CN101652762B - 存储器系统 - Google Patents

存储器系统 Download PDF

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Publication number
CN101652762B
CN101652762B CN2008800066497A CN200880006649A CN101652762B CN 101652762 B CN101652762 B CN 101652762B CN 2008800066497 A CN2008800066497 A CN 2008800066497A CN 200880006649 A CN200880006649 A CN 200880006649A CN 101652762 B CN101652762 B CN 101652762B
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CN2008800066497A
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Chinese (zh)
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CN101652762A (zh
Inventor
菅野伸一
矢野浩邦
檜田敏克
橘内和也
矢野纯二
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Toshiba Corp
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Toshiba Corp
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/16Protection against loss of memory contents
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/0223User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023Free address space management
    • G06F12/0238Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52Protection of memory contents; Detection of errors in memory contents
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/76Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2212/00Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
    • G06F2212/72Details relating to flash memory management
    • G06F2212/7211Wear leveling
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/14Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • Memory System (AREA)
CN2008800066497A 2008-04-24 2008-09-08 存储器系统 Expired - Fee Related CN101652762B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008114230A JP4439569B2 (ja) 2008-04-24 2008-04-24 メモリシステム
JP114230/2008 2008-04-24
PCT/JP2008/066507 WO2009130809A1 (en) 2008-04-24 2008-09-08 Memory system

Publications (2)

Publication Number Publication Date
CN101652762A CN101652762A (zh) 2010-02-17
CN101652762B true CN101652762B (zh) 2012-08-29

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CN2008800066497A Expired - Fee Related CN101652762B (zh) 2008-04-24 2008-09-08 存储器系统

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US (3) US7958411B2 (enExample)
EP (2) EP2447849B1 (enExample)
JP (1) JP4439569B2 (enExample)
KR (1) KR100978302B1 (enExample)
CN (1) CN101652762B (enExample)
TW (1) TWI386808B (enExample)
WO (1) WO2009130809A1 (enExample)

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EP2269139A1 (en) 2011-01-05
WO2009130809A1 (en) 2009-10-29
US7949910B2 (en) 2011-05-24
EP2447849A2 (en) 2012-05-02
TW200945047A (en) 2009-11-01
US7958411B2 (en) 2011-06-07
JP4439569B2 (ja) 2010-03-24
US20110219177A1 (en) 2011-09-08
KR20090129411A (ko) 2009-12-16
EP2269139B1 (en) 2012-10-31
US20100077266A1 (en) 2010-03-25
EP2447849B1 (en) 2019-05-01
EP2269139A4 (en) 2011-04-06
KR100978302B1 (ko) 2010-08-26
JP2009265912A (ja) 2009-11-12
EP2447849A3 (en) 2013-11-06
CN101652762A (zh) 2010-02-17
TWI386808B (zh) 2013-02-21
US20100146228A1 (en) 2010-06-10

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