CN101138082A - 柔性有源矩阵显示器背板及其制造方法 - Google Patents

柔性有源矩阵显示器背板及其制造方法 Download PDF

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CN101138082A
CN101138082A CNA200680007783XA CN200680007783A CN101138082A CN 101138082 A CN101138082 A CN 101138082A CN A200680007783X A CNA200680007783X A CN A200680007783XA CN 200680007783 A CN200680007783 A CN 200680007783A CN 101138082 A CN101138082 A CN 101138082A
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K·R·萨马
C·钱利
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Honeywell International Inc
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Abstract

一种有源矩阵显示器背板(100)的形成方法,包括,退火柔性介电衬底(202),然后在退火的衬底的表面上形成一个或多个薄膜晶体管(TFT)(112)、一个或多个像素电极(114)、以及互连(240)。互连(240)包括彼此电耦合的空间分开的独立的电极。互连电极中的一个电耦合到TFT(112),其它的互连电极电耦合到像素电极(114),从而电连接TFT(112)与像素电极(114)。

Description

柔性有源矩阵显示器背板及其制造方法
技术领域
本发明总体上涉及有源矩阵显示器,尤其涉及直接在柔性衬底上形成薄膜晶体管(TFT)显示器背板的方法。
背景技术
目前,开发军事上和商业上都可以应用的柔性AM(有源矩阵)显示器的重要性日益显著。这至少部分是由于有源矩阵显示技术有可能实现相对坚固、全彩色、小重量、低功率及低成本的柔性显示器。当前,大多数有源矩阵显示器使用刚性的玻璃衬底。很多这种刚性有源矩阵显示器在商业上应用广泛并且具有各种不同的尺寸,这一情况还会继续下去。例如,相对小尺寸(如,~2英寸对角)的显示器已用于某些数字照相机和移动电话。相对大尺寸(例如>~15英寸对角)的有源矩阵显示器已用于许多其它的消费产品,这些产品包括,如个人电脑(PC)和电视机(TV)。
虽然通常刚性有源矩阵显示器是可靠的并且耐用,柔性有源矩阵显示器则具有某些潜在的优点。例如柔性有源矩阵显示器会使许多独特的显示应用成为可能,这归因于它固有的坚固性与在使用、运输和储存中独特的形状因子的一致性和可轧制性。柔性显示器还可以经受卷装进出(roll-to-roll)制造工艺,这会大大减少制造成本。
不幸的是,目前的制造有源矩阵显示器的工艺一般不适合使用柔性塑料衬底的有源矩阵显示器的制造。这至少部分是因为,柔性衬底比通常用来在衬底上形成薄膜晶体管(TFT)的薄膜具有大的多(~20ppm对~3ppm)的CTE(热膨胀系数)。结果,会产生热应力,这会引起制造过程中的柔性衬底发生卷曲和翘曲。大多数情形下,不可能在卷曲和翘曲的衬底上进行各种光学光刻操作,因此,要处理完成这个衬底,既使不是不可能,也相当困难。另外,在各种TFT处理操作过程中柔性衬底会收缩,会产生立体尺寸方面的(dimensional)不稳定,这会使层与层的对准非常困难。
因此,需要一种直接在柔性衬底上制造有源矩阵显示器背板的方法,它不会在TFT处理过程中在衬底中产生明显的热应力,和/或立位尺寸相对稳定。本发明满足这些需要中的一个和多个。
技术方案
本发明提出一种TFT显示器背板,其中的TFT与象素电极直接形成在柔性衬底上。一个实施例中,只是示例性的,提出一种在柔性介电衬底上形成有源矩阵显示器背板的方法,其包括:在柔性介电衬底一表面上形成栅极层;在栅极层上形成栅极介电层;在至少部分栅极介电层上形成非晶硅(a-Si)层;在a-Si层上形成金属层间介电层;选择性的除去a-Si层上的部分金属层间介电层;选择性的除去部分金属层间介电层从而露出a-Si层上的至少源极接触区域和漏极接触区域;在源极接触区域形成源极接触;在漏极接触区域形成漏极接触。
另一示例性的实施例中,提出一种电互连形成在衬底上的薄膜晶体管(TFT)与象素电极的方法,包括:在衬底上形成导电材料层,在导电材料层上形成互连接触与象素电极接触,将TFT电耦合到互连接触,将象素电极电耦合到象素电极接触。
另一示例性的实施例中,提出一种有源矩阵显示器背板,包括:退火的柔性介电衬底、薄膜晶体管(TFT)、象素电极、互连。退火的柔性介电衬底具有至少第一表面和第二表面。TFT形成在退火的柔性介电衬底的第一表面上。象素电极形成在退火的柔性介电衬底第一表面上。互连形成在退火的柔性介电衬底(202)上,包括导体、互连接触、象素电极接触。互连接触和象素电极接触形成在导体上。互连接触电耦合到TFT,象素电极接触电耦合到象素电极。
