CN100489147C - 用于对高温超导体材料真空蒸发的装置和方法 - Google Patents
用于对高温超导体材料真空蒸发的装置和方法 Download PDFInfo
- Publication number
- CN100489147C CN100489147C CNB2003801028517A CN200380102851A CN100489147C CN 100489147 C CN100489147 C CN 100489147C CN B2003801028517 A CNB2003801028517 A CN B2003801028517A CN 200380102851 A CN200380102851 A CN 200380102851A CN 100489147 C CN100489147 C CN 100489147C
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- China
- Prior art keywords
- temperature superconductor
- described device
- evaporation
- evaporating area
- superconductor material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
- C23C14/30—Vacuum evaporation by wave energy or particle radiation by electron bombardment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/221—Ion beam deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/246—Replenishment of source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02024901A EP1422313A1 (de) | 2002-11-05 | 2002-11-05 | Vorrichtung und Verfahren zum Aufdampfen eines Beschichtungsmaterials im Vakuum mit kontinuierlicher Materialnachführung |
EP02024901.7 | 2002-11-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1711368A CN1711368A (zh) | 2005-12-21 |
CN100489147C true CN100489147C (zh) | 2009-05-20 |
Family
ID=32187159
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2003801028517A Expired - Lifetime CN100489147C (zh) | 2002-11-05 | 2003-10-15 | 用于对高温超导体材料真空蒸发的装置和方法 |
Country Status (9)
Country | Link |
---|---|
US (1) | US7727335B2 (de) |
EP (2) | EP1422313A1 (de) |
JP (1) | JP4519653B2 (de) |
KR (1) | KR100996338B1 (de) |
CN (1) | CN100489147C (de) |
AT (1) | ATE321898T1 (de) |
AU (1) | AU2003298085A1 (de) |
DE (1) | DE50302842D1 (de) |
WO (1) | WO2004041985A2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4589698B2 (ja) * | 2004-11-10 | 2010-12-01 | 新日本製鐵株式会社 | 超電導バルク体 |
US7398605B2 (en) | 2005-02-04 | 2008-07-15 | Eastman Kodak Company | Method of feeding particulate material to a heated vaporization surface |
KR100984148B1 (ko) * | 2007-12-21 | 2010-09-28 | 삼성전기주식회사 | 소스량 제어가 가능한 진공증착장치 |
FR2938554B1 (fr) * | 2008-11-19 | 2011-05-06 | Areva Nc | Procede de revetement d'un element de creuset metallique par un melange de verre et de ceramique |
CN101845617A (zh) * | 2010-06-07 | 2010-09-29 | 崔铮 | 直线型金属镀膜蒸发源的连续输送镀膜料装置 |
DE102010038656A1 (de) | 2010-07-29 | 2012-02-02 | THEVA DüNNSCHICHTTECHNIK GMBH | Hochtemperatur-Supraleiter-Bandleiter mit hoher kritischer Stromtragfähigkeit |
CN105586570A (zh) * | 2014-11-17 | 2016-05-18 | 上海和辉光电有限公司 | 辐射源蒸发系统及蒸镀控制方法 |
CN104611672A (zh) * | 2014-11-28 | 2015-05-13 | 中国电子科技集团公司第四十八研究所 | 一种聚焦电子束蒸发源及蒸发镀膜装置 |
DE102015117182A1 (de) * | 2015-10-08 | 2017-04-13 | Von Ardenne Gmbh | Verfahren und Vorrichtung zum Verdampfen von Material |
DE102016121256B4 (de) | 2016-11-07 | 2020-11-26 | Carl Zeiss Vision International Gmbh | Vakuumverdampfungseinrichtung, Tiegelabdeckung mit Nachfülleinrichtung und Vakuumbeschichtungsverfahren |
DE102017103746A1 (de) * | 2017-02-23 | 2018-08-23 | VON ARDENNE Asset GmbH & Co. KG | Elektronenstrahlverdampfer, Beschichtungsvorrichtung und Beschichtungsverfahren |
CN109182758B (zh) * | 2018-10-22 | 2023-06-02 | 天齐锂业(江苏)有限公司 | 一种低品位锂源制备超薄金属锂带的方法及系统 |
CN111663105A (zh) * | 2020-05-26 | 2020-09-15 | 南方科技大学 | 超高真空电子束蒸发器、电子束镀膜装置 |
Citations (1)
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---|---|---|---|---|
CN1251201C (zh) * | 2002-05-31 | 2006-04-12 | Tdk株式会社 | 光学头装置和采用此光学头装置的光学再现设备 |
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US3654109A (en) * | 1968-04-25 | 1972-04-04 | Ibm | Apparatus and method for measuring rate in flow processes |
DE2513813A1 (de) * | 1974-06-19 | 1976-01-02 | Airco Inc | Verfahren zum beschichten eines substrates |
US4381894A (en) * | 1980-11-06 | 1983-05-03 | Inficon Leybold-Heraeus, Inc. | Deposition monitor and control system |
