CN100487863C - 转移晶片的方法 - Google Patents
转移晶片的方法 Download PDFInfo
- Publication number
- CN100487863C CN100487863C CNB2005800251935A CN200580025193A CN100487863C CN 100487863 C CN100487863 C CN 100487863C CN B2005800251935 A CNB2005800251935 A CN B2005800251935A CN 200580025193 A CN200580025193 A CN 200580025193A CN 100487863 C CN100487863 C CN 100487863C
- Authority
- CN
- China
- Prior art keywords
- chip
- layer
- thin layer
- tack coat
- barrier layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 108
- 239000000758 substrate Substances 0.000 claims abstract description 71
- 239000000463 material Substances 0.000 claims abstract description 66
- 239000010410 layer Substances 0.000 claims description 371
- 238000005530 etching Methods 0.000 claims description 81
- 230000004888 barrier function Effects 0.000 claims description 77
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 28
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 25
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 25
- 239000002184 metal Substances 0.000 claims description 18
- 229910052751 metal Inorganic materials 0.000 claims description 18
- 239000000377 silicon dioxide Substances 0.000 claims description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 238000000151 deposition Methods 0.000 claims description 11
- 239000011241 protective layer Substances 0.000 claims description 11
- 150000004767 nitrides Chemical class 0.000 claims description 8
- 238000007781 pre-processing Methods 0.000 claims description 8
- 238000001259 photo etching Methods 0.000 claims description 7
- 235000012239 silicon dioxide Nutrition 0.000 claims description 6
- 238000004140 cleaning Methods 0.000 claims description 4
- 229920000642 polymer Polymers 0.000 claims description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 3
- 238000003672 processing method Methods 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 56
- 239000000126 substance Substances 0.000 description 11
- 230000000694 effects Effects 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 8
- 230000008021 deposition Effects 0.000 description 7
- 238000003475 lamination Methods 0.000 description 7
- 238000005498 polishing Methods 0.000 description 7
- 238000003486 chemical etching Methods 0.000 description 6
- 238000002161 passivation Methods 0.000 description 6
- 239000004411 aluminium Substances 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000010297 mechanical methods and process Methods 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 210000000056 organ Anatomy 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 235000011007 phosphoric acid Nutrition 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000004224 protection Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 230000010148 water-pollination Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68359—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used as a support during manufacture of interconnect decals or build up layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68368—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
Claims (34)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0451085A FR2871291B1 (fr) | 2004-06-02 | 2004-06-02 | Procede de transfert de plaques |
FR0451085 | 2004-06-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1989594A CN1989594A (zh) | 2007-06-27 |
CN100487863C true CN100487863C (zh) | 2009-05-13 |
Family
ID=34946054
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005800251935A Active CN100487863C (zh) | 2004-06-02 | 2005-06-02 | 转移晶片的方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7807482B2 (zh) |
EP (1) | EP1759411B1 (zh) |
JP (1) | JP5095394B2 (zh) |