附图的简要说明
本发明将结合后面的附图进行描述,相同的标记代表相同的元件。其中:
图1是一个示例性的实施例中有源矩阵显示器背板的示意图;
图2是图1中的背板的部分的截面图;
图3-11是图1中的背板的截面图,其表明用来制造背板的各种示例性的方法的步骤;
图12是一个示例性的实施例中使用图11的柔性有源矩阵背板制造的有源矩阵OLED(有机发光二极管)显示器的部分的截面图;
图13是根据本发明的另一实施例,图1中的背板的部分的截面图。
具体实施方式
下面对本发明的详细描述只是示例性的,而不是用来限制本发明或本发明的应用与使用。此外,也不受前面的发明背景部分与下面的对本发明的详细描述部分所提出的任何理论的束缚。根据这一点,这里描述的显示器背板包括与每个显示象素都相关的薄膜晶体管阵列,它用来控制各个象素。然而晶体管也可以用于任何其它的有源矩阵显示器件,如有机发光显示器与电泳显示器可以作为这方面的例子。
图1是一个示例性的实施例中有源矩阵显示器背板100的示意图,它包括多个栅极总线102、多个数据总线104、栅极驱动电路106、数据驱动电路108、多个薄膜晶体管(TFT)112、以及多个象素电极114。栅极总线102与数据总线104中的每一个都分别连接到栅极驱动电路106和数据驱动电路108,并分别从那里接收栅极驱动信号和数据输入信号的供给电压。
每个TFT112都包括栅极端子116、源极端子118、及漏极端子122,它们中的每个都耦合到栅极总线102、数据总线104、以及象素电极114。本实施例中,每个TFT112的栅极端子116都连接到栅极总线102,每个TFT112的源极端子118都连接到数据总线104,每个TFT112的漏极端子122都连接到象素电极114。这样,当栅极驱动电路106通过一个或多个栅极总线102给一个或多个栅极端子116供应栅极选择驱动信号时,相应的TFT112导通。结果,由数据驱动电路108到与导通的TFT112相应的数据总线104的输入信号供给电压供应到相应的象素电极114,从而控制相应的显示象素(未图示)的发光。
图2是部分背板100的截面图,下面结合图示详细的描述其中的一个TFT112和一个象素电极114。如图2所示,TFT112与象素电极114中的每一个都形成在柔性衬底202上。柔性衬底202具有第一表面204和第二表面206,优选的是它由诸如塑料的柔性介电材料构成。在一个特别优选的实施例中,柔性介电材料是聚萘二甲酸乙二醇酯(polyethylene napthalate,PEN),当然,还应理解,它也可以是已知的或以后会研发出来的其它多种柔性介电材料中的任何一种。不管柔性衬底202由哪种特定的柔性介电材料形成,在TFT112或象素电极114形成在它的第一表面204上之前,将柔性衬底202退火。退火的柔性衬底202比没有退火的柔性衬底大小更稳定。结果,先前提到的来自柔性衬底202、TFT112与象素电极114间的热膨胀系数的不同所引起的热应力,大大的减小了。下面会更详细的描述优选的衬底退火工艺。
TFT112与象素电极114,正如上面指出的那样,形成在退火的柔性介电衬底202的第一表面204上。优选的是,这样做之前,在第一204和第二206表面涂覆一介电层208。本实施例中,TFT112包括栅极电极212、栅极介电层214、非晶硅(a-Si)层216、金属层间介电层218、源极接触222、漏极接触224、源极电极226、漏极电极228、钝化层232、以及介电覆盖层234。由导电材料形成的栅极电极212电气上等同于并作为图1所示的栅极端子116。同样,每个源极226和漏极228的电极层分别电气上等同于并作为图1所示的源极118和漏极122的端子。
人们熟知,位于源极222和漏极224接触间的金属层间介电层218的那部分的长度(L)定义了TFT112的沟道长度。此外,α-Si层216作为载流子在源极接触222和漏极接触224间移动的TFT的沟道。源极222和漏极接触224,下面将会详细的进行描述,它们每个优选的是由接触增强层236和阻挡层238形成。接触增强层236通过例如减小阈值电压和增大亚阈值斜率来改善TFT的性能,阻挡层238作为稳定的金属导电层与下面的活性接触增强层236形成欧姆接触,同时对下面的活性接触增强层236起保护作用。
钝化层232与介电覆盖层234形成在TFT112与部分象素电极114上,提供对这些器件的钝化和/或保护作用。更具体的是,本实施例中可以看到,钝化层232形成在TFT112上,介电覆盖层234形成在钝化层232与部分象素电极114上。
如图2所示,本实施例中,象素电极114通过互连240电耦合到漏极电极228。互连240包括导体242、互连接触244、象素电极接触246、以及部分金属层间介电层218。互连导体242,后面会进行详细的描述,其优选的是与栅极电极212由相同的材料同时形成,并形成相同的厚度。此外,后面会进行详细的描述,互连接触244、象素电极接触246,它们都与源极222和漏极224接触由相同的材料同时形成,并形成相同的厚度。