JPS613880A (ja) * | 1984-06-18 | 1986-01-09 | Taiyo Yuden Co Ltd | 多元化合物の反応性蒸着方法 |
JPS61195968A (ja) | 1985-02-26 | 1986-08-30 | Hitachi Cable Ltd | 合金蒸着膜の製造方法 |
JP2711253B2 (ja) | 1987-03-18 | 1998-02-10 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 超伝導膜及びその形成方法 |
JPS63244811A (ja) | 1987-03-31 | 1988-10-12 | 田中貴金属工業株式会社 | 摺動接点装置 |
JP2502344B2 (ja) * | 1987-05-26 | 1996-05-29 | 住友電気工業株式会社 | 複合酸化物超電導体薄膜の作製方法 |
JPH01108363A (ja) * | 1987-10-19 | 1989-04-25 | Ishikawajima Harima Heavy Ind Co Ltd | 蒸着材料の塊状体の製造方法および装置 |
JPH01108364A (ja) * | 1987-10-19 | 1989-04-25 | Ishikawajima Harima Heavy Ind Co Ltd | 蒸発源の蒸着材料供給方法 |
JPH0293062A (ja) * | 1988-09-29 | 1990-04-03 | Toshiba Corp | レーザ光による膜形成装置 |
DE4000690A1 (de) | 1990-01-12 | 1991-07-18 | Philips Patentverwaltung | Verfahren zum herstellen von ultrafeinen partikeln und deren verwendung |
JPH0995775A (ja) * | 1995-10-02 | 1997-04-08 | Chugai Ro Co Ltd | 連続真空蒸着装置のるつぼ機構 |
JP4559543B2 (ja) | 1996-11-01 | 2010-10-06 | テファ デュンシヒトテヒニク ゲーエムベーハー | 薄い酸化物コーティングの製造装置 |
AU5179098A (en) | 1996-11-18 | 1998-06-10 | Micron Technology, Inc. | Method and apparatus for directional deposition of thin films using laser ablation |
JP3771012B2 (ja) | 1997-09-02 | 2006-04-26 | 株式会社フジクラ | 酸化物超電導導体 |
JPH11108364A (ja) | 1997-10-02 | 1999-04-23 | Art Technolgy:Kk | ガス器具等消し忘れ防止装置 |
US5945163A (en) * | 1998-02-19 | 1999-08-31 | First Solar, Llc | Apparatus and method for depositing a material on a substrate |
US6383301B1 (en) * | 1998-08-04 | 2002-05-07 | E. I. Du Pont De Nemours And Company | Treatment of deagglomerated particles with plasma-activated species |
US7232574B1 (en) | 1999-12-15 | 2007-06-19 | Mcneil-Ppc, Inc. | Long chain alcohols provided in edible oils |
NZ519268A (en) | 1999-12-15 | 2004-12-24 | Mcneil Ppc Inc | Cholesterol lowering comestibles comprising policosanol (predominately octasanol) and sterol |
US6468164B2 (en) | 2000-02-16 | 2002-10-22 | Delphi Technologies, Inc. | Constant velocity joint having fixed center and crossed grooves |
JP4701486B2 (ja) | 2000-09-18 | 2011-06-15 | エプソントヨコム株式会社 | 電子ビーム蒸着用電子銃、蒸着材料保持装置、及び蒸着装置 |
JP2002294479A (ja) | 2001-03-28 | 2002-10-09 | Nippon Paint Co Ltd | 自動車補修用脱脂剤、自動車の補修方法及び自動車 |
US20030054105A1 (en) * | 2001-08-14 | 2003-03-20 | Hammond Robert H. | Film growth at low pressure mediated by liquid flux and induced by activated oxygen |
-
2002
- 2002-11-05 EP EP02024901A patent/EP1422313A1/de not_active Withdrawn
-
2003
- 2003-10-15 AU AU2003298085A patent/AU2003298085A1/en not_active Abandoned
- 2003-10-15 JP JP2004548746A patent/JP4519653B2/ja not_active Expired - Lifetime
- 2003-10-15 WO PCT/EP2003/011428 patent/WO2004041985A2/de active IP Right Grant
- 2003-10-15 CN CNB2003801028517A patent/CN100489147C/zh not_active Expired - Lifetime
- 2003-10-15 KR KR1020057007873A patent/KR100996338B1/ko active IP Right Grant
- 2003-10-15 AT AT03795784T patent/ATE321898T1/de not_active IP Right Cessation
- 2003-10-15 US US10/533,776 patent/US7727335B2/en active Active
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Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1251201C (zh) * | 2002-05-31 | 2006-04-12 | Tdk株式会社 | 光学头装置和采用此光学头装置的光学再现设备 |
Also Published As
Publication number | Publication date |
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JP4519653B2 (ja) | 2010-08-04 |
WO2004041985A2 (de) | 2004-05-21 |
EP1558782A2 (de) | 2005-08-03 |
KR20050084652A (ko) | 2005-08-26 |
DE50302842D1 (de) | 2006-05-18 |
WO2004041985B1 (de) | 2004-08-26 |
WO2004041985A3 (de) | 2004-06-17 |
AU2003298085A8 (en) | 2004-06-07 |
CN1711368A (zh) | 2005-12-21 |
EP1422313A1 (de) | 2004-05-26 |
US7727335B2 (en) | 2010-06-01 |
AU2003298085A1 (en) | 2004-06-07 |
KR100996338B1 (ko) | 2010-11-23 |
US20060051495A1 (en) | 2006-03-09 |
JP2006504869A (ja) | 2006-02-09 |
EP1558782B1 (de) | 2006-03-29 |
ATE321898T1 (de) | 2006-04-15 |
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