WO2016082439A1 - 探针组件及包含其的检测装置 - Google Patents

探针组件及包含其的检测装置 Download PDF

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Publication number
WO2016082439A1
WO2016082439A1 PCT/CN2015/076956 CN2015076956W WO2016082439A1 WO 2016082439 A1 WO2016082439 A1 WO 2016082439A1 CN 2015076956 W CN2015076956 W CN 2015076956W WO 2016082439 A1 WO2016082439 A1 WO 2016082439A1
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WIPO (PCT)
Prior art keywords
probe
display panel
probe assembly
lead
region
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PCT/CN2015/076956
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English (en)
French (fr)
Inventor
盛化鹏
吴松
张�林
韦传兵
田林山
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京东方科技集团股份有限公司
合肥鑫晟光电科技有限公司
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Application filed by 京东方科技集团股份有限公司, 合肥鑫晟光电科技有限公司 filed Critical 京东方科技集团股份有限公司
Priority to US14/889,279 priority Critical patent/US10540919B2/en
Publication of WO2016082439A1 publication Critical patent/WO2016082439A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals

Definitions

  • Embodiments of the present invention relate to a probe assembly and a detection device including the same.
  • box detection is required.
  • a short-circuiting (Shorting Bar) wiring design is generally employed in the large-sized panel.
  • At least one embodiment of the present invention provides a probe assembly configured to detect a display panel including a first probe region corresponding to a lead in the display panel, the first probe region being provided with First probe, where:
  • the first probe is disposed at a position in the first probe region corresponding to a first one of the connected leads in the display panel, and the first probe region is in the first lead region No probe is placed at the corresponding position of the adjacent lead;
  • the first lead is any one of the connected leads.
  • the probe assembly further includes a second probe region corresponding to a line in the drive circuit in the display panel, the second probe region being provided with a second probe, wherein:
  • the second probe is disposed at a position in the second probe region corresponding to a first one of the lines having the same driving signal, and the second probe region is opposite to the first line No probe is placed at the position corresponding to the adjacent line;
  • the first line is any one of the lines having the same driving signal.
  • the spacing of adjacent first and second probes is greater than or equal to 50 um.
  • the probe assembly further includes: a pressure support, wherein:
  • the pressure support body is disposed at a leftmost side and a rightmost side of the probe assembly
  • a distance between the first or second probe and the pressure support disposed adjacent to the pressure support in the probe assembly is greater than or equal to 50 um.
  • the width of the pressure support is greater than or equal to 100 um.
  • the material of the pressure support is an alloy material, a silica gel material, or a ceramic material.
  • the width of the first probe in the first probe region of the probe assembly is less than the spacing between adjacent leads in the display panel.
  • the width of the second probe in the second probe region of the probe assembly is less than the spacing between adjacent lines of the drive circuitry in the display panel.
  • the materials of the first probe and the second probe of the probe assembly are the same as the material of the pressure support.
  • At least one embodiment of the present invention also provides a detection device comprising any of the probe assemblies of the first aspect.
  • FIG. 1 is a schematic structural diagram of a probe assembly according to an embodiment of the present invention.
  • FIG. 2 is a schematic diagram of a detection structure of a probe assembly according to an embodiment of the present invention.
  • FIG. 3 is a schematic structural diagram of another probe assembly according to an embodiment of the present invention.
  • FIG. 4 is a schematic structural diagram of still another probe assembly according to an embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of still another probe assembly according to an embodiment of the present invention.
  • FIG. 6 is a schematic diagram of a detection structure of another probe assembly according to an embodiment of the present invention.
  • Embodiments of the present invention provide a probe assembly configured to detect a display panel.
  • the probe assembly includes a first probe region 2 corresponding to a lead 13 in a display panel, the first probe region 2 being provided with a probe 1.
  • the probe 1 in the first probe region 2 on the probe assembly is disposed at a position corresponding to the first lead among the leads connected in the display panel, and the first probe region 2 The probe 1 is not disposed at a position corresponding to the lead adjacent to the first lead.
  • the first lead is any one of the connected leads.
  • the 6D shorting bar circuit design is taken as an example.
  • the gate line lead 3 is in contact with the data line lead 4.
  • the holes 5 intersect, and the lead of the first data line of the data line lead 4 intersecting the gate line lead 3 is connected to the lead of the sixth data line, and only the lead of the first data line or the sixth data is
  • the probe 1 is disposed in the first probe region 2 of the probe assembly corresponding to the lead of the wire.
  • the probe 1 is disposed only in the first probe region 2 of the probe component corresponding to the lead of one of the data lines of the adjacent data lines, for example, only corresponding to the first data line lead At the location of a probe area 2 Set probe 1 while not setting probe 1 at the position corresponding to the second data line lead. In this way, it can be ensured that the spacing between adjacent probes in the finally formed probe assembly is greater than or equal to 50 um, thereby ensuring that between the probes in the pin area 7 of the display panel is not caused by the detection of the display panel. A short circuit occurs due to the presence of dust or the like.
  • the probe in the first probe region corresponding to the lead in the display panel on the probe assembly is disposed in the first lead in the lead connected to the display panel At a position, and a position corresponding to the lead adjacent to the first lead in the first probe area is not provided with a probe, and finally formed to detect a large distance between adjacent probes in the probe assembly of the display panel
  • the spacing between adjacent probes so that when the probe assembly provided by the embodiment of the present invention is used for detecting the display panel, the shorting of adjacent probes does not occur, and the solution is solved.
  • the known probe assembly is used for detecting a short circuit between the probes when the display panel is detected, avoiding the failure to detect the defective display panel, improving the poor detection rate of the display panel, and ensuring the display panel.
  • the display quality in turn, can avoid waste of production materials and reduce production costs.
  • the probe assembly may further include a second probe region 8 corresponding to the line 12 in the drive circuit in the display panel, the first probe region 8 being provided with Probe 1.
  • the probe 1 in the second probe region 8 on the probe assembly is disposed at a position corresponding to the first line in the line having the same driving signal, and the second probe The probe 1 is not disposed at a position corresponding to the line adjacent to the first line in the needle region 8.
  • the first line is any one of the lines having the same drive signal.
  • the spacing between adjacent probes 1 in the second probe region 8 may be greater than or equal to 50 um to ensure that there is no dust between the probes 1 of the second region 8 during testing of the display panel.
  • the short-circuit between the connected probes is caused by other reasons, thereby avoiding the problem that the driving circuit capable of testing the driving signal to the display panel is not good, thereby ensuring the performance of the display panel.
  • a first probe region 2 and a second probe region 8 adjacent to the probe module there is shown a first probe region 2 and a second probe region 8 adjacent to the probe module, and the probes at the junction of the two regions are shown as probe 9 and probe 10, respectively; That is, the probe 9 in the first probe region 2 is disposed adjacent to the probe 10 in the second probe region 8.
  • the spacing between the probe 9 in the first probe region 2 and the probe 10 in the second probe region 8 is greater than or equal to 50 um, thereby preventing shorting between adjacent probes.
  • the display panel can be used to detect the display panel, which further ensures the functional integrity of the probe assembly, further ensuring the performance of the display panel after the detection, for example, ensuring the display quality of the display panel.
  • the probe assembly further includes: a pressure support body 11 in which the pressure support body 11 is disposed at the leftmost and rightmost sides of the probe assembly.
  • the spacing between the probes disposed adjacent the pressure support 11 and the pressure support 11 in the probe assembly is greater than or equal to 50 um.
  • the probe assembly in the embodiment of the present invention adds the pressure support body 11 at the leftmost and rightmost positions, so that the entire probe assembly can be well supported by the pressure support body 11, thereby avoiding the occurrence of bending. Situation, thereby increasing the life of the probe assembly.
  • the width of the pressure support 4 is greater than or equal to 100 um.
  • the pressure support may have a width of 100 to 150 um.
  • the material of the pressure support 4 is an alloy material, a silica gel material, or a ceramic material.
  • the material of the pressure support can be the same as the material of the probe in the probe assembly, such as an alloy material.
  • the width of the probe 1 in the first probe region 2 on the probe assembly is less than the spacing between adjacent leads in the display panel.
  • the width of the probe 1 in the second probe region 8 on the probe assembly is less than the spacing between adjacent lines of the drive circuitry in the display panel.
  • the probe component When the probe component is used for the detection of the display panel, since the alignment of the subsequent display panel and the probe component is realized by automatically recognizing the alignment mark, in actual tests, some uncontrollable factors may occur.
  • the display panel or the detection device mounting the probe assembly is displaced, which It may be possible to realize the position where the probe in the probe assembly is placed between the leads or the position between the lines of the driving circuit, and also the short connection of the probe assembly, and the new probe assembly needs to be replaced. test.
  • the width of the probe in the first probe region is smaller than the spacing between adjacent leads in the display panel, and the width of the probe in the second probe region is smaller than The spacing between adjacent lines of the driving circuit in the display panel, therefore, the probe assembly provided in this embodiment even if the probe falls between the leads or between the lines of the driving circuit due to irresistible factors There is also no short circuit, and the position of the probe assembly can be re-detected without replacing the new probe assembly, thereby improving production efficiency, reducing production cost, and thereby detecting the performance of the display panel.
  • the probe in the first probe region corresponding to the lead in the display panel on the probe assembly is disposed in the first lead in the lead connected to the display panel At a position, and a position corresponding to the lead adjacent to the first lead in the first probe area is not provided with a probe, and finally formed to detect a large distance between adjacent probes in the probe assembly of the display panel
  • the spacing between adjacent probes so that when the probe assembly provided by the embodiment of the present invention is used for detecting the display panel, the shorting of adjacent probes does not occur, and the solution is solved.
  • the known probe assembly is used for detecting a short circuit between the probes when the display panel is detected, avoiding the failure to detect the defective display panel, improving the poor detection rate of the display panel, and ensuring the display panel.
  • the display quality in turn, can avoid waste of production materials and reduce production costs.
  • Embodiments of the present invention also provide a detection device that includes any of the probe assemblies provided by the embodiments corresponding to Figures 1-6.
  • the probe in the first probe region corresponding to the lead in the display panel on the probe assembly is disposed at a position corresponding to the first lead in the lead connected to the display panel And, the probe corresponding to the lead adjacent to the first lead in the first probe region is not provided with a probe, and the final configuration is configured to detect that the spacing between adjacent probes in the probe assembly of the display panel is far greater than Knowing the spacing between adjacent probes in the probe assembly, so that when the probe assembly provided by the embodiment of the present invention is used for detecting the display panel, short-circuiting of adjacent probes does not occur, and the known
  • the probe component is used to detect a short circuit between the probes when detecting the display panel, avoiding the failure to detect the display panel, improving the poor detection rate of the display panel, and ensuring the display of the display panel. Quality, in turn, can avoid waste of production materials and reduce production costs.

Abstract

一种探针组件及包含其的检测装置，该探针组件配置以检测显示面板，包括与显示面板中的引线（13）对应的第一探针区域（2），第一探针区域（2）中与显示面板中相连引线（13）中的第一引线对应的位置处设置有探针（1），且，所述第一探针区域（2）中与第一引线相邻的引线对应的位置未设置探针（1）；其中，第一引线为相连引线（13）中的任意一根引线。检测装置包括所述探针组件。解决了现有的探针组件在用于检测显示面板时会出现的探针之间发生短路的问题，避免无法检测出显示面板的不良的情况出现，提高了显示面板的不良检出率，保证了显示面板的画面的显示质量，进而避免对生产材料的浪费并且降低了生产成本。

Description

探针组件及包含其的检测装置 技术领域
本发明的实施例涉及一种探针组件及包含其的检测装置。
背景技术
在液晶面板成盒后，为了检测制作工艺中出现的不良产品以避免不良面板投入后续的工序中从而减少生产资源的浪费，需进行成盒检测。在面板逐渐向大尺寸、高分辨率、高刷新频率发展的趋势下，为了降低检测设备对不良检出率的影响，在大尺寸面板中一般采用杆状短路(Shorting Bar)布线设计。
为了提高显示器的分辨率，需要减小面板中的引线的间距，这样，用于面板检测的探针组件中的探针的间距也会减小。由于探针组件中相邻的探针的间距减小，相邻探针之间很容易发生短路，从而无法检测出显示面板的不良，导致生产出的显示面板的不良率增大，从而造成生产材料的浪费。
发明内容
第一方面，本发明的至少一个实施例提供一种探针组件，配置以检测显示面板，包括与所述显示面板中的引线对应的第一探针区域，所述第一探针区域设置有第一探针，其中：
所述第一探针设置在所述第一探针区域中与所述显示面板中相连引线中的第一引线对应的位置处，且，所述第一探针区域中与所述第一引线相邻的引线对应的位置未设置任何探针；
所述第一引线为所述相连引线中的任意一根引线。
在一个示例中，所述探针组件还包括与所述显示面板中的驱动电路中的线路对应的第二探针区域，所述第二探针区域设置有第二探针，其中：
所述第二探针设置在所述第二探针区域中与具有相同驱动信号的线路中的第一线路对应的位置处，且，所述第二探针区域中与所述第一线路相邻的线路对应的位置处未设置任何探针；
所述第一线路为所述具有相同驱动信号的线路中的任意一根线路。
在一个示例中，相邻的所述第一探针和第二探针的间距大于或者等于50um。
在一个示例中，所述探针组件还包括：压力支撑体，其中：
所述压力支撑体设置在所述探针组件的最左侧和最右侧；
所述探针组件中与所述压力支撑体相邻设置的所述第一或第二探针与所述压力支撑体之间的间距大于或者等于50um。
在一个示例中，所述压力支撑体的宽度大于或者等于100um。
在一个示例中，所述压力支撑体的材料为合金材料、硅胶材料或者陶瓷材料。
在一个示例中，所述探针组件的所述第一探针区域中的所述第一探针的宽度小于所述显示面板中的相邻引线之间的间距。
在一个示例中，所述探针组件的所述第二探针区域中的所述第二探针的宽度小于所述显示面板中的驱动电路的相邻线路之间的间距。
在一个示例中，所述探针组件的所述第一探针和第二探针的材料与所述压力支撑体的材料相同。
第二方面，本发明的至少一个实施例还提供一种检测装置，所述检测装置包括第一方面所述的任一探针组件。
附图说明
以下将结合附图对本发明的实施例进行更详细的说明，以使本领域普通技术人员更加清楚地理解本发明，其中：
图1为本发明的实施例提供的一种探针组件的结构示意图；
图2为本发明的实施例提供的一种探针组件的检测结构示意图；
图3为本发明的实施例提供的另一种探针组件的结构示意图；
图4为本发明的实施例提供的又一种探针组件的结构示意图；
图5为本发明的实施例提供的再一种探针组件的结构示意图；
图6为本发明的实施例提供的另一种探针组件的检测结构示意图。
附图标记：1、9、10-探针；2-第一探针区域；3-栅线引线；4-数据线引线；5-接触孔；6-短接棒电路设计区域；7-扎针区域；8-第二探针 区域；11-压力支撑体；12-驱动电路的线路；13-显示面板中的引线。
具体实施方式
为使本发明的实施例的目的、技术方案和优点更加清楚，下面将结合本发明实施例的附图对本发明的实施例的技术方案进行清楚、完整的描述。显然，所描述的实施例仅是本发明的一部分示例性实施例，而不是全部的实施例。基于所描述的本发明的示例性实施例，本领域普通技术人员在无需创造性劳动的前提下所获得的所有其它实施例都属于本发明的保护范围。
除非另作定义，此处使用的技术术语或者科学术语应当为本发明所属领域内具有一般技能的人士所理解的通常意义。本发明专利申请说明书以及权利要求书中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性，而只是用来区分不同的组成部分。同样，“一个”、“一”或者“该”等类似词语也不表示数量限制，而是表示存在至少一个。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同，而不排除其他元件或者物件。“上”、“下”、等仅用于表示相对位置关系，当被描述对象的绝对位置改变后，则该相对位置关系也可能相应地改变。
本发明的实施例提供一种探针组件，该探针组件配置以检测显示面板。
参照图1和图2所示的实施例，该探针组件包括与显示面板中的引线13对应的第一探针区域2，该第一探针区域2设置有探针1。
如图2中所示，探针组件上的第一探针区域2中的探针1设置在与显示面板中相连的引线中的第一引线对应的位置处，且，第一探针区域2中与第一引线相邻的引线对应的位置处未设置有探针1。
在一个示例中，第一引线为相连引线中的任意一根引线。
在一个示例中，如图2中所示，以6D短接棒电路设计为例进行说明，在显示面板测试用的短接棒电路设计区域6中，栅线引线3与数据线引线4在接触孔5处相交，与栅线引线3相交的数据线引线4中的第一根数据线的引线与第六根数据线的引线相连，则只在第一根数据线的引线或者第六根数据线的引线对应的探针组件的第一探针区域2中设置探针1。且，只在相邻的数据线的引线中的一根数据线的引线对应的探针组件的第一探针区域2中设置探针1，例如，只在第一根数据线引线对应的第一探针区域2的位置处 设置探针1，同时不在第二根数据线引线对应的位置处设置探针1。如此，可以保证最终形成的探针组件中的相邻探针之间的间距大于或者等于50um，从而保证在进行显示面板的检测时，显示面板的扎针区域7中的探针之间不会因为灰尘等原因的存在而发生短路。
需要说明的是，本实施例中只是以6D的短路棒电路设计为例进行说明，并不旨在限定进行显示面板的检测时只能采用6D的短路棒电路设计，在实际的应用中，探针组件中的探针的设计只需满足本实施例中的原则即可，具体的探针位置不作特别限定。
如上所述，本发明的实施例中，通过将探针组件上的与显示面板中的引线对应的第一探针区域中的探针设置在与显示面板中相连的引线中的第一引线对应位置处，且，第一探针区域中与第一引线相邻的引线对应的位置未设置探针，最终形成的配置以检测显示面板的探针组件中相邻探针之间的间距远远大于已知的探针组件中相邻探针之间的间距，从而使用本发明实施例提供的该探针组件进行显示面板的检测时，不会发生相邻探针短接的情况，解决了已知的探针组件用于检测显示面板时探针之间会发生短路的问题，避免无法检测出显示面板的不良的情况出现，提高了显示面板的不良检出率，保证了显示面板的画面的显示质量，进而，可以避免对生产材料的浪费，降低了生产成本。
参照图3和图6所示的另一实施例，该探针组件还可包括与显示面板中的驱动电路中的线路12对应的第二探针区域8，该第一探针区域8设置有探针1。
如图3和图6所示，探针组件上的第二探针区域8中的探针1设置在与具有相同驱动信号的线路中的第一线路对应的位置处，且，该第二探针区域8中与第一线路相邻的线路对应的位置未设置探针1。
在一个示例中，第一线路为具有相同驱动信号的线路中的任意一根线路。
在一个示例中，第二探针区域8中相邻探针1之间的间距可以大于或者等于50um，以保证在显示面板的测试中该第二区域8的探针1之间不会因为灰尘等原因而造成相连探针之间短接，从而避免出现无法测试出给显示面板提供驱动信号的驱动电路是否性能良好的问题，进而保证了显示面板的性能的优良性。
参照图4，其示出了探针模块上相邻的第一探针区域2和第二探针区域8，并且两个区域交界处的探针分别示出为探针9和探针10；即，第一探针区域2中的探针9与第二探针区域8中的探针10相邻设置。在一个示例中，确保第一探针区域2中的探针9与第二探针区域8中的探针10之间的间距大于或者等于50um，进而防止相邻探针之间发生短接的问题，保证可以使用该探针组件对显示面板进行检测，更加确保了该探针组件的功能的完整性，进一步确保经过检测之后的显示面板的性能，例如，确保显示面板的画面显示质量。
在一个示例中，参照图5所示，探针组件中还包括：压力支撑体11，其中，压力支撑体11设置在探针组件的最左侧和最右侧。
在一个示例中，探针组件中与压力支撑体11相邻设置的探针与压力支撑体11之间的间距大于或者等于50um。
由于测试显示面板的工作台的中间是空心的，在进行大尺寸的显示面板的测试时，显示面板中会存在肉眼不可见的弯曲弧度，从而出现探针组件两边的探针不能同时受力和受力不均的问题，严重的降低探针组件的使用寿命。本发明实施例中的探针组件在最左侧和最右侧的位置处增加了压力支撑体11，这样，整个探针组件可以很好地被压力支撑体11支撑，进而可以避免出现弯曲的情况，从而提高探针组件的使用寿命。
在一个示例中，压力支撑体4的宽度大于或者等于100um。例如，压力支撑体的宽度可为100～150um。
在一个示例中，压力支撑体4的材料为合金材料、硅胶材料或者陶瓷材料。
例如，压力支撑体的材料可以与探针组件中的探针的材料相同，例如选用合金材料。
在一个示例中，探针组件上的第一探针区域2中的探针1的宽度小于显示面板中的相邻引线之间的间距。
在一个示例中，探针组件上的第二探针区域8中的探针1的宽度小于显示面板中的驱动电路的相邻线路之间的间距。
在使用探针组件进行显示面板的检测时，由于后续的显示面板与探针组件的对位都是通过自动识别对位标识来实现的，在实际的测试中会出现由于一些不可控的因素导致显示面板或者安装探针组件的检测装置出现移位，这 样可能实现探针组件中的探针放置在引线之间的位置或驱动电路的线路之间的位置的情况，同样会造成探针组件发生短接的情况，则需要更换新的探针组件进行测试。而本实施例提供的探针组件的一个示例中，第一探针区域中的探针的宽度小于显示面板中的相邻引线之间的间距，第二探针区域中的探针的宽度小于显示面板中的驱动电路的相邻线路之间的间距，因此，即使由于不可抗拒的因素出现探针落在引线之间或者驱动电路的线路之间的问题，本实施例中提供的探针组件也不会出现短接，并且通过对探针组件的位置进行调整可以重新进行检测而不需要更换新的探针组件，从而提高生产效率、降低生产成本，进而实现对显示面板的性能的检测。
如上所述，本发明的实施例中，通过将探针组件上的与显示面板中的引线对应的第一探针区域中的探针设置在与显示面板中相连的引线中的第一引线对应位置处，且，第一探针区域中与第一引线相邻的引线对应的位置未设置探针，最终形成的配置以检测显示面板的探针组件中相邻探针之间的间距远远大于已知的探针组件中相邻探针之间的间距，从而使用本发明实施例提供的该探针组件进行显示面板的检测时，不会发生相邻探针短接的情况，解决了已知的探针组件用于检测显示面板时探针之间会发生短路的问题，避免无法检测出显示面板的不良的情况出现，提高了显示面板的不良检出率，保证了显示面板的画面的显示质量，进而，可以避免对生产材料的浪费，降低了生产成本。
本发明的实施例还提供一种检测装置，该检测装置包括附图1～6对应的实施例提供的任一探针组件。
本发明的实施例提供的检测装置中，探针组件上的与显示面板中的引线对应的第一探针区域中的探针设置在与显示面板中相连的引线中的第一引线对应位置处，且，第一探针区域中与第一引线相邻的引线对应的位置未设置探针，最终形成的配置以检测显示面板的探针组件中相邻探针之间的间距远远大于已知的探针组件中相邻探针之间的间距，从而使用本发明实施例提供的该探针组件进行显示面板的检测时，不会发生相邻探针短接的情况，解决了已知的探针组件用于检测显示面板时探针之间会发生短路的问题，避免无法检测出显示面板的不良的情况出现，提高了显示面板的不良检出率，保证了显示面板的画面的显示质量，进而，可以避免对生产材料的浪费，降低了生产成本。
以上实施方式仅用于说明本发明，而并非对本发明的限制，有关技术领域的普通技术人员，在不脱离本发明的精神和范围的情况下，还可以做出各种变化和变型，因此所有等同的技术方案也属于本发明的范畴，本发明的专利保护范围应由权利要求限定。
本申请要求于2014年11月24日提交的名称为“一种检测用探针块及其检测装置”的中国专利申请No.201410686133.9的优先权，该申请全文以引用方式合并于本文。

Claims (10)

  1. 一种探针组件，配置以检测显示面板，所述探针组件包括与所述显示面板中的引线对应的第一探针区域，所述第一探针区域设置有第一探针，其中：
    所述第一探针区域中的第一探针设置在第一探针区域的与所述显示面板中相连引线中的第一引线对应的位置处，且，所述第一探针区域中与所述第一引线相邻的引线对应的位置未设置任何探针；
    所述第一引线为所述相连引线中的任意一根引线。
  2. 根据权利要求1所述的探针组件，其中，所述探针组件还包括与所述显示面板中的驱动电路中的线路对应的第二探针区域，所述第二探针区域设置有第二探针，其中：
    所述第二探针区域中的第二探针设置在与具有相同驱动信号的线路中的第一线路对应的位置处，且，所述第二探针区域中与所述第一线路相邻的线路对应的位置未设置任何探针；
    所述第一线路为所述具有相同驱动信号的线路中的任意一根线路。
  3. 根据权利要求2所述的探针组件，其中，
    相邻的所述第一探针和第二探针的间距大于或者等于50um。
  4. 根据权利要求1～3中任一所述的探针组件，其中，所述探针组件还包括压力支撑体，其中：
    所述压力支撑体设置在所述探针组件的最左侧和最右侧；
    所述探针组件中与所述压力支撑体相邻设置的所述第一探针或第二探针与所述压力支撑体之间的间距大于或者等于50um。
  5. 根据权利要求4所述的探针组件，其中，所述压力支撑体的宽度大于或者等于100um。
  6. 根据权利要求4所述的探针组件，其中，所述压力支撑体的材料为合金材料、硅胶材料或者陶瓷材料。
  7. 根据权利要求1所述的探针组件，其中，所述探针组件上的所述第一探针区域中的第一探针的宽度小于所述显示面板中相邻引线之间的间距。
  8. 根据权利要求2所述的探针组件，其中，所述探针组件上的所述第二探针区域中的第二探针的宽度小于所述显示面板中的驱动电路的相邻线路之 间的间距。
  9. 根据权利要求4所述的探针组件，其中，所述探针组件中的所述第一探针和第二探针的材料与所述压力支撑体的材料相同。
  10. 一种检测装置，包括权利要求1～9中任一所述的探针组件。
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