上面从结构方面描述了显示器背板100的一个实施例,下面会说明形成所描述的背板100的特别优选的工艺。参考图3-11。应理解的是,为了清楚和便于阐述,使用类似图2所示的简化的截面图来描述该工艺。此外还要理解的是,虽然为了简便使用了特定顺序的步骤来描述该方法,但,该方法也可以采用与下面的描述不同的顺序或使用不同的步骤来实施。另外,虽然该方法只描述了关于TFT112、象素电极114、及互连240,应理解,在同样的衬底202上可以形成多个TFT112、象素电极114、及互连240。
根据前面的介绍,并先参考图3,可以看到背板100的起始材料是衬底202。如上文所述,衬底202优选的是由柔性介电材料形成,在其最大可处理温度或其附近退火来改善其在后面的处理步骤中的大小的稳定性。本实施例中,衬底202由PEN形成,衬底退火的条件是温度约180度、约1毫托(mTorr)的真空,进行约16小时。应当理解该温度-压力-时间的选取只是示例性的,可以根据如用于衬底202的特殊柔性介电材料而改变。然而,对于PEN衬底的该特殊温度-压力-时间的选取会使后续的工艺步骤中收缩小于25ppm。
进一步处理之前,应注意后续的工艺步骤包括各种膜的淀积以及各种光学光刻工艺。因此,虽然没有叙述,应当理解,在后续的膜淀积工艺中,柔性衬底202的外周(例如离衬底的边缘约0.1”),由模框型设备支撑,从而在膜淀过程中稳固地支撑衬底202。此外,虽然没有叙述,在光学光刻工艺过程中,使衬底202被平面支撑,其可以使用真空吸盘,也可以临时使用表面活性剂将衬底202附着到玻璃衬底(未图示)上,例如在玻璃和衬底202间的一薄层的水。另外,虽然没有叙述,在退火及阻挡层涂覆后虽然衬底202大小相对稳定,在各工艺步骤间,优选的是将衬底202存放在没有水分的环境中,例如纯氮的手套箱(glove box)里。优选的是,通过这种处理来最小化由于吸收水分可能出现的大小的改变。
再一次回到背板形成方法的描述,现在参考图4,可看到在退火工艺之后,以及在任何薄膜处理步骤之前,在退火的柔性介电衬底202的第一204和第二206面上涂覆介电材料208。本实施例中,介电层208是SiNx,淀积厚度约3000。虽然可以使用许多淀积(或形成)工艺中的任何一种来淀积(或形成)介电层208,本实施例中,使用等离子体增强化学气相淀积(PECVD)工艺淀积介电材料208。
一旦退火的柔性介电衬底202涂覆了介电层208,就开始薄膜处理步骤。首先,如图5所示,栅极电极212与互连导体242同时形成在衬底第一表面204上,形成在介电层208上面。优选的是,栅极电极212与互连导电材料层242通过淀积多种导电材料中的任何一种形成合适的厚度,这些导电材料是已知的或以后会研发出来的。本实施例中,栅极电极212与互连导体242通过溅射淀积厚度约1500的NiCr形成,使用诸如反刻(etchback)或剥离光学光刻技术这些传统的光学光刻技术图形化并刻蚀淀积的NiCr,下文对它们会做详细的描述。不管使用的是哪一种特定的光学光刻技术,一旦完成,从衬底202除去光致抗蚀剂层(未图示)。虽然图5中没有图示,应理解的是,作为同一图形化工艺的部分,栅极电极212可以图形化为包括栅极总线102。
继续参考图5,可以看到在栅极电极212与互连导体242形成之后,栅极介电层214与a-硅层216都形成在栅极电极212上。本实施例中,栅极介电层214与a-硅层216都在约160℃温度下使用PECVD工艺淀积,对其进行图形化并蚀刻出合适的几何图形。然而,应理解的是,这只是示例性的,其他的多种工艺中的任何一种都可以用来形成这些层214,216。此外,虽然,介电层214可以包括不同厚度的多种介电层中的任何一种,本实施例中,栅极介电材料是SiNx,淀积厚度约2500。同样,a-硅层216可以淀积到不同的厚度,但是本实施例中,淀积到约1000的厚度。
栅极介电层214与a-硅层216,至少在本实施例中,作为单个淀积工艺的部分顺序淀积。然而,应当理解的是,这只是示例的,代替的是,这些层214,216可以通过两个独立的淀积工艺分别独立淀积。此外,取决于TFT112的特殊的设计,栅极介电层214和/或a-硅层216可以经过图形化和蚀刻定义多种器件几何图形中的任何一种。本实施例中,栅极介电层214与a-硅层216彼此对准,一起形成小岛,小岛中心位于栅极电极212上。
现在看图6,可以看到,一旦形成栅极介电层214与a-硅层216,接着就形成金属层间介电层218。金属层间介电层218可以包括多种介电材料中的任何一种,可以形成(或淀积)到不同的厚度。然而,本实施例中,金属层间介电层218包括约3000厚度的SiNx。此外,金属层间介电层218可以使用多种已知的形成或淀积工艺中的任何一种形成。本实施例中,金属层间介电层218使用结合PECVD与“部分”反刻光学光刻工艺的技术形成。在较详细的描述“部分”反刻光学光刻工艺之前,为了完整,先描述传统的反刻光学光刻工艺与传统的剥离光学光刻工艺。
