CN100394289C - 液晶显示装置及其制造方法 - Google Patents
液晶显示装置及其制造方法 Download PDFInfo
- Publication number
- CN100394289C CN100394289C CNB2005100067411A CN200510006741A CN100394289C CN 100394289 C CN100394289 C CN 100394289C CN B2005100067411 A CNB2005100067411 A CN B2005100067411A CN 200510006741 A CN200510006741 A CN 200510006741A CN 100394289 C CN100394289 C CN 100394289C
- Authority
- CN
- China
- Prior art keywords
- sweep trace
- electrode
- electrode terminal
- signal wire
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 78
- 238000004519 manufacturing process Methods 0.000 title claims description 41
- 239000010410 layer Substances 0.000 claims abstract description 211
- 238000009413 insulation Methods 0.000 claims abstract description 117
- 238000000034 method Methods 0.000 claims abstract description 102
- 230000008569 process Effects 0.000 claims abstract description 88
- 239000004065 semiconductor Substances 0.000 claims abstract description 59
- 230000003647 oxidation Effects 0.000 claims abstract description 17
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 17
- 238000009826 distribution Methods 0.000 claims description 101
- 239000010408 film Substances 0.000 claims description 90
- 239000011347 resin Substances 0.000 claims description 66
- 229920005989 resin Polymers 0.000 claims description 66
- 239000012212 insulator Substances 0.000 claims description 57
- 239000010409 thin film Substances 0.000 claims description 55
- 229910052751 metal Inorganic materials 0.000 claims description 52
- 239000002184 metal Substances 0.000 claims description 52
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 46
- 229910052710 silicon Inorganic materials 0.000 claims description 46
- 239000010703 silicon Substances 0.000 claims description 46
- 230000005611 electricity Effects 0.000 claims description 31
- 239000002002 slurry Substances 0.000 claims description 31
- 230000015572 biosynthetic process Effects 0.000 claims description 28
- 230000001681 protective effect Effects 0.000 claims description 22
- 239000011248 coating agent Substances 0.000 claims description 16
- 238000000576 coating method Methods 0.000 claims description 16
- 239000012535 impurity Substances 0.000 claims description 12
- 239000010407 anodic oxide Substances 0.000 claims description 11
- 239000011159 matrix material Substances 0.000 claims description 7
- 230000036961 partial effect Effects 0.000 claims description 6
- 238000011049 filling Methods 0.000 claims description 4
- 230000009467 reduction Effects 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims 20
- 229910021417 amorphous silicon Inorganic materials 0.000 claims 14
- 239000004020 conductor Substances 0.000 claims 8
- 206010070834 Sensitisation Diseases 0.000 claims 3
- 230000008313 sensitization Effects 0.000 claims 3
- 238000001465 metallisation Methods 0.000 claims 2
- 238000005516 engineering process Methods 0.000 abstract description 28
- 239000011241 protective layer Substances 0.000 abstract 1
- 239000011521 glass Substances 0.000 description 28
- 238000005530 etching Methods 0.000 description 24
- 238000007687 exposure technique Methods 0.000 description 23
- 239000000463 material Substances 0.000 description 20
- 238000002161 passivation Methods 0.000 description 20
- 239000003990 capacitor Substances 0.000 description 19
- 238000003860 storage Methods 0.000 description 19
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 17
- 239000010936 titanium Substances 0.000 description 17
- 238000012545 processing Methods 0.000 description 16
- 229910004205 SiNX Inorganic materials 0.000 description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 9
- 230000008859 change Effects 0.000 description 9
- 239000001301 oxygen Substances 0.000 description 9
- 229910052760 oxygen Inorganic materials 0.000 description 9
- 238000001259 photo etching Methods 0.000 description 9
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 8
- 210000002858 crystal cell Anatomy 0.000 description 8
- 230000003068 static effect Effects 0.000 description 8
- 229910052715 tantalum Inorganic materials 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 239000004411 aluminium Substances 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 238000004380 ashing Methods 0.000 description 6
- 230000009849 deactivation Effects 0.000 description 6
- 230000004044 response Effects 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 229910016048 MoW Inorganic materials 0.000 description 4
- 229910052804 chromium Inorganic materials 0.000 description 4
- 238000001312 dry etching Methods 0.000 description 4
- 229910052731 fluorine Inorganic materials 0.000 description 4
- 239000011737 fluorine Substances 0.000 description 4
- 239000004615 ingredient Substances 0.000 description 4
- 238000003475 lamination Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- 235000021419 vinegar Nutrition 0.000 description 4
- 239000000052 vinegar Substances 0.000 description 4
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000005357 flat glass Substances 0.000 description 3
- -1 fluorine fluoric acid class Chemical class 0.000 description 3
- 230000014759 maintenance of location Effects 0.000 description 3
- 239000004408 titanium dioxide Substances 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 2
- 229910052906 cristobalite Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- 239000000741 silica gel Substances 0.000 description 2
- 229910002027 silica gel Inorganic materials 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910052682 stishovite Inorganic materials 0.000 description 2
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 2
- 229910052905 tridymite Inorganic materials 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910003070 TaOx Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000002730 additional effect Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000007743 anodising Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 210000004027 cell Anatomy 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000009931 harmful effect Effects 0.000 description 1
- 229960002050 hydrofluoric acid Drugs 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000036647 reaction Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 235000014347 soups Nutrition 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B43—WRITING OR DRAWING IMPLEMENTS; BUREAU ACCESSORIES
- B43K—IMPLEMENTS FOR WRITING OR DRAWING
- B43K8/00—Pens with writing-points other than nibs or balls
- B43K8/02—Pens with writing-points other than nibs or balls with writing-points comprising fibres, felt, or similar porous or capillary material
- B43K8/028—Movable closure or gate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B43—WRITING OR DRAWING IMPLEMENTS; BUREAU ACCESSORIES
- B43K—IMPLEMENTS FOR WRITING OR DRAWING
- B43K23/00—Holders or connectors for writing implements; Means for protecting the writing-points
- B43K23/08—Protecting means, e.g. caps
- B43K23/12—Protecting means, e.g. caps for pens
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B43—WRITING OR DRAWING IMPLEMENTS; BUREAU ACCESSORIES
- B43K—IMPLEMENTS FOR WRITING OR DRAWING
- B43K8/00—Pens with writing-points other than nibs or balls
- B43K8/02—Pens with writing-points other than nibs or balls with writing-points comprising fibres, felt, or similar porous or capillary material
- B43K8/04—Arrangements for feeding ink to writing-points
- B43K8/12—Arrangements for feeding ink to writing-points writing-points or writing-point units being separable from reservoir
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
- H01L29/456—Ohmic electrodes on silicon
- H01L29/458—Ohmic electrodes on silicon for thin film silicon, e.g. source or drain electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78663—Amorphous silicon transistors
- H01L29/78669—Amorphous silicon transistors with inverted-type structure, e.g. with bottom gate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
- G02F1/134363—Electrodes characterised by their geometrical arrangement for applying an electric field parallel to the substrate, i.e. in-plane switching [IPS]
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
- G02F1/136236—Active matrix addressed cells for reducing the number of lithographic steps using a grey or half tone lithographic process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004021288A JP2005215275A (ja) | 2004-01-29 | 2004-01-29 | 液晶表示装置とその製造方法 |
JP021288/2004 | 2004-01-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1648751A CN1648751A (zh) | 2005-08-03 |
CN100394289C true CN100394289C (zh) | 2008-06-11 |
Family
ID=34805607
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100067411A Active CN100394289C (zh) | 2004-01-29 | 2005-01-31 | 液晶显示装置及其制造方法 |
Country Status (5)
Country | Link |
---|---|
US (2) | US7321404B2 (zh) |
JP (1) | JP2005215275A (zh) |
KR (1) | KR100710532B1 (zh) |
CN (1) | CN100394289C (zh) |
TW (1) | TWI306979B (zh) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1879055B (zh) * | 2003-11-14 | 2010-05-26 | 株式会社半导体能源研究所 | 液晶显示器件及其制造方法 |
JP2005215275A (ja) * | 2004-01-29 | 2005-08-11 | Quanta Display Japan Inc | 液晶表示装置とその製造方法 |
TWI319911B (en) * | 2005-08-11 | 2010-01-21 | Liquid crystal display device and manufacturing method thereof | |
JP4702003B2 (ja) * | 2005-11-16 | 2011-06-15 | セイコーエプソン株式会社 | 液晶装置およびプロジェクタ |
WO2007088722A1 (ja) * | 2006-01-31 | 2007-08-09 | Idemitsu Kosan Co., Ltd. | Tft基板及び反射型tft基板並びにそれらの製造方法 |
CN101026931B (zh) * | 2006-02-24 | 2011-10-19 | 佛山市顺德区顺达电脑厂有限公司 | 直角式信号线之制作方法及其电路板 |
US7872720B2 (en) * | 2007-03-01 | 2011-01-18 | Seiko Epson Corporation | Liquid crystal device and projector |
KR101484063B1 (ko) | 2008-08-14 | 2015-01-19 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 및 그의 제조 방법 |
JP5610855B2 (ja) * | 2010-06-04 | 2014-10-22 | 京セラディスプレイ株式会社 | 液晶表示装置および液晶表示装置の製造方法 |
US8558960B2 (en) | 2010-09-13 | 2013-10-15 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
US20120323284A1 (en) * | 2011-06-15 | 2012-12-20 | Smith & Nephew, Inc. | Variable angle locking implant |
CN102629588B (zh) * | 2011-12-13 | 2014-04-16 | 京东方科技集团股份有限公司 | 阵列基板的制造方法 |
CN102751300B (zh) * | 2012-06-18 | 2014-10-15 | 北京京东方光电科技有限公司 | 一种非晶硅平板x射线传感器的制作方法 |
JP6070073B2 (ja) * | 2012-10-31 | 2017-02-01 | 凸版印刷株式会社 | 薄膜トランジスタアレイ |
CN103984169A (zh) * | 2013-02-08 | 2014-08-13 | 群创光电股份有限公司 | 液晶显示装置 |
WO2015045554A1 (ja) * | 2013-09-26 | 2015-04-02 | シャープ株式会社 | 生体情報取得装置および生体情報取得方法 |
CN106575063B (zh) * | 2014-08-07 | 2019-08-27 | 夏普株式会社 | 有源矩阵基板、液晶面板以及有源矩阵基板的制造方法 |
US10866291B2 (en) * | 2014-09-12 | 2020-12-15 | Emory University | Devices and systems for MRI-guided procedures |
KR102269080B1 (ko) | 2015-01-23 | 2021-06-24 | 삼성디스플레이 주식회사 | 액정 표시 장치 및 그 제조 방법 |
KR102601207B1 (ko) | 2016-07-29 | 2023-11-13 | 삼성디스플레이 주식회사 | 표시장치 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1251914A (zh) * | 1998-10-01 | 2000-05-03 | 三星电子株式会社 | 液晶显示器用薄膜晶体管阵列基板及其制造方法 |
CN1255740A (zh) * | 1998-11-26 | 2000-06-07 | 三星电子株式会社 | 薄膜晶体管阵列面板及其制造方法和薄膜的光刻方法 |
CN1317106A (zh) * | 1998-09-04 | 2001-10-10 | 松下电器产业株式会社 | 有源矩阵型液晶显示装置及其制造方法 |
CN1333475A (zh) * | 2000-05-12 | 2002-01-30 | 株式会社日立制作所 | 液晶显示装置及其制造方法 |
TW519763B (en) * | 1999-10-26 | 2003-02-01 | Nec Corp | Active matrix LCD panel |
US6624864B1 (en) * | 1998-04-17 | 2003-09-23 | Kabushiki Kaisha Toshiba | Liquid crystal display device, matrix array substrate, and method for manufacturing matrix array substrate |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6906383B1 (en) * | 1994-07-14 | 2005-06-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacture thereof |
JP3782195B2 (ja) * | 1997-03-10 | 2006-06-07 | 株式会社東芝 | アクティブマトリクス型液晶表示素子及びその製造方法 |
KR100262953B1 (ko) * | 1997-06-11 | 2000-08-01 | 구본준 | 액정 표시 장치 및 그 액정 표시 장치의 제조 방법 |
KR20000039794A (ko) * | 1998-12-16 | 2000-07-05 | 김영환 | 고개구율 및 고투과율 액정표시장치의 제조방법 |
JP2000275663A (ja) * | 1999-03-26 | 2000-10-06 | Hitachi Ltd | 液晶表示装置とその製造方法 |
US6952020B1 (en) * | 1999-07-06 | 2005-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP2001311965A (ja) * | 2000-04-28 | 2001-11-09 | Nec Corp | アクティブマトリクス基板及びその製造方法 |
JP2005215275A (ja) * | 2004-01-29 | 2005-08-11 | Quanta Display Japan Inc | 液晶表示装置とその製造方法 |
-
2004
- 2004-01-29 JP JP2004021288A patent/JP2005215275A/ja active Pending
- 2004-10-14 US US10/963,801 patent/US7321404B2/en active Active
-
2005
- 2005-01-28 KR KR1020050008026A patent/KR100710532B1/ko active IP Right Grant
- 2005-01-28 TW TW094102737A patent/TWI306979B/zh active
- 2005-01-31 CN CNB2005100067411A patent/CN100394289C/zh active Active
-
2007
- 2007-04-23 US US11/785,939 patent/US7894009B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6624864B1 (en) * | 1998-04-17 | 2003-09-23 | Kabushiki Kaisha Toshiba | Liquid crystal display device, matrix array substrate, and method for manufacturing matrix array substrate |
CN1317106A (zh) * | 1998-09-04 | 2001-10-10 | 松下电器产业株式会社 | 有源矩阵型液晶显示装置及其制造方法 |
CN1251914A (zh) * | 1998-10-01 | 2000-05-03 | 三星电子株式会社 | 液晶显示器用薄膜晶体管阵列基板及其制造方法 |
CN1255740A (zh) * | 1998-11-26 | 2000-06-07 | 三星电子株式会社 | 薄膜晶体管阵列面板及其制造方法和薄膜的光刻方法 |
TW519763B (en) * | 1999-10-26 | 2003-02-01 | Nec Corp | Active matrix LCD panel |
CN1333475A (zh) * | 2000-05-12 | 2002-01-30 | 株式会社日立制作所 | 液晶显示装置及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
US7321404B2 (en) | 2008-01-22 |
KR20050077793A (ko) | 2005-08-03 |
CN1648751A (zh) | 2005-08-03 |
TW200525264A (en) | 2005-08-01 |
KR100710532B1 (ko) | 2007-04-23 |
US20080030637A1 (en) | 2008-02-07 |
US7894009B2 (en) | 2011-02-22 |
TWI306979B (en) | 2009-03-01 |
JP2005215275A (ja) | 2005-08-11 |
US20050168666A1 (en) | 2005-08-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100394289C (zh) | 液晶显示装置及其制造方法 | |
CN100353247C (zh) | 液晶显示装置及其制造方法 | |
CN100386669C (zh) | 液晶显示装置及其制造方法 | |
JP2004317685A (ja) | 液晶表示装置とその製造方法 | |
CN1648750A (zh) | 液晶显示装置及其制造方法 | |
CN107678222A (zh) | 显示面板及其制造方法 | |
TWI281999B (en) | LCD device and manufacturing method thereof | |
TW468081B (en) | Liquid crystal display device | |
TWI304145B (zh) | ||
CN100545726C (zh) | 液晶显示装置及其制造方法 | |
TWI300873B (zh) | ||
CN100557490C (zh) | 液晶显示装置及其制造方法 | |
JP2005049667A (ja) | 液晶表示装置とその製造方法 | |
CN100543569C (zh) | 液晶显示装置及其制造方法 | |
JP2000250065A (ja) | 液晶画像表示装置および画像表示装置用半導体装置の製造方法 | |
JP2001356367A (ja) | 液晶画像表示装置及び画像表示装置用半導体装置の製造方法 | |
CN100590500C (zh) | 液晶显示装置及其制造方法 | |
JP3391304B2 (ja) | 液晶画像表示装置と画像表示装置用半導体装置の製造方法 | |
JP3536762B2 (ja) | 液晶画像表示装置と画像表示装置用半導体装置の製造方法 | |
JP3216640B2 (ja) | 液晶画像表示装置と画像表示装置用半導体装置の製造方法 | |
CN100405194C (zh) | 液晶显示装置及其制造方法 | |
CN100416389C (zh) | 液晶显示装置及其制造方法 | |
JP2003208111A (ja) | 有機el表示装置と液晶表示装置及び表示装置用半導体装置 | |
CN105204251B (zh) | 一种显示基板及其制作方法和显示装置 | |
JP4538218B2 (ja) | 液晶表示装置とその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: YOUDA PHOTOELECTRIC CO., LTD. Free format text: FORMER OWNER: GUANGHUI ELECTRONIC CO., LTD. Effective date: 20080215 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20080215 Address after: Hsinchu City, Taiwan, China Applicant after: AU OPTRONICS Corp. Address before: Taoyuan County of Taiwan Province Applicant before: QUANTA DISPLAY INCORPORATION |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240117 Address after: 825 Waterscreek Avenue, Unit 250, Allen, Texas 75013, USA Patentee after: Optoelectronic Science Co.,Ltd. Address before: Hsinchu City, Taiwan, China Patentee before: AU OPTRONICS Corp. |
|
TR01 | Transfer of patent right |