KR (1) | KR101148050B1 (zh) |
CN (1) | CN100487863C (zh) |
FR (1) | FR2871291B1 (zh) |
IL (1) | IL179641A0 (zh) |
WO (1) | WO2005124826A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2871291B1 (fr) * | 2004-06-02 | 2006-12-08 | Tracit Technologies | Procede de transfert de plaques |
FR2880189B1 (fr) * | 2004-12-24 | 2007-03-30 | Tracit Technologies Sa | Procede de report d'un circuit sur un plan de masse |
KR100785009B1 (ko) * | 2006-03-06 | 2007-12-11 | 삼성전자주식회사 | 수직 자기 헤드 및 그 제조 방법 |
FR2926671B1 (fr) | 2008-01-17 | 2010-04-02 | Soitec Silicon On Insulator | Procede de traitement de defauts lors de collage de plaques |
FR2926748B1 (fr) * | 2008-01-25 | 2010-04-02 | Commissariat Energie Atomique | Objet muni d'un element graphique reporte sur un support et procede de realisation d'un tel objet. |
FR2962598B1 (fr) | 2010-07-06 | 2012-08-17 | Commissariat Energie Atomique | Procede d'implantation d'un materiau piezoelectrique |
EP2685297B1 (en) | 2012-07-13 | 2017-12-06 | Huawei Technologies Co., Ltd. | A process for manufacturing a photonic circuit with active and passive structures |
WO2014020387A1 (en) | 2012-07-31 | 2014-02-06 | Soitec | Methods of forming semiconductor structures including mems devices and integrated circuits on opposing sides of substrates, and related structures and devices |
KR102327141B1 (ko) * | 2014-11-19 | 2021-11-16 | 삼성전자주식회사 | 프리패키지 및 이를 사용한 반도체 패키지의 제조 방법 |
DE102015118991A1 (de) * | 2015-11-05 | 2017-05-11 | Ev Group E. Thallner Gmbh | Verfahren zur Behandlung von Millimeter- und/oder Mikrometer- und/oder Nanometerstrukturen an einer Oberfläche eines Substrats |
US9806025B2 (en) | 2015-12-29 | 2017-10-31 | Globalfoundries Inc. | SOI wafers with buried dielectric layers to prevent Cu diffusion |
TWI756384B (zh) * | 2017-03-16 | 2022-03-01 | 美商康寧公司 | 用於大量轉移微型led的方法及製程 |
JP2019075569A (ja) * | 2018-12-12 | 2019-05-16 | 晶元光電股▲ふん▼有限公司Epistar Corporation | 半導体素子を選択的にトランスファーする方法 |
CN110783254B (zh) * | 2019-11-08 | 2022-10-04 | 京东方科技集团股份有限公司 | 一种芯片转移方法及半导体器件 |
CN111474200B (zh) * | 2020-04-16 | 2023-09-26 | 宸鸿科技(厦门)有限公司 | 制备电子元件显微结构样品的方法 |
Family Cites Families (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5534328A (en) * | 1993-12-02 | 1996-07-09 | E. I. Du Pont De Nemours And Company | Integrated chemical processing apparatus and processes for the preparation thereof |
FR2715502B1 (fr) * | 1994-01-26 | 1996-04-05 | Commissariat Energie Atomique | Structure présentant des cavités et procédé de réalisation d'une telle structure. |
US5651900A (en) * | 1994-03-07 | 1997-07-29 | The Regents Of The University Of California | Microfabricated particle filter |
ATE350765T1 (de) * | 1994-07-26 | 2007-01-15 | Koninkl Philips Electronics Nv | Verfahren zur herstellung einer halbleitervorrichtunng und eine halbleitervorrichtung |
JPH09509792A (ja) * | 1994-12-23 | 1997-09-30 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | 支持ウェーハ上に接着した半導体物質の層中に半導体素子が形成した半導体装置の製造方法 |
JPH08334610A (ja) * | 1995-06-06 | 1996-12-17 | Furukawa Electric Co Ltd:The | 回折格子の製造方法 |
US5641416A (en) * | 1995-10-25 | 1997-06-24 | Micron Display Technology, Inc. | Method for particulate-free energy beam cutting of a wafer of die assemblies |
US5656552A (en) * | 1996-06-24 | 1997-08-12 | Hudak; John James | Method of making a thin conformal high-yielding multi-chip module |
US6027958A (en) * | 1996-07-11 | 2000-02-22 | Kopin Corporation | Transferred flexible integrated circuit |
JPH10223495A (ja) * | 1997-02-04 | 1998-08-21 | Nippon Telegr & Teleph Corp <Ntt> | 柔軟な構造を有する半導体装置とその製造方法 |
US6013534A (en) * | 1997-07-25 | 2000-01-11 | The United States Of America As Represented By The National Security Agency | Method of thinning integrated circuits received in die form |