人们通常熟知,对于传统的反刻光学光刻工艺,将材料层淀积(或形成)在衬底或其它材料层的表面。然后,将一层光致抗蚀剂淀积在淀积的材料层上。然后,使用光学光刻将光致抗蚀剂层图形化,这会除去光致抗蚀剂层选中的部分,露出部分下面的材料层。这样,使用剩下的光致抗蚀剂层作为掩膜,下面的材料层的露出部分由蚀刻去掉。然后除去剩下的光致抗蚀剂层/掩膜。
对于传统的剥离光学光刻工艺,首先将一层光致抗蚀剂淀积在表面上。然后,使用光学光刻将光致抗蚀剂层图形化,这会除去光致抗蚀剂层选中的部分,露出部分的下面的材料层。这样,剩下的光致抗蚀剂层作为后面材料淀积的掩膜。之后,一材料层淀积在光致抗蚀剂层/掩膜上以及下面的表面的露出的部分上。一旦淀积了材料层,光致抗蚀剂层/掩膜以及淀积在光致抗蚀剂层/掩膜上的那部分材料层被化学剥离,剩下表面的露出的部分上的材料层。因此,对于这种光学光刻技术,光致抗蚀剂层/掩膜有时称作剥离掩膜。
再次回到前面的描述,前面提到,使用PECVD和“部分”反刻光学光刻工艺形成金属层间介电层218。用于此处,意味着,在蚀刻金属层间介电层218之后,没有除去光致抗蚀剂层/掩膜(图6未图示)。这样,淀积的金属层间介电层218经蚀刻之后,光致抗蚀剂层/掩膜保留在原处,用作后续的光学光刻工艺的剥离掩膜,下文会对此做详细的描述。任何情形下,如图6所示,金属层间介电层淀积中使用的光致抗蚀剂层图形化为包括四个接触孔-源极接触孔602、漏极接触孔604、互连接触孔606与象素电极接触孔608。现在对此进行描述,源极接触222、漏极接触224、互连接触244、及象素电极接触246中每一个都分别形成在源极接触孔602、漏极接触孔604、互连接触孔606与象素电极接触孔608内。
源极接触222、漏极接触224、互连接触244、及象素电极接触246,与前文所述,每个都包括接触增强层236和阻挡层238。现在参考图7,可以看到,使用例如热蒸发工艺和先前步骤形成的光致抗蚀剂层/掩膜作为剥离掩膜,顺序将接触增强层236和阻挡层238淀积在金属层间介电层218上。本实施例中,接触增强层236和阻挡层238优选分别包括700厚的Yb和NiCr层,也可以使用其它的材料与其它的厚度。任何情形下,这些层236、238淀积(或形成)之后,接着使用许多已知方法中的任何一种除去剥离掩膜。本实施例中,在超声丙酮浴中除去剥离掩膜。
一旦源极接触222、漏极接触224、互连接触244、及象素电极接触246中每一个都形成之后,如图8所示,形成源极226和漏极228电极。要这样做,使用多种已知的或以后会研发出来的材料淀积方法与光学光刻技术中的任何一种,淀积、图形化并蚀刻一层诸如铝的导电层。本实施例中,使用溅射技术淀积铝层,然后使用上述的反刻光学光刻技术对其进行图形化和蚀刻。不管使用哪种特定的技术,应理解的是,淀积的铝层可以有不同的厚度,本实施例中,铝淀积的厚度约4000。如图8所示,在图形化光致抗蚀剂层并蚀刻铝层之后,源极电极226电耦合到源极接触222并在其上延伸,漏极电极228电耦合到漏极接触224和互连接触244,并在它们上面及它们中间延伸。然而,象素电极接触246保持露出。
在源极电极226和漏极电极228形成之后,形成钝化层232。如图9所示,钝化层232形成后,在TFT112与部分互连240上延伸。钝化层232,如同这里描述的每一层前面的层,可以包含多种介电材料中的任何一种,可以具有多个厚度中的任何一个。此外,可以使用多种已知的或以后会研发出来的材料淀积方法和光学光刻技术中的任何一种,形成钝化层232。本实施例中,钝化层232包括SiNx,使用PECVD淀积约3600的厚度。另外,优选的是,使用上述的部分反刻光学光刻技术图形化并蚀刻钝化层232。这样,淀积的钝化层232经蚀刻之后,并不除去光致抗蚀剂层/掩膜,它用作后续的光学光刻工艺的剥离掩膜,下面对此进行描述。
继续参考图9,可以看到,将钝化层淀积时使用的光致抗蚀剂层(未图示)图形化为也包括象素电极接触孔902。这样,象素电极接触246保持露出。结果,参考图10,当随后形成象素电极114时,将象素电极电耦合到象素电极接触246。象素电极114因此通过象素电极接触246、互连导体242、与互连接触244电耦合到TFT漏极电极228。
通过使用如溅射工艺和前面步骤形成的光致抗蚀剂层/掩膜作为剥离掩膜,在象素电极接触246与部分钝化层232上淀积合适的材料层形成象素电极114。象素电极114可以包括多种已知的或以后会研发出来的合适的材料中的任何一种,并可以淀积到多个合适的厚度中的任何一个。本实施例中,象素电极114包括氧化铟锡(ITO),淀积到约1000的厚度。象素淀积114淀积(或形成)之后,在超声丙酮浴中除去剥离掩膜,可以理解的是,可以使用多种已知的或以后会研发出来的合适的方法中的任何一种来剥离。
在象素电极114形成之后,形成介电覆盖层234。要这样做,使用多种已知的或以后会研发出来的材料淀积方法和光学光刻技术中的任何一种,来淀积、图形化、蚀刻一层介电材料。本实施例中,介电材料的淀积使用PECVD技术,使用上述的反刻光学光刻技术对淀积的介电材料层进行图形化与蚀刻。不管具体使用哪种特定的技术,介电层的材料和厚度可以改变,但本实施例中,该材料包括SiNx,淀积的厚度约3600。如图11所示,在图形化光致抗蚀并且蚀刻覆盖层234之后,部分的象素电极114露出。
使用上述的工艺制造的柔性背板100已可以用于附加的显示器的制造。例如,如图12所示,图2中的柔性背板100与有机发光二极管(OLED)结构堆栈1202、阴极层1204、与附加的薄膜密封层1206和1208集成,从而完成具有底发射1210结构的柔性有源矩阵OLED显示器的制造。OLED结构堆栈1202的制造,优选使用熟知的用于制造聚合物OLED器件结构或小分子OLED器件结构的喷墨打印技术或屏蔽真空蒸发技术,形成在有源矩阵背板100上。阴极层1204优选的是低功函数的阴极材料,其优选的是通过多种热蒸发技术中的任一种淀积。薄膜密封层1206和1208的淀积可以使用多种已知的技术中的任何一种,这些技术包括例如CVD、溅射、原子层淀积,并且可以包括阻挡水分和氧侵入的多种合适的阻挡层材料的任何一种,从而增强OLED寿命。应理解的是,图2中的有源矩阵背板100也可以用于制造具有顶发射OLED结构的柔性OLED显示器,以及其它的使用电泳或液晶显示介质的反射、透射柔性显示器。
应理解的是,上述在柔性介电衬底202上形成并电连接TFT112与象素电极114的方法只是示例性的,TFT112与象素电极114的电连接可以不使用互连240。例如,图13所示的另一实施例中,TFT112与象素电极114的电互连通过直接在漏极电极228上形成象素电极接触1302来实现。
根据这里描述的方法制造的柔性背板100能增强大小的稳定性,因此,能充分的消除层与层间可能的不对准并最小化来自衬底与淀积的材料层间的热膨胀系数(CTE)的失配引起的热应力。这里描述的方法还能最小化或除去制造过程中产生的衬底的弯曲与翘曲。
虽然前面的发明详述部分给出了至少一个示例性的实施例,应当理解,有许多的变形存在,也应当理解,示例性的实施例只是实例,在任何方面都没有限制本发明的范围、适用性与配置。前面描述的细节只是为本领域的技术人员实施本发明的示例性实施例提供便利。应理解,不脱离权利要求给出的本发明的范围的条件下,示例性的实施例中描述的元件的功能与布置可以进行各种改变。

Claims (10)

1.一种在柔性介电衬底(202)上形成有源矩阵显示器背板(100)的方法,包括步骤:
在柔性介电衬底(202)一表面上形成栅极层(212);
在栅极层(212)上形成栅极介电层(214);
在至少部分的栅极介电层(214)上形成非晶硅(a-Si)层(216);
在a-Si层(216)上形成金属层间介电层(218);
选择性的除去部分金属层间介电层(218)从而露出a-Si层上的至少源极接触区域和漏极接触区域;
在源极接触区域形成源极接触(222);
在漏极接触区域形成漏极接触(224)。
2.如权利要求1所述的方法,进一步包括:
退火柔性介电衬底(202)。
3.如权利要求1所述的方法,其中,柔性介电衬底(202)包括聚萘二甲酸乙二醇酯(PEN)。
4.如权利要求1所述的方法,进一步包括:
在柔性介电衬底(202)的表面上形成氮化硅(SiNx)介电阻挡层(208)。
5.如权利要求1所述的方法,其中:
栅极层(212)包括镍-铬(NiCr);以及
介电层(214)包括氮化硅(SiNx)。
6.如权利要求1所述的方法,其中,形成金属层间介电层(218)的步骤包括:
通过PECVD工艺淀积厚度约3000的一层SiNx;
在SiNx层上淀积光致抗蚀剂层;
图形化光致抗蚀剂层从而形成掩膜;
蚀刻SiNx金属层间介电层从而选择性除去其中的部分并露出a-Si层(216)上的源极接触区域和漏极接触区域。
7.如权利要求1所述的方法,进一步包括:
在源极(222)和漏极(224)接触上形成一层导电材料;
选择性除去部分的导电材料从而至少使源极(226)与漏极(228)电极彼此绝缘。
8.如权利要求1所述的方法,进一步包括:
在衬底的表面上形成象素电极(114),象素电极(114)电耦合到漏极接触(224)。
9.如权利要求1所述的方法,进一步包括:
在衬底的表面上形成互连导体(242);
在互连导体(242)上形成互连接触(244)和象素电极接触(246);
至少在象素电极接触上形成象素电极(114)。
10.一种有源矩阵显示器(100),包括:
具有至少第一表面(204)和第二表面(206)的退火的柔性介电衬底(202);
形成在退火的柔性介电衬底第一表面(204)上的薄膜晶体管(TFT)(112);
形成在退火的柔性介电衬底第一表面(204)上的象素电极(114);以及
形成在退火的柔性介电衬底(202)上的互连(240),该互连(240)包括具有形成在其上的互连接触(244)和象素电极接触(246)的导体(242),互连接触(244)电耦合到TFT(112),象素接触(246)电耦合到象素电极(114)。
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Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101118362A (zh) * 2002-12-16 2008-02-06 伊英克公司 电光显示器的底板
KR100663624B1 (ko) * 2004-04-29 2007-01-02 엘지.필립스 엘시디 주식회사 액정표시장치 제조방법
KR101058122B1 (ko) * 2004-09-08 2011-08-24 삼성전자주식회사 어레이 기판과, 그의 제조 방법 및 그를 구비한 액정 패널
US7316942B2 (en) * 2005-02-14 2008-01-08 Honeywell International, Inc. Flexible active matrix display backplane and method
TWI321241B (en) * 2005-09-14 2010-03-01 Ind Tech Res Inst Flexible pixel array substrate and method of fabricating the same
KR100647711B1 (ko) * 2005-11-03 2006-11-23 삼성에스디아이 주식회사 평판 디스플레이 장치 및 이의 제조방법
TWI344133B (en) * 2006-02-24 2011-06-21 Prime View Int Co Ltd Thin film transistor array substrate and electronic ink display device
TW200811569A (en) * 2006-08-21 2008-03-01 Prime View Int Co Ltd E-ink display panel
JP5583140B2 (ja) * 2008-12-02 2014-09-03 アリゾナ・ボード・オブ・リージェンツ,フォー・アンド・オン・ビハーフ・オブ・アリゾナ・ステート・ユニバーシティ フレキシブル基板アセンブリを準備する方法およびその方法により準備されたフレキシブル基板アセンブリ
US9721825B2 (en) 2008-12-02 2017-08-01 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
US9991311B2 (en) 2008-12-02 2018-06-05 Arizona Board Of Regents On Behalf Of Arizona State University Dual active layer semiconductor device and method of manufacturing the same
US9601530B2 (en) 2008-12-02 2017-03-21 Arizona Board Of Regents, A Body Corporated Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Dual active layer semiconductor device and method of manufacturing the same
TWI419091B (zh) 2009-02-10 2013-12-11 Ind Tech Res Inst 可轉移的可撓式電子裝置結構及可撓式電子裝置的製造方法
US8178422B2 (en) * 2009-03-31 2012-05-15 Taiwan Semiconductor Manufacturing Company, Ltd. Method of measurement in semiconductor fabrication
US8269212B2 (en) * 2009-04-29 2012-09-18 Honeywell International Inc. OLED display with a common anode and method for forming the same
TW201117262A (en) 2009-05-29 2011-05-16 Univ Arizona Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof
WO2011018110A1 (en) * 2009-08-12 2011-02-17 X-Fab Semiconductor Foundries Ag Method of manufacturing an organic light emitting diode by lift-off
KR101125567B1 (ko) * 2009-12-24 2012-03-22 삼성모바일디스플레이주식회사 고분자 기판 및 그 제조 방법과 상기 고분자 기판을 포함하는 표시 장치 및 그 제조 방법
KR101182441B1 (ko) * 2010-01-13 2012-09-12 삼성디스플레이 주식회사 유기 박막 패턴 형성 방법 및 유기 발광 디스플레이 장치의 제조 방법
