExample) |
| TW (1) | TWI386808B (enExample) |
| WO (1) | WO2009130809A1 (enExample) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9141477B2 (en) * | 2007-10-12 | 2015-09-22 | International Business Machines Corporation | Data protection for variable length records by utilizing high performance block storage metadata |
| US8230317B2 (en) * | 2008-04-09 | 2012-07-24 | International Business Machines Corporation | Data protection method for variable length records by utilizing high performance block storage metadata |
| JP2010157130A (ja) | 2008-12-27 | 2010-07-15 | Toshiba Corp | メモリシステム |
| JP5221332B2 (ja) * | 2008-12-27 | 2013-06-26 | 株式会社東芝 | メモリシステム |
| JP5317690B2 (ja) * | 2008-12-27 | 2013-10-16 | 株式会社東芝 | メモリシステム |
| US8190832B2 (en) * | 2009-01-29 | 2012-05-29 | International Business Machines Corporation | Data storage performance enhancement through a write activity level metric recorded in high performance block storage metadata |
| CN102317925B (zh) | 2009-02-12 | 2014-07-23 | 株式会社东芝 | 存储器系统和控制存储器系统的方法 |
| JP5268710B2 (ja) * | 2009-02-27 | 2013-08-21 | 株式会社東芝 | 半導体記憶装置 |
| JP2011128998A (ja) | 2009-12-18 | 2011-06-30 | Toshiba Corp | 半導体記憶装置 |
| JP5404483B2 (ja) | 2010-03-17 | 2014-01-29 | 株式会社東芝 | メモリシステム |
| JP5066209B2 (ja) | 2010-03-18 | 2012-11-07 | 株式会社東芝 | コントローラ、データ記憶装置、及びプログラム |
| TWI414936B (zh) * | 2010-06-04 | 2013-11-11 | Quanta Comp Inc | 電腦系統之除錯方法 |
| JP2012008651A (ja) | 2010-06-22 | 2012-01-12 | Toshiba Corp | 半導体記憶装置、その制御方法および情報処理装置 |
| JP5228021B2 (ja) | 2010-09-29 | 2013-07-03 | 株式会社東芝 | 半導体記憶装置 |
| TWI420308B (zh) * | 2010-10-13 | 2013-12-21 | Phison Electronics Corp | 區塊管理方法、記憶體控制器與記憶體儲存裝置 |
| JP2012128645A (ja) | 2010-12-15 | 2012-07-05 | Toshiba Corp | メモリシステム |
| JP2012128643A (ja) | 2010-12-15 | 2012-07-05 | Toshiba Corp | メモリシステム |
| JP5535128B2 (ja) | 2010-12-16 | 2014-07-02 | 株式会社東芝 | メモリシステム |
| JP2012155806A (ja) | 2011-01-28 | 2012-08-16 | Toshiba Corp | 不揮発性半導体記憶装置 |
| CN102163165B (zh) * | 2011-05-26 | 2012-11-14 | 忆正存储技术(武汉)有限公司 | 一种闪存错误预估模块及其预估方法 |
| US9514838B2 (en) * | 2011-05-31 | 2016-12-06 | Micron Technology, Inc. | Apparatus including memory system controllers and related methods for memory management using block tables |
| WO2013030866A1 (en) | 2011-08-29 | 2013-03-07 | Hitachi, Ltd. | Semiconductor storage device comprising electrically rewritable nonvolatile semiconductor memory |
| JP2013069183A (ja) * | 2011-09-26 | 2013-04-18 | Toshiba Corp | コントローラおよびメモリシステム |
| US9424188B2 (en) | 2011-11-23 | 2016-08-23 | Smart Modular Technologies, Inc. | Non-volatile memory packaging system with caching and method of operation thereof |
| JP5674634B2 (ja) | 2011-12-28 | 2015-02-25 | 株式会社東芝 | コントローラ、記憶装置およびプログラム |
