ATE398329T1 - Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung - Google Patents
Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtungInfo
- Publication number
- ATE398329T1 ATE398329T1 AT04723432T AT04723432T ATE398329T1 AT E398329 T1 ATE398329 T1 AT E398329T1 AT 04723432 T AT04723432 T AT 04723432T AT 04723432 T AT04723432 T AT 04723432T AT E398329 T1 ATE398329 T1 AT E398329T1
- Authority
- AT
- Austria
- Prior art keywords
- memory device
- addressable memory
- device equipped
- read amplifier
- equipped therewith
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/06—Sense amplifier related aspects
- G11C2207/063—Current sense amplifiers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
- Radar Systems Or Details Thereof (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Amplifiers (AREA)
- Facsimile Scanning Arrangements (AREA)
- Facsimile Heads (AREA)
- Character Input (AREA)
- Static Random-Access Memory (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20031364A NO320017B1 (no) | 2003-03-26 | 2003-03-26 | Deteksjonsforsterkersystemer og matriseadresserbar minneinnretning med ±n av disse |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE398329T1 true ATE398329T1 (de) | 2008-07-15 |
Family
ID=19914603
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04723432T ATE398329T1 (de) | 2003-03-26 | 2004-03-25 | Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung |
Country Status (12)
Country | Link |
---|---|
US (1) | US7113437B2 (de) |
EP (1) | EP1606820B1 (de) |
JP (1) | JP2006521645A (de) |
KR (1) | KR100687998B1 (de) |
CN (1) | CN1795509A (de) |
AT (1) | ATE398329T1 (de) |
AU (1) | AU2004222869A1 (de) |
CA (1) | CA2520492A1 (de) |
DE (1) | DE602004014349D1 (de) |
NO (1) | NO320017B1 (de) |
RU (1) | RU2311695C2 (de) |
WO (1) | WO2004086406A1 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6922350B2 (en) * | 2002-09-27 | 2005-07-26 | Intel Corporation | Reducing the effect of write disturbs in polymer memories |
NO324029B1 (no) | 2004-09-23 | 2007-07-30 | Thin Film Electronics Asa | Lesemetode og deteksjonsanordning |
US8081715B1 (en) * | 2005-01-27 | 2011-12-20 | Marvell International Ltd. | Device and method for sampling based on matched filtering |
JP4374549B2 (ja) * | 2005-12-20 | 2009-12-02 | セイコーエプソン株式会社 | 強誘電体メモリ装置、電子機器および強誘電体メモリ装置の駆動方法 |
KR100769796B1 (ko) | 2006-05-12 | 2007-10-25 | 주식회사 하이닉스반도체 | 저전압용 롬 |
US7532528B2 (en) * | 2007-06-30 | 2009-05-12 | Intel Corporation | Sense amplifier method and arrangement |
FR2918523B1 (fr) * | 2007-07-06 | 2011-02-11 | Excem | Dispositif d'interface pseudo-differentiel avec circuit d'equilibrage |
US8605520B2 (en) * | 2010-09-22 | 2013-12-10 | Magic Technologies, Inc. | Replaceable, precise-tracking reference lines for memory products |
US9324405B2 (en) * | 2010-11-30 | 2016-04-26 | Radiant Technologies, Inc. | CMOS analog memories utilizing ferroelectric capacitors |
KR101798992B1 (ko) * | 2011-01-10 | 2017-12-21 | 삼성전자주식회사 | 네거티브 커패시턴스 회로를 포함하는 감지 증폭기와, 이를 포함하는 장치들 |
US8693273B2 (en) | 2012-01-06 | 2014-04-08 | Headway Technologies, Inc. | Reference averaging for MRAM sense amplifiers |
FR3005195B1 (fr) * | 2013-04-24 | 2016-09-02 | Soitec Silicon On Insulator | Dispositif de memoire avec circuits de reference exploites dynamiquement. |
US8976613B2 (en) * | 2013-07-23 | 2015-03-10 | Taiwan Semiconductor Manufacturing Company Ltd. | Differential current sensing scheme for magnetic random access memory |
