ZA200303174B - Method of manufacturing an integrated circuit carrier. - Google Patents
Method of manufacturing an integrated circuit carrier. Download PDFInfo
- Publication number
- ZA200303174B ZA200303174B ZA200303174A ZA200303174A ZA200303174B ZA 200303174 B ZA200303174 B ZA 200303174B ZA 200303174 A ZA200303174 A ZA 200303174A ZA 200303174 A ZA200303174 A ZA 200303174A ZA 200303174 B ZA200303174 B ZA 200303174B
- Authority
- ZA
- South Africa
- Prior art keywords
- substrate
- integrated circuit
- carrier
- island
- receiving zone
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims description 33
- 238000000034 method Methods 0.000 claims description 23
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 208000002740 Muscle Rigidity Diseases 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 2
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 abstract description 26
- 229910000679 solder Inorganic materials 0.000 description 27
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 11
- 239000007787 solid Substances 0.000 description 7
- 238000003491 array Methods 0.000 description 4
- 239000000969 carrier Substances 0.000 description 4
- 230000000930 thermomechanical effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 1
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 1
- LVROLHVSYNLFBE-UHFFFAOYSA-N 2,3,6-trichlorobiphenyl Chemical compound ClC1=CC=C(Cl)C(C=2C=CC=CC=2)=C1Cl LVROLHVSYNLFBE-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 229920003192 poly(bis maleimide) Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/147—Semiconductor insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/4807—Ceramic parts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5387—Flexible insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/562—Protection against mechanical damage
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
- Y10T29/49149—Assembling terminal to base by metal fusion bonding
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49204—Contact or terminal manufacturing
- Y10T29/49208—Contact or terminal manufacturing by assembling plural parts
- Y10T29/49222—Contact or terminal manufacturing by assembling plural parts forming array of contacts or terminals
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49789—Obtaining plural product pieces from unitary workpiece
- Y10T29/4979—Breaking through weakened portion
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Wire Bonding (AREA)
- Thin Film Transistor (AREA)
- Die Bonding (AREA)
- Packaging Frangible Articles (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/693,484 US6775906B1 (en) | 2000-10-20 | 2000-10-20 | Method of manufacturing an integrated circuit carrier |
Publications (1)
Publication Number | Publication Date |
---|---|
ZA200303174B true ZA200303174B (en) | 2003-11-06 |
Family
ID=24784853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ZA200303174A ZA200303174B (en) | 2000-10-20 | 2003-04-24 | Method of manufacturing an integrated circuit carrier. |
Country Status (11)
Country | Link |
---|---|
US (10) | US6775906B1 (ja) |
EP (1) | EP1410701B1 (ja) |
JP (2) | JP2004511920A (ja) |
KR (1) | KR100619583B1 (ja) |
CN (1) | CN1235452C (ja) |
AT (1) | ATE410042T1 (ja) |
AU (2) | AU1363702A (ja) |
DE (1) | DE60136014D1 (ja) |
IL (2) | IL155460A0 (ja) |
WO (1) | WO2002034019A1 (ja) |
ZA (1) | ZA200303174B (ja) |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7221043B1 (en) * | 2000-10-20 | 2007-05-22 | Silverbrook Research Pty Ltd | Integrated circuit carrier with recesses |
US6775906B1 (en) * | 2000-10-20 | 2004-08-17 | Silverbrook Research Pty Ltd | Method of manufacturing an integrated circuit carrier |
