WO2008056739A1 - Procédé de débogage de système, appareil de débogage de système, processeur de données, ci d'interface de communication sans fil et procédé d'interface - Google Patents
Procédé de débogage de système, appareil de débogage de système, processeur de données, ci d'interface de communication sans fil et procédé d'interface Download PDFInfo
- Publication number
- WO2008056739A1 WO2008056739A1 PCT/JP2007/071706 JP2007071706W WO2008056739A1 WO 2008056739 A1 WO2008056739 A1 WO 2008056739A1 JP 2007071706 W JP2007071706 W JP 2007071706W WO 2008056739 A1 WO2008056739 A1 WO 2008056739A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- coil
- microcomputer
- reception
- transmission
- circuit
- Prior art date
Links
- 238000004891 communication Methods 0.000 title claims abstract description 239
- 238000000034 method Methods 0.000 title claims description 83
- 230000005540 biological transmission Effects 0.000 claims abstract description 195
- 230000008878 coupling Effects 0.000 claims abstract description 93
- 238000010168 coupling process Methods 0.000 claims abstract description 93
- 238000005859 coupling reaction Methods 0.000 claims abstract description 93
- 238000012790 confirmation Methods 0.000 claims abstract description 4
- 239000004065 semiconductor Substances 0.000 claims description 36
- 238000012545 processing Methods 0.000 claims description 24
- 230000001276 controlling effect Effects 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 6
- 230000004044 response Effects 0.000 claims description 4
- 230000002596 correlated effect Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 42
- 238000010586 diagram Methods 0.000 description 18
- 230000000295 complement effect Effects 0.000 description 17
- 102100040862 Dual specificity protein kinase CLK1 Human genes 0.000 description 16
- 230000006870 function Effects 0.000 description 14
- 238000006243 chemical reaction Methods 0.000 description 12
- 238000001514 detection method Methods 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 9
- 230000008859 change Effects 0.000 description 8
- 238000012937 correction Methods 0.000 description 6
- 230000000875 corresponding effect Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 238000011161 development Methods 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006698 induction Effects 0.000 description 3
- 102100039435 C-X-C motif chemokine 17 Human genes 0.000 description 2
- 101000889048 Homo sapiens C-X-C motif chemokine 17 Proteins 0.000 description 2
- 101000749294 Homo sapiens Dual specificity protein kinase CLK1 Proteins 0.000 description 2
- 208000018583 New-onset refractory status epilepticus Diseases 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- YGLMVCVJLXREAK-MTVMDMGHSA-N 1,1-dimethyl-3-[(1S,2R,6R,7S,8R)-8-tricyclo[5.2.1.02,6]decanyl]urea Chemical group C([C@H]12)CC[C@@H]1[C@@H]1C[C@@H](NC(=O)N(C)C)[C@H]2C1 YGLMVCVJLXREAK-MTVMDMGHSA-N 0.000 description 1
- 101100256921 Ajellomyces capsulatus SID3 gene Proteins 0.000 description 1
- 102100040844 Dual specificity protein kinase CLK2 Human genes 0.000 description 1
- 101000749291 Homo sapiens Dual specificity protein kinase CLK2 Proteins 0.000 description 1
- 101100492653 Oryza sativa subsp. japonica AT15 gene Proteins 0.000 description 1
- 101100366400 Schizosaccharomyces pombe (strain 972 / ATCC 24843) spg1 gene Proteins 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005674 electromagnetic induction Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/362—Software debugging
- G06F11/3648—Software debugging using additional hardware
- G06F11/3656—Software debugging using additional hardware using a specific debug interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/3025—Wireless interface with the DUT
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W28/00—Network traffic management; Network resource management
- H04W28/16—Central resource management; Negotiation of resources or communication parameters, e.g. negotiating bandwidth or QoS [Quality of Service]
- H04W28/18—Negotiating wireless communication parameters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W76/00—Connection management
- H04W76/10—Connection setup
Definitions
- the present invention relates to an interface technology using magnetic field coupling of coils, and more particularly to a contactless non-contact interface technology, for example, a technology effective when applied to system debugging for evaluating a target system by a debugger.
- Interface technologies between a debugger and a target system for system debugging include a wireless communication interface using wireless communication in addition to a wired communication interface using a cable.
- Patent Document 1 describes a technique of interfacing an interface cable having an antenna coil and an IC card reader by wireless communication for debugging a microcomputer for an IC card having a non-contact interface.
- Patent Documents 2 and 3 describe technologies that enable system debugging using wireless communication by mounting a wireless communication interface circuit on a target microcomputer connected to a debugger. By using the wireless communication interface for system debugging, the target system can be evaluated without dedicating the connection terminal between the target system and the microcomputer for evaluation.
- wireless communication systems for contactless IC cards include a close contact type by electromagnetic coupling defined by ISO / IEC10536 and a proximity type by electromagnetic induction defined by ISO / IEC14443.
- the contactless interface of these standards transmits information by performing complex modulation using a carrier wave.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2003-5994
- Patent Document 2 Japanese Patent Laid-Open No. 2005-182209
- Patent Document 3 Japanese Patent Laid-Open No. 2005-18703
- the wireless communication interface of the IC card is a close contact type with a communication distance of several millimeters
- the information modulated by PSK Phase Shift eying
- PSK Phase Shift eying
- wireless communication interfaces used for conventional system debugging represented by the above-mentioned patent document also transmit information via complex modulation using a carrier wave.
- the present inventors do not need a large antenna or a large-scale circuit for modulation / demodulation for a non-contact interface for system debugging, and the present inventors have an advantage of low power consumption. It was found. In other words, the longer the communication distance, the higher the power consumption and the need for a large antenna. If a large antenna is required, the degree of freedom when mounting it on a chip or package is reduced.
- modulation is performed by changing the carrier parameters (phase, frequency, amplitude, etc.) according to the information signal, a relatively high frequency signal is required for the carrier, and advanced analog design techniques are required.
- the circuit scale is significantly increased, and the power consumption is greatly increased.
- An object of the present invention is to provide a technique capable of performing a contactless interface for system debugging or the like without requiring a large antenna or a large-scale circuit for modulation / demodulation.
- Another object of the present invention is to provide a technique capable of reducing the cost for a non-contact interface used for system debugging or the like.
- a pulse by magnetic field coupling in which a first coil of the microcomputer and a second coil connected to the debugger are opposed to each other for wireless communication between a microcomputer having a debugging support circuit and a debugger.
- the microcomputer can perform control operations for system debugging according to the control from the debugger after setting the communication conditions autonomously.
- a non-contact interface for system debugging or the like can be performed without requiring a large antenna or a large-scale circuit for modulation / demodulation.
- FIG. 1 is an overall system configuration diagram to which the system debugging method according to the present invention can be applied.
- FIG. 2 is an explanatory diagram illustrating the operating power supply of the wireless communication interface circuit of the microcomputer and the operating power supply of the magnetic field coupling interface IC.
- FIG. 3 is a plan view of the probe and a longitudinal sectional view of the probe bonded to a microcomputer.
- Fig. 4 is a conceptual diagram when the tip of the probe is used as a replacement part.
- Fig. 5 is a vertical cross-sectional structure diagram when a coil is formed on a semiconductor integrated circuit chip of a magnetic field coupling interface IC.
- FIG. 6 is a circuit diagram showing a specific example of a wireless communication interface circuit possessed by the microcomputer.
- Fig. 7 is a specific circuit diagram of the clock transmission driver and clock transmission coil.
- Fig. 8 is a waveform diagram of the current waveform (Ic) flowing through the coil and the clock signal.
- FIG. 9 is an explanatory diagram illustrating an outline of an automatic offset adjustment method at the input of the comparator of FIG.
- FIG. 10 is a processing flow of the offset automatic adjustment method.
- FIG. 11 is an explanatory diagram showing the relationship between the offset adjustment register value and the detection value RXD when there is no offset! /.
- FIG. 12 is an explanatory diagram showing a relationship between an offset adjustment register value and a detection value RXD when there is a positive offset.
- FIG. 13 is an explanatory diagram illustrating an outline of the automatic determination timing adjustment method.
- FIG. 14 is a process flow of a determination timing automatic adjustment method.
- FIG. 15 is a waveform diagram of the timing adjustment operation.
- FIG. 16 is a circuit diagram showing a specific example of the magnetic field coupling interface.
- FIG. 17 is an explanatory diagram showing an outline of a method for measuring the signal amplitude strength of the recovered clock signal.
- FIG. 18 is a processing flow of the method for measuring the signal amplitude strength of the recovered clock signal.
- FIG. 19 is an explanatory diagram illustrating the relationship between the magnitude of hysteresis and its output in the hysteresis comparator.
- FIG. 20 is a timing chart of the signal amplitude strength measurement operation of the recovered clock signal.
- FIG. 21 is a flowchart illustrating a communication path establishment procedure at system startup.
- FIG. 22 is a circuit diagram showing another example of a wireless communication interface circuit possessed by a microcomputer.
- FIG. 23 is a circuit diagram showing another example of the magnetic field coupling interface IC.
- FIG. 24 is a flowchart illustrating various processing procedures at the time of system startup using asynchronous communication between the wireless communication interface circuit of FIG. 22 and the magnetic field coupling interface of FIG.
- FIG. 25 is a plan view showing a first example of coil arrangement when the package type is SOP, SSOP, or DIP.
- FIG. 26 is a plan view showing a second example of the coil arrangement when the package type is SOP, SSOP, or DIP.
- FIG. 27 is a plan view showing a first example of coil arrangement when the package type is QFP or QFN.
- FIG. 28 is a plan view showing a second example of coil arrangement when the package type is QFP or QFN.
- FIG. 29 is a plan view showing a third example of coil arrangement when the package type is QFP or QFN.
- FIG. 30 is a plan view showing an example of coil arrangement when the package type is BGA.
- FIG. 31 is a plan view showing an example of a specific coil pattern at the tip of the probe shown in FIG. 3.
- FIG. 32 is a plan view illustrating a specific pattern of coils included in the microcomputer. Explanation of symbols
- CPU Central processing unit
- a system debugging method for controlling a microcomputer (13) having a debugging support circuit (17) for supporting system debugging by means of a debugger (3) is that the microcomputer is connected between the microcomputer and the debugger. First coil with (14) And the second coil (8) connected to the debugger are wirelessly communicated by a pulse transmission method based on magnetic field coupling.
- the microcomputer performs V initialization processing for setting the wireless communication conditions V, (SM2, SM3, SM6), and the microcomputer is connected to the debugger.
- the microcomputer waits for control from the debugger via the debug support circuit (SM9), and the debugger waits for confirmation of the establishment of the communication before the microcomputer by the wireless communication.
- the Norse transmission system transmits information by the polarity of the pulse voltage.
- a pulse transmission method using magnetic field coupling is employed, large-scale modulation and demodulation circuits are not required for wireless communication, and it is not necessary to use a large antenna.
- the Norse transmission method when the operating frequency is changed according to the operating mode of the microcomputer, it is possible to easily cope with the frequency change of the transmitting noise, which is the information itself to be transmitted. .
- modulation and wireless communication it is necessary to make the carrier frequency variable in order to cope with changes in the operation reference clock frequency of the microcomputer, which increases the circuit size. This makes it impossible to perform system debugging with low power consumption.
- the microcomputer can perform control operations for system debugging according to the control from the debugger after setting the communication conditions autonomously in the initialization operation instructed by power-on or the like.
- the debugger is connected to the debugger with a second transmitting / receiving circuit (30) connected to the second coil on one side and connected to the debugger on the other side with V and the debugger.
- Wireless communication with the microcomputer is performed via a magnetic field coupling interface IC (7) having a second control circuit (31) for setting communication conditions by magnetic field coupling in the second transmission / reception circuit.
- the microcomputer communicates with the debugger wirelessly through the operation of the first transmission / reception circuit (26) connected to the first coil and the first control circuit (27) for setting communication conditions by magnetic field coupling to the first transmission / reception circuit. I do.
- the wireless communication function on the debugger side and wireless communication on the microcomputer side Communication conditions for the communication function can be set respectively.
- the microcomputer performs the wireless communication using a first coil formed in a conductive layer of a semiconductor integrated circuit chip that constitutes the microcomputer. Since V requires a large antenna coil, it can be formed on a semiconductor integrated circuit chip, eliminating the need for an external antenna external terminal for a debugging support circuit that is required only for debugging. Further, if the first coil is arranged at the corner portion of the semiconductor integrated circuit chip, the overlap between the first coil and the bonding wire is reduced, and unwanted induction between them can be suppressed. The first coil is formed outside the semiconductor integrated circuit chip inside the microcomputer package.
- the debugger uses a second coil formed on an interface flexible board on which the magnetic field coupling interface IC is mounted and interface wiring for connecting the mounted magnetic field coupling interface IC to the debugger is formed.
- Wireless communication Alternatively, the debugger performs the wireless communication using a second coil formed in a conductive layer on a semiconductor integrated circuit chip that forms the magnetic field coupling interface IC.
- the debugger by installing the debugger's wireless communication interface function on the interface flexible board, the debugger itself can easily support both system debugging using the wireless communication interface and system debugging using the wired communication interface. .
- the wireless communication is performed using a first coil that is individualized for the transmission coil and the reception coil, and a second coil that is individualized for the transmission coil and the reception coil.
- Communication control is simpler than when a coil is used for both transmission and reception, and transmission and reception can be performed in parallel, so the communication rate can be increased.
- a first coil 14_CLK, 14_TXD, 14_RXD
- a second coil 8_CLK, 8_TXD
- 8_RX D perform the wireless communication. This enables clock-synchronized wireless communication.
- the source of the synchronous clock is a microcomputer
- the synchronous clock frequency of the wireless communication interface with the debugger is reduced when the operation clock frequency of the microcomputer itself is changed according to the operation mode of the microcomputer. Co It is easy to match the operation mode of the computer, and it becomes easy to control the debugging operation that traces the internal state of the microcomputer.
- the first coil (14_TXD, 14—RXD) individualized for data transmission and data reception and the second coil individualized for data transmission and data reception (8_TXD, 8 — RXD) can be used.
- the distance between the coils of the coils individually used for the clock transmission, data transmission, and data reception is maximized with respect to the clock transmission coil. Since clock transmission is always in parallel with data transmission or data reception, it is convenient to prevent the possibility that the clock waveform will be undesirably distorted by induction between them. If suppression of undesired induction with the bonding wire of the semiconductor integrated circuit chip is taken into consideration, the coiner is located in the vicinity of the bonding wire connected to a signal terminal having a constant level such as a power supply terminal, a ground terminal or a mode terminal. It is good to arrange.
- the first control circuit sets, as the communication condition, an offset adjustment result for the differential output of the reception amplifier (44) in the first transmission / reception circuit, and the second control The circuit sets an offset adjustment result for the differential output of the receiving amplifier (56, 59) in the second transmitting / receiving circuit as the communication condition.
- Wireless communication reliability is improved by adjusting the offset of the amplifier.
- the first control circuit sets a determination timing adjustment result for the output of the reception amplifier in the first transmission / reception circuit as the communication condition
- the second control circuit sets the second transmission / reception as the communication condition. Sets the result of judgment timing adjustment for the output of the receiving amplifier in the circuit.
- the first transmission / reception circuit transmits a clock signal
- the second control circuit transmits the logic of the reception clock signal in the second transmission / reception circuit as the communication condition.
- the received waveform due to magnetic field coupling is an attenuated waveform, and the received clock waveform can be reproduced by appropriately setting a threshold value for determining the magnitude of the amplitude.
- the first control circuit determines a logical value of a received signal in the first transmission / reception circuit as the communication condition (44_A)
- the second control circuit measures the strength of the determination signal amplitude by the comparator (57_B) that determines the logical value of the received signal in the second transmission / reception circuit as the communication condition.
- the received signal waveform can be played back.
- the intensity of the determination signal amplitude is measured, for example, by measuring whether the output of the comparator can regenerate the clock while gradually increasing the hysteresis characteristic of the comparator. It can be done by judging the strength. For example, as a method of determining whether or not the clock can be regenerated, it is possible to measure the value of the duty of the output waveform of the comparator.
- the microcomputer and the debugger recognize the establishment of communication on the condition that predetermined data transmitted to the other can be recognized on the other side. It is possible to easily recognize whether or not communication can be established.
- the system bag device is a system used for system debugging of a target system (12) connected to a microcomputer (13) having a debugging support circuit (24) for supporting system debugging and controlled by the microcomputer.
- This system bag device has a second coil that can be magnetically coupled to the first coil (14) of the microcomputer and a debugger (3) connected to the second coil (8).
- the debugger communicates with the microcomputer by the pulse transmission method by the magnetic field coupling.
- a transmitting / receiving circuit (30) connected to the second coil on one side and connected to the V and debugger on the other side, and a transmitting / receiving circuit connected to the debugger and connected to the debugger Has a control circuit (31 with a magnetic field coupling interface IC (7) that sets communication conditions by magnetic field coupling.
- the debugger itself does not need to have a wireless communication interface function by a pulse transmission method by magnetic field coupling. It is possible to use the same debugger as wired communication is there.
- the second coil may be formed on the flexible substrate for the interface, or may be formed on a conductive layer of a semiconductor integrated circuit chip forming the magnetic field coupling interface IC.
- the front end portion (5TOP) of the interface flexible board has a planar shape correlated with the planar shape of the package of the microcomputer.
- a configuration in which the second coil is individualized for a transmission coil and a reception coil, and a configuration in which the second coil is individualized for clock reception, data transmission, and data reception are adopted. You can do it.
- a configuration for setting an offset adjustment result for the differential output of the reception amplifier, a configuration for setting a determination timing adjustment result for the output of the reception amplifier in the transmission / reception circuit, or a reception in the transmission / reception circuit Use a configuration that measures the strength of the judgment signal amplitude using a comparator that judges the logic of the signal.
- the microcomputer includes a central processing unit (18) for executing instructions, a debug support circuit (17) for connecting to the central processing unit to support system debugging, and an external device connected to the debug support circuit. And a wireless communication interface circuit (24) for performing wireless communication.
- the wireless communication interface circuit includes a transmission / reception circuit (26) for performing wireless communication by a pulse transmission method by magnetic field coupling using a coil, and a control circuit (27) for setting communication conditions in the transmission / reception circuit.
- the control circuit sets the communication condition (SM2, SM3, SM6), and recognizes a response to the signal transmitted from the transmission / reception circuit to the outside (SM6). Notification of completion of initialization is sent to the outside using the transmitter / receiver circuit (SM8).
- the central processing unit waits for an instruction from the transmission / reception circuit and starts operation. Adopting a pulse transmission system with magnetic coupling Therefore, low-cost wireless communication with a small physical scale is realized.
- the microcomputer can perform control operations for system debugging according to the control from the debugger.
- the transmission / reception circuit includes a transmission driver that drives a transmission coil, a reception amplifier that amplifies a current flowing in the reception coil, and a logical value of a reception signal by the reception amplifier.
- a comparator for determining the control circuit may perform offset adjustment for the differential output of the reception amplifier, adjustment of the determination timing for the output of the reception amplifier, or measurement of the intensity of the determination signal amplitude by the comparator as the communication condition.
- individual coils for clock reception, data transmission, and data reception are formed in the conductive layer on the semiconductor integrated circuit chip on which the microcomputer is formed, and the distance between the coils is set as the clock distance. It may be set so as to maximize the distance from the receiving coil, or the coil may be arranged at a corner portion of the semiconductor integrated circuit chip.
- the first coil is formed outside the semiconductor integrated circuit chip inside the microcomputer package.
- the wireless communication interface IC has a host interface terminal and a transmission / reception circuit that is connected to the host interface terminal on one side and connected to a coil on the other side and performs wireless communication by a pulse transmission method by magnetic field coupling using the coil.
- the control circuit that sets the communication condition in the transmission / reception circuit sets the communication condition and determines whether the signal received from the transmission / reception circuit via the coil is correct or not, and from the transmitter / receiver via the coinole. Whether the response to the transmitted signal is correct or not can be referenced from the host interface terminal.
- a host device such as a debugger, tester, or EPROM writer adopts a panoramic transmission system using magnetic coupling to control a target device such as a microphone computer by wireless communication
- the host device side The wireless communication interface can be easily realized.
- the interface method for the host device to control the microcomputer is the above-mentioned my method.
- Wireless communication is performed between the microcomputer and the host device by a pulse transmission method based on magnetic field coupling between the first coil of the microcomputer and the second coil connected to the host device.
- the microcomputer performs processing for setting the communication condition of the wireless communication in the initialization operation.
- the microcomputer controls the host device.
- the host device waits for confirmation of the establishment of the communication and shifts to the microcomputer control by the wireless communication. According to this, since a pulse transmission method using magnetic field coupling is employed, low-cost wireless communication with a small physical scale is realized.
- the microcomputer after setting the communication conditions autonomously in the initialization operation specified by the power-on etc., the microcomputer performs the control operation according to the instructions from the host device such as the debugger, tester or EPROM writer. I can power.
- FIG. 1 illustrates an overall system configuration to which the system debugging method according to the present invention can be applied.
- a host computer (HOST) 1 such as a personal computer is coupled to a debugger (DBG) 3 through an interface cable 2, and the debugger 3 is coupled to a connector 6 of the probe 5 through a debugger cable 4.
- the probe 5 includes a magnetic coupling interface IC (IFIC) 7 and a coil (second coil) 8 for a wireless communication interface, and is composed of a flexible substrate force for the interface.
- the magnetic field coupling interface IC7 is coupled to the connector 6 by the interface wiring 9 on one side, and the magnetic field coupling interface IC7 is coupled to the coil 8 by the interface wiring 10 on the other side.
- the base material of the interface flexible board is, for example, resin.
- the target system (TGTS) 12 to be debugged is a microcomputer.
- the microcomputer 13 has a coil (first coil) 14 for a wireless communication interface. Wireless communication is performed between the microcomputer 13 and the debugger 3 by a pulse transmission method based on magnetic field coupling in which the coil 14 included in the microcomputer 13 and the coil 8 connected to the debugger 3 are opposed to each other.
- the microcomputer 13 is a debugging support circuit (D BGS) 17, Central Processing Unit (CPU) 18, RAM (Random Access 'Memory'), Memory (MRY) 19 such as ROM (Read 'Only' Memory), Input / Output Port (PRT) 20, and Other Peripherals A circuit (PRPH) 21 is provided, and these circuit modules are commonly connected to an internal bus 22 shown as a representative.
- D BGS debugging support circuit
- CPU Central Processing Unit
- RAM Random Access 'Memory'
- MRY Memory
- ROM Read 'Only' Memory
- PRT Input / Output Port
- PRPH Peripherals A circuit
- the CPU 18 fetches an instruction according to a program stored in the memory 19, decodes the fetched instruction, performs operand access operation processing according to the result, and performs data processing designated by the instruction.
- the debug support circuit 17 can be interfaced with the debugger side using a radio communication interface circuit (WRLS) 24 provided with the coil 14.
- WRLS radio communication interface circuit
- the debug support circuit 17 is not particularly limited, but is used for breakpoint control in accordance with instructions from the debugger, tracepoint control, and interface control with the debugger in the break interrupt state.
- the wireless communication interface circuit 24 of the microcomputer 13 whose schematic configuration is shown in FIG. 1 includes a transmission / reception circuit (XDCR-M) 26 connected thereto and a transmission / reception circuit 26. It has a control circuit (CNT-M) 27 that sets communication conditions by magnetic field coupling.
- the control circuit 27 is controlled by the CPU 18.
- three coils 14 are illustrated.
- the magnetic field coupling interface IC7 whose schematic configuration is shown in FIG. 1 is connected to the coil 8 on one side and the transmission / reception circuit (XDCR-D) 30 connected to the debugger 3 on the other side.
- the transmission / reception circuit 30 has a control circuit (CNT-D) 31 for setting communication conditions by magnetic field coupling.
- the control circuit 31 is controlled by the debugger 3.
- CNT-D control circuit
- the microcomputer 13 has a plurality of operation modes, and is roughly classified into a debug mode and an actual mode, for example.
- the actual mode is the original operation mode of the microcomputer 13. After reset exception handling, instruction execution is started from a predetermined address on the system controlled by the microcomputer 13, and the operation of the debug support circuit 17 is stopped. This is an operation mode.
- debug mode the debug support circuit 17 is enabled, and after reset exception processing, the microcomputer 13 does not start executing instructions even with the predetermined address on the system, but starts executing instructions according to instructions from the debugger 3. Mode.
- the actual mode is often divided into multiple operation modes depending on the memory space and the low power consumption.
- MDi is a 1 bit indicating whether it is in debug mode or real mode. Means a mode terminal that is considered a Illustration of other signal terminals and power supply terminals is omitted.
- FIG. 2 shows the operation power supply of the wireless communication interface circuit 24 of the microcomputer 13 and the operation power supply of the magnetic field coupling interface IC 7.
- the operating power supply of the wireless communication interface circuit 24 is covered by the operating power supply voltage VDD supplied from the target system 12 to the microcomputer 13.
- the operating power supply of the magnetic field coupling interface IC7 is covered by the operating power supply voltage VCC supplied from the debugger 3 and its step-down power supply voltage VCC1.
- the wireless communication here does not require a non-contact power transmission function such as full-wave rectification of the wireless interface signal unlike the proximity contactless interface. Any non-contact signal transmission function is sufficient.
- the voltage relationship between the power supply voltage VDD and VCC1 is not limited to coincidence.
- Wireless communication between the coil 14 of the wireless communication interface circuit 24 and the coil 8 connected to the magnetic field coupling interface IC7 is performed by magnetic field coupling in which the corresponding coils are arranged to face each other within a range of several millimeters.
- a power supply circuit 34 steps down the power supply voltage VCC to the power supply voltage VC C1.
- FIG. 3 illustrates a planar configuration of the probe and a longitudinal sectional structure when the probe is bonded to a microcomputer.
- the tip portion 5T OP of the interface flexible substrate of the probe 5 has a shape along the planar shape of the package of the microcomputer 13.
- the three-sided SID;! To SID3 are formed approximately equal to the length of the three sides of the microcomputer 13 package.
- three coils 8 are formed in a wiring pattern and embedded in a flexible substrate for interface.
- (B) illustrates a state in which the tip 5TOP of the probe 5 is detachably fixed to the microcomputer 13 of the target system 12 by a longitudinal section.
- the tip 5TOP of the probe 5 is bonded and fixed to the surface of the package of the microcomputer 13 through a double-sided tape 35, for example.
- the tip of probe 5 The top edge of 5TOP and the edge of the surface of the package of microcomputer 13 are aligned, and the corresponding coil 14 of microcomputer 13 and coil 8 of probe 5 are concentrically opposed to each other. In this way, the positions of the coils 14 and 8 are defined in advance.
- the shape of the tip 5TOP is the planar shape of the package of the microcomputer 13. Since they are formed almost equally, it is easy to bond both ends together, and as a result, the coil 14 of the microcomputer 13 and the coil 8 of the probe 5 can be easily positioned with each other. Can be opposed to each other. This is useful for improving the reliability of wireless communication by magnetic field coupling.
- 36 is a protection board that prevents the probe 5 from being damaged by contact with the device or wiring of the target system 12. In FIG. 3, the wiring formed on the probe 5 is omitted!
- FIG. 4 shows a conceptual diagram when the tip portion of the probe 5 is used as a replacement part.
- Figure 4 typically shows two probes 5-A and 5-B.
- the 5FIX part is the part where the structure and function are fixed.
- 5CHG-A and 5CHG-B are coil parts as replacement parts, and have a size corresponding to the package size of the microcomputer 13 to be debugged, and a coil corresponding to the arrangement of the coil 14 of the microcomputer 13 Eight arrangements are provided.
- FIG. 5 illustrates a longitudinal cross-sectional structure when the coil 8 —A is formed on the semiconductor integrated circuit chip 7 C of the magnetic field coupling interface IC 7 —A.
- the coil 8-A is constituted by a conductive pattern formed on the semiconductor integrated circuit chip 7C of the magnetic field coupling interface IC7-A.
- the semiconductor integrated circuit chip 7C means a semiconductor element disposed inside the package.
- the size is 1 mm x 1 mm.
- the magnetic field coupling interface IC7 When the coil 8-A is formed on the semiconductor integrated circuit chip 7C of A, the size is reduced to, for example, 0.5 mm minor X 0.5 mm minor.
- the coil 8-A is illustrated as being formed on the surface of the semiconductor integrated circuit chip 7C. However, the coil 8-A is not a wiring layer or a top layer in the semiconductor integrated circuit chip. It can be built on the surface of the upper layer.
- Magnetic coupling interface IC7—A coil 8—A is placed opposite to the coil 14 of the microcomputer 13.
- the opposing surface of the microcomputer 13 is detachable with a double-sided tape 35. Fix it.
- magnetic coupling interface IC7 A package and microcontroller Standardize the package of computer 13 or make one side is the same length. Then, the positions of the coils 8-A and 14 with respect to each package may be defined in advance so as to be symmetrical with respect to the bonding surface of the package.
- FIG. 6 shows a specific example of the wireless communication interface circuit 24 possessed by the microcomputer 13.
- the circuit block indicated by 40 is a general term for circuits such as the CPU 18 other than the wireless communication interface circuit 24.
- Information transmission by the wireless communication interface circuit 24 is performed by a pulse transmission method using magnetic field coupling.
- the pulse transmission method is a method of transmitting information signals according to the polarity of the pulse voltage.
- the pulse voltage is defined by complementary positive and negative polarities.
- direct information transmission by a single-phase pulse voltage such as a dull level and a positive polarity or a ground level and a negative polarity may be used.
- a clock transmission driver 41 that generates a complementary clock pulse based on a clock signal supplied from the debug support circuit 17 and a clock transmission coil 14 -CLK are provided.
- the clock transmission driver 41 has a differential output, thereby generating complementary clock pulses.
- the output power of the clock transmission driver 41 can be adjusted by the control data CD ATI.
- a data transmission driver 42 that generates a complementary pulse according to transmission data output from the debug support circuit 17 and a data transmission coil 14-TXD are provided.
- a delay circuit ( ⁇ ) 43 for adjusting the output timing with respect to the input of the data transmission driver 42 to be variable is provided.
- the delay time can be adjusted by the control data CDAT2.
- the output power of the data transmission driver 42 can be adjusted by the control data CDAT3.
- Data receiving coil 14—A data receiving amplifier 46 is provided for amplifying the RXD received signal. The data receiving amplifier 46 can be omitted if necessary depending on the received signal strength (depending on the communication distance, etc.).
- a digital / analog conversion circuit (DAC) 47 for offset cancellation is arranged, and its output is added to the complementary output of the data reception amplifier 46 with the opposite polarity. If it is not necessary to remove the offset, the digital 'analog conversion circuit 47 can be omitted.
- the delay amount of the delay circuit 45 can be changed by the control data CDAT4, the gain of the data reception amplifier 46 can be changed by the control data CDAT5, and the digital-analog conversion circuit 47 converts the control data CDAT6 into an analog signal. .
- the control circuit 27 controls each communication condition of clock transmission, data transmission, and data reception. Data is controlled by the data CDAT;! To CDAT6.
- a register circuit (CREG) 27R for storing parameters and a parameter in the register circuit It has a logic circuit (LOG) 27L for controlling the operation sequence for setting.
- the logic circuit 27L has the capability to detect the optimum values of various adjustment parameters. This is the power that can also be implemented by software on the host computer via the debugger.
- the wireless communication interface circuit 24 is used for this purpose.
- Logic circuit 27L is provided as dedicated hardware.
- the register circuit 27R is accessible from the debugger 3 via the CPU 18 or the debug support circuit 17.
- the register circuit 27R includes a clock transmission output parameter register (for setting the clock transmission output power adjustment value (CDAT1)), a data transmission output parameter register (for setting the data transmission output power adjustment value (CDAT3)), and a data transmission delay parameter.
- One register for data transmission output timing delay value (CDAT2) setting), data reception gain parameter register (for data reception amplifier gain adjustment value (CDAT5) setting), offset adjustment register (DAC input value for offset adjustment) (For setting CDAT6), offset adjustment control register (control register for offset adjustment), judgment timing register (for setting judgment timing correction value), judgment timing control register (control register for judgment timing adjustment), and Provide a delay amount register (for setting the delay amount for judgment timing adjustment (CDAT4)).
- FIG. 7 shows a specific example of the clock transmission driver 41 and the clock transmission coil 14 CLK.
- a circuit configuration is illustrated.
- a current from the p-channel MOS transistor (pMOS transistor) MP1 to the n-channel MOS transistor (nMOS transistor) MN1 flows through the coil 14—CLK in synchronization with the rising edge of the clock signal CLK.
- a current from the pMOS transistor MP2 to the nMOS transistor MN2 flows through the coil 14-CLK in synchronization with the falling edge of the clock signal CLK.
- 49 is a fixed delay circuit.
- Inverters 50A and 51A and NOR gate 52A generate a high-level one-shot pulse in synchronization with the rising edge of clock signal CLK.
- FIG. 8 illustrates the waveform of the current Ic flowing through the coil 14—CLK and the waveform of the clock signal CLK. Each waveform is actually a gradually attenuated waveform.
- the circuit using the data transmission driver 42 and the data transmission coil 14—TXD can be similarly configured.
- Wireless communication can be performed by a pulse transmission method using a simple circuit illustrated in FIG.
- the clock frequency of the microcomputer to be used differs depending on the type of microcomputer and user system.
- the wireless communication interface circuit 24 employs wireless communication based on the pulse transmission system that can support the clock frequency in the microcomputer. Then, the wireless communication interface circuit 24 can be applied to microcomputers having different operating frequencies. Such a wireless communication interface circuit 24 can be positioned as a highly versatile module IP, that is, a design asset.
- the microcomputer often changes the clock frequency during user program operation to reduce power consumption, etc.
- the communication rate for debug control can be easily changed according to the operating clock frequency in the microcomputer. This improves the usability of the debug interface function as a microcomputer debug control mechanism.
- FIG. 9 illustrates an outline of an automatic offset adjustment method at the input of the comparator of FIG.
- FIG. 10 illustrates a processing flow of the automatic offset adjustment method.
- To cancel the comparator offset change the DAC47 output from negative to positive while sequentially incrementing the offset adjustment register value from the minimum value without sending data from the probe side, and the judgment value of the comparator
- the polarity is detected sequentially (S1 to S5).
- the value of the offset adjustment register when the polarity of the judgment value changes from 0 to 1 is the setting value of DAC 47 that can eliminate the offset (S6).
- this value cancels the comparator offset.
- 1 is set to the normal end bit of the offset adjustment control register (S6).
- Fig. 11 shows the relationship between the offset adjustment register value and the detection value RXD when there is no offset
- Fig. 12 shows the relationship between the offset adjustment register value and the detection value RXD when there is a positive offset.
- FIG. 13 illustrates an outline of the determination timing automatic adjustment method.
- FIG. 14 illustrates the processing flow of the judgment timing automatic adjustment method.
- Figure 15 shows the waveform of the timing adjustment operation.
- the DAC47 setting value is set to a value (offset value for judgment timing adjustment) that deliberately deviates from the set offset cancellation value set in the offset adjustment register (Sl l, S 12 ).
- a large signal in which the potential difference corresponding to the offset value for judgment timing adjustment is added to the output of the amplifier 46 can be input to the comparator.
- the delay amount by the delay circuit 45 is gradually increased while sequentially incrementing the value of the delay amount register from the minimum value.
- the polarity of the judgment value by the comparator 44 is sequentially detected (S13 to S15).
- the output RX of the comparator 44 becomes a certain value.
- the polarity of the output RXD of the comparator 44 is inverted again and from "1" Return to "0" (time t2 in Fig. 15).
- the value of the delay amount register at time tl plus half the increment of the delay amount register from time tl to time t2 is the optimal judgment timing (time t3) by comparator 44, and this value is used as the judgment timing register.
- the polarity of the received noise is determined at the timing delayed by that value with respect to the clock CLK change.
- the communication conditions are set using the parameter adjustment registers for the output power of the clock transmission driver 41 and data transmission driver 42, the output timing of the data transmission driver 42, and the amplifier gain of the data reception amplifier 46. So that it can be adjusted.
- the communication conditions By automatically setting the communication conditions, communication between the microcomputer 13 and the magnetic field coupling interface IC 7 can be stabilized, and unnecessary power consumption can be suppressed by transmission power control.
- FIG. 16 shows a specific example of the magnetic field coupling interface IC7.
- Magnetic field coupling interface Information transmission by IC7 is also performed by the pulse transmission system using magnetic field coupling as described above.
- the coil 8 is a clock receiving coil 8-CLK, a data receiving coil 8-RXD, and a data transmitting coil 8-TXD.
- the modulation information of the received noise signal induced in the clock receiving coil 8—CLK (here, the pulse in the case of complementary two-phase modulation).
- a clock receiving amplifier 56 for amplifying the clock receiving coil 8-CLK received signal is arranged.
- the clock receiving amplifier 56 can be omitted if it is arranged according to the received signal strength (depending on the communication distance) if necessary.
- DAC digital / analog conversion circuit
- offset cancellation is placed, and its output is added to the complementary output of the data reception amplifier 56 with the opposite polarity.
- the digital 'analog conversion circuit 67 can be omitted.
- the hysteresis characteristic of the hysteresis comparator 55 is made variable by the control data CDAT11
- the gain of the data receiving amplifier 56 is made variable by the control data CDAT12
- the digital-analog conversion circuit 57 converts the control data CDAT13 into an analog signal.
- the modulation information of the received noise signal induced in the data receiving coil 8—RXD (here, the positive and negative voltage polarity of the pulse in the case of complementary two-phase modulation) )
- a delay circuit ( ⁇ ) 58 for generating the optimum detection timing by the comparator 57 based on the clock CLK regenerated by the hysteresis comparator 55.
- a data reception amplifier 59 for amplifying the reception signal of the data reception coil 8-RXD is arranged.
- the data receiving amplifier 59 can be omitted if it is arranged according to the received signal strength (depending on the communication distance, etc.) if necessary.
- a digital 'analog conversion circuit (DAC) 60 for offset cancellation is arranged, and its output is added to the complementary output of the data reception amplifier 59 with the opposite polarity. If it is not necessary to remove the offset, the digital-to-analog conversion circuit 60 can be omitted.
- the delay amount of the delay circuit 58 can be changed by the control data CDAT14, the gain of the data receiving amplifier 59 can be changed by the control data CDA T15, and the digital 'analog conversion circuit 60 converts the control data CDAT16 to an analog signal. To do.
- a data transmission driver 62 that generates a complementary node according to transmission data supplied from the debugger 3 and drives the data transmission coil 8-TXD is provided.
- data is adjusted to adjust the transmission timing of the data pulse.
- a delay circuit ( ⁇ ) 63 is provided for adjusting the output timing for the input of the transmission driver 62 in a variable manner. The delay time can be adjusted by the control data CDAT17. The output power of the data transmission driver 62 can be adjusted by the control data CDAT18.
- the control circuit 31 controls each communication condition of clock reception, data transmission, and data reception.
- Data CDAT1;! A register circuit (CREG) 31R for storing parameters for controlling by CDAT18, and parameters in the register circuit It has a logic circuit (LOG) 31L for controlling the operation sequence for setting.
- the logic circuit 31L has a function to detect the optimum values of various adjustment parameters. This is a force S that can also be implemented by software on the host computer 1 via the debugger 3, where the magnetic coupling interface IC7 is For this purpose, a logic circuit 31L is provided as dedicated hardware.
- the register circuit 31R is accessible from the debugger 3 via the register interface (RIF).
- the register circuit 31R outputs the clock reception gain parameter register (for setting the gain adjustment value (CDAT12) of the clock reception amplifier 56) and the data transmission output parameter register (for setting the adjustment value (CDAT18) of the data transmission output power of the driver 62) ,
- Data reception gain parameter register for setting gain adjustment value (CDAT15) of data reception amplifier 59
- data transmission delay parameter register for setting delay value (CDAT17) of data transmission output timing by delay circuit 63
- offset adjustment register Offset adjustment DAC57 60 input value (for setting CDAT13, CDAT16), offset adjustment control register (control register for offset adjustment) judgment timing register (for setting judgment timing correction value (CDAT14) of delay circuit 58),
- Judgment timing control register control register for judgment timing adjustment
- Jister for setting delay amount for judgment timing adjustment
- Hysteresis adjustment register for setting hysteresis value (CDATl l) for receiving amplitude adjustment
- the control circuit 31 controls the automatic offset adjustment and determination timing automatic adjustment similar to those performed on the microcomputer 13 side, and also controls the amplitude of the signal amplitude of the recovered clock signal CLK by the hysteresis comparator 55. I do.
- FIG. 17 shows an outline of a method for measuring the strength of the signal amplitude of the reproduction clock signal CLK.
- FIG. 18 illustrates a processing flow of the method for measuring the strength of the signal amplitude of the recovered clock signal CLK.
- Figure 19 illustrates the relationship between the magnitude of the hysteresis in the hysteresis comparator and its output.
- FIG. 20 shows the timing of the signal amplitude strength measurement operation of the recovered clock signal CLK.
- the value held in the hysteresis adjustment register becomes data indicating the received signal amplitude to be judged (S36).
- the normal end bit of the received amplitude detection control register is set to 1 (S36). If measurement of the received signal amplitude cannot be completed, 1 is set to the error end bit of the received amplitude detection control register (S37). The same adjustment of the received signal amplitude can be performed when a hysteresis comparator is used in the data receiver.
- the position where the received signal intensity becomes maximum is the coil of the microcomputer.
- the coil of the magnetic field coupling interface IC is at the shortest facing position. This can also be used for alignment of the coil on the probe side and the coil on the microcomputer side.