US9530501B2 (en) | 2014-12-31 | 2016-12-27 | Freescale Semiconductor, Inc. | Non-volatile static random access memory (NVSRAM) having a shared port |
US9460760B2 (en) | 2015-01-23 | 2016-10-04 | Globalfoundries Inc. | Data-dependent self-biased differential sense amplifier |
US9466394B1 (en) | 2015-04-09 | 2016-10-11 | Freescale Semiconductor, Inc. | Mismatch-compensated sense amplifier for highly scaled technology |
US9786346B2 (en) | 2015-05-20 | 2017-10-10 | Micron Technology, Inc. | Virtual ground sensing circuitry and related devices, systems, and methods for crosspoint ferroelectric memory |
US10032505B2 (en) | 2015-07-13 | 2018-07-24 | International Business Machines Corporation | Dynamic random access memory with pseudo differential sensing |
US9552869B1 (en) | 2016-01-25 | 2017-01-24 | International Business Machines Corporation | Random access memory with pseudo-differential sensing |
US9799388B1 (en) | 2016-04-28 | 2017-10-24 | Micron Technology, Inc. | Charge sharing between memory cell plates using a conductive path |
US9715919B1 (en) * | 2016-06-21 | 2017-07-25 | Micron Technology, Inc. | Array data bit inversion |
US9899073B2 (en) | 2016-06-27 | 2018-02-20 | Micron Technology, Inc. | Multi-level storage in ferroelectric memory |
US10290341B2 (en) * | 2017-02-24 | 2019-05-14 | Micron Technology, Inc. | Self-reference for ferroelectric memory |
US10867653B2 (en) * | 2018-04-20 | 2020-12-15 | Micron Technology, Inc. | Access schemes for protecting stored data in a memory device |
US10622050B2 (en) | 2018-05-09 | 2020-04-14 | Micron Technology, Inc. | Ferroelectric memory plate power reduction |
CN111565032B (zh) * | 2019-02-13 | 2023-11-10 | 上海耕岩智能科技有限公司 | 信号转换电路及信号读出电路架构 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5218566A (en) | 1991-08-15 | 1993-06-08 | National Semiconductor Corporation | Dynamic adjusting reference voltage for ferroelectric circuits |
US5403486A (en) * | 1991-12-31 | 1995-04-04 | Baker Hughes Incorporated | Accelerator system in a centrifuge |
JPH07235648A (ja) * | 1994-02-24 | 1995-09-05 | Hitachi Ltd | 半導体記憶装置 |
JP3610621B2 (ja) * | 1994-11-11 | 2005-01-19 | ソニー株式会社 | 不揮発性半導体メモリ装置 |
US5572474A (en) * | 1995-07-18 | 1996-11-05 | Cypress Semiconductor Corporation | Pseudo-differential sense amplifier |
US5638322A (en) * | 1995-07-19 | 1997-06-10 | Cypress Semiconductor Corp. | Apparatus and method for improving common mode noise rejection in pseudo-differential sense amplifiers |
US5905672A (en) | 1997-03-27 | 1999-05-18 | Micron Technology, Inc. | Ferroelectric memory using ferroelectric reference cells |
US6317376B1 (en) * | 2000-06-20 | 2001-11-13 | Hewlett-Packard Company | Reference signal generation for magnetic random access memory devices |
NO312698B1 (no) * | 2000-07-07 | 2002-06-17 | Thin Film Electronics Asa | Fremgangsmåte til å utföre skrive- og leseoperasjoner i en passiv matriseminne og apparat for å utföre fremgangsmåten |
NO20004237L (no) * | 2000-08-24 | 2002-02-25 | Thin Film Electronics Asa | Integrert deteksjonsforsterker |
JP3866913B2 (ja) * | 2000-11-21 | 2007-01-10 | 富士通株式会社 | 半導体装置 |
US6522568B1 (en) * | 2001-07-24 | 2003-02-18 | Intel Corporation | Ferroelectric memory and method for reading the same |
US6611448B2 (en) * | 2001-07-30 | 2003-08-26 | Intel Corporation | Ferroelectric memory and method for reading the same |
US6876567B2 (en) * | 2001-12-21 | 2005-04-05 | Intel Corporation | Ferroelectric memory device and method of reading a ferroelectric memory |
US6914839B2 (en) * | 2001-12-24 | 2005-07-05 | Intel Corporation | Self-timed sneak current cancellation |
JP2004062922A (ja) * | 2002-07-25 | 2004-02-26 | Renesas Technology Corp | 不揮発性半導体記憶装置 |
-
2003
- 2003-03-26 NO NO20031364A patent/NO320017B1/no unknown
-
2004
- 2004-03-25 RU RU2005131193/09A patent/RU2311695C2/ru not_active IP Right Cessation
- 2004-03-25 CN CN200480014391.7A patent/CN1795509A/zh active Pending
- 2004-03-25 AU AU2004222869A patent/AU2004222869A1/en not_active Abandoned
- 2004-03-25 EP EP04723432A patent/EP1606820B1/de not_active Expired - Lifetime
- 2004-03-25 US US10/808,513 patent/US7113437B2/en not_active Expired - Fee Related
- 2004-03-25 AT AT04723432T patent/ATE398329T1/de not_active IP Right Cessation
- 2004-03-25 CA CA002520492A patent/CA2520492A1/en not_active Abandoned
- 2004-03-25 DE DE602004014349T patent/DE602004014349D1/de not_active Expired - Fee Related
- 2004-03-25 KR KR1020057017988A patent/KR100687998B1/ko not_active IP Right Cessation
- 2004-03-25 JP JP2006500738A patent/JP2006521645A/ja not_active Ceased
- 2004-03-25 WO PCT/NO2004/000086 patent/WO2004086406A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
NO20031364D0 (no) | 2003-03-26 |
CN1795509A (zh) | 2006-06-28 |
AU2004222869A1 (en) | 2004-10-07 |
WO2004086406A8 (en) | 2006-04-20 |
WO2004086406A1 (en) | 2004-10-07 |
EP1606820A1 (de) | 2005-12-21 |
RU2005131193A (ru) | 2006-05-27 |
KR100687998B1 (ko) | 2007-02-27 |
NO20031364L (no) | 2004-09-27 |
NO320017B1 (no) | 2005-10-10 |
DE602004014349D1 (de) | 2008-07-24 |
JP2006521645A (ja) | 2006-09-21 |
US7113437B2 (en) | 2006-09-26 |
RU2311695C2 (ru) | 2007-11-27 |
US20050105358A1 (en) | 2005-05-19 |
CA2520492A1 (en) | 2004-10-07 |
EP1606820B1 (de) | 2008-06-11 |
KR20050118207A (ko) | 2005-12-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE398329T1 (de) | Leseverstärkersysteme und damit ausgestattete matrixadressierbare speichereinrichtung | |
JP6777369B2 (ja) | 強誘電体メモリを含み、強誘電体メモリを動作するための装置及び方法 | |
JP6737953B2 (ja) | 強誘電体メモリを含む装置および強誘電体メモリにアクセスするための方法 | |
NO20003508L (no) | Adressering av minnematrise | |
US9679645B2 (en) | Non-volatile, piezoelectronic memory based on piezoresistive strain produced by piezoelectric remanence | |
KR101952455B1 (ko) | 강유전체 메모리 기록 및 비-파괴적 판독 시스템 및 방법 | |
JP4582764B2 (ja) | マルチビット制御機能を有する不揮発性強誘電体メモリ装置 | |
DE60116350D1 (de) | Ferro-elektrischer speicher und sein betriebsverfahren | |
NO20003507D0 (no) | FremgangsmÕte til dynamisk lesing/skriving i et ferroelektrisk minne samt kretsløsninger for utførelse av fremgangsmÕten | |
KR960704321A (ko) | 비-소멸성 강유전체 메모리(non-volatile memory) | |
JP2002093153A5 (de) | ||
ATE525706T1 (de) | Datenspeichereinrichtung | |
KR20060123863A (ko) | 불휘발성 강유전체 메모리를 포함하는 rfid 장치 | |
CN109390008B (zh) | 用于读取存储器单元的设备和方法 | |
JP4049519B2 (ja) | 強誘電体記憶装置 | |
TW200638421A (en) | Megnetic random access memory device | |
WO2002019341A3 (en) | Semiconductor memory having dual port cell supporting hidden refresh | |
JP2000268581A5 (de) | ||
JP4187664B2 (ja) | 強誘電体抵抗器不揮発性メモリアレイ | |
TW200614239A (en) | Semiconductor memory device for low power system | |
DE69615712D1 (de) | Zellengegenplatteneinstellung für dram-leseoperation | |
TW434544B (en) | Semiconductor integrated circuit | |
KR100576483B1 (ko) | 불휘발성 강유전체 메모리 장치 | |
TW200514090A (en) | Non-volatile memory element |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |