WO2012090771A1 - 蒸着膜の形成方法及び表示装置の製造方法 - Google Patents
蒸着膜の形成方法及び表示装置の製造方法 Download PDFInfo
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- WO2012090771A1 WO2012090771A1 PCT/JP2011/079441 JP2011079441W WO2012090771A1 WO 2012090771 A1 WO2012090771 A1 WO 2012090771A1 JP 2011079441 W JP2011079441 W JP 2011079441W WO 2012090771 A1 WO2012090771 A1 WO 2012090771A1
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- film
- vapor deposition
- forming
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- substrate
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
- C23C16/042—Coating on selected surface areas, e.g. using masks using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/04—Sealing arrangements, e.g. against humidity
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/841—Self-supporting sealing arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/35—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/871—Self-supporting sealing arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/851—Division of substrate
Definitions
- the present invention relates to a method for forming a vapor deposition film patterned into a predetermined shape and a method for manufacturing a display device including the vapor deposition film patterned into the predetermined shape.
- flat panel displays have been used in various products and fields, and further flat panel displays are required to have larger sizes, higher image quality, and lower power consumption.
- an organic EL display device including an organic EL element using electroluminescence (hereinafter referred to as “EL”) of an organic material is an all-solid-state type, low voltage drive, and high-speed response.
- EL organic EL display device
- the organic EL display device has a configuration in which, for example, an organic EL element electrically connected to a TFT is provided on a substrate made of a glass substrate or the like provided with a TFT (thin film transistor).
- organic EL elements including light emitting layers of red (R), green (G), and blue (B) are arranged and formed on a substrate as sub-pixels. Color images are displayed by selectively emitting light from these organic EL elements with a desired luminance using TFTs.
- an organic EL display device it is necessary to form a light emitting layer made of an organic light emitting material that emits light of each color in a predetermined pattern for each organic EL element.
- a vacuum deposition method for example, an ink jet method, a laser transfer method and the like are known.
- a vacuum deposition method for example, in a low molecular organic EL display (OLED), a vacuum deposition method is often used.
- a mask also referred to as a shadow mask in which openings of a predetermined pattern are formed is used, and the deposition surface of the substrate on which the mask is closely fixed is opposed to the deposition source.
- the vapor deposition particles (film forming material) from the vapor deposition source are vapor-deposited on the surface to be vapor-deposited through the opening of the mask, thereby forming a thin film having a predetermined pattern.
- Vapor deposition is performed for each color of the light emitting layer, and this is called “separate vapor deposition”.
- Patent Document 1 and Patent Document 2 describe a method in which the mask is moved little by little with respect to the substrate and the light emitting layers of the respective colors are separately deposited.
- a mask having the same size as the substrate is used, and the mask is fixed so as to cover the deposition surface of the substrate during vapor deposition.
- the vapor deposition apparatus and its associated apparatus are similarly enlarged and complicated, so that the apparatus design becomes difficult and the installation cost becomes high.
- JP-A-8-227276 (published September 3, 1996) JP 2000-188179 A (published July 4, 2000)
- FIGS. 13 and 14 a separate deposition method using a shadow mask 102 smaller than the substrate 101 has been proposed.
- the shadow mask 102 having the opening 102a, the nozzle 103 having the nozzle opening 103a (injection port), and the vapor deposition material supply source 104 connected to the nozzle 103 are integrated.
- a mask unit 105 is used.
- the deposition surface 101a of the substrate 101 and the shadow mask 102 are arranged to face each other, and the gap G between the deposition surface 101a and the shadow mask 102 is fixed while being fixed.
- a deposition film having a stripe pattern can be formed on the deposition surface 101 a of the substrate 101.
- the substrate 101 is fixed, and vapor deposition is performed while scanning the mask unit 105 in the horizontal direction in the figure with respect to the fixed substrate 101.
- a vapor deposition film having a stripe pattern can be formed on the vapor deposition surface 101 a of the substrate 101.
- FIG. 15 is a diagram illustrating a deposition surface 101a of the substrate 101.
- the large-sized substrate 101 includes a deposition region R1 in which a deposition film (for example, a light emitting layer) needs to be formed in each organic EL display device.
- a vapor deposition unnecessary region R2 serving as a terminal portion that does not require the formation of a vapor deposition film (for example, a light emitting layer).
- the vapor deposition film 106 having a stripe pattern is formed not only in the vapor deposition region R1 but also in the vapor deposition unnecessary region R2.
- the shadow mask 102 is a vapor deposition OFF line, i.e., a shadow mask.
- the right tip of 102 reaches the left tip of the vapor deposition unnecessary region R2, it can be considered that vapor deposition particles ejected from the nozzle opening of the nozzle provided in the mask unit are not ejected.
- the vapor deposition film 106 it is possible to prevent the vapor deposition film 106 from being formed in the vapor deposition unnecessary region R2, but in the vapor deposition region R1, the region where the shadow mask 102 still remains is substantially reduced in vapor deposition time. In other words, the vapor deposition amount decreases in a region where the film thickness of the vapor deposition film decreases.
- the vapor deposition film 106 having a uniform film thickness in the vapor deposition region R1 in order to form the vapor deposition film 106 having a uniform film thickness in the vapor deposition region R1, as shown in FIG.
- the vapor deposition film 106 having a stripe pattern is formed not only in R1, but also in the vapor deposition unnecessary region R2.
- FIG. 17 is a diagram for explaining problems that may occur due to the vapor deposition film 106 formed in the vapor deposition unnecessary region R2.
- FIG. 17 is a figure which shows schematic structure of the organic electroluminescence display 113 provided with the vapor deposition film
- FIG. 17B is a plan view showing the terminal portion 107 a of the organic EL display device 113.
- the vapor deposition film 106 having a stripe pattern is formed not only in the vapor deposition region R1 but also in the vapor deposition unnecessary region R2. ing.
- the vapor deposition film 106 is also formed on the terminal portion 107a of the wiring 107 which is the vapor deposition unnecessary region R2.
- the external circuit and the terminal portion 107a of the wiring 107 formed in the vapor deposition unnecessary region R2 are electrically connected to the flexible cable 112 via an anisotropic conductive film (ACF) 111.
- ACF anisotropic conductive film
- the vapor deposition film 106 is a high-resistance film such as an organic vapor deposition film such as a light-emitting layer, electrical conduction failure occurs.
- the vapor deposition film 106 is a low-resistance film such as a metal film. In this case, current leakage occurs.
- the sealing resin 109 is formed in a frame shape in the vapor deposition unnecessary region R2 at the four side ends of the vapor deposition region R1, and the substrate 101 and the sealing substrate 110 are bonded to each other through the sealing resin 109. Yes.
- an anode (not shown), a hole injection layer / hole transport layer (not shown), a vapor deposition film 106 as a light emitting layer, an electron transport layer (not shown), an electron injection layer (not shown), and a cathode 108 are sequentially arranged. It is possible to prevent the organic EL element laminated on the substrate from being deteriorated by moisture or oxygen in the atmosphere.
- the vapor deposition film 106 on the terminal portion 107a in the vapor deposition unnecessary region R2 is after the substrate 101 and the sealing substrate 110 are bonded to each other, and the substrate 101 is attached to each organic EL display device 113. After being divided so as to become, it is generally wiped off using an organic solvent.
- the organic solvent damages the sealing resin 109, and the sealing resin 109 is damaged by the organic solvent.
- moisture and oxygen in the atmosphere easily penetrate from the damaged part.
- an organic EL display device manufactured by a manufacturing method including such a wiping process has a low yield and it is difficult to ensure reliability.
- the present invention has been made in view of the above problems, and it is an object of the present invention to provide a method for forming a deposited film capable of high-definition patterning and a method for manufacturing a display device with improved yield and reliability.
- a method for forming a vapor deposition film according to the present invention is a method for forming a vapor deposition film having a predetermined shape on a substrate, on the surface on which the vapor deposition film is formed on the substrate.
- the method after forming a pattern film having a predetermined shape that has an opening and can be peeled off on the surface of the substrate on which the vapor deposition film is formed, it is relatively easy on the opening and the pattern film.
- Forming a plurality of linear vapor deposition films having a predetermined interval from each other, and peeling the pattern film to form the linear vapor deposition film having a predetermined shape It can be formed as a high-definition pattern.
- a method of manufacturing a display device includes a step of forming a plurality of active elements on a substrate, and an electrical connection to each of the active elements, and on the substrate.
- An opening of a possible pattern film is formed, and the pattern film is formed in at least a part of a non-display area that is a peripheral area of the display area, and the matrix shape is formed on the opening and the pattern film.
- the method for forming a vapor deposition film of the present invention includes a step of forming a pattern film having a predetermined shape that has an opening and can be peeled on the surface of the substrate on which the vapor deposition film is formed, and the opening. And forming a plurality of linear vapor deposition films having a predetermined interval along one direction on the substrate surface on the pattern film, and peeling the pattern film to form the vapor deposition. Forming a film into a predetermined shape.
- an opening of a peelable pattern film is formed in the display region.
- the pattern film is formed in at least a part of the non-display area that is the peripheral area of the display area, and the row direction of the first electrode formed in the matrix form on the opening and the pattern film Alternatively, a plurality of linear light emitting layers having a predetermined distance from each other are formed along the column direction, and after the step of forming at least the light emitting layer in the organic layer, or the second electrode is formed. After the step of performing, the pattern film is peeled off to form at least the light emitting layer in a predetermined shape.
- FIG. 1 It is a figure which shows the pattern shape and light emitting layer of the photosensitive dry film which were formed in the board
- FIG. 1 shows each process of the manufacturing method of the organic electroluminescence display of other one embodiment of this invention. It is a figure which shows schematic structure of the organic electroluminescence display manufactured by the manufacturing method of the organic electroluminescence display of one embodiment of this invention.
- the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are not masked with a shadow mask, and a second mask is used. It is a figure which shows an example of the method of electrically connecting a 2nd electrode and external wiring in the case of forming in the same shape as this electrode.
- a method for forming an organic EL display device will be described as an example in which a method for forming a vapor deposition film capable of high-definition patterning is used.
- the present invention is not limited to this.
- the method for forming a deposited film according to the present invention can be applied to all fields where a deposited film patterned with high definition is required.
- the deposited film formed using the deposited film forming method of the present invention is an organic film.
- the present invention is not limited to this, and the vapor deposition film forming method of the present invention can of course be used for forming an inorganic film.
- FIG. 12 is a diagram showing a schematic configuration of the organic EL display device 1, and FIG. 12A shows a cross section of the organic EL element 10 constituting the display region of the organic EL display device 1.
- An interlayer insulating film 4, a first electrode 5 and an edge cover 6 are formed on a substrate 3 on which a thin film transistor 2 (hereinafter referred to as “TFT”) is formed.
- TFT thin film transistor
- non-alkali glass or plastic can be used as the substrate 3.
- non-alkali glass having a thickness of 0.7 mm is used.
- the interlayer insulating film 4 and the edge cover 6 a known photosensitive resin can be used.
- the photosensitive resin include an acrylic resin and a polyimide resin.
- a photosensitive acrylic resin is used as the interlayer insulating film 4 and the edge cover 6.
- the first electrode 5 is formed in a pattern corresponding to each pixel by photolithography and etching after an electrode material is formed by sputtering or the like.
- the first electrode 5 various conductive materials can be used, but in the case of a bottom emission type organic EL element that emits light to the substrate side, it needs to be transparent or translucent. On the other hand, in the case of a top emission type organic EL element that emits light from the side opposite to the substrate, the second electrode 9 needs to be transparent or translucent.
- the TFT 2 is manufactured by a known method, and in the present embodiment, the manufacture of an active matrix type organic EL display device in which the TFT 2 is formed in each pixel will be described.
- the present invention is also applicable to this organic EL display device.
- the edge cover 6 covers the end portion of the first electrode 5 in order to prevent the organic EL layer from becoming thin at the end portion of the first electrode 5 and short-circuiting with the second electrode 9.
- the first electrode 5 is exposed at a portion without the edge cover 6. This exposed portion becomes a light emitting portion of each pixel.
- each organic EL layer is formed on the first electrode 5.
- the organic EL layer include a hole injection layer and a hole transport layer 7, a light emitting layer 8R, 8G, and 8B, an electron transport layer and an electron that are formed in the same shape as the second electrode 9 (not shown).
- An injection layer etc. are mentioned.
- a carrier blocking layer for blocking the flow of carriers such as holes and electrons may be inserted as necessary.
- one layer may have a plurality of functions.
- a single layer that serves as both a hole injection layer and a hole transport layer, such as a hole injection layer and a hole transport layer 7, may be provided. It may be formed.
- the first electrode 5 is an anode, and from the first electrode 5 side, a hole injection layer and a hole transport layer 7, a light emitting layer 8R, 8G, and 8B, an electron transport layer (not shown), An electron injection layer (not shown) and the second electrode 9 were stacked in this order as a cathode.
- ITO indium-tin oxide
- the materials of the organic EL layer known materials can be used.
- the light emitting layers 8R, 8G, and 8B a single material is used, or a certain material is used as a host material and another material is used as a guest.
- a mixed type mixed as a material or dopant is used.
- Examples of the material for the hole injection layer and the hole transport layer 7 include anthracene, azatriphenylene, fluorenone, hydrazone, stilbene, triphenylene, benzine, styrylamine, triphenylamine, porphyrin, triazole, imidazole, oxadiazole, and oxazole. , Polyarylalkanes, phenylenediamines, arylamines, and derivatives thereof, thiophene compounds, polysilane compounds, vinylcarbazole compounds, aniline compounds, and other heterocyclic conjugated monomers, oligomers, or polymers Can do.
- materials having high light emission efficiency such as low molecular fluorescent dyes and metal complexes are used.
- the electron transport layer and the electron injection layer for example, tris (8-quinolinolato) aluminum complex, oxadiazole derivative, triazole derivative, phenylquinoxaline derivative, silole derivative, and the like can be used.
- 12B includes a first electrode 5, a hole injection layer and a hole transport layer 7, light emitting layers 8R, 8G, and 8B, an electron transport layer, an electron injection layer, and a second electrode 9. It is a figure which shows a mode that the organic EL element 10 was sealed.
- the organic EL elements 10 are not deteriorated by moisture or oxygen in the atmosphere.
- the sealing resin 11 is formed in a frame shape, and the substrate 3 and the sealing substrate 12 are bonded together via the sealing resin 11.
- a glass substrate is used as the sealing substrate 12, and the substrate 3 and the sealing substrate 12 are bonded to each other through a frame-shaped sealing resin 11 having adhesiveness.
- the organic EL element 10 is sealed, but the sealing method of the organic EL element 10 is not limited to this, and for example, the upper surface of the organic EL element 10 is difficult to transmit moisture and oxygen.
- a dense sealing film is formed by a CVD method or the like, and an adhesive is applied to the entire side surface of the organic EL element 10 and bonded to a sealing substrate, or frit glass (powder glass) is formed in a frame shape Alternatively, the organic EL element 10 may be sealed.
- the above sealing method may be used in combination.
- FIG. 3 is a diagram showing a schematic manufacturing process of the organic EL display device 1.
- a substrate 3 having a TFT and a first electrode electrically connected to the TFT is manufactured by a known method (S1).
- a photoresist 13 is formed so as to cover the deposition unnecessary region R2 where the terminal portion and the like are formed on the substrate 3 (S2).
- FIG. 1 is a view showing a state in which a photoresist 13 is formed by patterning on a substrate 3.
- the photoresist 13 is not formed inside the sealing resin 11 formed in a frame shape, but only formed outside the sealing resin 11 formed in a frame shape.
- the photoresist 13 is formed only outside the sealing region of each organic EL panel on the substrate 3, and the photoresist 13 is not formed in the display region R1 (light emitting region) and the sealing region.
- a positive photoresist 13 is used as a pattern film that can be peeled off in a later process, and a coating process, a pre-bake process, an exposure process, a development process, and a post-bake process are performed, and the shape shown in FIG. A photoresist 13 was patterned.
- the photoresist 13 a general-purpose one can be used, but it is preferable to use a photoresist that has a small amount of water absorption and little degassing in a vacuum.
- the gas desorbed from the photoresist 13 may damage the film constituting the organic EL element during the manufacturing process of the organic EL element. There is.
- the photoresist 13 is formed of a low-absorbing material or a heat-resistant material in which moisture and decomposition products are not generated in a subsequent process.
- examples of the heat-resistant material include organic-inorganic hybrid materials, but are not limited thereto.
- the first electrode surface is subjected to plasma treatment or UV treatment before forming the organic layer including at least the light emitting layer. I do.
- a shadow mask having an opening having a predetermined shape is closely fixed on the photoresist 13 on the substrate 3, and a hole injection layer and a hole transport layer are formed on the entire surface by a conventional vacuum deposition method (S3).
- the hole injection layer and the hole transport layer are formed using the shadow mask, but the hole injection layer and the hole transport layer are formed using the photoresist 13 in combination. You can also.
- the second electrode connection portion R3 is an opening of the photoresist 13, when the hole injection layer and the hole transport layer are formed using only the photoresist 13 as a mask, the second electrode A hole injection layer and a hole transport layer are also formed on the connection portion R3. In that case, since an organic film is interposed between the second electrode connection portion R3 and the second electrode, there is a risk of causing a contact failure.
- a hole injection layer and a hole transport layer having a predetermined shape can be formed by using a shadow mask for shielding the portion of the second electrode connection portion R3 and using the photoresist 13 as a mask for the other portions.
- the hole injection layer and the hole transport layer may be vapor-deposited all over the surface of the plurality of organic EL elements, there is no need to perform high-precision patterning, and the display region R1 is open in the entire surface.
- a mask may be used. An open mask can be applied to vapor deposition on a large substrate because the frame for holding the mask is not so large and the weight does not increase.
- a shadow mask 102 smaller than the substrate 101 as shown in FIG. 13 is used, a shadow mask 102 having an opening 102a, a nozzle 103 having a nozzle opening (ejecting port) 103a, and a nozzle 103.
- the vapor deposition material supply source 104 connected to the substrate performs vapor deposition while scanning the substrate 101 in the left-right direction in the drawing with respect to the integrated mask unit 105, and as shown in FIG.
- the light emitting layers 8R, 8G, and 8B having a stripe pattern extending in the horizontal direction inside were formed (S4).
- the present invention is not limited to this.
- the unit 105 may be scanned, and further, the substrate 101 and the mask unit 105 may be scanned in opposite directions.
- the length in the longitudinal direction of the shadow mask 102 for each color that is open only in the portion corresponding to the sub-pixels of each color R, G, and B is the vertical length of the display region R1 shown in FIG.
- the substrate 3 is scanned in the right direction in the drawing with respect to the mask unit 105.
- the substrate 3 is moved upward in the drawing with respect to the mask unit 105 and the alignment is adjusted. Scanning is performed in the left direction in the figure.
- the shape of the shadow mask 102 is not limited to this, and can be appropriately set as long as the shadow mask 102 is not bent or stretched by its own weight. Moreover, it can also vapor-deposit collectively with respect to the display area
- the light emitting layer 8R When the light emitting layer 8R is vapor-deposited, R (red) vapor-deposited particles are ejected from the vapor deposition material supply source 104, and the above scanning is performed by the shadow mask 102 having an opening corresponding only to the R sub-pixel. By performing vapor deposition by the above, the light emitting layer 8R is formed in each R sub-pixel.
- a light-emitting layer was formed in a portion corresponding to each sub-pixel using the same method.
- the light emitting layers 8R, 8G, and 8B are formed by a separate coating vapor deposition method.
- the substrate 101 is scanned and deposited on the mask unit 105, but as shown in FIG. 14, the mask unit 105 is scanned and deposited on the substrate 101. May be performed.
- a stripe pattern is formed on the vapor deposition surface 101a of the substrate 101 with a gap G between the vapor deposition surface 101a of the substrate 101 and the shadow mask 102 being a predetermined interval.
- the light emitting layers 8R, 8G, and 8B are formed, the light emitting layers 8R, 8G, and 8B having a stripe pattern can be formed in a state where the deposition surface 101a of the substrate 101 and the shadow mask 102 are in close contact with each other. .
- a vapor deposition apparatus as shown in FIG. 13 is used to form the light emitting layers 8R, 8G, and 8B having a stripe pattern, but the film thickness is uniform and the stripe shape is fine. If the pattern of this can be formed, it will not specifically limit to the kind of vapor deposition apparatus to be used.
- a shadow mask having an opening having a predetermined shape is closely fixed on the photoresist 13 on the substrate 3, and an electron transport layer and an electron injection layer are sequentially formed on the entire surface by a conventional vacuum deposition method (S5, S6). .
- second electrodes are sequentially formed on the entire surface by a conventional vacuum deposition method (S7).
- the second electrode connection portion R3 formed on the substrate 3 formed in the portion is electrically connected to the wiring on the substrate 3.
- the electron transport layer and the electron injection layer are formed using a shadow mask.
- the photoresist 13 is also used. It can be used together as part of the mask.
- the first electrode, the hole injection layer and the hole transport layer, the light emitting layers 8R, 8G, and 8B, the electron transport layer, the electron injection layer, and the second electrode are formed on the substrate 3 on which the deposition has been completed. Sealing of the sealing region including the display region R1 is performed so that the organic EL element including the above is not deteriorated by moisture or oxygen in the atmosphere (S8).
- a sealing resin 11 is formed in a frame shape at the four side ends of the sealing region including the display region R ⁇ b> 1, and the substrate 3 is sealed with the sealing resin 11 interposed therebetween.
- a substrate (not shown) is bonded together.
- the photoresist 13 is peeled off (S9).
- a laminated film (a hole injection layer and a hole transport layer, a light emitting layer 8R ⁇ 8G ⁇ 8B, an electron transport layer, an electron injection layer, a second layer laminated on the surface of the photoresist 13 is removed. Electrode) can also be peeled off.
- the photoresist 13 can be peeled off from the substrate 3 by using the photoresist 13 that is peeled off with an aqueous stripping solution and stripping and cleaning the sealed substrate 3 with the above stripping solution.
- FIG. 2 shows the substrate 3 after the photoresist 13 has been peeled off.
- the hole injection layer and the hole transport layer, the light emitting layers 8R, 8G, and 8B, the electron transport layer, the electron injection layer, and the second electrode are not stacked in the deposition unnecessary region R2.
- the substrate 3 is divided for each organic EL panel (S10), and connected to an external circuit (drive circuit) using the terminal portion formed in the vapor deposition unnecessary region R2 (S11).
- the organic EL display device 1 is manufactured, and a desired display is performed by causing a current to flow from the driving circuit formed outside to the organic EL element provided for each sub-pixel to emit light. Can be done.
- FIG. 4 is a diagram showing a schematic manufacturing process of an organic EL display device using a conventional scanning-type separate vapor deposition method that does not include a pattern film that can be peeled off in a later process.
- a substrate including a TFT and a first electrode electrically connected to the TFT is manufactured by a known method (S101).
- a hole injection layer and a hole transport layer are formed on the entire surface by a vacuum deposition method on the substrate using only a normal open mask (S102).
- the photoresist 13 Since the photoresist 13 is not provided in the manufacturing process of the organic EL display device using the conventional scanning-type coating vapor deposition method shown in FIG. 4, the photoresist 13 cannot be used as a mask in general. Therefore, it is necessary to deposit only with an open mask.
- the photoresist 13 can be used in combination as a mask, so that the contact area of the open mask is reduced by reducing the contact area of the open mask. Since the damage to the pattern on the substrate can be reduced and the photoresist 13 covers the deposition unnecessary region R2 where the terminal portion is formed and also serves as a protective film for the terminal portion, the direct contact between the open mask and the terminal portion is possible. Therefore, it is possible to prevent damage to the terminal portion due to the open mask and improve the yield of the organic EL display device.
- the photoresist 13 covers the vapor deposition unnecessary region R2 in which the terminal portion is formed, it is possible to prevent foreign matter from getting on the terminal portion and the like, and to improve the reliability of the organic EL display device. .
- the photoresist 13 that covers the vapor deposition unnecessary region R2 is not provided, and thus has a stripe pattern.
- the light emitting layer is also deposited in the deposition unnecessary region R2, and as a result, the light emitting layer is directly deposited on the terminal portion.
- an electron transport layer, an electron injection layer, and a second electrode are sequentially formed on the entire surface by a conventional vacuum deposition method using only a normal open mask (S104). , S105, S106).
- the photoresist 13 In the step of forming the electron transport layer and the electron injection layer, since the photoresist 13 is not provided, the photoresist 13 cannot be used as a mask, and the hole injection layer and the hole transport layer are formed on the substrate. Problems similar to those already described in the part of the step (S102) of forming the entire surface by the vacuum deposition method occur in the same way.
- the photoresist 13 cannot be used as a mask, and it is necessary to use a normal open mask. For this reason, not only the same problems as the formation of the electron transport layer and the electron injection layer occur, but also facilities for using an open mask are required.
- the organic EL element sealing process (S107) and the process of dividing the substrate for each organic EL panel (S108) are performed.
- a wiping step (S109) of the light emitting layer formed in the vapor deposition unnecessary region R2 with an organic solvent is performed.
- the wiping step it is necessary to wipe off the deposited light emitting layer directly from the deposition unnecessary region R2 using an organic solvent, but it is not easy to completely remove the deposited light emitting layer, and the residue The problem that is likely to remain.
- the photoresist 13 is used. Therefore, the existing photoresist peeling technique is used to remove the residue-free photoresist and remove the peeling liquid. It is possible to suppress the damage to the sealing resin due to the removal of the overlying foreign matter by the freedom and the freedom of selection of the photoresist and the stripping solution, which may occur when the photoresist 13 as described above is not provided. The problem can be avoided.
- FIG. 5A and FIG. 5B show three types of sub-pixels each having an organic EL element having a light emitting layer of each color of red (R), green (G), and blue (B). Are arranged so as to be adjacent to each other in the vertical direction, and form one pixel of the organic EL display device, and the photoresist 13 is formed in the region where the light emitting layers 8R, 8G, and 8B are formed in the vapor deposition unnecessary region R2.
- R red
- G green
- B blue
- the vapor deposition unnecessary region R2 in which the light emitting layers 8R, 8G, and 8B having the stripe pattern are not formed is not necessarily covered with the photoresist 13, and therefore the photoresist 13 is formed as shown in FIG.
- the photoresist 13 may be formed in a stripe shape extending in the vertical direction in the figure as shown in (a) or in an island shape as shown in (b) in FIG.
- the photoresist 13 is formed on the light emitting layer 8R.
- the photoresist 13 is provided in a pattern as shown in FIG. 1, such as being unable to be used as a mask during the deposition of organic films other than 8G and 8B, the obtained effect is reduced.
- the light emitting layers 8R, 8G, and 8B having the above can be subjected to high-definition patterning.
- the amount of use of the photoresist 13 can be reduced, so that the material cost can be reduced.
- the amount of degassing from the photoresist 13 can be reduced, and the adverse effect on the organic EL element can be further reduced.
- the pattern shape of the photoresist 13 shown in FIGS. 5A and 5B is an example, and the number, arrangement, model, size, and the like of the organic EL panels in the substrate surface are shown. In consideration of this, the pattern shape of the photoresist 13 may be determined as appropriate.
- (c) in FIG. 5 and (d) in FIG. 5 include three types of sub-pixels each having an organic EL element having a light emitting layer of each color of red (R), green (G), and blue (B).
- the light-emitting layers 8R, 8G, and 8B are formed on the photoresist 13 in the evaporation unnecessary region R2. It is a figure which shows the example currently formed in the area
- the vapor deposition unnecessary region R2 in which the light emitting layers 8R, 8G, and 8B having the stripe pattern are not formed is not necessarily covered with the photoresist 13, and therefore the photoresist 13 is formed as shown in FIG. It may be formed in a stripe shape extending in the left-right direction in the figure as shown in (c) or an island shape as shown in (d) in FIG.
- the photoresist 13 has not been formed in the sealing region including the display region R1, but in this embodiment, the display region R1 is included if there is no problem in the characteristics of the organic EL display device. Photoresist 13 as a convex portion may be formed in the sealing region.
- the sealing substrate collides with the organic EL element, and the organic EL element It can function as a pillar that prevents damage.
- the present invention is not limited to this.
- the substrate 101 may be slid and evaporated while the deposition surface 101a of the substrate 101 and the shadow mask 102 are in close contact with each other.
- the photoresist 13 can prevent the deposition surface 101a of the substrate 101 from being damaged by the adhesion between the deposition surface 101a of the substrate 101 and the shadow mask 102.
- the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are deposited using a shadow mask (open mask). Or it can also form using the vapor deposition method like FIG. In that case, a mask that forms an opening on the entire surface of the display region R1 may be used instead of the mask that is patterned in a stripe shape.
- the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are deposited using an open mask, but the other electrode that connects the second electrode to the wiring of the substrate 3 is used. If there is a means, the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer can be formed in the same manner as the second electrode without using an open mask.
- FIG. 18 shows a case where the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are formed in the same shape as the second electrode using a photoresist as a mask without using a shadow mask (open mask). It is a figure which shows an example of the method of electrically connecting the 2nd electrode and external wiring in FIG.
- the convex portion 15 shown in the figure is formed using the photoresist 13, but the present invention is not limited to this, and the edge cover shown in FIG. 6 may be used.
- the convex 15, the photoresist 13, and the layer forming the edge cover 6 may be the same layer.
- a hole injection layer and a hole transport layer 7 As shown in the figure, on the convex portion 15, there are a hole injection layer and a hole transport layer 7, an electron transport layer (not shown), an electron injection layer (not shown), and a second electrode 9. Is formed.
- a wiring / second electrode connection portion R3 made of a conductive material is formed on the surface of the sealing substrate 12 facing the substrate 3, and the wiring / second electrode connection portion R3 is formed in the display region R1. It is electrically connected to the second electrode 9 and is drawn out of a sealing region surrounded by a sealing resin 11 formed in a frame shape by wiring.
- the wiring and second electrode connection portion R3 is connected to the wiring 107 of the substrate 3 by the conductive film 111.
- the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are not used as shadow masks (open masks), and a photoresist is used as a mask. Even when formed in the same shape, the second electrode can be connected to an external circuit.
- the organic layer other than the light emitting layer and the second electrode can be formed in a predetermined shape without a mask.
- the manufacturing process of the organic EL display device 1c shown in FIG. 18 it is possible not only to prevent the pattern on the substrate from being damaged by the contact of the vapor deposition mask, but also to use the photoresist 13 as the vapor deposition mask.
- the device tact time can be improved and the equipment cost can be reduced by reducing the mounting time of the device. As a result, the cost of the organic EL display device 1c can be reduced.
- the vapor deposition mask never contacts in the manufacturing process of the organic EL element. Therefore, there is no fear of pattern damage on the substrate due to contact with the vapor deposition mask, and the yield of the organic EL display device 1c can be further improved.
- Embodiment 2 Next, a second embodiment of the present invention will be described based on FIGS.
- a sealing film is formed using the photoresist 13 as a mask, and then the photoresist 13 is peeled off.
- the point which seals an organic EL element using a stop board is different from Embodiment 1, and it is as having demonstrated in Embodiment 1 about the other structure.
- members having the same functions as those shown in the drawings of the first embodiment are given the same reference numerals, and descriptions thereof are omitted.
- FIG. 8 is a diagram showing a schematic manufacturing process of the organic EL display device 1a.
- FIG. 6 is a diagram showing the pattern shape of the photoresist 13 and the light emitting layers 8R, 8G, and 8B formed on the substrate 3a provided with the organic EL display device 1a.
- a dense sealing film (not shown) that is difficult to transmit moisture and oxygen is formed on the second electrode, which is the upper surface of the organic EL element, by a CVD method or the like.
- a sealing resin or frit glass (powder glass) was formed in a frame shape on the side surface of the organic EL element, and the organic EL element was sealed (S8).
- the light emitting layers 8R, 8G, and 8B, the second electrode, and the sealing film are formed using the photoresist 13 as a mask.
- the present invention is not limited to this.
- the organic layers other than the light emitting layers 8R, 8G, and 8B can be formed by using only the photoresist 13 or using the photoresist 13 and an open mask in combination.
- the photoresist 13 is peeled off (S9). At this time, since the organic EL element is protected by the sealing film or the like as described above, the organic EL element is not damaged in the peeling process.
- the first electrode, the hole injection layer and the hole transport layer, the light emitting layers 8R, 8G, and 8B, the electron transport layer, the electron injection layer, and the second electrode were provided for the substrate 3a after the vapor deposition.
- the sealing region including the display region R1 is sealed so that the organic EL element is not deteriorated by moisture or oxygen in the atmosphere (S10).
- a sealing resin 11 is formed in a frame shape at the four side ends of the sealing region including the display region R1, and the substrate 3a is sealed with the sealing resin 11 interposed therebetween.
- a substrate (not shown) is bonded together.
- the substrate 3a is divided for each organic EL panel (S11), and connected to an external circuit (drive circuit) using the terminal portion formed in the vapor deposition unnecessary region R2 (S12), and the organic EL display device Complete 1a.
- the photoresist 13 can be used as a vapor deposition mask, it is possible to improve the apparatus tact by reducing the time for mounting the vapor deposition mask and to reduce the equipment cost. As a result, the cost of the organic EL display device 1a can be reduced. .
- damage to the surface of the organic EL panel can be reduced by reducing the number of mask adhesions to the substrate 3a, leading to an improvement in the yield of the organic EL display device 1a.
- the second electrode and the sealing film are formed by a vapor deposition method; however, the present invention is not limited to this, and other film formation methods such as a sputtering method are used. You can also
- the step of forming the sealing film may be omitted.
- the outer edge of the sealing region which is the region surrounded by the sealing resin 11, is also included in the vapor deposition unnecessary region R2, and is protected by the photoresist 13 (see FIG. 6).
- the organic EL element is sealed in a frame shape with the sealing resin 11 or frit glass (powder glass), or when the sealing substrate and the TFT substrate are bonded and sealed with the sealing resin 11,
- the deposited film is not interposed (interposed) between the substrates at the outer edge of the sealing region.
- a photosensitive dry film 14 is used instead of the photoresist 13 as a pattern film, and the second electrode is formed after the dry film 14 peeling step. It is different from Form 1.
- the organic layers other than the light emitting layers 8R, 8G, and 8B are different from the first embodiment in that the dry film 14 is formed as a mask without using the vapor deposition mask.
- the photosensitive dry film 14 covers the frame-shaped region where the sealing resin is applied, and only the display region R1 is open, which is different from the first embodiment.
- FIG. 11 is a diagram showing a schematic manufacturing process of the organic EL display device 1b.
- a photosensitive dry film 14 is formed as a pattern film instead of the photoresist 13, and the photosensitive dry film 14 is used as a mask to form a deposited film.
- 3 is the same as the steps S1, S2, and S4 already described with reference to FIG. 3 in the first embodiment, and thus the description thereof is omitted.
- the processes of S3, S5 and S6 are similar to the process of S7 of FIG. 3 in the first embodiment. That is, the hole injection layer, the hole transport layer, the electron transport layer, and the electron injection layer are formed using the dry film 14 having only the display region R1 opened as a mask. Since the dry film 14 covers the second electrode connection portion R3, the organic layer is not formed thereon.
- FIG. 9 is a diagram showing the pattern shape of the photosensitive dry film 14 formed on the substrate 3b and the light emitting layers 8R, 8G, and 8B.
- the photosensitive dry film 14 is formed to have an opening in the display region R1.
- a negative photosensitive dry film 14 is used, and this photosensitive dry film 14 is in a film form and is mechanically peeled off in the state of the film after patterning. Can be done.
- the photosensitive dry film 14 is peeled off before forming the second electrode (S7).
- the second electrode is used by using a normal open mask (a shadow mask having an opening in a region including the display region R1 and the second electrode connection portion R3). Is deposited (S8).
- the first electrode, the hole injection layer and the hole transport layer, the light emitting layers 8R, 8G, and 8B, the electron transport layer, the electron injection layer, and the second electrode are formed on the substrate 3b that has been deposited. Sealing of the sealing region including the display region R1 is performed so that the organic EL element including the above is not deteriorated by moisture or oxygen in the atmosphere (S9).
- FIG. 10 is a view showing the substrate 3b after the photosensitive dry film 14 is peeled off and the second electrode is deposited and the sealing region including the display region R1 is sealed.
- sealing resin 11 is formed in a frame shape at the four side end portions of the sealing region including display region R1, and substrate 3b and sealing substrate (not yet) are interposed via sealing resin 11. Are attached to each other.
- the substrate 3b is divided for each organic EL panel (S10) and connected to an external circuit (drive circuit) using the terminal portion formed in the vapor deposition unnecessary region R2 (S11), and the organic EL display device Complete 1b.
- the photosensitive dry film 14 can be used as a vapor deposition mask for an organic film including the light emitting layers 8R, 8G, and 8B, it is possible to improve the apparatus tact and reduce the equipment cost by reducing the deposition time of the vapor deposition mask. As a result, the cost of the organic EL display device 1b can be reduced.
- the outer edge of the sealing region that is the region surrounded by the sealing resin 11 is also included in the vapor deposition unnecessary region R2 and is protected by the photosensitive dry film 14. (See FIGS. 9 and 10).
- the organic EL element is sealed in a frame shape with the sealing resin 11 or frit glass (powder glass), or when the sealing substrate and the TFT substrate are bonded and sealed with the sealing resin 11,
- the deposited film is not interposed (interposed) between the substrates at the outer edge of the sealing region.
- the method for forming a vapor deposition film of the present invention is a first method different from the above vapor deposition film using the pattern film as a mask before or / and after the step of forming the vapor deposition film on the opening and the pattern film.
- a step of forming a film is included, and the pattern film is preferably peeled after the step of forming the first film.
- the maskless vapor deposition can be performed, and the apparatus tact can be reduced by reducing the mounting time of the vapor deposition mask. Can be improved and the equipment cost can be reduced.
- damage to the surface of the substrate can be reduced by reducing the number of adhesions of the vapor deposition mask.
- the vapor deposition film forming method of the present invention is different from the above vapor deposition film by using a mask having a through-hole before or / and after the step of forming the vapor deposition film on the opening and the pattern film.
- the step of forming a second film is included, and the pattern film is preferably peeled off after the step of forming the second film.
- the mask having a through hole and the substrate are brought into close contact with each other through the pattern film, so that the pattern film serves as a protective film for the substrate and reduces damage to the surface of the substrate. be able to.
- the pattern film is preferably formed by exposing and developing a photosensitive material.
- the pattern film can be patterned relatively easily and can be peeled off using a stripping solution.
- the pattern film is preferably a film-like peelable dry film.
- the pattern film can be peeled off in a film form without using a stripping solution, adverse effects that can occur when using the stripping solution can be suppressed.
- the pattern film is formed of a heat-resistant material that does not cause decomposition products in a subsequent process of forming the pattern film.
- the influence of the pattern film in the subsequent process can be suppressed.
- a vapor deposition mask having a through hole and a smaller area than the substrate, and a vapor deposition material supply source
- the vapor deposition mask in the mask unit to which is fixed is maintained at a certain distance from the substrate, and at least one of the mask unit and the substrate is scanned with respect to the other, and the vapor deposition film Is preferably formed.
- the vapor deposition mask in the mask unit and the substrate may be in close contact with each other.
- the substrate and the vapor deposition mask are in close contact with each other via the pattern film, damage to the substrate by the vapor deposition mask can be prevented by the pattern film.
- the method for producing a display device of the present invention includes a step of forming at least one layer in the organic layer including the metal layer and a layer other than the light emitting layer, using the pattern film as a mask. Preferably it is.
- the pattern film is used as a mask in the step of forming at least one layer selected from the organic layer, the layer other than the light emitting layer, the metal layer, and the inorganic layer. Therefore, in the process of forming these films, it is possible to perform vapor deposition without using a mask, and it is possible to improve the apparatus tact and reduce the equipment cost by reducing the mask mounting time.
- the damage to the surface of the substrate can be reduced by reducing the number of adhesion of the mask.
- the yield and reliability can be improved, and the manufacturing cost can be suppressed.
- the manufacturing method of the display device of the present invention includes a step of forming at least one layer in the organic layer including a layer other than the light-emitting layer and an inorganic layer including a metal layer using a mask having a through-hole. It is preferable that
- the mask having a through hole and the substrate are brought into close contact with each other through the pattern film, so that the pattern film serves as a protective film for the substrate and reduces damage to the surface of the substrate. Therefore, a method for manufacturing a display device with improved yield and reliability can be realized.
- the pattern film is peeled off after the step of forming the second electrode.
- the pattern film is used as a mask.
- the second electrode is preferably formed.
- the step of forming the second electrode can be performed without a mask, and the device tact can be reduced by reducing the wearing time of the mask. Can be improved and the equipment cost can be reduced.
- damage to the surface of the substrate can be reduced by reducing the number of adhesions of the vapor deposition mask.
- the second electrode is preferably formed using a mask having a through hole.
- the second electrode is formed using a mask having a through hole, the organic layer is not interposed between the connection portion of the wiring and the second electrode.
- the shape of the second electrode can be formed.
- the manufacturing method of the display device of the present invention includes a step of sealing the first electrode, the organic layer, and the second electrode with a sealing member, and the step of peeling the pattern film includes It is preferably performed after the step of sealing with the sealing member.
- the pattern film is peeled in a state where the first electrode, the organic layer, and the second electrode are sealed with a sealing member, adverse effects due to the stripping solution are suppressed. be able to.
- the method for manufacturing a display device of the present invention includes a step of forming a sealing film that seals the first electrode, the organic layer, and the second electrode, using the pattern film as a mask.
- the step of forming the sealing film is performed before peeling the pattern film, and after peeling the pattern film, the first electrode, the organic layer, the second electrode, It is preferable to perform a step of sealing the sealing film with a sealing member.
- the pattern film is peeled in a state where the first electrode, the organic layer, and the second electrode are sealed with a sealing film, adverse effects due to the stripping solution are suppressed. be able to.
- the sealing film is sealed separately from the sealing film, the reliability can be improved.
- the pattern film is preferably formed by exposing and developing a photosensitive material.
- the pattern film can be patterned relatively easily and can be peeled off using a stripping solution.
- the pattern film is a film-like peelable dry film formed by exposing and developing a photosensitive material, the first electrode;
- the pattern film is preferably peeled off before the step of sealing the organic layer and the second electrode with a sealing member.
- the pattern film can be peeled off without using a stripping solution, the pattern film can be peeled before the step of sealing with the sealing member.
- the pattern film is formed of a heat-resistant material that does not cause decomposition products in a subsequent process of forming the pattern film.
- the influence of the decomposition product of the pattern film in the subsequent process can be suppressed.
- the convex portion formed by the method prevents the organic layer, the second electrode, and the like from coming into contact with the sealing member and being damaged, for example, by pressing the sealing member. be able to.
- the second electrode is provided on the convex portion.
- the step of forming the convex portion is the same step as the step of forming the pattern film.
- the convex portion is formed in the step of forming the pattern film, a separate step for providing the convex portion is not necessary.
- the step of forming the pattern film may be the same step as the step of forming the edge cover formed so as to cover the end portion of the first electrode. preferable.
- the pattern film is formed in the step of forming the edge cover, there is no need for a separate process for providing the pattern film.
- a plurality of electrodes having a predetermined distance from each other along a row direction or a column direction of the first electrode formed in the matrix on the opening and the pattern film.
- the vapor deposition mask in the mask unit and the substrate may be in close contact with each other.
- the substrate and the vapor deposition mask are in close contact with each other via the pattern film, damage to the substrate by the vapor deposition mask can be prevented by the pattern film.
- the pattern film is formed also in a region where the sealing member is formed in a non-display region which is a peripheral region of the display region.
- the vapor deposition film is not interposed (interposed) between the substrates in the region where the sealing member is formed, the adhesion of the sealing member can be improved and the pores can be prevented. Since the performance can be sufficiently exhibited, the reliability of the organic EL display device can be further improved.
- the present invention can be suitably used in, for example, a manufacturing process of an organic EL display device.
- Organic EL display device (display device) 2 TFT (active element) 3, 3a, 3b Substrate 5 First electrode 7 Hole injection layer and hole transport layer (organic layer) 8R, 8G, 8B Light emitting layer 9 Second electrode 10 Organic EL element 11 Sealing resin (sealing member) 12 Sealing substrate (sealing member) 13 Photoresist (pattern film) 14 Photosensitive dry film (pattern film) 15 Convex part R1 Display area R2 Vapor deposition unnecessary area (non-display area) R3 Second electrode connection part
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Abstract
Description
図12は、有機EL表示装置1の概略構成を示す図であり、図12の(a)は、有機EL表示装置1の表示領域を構成する有機EL素子10の断面を示したものである。
次に、図6から図8に基づいて、本発明の第2の実施形態について説明する。本実施の形態においては、発光層8R・8G・8Bを含む有機層の形成工程後に、フォトレジスト13をマスクとして、封止膜を形成し、その後、フォトレジスト13の剥離を行った後に、封止基板を用いて、有機EL素子の封止を行っている点において、実施の形態1とは異なっており、その他の構成については実施の形態1において説明したとおりである。説明の便宜上、上記の実施の形態1の図面に示した部材と同じ機能を有する部材については、同じ符号を付し、その説明を省略する。
次に、図9から図11に基づいて、本発明の第3の実施形態について説明する。本実施の形態においては、パターン膜としてフォトレジスト13の代わりに感光性のドライフィルム14が用いられるとともに、このドライフィルム14の剥離工程後に、第2の電極が形成されるという点において、実施の形態1とは異なっている。
2 TFT(アクティブ素子)
3、3a、3b 基板
5 第1の電極
7 正孔注入層および正孔輸送層(有機層)
8R、8G、8B 発光層
9 第2の電極
10 有機EL素子
11 封止樹脂(封止部材)
12 封止基板(封止部材)
13 フォトレジスト(パターン膜)
14 感光性のドライフィルム(パターン膜)
15 凸部
R1 表示領域
R2 蒸着不要領域(非表示領域)
R3 第2の電極接続部
Claims (25)
- 基板に所定形状の蒸着膜を形成する蒸着膜の形成方法であって、
上記基板において上記蒸着膜が形成される面に、開口部を有するとともに剥離可能な所定形状のパターン膜を形成する工程と、
上記開口部および上記パターン膜上に、上記基板面上のある一つの方向に沿って、互いに所定間隔を有する複数の直線状の上記蒸着膜を形成する工程と、
上記パターン膜を剥離することによって、上記蒸着膜を所定形状に形成する工程と、を有することを特徴とする蒸着膜の形成方法。 - 上記開口部および上記パターン膜上に上記蒸着膜を形成する工程の前または/および後には、上記パターン膜をマスクとして、上記蒸着膜とは異なる第1の膜を形成する工程が含まれており、
上記パターン膜の剥離は、上記第1の膜を形成する工程の後に行われることを特徴とする請求項1に記載の蒸着膜の形成方法。 - 上記開口部および上記パターン膜上に上記蒸着膜を形成する工程の前または/および後には、貫通孔を有するマスクを用いて、上記蒸着膜とは異なる第2の膜を形成する工程が含まれており、
上記パターン膜の剥離は、上記第2の膜を形成する工程の後に行われることを特徴とする請求項1に記載の蒸着膜の形成方法。 - 上記パターン膜は、感光性材料を露光および現像して形成されていることを特徴とする請求項1から3の何れか1項に記載の蒸着膜の形成方法。
- 上記パターン膜は、フィルム状で剥離可能なドライフィルムであることを特徴とする請求項4に記載の蒸着膜の形成方法。
- 上記パターン膜は、上記パターン膜を形成する工程の後工程において、分解物が生じない耐熱性材料で形成されていることを特徴とする請求項1から5の何れか1項に記載の蒸着膜の形成方法。
- 上記開口部および上記パターン膜上に上記蒸着膜を形成する工程においては、
貫通孔を有するとともに、上記基板よりも面積が小さい蒸着マスクと、蒸着材料供給源から供給された蒸着粒子を上記蒸着マスクを介して、上記基板における上記パターン膜が形成された面に射出する射出口と、を備え、かつ、上記蒸着マスクと上記射出口との相対的な位置が固定されたマスクユニットにおける上記蒸着マスクは、上記基板とは、一定距離で維持されており、
上記マスクユニットおよび上記基板の少なくとも何れかの一方は、他方に対して、走査され、上記蒸着膜が形成されることを特徴とする請求項1から6の何れか1項に記載の蒸着膜の形成方法。 - 上記マスクユニットにおける上記蒸着マスクと、上記基板とは、密着されていることを特徴とする請求項7に記載の蒸着膜の形成方法。
- 基板上に複数のアクティブ素子を形成する工程と、
上記各々のアクティブ素子に電気的に接続され、かつ、上記基板上の表示領域にマトリクス状に第1の電極を形成する工程と、
上記第1の電極上に、少なくとも発光層を含む有機層を形成する工程と、
少なくとも上記有機層上に、上記第1の電極とは逆の極性を有する第2の電極を形成する工程と、を有する表示装置の製造方法であって、
上記有機層中、少なくとも上記発光層を形成する工程においては、
上記表示領域には、剥離可能なパターン膜の開口部が形成され、
上記表示領域の周辺領域である非表示領域の少なくとも一部には、上記パターン膜が形成され、
上記開口部および上記パターン膜上に、上記マトリクス状に形成された第1の電極の行方向または、列方向に沿って、互いに所定間隔を有する複数の直線状の少なくとも上記発光層が形成され、
上記有機層中、少なくとも上記発光層を形成する工程の後または、上記第2の電極を形成する工程の後に、
上記パターン膜を剥離することによって、少なくとも上記発光層を所定形状に形成することを特徴とする表示装置の製造方法。 - 上記パターン膜をマスクとして、上記有機層中、上記発光層以外の層および金属層を含む無機層における少なくとも一つ以上の層を形成する工程が含まれていることを特徴とする請求項9に記載の表示装置の製造方法。
- 貫通孔を有するマスクを用いて、上記有機層中、上記発光層以外の層および金属層を含む無機層における少なくとも一つ以上の層を形成する工程が含まれていることを特徴とする請求項9に記載の表示装置の製造方法。
- 上記パターン膜の剥離は、上記第2の電極を形成する工程の後に行われ、
上記第2の電極を形成する工程においては、上記パターン膜をマスクとして、上記第2の電極が形成されることを特徴とする請求項10に記載の表示装置の製造方法。 - 上記第2の電極を形成する工程においては、貫通孔を有するマスクを用いて、上記第2の電極が形成されることを特徴とする請求項11に記載の表示装置の製造方法。
- 上記第1の電極と、上記有機層と、上記第2の電極と、を封止部材で封止する工程を有し、
上記パターン膜を剥離する工程は、上記封止部材で封止する工程の後に行われることを特徴とする請求項9から13の何れか1項に記載の表示装置の製造方法。 - 上記パターン膜をマスクとして、上記第1の電極と、上記有機層と、上記第2の電極と、を封止する封止膜を形成する工程を有し、
上記封止膜を形成する工程は、上記パターン膜を剥離する前に行われ、
上記パターン膜を剥離した後には、上記第1の電極と、上記有機層と、上記第2の電極と、上記封止膜と、を封止部材で封止する工程を行うことを特徴とする請求項9から13の何れか1項に記載の表示装置の製造方法。 - 上記パターン膜は、感光性材料を露光および現像して形成されていることを特徴とする請求項9から15の何れか1項に記載の表示装置の製造方法。
- 上記パターン膜が、感光性材料を露光および現像して形成されるフィルム状で剥離可能なドライフィルムである場合には、
上記第1の電極と、上記有機層と、上記第2の電極と、を封止部材で封止する工程の前に、上記パターン膜を剥離することを特徴とする請求項9から13の何れか1項に記載の表示装置の製造方法。 - 上記パターン膜は、上記パターン膜を形成する工程の後工程において、分解物が生じない耐熱性材料で形成されていることを特徴とする請求項9から17の何れか1項に記載の表示装置の製造方法。
- 上記第1の電極と、上記有機層と、上記第2の電極と、を封止部材で封止する工程の前に、上記表示領域の一部に、上記封止部材を支える凸部を形成する工程を有することを特徴とする請求項9から18の何れか1項に記載の表示装置の製造方法。
- 上記凸部上には、上記第2の電極が備えられていることを特徴とする請求項19に記載の表示装置の製造方法。
- 上記凸部を形成する工程は、上記パターン膜を形成する工程と同一工程であることを特徴とする請求項19または20に記載の表示装置の製造方法。
- 上記パターン膜を形成する工程は、上記第1の電極の端部を覆うように形成されているエッジカバーを形成する工程と同一工程であることを特徴とする請求項9から21の何れか1項に記載の表示装置の製造方法。
- 上記開口部および上記パターン膜上に、上記マトリクス状に形成された第1の電極の行方向または、列方向に沿って、互いに所定間隔を有する複数の直線状の少なくとも上記発光層を形成する際には、
貫通孔を有するとともに、上記基板よりも面積が小さい蒸着マスクと、蒸着材料供給源から供給された蒸着粒子を上記蒸着マスクを介して、上記基板における上記パターン膜が形成された面に射出する射出口と、を備え、かつ、上記蒸着マスクと上記射出口との相対的な位置が固定されたマスクユニットにおける上記蒸着マスクは、上記基板とは、一定距離で維持されており、
上記マスクユニットおよび上記基板の少なくとも何れかの一方は、他方に対して、走査され、少なくとも上記発光層が形成されることを特徴とする請求項9から22の何れか1項に記載の表示装置の製造方法。 - 上記マスクユニットにおける上記蒸着マスクと、上記基板とは、密着されていることを特徴とする請求項23に記載の表示装置の製造方法。
- 上記表示領域の周辺領域である非表示領域において、上記封止部材が形成される領域にも上記パターン膜が形成されていることを特徴とする請求項15または17に記載の表示装置の製造方法。
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WO2014034499A1 (ja) * | 2012-09-03 | 2014-03-06 | 東京エレクトロン株式会社 | 蒸着装置、蒸着方法、有機elディスプレイ、および有機el照明装置 |
CN110945674A (zh) * | 2017-06-15 | 2020-03-31 | 高丽大学校世宗产学协力团 | 伸缩性基板结构体及其制作方法、伸缩性显示器及其制作方法以及伸缩性显示器使用方法 |
WO2020065964A1 (ja) * | 2018-09-28 | 2020-04-02 | シャープ株式会社 | 表示装置および表示装置の製造方法 |
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CN103283306A (zh) | 2013-09-04 |
US8906718B2 (en) | 2014-12-09 |
CN103283306B (zh) | 2016-07-20 |
JPWO2012090771A1 (ja) | 2014-06-05 |
JP5384752B2 (ja) | 2014-01-08 |
US20130280839A1 (en) | 2013-10-24 |
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