WO2008142752A1 - トレイ格納装置及び電子部品試験装置 - Google Patents

トレイ格納装置及び電子部品試験装置 Download PDF

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Publication number
WO2008142752A1
WO2008142752A1 PCT/JP2007/060210 JP2007060210W WO2008142752A1 WO 2008142752 A1 WO2008142752 A1 WO 2008142752A1 JP 2007060210 W JP2007060210 W JP 2007060210W WO 2008142752 A1 WO2008142752 A1 WO 2008142752A1
Authority
WO
WIPO (PCT)
Prior art keywords
test apparatus
electronic part
tray storage
storage device
part test
Prior art date
Application number
PCT/JP2007/060210
Other languages
English (en)
French (fr)
Inventor
Hiroki Ikeda
Yoshinari Kogure
Tsuyoshi Yamashita
Hiroyuki Takahashi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009515022A priority Critical patent/JPWO2008142752A1/ja
Priority to PCT/JP2007/060210 priority patent/WO2008142752A1/ja
Priority to TW097113467A priority patent/TW200911653A/zh
Publication of WO2008142752A1 publication Critical patent/WO2008142752A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

電子部品試験装置のトレイ格納部（１００）は、ＩＣデバイスを収容するカスタマトレイ（ＫＳＴ）を搬入出するための１個のアクセスポート（１１０）と、カスタマトレイを格納する３６個のストッカ（１６１）から構成されるストッカ群（１６４）と、アクセスポート（１１０）とストッカ群（１６４）との間でカスタマトレイ（ＫＳＴ）の受け渡しを行うための搬入出ユニット（１２０）及び第１のトレイ移送アーム（１３０）と、を備えている。
PCT/JP2007/060210 2007-05-18 2007-05-18 トレイ格納装置及び電子部品試験装置 WO2008142752A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009515022A JPWO2008142752A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置及び電子部品試験装置
PCT/JP2007/060210 WO2008142752A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置及び電子部品試験装置
TW097113467A TW200911653A (en) 2007-05-18 2008-04-14 Tray storage device and electronic part test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/060210 WO2008142752A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置及び電子部品試験装置

Publications (1)

Publication Number Publication Date
WO2008142752A1 true WO2008142752A1 (ja) 2008-11-27

Family

ID=40031479

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/060210 WO2008142752A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置及び電子部品試験装置

Country Status (3)

Country Link
JP (1) JPWO2008142752A1 (ja)
TW (1) TW200911653A (ja)
WO (1) WO2008142752A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110064546A1 (en) * 2009-07-15 2011-03-17 Teradyne, Inc. Storage Device Testing System Cooling
TWI384223B (zh) * 2009-02-18 2013-02-01 Keystone Electronics Corp 用於最終測試的裝置及方法
CN103996641A (zh) * 2011-09-06 2014-08-20 精工爱普生株式会社 分选机以及部件检查装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013057572A (ja) * 2011-09-07 2013-03-28 Seiko Epson Corp ハンドラー及び部品検査装置
TWI808748B (zh) * 2022-05-06 2023-07-11 四方自動化機械股份有限公司 晶片托盤之換盤機構

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6123008A (ja) * 1984-06-29 1986-01-31 Fujitsu Ltd プリント板ユニット試験装置のスケジュール制御方式
JP2006049454A (ja) * 2004-08-03 2006-02-16 Asyst Shinko Inc ストッカ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3642729B2 (ja) * 2000-11-27 2005-04-27 東京エレクトロン株式会社 処理装置
JP4154269B2 (ja) * 2003-03-31 2008-09-24 シャープ株式会社 製造設備の搬送システム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6123008A (ja) * 1984-06-29 1986-01-31 Fujitsu Ltd プリント板ユニット試験装置のスケジュール制御方式
JP2006049454A (ja) * 2004-08-03 2006-02-16 Asyst Shinko Inc ストッカ

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI384223B (zh) * 2009-02-18 2013-02-01 Keystone Electronics Corp 用於最終測試的裝置及方法
US20110064546A1 (en) * 2009-07-15 2011-03-17 Teradyne, Inc. Storage Device Testing System Cooling
US8116079B2 (en) * 2009-07-15 2012-02-14 Teradyne, Inc. Storage device testing system cooling
CN103996641A (zh) * 2011-09-06 2014-08-20 精工爱普生株式会社 分选机以及部件检查装置
US9411012B2 (en) 2011-09-06 2016-08-09 Seiko Epson Corporation Handler and part inspection apparatus

Also Published As

Publication number Publication date
TW200911653A (en) 2009-03-16
JPWO2008142752A1 (ja) 2010-08-05
TWI363730B (ja) 2012-05-11

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