ATE160652T1 - Verfahren zur herstellung von speicherkondensatoren für dram-zellen - Google Patents

Verfahren zur herstellung von speicherkondensatoren für dram-zellen

Info

Publication number
ATE160652T1
ATE160652T1 AT93912589T AT93912589T ATE160652T1 AT E160652 T1 ATE160652 T1 AT E160652T1 AT 93912589 T AT93912589 T AT 93912589T AT 93912589 T AT93912589 T AT 93912589T AT E160652 T1 ATE160652 T1 AT E160652T1
Authority
AT
Austria
Prior art keywords
dummies
pct
storage
dram cells
storage capacitors
Prior art date
Application number
AT93912589T
Other languages
German (de)
English (en)
Inventor
Wolfgang Roesner
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of ATE160652T1 publication Critical patent/ATE160652T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/01—Manufacture or treatment
    • H10D1/041—Manufacture or treatment of capacitors having no potential barriers
    • H10D1/042—Manufacture or treatment of capacitors having no potential barriers using deposition processes to form electrode extensions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/711—Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H10D1/716—Electrodes having non-planar surfaces, e.g. formed by texturisation having vertical extensions
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/942—Masking
    • Y10S438/947—Subphotolithographic processing

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT93912589T 1992-07-08 1993-06-15 Verfahren zur herstellung von speicherkondensatoren für dram-zellen ATE160652T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4222467A DE4222467C1 (cg-RX-API-DMAC10.html) 1992-07-08 1992-07-08

Publications (1)

Publication Number Publication Date
ATE160652T1 true ATE160652T1 (de) 1997-12-15

Family

ID=6462779

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93912589T ATE160652T1 (de) 1992-07-08 1993-06-15 Verfahren zur herstellung von speicherkondensatoren für dram-zellen

Country Status (9)

Country Link
US (1) US5496757A (cg-RX-API-DMAC10.html)
EP (1) EP0649566B1 (cg-RX-API-DMAC10.html)
JP (1) JP3330605B2 (cg-RX-API-DMAC10.html)
KR (1) KR100309614B1 (cg-RX-API-DMAC10.html)
AT (1) ATE160652T1 (cg-RX-API-DMAC10.html)
DE (2) DE4222467C1 (cg-RX-API-DMAC10.html)
HK (1) HK1002337A1 (cg-RX-API-DMAC10.html)
TW (1) TW358242B (cg-RX-API-DMAC10.html)
WO (1) WO1994001891A1 (cg-RX-API-DMAC10.html)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19640273C1 (de) 1996-09-30 1998-03-12 Siemens Ag Verfahren zur Herstellung barrierenfreier Halbleiterspeicheranordnungen
US6395613B1 (en) * 2000-08-30 2002-05-28 Micron Technology, Inc. Semiconductor processing methods of forming a plurality of capacitors on a substrate, bit line contacts and method of forming bit line contacts
US5998256A (en) 1996-11-01 1999-12-07 Micron Technology, Inc. Semiconductor processing methods of forming devices on a substrate, forming device arrays on a substrate, forming conductive lines on a substrate, and forming capacitor arrays on a substrate, and integrated circuitry
KR100227070B1 (ko) * 1996-11-04 1999-10-15 구본준 커패시터 및 그의 제조방법
US6590250B2 (en) 1997-11-25 2003-07-08 Micron Technology, Inc. DRAM capacitor array and integrated device array of substantially identically shaped devices
JP2000077619A (ja) * 1998-08-27 2000-03-14 Oki Electric Ind Co Ltd 半導体装置及びその製造方法
US6157067A (en) * 1999-01-04 2000-12-05 International Business Machines Corporation Metal oxide semiconductor capacitor utilizing dummy lithographic patterns
KR100338959B1 (ko) * 2000-08-31 2002-06-01 박종섭 반도체 소자의 커패시터 하부전극 제조방법
KR100502410B1 (ko) * 2002-07-08 2005-07-19 삼성전자주식회사 디램 셀들
US7468323B2 (en) * 2004-02-27 2008-12-23 Micron Technology, Inc. Method of forming high aspect ratio structures

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62286270A (ja) * 1986-06-05 1987-12-12 Sony Corp 半導体メモリ装置
IT1245495B (it) * 1990-01-26 1994-09-27 Mitsubishi Electric Corp Memoria ad accesso casuale dinamica avente un condensatore del tipo impilato e procedimento di fabbricazione di essa
DD299990A5 (de) * 1990-02-23 1992-05-14 Dresden Forschzentr Mikroelek Ein-Transistor-Speicherzellenanordnung und Verfahren zu deren Herstellung
JP2519569B2 (ja) * 1990-04-27 1996-07-31 三菱電機株式会社 半導体記憶装置およびその製造方法
JPH0629483A (ja) * 1991-04-29 1994-02-04 Micron Technol Inc スタック型iセルキャパシタおよびその製造方法

Also Published As

Publication number Publication date
KR950702748A (ko) 1995-07-29
HK1002337A1 (en) 1998-08-14
JPH07509346A (ja) 1995-10-12
EP0649566A1 (de) 1995-04-26
WO1994001891A1 (de) 1994-01-20
JP3330605B2 (ja) 2002-09-30
KR100309614B1 (ko) 2002-08-27
DE4222467C1 (cg-RX-API-DMAC10.html) 1993-06-24
US5496757A (en) 1996-03-05
DE59307748D1 (de) 1998-01-08
TW358242B (en) 1999-05-11
EP0649566B1 (de) 1997-11-26

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Legal Events

Date Code Title Description
REN Ceased due to non-payment of the annual fee