CN101358997A - 检查夹具及检查装置 - Google Patents

检查夹具及检查装置 Download PDF

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Publication number
CN101358997A
CN101358997A CNA2008101441557A CN200810144155A CN101358997A CN 101358997 A CN101358997 A CN 101358997A CN A2008101441557 A CNA2008101441557 A CN A2008101441557A CN 200810144155 A CN200810144155 A CN 200810144155A CN 101358997 A CN101358997 A CN 101358997A
Authority
CN
China
Prior art keywords
probe
mentioned
rear end
end side
inserting hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2008101441557A
Other languages
English (en)
Chinese (zh)
Inventor
土桥贤治
伊藤光彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KOYO TECHNOS CO Ltd
Original Assignee
KOYO TECHNOS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KOYO TECHNOS CO Ltd filed Critical KOYO TECHNOS CO Ltd
Publication of CN101358997A publication Critical patent/CN101358997A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CNA2008101441557A 2007-07-31 2008-07-29 检查夹具及检查装置 Pending CN101358997A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007198751 2007-07-31
JP2007198751A JP2009036532A (ja) 2007-07-31 2007-07-31 検査冶具および検査装置

Publications (1)

Publication Number Publication Date
CN101358997A true CN101358997A (zh) 2009-02-04

Family

ID=40331497

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2008101441557A Pending CN101358997A (zh) 2007-07-31 2008-07-29 检查夹具及检查装置

Country Status (4)

Country Link
JP (1) JP2009036532A (enrdf_load_stackoverflow)
KR (1) KR101011360B1 (enrdf_load_stackoverflow)
CN (1) CN101358997A (enrdf_load_stackoverflow)
TW (1) TW200905221A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104634999A (zh) * 2013-11-07 2015-05-20 日本电产理德股份有限公司 检测夹具
CN105044391A (zh) * 2014-04-24 2015-11-11 日本电产理德股份有限公司 电极结构体，检测夹具及电极结构体的制造方法
CN106932615A (zh) * 2017-04-28 2017-07-07 日本电产理德机器装置(浙江)有限公司 检查夹具及具备该检查夹具的检查装置
CN112424614A (zh) * 2018-07-18 2021-02-26 日本电产理德股份有限公司 探针、检查治具、检查装置以及探针的制造方法
CN112424615A (zh) * 2018-07-13 2021-02-26 日本电产理德股份有限公司 检查治具以及检查装置
CN113639979A (zh) * 2021-07-26 2021-11-12 苏州佳祺仕信息科技有限公司 一种检测治具及用于检测带孔工件性能的检测装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101565344B1 (ko) 2013-12-13 2015-11-03 현대자동차주식회사 차량 연동 단말기 조명 제어 시스템 및 제어 방법
CN106324481B (zh) * 2016-08-23 2018-11-27 管仙福 一种用于集成电路的定位检测装置
IT201700021400A1 (it) * 2017-02-24 2018-08-24 Technoprobe Spa Testa di misura a sonde verticali con migliorate proprietà in frequenza
CN113433360B (zh) * 2020-03-23 2023-12-01 奥特斯(中国)有限公司 测试适配器、测试设备和测试部件承载件的方法
KR102324248B1 (ko) * 2020-06-19 2021-11-12 리노정밀(주) 검사 장치용 블록 조립체
KR102649845B1 (ko) * 2023-11-29 2024-03-21 주식회사 나노시스 반도체 소자 테스터 지그

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0729838U (ja) * 1993-11-08 1995-06-02 日本電子材料株式会社 座屈応力減少機構付垂直動作式プローブカード
JP3575501B2 (ja) * 1995-05-15 2004-10-13 株式会社日本マイクロニクス プローブ装置
JPH09274054A (ja) * 1996-04-08 1997-10-21 Furukawa Electric Co Ltd:The プローバー
JP3505495B2 (ja) 2000-09-13 2004-03-08 日本電産リード株式会社 基板検査用検査治具、該検査治具を備えた基板検査装置および基板検査用検査治具の組立方法
US7248482B2 (en) * 2003-05-16 2007-07-24 Matsushita Electric Industrial Co., Ltd. Module with built-in circuit component and method for producing the same
TWI286606B (en) * 2004-03-16 2007-09-11 Gunsei Kimoto Electric signal connecting device, and probe assembly and prober device using it
JP2005338065A (ja) * 2004-04-26 2005-12-08 Koyo Technos:Kk 検査冶具および検査装置
CN100535676C (zh) * 2005-04-21 2009-09-02 株式会社光阳科技 检查夹具及检查装置
JP3849948B1 (ja) * 2005-11-16 2006-11-22 日本電産リード株式会社 基板検査用治具及び検査用プローブ
JP4448086B2 (ja) * 2005-12-12 2010-04-07 大西電子株式会社 プリント配線板の検査治具

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104634999A (zh) * 2013-11-07 2015-05-20 日本电产理德股份有限公司 检测夹具
CN104634999B (zh) * 2013-11-07 2019-02-22 日本电产理德股份有限公司 检测夹具
CN105044391A (zh) * 2014-04-24 2015-11-11 日本电产理德股份有限公司 电极结构体，检测夹具及电极结构体的制造方法
CN105044391B (zh) * 2014-04-24 2019-10-25 日本电产理德股份有限公司 电极结构体，检测夹具及电极结构体的制造方法
CN106932615A (zh) * 2017-04-28 2017-07-07 日本电产理德机器装置(浙江)有限公司 检查夹具及具备该检查夹具的检查装置
CN106932615B (zh) * 2017-04-28 2024-02-13 尼得科精密检测设备(浙江)有限公司 检查夹具及具备该检查夹具的检查装置
CN112424615A (zh) * 2018-07-13 2021-02-26 日本电产理德股份有限公司 检查治具以及检查装置
CN112424614A (zh) * 2018-07-18 2021-02-26 日本电产理德股份有限公司 探针、检查治具、检查装置以及探针的制造方法
CN113639979A (zh) * 2021-07-26 2021-11-12 苏州佳祺仕信息科技有限公司 一种检测治具及用于检测带孔工件性能的检测装置
CN113639979B (zh) * 2021-07-26 2022-04-26 苏州佳祺仕信息科技有限公司 一种检测治具及用于检测带孔工件性能的检测装置

Also Published As

Publication number Publication date
KR20090013139A (ko) 2009-02-04
KR101011360B1 (ko) 2011-01-28
TWI383163B (enrdf_load_stackoverflow) 2013-01-21
JP2009036532A (ja) 2009-02-19
TW200905221A (en) 2009-02-01

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Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20090204