WO2020234944A1 - ガスレーザ装置 - Google Patents
ガスレーザ装置 Download PDFInfo
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- WO2020234944A1 WO2020234944A1 PCT/JP2019/019786 JP2019019786W WO2020234944A1 WO 2020234944 A1 WO2020234944 A1 WO 2020234944A1 JP 2019019786 W JP2019019786 W JP 2019019786W WO 2020234944 A1 WO2020234944 A1 WO 2020234944A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/034—Optical devices within, or forming part of, the tube, e.g. windows, mirrors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/038—Electrodes, e.g. special shape, configuration or composition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/06—Construction or shape of active medium
- H01S3/07—Construction or shape of active medium consisting of a plurality of parts, e.g. segments
- H01S3/073—Gas lasers comprising separate discharge sections in one cavity, e.g. hybrid lasers
- H01S3/076—Folded-path lasers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08018—Mode suppression
- H01S3/0804—Transverse or lateral modes
- H01S3/0805—Transverse or lateral modes by apertures, e.g. pin-holes or knife-edges
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/139—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2308—Amplifier arrangements, e.g. MOPA
- H01S3/2325—Multi-pass amplifiers, e.g. regenerative amplifiers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2366—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media comprising a gas as the active medium
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/02—ASE (amplified spontaneous emission), noise; Reduction thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/2232—Carbon dioxide (CO2) or monoxide [CO]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2308—Amplifier arrangements, e.g. MOPA
- H01S3/2316—Cascaded amplifiers
Definitions
- the present invention relates to a gas laser apparatus for amplifying a laser beam using a laser gas.
- self-oscillation light may be generated by amplification of naturally emitted light generated in the gas laser device. Since the amplification gain of the gas laser device is consumed by the self-excited oscillation light, the amplification factor of the pulsed laser light output by the gas laser amplification system decreases. Therefore, the output of the pulsed laser light by the gas laser amplification system is reduced due to the generation of the self-excited oscillation light. Further, when the self-excited oscillating light irradiates a component in the gas laser amplification system, the component may be damaged by heat. Therefore, in the gas laser apparatus, it is desired to suppress the oscillation of the self-excited oscillation light.
- Patent Document 1 discloses a gas laser apparatus having a reflector that reflects self-excited oscillating light and a light absorber that absorbs self-excited oscillating light reflected by the reflector.
- the reflector reflects the self-excited oscillating light propagating in a direction different from the direction of the optical axis of the pulsed laser light toward the light absorber.
- the gas laser apparatus according to Patent Document 1 removes the self-oscillating light by absorbing the self-oscillating light in the light absorber.
- the conventional gas laser apparatus according to Patent Document 1 can remove self-oscillating light propagating in a direction different from the direction of the optical axis of the pulsed laser light, while the same optical axis as the optical axis of the pulsed laser light. There is a problem that the self-excited oscillating light oscillating in the above cannot be removed.
- the present invention has been made in view of the above, and an object of the present invention is to obtain a gas laser apparatus capable of suppressing the oscillation of self-excited oscillation light caused by naturally emitted light.
- the gas laser apparatus includes a discharge electrode for exciting the laser gas supplied to the discharge region and a first laser beam which is a laser beam propagating to the discharge region.
- a first shielding component provided with a first opening through which a second laser beam passes and a second opening through which a second laser beam, which is a laser beam reciprocating in a discharge region through the first opening, passes through.
- a third opening through which the first laser beam propagating through the first opening and propagating through the discharge region and the second laser beam propagating through the discharge region to the second opening is provided.
- a second shielding component facing the first shielding component across the discharge region is provided.
- the planar shape of the third opening includes a straight portion.
- the direction of the line segment connecting the geometric center of the planar shape of the second opening and the geometric center of the planar shape of the third opening when the planar shape of the third opening is projected onto the first shielding component Is a direction different from the direction of the perpendicular line in the straight line portion.
- the gas laser apparatus according to the present invention has an effect of being able to suppress the oscillation of self-oscillating light caused by naturally emitted light.
- FIG. 3 Perspective view of the gas laser apparatus according to the first embodiment of the present invention.
- FIG. 3 Block diagram of a gas laser amplification system having the gas laser apparatus according to the first embodiment.
- FIG. 3 a perspective view of the gas laser apparatus that amplifies the laser light emitted from the gas laser apparatus according to the first embodiment.
- the figure for demonstrating how the diffracted light is generated in the comparative example 1 of Embodiment 1.
- the figure for demonstrating how diffracted light is generated in the gas laser apparatus which concerns on Embodiment 1.
- the figure which shows the relationship between the azimuth angle and the intensity of the diffracted light about the diffracted light of the intensity distribution shown in FIG. The figure for demonstrating the azimuth in the relationship shown in FIG.
- FIG. 1 is a perspective view of the gas laser apparatus according to the first embodiment of the present invention.
- FIG. 2 is a perspective view showing a part of the configuration provided inside the gas laser apparatus according to the first embodiment.
- FIG. 3 is a block diagram of a gas laser amplification system having the gas laser apparatus according to the first embodiment.
- the gas laser device 100 is a so-called 3-axis orthogonal gas laser device.
- the X direction, the Y direction, and the Z direction are three directions orthogonal to each other.
- the Y direction represents the direction of the electrode gap length
- the X direction represents the direction in which the laser gas flows between the electrode gaps.
- the direction of the optical axis is approximately the Z direction.
- the direction pointed by the arrow in the X direction is defined as the plus X direction
- the direction opposite to the direction pointed by the arrow in the X direction is defined as the minus X direction.
- the direction pointed by the arrow in the Y direction is defined as the plus Y direction, and the direction opposite to the direction pointed by the arrow in the Y direction is defined as the minus Y direction.
- the direction pointed by the arrow in the Z direction is defined as the plus Z direction, and the direction opposite to the direction pointed by the arrow in the Z direction is defined as the minus Z direction.
- the gas laser apparatus 100 includes a housing 1 in which a laser gas as a laser medium is sealed, four electrode substrates 2, 3, 4, 5 housed in the housing 1, and electrodes 6, 7, 8 as discharge electrodes. , 9 and.
- the electrode 6 is provided on the electrode substrate 2.
- the electrode 7 is provided on the electrode substrate 3.
- the electrode 6 and the electrode 7 form a discharge electrode pair facing each other with the discharge region 23 interposed therebetween.
- the electrode 6 and the electrode 7 excite the laser gas supplied to the discharge region 23.
- the electrode 8 is provided on the electrode substrate 4.
- the electrode 9 is provided on the electrode substrate 5.
- the electrode 8 and the electrode 9 form a pair of discharge electrodes facing each other with the discharge region 24 interposed therebetween.
- the electrode 8 and the electrode 9 excite the laser gas supplied to the discharge region 24.
- the electrode substrates 2, 3, 4, and 5 are formed using a dielectric material such as alumina.
- Metallic electrodes 6, 7, 8 and 9 are formed on the surfaces of the electrode substrates 2, 3, 4 and 5 by metallizing or pasting, respectively.
- the surfaces of the electrodes 6, 7, 8 and 9 are covered with a dielectric material such as alumina as in the case of the electrode substrates 2, 3, 4 and 5.
- FIG. 1 the illustration of the dielectric covering the surfaces of the electrodes 6, 7, 8 and 9 is omitted.
- silent discharge occurs.
- a discharge region 23 is formed between the electrodes 6 and 7.
- a discharge region 24 is formed between the electrodes 8 and 9.
- the silent discharge is also referred to as an ozonizer discharge or a dielectric barrier discharge.
- the blower 10 and the heat exchangers 11 and 12 are housed in the housing 1.
- the blower 10 circulates the laser gas sealed in the housing 1.
- the heat exchanger 11 is arranged on the side of the electrode substrate 2 opposite to the side on which the discharge region 23 is formed.
- the blower 10 arranged to face the heat exchanger 11 generates a gas flow 13 that circulates between the heat exchanger 11 and the discharge region 23.
- the direction of the gas flow 13 in the discharge region 23 is the plus X direction.
- the blower 10 supplies a gas flow 13 of about 100 m / s to the discharge region 23.
- the gas flow 13 that has passed through the discharge region 23 is cooled by the heat exchanger 11.
- the gas flow 13 cooled by the heat exchanger 11 is supplied to the discharge region 23 again.
- the heat exchanger 12 is arranged on the side of the electrode substrate 4 opposite to the side on which the discharge region 24 is formed.
- the blower 10 arranged to face the heat exchanger 12 generates a gas flow 14 that circulates between the heat exchanger 12 and the discharge region 24.
- the direction of the gas flow 14 in the discharge region 24 is the minus X direction.
- the blower 10 supplies a gas flow 14 of about 100 m / s to the discharge region 24.
- the gas flow 14 that has passed through the discharge region 24 is cooled by the heat exchanger 12.
- the gas flow 14 cooled by the heat exchanger 12 is supplied to the discharge region 24 again.
- the pressure of the laser gas in the discharge regions 23 and 24 is maintained at a pressure lower than the atmospheric pressure.
- the gas flow 13 in the discharge region 23 and the gas flow 14 in the discharge region 24 are opposite to each other.
- the overall gain distribution obtained by superimposing the gain distributions in the discharge regions 23 and 24 becomes symmetrical.
- the gas laser apparatus 100 can improve the symmetry of the output laser beam.
- the laser gas includes, for example, carbon dioxide gas and nitrogen gas.
- a molecule or atom contained in the laser gas is excited to the upper level of the laser by silent discharge, stimulated emission when the laser light is passed through the laser gas amplifies light having a wavelength of, for example, around 10.6 ⁇ m.
- CO, He-Cd, HF, Ar +, ArF, KrF, XeCl, XeF and the like may be used as the laser gas.
- the gas laser apparatus 100 includes mirrors 21a, 21b, 22a, 22b that reflect the laser light propagating in the discharge regions 23 and 24, shielding plates 15 and 16 that shield the laser light, and windows 17 and 18 through which the laser light passes. Has.
- the mirrors 21a and 21b which are the first mirrors, and the mirrors 22a, 22b, which are the second mirrors, face each other with the shielding plate 15, the discharge regions 23, 24, and the shielding plate 16 interposed therebetween.
- the mirrors 21a, 21b, 22a, 22b form a path for optical amplification.
- the mirrors 21a and 21b are attached to the housing 1 via a mirror holder.
- the mirrors 22a and 22b are attached to the housing 1 via a mirror holder. Note that the mirror holder is not shown in FIGS. 1 and 2.
- a total reflection mirror is used for each of the mirrors 21a, 21b, 22a, 22b.
- each mirror 21a, 21b, 22a, 22b may be a flat surface, a concave surface, or a convex surface. That is, each of the mirrors 21a, 21b, 22a, and 22b may be a flat mirror, a concave mirror, or a convex mirror.
- the window 17 is provided on the surface of the housing 1 on the side where the mirrors 21a and 21b are provided.
- the laser light propagating from the outside of the housing 1 along the optical axis 110 and incident on the window 17 passes through the window 17 and is incident on the housing 1.
- the window 18 is provided on the surface of the housing 1 on the side where the mirrors 22a and 22b are provided.
- the laser beam incident on the window 18 from the housing 1 passes through the window 18.
- the laser beam transmitted through the window 18 propagates along the optical axis 111 and is emitted to the outside of the housing 1.
- the windows 17 and 18 have a function of transmitting the laser beam and a function of blocking the internal space of the housing 1 from the outside of the housing 1.
- a diamond substrate having an antireflection coating is used for the windows 17 and 18, for example.
- the shielding plate 15 which is the first shielding component, is arranged between the window 17 and the mirrors 21a and 21b and the discharge region 23.
- the shielding plate 15 is provided with openings 19a and 19b through which the laser light from the discharge region 23 toward the mirrors 21a and 21b and the laser light reflected by the mirrors 21a and 21b pass. Further, the shielding plate 15 is provided with an opening 19c through which the laser beam transmitted through the window 17 passes.
- the opening 19a, the opening 19b, and the opening 19c are arranged in the X direction and the Y direction.
- the planar shapes of the openings 19a, 19b, and 19c all have a circular shape.
- the openings 19a, 19b, and 19c are all circular openings.
- the shielding plate 15 shields the laser beam in a region other than the openings 19a, 19b, and 19c.
- the shielding plate 16 which is the second shielding component is arranged between the window 18 and the mirrors 22a and 22b and the discharge region 24.
- the shielding plate 15 and the shielding plate 16 face each other with the discharge regions 23 and 24 interposed therebetween.
- the shielding plate 16 is provided with openings 20a and 20b through which the laser light propagating from the discharge region 24 to the mirrors 22a and 22b and the laser light reflected by the mirrors 22a and 22b pass. Further, the shielding plate 16 is provided with an opening 20c through which the laser light propagating from the discharge region 24 to the window 18 passes.
- the opening 20a, the opening 20b, and the opening 20c are arranged in the X direction and the Y direction.
- the planar shape of the opening 20a is rectangular.
- the planar shape of the openings 20b and 20c has a circular shape.
- the opening 20a is a non-circular opening, and the openings 20b, 20c are circular openings.
- the shielding plate 16 shields the laser beam in a region other than the openings 20a, 20b, and 20c.
- the gas laser amplification system 200 shown in FIG. 3 includes a laser oscillator 101 that oscillates a laser beam, four gas laser devices 100, 102, 103, 104 that amplify the laser beam, and a processing device 105 that supplies the amplified laser beam. And have.
- the laser oscillator 101 is a quantum cascade laser.
- the laser oscillator 101 may be a main oscillator output amplifier (Master Oscillator Power Amplifier: MOPA) in which a gas laser amplifier is coupled to a small gas laser oscillator which is the main oscillator.
- MOPA Master Oscillator Power Amplifier
- the laser light emitted from the laser oscillator 101 propagates along the optical axis 110 and is incident on the gas laser apparatus 100.
- the laser beam amplified by the gas laser apparatus 100 is emitted from the gas laser apparatus 100 and propagates along the optical axis 111.
- the laser light propagating along the optical axis 111 is incident on the gas laser device 102, the gas laser device 103, and the gas laser device 104 in this order, and is amplified by the gas laser devices 102, 103, 104.
- the laser light emitted from the gas laser apparatus 104 is incident on the processing apparatus 105.
- the processing device 105 is, for example, a device that cuts a metal work.
- the processing device 105 collects the laser beam incident on the processing device 105 on the target 106 on the metal work.
- the processing device 105 may be any device that processes the work using laser light, and may be a device other than the device that cuts the metal work.
- the device to which the amplified laser light is supplied may be a device other than the processing device 105.
- the device to which the amplified laser light is supplied may be a device that generates extreme ultraviolet light.
- the device for generating extreme ultraviolet light generates extreme ultraviolet light by irradiating the target 106, which is a droplet of tin, with the focused laser light.
- gas laser amplification system 200 shown in FIG. 3 four gas laser devices 100, 102, 103, and 104 are arranged in series with each other.
- the number of gas laser devices arranged in series in the gas laser amplification system 200 is not limited to four, and may be arbitrary.
- one gas laser device 100 shown in FIGS. 1 and 2 is provided.
- the gas laser amplification system 200 may be provided with two or more gas laser devices 100 shown in FIGS. 1 and 2.
- FIG. 4 is a perspective view of a gas laser apparatus that amplifies the laser light emitted from the gas laser apparatus according to the first embodiment of the gas laser amplification system shown in FIG.
- FIG. 4 shows a perspective view of the gas laser apparatus 102.
- the description of the configuration common to the gas laser apparatus 100 among the gas laser apparatus 102 will be omitted.
- the configurations of the gas laser devices 103 and 104 are the same as the configurations of the gas laser devices 102.
- the mirrors 21a, 21b, 22a, 22b provided in the gas laser apparatus 100 shown in FIGS. 1 and 2 are not provided in the gas laser apparatus 102.
- the shielding plate 15 is provided with one opening 19d.
- the shielding plate 16 is provided with one opening 20d.
- the gas laser apparatus 102 has a window facing the opening 19d and a window facing the opening 20d.
- the window has a function of blocking the internal space of the housing 1 from the outside of the housing 1. In FIG. 4, the illustration of the window is omitted.
- the laser light propagating from the laser oscillator 101 along the optical axis 110 passes through the window 17 and enters the housing 1 as shown in FIG.
- the laser beam incident on the housing 1 becomes the first laser beam propagating along the optical axis 31.
- the first laser beam passes through the opening 19c, which is the first opening.
- the first laser beam that has passed through the opening 19c propagates sequentially in the discharge region 23 and the discharge region 24 along the optical axis 31.
- the first laser beam is a laser beam that first propagates in the discharge regions 23 and 24 after being incident on the housing 1.
- the laser light is amplified by passing through the discharge regions 23 and 24.
- the first laser beam passes through the discharge region 23 and the discharge region 24, passes through the opening 20a, and enters the mirror 22a.
- the first laser beam propagating through the discharge regions 23 and 24 and incident on the mirror 22a becomes the second laser beam propagating along the optical axis 32 due to reflection by the mirror 22a.
- the opening 20a which is a non-circular opening, is along the optical axes 31, 32, 33, 34, 35 of the six openings 19a, 19b, 19c, 20a, 20b, 20c provided in the gas laser apparatus 100. This is the opening through which the propagating laser beam reaches second.
- the laser beam reflected by the mirror 22a passes through the opening 20a again.
- the second laser beam passing through the opening 20a propagates sequentially in the discharge region 24 and the discharge region 23 along the optical axis 32.
- the second laser beam passes through the discharge region 24 and the discharge region 23, passes through the opening 19a, and enters the mirror 21a.
- the opening 19a is a second opening through which a second laser beam, which is a laser beam reciprocating between the discharge regions 23 and 24 through the opening 19c, passes through.
- the opening 20a is a third through which the first laser light propagating through the discharge regions 23 and 24 and the second laser light propagating through the discharge regions 23 and 24 to the opening 19a passes through the opening 20a. It is an opening.
- the laser beam reflected by the mirror 21a passes through the opening 19a again.
- the second laser beam propagating through the discharge regions 23 and 24 and incident on the mirror 21a becomes a third laser beam propagating along the optical axis 33 due to reflection by the mirror 21a.
- the third laser beam that has passed through the opening 19a propagates sequentially in the discharge region 23 and the discharge region 24 along the optical axis 33.
- the third laser beam passes through the discharge region 23 and the discharge region 24, passes through the opening 20b, and enters the mirror 22b.
- the opening 20b is a fourth opening through which the third laser beam propagating through the discharge regions 23 and 24 passes through the opening 19a.
- the laser beam reflected by the mirror 22b passes through the opening 20b again.
- the laser beam passing through the opening 20b propagates sequentially in the discharge region 24 and the discharge region 23 along the optical axis 34.
- the laser beam passes through the discharge region 24 and the discharge region 23, passes through the opening 19b, and enters the mirror 21b.
- the laser beam reflected by the mirror 21b passes through the opening 19b again.
- the laser beam propagating along the optical axis 34 becomes a fourth laser beam propagating along the optical axis 35 due to reflection by the mirror 21b.
- the fourth laser beam that has passed through the opening 19b propagates sequentially in the discharge region 23 and the discharge region 24 along the optical axis 35.
- the fourth laser beam passes through the discharge region 23 and the discharge region 24, and then passes through the opening 20c.
- the opening 20c is a fifth opening through which a fourth laser beam, which is a laser beam reciprocating between the discharge regions 23 and 24 through the opening 20b, passes through.
- the laser beam that has passed through the opening 20c is incident on the window 18.
- the laser beam transmitted through the window 18 propagates along the optical axis 111 and is emitted to the outside of the housing 1.
- the laser beam is amplified each time the laser beam passes through the discharge regions 23 and 24 due to reflection by the mirrors 21a, 21b, 22a, and 22b.
- the laser light emitted from the gas laser apparatus 100 passes through the gas laser apparatus 102, 103, 104 in sequence and enters the processing apparatus 105.
- the laser light is amplified by passing the laser light once through the discharge regions 23, 24 of the gas laser devices 102, 103, 104.
- the output of the pulsed laser light from the laser oscillator 101 is on the order of 10 W to 100 W, while the output of the pulsed laser light from the gas laser device 104 increases to 20 kW or more.
- the pulse width of the pulsed laser beam emitted from the laser oscillator 101 is on the order of 1 nanosecond to 100 nanoseconds.
- the pulse frequency of the pulsed laser light emitted from the laser oscillator 101 is on the order of 10 kHz to 100 kHz.
- the gas laser devices 100, 102, 103, 104 continuously generate high frequency discharges. At this time, when the pulse frequency of the pulsed laser light incident on the gas laser apparatus 100 is lower than the discharge frequency, or when the incident of the pulsed laser light is temporarily stopped, the pulsed laser light is not oscillated. Even then, the discharge remains generated.
- the gas laser amplification system 200 is required to have a high amplification factor so that laser light on the order of 10 W can be amplified to 20 kW or more.
- the spontaneous emission light is generated in a state where the pulse laser light is not emitted by the laser oscillator 101 due to the high amplification factor of the gas laser amplification system 200, the gas laser amplification system 200 is self-excited by the amplification of the naturally emitted light. Oscillated light may be generated.
- the naturally emitted light generated in the gas laser device 104 propagates while being amplified by the gas laser device 103 and the gas laser device 102, and is incident on the gas laser device 100.
- the naturally emitted light propagating along the optical axis 111 is incident on the gas laser apparatus 100 from the window 18, most of the naturally emitted light propagates along the optical axes 35, 34, 33, 32, and 31 in the order of the window. It emits light from 17 to the outside of the gas laser apparatus 100.
- the diffracted light is generated by the diffraction phenomenon when the naturally emitted light reflected by the mirror 22a passes through the opening 20a.
- Most of the naturally emitted light propagates from the opening 20a along the optical axis 31 and passes through the opening 19c.
- the naturally emitted light that has passed through the opening 19c passes through the window 17 and is emitted to the outside of the gas laser apparatus 100.
- a part of the naturally emitted light propagates from the opening 20a along the optical axis 32 and passes through the opening 19a.
- the naturally emitted light that has passed through the opening 19a is reflected by the mirror 21a and passes through the opening 19a.
- the naturally emitted light that has passed through the opening 19a propagates along the optical axes 33, 34, and 35, and is emitted from the window 18 to the outside of the gas laser apparatus 100.
- the naturally emitted light emitted from the gas laser apparatus 100 propagates while being amplified by the gas laser apparatus 102, 103, 104, and is incident on the processing apparatus 105.
- the naturally emitted light incident on the processing apparatus 105 is incident on the target 106.
- a part of the naturally emitted light incident on the target 106 is reflected by the target 106 and propagates in the opposite direction along the path when the light is incident on the target 106.
- the naturally emitted light propagating from the target 106 is returned to the gas laser device 104 and amplified by the gas laser device 104.
- the naturally emitted light amplified by the gas laser device 104 again passes through the gas laser device 103 and the gas laser device 102 and propagates to the gas laser device 100.
- the gas laser amplification system 200 may generate self-excited oscillation light by amplifying the naturally emitted light due to the diffraction phenomenon when the naturally emitted light passes through the opening 20a.
- the self-excited oscillation light generated due to the diffraction at the opening 20a oscillates on the same optical axis as the optical axis of the pulsed laser light output by the gas laser amplification system 200.
- the same optical axis of the self-excited oscillation light and the optical axis of the pulsed laser light means that the self-excited oscillation light propagates in the same manner as the pulsed laser light, except when both coincide with each other. It shall be included even if there is a deviation of.
- the self-oscillation light behaves differently from the original pulse laser light generated by the gas laser amplification system 200, the self-oscillation light may irradiate the target 106 at an unintended timing.
- the self-excited oscillating light propagating along the optical axis of the pulsed laser light subsequently propagates in a direction different from that of the pulsed laser light
- the self-oscillating light irradiates the component in the gas laser amplification system 200, whereby the component concerned. May damage the.
- the amplification factor of the pulsed laser light decreases due to the consumption of the amplification gain by the self-excited oscillation, the output of the pulsed laser light by the gas laser amplification system 200 decreases.
- the diffraction phenomenon of naturally emitted light may occur in openings other than the opening 20a.
- the source of naturally emitted light may be a component of the gas laser amplification system 200 other than the gas laser apparatus 104.
- the structural element that functions as part of the resonator is not limited to the target 106.
- the structural element that functions as a part of the resonator may be a structure arranged in an optical path through which the pulsed laser light propagates, such as openings 19d and 20d of the gas laser device 104.
- the gas laser apparatus 100 has a non-circular shape in the openings 19a, 19b, 19c, 20a, 20b, 20c through which the laser beam propagating along the optical axes 31, 32, 33, 34, 35 passes.
- the opening 20a which is an opening, is included.
- the gas laser apparatus 100 suppresses the self-excited oscillating light oscillating on the same optical axis as the optical axis of the pulsed laser light by providing the non-circular opening.
- the self-excited oscillation light is suppressed by generating the diffracted light in the non-circular opening in a manner different from that in the case of the circular opening.
- the appearance of diffracted light generated in the non-circular opening will be described by comparison with the appearance of diffracted light generated in the circular opening.
- FIG. 5 is a diagram for explaining how diffracted light is generated in Comparative Example 1 of the first embodiment.
- FIG. 6 is a diagram showing an example of the intensity distribution of the diffracted light generated in Comparative Example 1 of the first embodiment.
- the shielding plate 16 is provided with an opening 25 which is a circular opening instead of the opening 20a.
- FIG. 5 shows a state in which naturally emitted light propagating along the optical axis 31 through the opening 25 is incident on the opening 19c, and diffraction generated on the shielding plate 15 when the naturally emitted light passes through the opening 25.
- the pattern 41 is shown.
- FIG. 6 shows the diffraction pattern 41 and the intensity distribution 42 of the diffracted light on the shielding plate 15.
- the intensity of light is represented by light and dark. The brighter the part, the stronger the light intensity.
- the intensity distribution 42 is a three-dimensional display of the distribution of light intensity on the shielding plate 15.
- the center of the diffraction pattern 41 is the position of the optical axis 31.
- the light passing through the opening 25 forms a concentric diffraction pattern 41 that repeats light and dark while becoming weaker as the distance from the center of the diffraction pattern 41 increases.
- the diffraction pattern 41 becomes an annular pattern that becomes darker as the distance from the center increases.
- FIG. 7 is a diagram for explaining how diffracted light is generated in the gas laser apparatus according to the first embodiment.
- FIG. 8 is a diagram showing an example of the intensity distribution of diffracted light generated in the gas laser apparatus according to the first embodiment.
- FIG. 9 is an explanatory diagram of the arrangement of openings in the two shielding plates of the gas laser apparatus according to the first embodiment.
- FIG. 7 shows a state in which the laser light propagating along the optical axis 31 passing through the opening 20a is incident on the opening 19c, and a diffraction pattern 43 generated on the shielding plate 15 when the laser light passes through the opening 20a. It shows that.
- FIG. 8 shows the diffraction pattern 43 and the intensity distribution 44 of the diffracted light on the shielding plate 15.
- the intensity of light is represented by light and dark. The brighter the part, the stronger the light intensity.
- the intensity distribution 44 is a three-dimensional display of the distribution of light intensity on the shielding plate 15.
- the center of the diffraction pattern 43 is the position of the optical axis 31. It is assumed that the planar shape of the opening 20a is square. The planar shape of the opening 20a has four straight portions corresponding to the sides of the square.
- FIG. 9 shows a state in which the openings 20a, 20b, 20c provided in the shielding plate 16 are projected onto the shielding plate 15, and a diffraction pattern 43.
- the openings 20a, 20b, and 20c projected on the shielding plate 15 are shown by broken lines.
- the diffraction pattern 43 is a line-symmetrical pattern whose axis of symmetry is the diagonal line.
- the intensity of light around the opening 19c is increased in the direction of the perpendiculars on each side of the square presented by the opening 20a. In addition, the light intensity is weakened in the diagonal direction of the rectangle.
- the line segment 26 shown in FIG. 9 is a perpendicular line on one side of the square presented by the opening 20a.
- the line segment 27 is a line segment connecting the geometric center of the planar shape of the opening 20a and the geometric center of the planar shape of the opening 19a in the state shown in FIG.
- the center position of each opening 19a, 19b, 19c, 20a, 20b, 20c is assumed to be the geometric center of the planar shape of each opening 19a, 19b, 19c, 20a, 20b, 20c. ..
- the distance between the center position of the opening 19a and the center position of the opening 19b, the distance between the center position of the opening 19b and the center position of the opening 19c, and the center position of the opening 19c and the opening 19a The distance from the center position of is the same.
- the distance between the center position of the opening 20a and the center position of the opening 20b, the distance between the center position of the opening 20b and the center position of the opening 20c, and the center position of the opening 20c and the opening 20a The distance from the center position of is the same.
- FIG. 10 is a diagram showing the relationship between the azimuth angle and the intensity of the diffracted light with respect to the diffracted light of the intensity distribution shown in FIG. 6 and the diffracted light of the intensity distribution shown in FIG.
- FIG. 11 is a diagram for explaining the azimuth angle in the relationship shown in FIG. FIG. 11 shows the relationship between the intensity and the azimuth in the first bright ring of the diffraction patterns 41 and 43.
- the first bright ring is the bright ring closest to the Airy disk among the bright rings formed on the outside of the Airy disk.
- the Airy disk is a region inside the dark ring located on the center side of the diffraction patterns 41 and 43 with respect to the first bright ring.
- the axis along one diagonal line in the square formed by the opening 20a is defined as the X'axis, and the axis along the other diagonal line in the square is defined as the Y'axis.
- the angle ⁇ which is the azimuth, is an angle with respect to the X'axis in the first quadrant.
- Graph 36 shown in FIG. 10 shows the relationship between the azimuth angle and the light intensity of the diffraction pattern 43 shown in FIG.
- Graph 37 shown in FIG. 10 shows the relationship between the azimuth angle and the light intensity of the diffraction pattern 41 shown in FIG. In the diffraction pattern 41, the light intensity is constant regardless of the azimuth angle. Therefore, the graph 37 is a linear graph showing a constant intensity.
- the diffracted light is generated evenly regardless of the orientation.
- Most of the naturally emitted light propagating along the optical axis 31 is incident on the opening 19c, while a part of the naturally emitted light enters the opening 19a or 19b.
- the naturally emitted light is amplified in the resonator composed of the mirror 21a and the target 106 as described above.
- the light intensity in the diffraction pattern 43 is strengthened in the direction of the perpendicular on each side of the square and weakened in the direction of the diagonal.
- the light intensity is the minimum value in the direction corresponding to the diagonal line
- the light intensity is the maximum value in the direction corresponding to the perpendicular line on each side of the square.
- the light intensity in the diagonal direction is reduced as compared with the case of the diffraction pattern 41.
- the direction of the line segment 27 connecting the center position of the opening 19a and the center position of the opening 20a is the direction of the opening 20a.
- the direction is different from the direction of the line segment 26, which is a perpendicular line on the side of the square presented by.
- the central position of the opening 19a is a position other than the position on the perpendicular line on the side of the square exhibited by the opening 20a.
- the direction in which the light intensity is strengthened in the diffraction pattern 43 is the direction of the opening 19a seen from the center position of the opening 20a. It is different from the direction of the center position.
- the XY plane is a plane parallel to the X direction and the Y direction. Since the direction of the center position of the opening 19a as seen from the center position of the opening 20a and the direction in which the light intensity is enhanced are different from each other, the naturally emitted light propagating to the opening 19a due to the diffraction phenomenon in the opening 20a. Is reduced.
- the diagonal line of the square and the line segment 27 exhibited by the opening 20a coincide with each other. That is, when the square presented by the opening 20a is projected onto the shielding plate 15, the center position of the opening 19a and the center position of the opening 20a are aligned with each other in the diagonal direction of the square. In other words, the opening 19a and the opening 20a are aligned with each other in the direction of one angle viewed from the center position of the opening 20a.
- the direction in which the light intensity of the diffraction pattern 43 is weakened is the center position of the opening 19a as seen from the center position of the opening 20a. It is adjusted to the direction of.
- the direction of the center position of the opening 19a viewed from the center position of the opening 20a and the direction in which the light intensity is weakened match each other, the naturally emitted light propagating to the opening 19a due to the diffraction phenomenon of the opening 20a is generated. It will be reduced.
- the spontaneous emission light propagating to the opening 19a due to the diffraction phenomenon of the opening 20a is reduced as compared with the case where the opening 25 which is a circular opening is provided.
- the naturally emitted light propagating to the opening 19a the naturally emitted light propagating between the mirror 21a and the target 106 can be reduced. Since the amplification of the naturally emitted light is suppressed by reducing the naturally emitted light propagating between the mirror 21a and the target 106, the gas laser apparatus 100 suppresses the oscillation of the self-excited oscillation light in the gas laser amplification system 200. Is possible.
- the laser light of the optical axis 31 is the laser light that first propagates in the discharge regions 23 and 24 after being incident on the housing 1. Therefore, in the opening 20a through which the laser light of the optical axis 31 passes, the amplification action of the naturally emitted light due to the diffraction phenomenon appears most strongly among the openings 19a, 19b, 19c, 20a, 20b, 20c.
- the gas laser apparatus 100 can effectively reduce the naturally emitted light by including the linear portion in the planar shape of the opening 20a.
- FIG. 12 is an explanatory diagram of an arrangement of openings in Comparative Example 2 of the first embodiment.
- the shielding plate 16 is provided with an opening 28 instead of the opening 20a.
- the openings 28, 20b, 20c provided in the shielding plate 16 are projected onto the shielding plate 15, and the diffraction pattern 46 generated on the shielding plate 15 when the laser beam passes through the opening 28. Is shown.
- the openings 28, 20b, and 20c projected on the shielding plate 15 are shown by broken lines.
- the planar shape of the opening 28 is square.
- the square presented by the opening 28 is the same as the square presented by the opening 20a rotated by 45 degrees in the direction of the azimuth angle.
- the diffraction pattern 46 is the same as the diffraction pattern 43 rotated by 45 degrees in the direction of the azimuth angle.
- the line segment 26 is a perpendicular line on one side of the square presented by the opening 28.
- the line segment 26 coincides with the line segment connecting the center position of the opening 28 and the center position of the opening 19a. That is, when the planar shape of the opening 28 is projected onto the shielding plate 15, the center position of the opening 19a is a position on a perpendicular line on the side of the square exhibited by the opening 28. In this case, the direction in which the light intensity of the diffraction pattern 46 is strengthened is the same as the direction of the center position of the opening 19a as seen from the center position of the opening 28.
- the direction of the line segment 27 connecting the center position of the opening 19a and the center position of the opening 20a is the direction of the opening.
- the direction of the planar shape of the opening 20a on the XY plane is determined so as to be in a direction different from the direction of the line segment 26 which is a perpendicular line in the straight line portion of 20a.
- the planar shape of the opening 20a is not limited to a square, but may be a rectangle.
- the gas laser apparatus 100 is provided with an opening 20a having a planar shape including a straight line portion.
- the direction of the line segment 27 connecting the geometric center of the planar shape of the opening 19a and the geometric center of the planar shape of the opening 20a is the direction of the perpendicular line in the straight line portion.
- the direction is different from the direction.
- FIG. 13 is a perspective view showing a part of the configuration provided inside the gas laser apparatus according to the second embodiment of the present invention.
- the gas laser apparatus 100 according to the second embodiment is provided with two openings 20a and 50 which are non-circular openings.
- the gas laser apparatus 100 according to the second embodiment is the same as the gas laser apparatus 100 according to the first embodiment, except that the opening 50 is provided in place of the opening 19a shown in FIG.
- the same components as those in the first embodiment are designated by the same reference numerals, and the configurations different from those in the first embodiment will be mainly described.
- the naturally emitted light reflected by the mirror 22a is diffracted by the diffraction phenomenon when passing through the opening 20a
- the naturally emitted light propagating from the opening 20a along the optical axis 32 passes through the opening 50. It passes through and enters the mirror 21a.
- Most of the naturally emitted light reflected by the mirror 21a and passed through the opening 50 propagates along the optical axis 33 and enters the opening 20b.
- the diffracted light generated by the diffraction phenomenon at the opening 20a propagates along the optical axis 32 and further propagates along the optical axis 33, so that a part of the naturally emitted light passing through the opening 50 is opened. It may be incident on the opening 20c next to the portion 20b.
- the naturally emitted light that has passed through the opening 20c passes through the window 18 and is emitted to the outside of the gas laser apparatus 100.
- the gas laser amplification system 200 may generate self-excited oscillation light by emitting naturally emitted light from the gas laser apparatus 100 in this way.
- FIG. 14 is a diagram for explaining a state of diffracted light propagating in the gas laser apparatus according to the second embodiment.
- FIG. 14 shows a state in which the laser light propagating along the optical axis 33 passing through the opening 50 is incident on the opening 20b, and a diffraction pattern 47 generated on the shielding plate 16 when the laser light passes through the opening 50. It shows that.
- the opening 50 is a second opening through which the laser beam reciprocating in the discharge regions 23 and 24 passes through the opening 19c.
- the planar shape of the opening 50 is the same square as the square presented by the opening 20a. In the following description, the center position of the opening 50 is assumed to be the geometric center of the planar shape of the opening 50.
- the distance between the center position of the opening 50 and the center position of the opening 19b, the distance between the center position of the opening 19b and the center position of the opening 19c, and the center position of the opening 19c and the opening 50 The distance from the center position of is the same.
- the diffraction pattern 47 is the same as the diffraction pattern 43 shown in FIG.
- the line segment connecting the center position of the opening 50, which is the second opening, and the center position of the opening 20c, which is the fifth opening is ,
- the direction is different from the direction of the perpendicular line on the side of the square exhibited by the opening 50.
- the line segment connecting the center position of the opening 50 and the center position of the opening 20c coincides with the diagonal line of the square presented by the opening 50. ing. That is, when the square presented by the opening 50 is projected onto the shielding plate 16, the center position of the opening 20c and the stop position of the opening 50 are aligned with each other in the diagonal direction of the square.
- the direction in which the light intensity of the diffraction pattern 47 is weakened is the direction of the opening 20c seen from the center position of the opening 50. It is adjusted to the direction of the center position.
- the naturally emitted light propagating from the opening 50 to the opening 20c is reduced.
- the naturally emitted light propagating to the opening 20c it is possible to reduce the naturally emitted light propagating between the mirror 21a and the target 106.
- the naturally emitted light propagating to the opening 50 due to the diffraction phenomenon at the opening 20a is reduced as in the first embodiment.
- the reduction of the naturally emitted light propagating between the mirror 21a and the target 106 suppresses the amplification of the naturally emitted light. Therefore, the gas laser apparatus 100 is self-oscillated in the gas laser amplification system 200. It is possible to suppress the oscillation of light.
- the gas laser device 100 may be provided with three or more non-circular openings. In this case as well, the gas laser apparatus 100 can suppress the oscillation of the self-excited oscillation light.
- FIG. 15 is an explanatory diagram of an arrangement of openings provided in the gas laser apparatus according to the third embodiment of the present invention.
- the planar shape of the opening 20a is inclined as compared with the planar shape of the opening 20a in the first embodiment.
- the gas laser apparatus 100 according to the third embodiment is the same as the gas laser apparatus 100 according to the first embodiment, except that the planar shape of the opening 20a is inclined as compared with the case of the first embodiment.
- the same components as those in the first and second embodiments are designated by the same reference numerals, and the configurations different from those of the first and second embodiments will be mainly described.
- the openings 20a, 20b, 20c provided in the shielding plate 16 are projected onto the shielding plate 15, and the diffraction pattern 48 generated on the shielding plate 15 when the laser light passes through the opening 20a. Is shown.
- the intensity of light is represented by light and dark. The brighter the part, the stronger the light intensity.
- the openings 20a, 20b, and 20c projected on the shielding plate 15 are shown by broken lines.
- the line segment 27 is a line segment connecting the center position of the opening 19a and the center position of the opening 20a when the planar shape of the opening 20a is projected onto the shielding plate 15.
- the line segment 52 is one diagonal line in the square exhibited by the opening 20a.
- the line segment 52 is a line segment that coincides with the X'axis shown in FIG.
- the angle formed by the line segment 52 and the line segment 27 is ⁇ , the relationship between the angle ⁇ and the intensity of the diffracted light is the same as in the case of graph 36 shown in FIG.
- n is an arbitrary integer. n ( ⁇ / 2) ⁇ 0.14 ⁇ ⁇ ⁇ ⁇ n ( ⁇ / 2) + 0.14 ⁇ ⁇ ⁇ ⁇ (1)
- the range of the angle ⁇ represented by the above equation (1) is generated by the spontaneous emission light passing through the square opening 20a rather than the intensity of the diffracted light generated by the spontaneous emission light passing through the circular opening. This is the range of the angle ⁇ at which the intensity of the diffracted light becomes weaker.
- the angle ⁇ formed by the line segment 52 and the line segment 27 is included in the range represented by the above equation (1), the gas laser apparatus 100 emits naturally emitted light propagating to the opening 19a by a diffraction phenomenon. , It can be reduced as compared with the case of a circular opening.
- FIG. 16 is an explanatory view of an opening provided in the gas laser apparatus according to the fourth embodiment of the present invention.
- the planar shape of the opening 60 provided in the gas laser apparatus 100 according to the fourth embodiment is a regular hexagon.
- the same components as those in the first to third embodiments are designated by the same reference numerals, and the configurations different from those in the first to third embodiments will be mainly described.
- FIG. 16 shows the planar shape of the opening 60 and the diffraction pattern 61 generated by the laser light passing through the opening 60.
- the intensity of light is represented by light and dark. The brighter the part, the stronger the light intensity.
- the planar shape of the opening 60 has six straight portions corresponding to the sides of a regular hexagon.
- the intensity of light around the opening 60 is increased in the direction of the perpendiculars on each side of the regular hexagon presented by the opening 60. Further, the light intensity is weakened in the direction of each corner of the regular hexagon. That is, in the diffraction pattern 61, among the diagonal lines of the regular hexagon, the light intensity is weakened in the direction of the diagonal line which is the axis of symmetry of the regular hexagon.
- the planar shape of the opening 60 is not limited to a regular hexagon.
- the planar shape may be a polygon having one or more pairs of sides parallel to each other.
- a polygon having a planar shape is a polygon having four or more and an even number of corners. Considering the symmetry of the diffraction pattern 61, the polygon is preferably a regular polygon.
- the planar shape of the opening 50 provided in the shielding plate 15 in the second embodiment may be a polygon similar to the opening 60 of the fourth embodiment.
- FIG. 17 is an explanatory view of an opening provided in the gas laser apparatus according to the fifth embodiment of the present invention.
- the planar shape of the opening 62 provided in the gas laser apparatus 100 according to the fifth embodiment is a shape having a curved portion.
- the same components as those in the first to fourth embodiments are designated by the same reference numerals, and the configurations different from those in the first to fourth embodiments will be mainly described.
- FIG. 17 shows the planar shape of the opening 62 and the diffraction pattern 63 generated by the laser light passing through the opening 62.
- the intensity of light is represented by light and dark. The brighter the part, the stronger the light intensity.
- the planar shape of the opening 62 is a shape in which one of the squares has a rounded corner.
- the intensity of light around the opening 62 is increased in the direction of the perpendicular in one of the straight portions across the corner. Further, in the direction of the line segment connecting the geometric center and the angle in the planar shape of the opening 62, the light intensity is weakened in the direction of the angle between the two straight line portions.
- the geometric center in the planar shape of the opening 62 is the center of gravity of the area of the planar shape of the opening 62.
- the center position of the opening 19a and the center of gravity of the opening 62 are set.
- the direction of the connecting line segment is different from the direction of the perpendicular line in the straight line portion.
- the center position of the opening 19a and the center of gravity of the opening 62 connect the center of gravity of the planar shape of the opening 62 and the corner of the planar shape. They are lined up with each other in the direction of the line segment. As a result, the spontaneously emitted light propagating to the opening 19a due to the diffraction phenomenon at the opening 62 is reduced.
- planar shape of the opening 62 is not limited to the planar shape described in the fifth embodiment.
- the planar shape may have at least two straight portions sandwiching the corner.
- the planar shape may be a shape in which at least one corner of a polygon having one or more pairs of sides parallel to each other is rounded.
- the planar shape of the opening 50 provided in the shielding plate 15 in the second embodiment may be the same as the planar shape of the opening 62 of the fifth embodiment.
- FIG. 18 is a perspective view showing a main part of the gas laser apparatus according to the sixth embodiment of the present invention.
- suppression of self-excited oscillation light by providing the gas laser apparatus 100 with a mirror 70 which is a concave mirror will be described.
- the same components as those in the first to fifth embodiments are designated by the same reference numerals, and the configurations different from those in the first to fifth embodiments will be mainly described.
- FIG. 19 is an explanatory diagram of a diffraction pattern in the gas laser apparatus according to the sixth embodiment.
- FIG. 19 shows a plane wave diffraction pattern 71 passing through the circular opening and a focused beam diffraction pattern 72 passing through the circular opening.
- the light intensity is represented by light and dark. The brighter the part, the stronger the light intensity.
- the spread of diffracted light is suppressed by the focused beam rather than the plane wave.
- the naturally emitted light reflected by the mirror 70 becomes a focused beam, propagates through the discharge regions 23 and 24, and passes through the opening 20b.
- the naturally emitted light passes through the opening 20b, the spread of the diffracted light on the surface of the shielding plate 16 is suppressed, so that the naturally emitted light propagating to the opening 20c is reduced.
- the spontaneous emission light propagating to the opening 20c due to the diffraction phenomenon at the opening 20a is reduced.
- the gas laser apparatus 100 is not limited to the three-axis orthogonal gas laser apparatus, and may be a gas laser apparatus such as a high-speed axial flow system or a wall surface cooling system.
- the configuration shown in the above-described embodiment shows an example of the content of the present invention, can be combined with another known technique, and is one of the configurations without departing from the gist of the present invention. It is also possible to omit or change the part.
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Abstract
Description
図1は、本発明の実施の形態1にかかるガスレーザ装置の斜視図である。図2は、実施の形態1にかかるガスレーザ装置の内部に設けられている構成の一部を示す斜視図である。図3は、実施の形態1にかかるガスレーザ装置を有するガスレーザ増幅システムのブロック図である。
図13は、本発明の実施の形態2にかかるガスレーザ装置の内部に設けられている構成の一部を示す斜視図である。実施の形態2にかかるガスレーザ装置100には、非円形開口部である2つの開口部20a,50が設けられている。実施の形態2にかかるガスレーザ装置100は、図2に示す開口部19aに代えて開口部50が設けられているほかは、実施の形態1にかかるガスレーザ装置100と同様である。実施の形態2では、上記の実施の形態1と同一の構成要素には同一の符号を付し、実施の形態1とは異なる構成について主に説明する。
図15は、本発明の実施の形態3にかかるガスレーザ装置に設けられている開口部の配置についての説明図である。実施の形態3では、開口部20aの平面形状が、実施の形態1における開口部20aの平面形状と比べて傾いている。実施の形態3にかかるガスレーザ装置100は、開口部20aの平面形状が実施の形態1の場合と比べて傾いているほかは、実施の形態1にかかるガスレーザ装置100と同様である。実施の形態3では、上記の実施の形態1および2と同一の構成要素には同一の符号を付し、実施の形態1および2とは異なる構成について主に説明する。
n(π/2)-0.14π≦θ≦n(π/2)+0.14π ・・・(1)
図16は、本発明の実施の形態4にかかるガスレーザ装置に設けられている開口部についての説明図である。実施の形態4にかかるガスレーザ装置100に設けられている開口部60の平面形状は、正六角形である。実施の形態4では、上記の実施の形態1から3と同一の構成要素には同一の符号を付し、実施の形態1から3とは異なる構成について主に説明する。
図17は、本発明の実施の形態5にかかるガスレーザ装置に設けられている開口部についての説明図である。実施の形態5にかかるガスレーザ装置100に設けられている開口部62の平面形状は、曲線部位を有する形状である。実施の形態5では、上記の実施の形態1から4と同一の構成要素には同一の符号を付し、実施の形態1から4とは異なる構成について主に説明する。
図18は、本発明の実施の形態6にかかるガスレーザ装置の要部を示す斜視図である。実施の形態6では、ガスレーザ装置100に凹面ミラーであるミラー70が設けられることによる自励発振光の抑制について説明する。実施の形態6では、上記の実施の形態1から5と同一の構成要素には同一の符号を付し、実施の形態1から5とは異なる構成について主に説明する。
Claims (7)
- 放電領域へ供給されるレーザガスを励起させる放電電極と、
前記放電領域へ伝搬するレーザ光である第1のレーザ光が通る第1の開口部と、前記第1の開口部を通って前記放電領域を往復した前記レーザ光である第2のレーザ光が通る第2の開口部とが設けられている第1の遮蔽部品と、
前記第1の開口部を通って前記放電領域を伝搬した前記第1のレーザ光と、前記放電領域を経て前記第2の開口部へ伝搬する前記第2のレーザ光とが通る第3の開口部が設けられており、前記放電領域を挟んで前記第1の遮蔽部品と対向する第2の遮蔽部品と、
を備え、
前記第3の開口部の平面形状には、直線部位が含まれており、
前記第3の開口部の平面形状を前記第1の遮蔽部品に投影した場合において、前記第2の開口部の平面形状の幾何中心と前記第3の開口部の平面形状の幾何中心とを結ぶ線分の方向は、前記直線部位における垂線の方向とは異なる方向であることを特徴とするガスレーザ装置。 - 前記第3の開口部の平面形状には、角を挟む2つの直線部位が含まれており、
前記第3の開口部の平面形状を前記第1の遮蔽部品に投影した場合において、前記第2の開口部の平面形状の幾何中心と前記第3の開口部の平面形状の幾何中心とは、前記第3の開口部の平面形状の幾何中心と前記角とを結ぶ線分の方向において互いに並べられていることを特徴とする請求項1に記載のガスレーザ装置。 - 前記第3の開口部の平面形状には、角を挟む2つの直線部位が含まれており、
前記第3の開口部の平面形状を前記第1の遮蔽部品に投影した場合において、前記第2の開口部の平面形状の幾何中心と前記第3の開口部の平面形状の幾何中心とを結ぶ線分と前記角とを結ぶ線分とがなす角度θは、次の式を満足することを特徴とする請求項1に記載のガスレーザ装置。
n(π/2)-0.14π≦θ≦n(π/2)+0.14π - 前記第2の開口部の平面形状には、直線部位が含まれており、
前記第2の遮蔽部品には、前記第2の開口部を通って前記放電領域を伝搬した前記レーザ光である第3のレーザ光が通る第4の開口部と、前記第4の開口部を通って前記放電領域を往復した前記レーザ光である第4のレーザ光が通る第5の開口部とが設けられており、
前記第2の遮蔽部品に前記第2の開口部の平面形状を投影した場合において、前記第2の開口部の平面形状の幾何中心と前記第5の開口部の平面形状の幾何中心とを結ぶ線分の方向は、前記第2の開口部の前記直線部位における垂線の方向とは異なる方向であることを特徴とする請求項1から3のいずれか1つに記載のガスレーザ装置。 - 前記第3の開口部の平面形状は、互いに平行な辺が1対以上含まれている多角形であることを特徴とする請求項1または2に記載のガスレーザ装置。
- 前記放電電極と前記第1の遮蔽部品と前記第2の遮蔽部品とを収容する筐体を備え、
前記筐体へ入射してから最初に前記放電領域を伝搬した前記レーザ光である前記第1のレーザ光が前記第3の開口部を通ることを特徴とする請求項1から5のいずれか1つに記載のガスレーザ装置。 - 前記第1の遮蔽部品、前記放電領域および前記第2の遮蔽部品を挟んで互いに対向して配置され、前記レーザ光を反射する複数のミラーを備え、
前記複数のミラーのうちの少なくとも1つは、凹面ミラーであることを特徴とする請求項1から6のいずれか1つに記載のガスレーザ装置。
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3732013A (en) * | 1971-04-02 | 1973-05-08 | Us Army | Multipath laser moving target indicator |
JPH02162783A (ja) * | 1988-12-16 | 1990-06-22 | Sumitomo Metal Mining Co Ltd | レーザー装置 |
JPH0595142A (ja) * | 1991-10-01 | 1993-04-16 | Mitsubishi Electric Corp | レーザ発振装置 |
JPH11112074A (ja) * | 1997-10-07 | 1999-04-23 | Nippon Steel Corp | レーザビーム通過開口板およびそれを用いた高出力レーザ装置およびレーザ光伝送装置 |
JP2008042048A (ja) * | 2006-08-09 | 2008-02-21 | Komatsu Ltd | 極端紫外光源装置用ドライバーレーザ |
JP2011159932A (ja) * | 2010-02-04 | 2011-08-18 | Mitsubishi Electric Corp | ガスレーザ増幅装置およびその光軸調整方法 |
WO2012176252A1 (ja) * | 2011-06-20 | 2012-12-27 | 三菱電機株式会社 | ガスレーザ増幅装置 |
WO2015008405A1 (ja) * | 2013-07-18 | 2015-01-22 | 三菱電機株式会社 | ガスレーザ装置 |
JP2015103762A (ja) * | 2013-11-28 | 2015-06-04 | 三菱電機株式会社 | ガスレーザ増幅システム |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54127474A (en) | 1978-03-28 | 1979-10-03 | Toshiba Corp | Production of heat-insulating wall material |
JP6170928B2 (ja) * | 2012-09-18 | 2017-07-26 | ギガフォトン株式会社 | スラブ型増幅器、それを含むレーザ装置および極短紫外光生成装置 |
JP6215334B2 (ja) | 2013-09-27 | 2017-10-18 | ギガフォトン株式会社 | レーザ装置及び極端紫外光生成システム |
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Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3732013A (en) * | 1971-04-02 | 1973-05-08 | Us Army | Multipath laser moving target indicator |
JPH02162783A (ja) * | 1988-12-16 | 1990-06-22 | Sumitomo Metal Mining Co Ltd | レーザー装置 |
JPH0595142A (ja) * | 1991-10-01 | 1993-04-16 | Mitsubishi Electric Corp | レーザ発振装置 |
JPH11112074A (ja) * | 1997-10-07 | 1999-04-23 | Nippon Steel Corp | レーザビーム通過開口板およびそれを用いた高出力レーザ装置およびレーザ光伝送装置 |
JP2008042048A (ja) * | 2006-08-09 | 2008-02-21 | Komatsu Ltd | 極端紫外光源装置用ドライバーレーザ |
JP2011159932A (ja) * | 2010-02-04 | 2011-08-18 | Mitsubishi Electric Corp | ガスレーザ増幅装置およびその光軸調整方法 |
WO2012176252A1 (ja) * | 2011-06-20 | 2012-12-27 | 三菱電機株式会社 | ガスレーザ増幅装置 |
WO2015008405A1 (ja) * | 2013-07-18 | 2015-01-22 | 三菱電機株式会社 | ガスレーザ装置 |
JP2015103762A (ja) * | 2013-11-28 | 2015-06-04 | 三菱電機株式会社 | ガスレーザ増幅システム |
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