CN101405809A - 用于由多列不同存储器阵列共享的限流分压器的装置和方法 - Google Patents
用于由多列不同存储器阵列共享的限流分压器的装置和方法 Download PDFInfo
- Publication number
- CN101405809A CN101405809A CNA200380109481XA CN200380109481A CN101405809A CN 101405809 A CN101405809 A CN 101405809A CN A200380109481X A CNA200380109481X A CN A200380109481XA CN 200380109481 A CN200380109481 A CN 200380109481A CN 101405809 A CN101405809 A CN 101405809A
- Authority
- CN
- China
- Prior art keywords
- row
- memory
- memory array
- balancing circuitry
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000015654 memory Effects 0.000 title claims abstract description 180
- 238000003491 array Methods 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000015572 biosynthetic process Effects 0.000 claims 2
- 238000011067 equilibration Methods 0.000 abstract 4
- 239000002184 metal Substances 0.000 description 8
- 230000004913 activation Effects 0.000 description 6
- 230000002950 deficient Effects 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 5
- 230000000295 complement effect Effects 0.000 description 4
- 230000003213 activating effect Effects 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000005055 memory storage Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4097—Bit-line organisation, e.g. bit-line layout, folded bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/005—Transfer gates, i.e. gates coupling the sense amplifier output to data lines, I/O lines or global bit lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/309,572 US6934208B2 (en) | 2002-12-03 | 2002-12-03 | Apparatus and method for a current limiting bleeder device shared by columns of different memory arrays |
| US10/309,572 | 2002-12-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101405809A true CN101405809A (zh) | 2009-04-08 |
Family
ID=32392903
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA200380109481XA Pending CN101405809A (zh) | 2002-12-03 | 2003-12-01 | 用于由多列不同存储器阵列共享的限流分压器的装置和方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6934208B2 (enExample) |
| EP (1) | EP1576347A2 (enExample) |
| JP (1) | JP2006518523A (enExample) |
| KR (1) | KR100788182B1 (enExample) |
| CN (1) | CN101405809A (enExample) |
| AU (1) | AU2003298793A1 (enExample) |
| TW (1) | TWI285899B (enExample) |
| WO (1) | WO2004051662A2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6934208B2 (en) | 2002-12-03 | 2005-08-23 | Boise Technology, Inc. | Apparatus and method for a current limiting bleeder device shared by columns of different memory arrays |
| KR100587080B1 (ko) * | 2004-05-17 | 2006-06-08 | 주식회사 하이닉스반도체 | 메모리 장치의 감지 증폭기를 제어하여 컬럼성 페일을검출하는 방법 및 그 장치 |
| US7698607B2 (en) * | 2004-06-15 | 2010-04-13 | Intel Corporation | Repairing microdisplay frame buffers |
| US10020038B1 (en) | 2017-04-14 | 2018-07-10 | Micron Technology, Inc. | Apparatuses and methods for controlling wordlines and sense amplifiers |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5235550A (en) * | 1991-05-16 | 1993-08-10 | Micron Technology, Inc. | Method for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shorts |
| US5499211A (en) * | 1995-03-13 | 1996-03-12 | International Business Machines Corporation | Bit-line precharge current limiter for CMOS dynamic memories |
| JP3782227B2 (ja) * | 1997-03-11 | 2006-06-07 | 株式会社東芝 | 半導体記憶装置 |
| US5896334A (en) * | 1997-08-14 | 1999-04-20 | Micron Technology, Inc. | Circuit and method for memory device with defect current isolation |
| JP3505373B2 (ja) * | 1997-11-14 | 2004-03-08 | 株式会社東芝 | 半導体記憶装置 |
| JP2000077628A (ja) * | 1998-06-19 | 2000-03-14 | Toshiba Corp | 半導体記憶装置 |
| US6078538A (en) * | 1998-08-20 | 2000-06-20 | Micron Technology, Inc. | Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts |
| JP2001052476A (ja) * | 1999-08-05 | 2001-02-23 | Mitsubishi Electric Corp | 半導体装置 |
| US6356492B1 (en) * | 2000-08-16 | 2002-03-12 | Micron Technology, Inc. | Method and apparatus for reducing current drain caused by row to column shorts in a memory device |
| US6333882B1 (en) * | 2000-08-25 | 2001-12-25 | Micron Technology, Inc. | Equilibration/pre-charge circuit for a memory device |
| US6678199B1 (en) * | 2002-06-19 | 2004-01-13 | Micron Technology, Inc. | Memory device with sense amp equilibration circuit |
| US6934208B2 (en) | 2002-12-03 | 2005-08-23 | Boise Technology, Inc. | Apparatus and method for a current limiting bleeder device shared by columns of different memory arrays |
-
2002
- 2002-12-03 US US10/309,572 patent/US6934208B2/en not_active Expired - Lifetime
-
2003
- 2003-12-01 WO PCT/US2003/038226 patent/WO2004051662A2/en not_active Ceased
- 2003-12-01 JP JP2004557464A patent/JP2006518523A/ja active Pending
- 2003-12-01 KR KR1020057010141A patent/KR100788182B1/ko not_active Expired - Fee Related
- 2003-12-01 AU AU2003298793A patent/AU2003298793A1/en not_active Abandoned
- 2003-12-01 CN CNA200380109481XA patent/CN101405809A/zh active Pending
- 2003-12-01 EP EP03796551A patent/EP1576347A2/en not_active Withdrawn
- 2003-12-02 TW TW092133863A patent/TWI285899B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US6934208B2 (en) | 2005-08-23 |
| TW200428403A (en) | 2004-12-16 |
| AU2003298793A1 (en) | 2004-06-23 |
| US20040105333A1 (en) | 2004-06-03 |
| WO2004051662A2 (en) | 2004-06-17 |
| EP1576347A2 (en) | 2005-09-21 |
| KR20050084162A (ko) | 2005-08-26 |
| TWI285899B (en) | 2007-08-21 |
| JP2006518523A (ja) | 2006-08-10 |
| KR100788182B1 (ko) | 2008-01-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20090408 |