| US8924636B2 (en) | 2012-02-23 | 2014-12-30 | Kabushiki Kaisha Toshiba | Management information generating method, logical block constructing method, and semiconductor memory device |
| US9251055B2 (en) | 2012-02-23 | 2016-02-02 | Kabushiki Kaisha Toshiba | Memory system and control method of memory system |
| CN102981966B (zh) * | 2012-11-09 | 2016-04-06 | 青岛海信宽带多媒体技术有限公司 | 一种均衡分配Flash存储块的数据存储方法 |
| CN104731515B (zh) * | 2013-12-18 | 2018-02-23 | 华为技术有限公司 | 控制存储设备机群磨损均衡的方法及设备 |
| TWI548991B (zh) * | 2014-02-14 | 2016-09-11 | 群聯電子股份有限公司 | 記憶體管理方法、記憶體控制電路單元與記憶體儲存裝置 |
| KR102285462B1 (ko) * | 2014-03-26 | 2021-08-05 | 삼성전자주식회사 | 불휘발성 메모리 및 메모리 컨트롤러를 포함하는 메모리 시스템의 동작 방법 |
| KR20160024530A (ko) * | 2014-08-26 | 2016-03-07 | 에스케이하이닉스 주식회사 | 반도체 장치 및 이의 동작 방법 |
| DK3059679T3 (en) * | 2014-12-05 | 2018-12-17 | Huawei Tech Co Ltd | CONTROL UNIT, FLASH MEMORY UNIT, PROCEDURE FOR IDENTIFICATION OF DATA BLOCK STABILITY, AND PROCEDURE FOR STORING DATA ON THE FLASH MEMORY UNIT |
| CN107534425B (zh) | 2015-07-28 | 2021-06-29 | 拉姆伯斯公司 | 容忍突发的决策反馈均衡 |
| KR102393323B1 (ko) * | 2015-08-24 | 2022-05-03 | 삼성전자주식회사 | 재사용 주기를 이용하여 사용자 데이터를 쓰기 위한 워드라인을 결정하는 저장 장치의 동작 방법 |
| KR102456104B1 (ko) | 2015-08-24 | 2022-10-19 | 삼성전자주식회사 | 데이터 신뢰성에 따라 동작 조건을 변경하는 저장 장치의 동작 방법 |
| KR102333746B1 (ko) * | 2015-09-02 | 2021-12-01 | 삼성전자주식회사 | 재사용 주기에 따라 마모도를 관리하는 저장 장치의 동작 방법 |
| TWI607448B (zh) * | 2016-09-07 | 2017-12-01 | 群聯電子股份有限公司 | 資料寫入方法、記憶體控制電路單元與記憶體儲存裝置 |
| US10489064B2 (en) * | 2016-10-03 | 2019-11-26 | Cypress Semiconductor Corporation | Systems, methods, and devices for user configurable wear leveling of non-volatile memory |
| CN106601306B (zh) * | 2016-12-15 | 2019-12-31 | 武汉新芯集成电路制造有限公司 | 一种提升闪存芯片性能的方法 |
| US10204693B2 (en) * | 2016-12-31 | 2019-02-12 | Western Digital Technologies, Inc. | Retiring computer memory blocks |
| KR102844275B1 (ko) * | 2017-02-02 | 2025-08-12 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 메모리 시스템의 동작 방법 |
| CN108733577B (zh) * | 2017-04-21 | 2021-10-22 | 群联电子股份有限公司 | 存储器管理方法、存储器控制电路单元及存储器存储装置 |
| TWI692691B (zh) | 2018-01-11 | 2020-05-01 | 大陸商合肥沛睿微電子股份有限公司 | 記憶體控制裝置與記憶體控制方法 |
| US10714187B2 (en) | 2018-01-11 | 2020-07-14 | Raymx Microelectronics Corp. | Memory control device for estimating time interval and method thereof |
| US11379355B2 (en) | 2018-10-30 | 2022-07-05 | Micron Technology, Inc. | Power-on-time based data relocation |
| CN118645142B (zh) * | 2019-07-15 | 2025-09-09 | 美光科技公司 | 用于存储器系统的维护操作 |
| TWI758867B (zh) * | 2020-09-16 | 2022-03-21 | 英業達股份有限公司 | 基於gpnv的基本輸入輸出系統錯誤訊息記錄方法、系統及終端 |
| US11698871B2 (en) * | 2020-09-25 | 2023-07-11 | PetaIO Inc. | Method for PRP/SGL handling for out-of-order NVME controllers |
