CN100403446C - 多端口扫描链寄存器装置和方法 - Google Patents

多端口扫描链寄存器装置和方法 Download PDF

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Publication number
CN100403446C
CN100403446C CNB031083013A CN03108301A CN100403446C CN 100403446 C CN100403446 C CN 100403446C CN B031083013 A CNB031083013 A CN B031083013A CN 03108301 A CN03108301 A CN 03108301A CN 100403446 C CN100403446 C CN 100403446C
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CN
China
Prior art keywords
data
registers
sram
scan
scan chains
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CNB031083013A
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English (en)
Chinese (zh)
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CN1447335A (zh
Inventor
F·A·佩尔纳
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication date
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Publication of CN1447335A publication Critical patent/CN1447335A/zh
Application granted granted Critical
Publication of CN100403446C publication Critical patent/CN100403446C/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/10—Aspects relating to interfaces of memory device to external buses
    • G11C2207/107—Serial-parallel conversion of data or prefetch

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CNB031083013A 2002-03-27 2003-03-27 多端口扫描链寄存器装置和方法 Expired - Lifetime CN100403446C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/107939 2002-03-27
US10/107,939 US6848067B2 (en) 2002-03-27 2002-03-27 Multi-port scan chain register apparatus and method

Publications (2)

Publication Number Publication Date
CN1447335A CN1447335A (zh) 2003-10-08
CN100403446C true CN100403446C (zh) 2008-07-16

Family

ID=27804376

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB031083013A Expired - Lifetime CN100403446C (zh) 2002-03-27 2003-03-27 多端口扫描链寄存器装置和方法

Country Status (7)

Country Link
US (1) US6848067B2 (enExample)
EP (1) EP1349171B1 (enExample)
JP (1) JP2003308224A (enExample)
KR (1) KR100944179B1 (enExample)
CN (1) CN100403446C (enExample)
DE (1) DE60302821T2 (enExample)
TW (1) TW200304546A (enExample)

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US9984377B2 (en) * 2003-10-06 2018-05-29 Yellowpages.Com Llc System and method for providing advertisement
US7027323B2 (en) * 2004-04-02 2006-04-11 Hewlett-Packard Development Company, L.P. Storage device having parallel connected memory cells that include magnetoresistive elements
US7362549B2 (en) * 2004-05-19 2008-04-22 Seagate Technology Llc Storage device having first and second magnetic elements that interact magnetically to indicate a storage state
KR100632367B1 (ko) 2004-11-22 2006-10-09 삼성전자주식회사 불휘발성 반도체 메모리 장치의 프로그램 비트 스캔표시회로
US8429319B2 (en) * 2005-09-28 2013-04-23 Hynix Semiconductor Inc. Multi-port memory device with serial input/output interface
US7600168B2 (en) * 2005-12-26 2009-10-06 Prolific Technology Inc. Apparatus with programmable scan chains for multiple chip modules and method for programming the same
CN1996035B (zh) * 2005-12-31 2012-01-25 旺玖科技股份有限公司 用于多芯片组件的具有可规划扫描链的装置
US7388776B1 (en) * 2006-12-22 2008-06-17 Hitachi Global Storage Technologies Netherlands, B.V. Three-dimensional magnetic memory
US8434153B2 (en) 2009-08-24 2013-04-30 Microsoft Corporation Application display on a locked device
CN102043124B (zh) * 2009-10-12 2013-07-17 炬力集成电路设计有限公司 一种具有扫描链的集成电路
US8315081B2 (en) * 2010-03-22 2012-11-20 Qualcomm Incorporated Memory cell that includes multiple non-volatile memories
JP2011216657A (ja) * 2010-03-31 2011-10-27 Unisantis Electronics Japan Ltd 半導体装置
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
US8438433B2 (en) * 2010-09-21 2013-05-07 Qualcomm Incorporated Registers with full scan capability
CN102109978A (zh) * 2011-02-28 2011-06-29 孙瑞琛 一种数据的重排方法及重排装置
KR101929983B1 (ko) 2012-07-18 2018-12-17 삼성전자주식회사 저항성 메모리 셀을 갖는 반도체 메모리 장치 및 그 테스트 방법
US8788897B2 (en) * 2012-09-28 2014-07-22 Texas Instruments Incorporated Path-based crosstalk fault test scanning in built-in self-testing
WO2014108740A1 (en) * 2013-01-09 2014-07-17 Freescale Semiconductor, Inc. Electronic device and method for state retention
JP2014137292A (ja) * 2013-01-17 2014-07-28 Fujitsu Semiconductor Ltd スキャン回路、半導体装置および半導体装置の試験方法
US20150316971A1 (en) * 2014-05-02 2015-11-05 Avalanche Technology, Inc. Method and apparatus to reduce power consumption of mobile and portable devices with non-volatile memories
JP6305823B2 (ja) * 2014-05-12 2018-04-04 株式会社メガチップス スキャンテスト回路
CN104943397B (zh) * 2015-06-25 2016-08-17 珠海艾派克微电子有限公司 成像盒芯片、成像盒以及更换成像盒芯片序列号的方法
CN109901048B (zh) * 2017-12-09 2021-04-27 英业达科技有限公司 以不同扫描链测试差分线路的系统及其方法

Citations (3)

* Cited by examiner, † Cited by third party
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CN1126392A (zh) * 1994-03-24 1996-07-10 Dva公司 可扫描的锁存器及其使用方法
US5867507A (en) * 1995-12-12 1999-02-02 International Business Machines Corporation Testable programmable gate array and associated LSSD/deterministic test methodology
JP2001229688A (ja) * 2000-01-13 2001-08-24 Hewlett Packard Co <Hp> メモリアプリケーション用のハイブリッドデータｉ／ｏ

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JPS62287497A (ja) * 1986-06-06 1987-12-14 Fujitsu Ltd 半導体記憶装置
FR2624631B1 (fr) 1987-12-14 1990-05-04 Centre Nat Rech Scient Systeme multiprocesseur, procede d'echange d'informations mis en oeuvre et composant memoire multiport serie susceptible d'equiper ledit systeme
US5442770A (en) * 1989-01-24 1995-08-15 Nec Electronics, Inc. Triple port cache memory
JPH0682326B2 (ja) 1989-09-29 1994-10-19 三菱電機株式会社 スキャンレジスタおよびそれを用いたテスト回路
US5452259A (en) * 1993-11-15 1995-09-19 Micron Technology Inc. Multiport memory with pipelined serial input
JP2734394B2 (ja) 1995-01-27 1998-03-30 日本電気株式会社 半導体集積回路装置
US5636228A (en) 1996-01-16 1997-06-03 Motorola, Inc. Scan register with decoupled scan routing
US6744728B1 (en) * 1997-09-17 2004-06-01 Sony Corporation & Sony Electronics, Inc. Data pipeline timing optimization technique in a multi-port bridge for a local area network
US5953285A (en) 1997-09-17 1999-09-14 Cypress Semiconductor Corp. Scan path circuitry including an output register having a flow through mode
JP2001243763A (ja) * 2000-02-24 2001-09-07 Nec Microsystems Ltd 半導体記憶装置およびそのバンク間データ転送方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1126392A (zh) * 1994-03-24 1996-07-10 Dva公司 可扫描的锁存器及其使用方法
US5867507A (en) * 1995-12-12 1999-02-02 International Business Machines Corporation Testable programmable gate array and associated LSSD/deterministic test methodology
JP2001229688A (ja) * 2000-01-13 2001-08-24 Hewlett Packard Co <Hp> メモリアプリケーション用のハイブリッドデータｉ／ｏ

Also Published As

Publication number Publication date
KR20030078007A (ko) 2003-10-04
DE60302821D1 (de) 2006-01-26
CN1447335A (zh) 2003-10-08
KR100944179B1 (ko) 2010-02-25
DE60302821T2 (de) 2006-08-10
JP2003308224A (ja) 2003-10-31
US20030188240A1 (en) 2003-10-02
US6848067B2 (en) 2005-01-25
TW200304546A (en) 2003-10-01
EP1349171A1 (en) 2003-10-01
EP1349171B1 (en) 2005-12-21

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Owner name: SAMSUNG ELECTRONICS CO., LTD

Free format text: FORMER OWNER: HEWLETT-PACKARD DEVELOPMENT COMPANY

Effective date: 20070914

C41 Transfer of patent application or patent right or utility model
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Effective date of registration: 20070914

Address after: Gyeonggi Do, South Korea

Applicant after: SAMSUNG ELECTRONICS Co.,Ltd.

Address before: California, USA

Applicant before: Hewlett-Packard Co.

C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20080716