WO2012021197A2 (en) * 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof
WO2012021196A2 (en) 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method for manufacturing electronic devices and electronic devices thereof
TWI464788B (zh) * 2011-12-22 2014-12-11 Ind Tech Res Inst 感測元件陣列及其製作方法
US8658444B2 (en) 2012-05-16 2014-02-25 International Business Machines Corporation Semiconductor active matrix on buried insulator
CN103021339B (zh) * 2012-12-31 2015-09-16 昆山工研院新型平板显示技术中心有限公司 像素电路、显示装置及其驱动方法
TWI532162B (zh) 2013-06-25 2016-05-01 友達光電股份有限公司 可撓式顯示面板及其製造方法
TWI688850B (zh) * 2013-08-13 2020-03-21 飛利斯有限公司 具有電子顯示器之物品
WO2015031501A1 (en) 2013-08-27 2015-03-05 Polyera Corporation Attachable device having a flexible electronic component
KR20150034947A (ko) * 2013-09-27 2015-04-06 삼성디스플레이 주식회사 표시 장치의 금속 배선, 박막 트랜지스터 기판 및 박막 트랜지스터 기판의 제조 방법
EP3087559B1 (en) 2013-12-24 2021-05-05 Flexterra, Inc. Support structures for a flexible electronic component
WO2017034644A2 (en) 2015-06-09 2017-03-02 ARIZONA BOARD OF REGENTS a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY Method of providing an electronic device and electronic device thereof
WO2015156891A2 (en) 2014-01-23 2015-10-15 Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
US10381224B2 (en) 2014-01-23 2019-08-13 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an electronic device and electronic device thereof
KR102466741B1 (ko) 2014-05-13 2022-11-15 아리조나 보드 오브 리젠츠 온 비하프 오브 아리조나 스테이트 유니버시티 전자 디바이스를 제공하는 방법
KR102352290B1 (ko) 2014-09-03 2022-01-18 삼성디스플레이 주식회사 플렉서블 표시패널
US10446582B2 (en) 2014-12-22 2019-10-15 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an imaging system and imaging system thereof
US9741742B2 (en) 2014-12-22 2017-08-22 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Deformable electronic device and methods of providing and using deformable electronic device
WO2016138356A1 (en) 2015-02-26 2016-09-01 Polyera Corporation Attachable device having a flexible electronic component

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4479702A (en) * 1982-07-06 1984-10-30 Olin Corporation Method and apparatus for assembling a compact multi-conductor optical fiber communication cable
US20010022387A1 (en) 1991-05-02 2001-09-20 Naoki Sano Pattern forming method for semiconductor manufacturing
JP2900229B2 (ja) * 1994-12-27 1999-06-02 株式会社半導体エネルギー研究所 半導体装置およびその作製方法および電気光学装置
GB9521855D0 (en) 1995-10-25 1996-01-03 Philips Electronics Nv Manufacture of electronic devices comprising thin-film circuitry
JP2776378B2 (ja) * 1996-06-27 1998-07-16 日本電気株式会社 薄膜トランジスタアレイ基板およびその製造方法
JPH10104660A (ja) * 1996-10-03 1998-04-24 Hitachi Ltd 液晶表示装置
US5994174A (en) 1997-09-29 1999-11-30 The Regents Of The University Of California Method of fabrication of display pixels driven by silicon thin film transistors
JP4094179B2 (ja) * 1998-08-21 2008-06-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
US6246070B1 (en) 1998-08-21 2001-06-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device provided with semiconductor circuit made of semiconductor element and method of fabricating the same
EP1243032B1 (en) * 1999-12-21 2019-11-20 Flexenable Limited Inkjet-fabricated integrated circuits
JP2002208592A (ja) 2001-01-09 2002-07-26 Sharp Corp 絶縁膜の形成方法、半導体装置、製造装置
JP2004128421A (ja) 2002-10-07 2004-04-22 Semiconductor Energy Lab Co Ltd レーザ照射方法およびレーザ照射装置、並びに半導体装置の作製方法
US7274413B1 (en) * 2002-12-06 2007-09-25 United States Of America As Represented By The Secretary Of The Navy Flexible video display apparatus and method
TWI290008B (en) * 2002-12-24 2007-11-11 Ritdisplay Corp Active driven organic electroluminescent device
JP4316896B2 (ja) * 2003-01-09 2009-08-19 株式会社 日立ディスプレイズ 表示装置とその製造方法
JP2004296963A (ja) * 2003-03-28 2004-10-21 Semiconductor Energy Lab Co Ltd 半導体装置及び半導体装置の作製方法
JP4108633B2 (ja) * 2003-06-20 2008-06-25 シャープ株式会社 薄膜トランジスタおよびその製造方法ならびに電子デバイス
KR100558985B1 (ko) 2003-06-27 2006-03-10 엘지.필립스 엘시디 주식회사 액정 표시 장치용 어레이 기판의 제조 방법
US7527994B2 (en) * 2004-09-01 2009-05-05 Honeywell International Inc. Amorphous silicon thin-film transistors and methods of making the same
US7427776B2 (en) * 2004-10-07 2008-09-23 Hewlett-Packard Development Company, L.P. Thin-film transistor and methods
US7316942B2 (en) * 2005-02-14 2008-01-08 Honeywell International, Inc. Flexible active matrix display backplane and method

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