| KR20230018215A (ko) * | 2021-07-29 | 2023-02-07 | 삼성전자주식회사 | 스토리지 장치, 스토리지 컨트롤러 및 스토리지 컨트롤러의 동작 방법 |
| EP4521223A4 (en) | 2023-07-11 | 2025-10-29 | Yangtze Memory Tech Co Ltd | OPERATING METHOD FOR MEMORY SYSTEM, MEMORY SYSTEM AND STORAGE MEDIA |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1536579A (zh) * | 2003-04-08 | 2004-10-13 | 株式会社瑞萨科技 | 存储卡 |
Family Cites Families (53)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4724456A (en) * | 1985-09-30 | 1988-02-09 | Minolta Camera Kabushiki Kaisha | Camera system having photographic camera and electronic flash device |
| JPH0248592A (ja) * | 1988-08-09 | 1990-02-19 | Tsumura & Co | ジベンゾシクロオクタジエン型リグナンの製造法 |
| US5172338B1 (en) | 1989-04-13 | 1997-07-08 | Sandisk Corp | Multi-state eeprom read and write circuits and techniques |
| EP0935255A2 (en) | 1989-04-13 | 1999-08-11 | SanDisk Corporation | Flash EEPROM system |
| US6230233B1 (en) * | 1991-09-13 | 2001-05-08 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
| JP3412839B2 (ja) | 1992-07-01 | 2003-06-03 | 株式会社東芝 | 不揮発性半導体メモリ装置 |
| JP2856621B2 (ja) | 1993-02-24 | 1999-02-10 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 一括消去型不揮発性メモリおよびそれを用いる半導体ディスク装置 |
| US5479638A (en) * | 1993-03-26 | 1995-12-26 | Cirrus Logic, Inc. | Flash memory mass storage architecture incorporation wear leveling technique |
| US5485595A (en) | 1993-03-26 | 1996-01-16 | Cirrus Logic, Inc. | Flash memory mass storage architecture incorporating wear leveling technique without using cam cells |
| KR970008188B1 (ko) | 1993-04-08 | 1997-05-21 | 가부시끼가이샤 히다찌세이사꾸쇼 | 플래시메모리의 제어방법 및 그것을 사용한 정보처리장치 |
| JPH0756780A (ja) | 1993-08-16 | 1995-03-03 | Toshiba Corp | メモリカード装置 |
| JP3507132B2 (ja) * | 1994-06-29 | 2004-03-15 | 株式会社日立製作所 | フラッシュメモリを用いた記憶装置およびその記憶制御方法 |
| US5930815A (en) * | 1995-07-31 | 1999-07-27 | Lexar Media, Inc. | Moving sequential sectors within a block of information in a flash memory mass storage architecture |
| JP3552490B2 (ja) | 1997-09-17 | 2004-08-11 | 日本ビクター株式会社 | フラッシュ型メモリを備えた記憶装置,フラッシュ型メモリの管理方法 |
| JP3421581B2 (ja) | 1998-06-29 | 2003-06-30 | 株式会社日立製作所 | 不揮発性半導体メモリを用いた記憶装置 |
| US20020003252A1 (en) | 1998-09-03 | 2002-01-10 | Ravi Iyer | Flash memory circuit with with resistance to disturb effect |
| EP1228510B1 (en) * | 1999-04-01 | 2006-09-20 | Lexar Media, Inc. | Space management for managing high capacity nonvolatile memory |
| US6269025B1 (en) * | 2000-02-09 | 2001-07-31 | Advanced Micro Devices, Inc. | Memory system having a program and erase voltage modifier |
| JP4149640B2 (ja) | 2000-07-10 | 2008-09-10 | 株式会社東芝 | 半導体メモリの書込制御装置及びその方法 |