JP2000349285A (ja) * | 1999-06-04 | 2000-12-15 | Hitachi Ltd | 半導体集積回路装置の製造方法および半導体集積回路装置 |
US6211733B1 (en) | 1999-10-22 | 2001-04-03 | Powerwave Technologies, Inc. | Predistortion compensation for a power amplifier |
JP3455762B2 (ja) * | 1999-11-11 | 2003-10-14 | カシオ計算機株式会社 | 半導体装置およびその製造方法 |
US6214733B1 (en) * | 1999-11-17 | 2001-04-10 | Elo Technologies, Inc. | Process for lift off and handling of thin film materials |
JP4478268B2 (ja) * | 1999-12-28 | 2010-06-09 | セイコーエプソン株式会社 | 薄膜デバイスの製造方法 |
US6902987B1 (en) * | 2000-02-16 | 2005-06-07 | Ziptronix, Inc. | Method for low temperature bonding and bonded structure |
JP2002050749A (ja) * | 2000-07-31 | 2002-02-15 | Canon Inc | 複合部材の分離方法及び装置 |
JP2002057128A (ja) * | 2000-08-15 | 2002-02-22 | Fujitsu Quantum Devices Ltd | 半導体装置及びその製造方法 |
US20020115263A1 (en) * | 2001-02-16 | 2002-08-22 | Worth Thomas Michael | Method and related apparatus of processing a substrate |
FR2823012B1 (fr) * | 2001-04-03 | 2004-05-21 | Commissariat Energie Atomique | Procede de transfert selectif d'au moins un element d'un support initial sur un support final |
FR2823599B1 (fr) * | 2001-04-13 | 2004-12-17 | Commissariat Energie Atomique | Substrat demomtable a tenue mecanique controlee et procede de realisation |
FR2823596B1 (fr) * | 2001-04-13 | 2004-08-20 | Commissariat Energie Atomique | Substrat ou structure demontable et procede de realisation |
GB0110088D0 (en) * | 2001-04-25 | 2001-06-20 | Filtronic Compound Semiconduct | Semiconductor wafer handling method |
FR2828579B1 (fr) * | 2001-08-13 | 2004-01-30 | St Microelectronics Sa | Procede de manipulation d'une plaquette de silicium mince |
US20030064579A1 (en) * | 2001-09-27 | 2003-04-03 | Masafumi Miyakawa | Surface protecting adhesive film for semiconductor wafer and protecting method for semiconductor wafer using said adhesive film |
FR2860842B1 (fr) * | 2003-10-14 | 2007-11-02 | Tracit Technologies | Procede de preparation et d'assemblage de substrats |
FR2871291B1 (fr) * | 2004-06-02 | 2006-12-08 | Tracit Technologies | Procede de transfert de plaques |
FR2880189B1 (fr) * | 2004-12-24 | 2007-03-30 | Tracit Technologies Sa | Procede de report d'un circuit sur un plan de masse |
-
2004
- 2004-06-02 FR FR0451085A patent/FR2871291B1/fr not_active Expired - Lifetime
-
2005
- 2005-06-02 US US11/628,615 patent/US7807482B2/en active Active
- 2005-06-02 EP EP05776391A patent/EP1759411B1/fr active Active
- 2005-06-02 KR KR1020067027678A patent/KR101148050B1/ko active IP Right Grant
- 2005-06-02 JP JP2007514059A patent/JP5095394B2/ja active Active
- 2005-06-02 WO PCT/FR2005/050411 patent/WO2005124826A1/fr active Application Filing
- 2005-06-02 CN CNB2005800251935A patent/CN100487863C/zh active Active
-
2006
- 2006-11-27 IL IL179641A patent/IL179641A0/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN1989594A (zh) | 2007-06-27 |
US7807482B2 (en) | 2010-10-05 |
IL179641A0 (en) | 2008-04-13 |
KR101148050B1 (ko) | 2012-05-25 |
FR2871291B1 (fr) | 2006-12-08 |
JP5095394B2 (ja) | 2012-12-12 |
EP1759411B1 (fr) | 2012-05-30 |
JP2008502129A (ja) | 2008-01-24 |
FR2871291A1 (fr) | 2005-12-09 |
WO2005124826A1 (fr) | 2005-12-29 |
EP1759411A1 (fr) | 2007-03-07 |
US20080254596A1 (en) | 2008-10-16 |
KR20070034535A (ko) | 2007-03-28 |
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Owner name: S.O.I. TEKER ISOLATOR SILICON TECHNOLOGY Free format text: FORMER OWNER: TRACIT TECHNOLOGIES Effective date: 20100728 |
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Effective date of registration: 20100728 Address after: French Buryn Patentee after: S.O.I. Teker Isolator Silicon Technology Address before: French moirans Patentee before: Tracit Technologies |