WO2022011918A1 - 显示面板及显示装置 - Google Patents

显示面板及显示装置 Download PDF

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Publication number
WO2022011918A1
WO2022011918A1 PCT/CN2020/130736 CN2020130736W WO2022011918A1 WO 2022011918 A1 WO2022011918 A1 WO 2022011918A1 CN 2020130736 W CN2020130736 W CN 2020130736W WO 2022011918 A1 WO2022011918 A1 WO 2022011918A1
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WO
WIPO (PCT)
Prior art keywords
metal
metal trace
display panel
terminal
metal wiring
Prior art date
Application number
PCT/CN2020/130736
Other languages
English (en)
French (fr)
Inventor
程江坤
Original Assignee
武汉华星光电半导体显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 武汉华星光电半导体显示技术有限公司 filed Critical 武汉华星光电半导体显示技术有限公司
Publication of WO2022011918A1 publication Critical patent/WO2022011918A1/zh

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/301—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements flexible foldable or roll-able electronic displays, e.g. thin LCD, OLED
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present application relates to the field of display, and in particular, to a display panel and a display device.
  • the display panel has a multi-layer structure including an inorganic material layer, a metal material layer, etc.
  • the inorganic layer is prone to stress concentration and microcracks occur first.
  • the crack grows, it can cause the wiring in the display panel to break.
  • the risk of line breakage in display panels has become increasingly prominent. How to detect tiny cracks in the inorganic material layer before the line breaks is the primary task of preventing line breakage.
  • the embodiment of the present application provides a display panel provided with a crack detection circuit, which can detect micro-cracks in a detected layer in the display panel, especially micro-cracks in an inorganic material layer.
  • a display panel includes a crack detection circuit and a detected layer
  • the crack detection circuit includes: a test terminal; a first metal wire, the first metal wire includes a first end and a second end connected to the test end end and a first metal wiring body, the first metal wiring body is connected between the first end and the second end; and a second metal wiring, the second metal wiring is arranged on the On the first metal wiring, the second metal wiring includes a third end, a fourth end and a second metal wiring body, and the second metal wiring body is connected to the third end and the first metal wiring body. between the four ends; wherein, the detected layer is located between the first metal wiring and the second metal wiring.
  • a display device includes a display panel, the display panel includes a crack detection circuit and a detected layer, the crack detection circuit includes: a test terminal; and a first metal wire, the first metal wire includes connected to the first end and the second end of the test terminal and a first metal wiring body, the first metal wiring body is connected between the first end and the second end; and a second metal wiring body wire, the second metal wire is disposed on the first metal wire, the second metal wire includes a third end, a fourth end and a second metal wire body, the second metal wire The body is connected between the third end and the fourth end; wherein, the detected layer is located between the first metal wiring and the second metal wiring.
  • a crack detection circuit is provided on the display panel, the crack detection circuit includes a first metal wiring and a second metal wiring, and a In the detection layer, a capacitor is formed between the first metal trace and the second metal trace, and a detection signal is applied to the first metal trace and the second metal trace respectively to detect the path state and capacitance value between the two metal traces Therefore, it can be determined whether there is a small crack in the detected layer in the display panel, and the cracked display panel is screened out in advance to avoid flowing into the user end.
  • FIG. 1 is a schematic top-view structure diagram of a display panel provided by an embodiment of the present application.
  • FIG. 2 is a schematic cross-sectional structure diagram of a crack detection circuit provided by an embodiment of the application.
  • FIG. 3 is a schematic diagram of a display device according to an embodiment of the present application.
  • first and second are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, features defined as “first”, “second” may expressly or implicitly include one or more of said features. In the description of the present application, “plurality” means two or more, unless otherwise expressly and specifically defined.
  • the terms “installed”, “connected” and “connected” should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection Connection, or integral connection; it can be mechanical connection, electrical connection or can communicate with each other; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal communication of two elements or the interaction of two elements relation.
  • installed should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection Connection, or integral connection; it can be mechanical connection, electrical connection or can communicate with each other; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal communication of two elements or the interaction of two elements relation.
  • a first feature "on” or “under” a second feature may include direct contact between the first and second features, or may include the first and second features Not directly but through additional features between them.
  • the first feature being “above”, “over” and “above” the second feature includes the first feature being directly above and obliquely above the second feature, or simply means that the first feature is level higher than the second feature.
  • the first feature is “below”, “below” and “below” the second feature includes the first feature being directly below and diagonally below the second feature, or simply means that the first feature has a lower level than the second feature.
  • FIG. 2 is a cross-sectional view of the AB dotted line in FIG. 1.
  • An embodiment of the present application provides a display panel 100, including a crack detection circuit 80 and a detected layer 30.
  • the crack detection circuit 80 includes: testing Terminal 90; first metal trace 10, the first metal trace 10 includes a first end 12 and a second end 13 connected to the test terminal 90 and a first metal trace body 11, the first metal trace body 11 is connected to 13 between the first end 12 and the second end; and a second metal trace 20, the second metal trace 20 is disposed on the first metal trace 10, and the second metal trace 20 includes a third end 22, a fourth The terminal 23 and the second metal trace body 21, the second metal trace body 21 is connected between the third terminal 22 and the fourth terminal 23; wherein, the detected layer 30 is located on the first metal trace 10 and the second metal trace Between lines 20.
  • a crack detection circuit 80 is provided on the display panel 100 .
  • the crack detection circuit 80 includes a first metal trace 10 and a second metal trace 20 and is sandwiched between the first metal trace 10 and the second metal trace The detected layer 30 between 20, a capacitor is formed between the first metal trace 10 and the second metal trace 20, and a detection signal is respectively applied to the first metal trace 10 and the second metal trace 20 to detect the two metals
  • the state of the path between the traces and the state of the capacitance value can determine whether there is a small crack in the detected layer 30 in the display panel, and screen out the cracked display panel in advance to avoid flowing into the user terminal.
  • the display panel 100 includes a display area 110 and a non-display area 120
  • the crack detection circuit 80 is disposed on the display panel 100
  • the crack detection circuit 80 includes a first metal trace.
  • the wire 10 , the second metal wire 20 , the tested layer 30 and the test terminal 90 is arranged in the non-display area 120 , and the tested layer 30 is sandwiched between the first metal wire 10 and the second metal wire 20 . between.
  • the first metal trace 10 includes a first end 12 and a second end 13 connected to or extending from the test terminal 90 and a first metal trace body 11 , and the first metal trace body 11 is connected to the first end 12 and the second end Between 13; the second metal trace 20 is disposed on the first metal trace 10, the second metal trace 20 includes a third end 22, a fourth end 23 and a second metal trace body 21, the second metal trace The body 21 is connected between the third end 22 and the fourth end 23 .
  • the ductility of the inspected layer 30 is weaker than that of the first metal trace 10 and the second metal trace 20 .
  • the detected layer 30 and the second metal trace 20 are stacked and arranged, since the ductility of the detected layer 30 is weaker than that of the first metal trace 10 and the second metal trace 20 , the detected layer 30 Cracks or fractures occur before the first metal traces 10 and the second metal traces 20 , so the first metal traces 10 and the second metal traces 20 can detect the cracks or fractures in the detected layer 30 .
  • the first metal wiring body 11 and the second metal wiring body 21 surround the display area 110 of the display panel 100 .
  • the first metal wiring body 11 and the second metal wiring body 21 are disposed in the non-display area 120 , are disposed around the display area 110 of the display panel 100 , and are connected or extended to the test terminal at a frame position of the display panel 100 . 90.
  • the detected layer 30 includes an inorganic layer.
  • the inorganic layer is a brittle material with poor ductility and is prone to cracks and fractures. When the cracks and fractures expand, various metal lines in the display panel 100 will be fractured, thereby causing fractures. If the display is not good, the crack detection circuit 80 can detect cracks and fractures in the inorganic layer in time, so as to avoid the cracks and fractures from extending or extending to the metal lines, and the outflow of defective products can be avoided.
  • the microcracks 70 are illustrated in FIG. 2 , the existence of the microcracks 70 is detected, and the microcracks 70 are prevented from spreading into the wiring in the display panel 100 .
  • the inorganic layer included in the detected layer 30 may extend from the display area 110 to the non-display area 120 .
  • the detected layer 30 detects a crack in the crack detection circuit 80 , it reflects the function of the display panel 100 . The reliability has been reduced, not only the cracks in the crack detection circuit 80 will spread to the display area 110, but also the inorganic layer in the display area 110 has a high probability of cracks, and the display panel 100 whose existence of cracks is detected needs to be screened in advance to avoid inflow user terminal.
  • the crack detection circuit 80 is located in the non-display area 120 of the display panel 100 , which can prevent the crack detection circuit 80 from occupying the area of the display area.
  • the test terminal 90 includes a first input terminal, a first output terminal, a second input terminal and a second output terminal, wherein the first input terminal is used for inputting a first input signal to the first terminal, and the first input terminal is used for inputting a first input signal to the first terminal.
  • the output end is used to receive the first output signal through the second end, the second input end is used to input the second input signal to the third end, the second output end is used to receive the second output signal through the fourth end, the first output signal And the second output signal is used to detect whether the detected layer has cracks.
  • the first end 12 may be the first input end or the vicinity of the first end 12 may be the first input end
  • the second end 13 may be the first output end or the vicinity of the second end 13 may be the first output end
  • the third end 22 may be the second input end or the vicinity of the third end 22 may be the second input end
  • the fourth end 23 may be the second output end or the vicinity of the fourth end 23 may be the second output end, but not limited to this.
  • a capacitor is formed between the first metal trace 10 and the second metal trace 20, a detection signal is input through the first input terminal and the second input terminal, respectively, and the detection signal is output from the first output terminal and the second output terminal, so that the detection signal can be detected. Measure the path state and capacitance value between the first metal trace 10 and the second metal trace 20, so as to determine whether there is a small crack in the detected layer 30 in the display panel 100, and screen out the cracked display panel in advance to avoid inflow user terminal.
  • test terminals 90 include chips 160 or test points.
  • the method of inputting signals to the first input terminal and the second input terminal at the test terminal 90 may be the chip 160 or the test point
  • the method of outputting signals to the first output terminal and the second output terminal at the test terminal 90 may be the chip 160 or test points
  • the test points may be in the form of pads, test pads, test metal blocks, etc., but not limited to this.
  • the display panel 100 includes a substrate 60 , the orthographic projection of the first metal wiring body 11 perpendicular to the substrate 60 and the orthographic projection of the second metal wiring body 21 perpendicular to the substrate 60 at least partially overlap .
  • the first metal wiring body 11 and the second metal wiring body 21 have parts that are directly opposite to each other, or the first metal wiring body 11 and the second metal wiring body 21 have all of the opposite parts.
  • the display panel 100 includes the substrate 60 , and the orthographic projection of the first metal wiring body 11 perpendicular to the substrate 60 and the orthographic projection of the second metal wiring body 21 perpendicular to the substrate 60 may not overlap.
  • the first metal wiring body 21 may not overlap.
  • the orthographic projection of the wiring body 11 perpendicular to the substrate 60 is adjacent to but not overlapping the orthographic projection of the second metal wiring body 21 perpendicular to the substrate 60 .
  • a capacitor can also be formed between the two metal traces, and a detection signal can be applied to the first metal trace 10 and the second metal trace 20 respectively to detect the state of the path and the capacitance value between the two metal traces, so as to determine the detected layer in the display panel. 30 Whether there are small cracks, screen out the cracked display panel in advance to avoid flowing into the user terminal.
  • the width of the first metal trace body 11 is equal to the width of the second metal trace body 21 . In some embodiments, the width of the first metal trace body 11 is not equal to the width of the second metal trace body 21 , for example, the width of the first metal trace body 11 is greater than the width of the second metal trace body 21 .
  • the detected layer 30 may include two or more inorganic layers.
  • the detected layer 30 includes an organic layer, for example, the detected layer 30 includes an organic layer and an inorganic layer, and the organic layer can be a flat layer of transparent resin.
  • the materials of the first metal wiring body 11 and the second metal wiring body 21 are the same or different. Whether the materials of the first metal wiring body 11 and the second metal wiring body 21 are the same is not limited here, and whether the materials of the first metal wiring body 11 and the second metal wiring body 21 have the same ductility is not discussed here. limited.
  • the material of the first metal trace body 11 is Mo
  • the material of the second metal trace body 21 can be Mo
  • the material of the first metal trace body 11 is Mo
  • the material of the second metal trace body 21 can be Al.
  • the display area 110 includes gate driving wirings and data driving wirings, the first metal wiring body 11 and the gate driving wirings are formed of the same layer of metal, and the second metal wiring body 21 and the data driving wirings The traces are made of the same layer of metal.
  • the display area 110 includes a gate driving trace and an anode metal layer, the first metal trace body 11 and the gate driving trace are formed of the same layer of metal, and the second metal trace body 21 and the anode metal layer Consists of the same layer of metal.
  • the layer structure 40 is an inorganic layer or other layer structures.
  • Other layer structures may also be included on the second metal traces 20 , for example, the layer structure 50 is other layer structures such as an organic layer, which is not limited thereto.
  • the present application also provides a display device, please refer to FIG. 3 , the display device 1000 includes any one of the above-mentioned display panels 100 , and the display device 1000 may also include other parts 600 , such as a driving system, a casing, and the like.
  • a crack detection circuit 80 is provided on the display panel 100 .
  • the crack detection circuit 80 includes a first metal trace 10 and a second metal trace 20 and is sandwiched between the first metal trace 10 and the second metal trace The detected layer 30 between 20, a capacitor is formed between the first metal trace 10 and the second metal trace 20, and a detection signal is respectively applied to the first metal trace 10 and the second metal trace 20 to detect the two metals
  • the state of the path between the traces and the state of the capacitance value can determine whether there is a small crack in the detected layer 30 in the display panel, and screen out the cracked display panel in advance to avoid flowing into the user terminal.
  • a display panel and a display device provided by the embodiments of the present application have been introduced in detail above, and the principles and implementations of the present application are described with specific examples. The descriptions of the above embodiments are only used to help understand the present application. Those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements to some of the technical features; and these modifications or replacements, and The essence of the corresponding technical solutions is not deviated from the scope of the technical solutions of the embodiments of the present application.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
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  • Computer Hardware Design (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种显示面板（100），包括裂纹检测电路（80）和被检测层（30），裂纹检测电路（80）包括：测试端（90）；第一金属走线（10），第一金属走线（10）包括连接于测试端（90）的第一端（12）和第二端（13）以及第一金属走线本体（11）；以及第二金属走线（20），第二金属走线（20）设置于第一金属走线（10）上；其中，被检测层（30）位于第一金属走线（10）和第二金属走线（20）之间。

Description

显示面板及显示装置 技术领域
本申请涉及显示领域，特别涉及一种显示面板及显示装置。
 背景技术
随着人类进入信息互联时代，人机互动的需求爆发式增长，而平面显示技术是目前应用最广泛的人机信息交换方式。显示面板具有包括无机材料层、金属材料层等的多层结构，在显示面板生产制造的镀膜、封装、切割、组装、运输等过程中，无机层容易应力集中先发生微小裂纹（crack），当裂纹扩大时会导致显示面板中的线路断裂。特别是随着柔性、可弯折的显示技术的开发，显示面板中线路的断裂风险日益突出，在线路断裂前如何检测出无机材料层中微小裂纹是预防线路断裂的首要任务。
 技术问题
本申请实施例提供了一种设置裂纹检测电路的显示面板，可以检测出显示面板中被检测层中的微小裂纹，特别是无机材料层中的微小裂纹。
 技术解决方案
一种显示面板，包括裂纹检测电路和被检测层，所述裂纹检测电路包括：测试端；第一金属走线，所述第一金属走线包括连接于所述测试端的第一端和第二端以及第一金属走线本体，所述第一金属走线本体连接于所述第一端和所述第二端之间；以及第二金属走线，所述第二金属走线设置于所述第一金属走线上，所述第二金属走线包括第三端、第四端以及第二金属走线本体，所述第二金属走线本体连接于所述第三端和所述第四端之间；其中，所述被检测层位于所述第一金属走线和所述第二金属走线之间。
一种显示装置，所述显示装置包括显示面板，所述显示面板包括裂纹检测电路和被检测层，所述裂纹检测电路包括：测试端；第一金属走线，所述第一金属走线包括连接于所述测试端的第一端和第二端以及第一金属走线本体，所述第一金属走线本体连接于所述第一端和所述第二端之间；以及第二金属走线，所述第二金属走线设置于所述第一金属走线上，所述第二金属走线包括第三端、第四端以及第二金属走线本体，所述第二金属走线本体连接于所述第三端和所述第四端之间；其中，所述被检测层位于所述第一金属走线和所述第二金属走线之间。
 有益效果
本申请的有益效果为：在显示面板设置裂纹检测电路，裂纹检测电路包括第一金属走线和第二金属走线，以及夹设于第一金属走线和第二金属走线之间的被检测层，第一金属走线和第二金属走线之间形成电容，对第一金属走线和第二金属走线分别施加检测信号，侦测两金属走线之间的通路状态、电容值状况，从而可以判定显示面板中被检测层是否存在细小裂纹，提前筛选出有裂纹的显示面板避免流入用户端。
 附图说明
图1为本申请一实施例提供的显示面板的俯视结构示意图；
图2为本申请一实施例提供的裂纹检测电路的断面结构示意图；
图3为本申请一实施例提供的一种显示装置的示意图。
 本发明的实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接或可以相互通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请中的具体含义。
在本申请中，除非另有明确的规定和限定，第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触，也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且，第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方，或仅仅表示第一特征水平高度小于第二特征。
下文的公开提供了许多不同的实施方式或例子用来实现本申请的不同结构。为了简化本申请的公开，下文中对特定例子的部件和设置进行描述。当然，它们仅仅为示例，并且目的不在于限制本申请。此外，本申请可以在不同例子中重复参考数字和/或参考字母，这种重复是为了简化和清楚的目的，其本身不指示所讨论各种实施方式和/或设置之间的关系。此外，本申请提供了的各种特定的工艺和材料的例子，但是本领域普通技术人员可以意识到其他工艺的应用和/或其他材料的使用。
请参阅图1、图2，图2为图1中AB虚线断面图，本申请的实施例提供了一种显示面板100，包括裂纹检测电路80和被检测层30，裂纹检测电路80包括：测试端90；第一金属走线10，第一金属走线10包括连接于测试端90的第一端12和第二端13以及第一金属走线本体11，第一金属走线本体11连接于第一端12和第二端之间13；以及第二金属走线20，第二金属走线20设置于第一金属走线10上，第二金属走线20包括第三端22、第四端23以及第二金属走线本体21，第二金属走线本体21连接于第三端22和第四端23之间；其中，被检测层30位于第一金属走线10和第二金属走线20之间。
本申请的实施例在显示面板100设置裂纹检测电路80，裂纹检测电路80包括第一金属走线10和第二金属走线20，以及夹设于第一金属走线10和第二金属走线20之间的被检测层30，第一金属走线10和第二金属走线20之间形成电容，对第一金属走线10和第二金属走线20分别施加检测信号，侦测两金属走线之间的通路状态、电容值状况，从而可以判定显示面板中被检测层30是否存在细小裂纹，提前筛选出有裂纹的显示面板避免流入用户端。
具体的，请参阅图1、图2，在一些实施例中，显示面板100包括显示区110和非显示区120，裂纹检测电路80设置在显示面板100上，裂纹检测电路80包括第一金属走线10、第二金属走线20、被检测层30以及测试端90，测试端90设置于非显示区120，被检测层30夹设于第一金属走线10和第二金属走线20之间。第一金属走线10包括连接或延伸于测试端90的第一端12和第二端13以及第一金属走线本体11，第一金属走线本体11连接于第一端12和第二端之间13；第二金属走线20设置于第一金属走线10上，第二金属走线20包括第三端22、第四端23以及第二金属走线本体21，第二金属走线本体21连接于第三端22和第四端23之间。
在一些实施例中，被检测层30的延展性弱于第一金属走线10和第二金属走线20。第一金属走线10、被检测层30以及第二金属走线20层叠设置时，由于被检测层30的延展性弱于第一金属走线10和第二金属走线20，被检测层30会先于第一金属走线10和第二金属走线20发生裂纹或者断裂，因而第一金属走线10和第二金属走线20可以检测出被检测层30中的裂纹或断裂。
在一些实施例中，请参阅图1，第一金属走线本体11和第二金属走线本体21环绕显示面板100的显示区110。例如，第一金属走线本体11和第二金属走线本体21设置于非显示区120，且环绕显示面板100的显示区110设置，并在显示面板100的一个边框位置连接或延伸至测试端90。
在一些实施例中，被检测层30包括无机层，无机层为脆性材料，延展性较差，容易发生裂纹和断裂，当裂纹和断裂扩大时会导致显示面板100中各种金属线路断裂，从而导致显示不良，通过裂纹检测电路80及时检测出无机层中的裂纹和断裂，避免裂纹和断裂延伸或扩展至金属线路，可以避免不良品流出。在图2中示意了微小裂纹70，检测出微小裂纹70的存在，并防止微小裂纹70扩展至显示面板100中的线路之中。在一些实施例中，被检测层30包括的无机层可以是由显示区110延伸至非显示区120设置，当被检测层30在裂纹检测电路80中检测出裂纹时，体现了显示面板100的信耐性已经下降，不但裂纹检测电路80中的裂纹会扩散至显示区110，同时显示区110中的无机层也大概率存在裂纹，被检测出裂纹存在的显示面板100需要提前筛选出以避免流入用户端。
在一些实施例中，请参阅图1，裂纹检测电路80位于显示面板100的非显示区120，可以避免裂纹检测电路80占据显示区的面积。
在一些实施例中，测试端90包括第一输入端、第一输出端、第二输入端和第二输出端，其中，第一输入端用于向第一端输入第一输入信号，第一输出端用于通过第二端接收第一输出信号，第二输入端用于向第三端输入第二输入信号，第二输出端用于通过第四端接收第二输出信号，第一输出信号和第二输出信号用于检测被检测层是否有裂纹。具体的，例如第一端12可以为第一输入端或者第一端12的附近可以为第一输入端，第二端13可以为第一输出端或者第二端13附近可以为第一输出端，第三端22可以为第二输入端或者第三端22附近可以为第二输入端，第四端23可以为第二输出端或者第四端23附近可以为第二输处端，但不限于此。第一金属走线10和第二金属走线20之间形成电容，通过第一输入端、第二输入端分别输入检测信号，第一输出端、第二输出端分别输出检测信号，这样可以侦测第一金属走线10和第二金属走线20之间的通路状态、电容值状况，从而可以判定显示面板100中被检测层30是否存在细小裂纹，提前筛选出有裂纹的显示面板避免流入用户端。
在一些实施例中，测试端90包括芯片160或者测试点。具体的，在测试端90对第一输入端、第二输入端输入信号的方式可以为芯片160或者测试点，在测试端90对第一输出端、第二输出端输出信号的方式可以为芯片160或者测试点，测试点可以为焊盘、测试pad、测试金属块等形式，不限于此。
在一些实施例中，请参阅图2，显示面板100包括基底60，第一金属走线本体11垂直于基底60的正投影与第二金属走线本体21垂直于基底60的正投影至少部分重叠。第一金属走线本体11与第二金属走线本体21具有部分正相对部分，或者第一金属走线本体11与第二金属走线本体21具有全部正相对部分。
在一些实施例中，显示面板100包括基底60，第一金属走线本体11垂直于基底60的正投影与第二金属走线本体21垂直于基底60的正投影可以不重叠，例如第一金属走线本体11垂直于基底60的正投影与第二金属走线本体21垂直于基底60的正投影相邻但不重叠，此时第一金属走线本体11和第二金属走线本体21之间也可以形成电容，对第一金属走线10和第二金属走线20分别施加检测信号，侦测两金属走线之间的通路状态、电容值状况，从而可以判定显示面板中被检测层30是否存在细小裂纹，提前筛选出有裂纹的显示面板避免流入用户端。
在一些实施例中，第一金属走线本体11的宽度等于第二金属走线本体21的宽度。在一些实施例中，第一金属走线本体11的宽度不等于第二金属走线本体21的宽度，例如第一金属走线本体11的宽度大于第二金属走线本体21的宽度。
在一些实施例中，被检测层30可以包括两层或两层以上的无机层。
在一些实施例中，被检测层30包括还可以包括有机层，例如被检测层30包括一层有机层和一层无机层，有机层可以为平坦层的透明树脂。
在一些实施例中，请参阅图2，第一金属走线本体11与第二金属走线本体21的材料相同或不同。第一金属走线本体11与第二金属走线本体21的材料是否相同在此不做限定，第一金属走线本体11与第二金属走线本体21的材料延展性是否相同在此不做限定。例如第一金属走线本体11的材料为Mo，第二金属走线本体21的材料可以为Mo, 例如第一金属走线本体11的材料为Mo，第二金属走线本体21的材料可以为Al。
在一些实施例中，显示区110包括栅极驱动走线和数据驱动走线，第一金属走线本体11和栅极驱动走线由同层金属构成，第二金属走线本体21和数据驱动走线由同层金属构成。
在一些实施例中，显示区110包括栅极驱动走线和阳极金属层，第一金属走线本体11和栅极驱动走线由同层金属构成，第二金属走线本体21和阳极金属层由同层金属构成。
在一些实施例中，请参阅图2，第一金属走线10和基底之间还可以包括其他层结构，例如层结构40为无机层等其他层结构。第二金属走线20之上还可以包括其他层结构，例如层结构50为有机层等其他层结构，不限于此。
本申请还提供了一种显示装置，请参阅图3，显示装置1000包括上述任意一种显示面板100，显示装置1000还可以包括其他部位600，例如驱动系统、外壳等。
本申请的实施例在显示面板100设置裂纹检测电路80，裂纹检测电路80包括第一金属走线10和第二金属走线20，以及夹设于第一金属走线10和第二金属走线20之间的被检测层30，第一金属走线10和第二金属走线20之间形成电容，对第一金属走线10和第二金属走线20分别施加检测信号，侦测两金属走线之间的通路状态、电容值状况，从而可以判定显示面板中被检测层30是否存在细小裂纹，提前筛选出有裂纹的显示面板避免流入用户端。
在上述实施例中，对各个实施例的描述都各有侧重，某个实施例中没有详述的部分，可以参见其他实施例的相关描述。
以上对本申请实施例所提供的一种显示面板及显示装置进行了详细介绍，本文中应用了具体个例对本申请的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本申请的技术方案及其核心思想；本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例的技术方案的范围。

Claims (18)

  1. 一种显示面板，包括裂纹检测电路和被检测层，所述裂纹检测电路包括：
    测试端；
    第一金属走线，所述第一金属走线包括连接于所述测试端的第一端和第二端以及第一金属走线本体，所述第一金属走线本体连接于所述第一端和所述第二端之间；以及
    第二金属走线，所述第二金属走线设置于所述第一金属走线上，所述第二金属走线包括第三端、第四端以及第二金属走线本体，所述第二金属走线本体连接于所述第三端和所述第四端之间；其中，所述被检测层位于所述第一金属走线和所述第二金属走线之间。
  2. 根据权利要求1所述的显示面板，其中，所述被检测层的延展性弱于所述第一金属走线和所述第二金属走线。
  3. 根据权利要求1所述的显示面板，其中，所述第一金属走线本体和所述第二金属走线本体环绕所述显示面板的显示区。
  4. 根据权利要求2所述的显示面板，其中，所述被检测层包括无机层。
  5. 根据权利要求1所述的显示面板，其中，所述裂纹检测电路位于所述显示面板的非显示区。
  6. 根据权利要求1所述的显示面板，其中，所述测试端包括第一输入端、第一输出端、第二输入端和第二输出端，其中，所述第一输入端用于向所述第一端输入第一输入信号，所述第一输出端用于通过所述第二端接收第一输出信号，所述第二输入端用于向所述第三端输入第二输入信号，所述第二输出端用于通过所述第四端接收第二输出信号，所述第一输出信号和所述第二输出信号用于检测所述被检测层是否有裂纹。
  7. 根据权利要求1所述的显示面板，其中，所述测试端包括芯片或者测试点。
  8. 根据权利要求1所述的显示面板，其中，所述显示面板包括基底，所述第一金属走线本体垂直于所述基底的正投影与所述第二金属走线本体垂直于所述基底的正投影至少部分重叠。
  9. 根据权利要求1所述的显示面板，其中，所述第一金属走线本体与所述第二金属走线本体的材料相同或不同。
  10. 一种显示装置，所述显示装置包括显示面板，所述显示面板包括裂纹检测电路和被检测层，所述裂纹检测电路包括：
    测试端；
    第一金属走线，所述第一金属走线包括连接于所述测试端的第一端和第二端以及第一金属走线本体，所述第一金属走线本体连接于所述第一端和所述第二端之间；以及
    第二金属走线，所述第二金属走线设置于所述第一金属走线上，所述第二金属走线包括第三端、第四端以及第二金属走线本体，所述第二金属走线本体连接于所述第三端和所述第四端之间；其中，所述被检测层位于所述第一金属走线和所述第二金属走线之间。
  11. 根据权利要求10所述的显示装置，其中，所述被检测层的延展性弱于所述第一金属走线和所述第二金属走线。
  12. 根据权利要求10所述的显示装置，其中，所述第一金属走线本体和所述第二金属走线本体环绕所述显示面板的显示区。
  13. 根据权利要求11所述的显示装置，其中，所述被检测层包括无机层。
  14. 根据权利要求10所述的显示装置，其中，所述裂纹检测电路位于所述显示面板的非显示区。
  15. 根据权利要求10所述的显示装置，其中，所述测试端包括第一输入端、第一输出端、第二输入端和第二输出端，其中，所述第一输入端用于向所述第一端输入第一输入信号，所述第一输出端用于通过所述第二端接收第一输出信号，所述第二输入端用于向所述第三端输入第二输入信号，所述第二输出端用于通过所述第四端接收第二输出信号，所述第一输出信号和所述第二输出信号用于检测所述被检测层是否有裂纹。
  16. 根据权利要求10所述的显示装置，其中，所述测试端包括芯片或者测试点。
  17. 根据权利要求10所述的显示装置，其中，所述显示面板包括基底，所述第一金属走线本体垂直于所述基底的正投影与所述第二金属走线本体垂直于所述基底的正投影至少部分重叠。
  18. 根据权利要求10所述的显示装置，其中，所述第一金属走线本体与所述第二金属走线本体的材料相同或不同。
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