| US6772274B1 (en) * | 2000-09-13 | 2004-08-03 | Lexar Media, Inc. | Flash memory system and method implementing LBA to PBA correlation within flash memory array |
| KR100644602B1 (ko) * | 2000-10-11 | 2006-11-10 | 삼성전자주식회사 | 플래시메모리를 위한 재사상 제어방법 및 그에 따른플래시 메모리의 구조 |
| JP2002133887A (ja) | 2000-10-31 | 2002-05-10 | Matsushita Electric Ind Co Ltd | 不揮発性半導体メモリ装置 |
| JP2003308242A (ja) * | 2002-04-16 | 2003-10-31 | Hitachi Ltd | 半導体記憶装置及びその制御方法 |
| US6985992B1 (en) * | 2002-10-28 | 2006-01-10 | Sandisk Corporation | Wear-leveling in non-volatile storage systems |
| ATE372578T1 (de) * | 2002-10-28 | 2007-09-15 | Sandisk Corp | Automatischer abnutzungsausgleich in einem nicht- flüchtigen speichersystem |
| JP4256175B2 (ja) * | 2003-02-04 | 2009-04-22 | 株式会社東芝 | 不揮発性半導体メモリ |
| US8112574B2 (en) * | 2004-02-26 | 2012-02-07 | Super Talent Electronics, Inc. | Swappable sets of partial-mapping tables in a flash-memory system with a command queue for combining flash writes |
| US7139864B2 (en) * | 2003-12-30 | 2006-11-21 | Sandisk Corporation | Non-volatile memory and method with block management system |
| US7363421B2 (en) * | 2005-01-13 | 2008-04-22 | Stmicroelectronics S.R.L. | Optimizing write/erase operations in memory devices |
| JP4413840B2 (ja) | 2005-09-20 | 2010-02-10 | 株式会社東芝 | 記憶媒体再生装置、記憶媒体再生方法および記憶媒体再生プログラム |
| JP4327143B2 (ja) * | 2005-09-30 | 2009-09-09 | パナソニックEvエナジー株式会社 | 二次電池用の制御装置及び二次電池の出力制御方法及び二次電池の出力制御実行プログラム |
| JP4660353B2 (ja) | 2005-11-01 | 2011-03-30 | 株式会社東芝 | 記憶媒体再生装置 |
| JP4575288B2 (ja) | 2005-12-05 | 2010-11-04 | 株式会社東芝 | 記憶媒体、記憶媒体再生装置、記憶媒体再生方法および記憶媒体再生プログラム |
| JP4575346B2 (ja) | 2006-11-30 | 2010-11-04 | 株式会社東芝 | メモリシステム |
| JP2008217857A (ja) | 2007-02-28 | 2008-09-18 | Toshiba Corp | メモリコントローラ及び半導体装置 |
| JP2008257773A (ja) * | 2007-04-02 | 2008-10-23 | Toshiba Corp | 不揮発性半導体記憶装置、不揮発性半導体記憶装置の制御方法、不揮発性半導体記憶システム、及びメモリカード |
| US7882301B2 (en) * | 2007-05-09 | 2011-02-01 | Stmicroelectronics S.R.L. | Wear leveling in storage devices based on flash memories and related circuit, system, and method |
| US20080282024A1 (en) * | 2007-05-09 | 2008-11-13 | Sudeep Biswas | Management of erase operations in storage devices based on flash memories |
| US7743203B2 (en) * | 2007-05-11 | 2010-06-22 | Spansion Llc | Managing flash memory based upon usage history |
| JP4564520B2 (ja) | 2007-08-31 | 2010-10-20 | 株式会社東芝 | 半導体記憶装置およびその制御方法 |
| JP4538034B2 (ja) | 2007-09-26 | 2010-09-08 | 株式会社東芝 | 半導体記憶装置、及びその制御方法 |
| US8751726B2 (en) * | 2007-12-05 | 2014-06-10 | Densbits Technologies Ltd. | System and methods employing mock thresholds to generate actual reading thresholds in flash memory devices |
| WO2009084724A1 (en) * | 2007-12-28 | 2009-07-09 | Kabushiki Kaisha Toshiba | Semiconductor storage device |
