WO2011059192A3 - 스프링 콘택트 및 스프링 콘택트 내장 소켓 - Google Patents

스프링 콘택트 및 스프링 콘택트 내장 소켓 Download PDF

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Publication number
WO2011059192A3
WO2011059192A3 PCT/KR2010/007459 KR2010007459W WO2011059192A3 WO 2011059192 A3 WO2011059192 A3 WO 2011059192A3 KR 2010007459 W KR2010007459 W KR 2010007459W WO 2011059192 A3 WO2011059192 A3 WO 2011059192A3
Authority
WO
WIPO (PCT)
Prior art keywords
contact
spring
contact pin
socket
locking protrusion
Prior art date
Application number
PCT/KR2010/007459
Other languages
English (en)
French (fr)
Other versions
WO2011059192A2 (ko
Inventor
황동원
Original Assignee
하이콘 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 하이콘 주식회사 filed Critical 하이콘 주식회사
Priority to US13/509,496 priority Critical patent/US8808038B2/en
Priority to CN201080051369.5A priority patent/CN102667500B/zh
Priority to JP2012538750A priority patent/JP5438224B2/ja
Publication of WO2011059192A2 publication Critical patent/WO2011059192A2/ko
Publication of WO2011059192A3 publication Critical patent/WO2011059192A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

본 발명은 스프링 콘택트 및 스프링 콘택트 내장 소켓에 관한 것으로서, 검사 대상인 별도의 반도체 IC의 리드와 접촉하도록 하는 소정형상의 접촉부와, 두개의 스프링 고정 돌기와, 몸체를 포함하는 상부 접촉 핀; 상기 상부 접촉 핀과 상호 직교하도록 결합되는 하부 접촉 핀; 및 상기 상부 접촉 핀과 하부 접촉 핀 사이에 삽입되는 스프링; 을 포함하되, 상기 몸체는, 단부에 경사면과 걸림 돌기가 형성되어 있고, 서로 대칭하는 두개의 탄성부를 가지고, 상기 두 탄성부의 내측에는 상기 하부 접촉 핀과 결합되었을 때 유동 공간을 제공하는 도피 홈이 형성되어 있으며, 상기 하부 접촉 핀의 걸림 돌기를 수용 걸림 및 유동하도록 하고, 상기 하부 접촉 핀의 걸림 돌기 및 측면 접촉부와 전기적으로 접촉하도록 형성된 유동 홈으로 구성되는 것을 특징으로 하는 스프링 콘택트에서, 특히 콘택트의 압축 길이를 최소화 하기위한 구조, 일열 협 피치(Fine Pitch) 스프링 콘택트 및 소켓을 위한 구조, 솔더링형 스프링 콘택트 및 소켓의 다양한 구조를 제공한다.
PCT/KR2010/007459 2009-11-11 2010-10-28 스프링 콘택트 및 스프링 콘택트 내장 소켓 WO2011059192A2 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US13/509,496 US8808038B2 (en) 2009-11-11 2010-10-28 Spring contact and a socket embedded with spring contacts
CN201080051369.5A CN102667500B (zh) 2009-11-11 2010-10-28 弹簧接触件及内置弹簧接触件的插座
JP2012538750A JP5438224B2 (ja) 2009-11-11 2010-10-28 バネコンタクト及びバネコンタクト内蔵ソケット

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2009-0108375 2009-11-11
KR1020090108375A KR101058146B1 (ko) 2009-11-11 2009-11-11 스프링 콘택트 및 스프링 콘택트 내장 소켓

Publications (2)

Publication Number Publication Date
WO2011059192A2 WO2011059192A2 (ko) 2011-05-19
WO2011059192A3 true WO2011059192A3 (ko) 2011-10-13

Family

ID=43992181

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/007459 WO2011059192A2 (ko) 2009-11-11 2010-10-28 스프링 콘택트 및 스프링 콘택트 내장 소켓

Country Status (5)

Country Link
US (1) US8808038B2 (ko)
JP (1) JP5438224B2 (ko)
KR (1) KR101058146B1 (ko)
CN (1) CN102667500B (ko)
WO (1) WO2011059192A2 (ko)

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Also Published As

Publication number Publication date
WO2011059192A2 (ko) 2011-05-19
JP5438224B2 (ja) 2014-03-12
US8808038B2 (en) 2014-08-19
JP2013511039A (ja) 2013-03-28
CN102667500B (zh) 2016-03-02
KR101058146B1 (ko) 2011-08-24
KR20110051668A (ko) 2011-05-18
CN102667500A (zh) 2012-09-12
US20120238136A1 (en) 2012-09-20

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