US6890185B1 (en) * | 2003-11-03 | 2005-05-10 | Kulicke & Soffa Interconnect, Inc. | Multipath interconnect with meandering contact cantilevers |
JP2007053248A (ja) * | 2005-08-18 | 2007-03-01 | Tdk Corp | フレキシブル基板、実装構造、表示ユニット、及び携帯用電子機器 |
US8389862B2 (en) | 2008-10-07 | 2013-03-05 | Mc10, Inc. | Extremely stretchable electronics |
US8097926B2 (en) | 2008-10-07 | 2012-01-17 | Mc10, Inc. | Systems, methods, and devices having stretchable integrated circuitry for sensing and delivering therapy |
EP2349440B1 (en) | 2008-10-07 | 2019-08-21 | Mc10, Inc. | Catheter balloon having stretchable integrated circuitry and sensor array |
US9123614B2 (en) | 2008-10-07 | 2015-09-01 | Mc10, Inc. | Methods and applications of non-planar imaging arrays |
JP5689066B2 (ja) * | 2008-11-12 | 2015-03-25 | エムシー10 インコーポレイテッドMc10,Inc. | 高度に伸縮可能な電子部品 |
EP2902294B1 (en) * | 2008-11-12 | 2020-03-04 | Mc10, Inc. | Extremely stretchable electronics |
CN101909413A (zh) * | 2009-06-03 | 2010-12-08 | 鸿富锦精密工业(深圳)有限公司 | 金属网孔板、盖板制造方法及电子设备 |
US8837159B1 (en) | 2009-10-28 | 2014-09-16 | Amazon Technologies, Inc. | Low-profile circuit board assembly |
US8471387B2 (en) * | 2010-05-12 | 2013-06-25 | Monolithe Semiconductor Inc. | Extendable network structure |
US8531014B2 (en) * | 2010-09-27 | 2013-09-10 | Infineon Technologies Ag | Method and system for minimizing carrier stress of a semiconductor device |
US8649820B2 (en) | 2011-11-07 | 2014-02-11 | Blackberry Limited | Universal integrated circuit card apparatus and related methods |
US8936199B2 (en) | 2012-04-13 | 2015-01-20 | Blackberry Limited | UICC apparatus and related methods |
USD703208S1 (en) | 2012-04-13 | 2014-04-22 | Blackberry Limited | UICC apparatus |
USD701864S1 (en) * | 2012-04-23 | 2014-04-01 | Blackberry Limited | UICC apparatus |
US9226402B2 (en) | 2012-06-11 | 2015-12-29 | Mc10, Inc. | Strain isolation structures for stretchable electronics |
KR20150031324A (ko) | 2012-07-05 | 2015-03-23 | 엠씨10, 인크 | 유동 감지를 포함하는 카테터 장치 |
US9295842B2 (en) | 2012-07-05 | 2016-03-29 | Mc10, Inc. | Catheter or guidewire device including flow sensing and use thereof |
US9171794B2 (en) | 2012-10-09 | 2015-10-27 | Mc10, Inc. | Embedding thin chips in polymer |
US9082025B2 (en) | 2012-10-09 | 2015-07-14 | Mc10, Inc. | Conformal electronics integrated with apparel |
US9706647B2 (en) | 2013-05-14 | 2017-07-11 | Mc10, Inc. | Conformal electronics including nested serpentine interconnects |
KR20160040670A (ko) | 2013-08-05 | 2016-04-14 | 엠씨10, 인크 | 곡면부착형 전자기기를 포함하는 유연한 온도 센서 |
JP2016532468A (ja) | 2013-10-07 | 2016-10-20 | エムシー10 インコーポレイテッドMc10,Inc. | 検知および分析のためのコンフォーマルセンサシステム |
CA2930740A1 (en) | 2013-11-22 | 2015-05-28 | Mc10, Inc. | Conformal sensor systems for sensing and analysis of cardiac activity |
EP3092661A4 (en) | 2014-01-06 | 2017-09-27 | Mc10, Inc. | Encapsulated conformal electronic systems and devices, and methods of making and using the same |
CA2940539C (en) | 2014-03-04 | 2022-10-04 | Mc10, Inc. | Multi-part flexible encapsulation housing for electronic devices |
US9402312B2 (en) | 2014-05-12 | 2016-07-26 | Invensas Corporation | Circuit assemblies with multiple interposer substrates, and methods of fabrication |
US9899330B2 (en) | 2014-10-03 | 2018-02-20 | Mc10, Inc. | Flexible electronic circuits with embedded integrated circuit die |
US10297572B2 (en) | 2014-10-06 | 2019-05-21 | Mc10, Inc. | Discrete flexible interconnects for modules of integrated circuits |
USD781270S1 (en) | 2014-10-15 | 2017-03-14 | Mc10, Inc. | Electronic device having antenna |
WO2016134306A1 (en) | 2015-02-20 | 2016-08-25 | Mc10, Inc. | Automated detection and configuration of wearable devices based on on-body status, location, and/or orientation |
US10398343B2 (en) | 2015-03-02 | 2019-09-03 | Mc10, Inc. | Perspiration sensor |
US9741620B2 (en) | 2015-06-24 | 2017-08-22 | Invensas Corporation | Structures and methods for reliable packages |
WO2017015000A1 (en) | 2015-07-17 | 2017-01-26 | Mc10, Inc. | Conductive stiffener, method of making a conductive stiffener, and conductive adhesive and encapsulation layers |
WO2017031129A1 (en) | 2015-08-19 | 2017-02-23 | Mc10, Inc. | Wearable heat flux devices and methods of use |
WO2017030851A2 (en) | 2015-08-20 | 2017-02-23 | Oletquin Management Llc | Fabric with embedded electrical components |
CN112822840A (zh) | 2015-08-20 | 2021-05-18 | 苹果公司 | 具有电子部件阵列的基于织物的物品 |
WO2017059215A1 (en) | 2015-10-01 | 2017-04-06 | Mc10, Inc. | Method and system for interacting with a virtual environment |
EP3359031A4 (en) | 2015-10-05 | 2019-05-22 | Mc10, Inc. | METHOD AND SYSTEM FOR NEUROMODULATION AND STIMULATION |
CN115175014A (zh) | 2016-02-22 | 2022-10-11 | 美谛达解决方案公司 | 贴身传感器系统 |
EP3420733A4 (en) | 2016-02-22 | 2019-06-26 | Mc10, Inc. | SYSTEM, DEVICE AND METHOD FOR ACQUIRING ON THE BODY OF SENSOR AND CONCENTRATOR NODE COUPLED WITH SENSOR INFORMATION |
WO2017184705A1 (en) | 2016-04-19 | 2017-10-26 | Mc10, Inc. | Method and system for measuring perspiration |
US10447347B2 (en) | 2016-08-12 | 2019-10-15 | Mc10, Inc. | Wireless charger and high speed data off-loader |
US10799403B2 (en) | 2017-12-28 | 2020-10-13 | Stryker Corporation | Patient transport apparatus with controlled auxiliary wheel deployment |
US10779403B2 (en) | 2018-09-20 | 2020-09-15 | Apple Inc. | Shorting pattern between pads of a camera module |
Family Cites Families (57)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3723176A (en) * | 1969-06-19 | 1973-03-27 | American Lava Corp | Alumina palladium composite |
US3670409A (en) * | 1970-11-19 | 1972-06-20 | Gte Automatic Electric Lab Inc | Planar receptacle |
US4426773A (en) * | 1981-05-15 | 1984-01-24 | General Electric Ceramics, Inc. | Array of electronic packaging substrates |
JPH0654798B2 (ja) | 1985-03-11 | 1994-07-20 | 沖電気工業株式会社 | 半導体集積回路装置の製造方法 |
US4802277A (en) * | 1985-04-12 | 1989-02-07 | Hughes Aircraft Company | Method of making a chip carrier slotted array |
JPS6169150A (ja) | 1985-09-06 | 1986-04-09 | Nec Corp | 半導体集積回路装置 |
US5086337A (en) * | 1987-01-19 | 1992-02-04 | Hitachi, Ltd. | Connecting structure of electronic part and electronic device using the structure |
JP2533511B2 (ja) * | 1987-01-19 | 1996-09-11 | 株式会社日立製作所 | 電子部品の接続構造とその製造方法 |
JPH01144652A (ja) | 1987-11-30 | 1989-06-06 | Nec Corp | 集積回路 |
JPH01258458A (ja) * | 1988-04-08 | 1989-10-16 | Nec Corp | ウェーハ集積型集積回路 |
US4967260A (en) * | 1988-05-04 | 1990-10-30 | International Electronic Research Corp. | Hermetic microminiature packages |
US4989063A (en) * | 1988-12-09 | 1991-01-29 | The United States Of America As Represented By The Secretary Of The Air Force | Hybrid wafer scale microcircuit integration |
US5045921A (en) * | 1989-12-26 | 1991-09-03 | Motorola, Inc. | Pad array carrier IC device using flexible tape |
US5148265A (en) * | 1990-09-24 | 1992-09-15 | Ist Associates, Inc. | Semiconductor chip assemblies with fan-in leads |
EP0482247A1 (en) | 1990-10-26 | 1992-04-29 | International Business Machines Corporation | Method for producing an integrated circuit structure with a dense multilayer metallization pattern |
US5379191A (en) * | 1991-02-26 | 1995-01-03 | Microelectronics And Computer Technology Corporation | Compact adapter package providing peripheral to area translation for an integrated circuit chip |
US5173055A (en) * | 1991-08-08 | 1992-12-22 | Amp Incorporated | Area array connector |
US6568073B1 (en) * | 1991-11-29 | 2003-05-27 | Hitachi Chemical Company, Ltd. | Process for the fabrication of wiring board for electrical tests |