| JP4461170B2 (ja) * | 2007-12-28 | 2010-05-12 | 株式会社東芝 | メモリシステム |
| JP2009211234A (ja) * | 2008-03-01 | 2009-09-17 | Toshiba Corp | メモリシステム |
| JP4745356B2 (ja) * | 2008-03-01 | 2011-08-10 | 株式会社東芝 | メモリシステム |
| JP4498426B2 (ja) * | 2008-03-01 | 2010-07-07 | 株式会社東芝 | メモリシステム |
| JP5010505B2 (ja) * | 2008-03-01 | 2012-08-29 | 株式会社東芝 | メモリシステム |
| JP4551958B2 (ja) * | 2008-12-22 | 2010-09-29 | 株式会社東芝 | 半導体記憶装置および半導体記憶装置の制御方法 |
| JP2010157130A (ja) * | 2008-12-27 | 2010-07-15 | Toshiba Corp | メモリシステム |
| JP5198245B2 (ja) * | 2008-12-27 | 2013-05-15 | 株式会社東芝 | メモリシステム |
| JP5317689B2 (ja) * | 2008-12-27 | 2013-10-16 | 株式会社東芝 | メモリシステム |
| JP5268710B2 (ja) * | 2009-02-27 | 2013-08-21 | 株式会社東芝 | 半導体記憶装置 |
-
2008
- 2008-04-24 JP JP2008114230A patent/JP4439569B2/ja not_active Expired - Fee Related
- 2008-09-08 WO PCT/JP2008/066507 patent/WO2009130809A1/en not_active Ceased
- 2008-09-08 CN CN2008800066497A patent/CN101652762B/zh not_active Expired - Fee Related
- 2008-09-08 EP EP11183776.1A patent/EP2447849B1/en not_active Not-in-force
- 2008-09-08 KR KR1020097018223A patent/KR100978302B1/ko not_active Expired - Fee Related
- 2008-09-08 EP EP08810558A patent/EP2269139B1/en not_active Not-in-force
- 2008-09-25 TW TW097136969A patent/TWI386808B/zh not_active IP Right Cessation
-
2009
- 2009-08-31 US US12/551,213 patent/US7958411B2/en active Active
-
2010
- 2010-02-12 US US12/705,431 patent/US7949910B2/en active Active
-
2011
- 2011-05-13 US US13/107,623 patent/US20110219177A1/en not_active Abandoned
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1536579A (zh) * | 2003-04-08 | 2004-10-13 | 株式会社瑞萨科技 | 存储卡 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2269139A1 (en) | 2011-01-05 |
| WO2009130809A1 (en) | 2009-10-29 |
| US7949910B2 (en) | 2011-05-24 |
| EP2447849A2 (en) | 2012-05-02 |
| TW200945047A (en) | 2009-11-01 |
| US7958411B2 (en) | 2011-06-07 |
| JP4439569B2 (ja) | 2010-03-24 |
| US20110219177A1 (en) | 2011-09-08 |
| KR20090129411A (ko) | 2009-12-16 |
| EP2269139B1 (en) | 2012-10-31 |
| US20100077266A1 (en) | 2010-03-25 |
| EP2447849B1 (en) | 2019-05-01 |
| EP2269139A4 (en) | 2011-04-06 |
| KR100978302B1 (ko) | 2010-08-26 |
| JP2009265912A (ja) | 2009-11-12 |
| EP2447849A3 (en) | 2013-11-06 |
| CN101652762A (zh) | 2010-02-17 |
| TWI386808B (zh) | 2013-02-21 |
| US20100146228A1 (en) | 2010-06-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101652762B (zh) | 存储器系统 | |
| US20250130713A1 (en) | Memory system and control method thereof | |
| JP2010108522A (ja) | メモリシステムの制御方法 | |
| JP4703764B2 (ja) | メモリシステムの制御方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120829 Termination date: 20170908 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |