ATE491207T1 - Gleichzeitige lesung von statusregistern - Google Patents

Gleichzeitige lesung von statusregistern

Info

Publication number
ATE491207T1
ATE491207T1 AT07844009T AT07844009T ATE491207T1 AT E491207 T1 ATE491207 T1 AT E491207T1 AT 07844009 T AT07844009 T AT 07844009T AT 07844009 T AT07844009 T AT 07844009T AT E491207 T1 ATE491207 T1 AT E491207T1
Authority
AT
Austria
Prior art keywords
subset
memory device
memory
status information
drive
Prior art date
Application number
AT07844009T
Other languages
English (en)
Inventor
Barry Joe Wolford
James Edward Sullivan
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE491207T1 publication Critical patent/ATE491207T1/de

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F15/00Digital computers in general; Data processing equipment in general
    • G06F15/16Combinations of two or more digital computers each having at least an arithmetic unit, a program unit and a register, e.g. for a simultaneous processing of several programs
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40626Temperature related aspects of refresh operations
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1045Read-write mode select circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/12Group selection circuits, e.g. for memory block selection, chip selection, array selection

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Dram (AREA)
  • Memory System (AREA)
  • Multi Processors (AREA)
  • Communication Control (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
AT07844009T 2006-10-11 2007-10-09 Gleichzeitige lesung von statusregistern ATE491207T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/548,430 US7593279B2 (en) 2006-10-11 2006-10-11 Concurrent status register read
PCT/US2007/080779 WO2008045856A2 (en) 2006-10-11 2007-10-09 Concurrent reading of status registers

Publications (1)

Publication Number Publication Date
ATE491207T1 true ATE491207T1 (de) 2010-12-15

Family

ID=39283566

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07844009T ATE491207T1 (de) 2006-10-11 2007-10-09 Gleichzeitige lesung von statusregistern

Country Status (9)

Country Link
US (1) US7593279B2 (de)
EP (1) EP2076905B1 (de)
JP (3) JP2010507148A (de)
KR (1) KR101125947B1 (de)
CN (1) CN101523502B (de)
AT (1) ATE491207T1 (de)
DE (1) DE602007011092D1 (de)
TW (1) TW200834598A (de)
WO (1) WO2008045856A2 (de)

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US9262326B2 (en) * 2006-08-14 2016-02-16 Qualcomm Incorporated Method and apparatus to enable the cooperative signaling of a shared bus interrupt in a multi-rank memory subsystem
US7796462B2 (en) 2007-02-22 2010-09-14 Mosaid Technologies Incorporated Data flow control in multiple independent port
US7809901B2 (en) * 2007-08-30 2010-10-05 Micron Technology, Inc. Combined parallel/serial status register read
KR100955684B1 (ko) 2008-10-02 2010-05-06 주식회사 하이닉스반도체 플래그신호 생성회로 및 반도체 메모리 장치
US8180500B2 (en) * 2009-07-29 2012-05-15 Nanya Technology Corp. Temperature sensing system and related temperature sensing method
WO2011134051A1 (en) * 2010-04-26 2011-11-03 Mosaid Technologies Incorporated Serially connected memory having subdivided data interface
US9778877B1 (en) * 2011-11-02 2017-10-03 Rambus Inc. High capacity, high performance memory system
CN104636271B (zh) * 2011-12-22 2018-03-30 英特尔公司 访问命令/地址寄存器装置中存储的数据
JP2014149669A (ja) * 2013-01-31 2014-08-21 Toshiba Corp 半導体記憶装置
JP2015069602A (ja) * 2013-09-30 2015-04-13 株式会社東芝 メモリ・システム
US20150213850A1 (en) * 2014-01-24 2015-07-30 Qualcomm Incorporated Serial data transmission for dynamic random access memory (dram) interfaces
US10223311B2 (en) 2015-03-30 2019-03-05 Samsung Electronics Co., Ltd. Semiconductor memory device for sharing inter-memory command and information, memory system including the same and method of operating the memory system
JP6753746B2 (ja) * 2016-09-15 2020-09-09 キオクシア株式会社 半導体記憶装置
US10572344B2 (en) * 2017-04-27 2020-02-25 Texas Instruments Incorporated Accessing error statistics from DRAM memories having integrated error correction
JP6453492B1 (ja) * 2018-01-09 2019-01-16 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置
KR102576766B1 (ko) * 2018-07-13 2023-09-11 에스케이하이닉스 주식회사 반도체장치
US10878881B1 (en) * 2019-11-26 2020-12-29 Nanya Technology Corporation Memory apparatus and refresh method thereof
EP4024396B1 (de) * 2020-09-04 2023-12-20 Changxin Memory Technologies, Inc. Lese- und schreibverfahren für eine speichervorrichtung und speichervorrichtung

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US5216672A (en) 1992-04-24 1993-06-01 Digital Equipment Corporation Parallel diagnostic mode for testing computer memory
US5640521A (en) * 1992-06-17 1997-06-17 Texas Instruments Incorporated Addressable shadow port and protocol with remote I/O, contol and interrupt ports
JP3579461B2 (ja) * 1993-10-15 2004-10-20 株式会社ルネサステクノロジ データ処理システム及びデータ処理装置
WO1998035296A1 (fr) * 1997-02-07 1998-08-13 Mitsubishi Denki Kabushiki Kaisha Controleur de bus et systeme de controle de bus
US20010011318A1 (en) 1997-02-27 2001-08-02 Vishram P. Dalvi Status indicators for flash memory
US6049856A (en) * 1997-05-27 2000-04-11 Unisys Corporation System for simultaneously accessing two portions of a shared memory
US6279084B1 (en) * 1997-10-24 2001-08-21 Compaq Computer Corporation Shadow commands to optimize sequencing of requests in a switch-based multi-processor system
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JP3580702B2 (ja) * 1998-06-03 2004-10-27 シャープ株式会社 不揮発性半導体記憶装置
US5963482A (en) 1998-07-14 1999-10-05 Winbond Electronics Corp. Memory integrated circuit with shared read/write line
KR100330164B1 (ko) * 1999-04-27 2002-03-28 윤종용 무효 블록들을 가지는 복수의 플래시 메모리들을 동시에 프로그램하는 방법
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Also Published As

Publication number Publication date
EP2076905B1 (de) 2010-12-08
JP2013232276A (ja) 2013-11-14
KR101125947B1 (ko) 2012-04-12
US20080089138A1 (en) 2008-04-17
TW200834598A (en) 2008-08-16
CN101523502A (zh) 2009-09-02
JP5475170B2 (ja) 2014-04-16
WO2008045856A3 (en) 2008-07-24
WO2008045856A2 (en) 2008-04-17
DE602007011092D1 (de) 2011-01-20
WO2008045856B1 (en) 2008-10-02
CN101523502B (zh) 2012-11-28
KR20090085056A (ko) 2009-08-06
US7593279B2 (en) 2009-09-22
JP5774739B2 (ja) 2015-09-09
EP2076905A2 (de) 2009-07-08
JP2010507148A (ja) 2010-03-04
JP2014139798A (ja) 2014-07-31

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