JPH0685010A (ja) * | 1992-09-02 | 1994-03-25 | Toshiba Corp | マルチチップモジュール |
DE4342767A1 (de) * | 1993-12-15 | 1995-06-22 | Ant Nachrichtentech | Verfahren zur Herstellung einer quaderförmigen Vertiefung zur Aufnahme eines Bauelementes in einer Trägerplatte |
US5802699A (en) * | 1994-06-07 | 1998-09-08 | Tessera, Inc. | Methods of assembling microelectronic assembly with socket for engaging bump leads |
US5632631A (en) * | 1994-06-07 | 1997-05-27 | Tessera, Inc. | Microelectronic contacts with asperities and methods of making same |
US6361959B1 (en) * | 1994-07-07 | 2002-03-26 | Tessera, Inc. | Microelectronic unit forming methods and materials |
US5983492A (en) * | 1996-11-27 | 1999-11-16 | Tessera, Inc. | Low profile socket for microelectronic components and method for making the same |
JP3294740B2 (ja) | 1995-07-31 | 2002-06-24 | 富士通株式会社 | 半導体装置 |
US5810609A (en) * | 1995-08-28 | 1998-09-22 | Tessera, Inc. | Socket for engaging bump leads on a microelectronic device and methods therefor |
DE19534590A1 (de) | 1995-09-11 | 1997-03-13 | Laser & Med Tech Gmbh | Scanning Ablation von keramischen Werkstoffen, Kunststoffen und biologischen Hydroxylapatitmaterialien, insbesondere Zahnhartsubstanz |
EP0802569B1 (en) | 1996-04-15 | 2003-09-24 | STMicroelectronics S.r.l. | FLASH-EPROM integrated with EEPROM |
WO1997044859A1 (en) * | 1996-05-24 | 1997-11-27 | Tessera, Inc. | Connectors for microelectronic elements |
JP2755252B2 (ja) * | 1996-05-30 | 1998-05-20 | 日本電気株式会社 | 半導体装置用パッケージ及び半導体装置 |
US5938452A (en) * | 1996-12-23 | 1999-08-17 | General Electric Company | Flexible interface structures for electronic devices |
US6064576A (en) * | 1997-01-02 | 2000-05-16 | Texas Instruments Incorporated | Interposer having a cantilevered ball connection and being electrically connected to a printed circuit board |
US5796050A (en) | 1997-02-05 | 1998-08-18 | International Business Machines Corporation | Flexible board having adhesive in surface channels |
US6114763A (en) * | 1997-05-30 | 2000-09-05 | Tessera, Inc. | Semiconductor package with translator for connection to an external substrate |
US6313402B1 (en) * | 1997-10-29 | 2001-11-06 | Packard Hughes Interconnect Company | Stress relief bend useful in an integrated circuit redistribution patch |
JPH11135675A (ja) * | 1997-10-30 | 1999-05-21 | Kawasaki Steel Corp | 半導体装置及びその製造方法 |
DE19754874A1 (de) * | 1997-12-10 | 1999-06-24 | Siemens Ag | Verfahren zur Umformung eines Substrats mit Randkontakten in ein Ball Grid Array, nach diesem Verfahren hergestelltes Ball Grid Array und flexible Verdrahtung zur Umformung eines Substrats mit Randkontakten in ein Ball Grid Array |
JP3398319B2 (ja) * | 1997-12-16 | 2003-04-21 | 新光電気工業株式会社 | 半導体装置及びその製造方法 |
US5973394A (en) * | 1998-01-23 | 1999-10-26 | Kinetrix, Inc. | Small contactor for test probes, chip packaging and the like |
JPH11284029A (ja) | 1998-03-27 | 1999-10-15 | Denso Corp | 電子部品の実装構造 |
JP3575324B2 (ja) | 1998-03-31 | 2004-10-13 | セイコーエプソン株式会社 | 半導体装置、半導体装置の製造方法及び半導体装置の実装方法 |
JP2002515651A (ja) | 1998-05-13 | 2002-05-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 半導体装置および半導体装置の製造方法 |
CN100419978C (zh) * | 1998-06-12 | 2008-09-17 | 株式会社瑞萨科技 | 半导体装置及其制造方法 |
JP2000012732A (ja) | 1998-06-24 | 2000-01-14 | Rohm Co Ltd | Bga型半導体装置の構造 |
US6160715A (en) * | 1998-09-08 | 2000-12-12 | Lucent Technologies Inc. | Translator for recessed flip-chip package |
US6341071B1 (en) | 1999-03-19 | 2002-01-22 | International Business Machines Corporation | Stress relieved ball grid array package |
US6396143B1 (en) * | 1999-04-30 | 2002-05-28 | Mitsubishi Gas Chemical Company, Inc. | Ball grid array type printed wiring board having exellent heat diffusibility and printed wiring board |
US6078505A (en) | 1999-05-14 | 2000-06-20 | Triquint Semiconductor, Inc. | Circuit board assembly method |
US6365967B1 (en) * | 1999-05-25 | 2002-04-02 | Micron Technology, Inc. | Interconnect structure |
JP3494593B2 (ja) * | 1999-06-29 | 2004-02-09 | シャープ株式会社 | 半導体装置及び半導体装置用基板 |
US6524115B1 (en) * | 1999-08-20 | 2003-02-25 | 3M Innovative Properties Company | Compliant interconnect assembly |
JP2001094228A (ja) | 1999-09-22 | 2001-04-06 | Seiko Epson Corp | 半導体装置の実装構造 |
US6393143B1 (en) * | 1999-12-08 | 2002-05-21 | The United States Of America As Represented By The Secretary Of The Navy | Technique for estimating the pose of surface shapes using tripod operators |
JP3772078B2 (ja) * | 2000-09-29 | 2006-05-10 | 株式会社東芝 | 半導体装置及び半導体装置搭載用配線基板 |
US6775906B1 (en) * | 2000-10-20 | 2004-08-17 | Silverbrook Research Pty Ltd | Method of manufacturing an integrated circuit carrier |
US6507099B1 (en) * | 2000-10-20 | 2003-01-14 | Silverbrook Research Pty Ltd | Multi-chip integrated circuit carrier |
US6710457B1 (en) * | 2000-10-20 | 2004-03-23 | Silverbrook Research Pty Ltd | Integrated circuit carrier |
-
2000
- 2000-10-20 US US09/693,484 patent/US6775906B1/en not_active Expired - Fee Related
-
2001
- 2001-10-19 KR KR1020037005531A patent/KR100619583B1/ko not_active IP Right Cessation
- 2001-10-19 CN CNB018177603A patent/CN1235452C/zh not_active Expired - Fee Related
- 2001-10-19 DE DE60136014T patent/DE60136014D1/de not_active Expired - Lifetime
- 2001-10-19 IL IL15546001A patent/IL155460A0/xx active IP Right Grant
- 2001-10-19 AT AT01981936T patent/ATE410042T1/de not_active IP Right Cessation
- 2001-10-19 WO PCT/AU2001/001334 patent/WO2002034019A1/en active IP Right Grant
- 2001-10-19 JP JP2002537089A patent/JP2004511920A/ja active Pending
- 2001-10-19 EP EP01981936A patent/EP1410701B1/en not_active Expired - Lifetime
- 2001-10-19 AU AU1363702A patent/AU1363702A/xx active Pending
- 2001-10-19 AU AU2002213637A patent/AU2002213637B2/en not_active Ceased
-
2003
- 2003-04-15 IL IL155460A patent/IL155460A/en not_active IP Right Cessation
- 2003-04-24 ZA ZA200303174A patent/ZA200303174B/en unknown
-
2004
- 2004-07-19 US US10/893,379 patent/US7107674B2/en not_active Expired - Fee Related
- 2004-08-02 US US10/902,852 patent/US7154172B2/en not_active Expired - Fee Related
-
2005
- 2005-10-24 JP JP2005308766A patent/JP4658772B2/ja not_active Expired - Fee Related
-
2006
- 2006-05-30 US US11/442,400 patent/US7402894B2/en not_active Expired - Fee Related
- 2006-11-03 US US11/592,209 patent/US7247941B2/en not_active Expired - Fee Related
-
2007
- 2007-06-05 US US11/758,644 patent/US7307354B2/en not_active Expired - Fee Related
- 2007-11-14 US US11/940,304 patent/US7479697B2/en not_active Expired - Fee Related
-
2008
- 2008-06-17 US US12/141,037 patent/US7767912B2/en not_active Expired - Fee Related
- 2008-11-23 US US12/276,390 patent/US7705452B2/en not_active Expired - Fee Related
-
2010
- 2010-04-22 US US12/765,690 patent/US7936063B2/en not_active Expired - Fee Related
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2002213637B2 (en) | Method of manufacturing an integrated circuit carrier | |
AU2002213637A1 (en) | Method of manufacturing an integrated circuit carrier | |
AU2002210256B2 (en) | An integrated circuit carrier | |
US6507099B1 (en) | Multi-chip integrated circuit carrier | |
AU2002210252B2 (en) | Integrated circuit carrier with recesses | |
AU2002210253A1 (en) | A multi-chip integrated circuit carrier | |
AU2004203187B2 (en) | Method of reducing rigidity of a substrate | |
AU2004202249B2 (en) | Method of mounting an integrated circuit | |
AU2005200943B2 (en) | Integrated Circuit and Carrier Assembly | |
AU2004203181A1 (en) | An integrated circuit assembly |