ATE398329T1 - Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung - Google Patents

Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung

Info

Publication number
ATE398329T1
ATE398329T1 AT04723432T AT04723432T ATE398329T1 AT E398329 T1 ATE398329 T1 AT E398329T1 AT 04723432 T AT04723432 T AT 04723432T AT 04723432 T AT04723432 T AT 04723432T AT E398329 T1 ATE398329 T1 AT E398329T1
Authority
AT
Austria
Prior art keywords
memory device
addressable memory
device equipped
read amplifier
equipped therewith
Prior art date
Application number
AT04723432T
Other languages
English (en)
Inventor
Robert Schweickert
Geirr Leistad
Original Assignee
Thin Film Electronics Asa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thin Film Electronics Asa filed Critical Thin Film Electronics Asa
Application granted granted Critical
Publication of ATE398329T1 publication Critical patent/ATE398329T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/062Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/06Sense amplifier related aspects
    • G11C2207/063Current sense amplifiers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Amplifiers (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Facsimile Heads (AREA)
  • Character Input (AREA)
  • Static Random-Access Memory (AREA)
  • Read Only Memory (AREA)
AT04723432T 2003-03-26 2004-03-25 Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung ATE398329T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20031364A NO320017B1 (no) 2003-03-26 2003-03-26 Deteksjonsforsterkersystemer og matriseadresserbar minneinnretning med ±n av disse

Publications (1)

Publication Number Publication Date
ATE398329T1 true ATE398329T1 (de) 2008-07-15

Family

ID=19914603

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04723432T ATE398329T1 (de) 2003-03-26 2004-03-25 Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung

Country Status (12)

Country Link
US (1) US7113437B2 (de)
EP (1) EP1606820B1 (de)
JP (1) JP2006521645A (de)
KR (1) KR100687998B1 (de)
CN (1) CN1795509A (de)
AT (1) ATE398329T1 (de)
AU (1) AU2004222869A1 (de)
CA (1) CA2520492A1 (de)
DE (1) DE602004014349D1 (de)
NO (1) NO320017B1 (de)
RU (1) RU2311695C2 (de)
WO (1) WO2004086406A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6922350B2 (en) * 2002-09-27 2005-07-26 Intel Corporation Reducing the effect of write disturbs in polymer memories
NO324029B1 (no) 2004-09-23 2007-07-30 Thin Film Electronics Asa Lesemetode og deteksjonsanordning
US8081715B1 (en) * 2005-01-27 2011-12-20 Marvell International Ltd. Device and method for sampling based on matched filtering
JP4374549B2 (ja) * 2005-12-20 2009-12-02 セイコーエプソン株式会社 強誘電体メモリ装置、電子機器および強誘電体メモリ装置の駆動方法
KR100769796B1 (ko) 2006-05-12 2007-10-25 주식회사 하이닉스반도체 저전압용 롬
US7532528B2 (en) * 2007-06-30 2009-05-12 Intel Corporation Sense amplifier method and arrangement
FR2918523B1 (fr) * 2007-07-06 2011-02-11 Excem Dispositif d'interface pseudo-differentiel avec circuit d'equilibrage
US8605520B2 (en) * 2010-09-22 2013-12-10 Magic Technologies, Inc. Replaceable, precise-tracking reference lines for memory products
US9324405B2 (en) * 2010-11-30 2016-04-26 Radiant Technologies, Inc. CMOS analog memories utilizing ferroelectric capacitors
KR101798992B1 (ko) * 2011-01-10 2017-12-21 삼성전자주식회사 네거티브 커패시턴스 회로를 포함하는 감지 증폭기와, 이를 포함하는 장치들
US8693273B2 (en) 2012-01-06 2014-04-08 Headway Technologies, Inc. Reference averaging for MRAM sense amplifiers
FR3005195B1 (fr) * 2013-04-24 2016-09-02 Soitec Silicon On Insulator Dispositif de memoire avec circuits de reference exploites dynamiquement.
US8976613B2 (en) * 2013-07-23 2015-03-10 Taiwan Semiconductor Manufacturing Company Ltd. Differential current sensing scheme for magnetic random access memory
US9530501B2 (en) 2014-12-31 2016-12-27 Freescale Semiconductor, Inc. Non-volatile static random access memory (NVSRAM) having a shared port
US9460760B2 (en) 2015-01-23 2016-10-04 Globalfoundries Inc. Data-dependent self-biased differential sense amplifier
US9466394B1 (en) 2015-04-09 2016-10-11 Freescale Semiconductor, Inc. Mismatch-compensated sense amplifier for highly scaled technology
US9786346B2 (en) 2015-05-20 2017-10-10 Micron Technology, Inc. Virtual ground sensing circuitry and related devices, systems, and methods for crosspoint ferroelectric memory
US10032505B2 (en) 2015-07-13 2018-07-24 International Business Machines Corporation Dynamic random access memory with pseudo differential sensing
US9552869B1 (en) 2016-01-25 2017-01-24 International Business Machines Corporation Random access memory with pseudo-differential sensing
US9799388B1 (en) 2016-04-28 2017-10-24 Micron Technology, Inc. Charge sharing between memory cell plates using a conductive path
US9715919B1 (en) * 2016-06-21 2017-07-25 Micron Technology, Inc. Array data bit inversion
US9899073B2 (en) 2016-06-27 2018-02-20 Micron Technology, Inc. Multi-level storage in ferroelectric memory
US10290341B2 (en) * 2017-02-24 2019-05-14 Micron Technology, Inc. Self-reference for ferroelectric memory
US10867653B2 (en) * 2018-04-20 2020-12-15 Micron Technology, Inc. Access schemes for protecting stored data in a memory device
US10622050B2 (en) 2018-05-09 2020-04-14 Micron Technology, Inc. Ferroelectric memory plate power reduction
CN111565032B (zh) * 2019-02-13 2023-11-10 上海耕岩智能科技有限公司 信号转换电路及信号读出电路架构

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5218566A (en) 1991-08-15 1993-06-08 National Semiconductor Corporation Dynamic adjusting reference voltage for ferroelectric circuits
US5403486A (en) * 1991-12-31 1995-04-04 Baker Hughes Incorporated Accelerator system in a centrifuge
JPH07235648A (ja) * 1994-02-24 1995-09-05 Hitachi Ltd 半導体記憶装置
JP3610621B2 (ja) * 1994-11-11 2005-01-19 ソニー株式会社 不揮発性半導体メモリ装置
US5572474A (en) * 1995-07-18 1996-11-05 Cypress Semiconductor Corporation Pseudo-differential sense amplifier
US5638322A (en) * 1995-07-19 1997-06-10 Cypress Semiconductor Corp. Apparatus and method for improving common mode noise rejection in pseudo-differential sense amplifiers
US5905672A (en) 1997-03-27 1999-05-18 Micron Technology, Inc. Ferroelectric memory using ferroelectric reference cells
US6317376B1 (en) * 2000-06-20 2001-11-13 Hewlett-Packard Company Reference signal generation for magnetic random access memory devices
NO312698B1 (no) * 2000-07-07 2002-06-17 Thin Film Electronics Asa Fremgangsmåte til å utföre skrive- og leseoperasjoner i en passiv matriseminne og apparat for å utföre fremgangsmåten
NO20004237L (no) * 2000-08-24 2002-02-25 Thin Film Electronics Asa Integrert deteksjonsforsterker
JP3866913B2 (ja) * 2000-11-21 2007-01-10 富士通株式会社 半導体装置
US6522568B1 (en) * 2001-07-24 2003-02-18 Intel Corporation Ferroelectric memory and method for reading the same
US6611448B2 (en) * 2001-07-30 2003-08-26 Intel Corporation Ferroelectric memory and method for reading the same
US6876567B2 (en) * 2001-12-21 2005-04-05 Intel Corporation Ferroelectric memory device and method of reading a ferroelectric memory
US6914839B2 (en) * 2001-12-24 2005-07-05 Intel Corporation Self-timed sneak current cancellation
JP2004062922A (ja) * 2002-07-25 2004-02-26 Renesas Technology Corp 不揮発性半導体記憶装置

Also Published As

Publication number Publication date
NO20031364D0 (no) 2003-03-26
CN1795509A (zh) 2006-06-28
AU2004222869A1 (en) 2004-10-07
WO2004086406A8 (en) 2006-04-20
WO2004086406A1 (en) 2004-10-07
EP1606820A1 (de) 2005-12-21
RU2005131193A (ru) 2006-05-27
KR100687998B1 (ko) 2007-02-27
NO20031364L (no) 2004-09-27
NO320017B1 (no) 2005-10-10
DE602004014349D1 (de) 2008-07-24
JP2006521645A (ja) 2006-09-21
US7113437B2 (en) 2006-09-26
RU2311695C2 (ru) 2007-11-27
US20050105358A1 (en) 2005-05-19
CA2520492A1 (en) 2004-10-07
EP1606820B1 (de) 2008-06-11
KR20050118207A (ko) 2005-12-15

Similar Documents

Publication Publication Date Title
ATE398329T1 (de) Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung
JP6777369B2 (ja) 強誘電体メモリを含み、強誘電体メモリを動作するための装置及び方法
JP6737953B2 (ja) 強誘電体メモリを含む装置および強誘電体メモリにアクセスするための方法
NO20003508L (no) Adressering av minnematrise
US9679645B2 (en) Non-volatile, piezoelectronic memory based on piezoresistive strain produced by piezoelectric remanence
KR101952455B1 (ko) 강유전체 메모리 기록 및 비-파괴적 판독 시스템 및 방법
JP4582764B2 (ja) マルチビット制御機能を有する不揮発性強誘電体メモリ装置
DE60116350D1 (de) Ferro-elektrischer speicher und sein betriebsverfahren
NO20003507D0 (no) FremgangsmÕte til dynamisk lesing/skriving i et ferroelektrisk minne samt kretsløsninger for utførelse av fremgangsmÕten
KR960704321A (ko) 비-소멸성 강유전체 메모리(non-volatile memory)
JP2002093153A5 (de)
ATE525706T1 (de) Datenspeichereinrichtung
KR20060123863A (ko) 불휘발성 강유전체 메모리를 포함하는 rfid 장치
CN109390008B (zh) 用于读取存储器单元的设备和方法
JP4049519B2 (ja) 強誘電体記憶装置
TW200638421A (en) Megnetic random access memory device
WO2002019341A3 (en) Semiconductor memory having dual port cell supporting hidden refresh
JP2000268581A5 (de)
JP4187664B2 (ja) 強誘電体抵抗器不揮発性メモリアレイ
TW200614239A (en) Semiconductor memory device for low power system
DE69615712D1 (de) Zellengegenplatteneinstellung für dram-leseoperation
TW434544B (en) Semiconductor integrated circuit
KR100576483B1 (ko) 불휘발성 강유전체 메모리 장치
TW200514090A (en) Non-volatile memory element

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties