WO2018110317A1 - 有機光電変換素子の正孔捕集層用組成物 - Google Patents
有機光電変換素子の正孔捕集層用組成物 Download PDFInfo
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- WO2018110317A1 WO2018110317A1 PCT/JP2017/043253 JP2017043253W WO2018110317A1 WO 2018110317 A1 WO2018110317 A1 WO 2018110317A1 JP 2017043253 W JP2017043253 W JP 2017043253W WO 2018110317 A1 WO2018110317 A1 WO 2018110317A1
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- carbon atoms
- photoelectric conversion
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- organic photoelectric
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- 239000000203 mixture Substances 0.000 title claims abstract description 129
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 68
- 239000010409 thin film Substances 0.000 claims abstract description 52
- 229910052731 fluorine Inorganic materials 0.000 claims abstract description 48
- 239000011737 fluorine Substances 0.000 claims abstract description 45
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims abstract description 43
- 239000000126 substance Substances 0.000 claims abstract description 35
- 239000002904 solvent Substances 0.000 claims abstract description 34
- 229920000767 polyaniline Polymers 0.000 claims abstract description 23
- 125000000542 sulfonic acid group Chemical group 0.000 claims abstract description 20
- 125000003118 aryl group Chemical group 0.000 claims abstract description 17
- 125000003710 aryl alkyl group Chemical group 0.000 claims abstract description 15
- 125000005309 thioalkoxy group Chemical group 0.000 claims abstract description 14
- 125000001188 haloalkyl group Chemical group 0.000 claims abstract description 13
- 239000004094 surface-active agent Substances 0.000 claims abstract description 9
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 8
- 238000003475 lamination Methods 0.000 claims abstract description 4
- 125000004432 carbon atom Chemical group C* 0.000 claims description 115
- -1 aryl sulfonic acid compound Chemical class 0.000 claims description 110
- 239000002736 nonionic surfactant Substances 0.000 claims description 36
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 29
- 239000002019 doping agent Substances 0.000 claims description 24
- 125000003545 alkoxy group Chemical group 0.000 claims description 21
- 125000000217 alkyl group Chemical group 0.000 claims description 17
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical group C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 claims description 12
- 125000003342 alkenyl group Chemical group 0.000 claims description 12
- 125000000304 alkynyl group Chemical group 0.000 claims description 12
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 11
- 229910052799 carbon Inorganic materials 0.000 claims description 11
- 229920000642 polymer Polymers 0.000 claims description 9
- 125000005843 halogen group Chemical group 0.000 claims description 8
- 125000002252 acyl group Chemical group 0.000 claims description 6
- 125000001153 fluoro group Chemical group F* 0.000 claims description 6
- 125000005010 perfluoroalkyl group Chemical group 0.000 claims description 6
- ONUFSRWQCKNVSL-UHFFFAOYSA-N 1,2,3,4,5-pentafluoro-6-(2,3,4,5,6-pentafluorophenyl)benzene Chemical group FC1=C(F)C(F)=C(F)C(F)=C1C1=C(F)C(F)=C(F)C(F)=C1F ONUFSRWQCKNVSL-UHFFFAOYSA-N 0.000 claims description 5
- 239000007848 Bronsted acid Substances 0.000 claims description 5
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 claims description 5
- 239000005456 alcohol based solvent Substances 0.000 claims description 5
- 125000005577 anthracene group Chemical group 0.000 claims description 5
- 125000004093 cyano group Chemical group *C#N 0.000 claims description 5
- 125000001624 naphthyl group Chemical group 0.000 claims description 5
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 5
- 125000003837 (C1-C20) alkyl group Chemical group 0.000 abstract 1
- 125000006649 (C2-C20) alkynyl group Chemical group 0.000 abstract 1
- 125000003860 C1-C20 alkoxy group Chemical group 0.000 abstract 1
- 125000003358 C2-C20 alkenyl group Chemical group 0.000 abstract 1
- 239000000463 material Substances 0.000 description 66
- 239000000243 solution Substances 0.000 description 61
- 238000000034 method Methods 0.000 description 51
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 23
- 230000015572 biosynthetic process Effects 0.000 description 23
- 239000000758 substrate Substances 0.000 description 23
- 239000010408 film Substances 0.000 description 22
- 239000012153 distilled water Substances 0.000 description 13
- 239000010405 anode material Substances 0.000 description 12
- 238000002360 preparation method Methods 0.000 description 12
- 239000011148 porous material Substances 0.000 description 11
- 230000000903 blocking effect Effects 0.000 description 10
- 238000000576 coating method Methods 0.000 description 10
- 150000001875 compounds Chemical class 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 9
- 239000007864 aqueous solution Substances 0.000 description 9
- 239000007787 solid Substances 0.000 description 9
- 238000004528 spin coating Methods 0.000 description 9
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 8
- 239000002253 acid Substances 0.000 description 8
- 239000006185 dispersion Substances 0.000 description 8
- 238000003786 synthesis reaction Methods 0.000 description 8
- 239000012298 atmosphere Substances 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 7
- 238000001035 drying Methods 0.000 description 7
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 6
- 229940126062 Compound A Drugs 0.000 description 6
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 239000011261 inert gas Substances 0.000 description 6
- 229910052809 inorganic oxide Inorganic materials 0.000 description 6
- 229910052709 silver Inorganic materials 0.000 description 6
- 239000004332 silver Substances 0.000 description 6
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 5
- 239000010406 cathode material Substances 0.000 description 5
- 239000003960 organic solvent Substances 0.000 description 5
- 238000000859 sublimation Methods 0.000 description 5
- 230000008022 sublimation Effects 0.000 description 5
- STTGYIUESPWXOW-UHFFFAOYSA-N 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline Chemical compound C=12C=CC3=C(C=4C=CC=CC=4)C=C(C)N=C3C2=NC(C)=CC=1C1=CC=CC=C1 STTGYIUESPWXOW-UHFFFAOYSA-N 0.000 description 4
- VZSRBBMJRBPUNF-UHFFFAOYSA-N 2-(2,3-dihydro-1H-inden-2-ylamino)-N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]pyrimidine-5-carboxamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C(=O)NCCC(N1CC2=C(CC1)NN=N2)=O VZSRBBMJRBPUNF-UHFFFAOYSA-N 0.000 description 4
- DHDHJYNTEFLIHY-UHFFFAOYSA-N 4,7-diphenyl-1,10-phenanthroline Chemical compound C1=CC=CC=C1C1=CC=NC2=C1C=CC1=C(C=3C=CC=CC=3)C=CN=C21 DHDHJYNTEFLIHY-UHFFFAOYSA-N 0.000 description 4
- 229920002873 Polyethylenimine Polymers 0.000 description 4
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 4
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 description 4
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 230000001747 exhibiting effect Effects 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 229920000301 poly(3-hexylthiophene-2,5-diyl) polymer Polymers 0.000 description 4
- 239000000047 product Substances 0.000 description 4
- 238000001771 vacuum deposition Methods 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- NIPNSKYNPDTRPC-UHFFFAOYSA-N N-[2-oxo-2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 NIPNSKYNPDTRPC-UHFFFAOYSA-N 0.000 description 3
- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 150000007513 acids Chemical class 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000011344 liquid material Substances 0.000 description 3
- 230000014759 maintenance of location Effects 0.000 description 3
- 229920001467 poly(styrenesulfonates) Polymers 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 238000004381 surface treatment Methods 0.000 description 3
- 229930192474 thiophene Natural products 0.000 description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 3
- 229910001887 tin oxide Inorganic materials 0.000 description 3
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 2
- YIWGJFPJRAEKMK-UHFFFAOYSA-N 1-(2H-benzotriazol-5-yl)-3-methyl-8-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carbonyl]-1,3,8-triazaspiro[4.5]decane-2,4-dione Chemical compound CN1C(=O)N(c2ccc3n[nH]nc3c2)C2(CCN(CC2)C(=O)c2cnc(NCc3cccc(OC(F)(F)F)c3)nc2)C1=O YIWGJFPJRAEKMK-UHFFFAOYSA-N 0.000 description 2
- HMUNWXXNJPVALC-UHFFFAOYSA-N 1-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperazin-1-yl]-2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethanone Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)N1CCN(CC1)C(CN1CC2=C(CC1)NN=N2)=O HMUNWXXNJPVALC-UHFFFAOYSA-N 0.000 description 2
- FCEHBMOGCRZNNI-UHFFFAOYSA-N 1-benzothiophene Chemical compound C1=CC=C2SC=CC2=C1 FCEHBMOGCRZNNI-UHFFFAOYSA-N 0.000 description 2
- SVTBMSDMJJWYQN-UHFFFAOYSA-N 2-methylpentane-2,4-diol Chemical compound CC(O)CC(C)(C)O SVTBMSDMJJWYQN-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- CONKBQPVFMXDOV-QHCPKHFHSA-N 6-[(5S)-5-[[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperazin-1-yl]methyl]-2-oxo-1,3-oxazolidin-3-yl]-3H-1,3-benzoxazol-2-one Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)N1CCN(CC1)C[C@H]1CN(C(O1)=O)C1=CC2=C(NC(O2)=O)C=C1 CONKBQPVFMXDOV-QHCPKHFHSA-N 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-WFGJKAKNSA-N Dimethyl sulfoxide Chemical compound [2H]C([2H])([2H])S(=O)C([2H])([2H])[2H] IAZDPXIOMUYVGZ-WFGJKAKNSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 2
- 229920001167 Poly(triaryl amine) Polymers 0.000 description 2
- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- ILAHWRKJUDSMFH-UHFFFAOYSA-N boron tribromide Chemical compound BrB(Br)Br ILAHWRKJUDSMFH-UHFFFAOYSA-N 0.000 description 2
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- 239000004148 curcumin Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- SWXVUIWOUIDPGS-UHFFFAOYSA-N diacetone alcohol Chemical compound CC(=O)CC(C)(C)O SWXVUIWOUIDPGS-UHFFFAOYSA-N 0.000 description 2
- IYYZUPMFVPLQIF-UHFFFAOYSA-N dibenzothiophene Chemical compound C1=CC=C2C3=CC=CC=C3SC2=C1 IYYZUPMFVPLQIF-UHFFFAOYSA-N 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000009499 grossing Methods 0.000 description 2
- 125000001072 heteroaryl group Chemical group 0.000 description 2
- AOGQPLXWSUTHQB-UHFFFAOYSA-N hexyl acetate Chemical compound CCCCCCOC(C)=O AOGQPLXWSUTHQB-UHFFFAOYSA-N 0.000 description 2
- 238000004770 highest occupied molecular orbital Methods 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 229910052740 iodine Inorganic materials 0.000 description 2
- 239000000395 magnesium oxide Substances 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000012046 mixed solvent Substances 0.000 description 2
- IBHBKWKFFTZAHE-UHFFFAOYSA-N n-[4-[4-(n-naphthalen-1-ylanilino)phenyl]phenyl]-n-phenylnaphthalen-1-amine Chemical compound C1=CC=CC=C1N(C=1C2=CC=CC=C2C=CC=1)C1=CC=C(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C3=CC=CC=C3C=CC=2)C=C1 IBHBKWKFFTZAHE-UHFFFAOYSA-N 0.000 description 2
- ZPBSAMLXSQCSOX-UHFFFAOYSA-N naphthalene-1,3,6-trisulfonic acid Chemical compound OS(=O)(=O)C1=CC(S(O)(=O)=O)=CC2=CC(S(=O)(=O)O)=CC=C21 ZPBSAMLXSQCSOX-UHFFFAOYSA-N 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- 125000000962 organic group Chemical group 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 2
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 2
- 229920000123 polythiophene Polymers 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 108090000623 proteins and genes Proteins 0.000 description 2
- 239000003586 protic polar solvent Substances 0.000 description 2
- VWDWKYIASSYTQR-UHFFFAOYSA-N sodium nitrate Chemical compound [Na+].[O-][N+]([O-])=O VWDWKYIASSYTQR-UHFFFAOYSA-N 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 125000001424 substituent group Chemical group 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- DCTMXCOHGKSXIZ-UHFFFAOYSA-N (R)-1,3-Octanediol Chemical compound CCCCCC(O)CCO DCTMXCOHGKSXIZ-UHFFFAOYSA-N 0.000 description 1
- 125000004317 1,3,5-triazin-2-yl group Chemical group [H]C1=NC(*)=NC([H])=N1 0.000 description 1
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- KZDTZHQLABJVLE-UHFFFAOYSA-N 1,8-diiodooctane Chemical compound ICCCCCCCCI KZDTZHQLABJVLE-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- 125000006019 1-methyl-1-propenyl group Chemical group 0.000 description 1
- 125000006021 1-methyl-2-propenyl group Chemical group 0.000 description 1
- 125000006018 1-methyl-ethenyl group Chemical group 0.000 description 1
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 1
- 125000006023 1-pentenyl group Chemical group 0.000 description 1
- 125000004206 2,2,2-trifluoroethyl group Chemical group [H]C([H])(*)C(F)(F)F 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- LCZVSXRMYJUNFX-UHFFFAOYSA-N 2-[2-(2-hydroxypropoxy)propoxy]propan-1-ol Chemical compound CC(O)COC(C)COC(C)CO LCZVSXRMYJUNFX-UHFFFAOYSA-N 0.000 description 1
- JQMFQLVAJGZSQS-UHFFFAOYSA-N 2-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperazin-1-yl]-N-(2-oxo-3H-1,3-benzoxazol-6-yl)acetamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)N1CCN(CC1)CC(=O)NC1=CC2=C(NC(O2)=O)C=C1 JQMFQLVAJGZSQS-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- WBIQQQGBSDOWNP-UHFFFAOYSA-N 2-dodecylbenzenesulfonic acid Chemical compound CCCCCCCCCCCCC1=CC=CC=C1S(O)(=O)=O WBIQQQGBSDOWNP-UHFFFAOYSA-N 0.000 description 1
- 125000002941 2-furyl group Chemical group O1C([*])=C([H])C([H])=C1[H] 0.000 description 1
- ZCSHACFHMFHFKK-UHFFFAOYSA-N 2-methyl-1,3,5-trinitrobenzene;2,4,6-trinitro-1,3,5-triazinane Chemical compound [O-][N+](=O)C1NC([N+]([O-])=O)NC([N+]([O-])=O)N1.CC1=C([N+]([O-])=O)C=C([N+]([O-])=O)C=C1[N+]([O-])=O ZCSHACFHMFHFKK-UHFFFAOYSA-N 0.000 description 1
- 125000006020 2-methyl-1-propenyl group Chemical group 0.000 description 1
- 125000006022 2-methyl-2-propenyl group Chemical group 0.000 description 1
- 125000001622 2-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C(*)C([H])=C([H])C2=C1[H] 0.000 description 1
- 125000004105 2-pyridyl group Chemical group N1=C([*])C([H])=C([H])C([H])=C1[H] 0.000 description 1
- 125000000175 2-thienyl group Chemical group S1C([*])=C([H])C([H])=C1[H] 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- 125000003682 3-furyl group Chemical group O1C([H])=C([*])C([H])=C1[H] 0.000 description 1
- 125000003349 3-pyridyl group Chemical group N1=C([H])C([*])=C([H])C([H])=C1[H] 0.000 description 1
- 125000001541 3-thienyl group Chemical group S1C([H])=C([*])C([H])=C1[H] 0.000 description 1
- GZEFZLXJPGMRSP-UHFFFAOYSA-N 37,38,39,40-tetrazanonacyclo[28.6.1.13,10.112,19.121,28.04,9.013,18.022,27.031,36]tetraconta-1(37),2,4,6,8,10,12(39),13,15,17,19,21,23,25,27,29,31,33,35-nonadecaene Chemical compound c1ccc2c3cc4[nH]c(cc5nc(cc6[nH]c(cc(n3)c2c1)c1ccccc61)c1ccccc51)c1ccccc41 GZEFZLXJPGMRSP-UHFFFAOYSA-N 0.000 description 1
- AOJJSUZBOXZQNB-VTZDEGQISA-N 4'-epidoxorubicin Chemical compound O([C@H]1C[C@@](O)(CC=2C(O)=C3C(=O)C=4C=CC=C(C=4C(=O)C3=C(O)C=21)OC)C(=O)CO)[C@H]1C[C@H](N)[C@@H](O)[C@H](C)O1 AOJJSUZBOXZQNB-VTZDEGQISA-N 0.000 description 1
- DFFMMDIDNCWQIV-UHFFFAOYSA-N 4-amino-3-methoxybenzenesulfonic acid Chemical compound COC1=CC(S(O)(=O)=O)=CC=C1N DFFMMDIDNCWQIV-UHFFFAOYSA-N 0.000 description 1
- 125000000339 4-pyridyl group Chemical group N1=C([H])C([H])=C([*])C([H])=C1[H] 0.000 description 1
- YCPXWRQRBFJBPZ-UHFFFAOYSA-N 5-sulfosalicylic acid Chemical compound OC(=O)C1=CC(S(O)(=O)=O)=CC=C1O YCPXWRQRBFJBPZ-UHFFFAOYSA-N 0.000 description 1
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910001148 Al-Li alloy Inorganic materials 0.000 description 1
- 229910015900 BF3 Inorganic materials 0.000 description 1
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 1
- AZSFNTBGCTUQFX-UHFFFAOYSA-N C12=C3C(C4=C5C=6C7=C8C9=C(C%10=6)C6=C%11C=%12C%13=C%14C%11=C9C9=C8C8=C%11C%15=C%16C=%17C(C=%18C%19=C4C7=C8C%15=%18)=C4C7=C8C%15=C%18C%20=C(C=%178)C%16=C8C%11=C9C%14=C8C%20=C%13C%18=C8C9=%12)=C%19C4=C2C7=C2C%15=C8C=4C2=C1C12C3=C5C%10=C3C6=C9C=4C32C1(CCCC(=O)OC)C1=CC=CC=C1 Chemical compound C12=C3C(C4=C5C=6C7=C8C9=C(C%10=6)C6=C%11C=%12C%13=C%14C%11=C9C9=C8C8=C%11C%15=C%16C=%17C(C=%18C%19=C4C7=C8C%15=%18)=C4C7=C8C%15=C%18C%20=C(C=%178)C%16=C8C%11=C9C%14=C8C%20=C%13C%18=C8C9=%12)=C%19C4=C2C7=C2C%15=C8C=4C2=C1C12C3=C5C%10=C3C6=C9C=4C32C1(CCCC(=O)OC)C1=CC=CC=C1 AZSFNTBGCTUQFX-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- 229910021592 Copper(II) chloride Inorganic materials 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 239000002841 Lewis acid Substances 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SUAKHGWARZSWIH-UHFFFAOYSA-N N,N‐diethylformamide Chemical compound CCN(CC)C=O SUAKHGWARZSWIH-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- MKYBYDHXWVHEJW-UHFFFAOYSA-N N-[1-oxo-1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propan-2-yl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(C(C)NC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 MKYBYDHXWVHEJW-UHFFFAOYSA-N 0.000 description 1
- VCUFZILGIRCDQQ-KRWDZBQOSA-N N-[[(5S)-2-oxo-3-(2-oxo-3H-1,3-benzoxazol-6-yl)-1,3-oxazolidin-5-yl]methyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C1O[C@H](CN1C1=CC2=C(NC(O2)=O)C=C1)CNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F VCUFZILGIRCDQQ-KRWDZBQOSA-N 0.000 description 1
- OHLUUHNLEMFGTQ-UHFFFAOYSA-N N-methylacetamide Chemical compound CNC(C)=O OHLUUHNLEMFGTQ-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- GJGINYBUTDYJPL-UHFFFAOYSA-N OC1=C(C=CC=C1)S(=O)(=O)O.C12(C(=O)CC(CC1)C2(C)C)CS(=O)(=O)O Chemical compound OC1=C(C=CC=C1)S(=O)(=O)O.C12(C(=O)CC(CC1)C2(C)C)CS(=O)(=O)O GJGINYBUTDYJPL-UHFFFAOYSA-N 0.000 description 1
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- JAWMENYCRQKKJY-UHFFFAOYSA-N [3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-ylmethyl)-1-oxa-2,8-diazaspiro[4.5]dec-2-en-8-yl]-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]methanone Chemical compound N1N=NC=2CN(CCC=21)CC1=NOC2(C1)CCN(CC2)C(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F JAWMENYCRQKKJY-UHFFFAOYSA-N 0.000 description 1
- MCEWYIDBDVPMES-UHFFFAOYSA-N [60]pcbm Chemical compound C123C(C4=C5C6=C7C8=C9C%10=C%11C%12=C%13C%14=C%15C%16=C%17C%18=C(C=%19C=%20C%18=C%18C%16=C%13C%13=C%11C9=C9C7=C(C=%20C9=C%13%18)C(C7=%19)=C96)C6=C%11C%17=C%15C%13=C%15C%14=C%12C%12=C%10C%10=C85)=C9C7=C6C2=C%11C%13=C2C%15=C%12C%10=C4C23C1(CCCC(=O)OC)C1=CC=CC=C1 MCEWYIDBDVPMES-UHFFFAOYSA-N 0.000 description 1
- JFBZPFYRPYOZCQ-UHFFFAOYSA-N [Li].[Al] Chemical compound [Li].[Al] JFBZPFYRPYOZCQ-UHFFFAOYSA-N 0.000 description 1
- ZVMDAQQBXVFTTI-UHFFFAOYSA-N [Si]OCCC1=CC=CC=C1 Chemical compound [Si]OCCC1=CC=CC=C1 ZVMDAQQBXVFTTI-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 125000002777 acetyl group Chemical group [H]C([H])([H])C(*)=O 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 125000004414 alkyl thio group Chemical group 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- ROOXNKNUYICQNP-UHFFFAOYSA-N ammonium persulfate Chemical compound [NH4+].[NH4+].[O-]S(=O)(=O)OOS([O-])(=O)=O ROOXNKNUYICQNP-UHFFFAOYSA-N 0.000 description 1
- 239000012935 ammoniumperoxodisulfate Substances 0.000 description 1
- 150000001448 anilines Chemical class 0.000 description 1
- 125000000129 anionic group Chemical group 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 125000002078 anthracen-1-yl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C3C([*])=C([H])C([H])=C([H])C3=C([H])C2=C1[H] 0.000 description 1
- 125000000748 anthracen-2-yl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C3C([H])=C([*])C([H])=C([H])C3=C([H])C2=C1[H] 0.000 description 1
- VMPVEPPRYRXYNP-UHFFFAOYSA-I antimony(5+);pentachloride Chemical compound Cl[Sb](Cl)(Cl)(Cl)Cl VMPVEPPRYRXYNP-UHFFFAOYSA-I 0.000 description 1
- YBGKQGSCGDNZIB-UHFFFAOYSA-N arsenic pentafluoride Chemical compound F[As](F)(F)(F)F YBGKQGSCGDNZIB-UHFFFAOYSA-N 0.000 description 1
- 238000007611 bar coating method Methods 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- BEHLMOQXOSLGHN-UHFFFAOYSA-N benzenamine sulfate Chemical group OS(=O)(=O)NC1=CC=CC=C1 BEHLMOQXOSLGHN-UHFFFAOYSA-N 0.000 description 1
- SRSXLGNVWSONIS-UHFFFAOYSA-N benzenesulfonic acid Chemical compound OS(=O)(=O)C1=CC=CC=C1 SRSXLGNVWSONIS-UHFFFAOYSA-N 0.000 description 1
- 229940092714 benzenesulfonic acid Drugs 0.000 description 1
- LJOLGGXHRVADAA-UHFFFAOYSA-N benzo[e][1]benzothiole Chemical compound C1=CC=C2C(C=CS3)=C3C=CC2=C1 LJOLGGXHRVADAA-UHFFFAOYSA-N 0.000 description 1
- BNBQRQQYDMDJAH-UHFFFAOYSA-N benzodioxan Chemical compound C1=CC=C2OCCOC2=C1 BNBQRQQYDMDJAH-UHFFFAOYSA-N 0.000 description 1
- 125000003236 benzoyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C(*)=O 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 150000003519 bicyclobutyls Chemical group 0.000 description 1
- 150000005350 bicyclononyls Chemical group 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- OWBTYPJTUOEWEK-UHFFFAOYSA-N butane-2,3-diol Chemical compound CC(O)C(C)O OWBTYPJTUOEWEK-UHFFFAOYSA-N 0.000 description 1
- 125000004063 butyryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- FJDQFPXHSGXQBY-UHFFFAOYSA-L caesium carbonate Chemical compound [Cs+].[Cs+].[O-]C([O-])=O FJDQFPXHSGXQBY-UHFFFAOYSA-L 0.000 description 1
- 229910000024 caesium carbonate Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000013065 commercial product Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 125000006165 cyclic alkyl group Chemical group 0.000 description 1
- 125000001995 cyclobutyl group Chemical group [H]C1([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- 125000000582 cycloheptyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- ARUKYTASOALXFG-UHFFFAOYSA-N cycloheptylcycloheptane Chemical group C1CCCCCC1C1CCCCCC1 ARUKYTASOALXFG-UHFFFAOYSA-N 0.000 description 1
- HPXRVTGHNJAIIH-UHFFFAOYSA-N cyclohexanol Chemical compound OC1CCCCC1 HPXRVTGHNJAIIH-UHFFFAOYSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- WVIIMZNLDWSIRH-UHFFFAOYSA-N cyclohexylcyclohexane Chemical group C1CCCCC1C1CCCCC1 WVIIMZNLDWSIRH-UHFFFAOYSA-N 0.000 description 1
- 125000006547 cyclononyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- NLUNLVTVUDIHFE-UHFFFAOYSA-N cyclooctylcyclooctane Chemical group C1CCCCCCC1C1CCCCCCC1 NLUNLVTVUDIHFE-UHFFFAOYSA-N 0.000 description 1
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- MAWOHFOSAIXURX-UHFFFAOYSA-N cyclopentylcyclopentane Chemical group C1CCCC1C1CCCC1 MAWOHFOSAIXURX-UHFFFAOYSA-N 0.000 description 1
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- 238000007607 die coating method Methods 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 125000001028 difluoromethyl group Chemical group [H]C(F)(F)* 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- XUCJHNOBJLKZNU-UHFFFAOYSA-M dilithium;hydroxide Chemical compound [Li+].[Li+].[OH-] XUCJHNOBJLKZNU-UHFFFAOYSA-M 0.000 description 1
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 1
- YYLGKUPAFFKGRQ-UHFFFAOYSA-N dimethyldiethoxysilane Chemical compound CCO[Si](C)(C)OCC YYLGKUPAFFKGRQ-UHFFFAOYSA-N 0.000 description 1
- 150000002009 diols Chemical class 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- SZXQTJUDPRGNJN-UHFFFAOYSA-N dipropylene glycol Chemical compound OCCCOCCCO SZXQTJUDPRGNJN-UHFFFAOYSA-N 0.000 description 1
- DOYSNKVXNZSWCT-UHFFFAOYSA-N disilanyl(phenyl)silane Chemical compound [SiH3][SiH2][SiH2]C1=CC=CC=C1 DOYSNKVXNZSWCT-UHFFFAOYSA-N 0.000 description 1
- 229940060296 dodecylbenzenesulfonic acid Drugs 0.000 description 1
- 238000010893 electron trap Methods 0.000 description 1
- 239000003480 eluent Substances 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 125000004705 ethylthio group Chemical group C(C)S* 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 125000003709 fluoroalkyl group Chemical group 0.000 description 1
- 125000004216 fluoromethyl group Chemical group [H]C([H])(F)* 0.000 description 1
- 125000002485 formyl group Chemical group [H]C(*)=O 0.000 description 1
- 229910003472 fullerene Inorganic materials 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 125000006343 heptafluoro propyl group Chemical group 0.000 description 1
- 239000011964 heteropoly acid Substances 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229940051250 hexylene glycol Drugs 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 150000007517 lewis acids Chemical class 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000001989 lithium alloy Substances 0.000 description 1
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 1
- SKEDXQSRJSUMRP-UHFFFAOYSA-N lithium;quinolin-8-ol Chemical compound [Li].C1=CN=C2C(O)=CC=CC2=C1 SKEDXQSRJSUMRP-UHFFFAOYSA-N 0.000 description 1
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 description 1
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- SJCKRGFTWFGHGZ-UHFFFAOYSA-N magnesium silver Chemical compound [Mg].[Ag] SJCKRGFTWFGHGZ-UHFFFAOYSA-N 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- ARYZCSRUUPFYMY-UHFFFAOYSA-N methoxysilane Chemical compound CO[SiH3] ARYZCSRUUPFYMY-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 125000002816 methylsulfanyl group Chemical group [H]C([H])([H])S[*] 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- SFMJNHNUOVADRW-UHFFFAOYSA-N n-[5-[9-[4-(methanesulfonamido)phenyl]-2-oxobenzo[h][1,6]naphthyridin-1-yl]-2-methylphenyl]prop-2-enamide Chemical compound C1=C(NC(=O)C=C)C(C)=CC=C1N1C(=O)C=CC2=C1C1=CC(C=3C=CC(NS(C)(=O)=O)=CC=3)=CC=C1N=C2 SFMJNHNUOVADRW-UHFFFAOYSA-N 0.000 description 1
- 125000006606 n-butoxy group Chemical group 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004708 n-butylthio group Chemical group C(CCC)S* 0.000 description 1
- 125000006610 n-decyloxy group Chemical group 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001298 n-hexoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 1
- 125000004718 n-hexylthio group Chemical group C(CCCCC)S* 0.000 description 1
- 125000006609 n-nonyloxy group Chemical group 0.000 description 1
- 125000006608 n-octyloxy group Chemical group 0.000 description 1
- 125000003935 n-pentoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004712 n-pentylthio group Chemical group C(CCCC)S* 0.000 description 1
- 125000003506 n-propoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004706 n-propylthio group Chemical group C(CC)S* 0.000 description 1
- PAYSBLPSJQBEJR-UHFFFAOYSA-N naphtho[2,3-e][1]benzothiole Chemical compound C1=CC=C2C=C3C(C=CS4)=C4C=CC3=CC2=C1 PAYSBLPSJQBEJR-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 125000005246 nonafluorobutyl group Chemical group FC(F)(F)C(F)(F)C(F)(F)C(F)(F)* 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 125000006340 pentafluoro ethyl group Chemical group FC(F)(F)C(F)(F)* 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- DHRLEVQXOMLTIM-UHFFFAOYSA-N phosphoric acid;trioxomolybdenum Chemical compound O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.OP(O)(O)=O DHRLEVQXOMLTIM-UHFFFAOYSA-N 0.000 description 1
- IYDGMDWEHDFVQI-UHFFFAOYSA-N phosphoric acid;trioxotungsten Chemical compound O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.OP(O)(O)=O IYDGMDWEHDFVQI-UHFFFAOYSA-N 0.000 description 1
- OBCUTHMOOONNBS-UHFFFAOYSA-N phosphorus pentafluoride Chemical compound FP(F)(F)(F)F OBCUTHMOOONNBS-UHFFFAOYSA-N 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 229940051841 polyoxyethylene ether Drugs 0.000 description 1
- 229920000056 polyoxyethylene ether Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 150000004032 porphyrins Chemical class 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 125000001501 propionyl group Chemical group O=C([*])C([H])([H])C([H])([H])[H] 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- ZVJDFJRDKIADMB-UHFFFAOYSA-N quinolin-8-ol;sodium Chemical compound [Na].C1=CN=C2C(O)=CC=CC2=C1 ZVJDFJRDKIADMB-UHFFFAOYSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- PUZPDOWCWNUUKD-UHFFFAOYSA-M sodium fluoride Chemical compound [F-].[Na+] PUZPDOWCWNUUKD-UHFFFAOYSA-M 0.000 description 1
- 239000004317 sodium nitrate Substances 0.000 description 1
- 235000010344 sodium nitrate Nutrition 0.000 description 1
- 229940006186 sodium polystyrene sulfonate Drugs 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- FVRNDBHWWSPNOM-UHFFFAOYSA-L strontium fluoride Chemical compound [F-].[F-].[Sr+2] FVRNDBHWWSPNOM-UHFFFAOYSA-L 0.000 description 1
- 229910001637 strontium fluoride Inorganic materials 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000000967 suction filtration Methods 0.000 description 1
- 125000000446 sulfanediyl group Chemical group *S* 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- PCCVSPMFGIFTHU-UHFFFAOYSA-N tetracyanoquinodimethane Chemical compound N#CC(C#N)=C1C=CC(=C(C#N)C#N)C=C1 PCCVSPMFGIFTHU-UHFFFAOYSA-N 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- VJYJJHQEVLEOFL-UHFFFAOYSA-N thieno[3,2-b]thiophene Chemical compound S1C=CC2=C1C=CS2 VJYJJHQEVLEOFL-UHFFFAOYSA-N 0.000 description 1
- CRUIOQJBPNKOJG-UHFFFAOYSA-N thieno[3,2-e][1]benzothiole Chemical compound C1=C2SC=CC2=C2C=CSC2=C1 CRUIOQJBPNKOJG-UHFFFAOYSA-N 0.000 description 1
- 150000003577 thiophenes Chemical class 0.000 description 1
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 1
- 125000005259 triarylamine group Chemical group 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- JLGNHOJUQFHYEZ-UHFFFAOYSA-N trimethoxy(3,3,3-trifluoropropyl)silane Chemical compound CO[Si](OC)(OC)CCC(F)(F)F JLGNHOJUQFHYEZ-UHFFFAOYSA-N 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 125000003774 valeryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C08G61/12—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule
- C08G61/122—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides
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- C08K5/00—Use of organic ingredients
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Definitions
- the present invention relates to a composition for a hole collection layer of an organic photoelectric conversion element.
- An organic photoelectric conversion element is a device that converts light energy into electrical energy using an organic semiconductor, and examples thereof include organic solar cells.
- An organic solar cell is a solar cell element using an organic substance as an active layer or a charge transport material.
- Organic thin-film solar cells developed by Tan are well known (Non-Patent Documents 1 and 2). All are lightweight, thin film, flexible, roll-to-roll, and other features that are different from the current mainstream inorganic solar cells. Formation is expected.
- organic thin-film solar cells have features such as electrolyte-free and heavy metal compound-free, as well as a recent report of 10.6% photoelectric conversion efficiency (hereinafter abbreviated as PCE) by the UCLA group. For the reason, it has attracted a lot of attention (Non-patent Document 3).
- the organic thin-film solar cell exhibits high photoelectric conversion efficiency even at low illuminance compared to a photoelectric conversion element using an existing silicon-based material, and can be thinned and pixels can be miniaturized. Due to the feature of being able to combine the properties of a color filter, it is attracting attention not only as a solar battery but also as an optical sensor such as an image sensor (Patent Documents 1 and 2 and Non-Patent Document 4). ).
- an organic photoelectric conversion element hereinafter sometimes abbreviated as OPV
- applications such as an optical sensor.
- the organic photoelectric conversion element includes an active layer (photoelectric conversion layer), a charge (hole, electron) collection layer, an electrode (anode, cathode), and the like.
- the active layer and the charge collection layer are generally formed by a vacuum deposition method, but there are problems with the vacuum deposition method in terms of the complexity of the mass production process, the high cost of the apparatus, the utilization efficiency of the material, etc. There is.
- water dispersible high molecular organic conductive materials such as PEDOT / PSS may be used as the coating material for the hole collection layer, but since it is an aqueous dispersion, it is completely free of moisture. Therefore, there is a problem that it is difficult to control the removal and re-absorption, and it is easy to accelerate the deterioration of the element.
- the PEDOT / PSS aqueous dispersion has the property that solids are likely to aggregate, there are problems that coating film defects are likely to occur, clogging and corrosion of the coating apparatus are likely to occur, and heat resistance In terms of performance, it is insufficient, and various problems remain in mass production.
- the present invention has been made in view of the above circumstances, and provides a thin film suitable for a hole collection layer of an organic photoelectric conversion element, and in particular, an organic photoelectric conversion element suitable for production of a reverse stacked organic photoelectric conversion element It aims at providing the composition for positive hole collection layers.
- a polymer containing aniline sulfonic acid substituted with a predetermined electron donating substituent such as an alkoxy group or a derivative thereof as a repeating unit is obtained.
- a uniform solution with high hole transportability and low solubility to active layers and high solubility in protic polar solvents such as alcohol and water is obtained.
- an OPV element has a hole collection layer, an OPV element exhibiting good PCE with a high yield can be obtained, and an electron-accepting dopant material mainly composed of Bronsted acid having a high oxidizing power during the preparation of the solution.
- a composition for a hole collection layer of an organic photoelectric conversion device comprising a charge transporting substance composed of a polyaniline derivative represented by the formula (1), a fluorine-based surfactant, and a solvent; ⁇ Wherein R 1 to R 6 are each independently a hydrogen atom, a halogen atom, a nitro group, a cyano group, a sulfonic acid group, an alkoxy group having 1 to 20 carbon atoms, or a thioalkoxy group having 1 to 20 carbon atoms.
- An alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms, an alkynyl group having 2 to 20 carbon atoms, a haloalkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 20 carbon atoms, and 7 to 7 carbon atoms 20 represents an aralkyl group or an acyl group having 1 to 20 carbon atoms, one of R 1 to R 4 is a sulfonic acid group, and one or more of the remaining R 1 to R 4 are carbon
- composition for hole collection layer containing alkoxysilane 3.
- a composition for a hole collection layer of an organic photoelectric conversion device according to any one of 1 to 4, wherein R 1 is a sulfonic acid group, and R 4 is an alkoxy group having 1 to 20 carbon atoms; 6).
- a composition for a hole collection layer of an organic photoelectric conversion element according to any one of 1 to 5, comprising an electron-accepting dopant substance different from the polyaniline derivative represented by the formula (1); 7).
- X represents O
- A represents a naphthalene ring or an anthracene ring
- B represents a divalent to tetravalent perfluorobiphenyl group
- l represents the number of sulfonic acid groups bonded to A.
- It is an integer satisfying 1 ⁇ l ⁇ 4
- q represents the number of bonds between B and X, and is an integer satisfying 2 to 4.
- a composition for a hole collection layer of an organic photoelectric conversion device according to any one of 1 to 8, wherein the solvent contains one or more solvents selected from alcohol solvents and water; 10.
- a hole collection layer comprising the composition for a hole collection layer of any one of the organic photoelectric conversion elements of 1 to 10, 12
- 12 or 13 organic photoelectric conversion elements wherein the active layer contains a polymer containing a thiophene skeleton in the main chain; 16. 12 or 13 organic photoelectric conversion elements, wherein the active layer comprises a fullerene derivative and a polymer containing a thiophene skeleton in the main chain; 17.
- a charge transporting substance comprising a polyaniline derivative represented by the formula (1); an electron accepting dopant substance different from the polyaniline derivative represented by the formula (1); a fluorosurfactant; and a solvent.
- An alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms, an alkynyl group having 2 to 20 carbon atoms, a haloalkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 20 carbon atoms, and 7 to 7 carbon atoms 20 represents an aralkyl group or an acyl group having 1 to 20 carbon atoms, one of R 1 to R 4 is a sulfonic acid group, and one or more of the remaining R 1 to R 4 are carbon
- the composition for the hole collection layer of the organic photoelectric conversion device of the present invention can only be produced using a charge transporting material made of a polyaniline derivative that is available on the market at a low cost or can be simply synthesized by a known method.
- a charge transporting material made of a polyaniline derivative that is available on the market at a low cost or can be simply synthesized by a known method.
- an organic thin film solar cell excellent in PCE can be obtained.
- a highly uniform thin film can be formed by using the composition for a hole collection layer of the present invention, current leakage is suppressed by using this highly uniform thin film as a hole collection layer, and reverse bias darkening is performed. The current can be kept low.
- the hole collection layer composition of the present invention it is possible to detect a thin film composed of the hole collection layer composition of the present invention by applying it to an element structure similar to an organic thin film solar cell and converting a few photons into electrons.
- the hole collection layer obtained from the composition can also be applied to optical sensor applications such as high-performance image sensor applications.
- the charge transporting substance composed of the polyaniline derivative used in the present invention is excellent in solubility in protic polar solvents such as alcohol and water, and can be prepared using a solvent that does not adversely affect these active layers.
- it contains a fluorine-based surfactant it can be easily formed on the active layer, and therefore, it is suitable for the production of a reverse laminated organic thin film solar cell.
- an electron-accepting dopant substance made of Bronsted acid an OPV element exhibiting higher PCE and exhibiting high durability can be obtained.
- composition for hole collection layers of the organic photoelectric conversion device of the present invention contains a charge transporting material comprising a polyaniline derivative represented by the formula (1), a fluorine-based surfactant, and a solvent.
- R 1 to R 6 are each independently a hydrogen atom, a halogen atom, a nitro group, a cyano group, a sulfonic acid group, an alkoxy group having 1 to 20 carbon atoms, or a thio having 1 to 20 carbon atoms.
- halogen atom examples include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
- alkyl group having 1 to 20 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, and n-pentyl group.
- a chain alkyl group having 1 to 20 carbon atoms such as n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group; cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group , Cycloheptyl group, cyclooctyl group, cyclononyl group, cyclodecyl group, bicyclobutyl group, bicyclopentyl group, bicyclohexyl group, bicycloheptyl group, bicyclooctyl group, bicyclononyl group, bicyclodecyl group, etc. Examples thereof include a cyclic alkyl group.
- alkenyl group having 2 to 20 carbon atoms include ethenyl group, n-1-propenyl group, n-2-propenyl group, 1-methylethenyl group, n-1-butenyl group, n-2-butenyl group, n-3-butenyl group, 2-methyl-1-propenyl group, 2-methyl-2-propenyl group, 1-ethylethenyl group, 1-methyl-1-propenyl group, 1-methyl-2-propenyl group, n- Examples thereof include a 1-pentenyl group, an n-1-decenyl group, and an n-1-eicosenyl group.
- alkynyl group having 2 to 20 carbon atoms examples include ethynyl group, n-1-propynyl group, n-2-propynyl group, n-1-butynyl group, n-2-butynyl group, and n-3-butynyl.
- alkoxy group having 1 to 20 carbon atoms include methoxy group, ethoxy group, n-propoxy group, i-propoxy group, c-propoxy group, n-butoxy group, i-butoxy group, s-butoxy group, t-butoxy group, n-pentoxy group, n-hexoxy group, n-heptyloxy group, n-octyloxy group, n-nonyloxy group, n-decyloxy group, n-undecyloxy group, n-dodecyloxy group, n-tridecyloxy group, n-tetradecyloxy group, n-pentadecyloxy group, n-hexadecyloxy group, n-heptadecyloxy group, n-octadecyloxy group, n-nonadecyloxy group, n-eicosa Nyl
- thioalkoxy group having 1 to 20 carbon atoms include groups in which the oxygen atom of the alkoxy group is substituted with a sulfur atom.
- Specific examples of the thioalkoxy (alkylthio) group having 1 to 20 carbon atoms include methylthio group, ethylthio group, n-propylthio group, isopropylthio group, n-butylthio group, isobutylthio group, s-butylthio group, t-butylthio group.
- n-pentylthio group n-hexylthio group, n-heptylthio group, n-octylthio group, n-nonylthio group, n-decylthio group, n-undecylthio group, n-dodecylthio group, n-tridecylthio group, n-tetra
- haloalkyl group having 1 to 20 carbon atoms examples include groups in which at least one hydrogen atom in the alkyl group is substituted with a halogen atom.
- the halogen atom may be any of chlorine, bromine, iodine and fluorine atoms. Of these, a fluoroalkyl group is preferable, and a perfluoroalkyl group is more preferable.
- fluoromethyl group examples thereof include fluoromethyl group, difluoromethyl group, trifluoromethyl group, pentafluoroethyl group, 2,2,2-trifluoroethyl group, heptafluoropropyl group, 2,2,3,3,3- Pentafluoropropyl group, 2,2,3,3-tetrafluoropropyl group, 2,2,2-trifluoro-1- (trifluoromethyl) ethyl group, nonafluorobutyl group, 4,4,4-trifluoro Butyl group, undecafluoropentyl group, 2,2,3,3,4,4,5,5,5-nonafluoropentyl group, 2,2,3,3,4,4,5,5-octafluoro Pentyl group, tridecafluorohexyl group, 2,2,3,3,4,4,5,5,6,6,6-undecafluorohexyl group, 2,2,3,3,4,4,5 , 5,6,6-Decafluo Hexyl group
- aryl group having 6 to 20 carbon atoms include phenyl group, 1-naphthyl group, 2-naphthyl group, 1-anthryl group, 2-anthryl group, 9-anthryl group, 1-phenanthryl group, 2-phenanthryl group. Group, 3-phenanthryl group, 4-phenanthryl group, 9-phenanthryl group and the like.
- aralkyl group having 7 to 20 carbon atoms include benzyl group, p-methylphenylmethyl group, m-methylphenylmethyl group, o-ethylphenylmethyl group, m-ethylphenylmethyl group, p-ethylphenylmethyl.
- acyl group having 1 to 20 carbon atoms include formyl group, acetyl group, propionyl group, butyryl group, isobutyryl group, valeryl group, isovaleryl group, benzoyl group and the like.
- R 1 to R 4 is a sulfonic acid group, and one or more of the remaining R 1 to R 4 are preferably left.
- Any one of R 1 to R 4 is an electron donating group, an alkoxy group having 1 to 20 carbon atoms, a thioalkoxy group having 1 to 20 carbon atoms, an alkyl group having 1 to 20 carbon atoms, or a carbon number;
- An alkoxy group having 1 to 20 carbon atoms, a thioalkoxy group having 1 to 20 carbon atoms, and an alkyl group having 1 to 20 carbon atoms are preferable, an alk
- R 1 is preferably a sulfonic acid group
- R 4 is preferably alkoxy having 1 to 20 carbon atoms.
- R 2 , R 3 , R 5 and R 6 are preferably all hydrogen atoms.
- the weight average molecular weight of the polyaniline derivative represented by the formula (1) is not particularly limited, but considering the conductivity, the lower limit is usually 200 or more, preferably 1,000 or more, Considering the point of improving the solubility, the upper limit is usually 5,000,000 or less, preferably 500,000 or less.
- the weight average molecular weight is a polystyrene conversion value determined by gel permeation chromatography.
- the polyaniline derivative represented by the formula (1) may be used alone or in combination of two or more compounds.
- the polyaniline derivative represented by the formula (1) may be a commercially available product or a polymerized by a known method using an aniline derivative or the like as a starting material. It is preferable to use one purified by a method such as ion exchange. By using the purified one, the characteristics of the OPV element including a thin film obtained from the composition containing the compound can be further improved.
- the ionization potential of the hole collection layer is preferably a value close to the ionization potential of the p-type semiconductor material in the active layer.
- the absolute value of the difference is preferably 0 to 1 eV, more preferably 0 to 0.5 eV, and still more preferably 0 to 0.2 eV.
- the hole collection layer composition of the present invention may contain an electron-accepting dopant substance for the purpose of adjusting the ionization potential of the charge transporting thin film obtained using the composition.
- the electron-accepting dopant substance is not particularly limited as long as it is soluble in at least one solvent used.
- the electron-accepting dopant material include inorganic strong acids such as hydrogen chloride, sulfuric acid, nitric acid and phosphoric acid; aluminum chloride (III) (AlCl 3 ), titanium tetrachloride (IV) (TiCl 4 ), boron tribromide (BBr 3 ), boron trifluoride ether complex (BF 3 ⁇ OEt 2 ), iron chloride (III) (FeCl 3 ), copper (II) chloride (CuCl 2 ), antimony pentachloride (V) (SbCl 5 ), Lewis acids such as arsenic pentafluoride (V) (AsF 5 ), phosphorus pentafluoride (PF 5 ), tris (4-bromophenyl) aluminum hexachloroantimonate (TBPAH); benzenesulfonic acid, tosylic acid, camphorsulfonic acid Hydroxybenzenesulfonic acid, 5-sulfo
- Bronsted acid that donates H + is particularly preferable, arylsulfonic acid compounds are more preferable, and arylsulfonic acid compounds represented by formula (2) are particularly preferable. It is.
- X represents O
- A represents a naphthalene ring or an anthracene ring
- B represents a divalent to tetravalent perfluorobiphenyl group
- l represents the number of sulfonic acid groups bonded to A.
- the composition of this invention contains a fluorine-type surfactant.
- the fluorine-based surfactant is not particularly limited as long as it contains a fluorine atom, and may be any of cationic, anionic and nonionic, but a fluorine-based nonionic surfactant is preferable.
- at least one fluorine-based nonionic surfactant selected from the following formulas (A1) and (B1) is preferable.
- R represents a monovalent organic group containing a fluorine atom
- n represents an integer of 1 to 20.
- the organic group include an alkyl group having 1 to 40 carbon atoms, an aryl group having 6 to 20 carbon atoms, an aralkyl group having 7 to 20 carbon atoms, and a heteroaryl group having 2 to 20 carbon atoms.
- heteroaryl group examples include 2-thienyl group, 3-thienyl group, 2-furanyl group, 3-furanyl group, 2-oxazolyl group, 4-oxazolyl group, 5-oxazolyl group, 3-isoxazolyl group, 4 -Isoxazolyl group, 5-isoxazolyl group, 2-thiazolyl group, 4-thiazolyl group, 5-thiazolyl group, 3-isothiazolyl group, 4-isothiazolyl group, 5-isothiazolyl group, 2-imidazolyl group, 4-imidazolyl group, 2 -Pyridyl group, 3-pyridyl group, 4-pyridyl group, 2-pyrazyl group, 3-pyrazyl group, 5-pyrazyl group, 6-pyrazyl group, 2-pyrimidyl group, 4-pyrimidyl group, 5-pyrimidyl group, 6 -Pyrimidyl, 3-pyridazyl, 4-pyrida
- perfluoroalkyl polyoxyethylene ester represented by the following (A2) having a perfluoroalkyl group R f having 1 to 40 carbon atoms and perfluoroalkyl polyoxyethylene ether or fluorine telomer alcohol represented by (B2) More preferred is at least one fluorine-based nonionic surfactant selected from:
- n represents the same meaning as described above.
- the fluorosurfactant used in the present invention is available as a commercial product.
- Such commercially available products include Capstone (registered trademark) FS-10, FS-22, FS-30, FS-31, FS-34, FS-35, FS-50, FS-51, FS-60, FS-61, FS-63, FS-64, FS-65, FS-66, FS-81, FS-83, FS-3100; Neugen FN-1287 manufactured by Daiichi Kogyo Seiyaku Co., Ltd. Although it is mentioned, it is not limited to these. In particular, Capstone FS-30, 31, 34, 35, 3100 and Neugen FN-1287, which are nonionic surfactants, are preferable.
- the content of the fluorosurfactant is not particularly limited, but considering the balance between the improvement of film formability on the active layer and the decrease in photoelectric conversion efficiency due to the addition.
- the total amount of the composition is preferably 0.05 to 10% by mass, more preferably 0.05 to 5.0% by mass, still more preferably 0.07 to 2.0% by mass, and 0.10 to 1.% by mass. 0% by mass is more preferable.
- the composition of the present invention preferably contains an alkoxysilane.
- alkoxysilane By including alkoxysilane, the solvent resistance and water resistance of the resulting thin film can be improved, the electron blocking property can be improved, and the HOMO level and LUMO level can be optimized with respect to the active layer.
- the alkoxysilane may be a siloxane-based material.
- any one or more alkoxysilanes among tetraalkoxysilane, trialkoxysilane, dialkoxysilane can be used. In particular, tetraethoxysilane, tetramethoxysilane, phenyltriethoxysilane, phenyltrisilane.
- Methoxysilane, methyltriethoxysilane, methyltrimethoxysilane, 3,3,3-trifluoropropyltrimethoxysilane, dimethyldiethoxysilane and dimethyldimethoxysilane are preferred, and tetraethoxysilane is more preferred.
- the siloxane material include polysiloxanes such as poly (tetraethoxysilane) and poly (phenylethoxysilane) obtained by a reaction such as hydrolysis with respect to the alkoxysilane.
- the amount of alkoxysilane added is not particularly limited as long as the above effect is exhibited, but is preferably 0.0001 to 100 times by mass ratio relative to the polyaniline derivative used in the present invention, and 0.01 to 50 Double is more preferable, and 0.05 to 10 times is even more preferable.
- blend another additive with the composition of this invention, as long as the objective of this invention can be achieved.
- a kind of additive it can select from a well-known thing suitably according to a desired effect, and can be used.
- a highly soluble solvent that can dissolve the polyaniline derivative and the electron-accepting dopant substance satisfactorily can be used.
- Highly soluble solvents can be used singly or in combination of two or more, and the amount used can be 5 to 100% by mass with respect to the total solvent used in the composition.
- Examples of such highly soluble solvents include water; alcohol solvents such as ethanol, 2-propanol, 1-butanol, 2-butanol, s-butanol, t-butanol, 1-methoxy-2-propanol, N Amide systems such as -methylformamide, N, N-dimethylformamide, N, N-diethylformamide, N-methylacetamide, N, N-dimethylacetamide, N-methylpyrrolidone, 1,3-dimethyl-2-imidazolidinone
- An organic solvent such as a solvent may be mentioned.
- at least one selected from water and alcohol solvents is preferable, and water, ethanol, and 2-propanol are more preferable.
- a solvent composed of only one or two or more solvents selected from alcohol solvents and water which does not adversely affect the active layer. It is preferable to use it.
- Both the charge transporting material and the electron-accepting dopant material are preferably completely dissolved or uniformly dispersed in the above-mentioned solvent. In consideration of obtaining the hole collection layer with good reproducibility, it is more preferable that these substances are completely dissolved in the solvent.
- the hole collection layer composition of the present invention has a viscosity of 10 to 200 mPa ⁇ s, particularly 35 to 150 mPa ⁇ s at 25 ° C., in order to improve film forming properties and dischargeability from the coating apparatus.
- the organic solvent may have at least one high-viscosity organic solvent having a boiling point of 50 to 300 ° C., particularly 150 to 250 ° C.
- the high-viscosity organic solvent is not particularly limited.
- cyclohexanol ethylene glycol, 1,3-octylene glycol, diethylene glycol, dipropylene glycol, triethylene glycol, tripropylene glycol, 1,3-butane
- 1,3-butane examples include diol, 2,3-butanediol, 1,4-butanediol, propylene glycol, hexylene glycol and the like.
- the addition ratio of the high-viscosity organic solvent with respect to the total solvent used in the composition of the present invention is preferably within a range in which no solid precipitates.
- the addition ratio is 5 to 80% by mass as long as no solid precipitates. Preferably there is.
- solvents that can provide film flatness during heat treatment for the purpose of improving the wettability to the coated surface, adjusting the surface tension of the solvent, adjusting the polarity, adjusting the boiling point, etc., are used in the composition. It is also possible to mix at a ratio of 1 to 90% by mass, preferably 1 to 50% by mass with respect to the whole.
- Examples of such a solvent include butyl cellosolve, diethylene glycol diethyl ether, diethylene glycol dimethyl ether, diethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, dipropylene glycol monomethyl ether, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, ethyl carbitol, Examples include diacetone alcohol, ⁇ -butyrolactone, ethyl lactate, and n-hexyl acetate.
- the solid content concentration of the composition of the present invention is appropriately set in consideration of the viscosity and surface tension of the composition, the thickness of the thin film to be produced, etc., but is usually 0.1 to 10.0 mass. %, Preferably 0.5 to 5.0% by mass, more preferably 1.0 to 3.0% by mass.
- the mass ratio of the charge transporting substance and the electron-accepting dopant substance is also appropriately set in consideration of the type of charge transporting property, charge transporting substance, etc. that are expressed.
- the electron-accepting dopant material is 0 to 10, preferably 0.1 to 3.0, more preferably 0.2 to 2.0.
- the viscosity of the composition for hole collection layers used in the present invention is appropriately adjusted according to the coating method in consideration of the thickness of the thin film to be produced and the solid content concentration. It is about 0.1 mPa ⁇ s to 50 mPa ⁇ s.
- the charge transporting substance, the electron accepting dopant substance, the solvent, and the like can be mixed in any order. That is, for example, after dissolving a polyaniline derivative in a solvent, a method of dissolving an electron-accepting dopant substance in the solution, a method of dissolving an electron-accepting dopant substance in a solvent, and then dissolving a polyaniline derivative in the solution, Any method of mixing a polyaniline derivative and an electron-accepting dopant substance and then dissolving the mixture by adding it to a solvent can be adopted as long as the solid content is uniformly dissolved or dispersed in the solvent.
- the order of adding the fluorosurfactant and alkoxysilane is also arbitrary.
- the composition is prepared in an inert gas atmosphere at normal temperature and pressure.
- the composition is prepared in an air atmosphere (the presence of oxygen). Below), or while heating.
- the composition described above is applied to the anode in the case of a forward stacked organic thin film solar cell and fired on the active layer in the case of a reverse stacked organic thin film solar cell. Layers can be formed.
- drop casting method, spin coating method, blade coating method, dip coating method, roll coating method, bar coating method, die coating method What is necessary is just to employ
- the coating is performed in an inert gas atmosphere at normal temperature and pressure, but in an air atmosphere (in the presence of oxygen) unless the compound in the composition is decomposed or the composition is largely changed. It may be performed while heating.
- the film thickness is not particularly limited, but in any case, it is preferably about 0.1 to 500 nm, more preferably about 1 to 100 nm.
- Methods for changing the film thickness include methods such as changing the solid content concentration in the composition and changing the amount of solution at the time of coating.
- Order-stacked organic thin film solar cell [formation of anode layer]: a step of forming a layer of anode material on the surface of a transparent substrate to produce a transparent electrode
- anode materials indium tin oxide (ITO), indium Inorganic oxides such as zinc oxide (IZO), metals such as gold, silver, and aluminum, high-charge transporting organic compounds such as polythiophene derivatives and polyaniline derivatives can be used. Of these, ITO is most preferred.
- the transparent substrate a substrate made of glass or transparent resin can be used.
- the method of forming the anode material layer is appropriately selected according to the properties of the anode material.
- a dry process such as a vacuum deposition method or a sputtering method is selected in the case of a hardly soluble or hardly dispersible sublimation material, and in the case of a solution material or a dispersion material, the viscosity and surface tension of the composition are desired.
- an optimum one of the above-described various wet process methods is adopted.
- a commercially available transparent anode substrate can also be used.
- the manufacturing method of the organic thin-film solar cell of this invention does not include the process of forming an anode layer.
- the manufacturing method of the organic thin-film solar cell of this invention does not include the process of forming an anode layer.
- a transparent anode substrate using an inorganic oxide such as ITO as an anode material it is preferably used after washing with a detergent, alcohol, pure water or the like before laminating the upper layer.
- surface treatment such as UV ozone treatment or oxygen-plasma treatment immediately before use.
- the anode material is mainly composed of an organic material, the surface treatment may not be performed.
- Step of forming a hole collection layer on the formed anode material layer Step of forming a hole collection layer on the formed anode material layer According to the above method, the hole collection layer is formed on the anode material layer using the composition of the present invention. Form a stack.
- the active layer is an n layer which is a thin film made of an n-type semiconductor material and a thin film made of a p-type semiconductor material. Even if it laminates
- n-type semiconductor materials include fullerene, [6,6] -phenyl-C 61 -butyric acid methyl ester (PC 61 BM), [6,6] -phenyl-C 71 -butyric acid methyl ester (PC 71 BM), and the like. Can be mentioned.
- the p-type semiconductor material is described in regioregular poly (3-hexylthiophene) (P3HT), PTB7 represented by the following formula (4), Japanese Patent Application Laid-Open No. 2009-158921 and International Publication No. 2010/008672.
- polymers having a thiophene skeleton in the main chain phthalocyanines such as CuPC and ZnPC, and porphyrins such as tetrabenzoporphyrin.
- thiophene skeleton in the main chain refers to a divalent aromatic ring composed only of thiophene, or thienothiophene, benzothiophene, dibenzothiophene, benzodithiophene, naphthothiophene, naphthodithiophene, anthrathiophene, anthracodi It represents a divalent fused aromatic ring containing one or more thiophenes such as thiophene, and these may be substituted with the substituents represented by R 1 to R 6 above.
- the active layer is formed by selecting the above-described dry processes when the active layer material is a hardly soluble sublimation material.
- the active layer material is a solution material or dispersion material
- the viscosity and surface of the composition are selected. In consideration of tension, desired thin film thickness, and the like, an optimum one of the various wet process methods described above is employed.
- Step of forming an electron collection layer on the formed active layer If necessary, between the active layer and the cathode layer for the purpose of improving the efficiency of charge transfer, etc.
- An electron collection layer may be formed.
- Materials for forming the electron collection layer include lithium oxide (Li 2 O), magnesium oxide (MgO), alumina (Al 2 O 3 ), lithium fluoride (LiF), sodium fluoride (NaF), and magnesium fluoride.
- the various dry processes described above are selected, and in the case of a solution material or a dispersion liquid material, the method of forming the electron collection layer is selected.
- an optimum one of the various wet process methods described above is employed.
- cathode layer Step of forming a cathode layer on the formed electron collection layer
- cathode materials include aluminum, magnesium-silver alloy, aluminum-lithium alloy, lithium, sodium, potassium, cesium, calcium
- examples include metals such as barium, silver and gold, inorganic oxides such as indium tin oxide (ITO) and indium zinc oxide (IZO), and high charge transporting organic compounds such as polythiophene derivatives and polyaniline derivatives.
- ITO indium tin oxide
- IZO indium zinc oxide
- These cathode materials can be laminated or mixed for use.
- the cathode layer is formed in the same manner as described above when the cathode layer material is a poorly soluble, hardly dispersible sublimable material, and the various dry processes described above are selected. In consideration of the viscosity and surface tension of the film, the desired thickness of the thin film, etc., an optimum one of the various wet process methods described above is employed.
- a carrier block layer may be provided between arbitrary layers for the purpose of controlling photocurrent rectification.
- a carrier blocking layer usually an electron blocking layer is inserted between the active layer and the hole collection layer or anode, and a hole blocking layer is inserted between the active layer and the electron collection layer or cathode. In many cases, this is not the case.
- the material for forming the hole blocking layer include titanium oxide, zinc oxide, tin oxide, bathocuproine (BCP), 4,7-diphenyl 1,10-phenanthroline (BPhen), and the like.
- Examples of the material for forming the electron blocking layer include triarylamines such as N, N′-di (1-naphthyl) -N, N′-diphenylbenzidine ( ⁇ -NPD) and poly (triarylamine) (PTAA). Materials and the like.
- the carrier block layer is formed by selecting the various dry processes described above when the carrier block layer material is a poorly soluble, hardly dispersible sublimation material, and when the carrier block layer material is a solution material or a dispersion material, In consideration of the viscosity and surface tension of the composition, the desired thickness of the thin film, etc., an optimum one of the various wet process methods described above is employed.
- (2) Reverse stacked organic thin film solar cell [formation of cathode layer]: a step of forming a cathode material layer on the surface of a transparent substrate to produce a transparent cathode substrate.
- FTO fluorine-doped tin oxide
- examples of the transparent substrate include those exemplified for the above-mentioned normal layered anode material.
- the dry process described above is selected in the case of a hardly soluble or hardly dispersible sublimable material, and in the case of a solution material or a dispersion liquid material, the viscosity of the composition is determined.
- the manufacturing method of the organic thin-film solar cell of this invention does not include the process of forming a cathode layer.
- the same cleaning treatment or surface treatment as that of a forward laminated anode material may be performed.
- Step of forming an electron collection layer on the formed cathode If necessary, electrons are placed between the active layer and the cathode layer for the purpose of improving the efficiency of charge transfer.
- a collection layer may be formed.
- the material for forming the electron collection layer include zinc oxide (ZnO), titanium oxide (TiO), tin oxide (SnO), and the like, in addition to the materials exemplified in the above-described orderly stacked material.
- the dry process described above is selected in the case of a hardly soluble or hardly dispersible sublimation material, and in the case of a solution material or a dispersion liquid material, the viscosity and surface tension of the composition, desired In consideration of the thickness of the thin film to be processed, an optimum one of the various wet process methods described above is employed.
- a method of forming an inorganic oxide layer by forming a precursor layer of an inorganic oxide on a cathode using a wet process (particularly, spin coating or slit coating) and firing it may be employed.
- the active layer is an n layer that is a thin film made of an n-type semiconductor material and a p layer that is a thin film made of a p-type semiconductor material. Or a non-laminated thin film made of a mixture of these materials.
- the n-type and p-type semiconductor materials include the same materials as those exemplified for the above-described forward-stacked semiconductor materials, and examples of the n-type materials include PC 61 BM and PC 71 BM. Polymers containing a thiophene skeleton in the main chain such as PTB7 are preferred.
- the method for forming the active layer is also the same as the method described for the above-described orderly stacked type active layer.
- Step of forming a hole collection layer on the formed layer of active layer material According to the above method, the composition of the present invention is used on the layer of active layer material. A hole collection layer is formed.
- Step of forming an anode layer on the formed hole collection layer Examples of the anode material include the same materials as the above-mentioned layered anode materials. Is the same as the cathode layer of the forward lamination type.
- a carrier block layer may be provided between arbitrary layers for the purpose of controlling the rectification property of the photocurrent, if necessary.
- Examples of the material for forming the hole blocking layer and the material for forming the electron blocking layer include those described above, and the method for forming the carrier blocking layer is also the same as described above.
- the OPV device manufactured by the method exemplified above is again introduced into the glove box and sealed in an inert gas atmosphere such as nitrogen in order to prevent device deterioration due to the atmosphere.
- the function as a solar cell can be exhibited, or the solar cell characteristics can be measured.
- a sealing method a concave glass substrate with a UV curable resin attached to the end is attached to the film forming surface side of the organic thin film solar cell element in an inert gas atmosphere, and the resin is cured by UV irradiation. Examples of the method include performing a film sealing type sealing by a technique such as sputtering under vacuum.
- composition for hole collection layer 1 [Example 1-1] 750 mg of polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 was dissolved in 24.3 g of distilled water to prepare a brown solution having a concentration of 3.0% by mass. To the obtained brown solution, 0.1% by mass of a fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was added to the whole brown solution, and filtered through a syringe filter having a pore size of 0.45 ⁇ m. A hole collecting layer composition B1 was obtained.
- FS-30 fluorine-based nonionic surfactant
- Example 1-2 375 mg of polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 was dissolved in 24.6 g of distilled water to prepare a brown solution having a concentration of 1.5% by mass. To the obtained brown solution, 0.1% by mass of a fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was added to the whole brown solution, and filtered through a syringe filter having a pore size of 0.45 ⁇ m. A composition B2 for a hole collection layer was obtained.
- FS-30 fluorine-based nonionic surfactant
- Example 1-3 250 mg of the polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 and 125 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of International Publication No. 2006/025342 were added to 24.6 g of distilled water. And a brown solution having a concentration of 1.5% by mass was prepared. To the obtained brown solution, 0.1% by mass of a fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was added to the whole brown solution, and filtered through a syringe filter having a pore size of 0.45 ⁇ m. A hole collection layer composition B3 was obtained.
- FS-30 fluorine-based nonionic surfactant
- Example 1-4 In the same manner as in Example 1-1, except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FS-34, manufactured by DuPont), holes were formed. Collection layer composition B4 was obtained.
- Example 1-5 In the same manner as in Example 1-2, except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FS-34, manufactured by DuPont), holes were formed. Collection layer composition B5 was obtained.
- Example 1-6 In the same manner as in Example 1-3, except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FS-34, manufactured by DuPont), holes were formed. Collection layer composition B6 was obtained.
- Example 1-7 Except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.), Example 1-1 and Similarly, composition B7 for hole collection layers was obtained.
- fluorine-based nonionic surfactant FS-30, manufactured by DuPont
- FN-1287 manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-8 Example 1-2, except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.). Thus, a hole collection layer composition B8 was obtained.
- FS-30 fluorine-based nonionic surfactant
- FN-1287 fluorine-based nonionic surfactant manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-9 Except that the fluorine-based nonionic surfactant (FS-30, manufactured by DuPont) was changed to a fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.), Example 1-3 and Similarly, composition B9 for hole collection layers was obtained.
- fluorine-based nonionic surfactant FS-30, manufactured by DuPont
- FN-1287 manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-10 125 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of the polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 and International Publication No. 2006/025342 was added to 12.1 g of distilled water. And a brown solution having a concentration of 3.0% by mass was prepared. To the obtained brown solution, 0.1% by mass of a fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was added to the whole brown solution, and a syringe having a pore size of 0.45 ⁇ m. It filtered with the filter and obtained composition B10 for positive hole collection layers.
- a fluorine-based nonionic surfactant FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-11 Hole trapping was performed in the same manner as in Example 1-9 except that the addition amount of the fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was changed to 0.5% by mass. A layer-collecting composition B11 was obtained.
- the fluorine-based nonionic surfactant FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-12 To 4.41 g of AquaPASS-01X (manufactured by Mitsubishi Chemical Corporation, 5.1 mass% aqueous solution), 3.20 g of distilled water and 7.39 g of ethanol were added to prepare a brown solution with a concentration of 1.5 mass%. Fluorine nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was added to the obtained brown solution in an amount of 0.5% by mass based on the whole brown solution, and a syringe having a pore size of 0.45 ⁇ m. It filtered with the filter and obtained composition B12 for positive hole collection layers.
- FN-1287 manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-13 100 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of WO 2006/025342 was dissolved in 6.13 g of distilled water, and AquaPASS-01X (manufactured by Mitsubishi Chemical Corporation, (5.1 mass% aqueous solution) 3.92 g and 9.85 g ethanol were added to prepare a brown solution having a concentration of 1.5 mass%.
- AquaPASS-01X manufactured by Mitsubishi Chemical Corporation, (5.1 mass% aqueous solution) 3.92 g and 9.85 g ethanol were added to prepare a brown solution having a concentration of 1.5 mass%.
- Fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was added to the obtained brown solution in an amount of 0.7% by mass with respect to the whole brown solution, and a syringe having a pore size of 0.45 ⁇ m. It filtered with the filter and obtained composition B13 for positive hole collection layers.
- Example 1-14 200 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of WO 2006/025342 was dissolved in 7.99 g of distilled water, and AquaPASS-01X (manufactured by Mitsubishi Chemical Corporation, (5.1 mass% aqueous solution) 1.96 g and 9.85 g ethanol were added to prepare a brown solution having a concentration of 1.5 mass%. To the obtained brown solution, 4.0% by mass of a fluorine-based nonionic surfactant (FS-35, manufactured by DuPont, 25% by mass aqueous solution) is added to the whole brown solution, and a syringe filter having a pore size of 0.45 ⁇ m. To obtain a composition B14 for hole collection layer.
- FS-35 fluorine-based nonionic surfactant
- Example 1-15 200 mg of a 1,3,6-naphthalenetrisulfonic acid 20% by weight aqueous solution (FUNCHEM-NTSH (20), manufactured by Toyama Pharmaceutical Co., Ltd.) was dissolved in 7.99 g of distilled water, and AquaPASS-01X (Mitsubishi Chemical Corporation) (Manufactured, 5.1 mass% aqueous solution) 1.96 g and ethanol 9.85 g were added to prepare a brown solution having a concentration of 1.5 mass%.
- FUNCHEM-NTSH a 1,3,6-naphthalenetrisulfonic acid 20% by weight aqueous solution
- AquaPASS-01X Mitsubishi Chemical Corporation
- a fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was added to the whole brown solution, and a syringe having a pore size of 0.45 ⁇ m. It filtered with the filter and obtained composition B15 for positive hole collection layers.
- Example 1-16 200 mg of a 20% by weight aqueous solution of polystyrene sulfonic acid (manufactured by Toyama Pharmaceutical Co., Ltd., FUNCHEM-PSSH (20), molecular weight 14,000) was dissolved in 7.99 g of distilled water, and AquaPASS-01X (manufactured by Mitsubishi Chemical Corporation) (5.1 mass% aqueous solution) 1.96 g and 9.85 g ethanol were added to prepare a brown solution having a concentration of 1.5 mass%.
- polystyrene sulfonic acid manufactured by Toyama Pharmaceutical Co., Ltd., FUNCHEM-PSSH (20), molecular weight 14,000
- AquaPASS-01X manufactured by Mitsubishi Chemical Corporation
- Fluorine nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was added to the obtained brown solution in an amount of 0.5% by mass based on the whole brown solution, and a syringe having a pore size of 0.45 ⁇ m. The mixture was filtered with a filter to obtain a hole collection layer composition B16.
- the hole collection layer composition B1 prepared in Example 1-1 was applied onto the active layer by a spin coating method, and then heated at 120 ° C. for 10 minutes using a hot plate. A collection layer was formed. The film thickness of the hole collection layer was about 30 nm.
- the laminated substrate is placed in a vacuum vapor deposition apparatus and evacuated until the degree of vacuum in the apparatus becomes 1 ⁇ 10 ⁇ 3 Pa or less, and a silver layer serving as an anode is formed to a thickness of 80 nm by resistance heating.
- the reverse laminated OPV element in which the area of the portion where the stripe-like ITO layer and the silver layer intersect is 2 mm ⁇ 2 mm was produced.
- Example 2-2 to 2-11 A reverse stacked OPV element was produced in the same manner as in Example 2-1, except that the hole collection layer compositions B2 to B11 were used instead of the hole collection layer composition B1.
- Example 2-12 A 20 mm ⁇ 20 mm glass substrate obtained by patterning the ITO transparent conductive layer serving as the cathode into a 2 mm ⁇ 20 mm stripe was subjected to UV / ozone treatment for 15 minutes. A solution of zinc oxide (manufactured by Genes' Ink) serving as an electron collection layer was dropped onto this substrate, and a film was formed by spin coating. The film thickness of the electron collection layer was about 20 nm. Thereafter, in the glove box substituted with an inert gas, the solution A1 obtained in Preparation Example 1 was dropped onto the formed electron collection layer, and a film was formed by spin coating to form an active layer.
- zinc oxide manufactured by Genes' Ink
- the hole collection layer composition B12 prepared in Example 1-12 was applied by spin coating, and then dried at room temperature to form a hole collection layer.
- the film thickness of the hole collection layer was about 50 nm.
- the laminated substrate is placed in a vacuum vapor deposition apparatus and evacuated until the degree of vacuum in the apparatus becomes 1 ⁇ 10 ⁇ 3 Pa or less, and a silver layer serving as an anode is formed to a thickness of 80 nm by resistance heating.
- the reverse laminated OPV element in which the area of the portion where the stripe-like ITO layer and the silver layer intersect is 2 mm ⁇ 2 mm was produced. Further, annealing was performed by heating at 60 ° C. for 30 minutes using a hot plate.
- Examples 2-13 to 2-16 A reverse stacked OPV device was produced in the same manner as in Example 2-12 except that the hole collection layer compositions B13 to B16 were used instead of the hole collection layer composition B12.
- Example 2-1 A reverse stacked OPV element was produced in the same manner as in Example 2-1, except that the hole collection layer composition B1 was not used.
- composition for hole collection layer 2 [Example 1-17] 81.9 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of the polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 and International Publication No. 2006/025342 was added to distilled water 13 0.0 g and 13.0 g of ethanol were dissolved, and 536 mg of tetraethoxysilane was added to prepare a brown solution having a concentration of 3.0% by mass.
- the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of the polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 and International Publication No. 2006/025342 was added to distilled water 13 0.0 g and 13.0 g of ethanol were dissolved, and 536 mg of tetraethoxysilane was added to prepare a brown solution having a concentration of 3.0% by mass.
- fluorine-based nonionic surfactant (FS-35, manufactured by DuPont) was added in an amount of 0.5% by mass with respect to the whole brown solution, and filtered through a syringe filter having a pore size of 0.45 ⁇ m.
- the hole collection layer composition B17 was obtained.
- Example 1-18 124 mg of the polymethoxyaniline sulfonic acid obtained in Synthesis Example 1 and 61.9 mg of the aryl sulfonic acid compound A represented by the above formula (2-1) synthesized based on the description of International Publication No. 2006/025342 were added to distilled water 13 0.0 g and 13.0 g of ethanol were dissolved, and 619 mg of tetraethoxysilane was added to prepare a brown solution having a concentration of 3.0% by mass.
- fluorine-based nonionic surfactant (FS-35, manufactured by DuPont) was added in an amount of 0.5% by mass with respect to the whole brown solution, and filtered through a syringe filter having a pore size of 0.45 ⁇ m.
- a hole collection layer composition B18 was obtained.
- Example 1-19 The same procedure as in Example 1-17 except that the fluorine-based nonionic surfactant was changed to FN-1287 (Daiichi Kogyo Seiyaku Co., Ltd.) and 0.3% by mass was added to the whole brown solution. , Composition B19 for hole collection layer was obtained.
- Example 1-20 The same procedure as in Example 1-18 except that the fluorine-based nonionic surfactant was changed to FN-1287 (Daiichi Kogyo Seiyaku Co., Ltd.) and 0.3% by mass was added to the whole brown solution. And composition B20 for hole collection layers was obtained.
- Example 1-21 Hole trapping was carried out in the same manner as in Example 1-19 except that the addition amount of the fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was changed to 0.5% by mass. Layering composition B21 was obtained.
- the fluorine-based nonionic surfactant FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 1-22 Hole trapping was carried out in the same manner as in Example 1-20, except that the addition amount of the fluorine-based nonionic surfactant (FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.) was changed to 0.5% by mass. Layering composition B22 was obtained.
- the fluorine-based nonionic surfactant FN-1287, manufactured by Daiichi Kogyo Seiyaku Co., Ltd.
- Example 3-1 Preparation of hole collection layer and evaluation of water resistance
- the hole collection layer composition B12 prepared in Example 1-12 was applied by spin coating. This substrate was heated at 120 ° C. for 10 minutes using a hot plate to form a hole collection layer.
- Examples 3-2 to 3-6 A hole collection layer was formed in the same manner as in Example 3-1, except that the hole collection layer compositions B13 to B17 were used instead of the hole collection layer composition B12.
- the OPV element produced from the composition of the present invention maintains the HTL characteristics even after the light resistance test and exhibits high light resistance.
- Example 5-2 A reverse stacked OPV element was produced in the same manner as in Example 5-1, except that the hole collection layer composition B13 was used instead of the hole collection layer composition B12.
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Abstract
Description
有機太陽電池は、活性層や電荷輸送物質に有機物を使用した太陽電池素子であり、M.グレッツェルによって開発された色素増感太陽電池と、C.W.タンによって開発された有機薄膜太陽電池とがよく知られている(非特許文献1,2)。
いずれも軽量・薄膜で、フレキシブル化可能である点、ロール・トゥ・ロールでの生産が可能である点など、現在主流の無機系太陽電池とは異なる特長を持っていることから、新たな市場形成が期待されている。
中でも、有機薄膜太陽電池は、電解質フリー、重金属化合物フリー等の特長を持つうえに、最近、UCLAらのグループによって光電変換効率(以下PCEと略す)10.6%の報告がなされたことなどの理由から、大きな注目を集めている(非特許文献3)。
有機光電変換素子は、活性層(光電変換層)、電荷(正孔、電子)捕集層、および電極(陽極、陰極)等を備えて構成される。
これらの中でも活性層および電荷捕集層は、一般に真空蒸着法によって形成されているが、真空蒸着法には、量産プロセスによる複雑性、装置の高コスト化、材料の利用効率等の点で問題がある。
しかもPEDOT/PSS水分散液は、固形分が凝集し易いという性質を有しているため、塗布膜の欠陥が生じやすい、塗布装置の目詰まりや腐食を発生させやすいという問題があるうえ、耐熱性という点でも不十分であり、量産化する上で種々の課題が残されている。
1. 式(1)で表されるポリアニリン誘導体からなる電荷輸送性物質と、フッ素系界面活性剤と、溶媒とを含むことを特徴とする有機光電変換素子の正孔捕集層用組成物、
mおよびnは、それぞれ、0≦m≦1、0≦n≦1、かつ、m+n=1を満たす数である。}
2. アルコキシシランを含む1の正孔補集層用組成物、
3. 前記フッ素系界面活性剤が、フッ素系ノニオン性界面活性剤である1または2の有機光電変換素子の正孔捕集層用組成物、
4. 前記フッ素系ノニオン性界面活性剤が、下記式(A2)および(B2)から選ばれる少なくとも1種である3の有機光電変換素子の正孔捕集層用組成物、
5. 前記R1が、スルホン酸基であり、前記R4が、炭素数1~20のアルコキシ基である1~4のいずれかの有機光電変換素子の正孔捕集層用組成物、
6. 前記式(1)で表されるポリアニリン誘導体とは異なる電子受容性ドーパント物質を含む1~5のいずれかの有機光電変換素子の正孔捕集層用組成物、
7. 前記電子受容性ドーパント物質が、ブレンステッド酸である6の有機光電変換素子の正孔捕集層用組成物、
8. 前記電子受容性ドーパント物質が、式(2)で表されるアリールスルホン酸化合物である7の有機光電変換素子の正孔捕集層用組成物、
9. 前記溶媒が、アルコール系溶媒および水から選ばれる1種または2種以上の溶媒を含む1~8のいずれかの有機光電変換素子の正孔捕集層用組成物、
10. 前記有機光電変換素子が、有機薄膜太陽電池、色素増感太陽電池または光センサーである1~9のいずれかの有機光電変換素子の正孔捕集層用組成物、
11. 1~10のいずれかの有機光電変換素子の正孔捕集層用組成物を用いてなる正孔捕集層、
12. 11の正孔捕集層を有する有機光電変換素子、
13. 11の正孔捕集層と、それに接するように設けられた活性層とを有する有機光電変換素子、
14. 前記活性層が、フラーレン誘導体を含む12または13の有機光電変換素子、
15. 前記活性層が、主鎖にチオフェン骨格を含むポリマーを含む12または13の有機光電変換素子、
16. 前記活性層が、フラーレン誘導体および主鎖にチオフェン骨格を含むポリマーを含む12または13の有機光電変換素子、
17. 逆積層型である12~16のいずれかの有機光電変換素子、
18. 前記有機光電変換素子が、有機薄膜太陽電池または光センサーである12~17のいずれかの有機光電変換素子、
19. トップ陽極構造を有する12~18のいずれかの有機光電変換素子、
20. 式(1)で表されるポリアニリン誘導体からなる電荷輸送性物質と、この式(1)で表されるポリアニリン誘導体とは異なる電子受容性ドーパント物質と、フッ素系界面活性剤と、溶媒とを含むことを特徴とする電荷輸送性組成物、
21. アルコキシシランを含む20の電荷輸送性組成物、
22. 前記電子受容性ドーパント物質が、式(2)で表されるアリールスルホン酸化合物である20または21の電荷輸送性組成物
を提供する。
また、本発明で用いるポリアニリン誘導体からなる電荷輸送性物質は、アルコールや水等のプロトン性極性溶媒に対する溶解性に優れ、これらの活性層に悪影響を与えにくい溶媒を用いて組成物を調製でき、しかも、フッ素系界面活性剤を含んでいるため活性層上に容易に成膜できるため、逆積層型有機薄膜太陽電池の作製にも適している。
さらに、ブレンステッド酸からなる電子受容性ドーパント物質を添加することで、より高いPCEを示し、高耐久性を発現するOPV素子が得られる。
本発明の有機光電変換素子の正孔捕集層用組成物は、式(1)で表されるポリアニリン誘導体からなる電荷輸送性物質と、フッ素系界面活性剤と、溶媒とを含む。
炭素数1~20のアルキル基の具体例としては、メチル基、エチル基、n-プロピル基、イソプロピル基、n-ブチル基、イソブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、n-ヘキシル基、n-ヘプチル基、n-オクチル基、n-ノニル基、n-デシル基等の炭素数1~20の鎖状アルキル基;シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロオクチル基、シクロノニル基、シクロデシル基、ビシクロブチル基、ビシクロペンチル基、ビシクロヘキシル基、ビシクロヘプチル基、ビシクロオクチル基、ビシクロノニル基、ビシクロデシル基等の炭素数3~20の環状アルキル基等が挙げられる。
炭素数1~20のチオアルコキシ(アルキルチオ)基の具体例としては、メチルチオ基、エチルチオ基、n-プロピルチオ基、イソプロピルチオ基、n-ブチルチオ基、イソブチルチオ基、s-ブチルチオ基、t-ブチルチオ基、n-ペンチルチオ基、n-ヘキシルチオ基、n-ヘプチルチオ基、n-オクチルチオ基、n-ノニルチオ基、n-デシルチオ基、n-ウンデシルチオ基、n-ドデシルチオ基、n-トリデシルチオ基、n-テトラデシルチオ基、n-ペンタデシルチオ基、n-ヘキサデシルチオ基、n-ヘプタデシルチオ基、n-オクタデシルチオ基、n-ノナデシルチオ基、n-エイコサニルチオ基等が挙げられる。
その具体例としては、フルオロメチル基、ジフルオロメチル基、トリフルオロメチル基、ペンタフルオロエチル基、2,2,2-トリフルオロエチル基、ヘプタフルオロプロピル基、2,2,3,3,3-ペンタフルオロプロピル基、2,2,3,3-テトラフルオロプロピル基、2,2,2-トリフルオロ-1-(トリフルオロメチル)エチル基、ノナフルオロブチル基、4,4,4-トリフルオロブチル基、ウンデカフルオロペンチル基、2,2,3,3,4,4,5,5,5-ノナフルオロペンチル基、2,2,3,3,4,4,5,5-オクタフルオロペンチル基、トリデカフルオロヘキシル基、2,2,3,3,4,4,5,5,6,6,6-ウンデカフルオロヘキシル基、2,2,3,3,4,4,5,5,6,6-デカフルオロヘキシル基、3,3,4,4,5,5,6,6,6-ノナフルオロヘキシル基等が挙げられる。
炭素数1~20のアシル基の具体例としては、ホルミル基、アセチル基、プロピオニル基、ブチリル基、イソブチリル基、バレリル基、イソバレリル基、ベンゾイル基等が挙げられる。
置換位置は特に限定されるものではないが、本発明では、R1がスルホン酸基であることが好ましく、また、R4が炭素数1~20のアルコキシであることが好ましい。
さらに、R2、R3、R5およびR6は、いずれも水素原子であることが好ましい。
また、式(1)で表されるポリアニリン誘導体は、市販品を用いても、アニリン誘導体などを出発原料とした公知の方法によって重合したものを用いてもよいが、いずれの場合も再沈殿やイオン交換等の方法により精製されたものを用いることが好ましい。精製したものを用いることで、当該化合物を含む組成物から得られた薄膜を備えたOPV素子の特性をより高めることができる。
したがって、本発明の正孔捕集層用組成物には、これを用いて得られる電荷輸送性薄膜のイオン化ポテンシャルを調節することを目的として、電子受容性ドーパント物質を含んでいてもよい。
電子受容性ドーパント物質としては、使用する少なくとも1種の溶媒に溶解するものであれば、特に限定されない。
フッ素系界面活性剤としては、フッ素原子を含有している限り特に限定されるものではなく、カチオン性、アニオン性、ノニオン性のいずれでもよいが、フッ素系ノニオン性界面活性剤が好適であり、特に、下記式(A1)および(B1)から選ばれる少なくとも1種のフッ素系ノニオン性界面活性剤が好ましい。
有機基の具体例としては、炭素数1~40のアルキル基、炭素数6~20のアリール基、炭素数7~20のアラルキル基、炭素数2~20のヘテロアリール基等が挙げられる。
ヘテロアリール基の具体例としては、2-チエニル基、3-チエニル基、2-フラニル基、3-フラニル基、2-オキサゾリル基、4-オキサゾリル基、5-オキサゾリル基、3-イソオキサゾリル基、4-イソオキサゾリル基、5-イソオキサゾリル基、2-チアゾリル基、4-チアゾリル基、5-チアゾリル基、3-イソチアゾリル基、4-イソチアゾリル基、5-イソチアゾリル基、2-イミダゾリル基、4-イミダゾリル基、2-ピリジル基、3-ピリジル基、4-ピリジル基、2-ピラジル基、3-ピラジル基、5-ピラジル基、6-ピラジル基、2-ピリミジル基、4-ピリミジル基、5-ピリミジル基、6-ピリミジル基、3-ピリダジル基、4-ピリダジル基、5-ピリダジル基、6-ピリダジル基、1,2,3-トリアジン-4-イル基、1,2,3-トリアジン-5-イル基、1,2,4-トリアジン-3-イル基、1,2,4-トリアジン-5-イル基、1,2,4-トリアジン-6-イル基、1,3,5-トリアジン-2-イル基等が挙げられる。
その他、アルキル基、アリール基、アラルキル基の具体例としては、上記と同様のものが挙げられる。
上記nは、1~20の整数であれば、特に限定されるものではないが、1~10の整数がより好ましい。
そのような市販品としては、デュポン製キャップストーン(Capstone,登録商標)FS-10、FS-22、FS-30、FS-31、FS-34、FS-35、FS-50、FS-51、FS-60、FS-61、FS-63、FS-64、FS-65、FS-66、FS-81、FS-83、FS-3100;第一工業製薬(株)製ノイゲンFN-1287等が挙げられるが、これらに限定されるものではない。
特に、ノニオン性界面活性剤である、キャップストーンFS-30、31、34、35、3100、ノイゲンFN-1287が好適である。
アルコキシシランとしては、テトラアルコキシシラン、トリアルコキシシラン、ジアルコキシシランの中から任意の1種以上のアルコキシシランを用いることができるが、特にテトラエトキシシラン、テトラメトキシシラン、フェニルトリエトキシシラン、フェニルトリメトキシシラン、メチルトリエトキシシラン、メチルトリメトキシシラン、3,3,3-トリフルオロプロピルトリメトキシシラン、ジメチルジエトキシシラン、ジメチルジメトキシシランが好ましく、テトラエトキシシランがより好ましい。
シロキサン系材料としては、上記アルコキシシランに対して加水分解等の反応により得られる、ポリ(テトラエトキシシラン)、ポリ(フェニルエトキシシラン)等のポリシロキサンが挙げられる。
アルコキシシランの添加量としては、上記の効果が発揮される量であれば特に限定されないが、本発明で用いるポリアニリン誘導体に対し、質量比で0.0001~100倍が好ましく、0.01~50倍がより好ましく、0.05~10倍がより一層好ましい。
添加剤の種類としては、所望の効果に応じて公知のものから適宜選択して用いることができる。
これらの中でも、水およびアルコール系溶媒から選ばれる少なくとも1種が好ましく、水、エタノール、2-プロパノールがより好ましい。
特に、逆積層型のOPVの正孔捕集層の形成に用いる場合には、活性層に悪影響を与えない、アルコール系溶媒および水から選ばれる1種または2種以上の溶媒のみからなる溶媒を用いることが好ましい。
高粘度有機溶媒としては、特に限定されるものではなく、例えば、シクロヘキサノール、エチレングリコール、1,3-オクチレングリコール、ジエチレングリコール、ジプロピレングリコール、トリエチレングリコール、トリプロピレングリコール、1,3-ブタンジオール、2,3-ブタンジオール、1,4-ブタンジオール、プロピレングリコール、へキシレングリコール等が挙げられる。
このような溶媒としては、例えば、ブチルセロソルブ、ジエチレングリコールジエチルエーテル、ジエチレングリコールジメチルエーテル、ジエチレングリコールモノエチルエーテルアセテート、ジエチレングリコールモノブチルエーテルアセテート、ジプロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテート、エチルカルビトール、ジアセトンアルコール、γ-ブチロラクトン、エチルラクテート、n-ヘキシルアセテート等が挙げられる。
また、電荷輸送性物質と電子受容性ドーパント物質の質量比も、発現する電荷輸送性、電荷輸送性物質等の種類を考慮して適宜設定されるものではあるが、通常、電荷輸送性物質1に対し、電子受容性ドーパント物質0~10、好ましくは0.1~3.0、より好ましくは0.2~2.0である。
そして、本発明において用いる正孔捕集層用組成物の粘度は、作製する薄膜の厚み等や固形分濃度を考慮し、塗布方法に応じて適宜調節されるものではあるが、通常25℃で0.1mPa・s~50mPa・s程度である。
なお、フッ素系界面活性剤、アルコキシシランの添加順序も任意である。
塗布にあたっては、組成物の粘度と表面張力、所望する薄膜の厚さ等を考慮し、ドロップキャスト法、スピンコート法、ブレードコート法、ディップコート法、ロールコート法、バーコート法、ダイコート法、インクジェット法、印刷法(凸版、凹版、平版、スクリーン印刷等)等といった各種ウェットプロセス法の中から最適なものを採用すればよい。
また、通常、塗布は、常温、常圧の不活性ガス雰囲気下で行われるが、組成物中の化合物が分解したり、組成が大きく変化したりしない限り、大気雰囲気下(酸素存在下)で行ってもよく、加熱しながら行ってもよい。
(1)順積層型有機薄膜太陽電池
[陽極層の形成]:透明基板の表面に陽極材料の層を形成し、透明電極を製造する工程
陽極材料としては、インジウム錫酸化物(ITO)、インジウム亜鉛酸化物(IZO)等の無機酸化物や、金、銀、アルミニウム等の金属、ポリチオフェン誘導体、ポリアニリン誘導体等の高電荷輸送性有機化合物を用いることができる。これらの中ではITOが最も好ましい。また、透明基板としては、ガラスあるいは透明樹脂からなる基板を用いることができる。
陽極材料の層(陽極層)の形成方法は、陽極材料の性質に応じて適宜選択される。通常、難溶性、難分散性昇華性材料の場合には真空蒸着法やスパッタ法等のドライプロセスが選択され、溶液材料あるいは分散液材料の場合には、組成物の粘度と表面張力、所望する薄膜の厚さ等を考慮し、上述した各種ウェットプロセス法の中から最適なものが採用される。
ITO等の無機酸化物を陽極材料として用いて透明陽極基板を形成する場合、上層を積層する前に、洗剤、アルコール、純水等で洗浄してから使用することが好ましい。さらに、使用直前にUVオゾン処理、酸素-プラズマ処理等の表面処理を施すことが好ましい。陽極材料が有機物を主成分とする場合、表面処理を行わなくともよい。
上記方法に従い、陽極材料の層上に、本発明の組成物を用いて正孔捕集層を形成する。
活性層は、n型半導体材料からなる薄膜であるn層と、p型半導体材料からなる薄膜であるp層とを積層したものであっても、これら材料の混合物からなる非積層薄膜であってもよい。
なお、ここでいう「主鎖にチオフェン骨格」とはチオフェンのみからなる2価の芳香環、またはチエノチオフェン、ベンゾチオフェン、ジベンゾチオフェン、ベンゾジチオフェン、ナフトチオフェン、ナフトジチオフェン、アントラチオフェン、アントラジチオフェン等のような1以上のチオフェンを含む2価の縮合芳香環を表し、これらは上記R1~R6で示される置換基で置換されていてもよい。
必要に応じて、電荷の移動を効率化すること等を目的として、活性層と陰極層の間に電子捕集層を形成してもよい。
電子捕集層を形成する材料としては、酸化リチウム(Li2O)、酸化マグネシウム(MgO)、アルミナ(Al2O3)、フッ化リチウム(LiF)、フッ化ナトリウム(NaF)、フッ化マグネシウム(MgF2)、フッ化ストロンチウム(SrF2)、炭酸セシウム(Cs2CO3)、8-キノリノールリチウム塩(Liq)、8-キノリノールナトリウム塩(Naq)、バソクプロイン(BCP)、4,7-ジフェニル-1,10-フェナントロリン(BPhen)、ポリエチレンイミン(PEI)、エトキシ化ポリエチレンイミン(PEIE)等が挙げられる。
陰極材料としては、アルミニウム、マグネシウム-銀合金、アルミニウム-リチウム合金、リチウム、ナトリウム、カリウム、セシウム、カルシウム、バリウム、銀、金等の金属や、インジウム錫酸化物(ITO)、インジウム亜鉛酸化物(IZO)等の無機酸化物や、ポリチオフェン誘導体、ポリアニリン誘導体等の高電荷輸送性有機化合物が挙げられ、複数の陰極材料を積層したり、混合したりして使用することができる。
陰極層の形成方法も、上記と同様、陰極層材料が難溶性、難分散性昇華性材料の場合には上述した各種ドライプロセスが選択され、溶液材料あるいは分散液材料の場合には、組成物の粘度と表面張力、所望する薄膜の厚さ等を考慮し、上述した各種ウェットプロセス法の中から最適なものが採用される。
必要に応じて、光電流の整流性をコントロールすること等を目的として、任意の層間にキャリアブロック層を設けてもよい。キャリアブロック層を設ける場合、通常、活性層と、正孔捕集層または陽極との間に電子ブロック層を、活性層と、電子捕集層または陰極との間に正孔ブロック層を挿入する場合が多いが、この限りではない。
正孔ブロック層を形成する材料としては、酸化チタン、酸化亜鉛、酸化スズ、バソクプロイン(BCP)、4,7-ジフェニル1,10-フェナントロリン(BPhen)等が挙げられる。
電子ブロック層を形成する材料としては、N,N′-ジ(1-ナフチル)-N,N′-ジフェニルベンジジン(α-NPD)、ポリ(トリアリールアミン)(PTAA)等のトリアリールアミン系材料等が挙げられる。
[陰極層の形成]:透明基板の表面に陰極材料の層を形成し、透明陰極基板を製造する工程
陰極材料としては、上記順積層型の陽極材料で例示したものに加え、フッ素ドープ酸化錫(FTO)が挙げられ、透明基板としては、上記順積層型の陽極材料で例示したものが挙げられる。
陰極材料の層(陰極層)の形成方法も、難溶性、難分散性昇華性材料の場合には上述したドライプロセスが選択され、溶液材料あるいは分散液材料の場合には、組成物の粘度と表面張力、所望する薄膜の厚さ等を考慮し、上述した各種ウェットプロセス法の中から最適なものが採用される。
また、この場合も市販の透明陰極基板を好適に用いることができ、素子の歩留を向上させる観点からは、平滑化処理がされている基板を用いることが好ましい。市販の透明陰極基板を用いる場合、本発明の有機薄膜太陽電池の製造方法は、陰極層を形成する工程を含まない。
無機酸化物を陰極材料として使用して透明陰極基板を形成する場合、順積層型の陽極材料と同様の洗浄処理や、表面処理を施してもよい。
必要に応じて、電荷の移動を効率化すること等を目的として、活性層と陰極層の間に電子捕集層を形成してもよい。
電子捕集層を形成する材料としては、上記順積層型の材料で例示したものに加え、酸化亜鉛(ZnO)、酸化チタン(TiO)、酸化スズ(SnO)等が挙げられる。
電子捕集層の形成方法も、難溶性、難分散性昇華性材料の場合には上述したドライプロセスが選択され、溶液材料あるいは分散液材料の場合には、組成物の粘度と表面張力、所望する薄膜の厚さ等を考慮し、上述した各種ウェットプロセス法の中から最適なものが採用される。また、無機酸化物の前駆体層をウェットプロセス(特にスピンコート法かスリットコート法)を用いて陰極上に形成し、焼成して無機酸化物の層を形成する方法を採用することもできる。
活性層は、n型半導体材料からなる薄膜であるn層と、p型半導体材料からなる薄膜であるp層とを積層したものであっても、これら材料の混合物からなる非積層薄膜であってもよい。
n型およびp型半導体材料としては、上記順積層型の半導体材料で例示したものと同様のものが挙げられるが、n型材料としては、PC61BM、PC71BMが、p型材料としては、PTB7等の主鎖にチオフェン骨格を含むポリマー類が好ましい。
活性層の形成方法も、上記順積層型の活性層で説明した方法と同様である。
上記方法に従い、活性層材料の層上に、本発明の組成物を用いて正孔捕集層を形成する。
陽極材料としては、上記順積層型の陽極材料と同様のものが挙げられ、陽極層の形成方法としても、順積層型の陰極層と同様である。
順積層型の素子と同様、必要に応じて、光電流の整流性をコントロールすること等を目的として、任意の層間にキャリアブロック層を設けてもよい。
正孔ブロック層を形成する材料および電子ブロック層を形成する材料としては、上記と同様のものが挙げられ、キャリアブロック層の形成方法も上記と同様である。
封止法としては、端部にUV硬化樹脂を付着させた凹型ガラス基板を、不活性ガス雰囲気下、有機薄膜太陽電池素子の成膜面側に付着させ、UV照射によって樹脂を硬化させる方法や、真空下、スパッタリング等の手法によって膜封止タイプの封止を行う方法などが挙げられる。
(1)NMR
装置:日本電子(株)製 ECX-300
測定溶媒:純正化学(株)製 ジメチルスルホキシド-d6
(2)グローブボックス:山八物産(株)製、VACグローブボックスシステム
(3)蒸着装置:アオヤマエンジニアリング(株)製、真空蒸着装置
(4)ソーラーシミュレータ:分光計器(株)製、OTENTOSUN-III、AM1.5Gフィルター、放射強度:100mW/cm2
(5)ソースメジャーユニット:ケースレーインスツルメンツ(株)製、2612A
(6)GPC
装置:東ソー(株)製 HLC-8320GPC Eco SEC
カラム:東ソー(株)製 TSKgel G3000PWXL
カラム温度:40℃
溶離液:100mM 硝酸ナトリウム水溶液
送液速度:0.5mL/min
検出器:UV(254nm)
検量線:標準ポリスチレンスルホン酸ナトリウム(アルドリッチ製)
(7)膜厚測定装置:(株)小坂研究所製、サーフコーダ ET-4000
(8)イオン化ポテンシャル測定装置:理研計器(株)製、AC-3
[調製例1]
PTB7(1-Material社製)20mgおよびPC61BM(フロンティアカーボン社製、製品名:nanom spectra E100)30mgが入ったサンプル瓶の中にクロロベンゼン2.0mLを加え、80℃のホットプレート上で15時間撹拌した。この溶液を室温まで放冷した後、1,8-ジヨードオクタン(東京化成工業(株)製)60μLを加えて撹拌し、溶液A1(活性層組成物)を得た。
[合成例1]
o-アニシジン-5-スルホン酸20mmolと、トリエチルアミン20mmolとを、室温で蒸留水4.5mLおよびアセトニトリル4.5mLを含む混合溶媒9mLに溶解し、溶液1を得た。続いて、蒸留水9mLとアセトニトリル9mLを含む混合溶媒18mLにペルオキソ二硫酸アンモニウム20mmolと98%濃硫酸1.1gとを溶解した溶液2を0℃に冷却し、その中に溶液1を30分かけて滴下した。
滴下終了後、反応溶液を25℃で1時間さらに撹拌した後、反応生成物を吸引ろ過で濾別した。ろ取した固体をメチルアルコール200mLで洗浄した後、真空乾燥してポリメトキシアニリンスルホン酸の緑色粉末2.78gを得た。
得られたポリマーの重量平均分子量をGPCによって測定したところ、1,366であった。
[実施例1-1]
合成例1で得られたポリメトキシアニリンスルホン酸750mgを蒸留水24.3gに溶解し、濃度3.0質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、褐色溶液全体に対して0.1質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B1を得た。
合成例1で得られたポリメトキシアニリンスルホン酸375mgを蒸留水24.6gに溶解し、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、褐色溶液全体に対して0.1質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B2を得た。
合成例1で得られたポリメトキシアニリンスルホン酸250mgと国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A125mgを、蒸留水24.6gとに溶解し、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、褐色溶液全体に対して0.1質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B3を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、フッ素系ノニオン性界面活性剤(FS-34,デュポン製)に変更した以外は、実施例1-1と同様にして、正孔捕集層用組成物B4を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、フッ素系ノニオン性界面活性剤(FS-34,デュポン製)に変更した以外は、実施例1-2と同様にして、正孔捕集層用組成物B5を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、フッ素系ノニオン性界面活性剤(FS-34,デュポン製)に変更した以外は、実施例1-3と同様にして、正孔捕集層用組成物B6を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)に変更した以外は、実施例1-1と同様にして、正孔捕集層用組成物B7を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)をフッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)に変更した以外は、実施例1-2と同様にして、正孔捕集層用組成物B8を得た。
フッ素系ノニオン性界面活性剤(FS-30,デュポン製)を、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)に変更した以外は、実施例1-3と同様にして、正孔捕集層用組成物B9を得た。
合成例1で得られたポリメトキシアニリンスルホン酸250mgと国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A125mgを、蒸留水12.1gに溶解し、濃度3.0質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)を、褐色溶液全体に対して0.1質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B10を得た。
フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)の添加量を、0.5質量%に変更した以外は、実施例1-9と同様にして、正孔捕集層用組成物B11を得た。
aquaPASS-01X(三菱ケミカル(株)製,5.1質量%水溶液)4.41gに、蒸留水3.20gとエタノール7.39gを加えて、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)を、褐色溶液全体に対して0.5質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B12を得た。
国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A100mgを蒸留水6.13gに溶解し、aquaPASS-01X(三菱ケミカル(株)製,5.1質量%水溶液)3.92gとエタノール9.85gを加えて、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)を、褐色溶液全体に対して0.7質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B13を得た。
国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A200mgを蒸留水7.99gに溶解し、aquaPASS-01X(三菱ケミカル(株)製,5.1質量%水溶液)1.96gとエタノール9.85gを加えて、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-35,デュポン製,25質量%水溶液)を、褐色溶液全体に対して4.0質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B14を得た。
1,3,6-ナフタレントリスルホン酸20質量%水溶液(富山薬品工業(株)製,FUNCHEM-NTSH(20))200mgを蒸留水7.99gに溶解し、aquaPASS-01X(三菱ケミカル(株)製,5.1質量%水溶液)1.96gとエタノール9.85gを加えて、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)を、褐色溶液全体に対して1.0質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B15を得た。
ポリスチレンスルホン酸20質量%水溶液(富山薬品工業(株)製,FUNCHEM-PSSH(20),分子量14,000)200mgを蒸留水7.99gに溶解し、aquaPASS-01X(三菱ケミカル(株)製,5.1質量%水溶液)1.96gとエタノール9.85gを加えて、濃度1.5質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)を、褐色溶液全体に対して0.5質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B16を得た。
[実施例2-1]
陰極となるITO透明導電層を2mm×20mmのストライプ状にパターニングした20mm×20mmのガラス基板を15分間UV/オゾン処理した。この基板に、電子捕集層となる酸化亜鉛の溶液(Genes’ Ink製)を滴下し、スピンコート法により成膜した。電子捕集層の膜厚は約20nmであった。その後、不活性ガスにより置換されたグローブボックス中で、形成した電子捕集層上に調製例1で得られた溶液A1を滴下してスピンコート法により成膜し、活性層を形成した。
次に、この活性層上に実施例1-1で調製した正孔捕集層用組成物B1をスピンコート法により塗布した後、ホットプレートを用いて、120℃で10分間加熱して正孔捕集層を形成した。正孔捕集層の膜厚は約30nmであった。
最後に、積層した基板を真空蒸着装置内に設置して、装置内の真空度が1×10-3Pa以下になるまで排気し、抵抗加熱法によって、陽極となる銀層を80nmの厚さに蒸着することで、ストライプ状のITO層と銀層とが交差する部分の面積が2mm×2mmである逆積層型OPV素子を作製した。
正孔捕集層用組成物B1の代わりに、正孔捕集層用組成物B2~B11を用いた以外は、実施例2-1と同様の方法で、逆積層型OPV素子を作製した。
陰極となるITO透明導電層を2mm×20mmのストライプ状にパターニングした20mm×20mmのガラス基板を15分間UV/オゾン処理した。この基板に、電子捕集層となる酸化亜鉛の溶液(Genes’ Ink製)を滴下し、スピンコート法により成膜した。電子捕集層の膜厚は約20nmであった。その後、不活性ガスにより置換されたグローブボックス中で、形成した電子捕集層上に調製例1で得られた溶液A1を滴下してスピンコート法により成膜し、活性層を形成した。
次に、この活性層上に実施例1-12で調製した正孔捕集層用組成物B12をスピンコート法により塗布した後、室温で乾燥させることで正孔捕集層を形成した。正孔捕集層の膜厚は約50nmであった。
最後に、積層した基板を真空蒸着装置内に設置して、装置内の真空度が1×10-3Pa以下になるまで排気し、抵抗加熱法によって、陽極となる銀層を80nmの厚さに蒸着することで、ストライプ状のITO層と銀層とが交差する部分の面積が2mm×2mmである逆積層型OPV素子を作製した。さらに、ホットプレートを用いて、60℃で30分間加熱してアニール処理を行った。
正孔捕集層用組成物B12の代わりに、正孔捕集層用組成物B13~B16を用いた以外は、実施例2-12と同様の方法で、逆積層型OPV素子を作製した。
正孔捕集層用組成物B1を用いない以外は、実施例2-1と同様の方法で、逆積層型OPV素子を作製した。
上記実施例2-1~2-16および比較例2-1で作製した各OPV素子について、短絡電流密度(Jsc〔mA/cm2〕)、開放電圧(Voc〔V〕)、曲線因子(FF)、およびPCE〔%〕の評価を行った。結果を表1に示す。
なおPCE〔%〕は、下式により算出した。
PCE〔%〕=Jsc〔mA/cm2〕×Voc〔V〕×FF÷入射光強度(100〔mW/cm2〕)×100
[実施例1-17]
合成例1で得られたポリメトキシアニリンスルホン酸179mgと国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A89.3mgを、蒸留水13.0gとエタノール13.0gに溶解し、テトラエトキシシラン536mgを添加して、濃度3.0質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-35,デュポン製)を、褐色溶液全体に対して0.5質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B17を得た。
合成例1で得られたポリメトキシアニリンスルホン酸124mgと国際公開第2006/025342号の記載に基づいて合成した上記式(2-1)で示されるアリールスルホン酸化合物A61.9mgを、蒸留水13.0gとエタノール13.0gに溶解し、テトラエトキシシラン619mgを添加して、濃度3.0質量%の褐色溶液を調製した。得られた褐色溶液に、フッ素系ノニオン性界面活性剤(FS-35,デュポン製)を、褐色溶液全体に対して0.5質量%添加し、孔径0.45μmのシリンジフィルターでろ過して、正孔捕集層用組成物B18を得た。
フッ素系ノニオン性界面活性剤をFN-1287(第一工業製薬(株))製に変更し、褐色溶液全体に対して0.3質量%添加した以外は、実施例1-17と同様にして、正孔捕集層用組成物B19を得た。
フッ素系ノニオン性界面活性剤をFN-1287(第一工業製薬(株))製に変更し、褐色溶液全体に対して0.3質量%添加した以外は、実施例1-18と同様にして、正孔捕集層用組成物B20を得た。
フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)の添加量を、0.5質量%に変更した以外は、実施例1-19と同様にして、正孔捕集層用組成物B21を得た。
フッ素系ノニオン性界面活性剤(FN-1287,第一工業製薬(株)製)の添加量を、0.5質量%に変更した以外は、実施例1-20と同様にして、正孔捕集層用組成物B22を得た。
[実施例2-17~2-22]
正孔捕集層用組成物B1の代わりに、正孔捕集層用組成物B17~B22を用いた以外は、実施例2-1と同様の方法で、逆積層型OPV素子を作製した。
上記実施例2-17~2-22で作製した各OPV素子について、短絡電流密度(Jsc〔mA/cm2〕)、開放電圧(Voc〔V〕)、曲線因子(FF)、およびPCE〔%〕の評価を行った。結果を表2に示す。なお、上記比較例2-1の結果も併せて示す。
なおPCE〔%〕は、下式により算出した。
PCE〔%〕=Jsc〔mA/cm2〕×Voc〔V〕×FF÷入射光強度(100〔mW/cm2〕)×100
[実施例3-1]
ITO基板上に、実施例1-12で調製した正孔捕集層用組成物B12をスピンコート法により塗布した。この基板を、ホットプレートを用いて、120℃で10分間加熱して正孔捕集層を形成した。
正孔捕集層用組成物B12の代わりに、正孔捕集層用組成物B13~B17を用いた以外は、実施例3-1と同様の方法で、正孔捕集層を形成した。
[実施例4-1~4-5]
上記実施例2-12~2-16で作製した各OPV素子について、初期特性評価を行った後、2000Wメタルハライドランプを用いた太陽電池耐久試験システム(セリック(株)製、SML-2K1AV4)にて疑似太陽光を100mW/cm2の照度で24時間照射後の変換効率測定を行い、下記計算式を用いて変換効率保持率を算出した。初期特性および変換効率保持率を表4に示す。
変換効率保持率(%)=耐光性試験後の変換効率÷初期変換効率×100
[調製例1]
P3HT(メルク社製)40mgおよびPC61BM(フロンティアカーボン社製、製品名:nanom spectra E100)36mgが入ったサンプル瓶の中にクロロベンゼン2.0mLを加え、80℃のホットプレート上で15時間撹拌した。この溶液を室温まで放冷し、溶液B1(活性層組成物)を得た。
[実施例5-1]
活性層組成物A1の代わりに、活性層組成物B1を用いた以外は、実施例2-12と同様の方法で、逆積層型OPV素子を作製した。
正孔捕集層用組成物B12の代わりに、正孔捕集層用組成物B13を用いた以外は、実施例5-1と同様の方法で、逆積層型OPV素子を作製した。
上記実施例5-1~5-2で作製した各OPV素子について、短絡電流密度(Jsc〔mA/cm2〕)、開放電圧(Voc〔V〕)、曲線因子(FF)、およびPCE〔%〕の評価を行った。結果を表5に示す。
なおPCE〔%〕は、下式により算出した。
PCE〔%〕=Jsc〔mA/cm2〕×Voc〔V〕×FF÷入射光強度(100〔mW/cm2〕)×100
Claims (22)
- 式(1)で表されるポリアニリン誘導体からなる電荷輸送性物質と、フッ素系界面活性剤と、溶媒とを含むことを特徴とする有機光電変換素子の正孔捕集層用組成物。
mおよびnは、それぞれ、0≦m≦1、0≦n≦1、かつ、m+n=1を満たす数である。} - アルコキシシランを含む請求項1記載の正孔補集層用組成物。
- 前記フッ素系界面活性剤が、フッ素系ノニオン性界面活性剤である請求項1または2記載の有機光電変換素子の正孔捕集層用組成物。
- 前記R1が、スルホン酸基であり、前記R4が、炭素数1~20のアルコキシ基である請求項1~4のいずれか1項記載の有機光電変換素子の正孔捕集層用組成物。
- 前記式(1)で表されるポリアニリン誘導体とは異なる電子受容性ドーパント物質を含む請求項1~5のいずれか1項記載の有機光電変換素子の正孔捕集層用組成物。
- 前記電子受容性ドーパント物質が、ブレンステッド酸である請求項6記載の有機光電変換素子の正孔捕集層用組成物。
- 前記溶媒が、アルコール系溶媒および水から選ばれる1種または2種以上の溶媒を含む請求項1~8のいずれか1項記載の有機光電変換素子の正孔捕集層用組成物。
- 前記有機光電変換素子が、有機薄膜太陽電池、色素増感太陽電池または光センサーである請求項1~9のいずれか1項記載の有機光電変換素子の正孔捕集層用組成物。
- 請求項1~10のいずれか1項記載の有機光電変換素子の正孔捕集層用組成物を用いてなる正孔捕集層。
- 請求項11の正孔捕集層を有する有機光電変換素子。
- 請求項11の正孔捕集層と、それに接するように設けられた活性層とを有する有機光電変換素子。
- 前記活性層が、フラーレン誘導体を含む請求項12または13記載の有機光電変換素子。
- 前記活性層が、主鎖にチオフェン骨格を含むポリマーを含む請求項12または13記載の有機光電変換素子。
- 前記活性層が、フラーレン誘導体および主鎖にチオフェン骨格を含むポリマーを含む請求項12または13記載の有機光電変換素子。
- 逆積層型である請求項12~16のいずれか1項記載の有機光電変換素子。
- 前記有機光電変換素子が、有機薄膜太陽電池または光センサーである請求項12~17のいずれか1項記載の有機光電変換素子。
- トップ陽極構造を有する請求項12~18のいずれか1項記載の有機光電変換素子。
- 式(1)で表されるポリアニリン誘導体からなる電荷輸送性物質と、この式(1)で表されるポリアニリン誘導体とは異なる電子受容性ドーパント物質と、フッ素系界面活性剤と、溶媒とを含むことを特徴とする電荷輸送性組成物。
- アルコキシシランを含む請求項20記載の電荷輸送性組成物。
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US16/464,619 US11563176B2 (en) | 2016-12-16 | 2017-12-01 | Composition for hole collecting layer of organic photoelectric conversion element |
BR112019012055-6A BR112019012055B1 (pt) | 2016-12-16 | 2017-12-01 | Composição para uma camada coletora de buraco de um elemento fotovoltaico orgânico, camada coletora de buraco, elemento fotovoltaico orgânico e composição transportadora de carga |
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Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003509816A (ja) * | 1999-09-03 | 2003-03-11 | スリーエム イノベイティブ プロパティズ カンパニー | 導電性自己ドープ型ポリマー緩衝層を有する有機電子デバイス |
JP2003234460A (ja) | 2002-02-12 | 2003-08-22 | Nippon Hoso Kyokai <Nhk> | 積層型光導電膜および固体撮像装置 |
WO2005000832A1 (ja) | 2003-06-25 | 2005-01-06 | Nissan Chemical Industries, Ltd. | 1,4-ベンゾジオキサンスルホン酸化合物及び電子受容性物質としての利用 |
JP2005108828A (ja) | 2003-09-11 | 2005-04-21 | Nissan Chem Ind Ltd | 電荷輸送性ワニス、電荷輸送性薄膜および有機エレクトロルミネッセンス素子 |
WO2006025342A1 (ja) | 2004-08-31 | 2006-03-09 | Nissan Chemical Industries, Ltd. | アリールスルホン酸化合物及び電子受容性物質としての利用 |
JP2008258474A (ja) | 2007-04-06 | 2008-10-23 | Sony Corp | 固体撮像装置および撮像装置 |
JP2009158921A (ja) | 2007-12-05 | 2009-07-16 | Toray Ind Inc | 光起電力素子用電子供与性有機材料、光起電力素子用材料および光起電力素子 |
WO2010008672A1 (en) | 2008-07-18 | 2010-01-21 | University Of Chicago | Semiconducting polymers |
WO2010058777A1 (ja) | 2008-11-19 | 2010-05-27 | 日産化学工業株式会社 | 電荷輸送性材料および電荷輸送性ワニス |
JP2011138813A (ja) * | 2009-12-25 | 2011-07-14 | Mitsubishi Rayon Co Ltd | 有機エレクトロルミネッセンス素子 |
WO2012078517A1 (en) * | 2010-12-06 | 2012-06-14 | Plextronics, Inc. | Inks for solar cell inverted structures |
WO2015087797A1 (ja) * | 2013-12-09 | 2015-06-18 | 日産化学工業株式会社 | 有機薄膜太陽電池の陽極バッファ層用組成物及び有機薄膜太陽電池 |
JP2015129265A (ja) * | 2013-11-29 | 2015-07-16 | 三菱化学株式会社 | 金属酸化物含有層形成用組成物、電子デバイス、及び電子デバイスの製造方法 |
WO2015186688A1 (ja) * | 2014-06-05 | 2015-12-10 | 日産化学工業株式会社 | 電荷輸送性ワニス |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5589108A (en) | 1993-12-29 | 1996-12-31 | Nitto Chemical Industry Co., Ltd. | Soluble alkoxy-group substituted aminobenzenesulfonic acid aniline conducting polymers |
JP4569740B2 (ja) | 2002-02-20 | 2010-10-27 | 日産化学工業株式会社 | 有機導電性材料及び導電性ワニス |
TW200502277A (en) * | 2003-05-20 | 2005-01-16 | Nissan Chemical Ind Ltd | Charge-transporting varnish |
US7259405B2 (en) | 2004-11-23 | 2007-08-21 | Au Optronics Corporation | Organic photoelectric device with improved electron transport efficiency |
TWI378114B (en) * | 2008-12-17 | 2012-12-01 | Ten Chin Wen | Structure of hole-collecting layer made of sulfonated polyaniline derivative and electron-collecting layer made of titanium dioxide and manufacture method therefor |
JP5761357B2 (ja) * | 2011-09-21 | 2015-08-12 | 日産化学工業株式会社 | 塗布型電荷輸送性薄膜形成用ワニス |
WO2014119782A1 (ja) | 2013-02-04 | 2014-08-07 | 日産化学工業株式会社 | 有機薄膜太陽電池用バッファ層及び有機薄膜太陽電池 |
JP6147542B2 (ja) | 2013-04-01 | 2017-06-14 | 株式会社東芝 | 透明導電フィルムおよび電気素子 |
WO2014171484A1 (ja) * | 2013-04-16 | 2014-10-23 | 日産化学工業株式会社 | 金属陽極用正孔輸送性ワニスおよび複合金属陽極 |
JP6417621B2 (ja) * | 2014-02-12 | 2018-11-07 | ナガセケムテックス株式会社 | インク用組成物及び透明電極 |
US20160196892A1 (en) * | 2015-01-07 | 2016-07-07 | Nagase Chemtex Corporation | Conductive resin composition and transparent conductive laminated body |
EP3252840B1 (en) * | 2015-01-20 | 2020-03-11 | Nissan Chemical Corporation | Varnish for formation of charge-transporting thin film |
WO2016148184A1 (ja) | 2015-03-17 | 2016-09-22 | 日産化学工業株式会社 | 光センサ素子の正孔捕集層形成用組成物および光センサ素子 |
-
2017
- 2017-12-01 US US16/464,619 patent/US11563176B2/en active Active
- 2017-12-01 EP EP17882030.4A patent/EP3544072A4/en active Pending
- 2017-12-01 WO PCT/JP2017/043253 patent/WO2018110317A1/ja unknown
- 2017-12-01 CN CN201780077434.3A patent/CN110073509A/zh active Pending
- 2017-12-01 JP JP2018556572A patent/JP7180379B2/ja active Active
- 2017-12-01 KR KR1020197019443A patent/KR102494413B1/ko active IP Right Grant
- 2017-12-01 BR BR112019012055-6A patent/BR112019012055B1/pt active IP Right Grant
- 2017-12-12 TW TW106143492A patent/TWI776833B/zh active
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003509816A (ja) * | 1999-09-03 | 2003-03-11 | スリーエム イノベイティブ プロパティズ カンパニー | 導電性自己ドープ型ポリマー緩衝層を有する有機電子デバイス |
JP2003234460A (ja) | 2002-02-12 | 2003-08-22 | Nippon Hoso Kyokai <Nhk> | 積層型光導電膜および固体撮像装置 |
WO2005000832A1 (ja) | 2003-06-25 | 2005-01-06 | Nissan Chemical Industries, Ltd. | 1,4-ベンゾジオキサンスルホン酸化合物及び電子受容性物質としての利用 |
JP2005108828A (ja) | 2003-09-11 | 2005-04-21 | Nissan Chem Ind Ltd | 電荷輸送性ワニス、電荷輸送性薄膜および有機エレクトロルミネッセンス素子 |
WO2006025342A1 (ja) | 2004-08-31 | 2006-03-09 | Nissan Chemical Industries, Ltd. | アリールスルホン酸化合物及び電子受容性物質としての利用 |
JP2008258474A (ja) | 2007-04-06 | 2008-10-23 | Sony Corp | 固体撮像装置および撮像装置 |
JP2009158921A (ja) | 2007-12-05 | 2009-07-16 | Toray Ind Inc | 光起電力素子用電子供与性有機材料、光起電力素子用材料および光起電力素子 |
WO2010008672A1 (en) | 2008-07-18 | 2010-01-21 | University Of Chicago | Semiconducting polymers |
WO2010058777A1 (ja) | 2008-11-19 | 2010-05-27 | 日産化学工業株式会社 | 電荷輸送性材料および電荷輸送性ワニス |
JP2011138813A (ja) * | 2009-12-25 | 2011-07-14 | Mitsubishi Rayon Co Ltd | 有機エレクトロルミネッセンス素子 |
WO2012078517A1 (en) * | 2010-12-06 | 2012-06-14 | Plextronics, Inc. | Inks for solar cell inverted structures |
JP2015129265A (ja) * | 2013-11-29 | 2015-07-16 | 三菱化学株式会社 | 金属酸化物含有層形成用組成物、電子デバイス、及び電子デバイスの製造方法 |
WO2015087797A1 (ja) * | 2013-12-09 | 2015-06-18 | 日産化学工業株式会社 | 有機薄膜太陽電池の陽極バッファ層用組成物及び有機薄膜太陽電池 |
WO2015186688A1 (ja) * | 2014-06-05 | 2015-12-10 | 日産化学工業株式会社 | 電荷輸送性ワニス |
Non-Patent Citations (5)
Title |
---|
APPL. PHYS. LETT., vol. 48, 1986, pages 183 - 185 |
NATURE PHOTONICS, vol. 6, 2012, pages 153 - 161 |
NATURE, vol. 353, 1991, pages 737 - 740 |
SCIENTIFIC REPORTS, vol. 5, no. 7708, 2015, pages 1 - 7 |
See also references of EP3544072A4 |
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US11563176B2 (en) | 2023-01-24 |
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BR112019012055B1 (pt) | 2023-11-21 |
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