- by setting the minimum required transmission power power while detecting the received signal power further low power operation is possible. Become capable.
- FIG. 21 illustrates a communication path establishment procedure at the time of system startup. It is necessary to establish a wireless communication path for debugging at system startup. It is desirable to set the communication conditions by setting the offset adjustment and judgment timing parameters for the reception function on both sides.
- Various adjustment procedures at system startup include reset, transmitter initialization, receiver offset correction, clock transmission and probe position adjustment, magnetic coupling interface IC side data reception judgment timing adjustment, microcomputer side Data reception judgment timing adjustment and initialization completion notification are roughly divided.
- both the magnetic field coupling interface IC7 side and the microcomputer 13 side are reset (SMI, SD1).
- the debug mode is designated using the mode terminal MDi.
- the microcomputer reset instruction can be, for example, a power-on reset.
- a specific pattern is sent to the microcomputer using the asynchronous channel, and the reset instruction is given to the microphone computer 13 from the probe 5 side. It is also possible.
- the value of the determination timing register, transmission power adjustment register, transmission delay adjustment register, reset Is initialized to a fixed value determined in advance (SM2, SD2).
- the offset is automatically corrected for each receiver after reset (SM3, SD3).
- the microcomputer side continues to transmit the clock to the probe 5 side after the automatic offset correction of the receiver is completed (SM4).
- the probe side detects the received amplitude (SD4) and adjusts the probe position so that the received amplitude becomes larger.
- SD4 received amplitude
- an error is displayed on the host computer as communication failure and the process ends (SD5, SD12).
- the microcomputer 13 side continues to transmit "data pattern 1" to the probe 5 side after the automatic offset correction of the receiver is completed (SM5).
- the magnetic coupling interface IC7 side adjusts the judgment timing of the data receiver when clock transmission and probe position adjustment are completed (SD6). At this time, if “data pattern 1” cannot be received within a certain time, communication is failed and an error is displayed on the host computer 13 (SD7, SD12).
- the microcomputer 13 side When the microcomputer 13 side successfully adjusts the data reception determination timing on the microcomputer 13 side, it transmits an initialization completion command to the magnetic field coupling interface IC 7 side, and operates as a debug mode. Start (SM9).
- the magnetic coupling interface IC7 side When receiving the initialization completion command from the microcomputer 13 side, the magnetic coupling interface IC7 side recognizes that the initialization is complete (SD9) and starts debug control (SD11). If the initialization completion command is not received within a certain period (SD10), the debugger software displays on the host computer 1 that communication is not possible and terminates (SD12).
- FIG. 22 shows another example of the wireless communication interface circuit possessed by the microcomputer 13.
- the wireless communication interface circuit 24-A shown in the figure is a circuit for asynchronous communication. If the data rate requirement is not so high, using asynchronous communication for data transmission / reception eliminates the need for transmitter / receiver timing adjustments and greatly simplifies the system.
- the difference from Fig. 6 is that it has a data transmitter and data receiver without a clock transmitter, does not have variable delay circuits 43 and 45, respectively, and adopts a hysteresis comparator in the data receiver.
- the Information transmission by the wireless communication interface circuit 24-A is performed by a pulse transmission method using magnetic field coupling as described above.
- the debug support circuit 17 It has a data transmission driver 42 that generates complementary noise, and a data transmission coil 14—TXD.
- the output power of the data transmission driver 42 can be adjusted by the control data CDAT3.
- the transmission operation is performed in synchronization with the internal clock CLK1.
- Internal clock CLK1 is not a clock for synchronous communication.
- the data reception coil 14—RXD and the modulation information of the received noise signal induced in this data reception coil 14—RXD (here, the pulses in the case of complementary two-phase modulation) Has a hysteresis comparator 44 — A for detecting the positive and negative voltage polarity).
- a data reception amplifier 46 for amplifying the reception signal of the data reception coil 14—RXD is arranged.
- the data receiving amplifier 46 can be omitted if it is arranged according to the received signal strength (depending on the communication distance, etc.) if necessary.
- an offset canceling digital-to-analog converter (DAC) 47 is arranged to remove the offset of the data receiving path, and its output is added to the complementary output of the data receiving amplifier 46 with the opposite polarity. If it is not necessary to remove the offset, the digital / analog conversion circuit 47 can be omitted.
- the power of the data transmission driver 42 can be made variable by the control data CDAT3
- the gain of the data reception amplifier 46 can be made variable by the control data CDAT5
- the hysteresis characteristic of the hysteresis comparator 44—A can be made variable by the control data CDAT20.
- the digital-analog converter circuit 47 converts the control data CDAT6 into an analog signal.
- Control circuit 27—A is a register circuit (CREG) 27R—A for storing parameters for controlling communication conditions of data transmission and data reception by control data CDAT3, CDAT5, CDAT6, CDAT20. And a logic circuit (LOG) 27L-A for controlling the operation sequence for setting parameters in the register circuit.
- Logic circuit 27L—A has a function to detect the optimum values of various adjustment parameters. This is a force S that can also be implemented by software on the host computer via a debugger.
- the wireless communication interface circuit 24— A has logic circuit 27L—A as dedicated hardware for that!
- Register circuit 27R—A is made accessible from debugger 3 via CPU 18 or debug support circuit 17.
- Register circuit 27R A is a data transmission output parameter register. (For data transmission output power adjustment value (CDAT3) setting), data reception gain parameter register (for data reception amplifier gain adjustment value (CDAT5) setting), offset adjustment register (DAC input value for offset adjustment (CDAT6)) Setting), offset adjustment control register (control register for offset adjustment), and hysteresis adjustment register (for setting hysteresis value (CDAT20) for reception amplitude adjustment).
- CDAT3 data transmission output power adjustment value
- data reception gain parameter register for data reception amplifier gain adjustment value (CDAT5) setting
- offset adjustment register DAC input value for offset adjustment (CDAT6)
- offset adjustment control register control register for offset adjustment
- hysteresis adjustment register for setting hysteresis value (CDAT20) for reception amplitude adjustment).
- FIG. 23 shows another example of the magnetic field coupling interface IC.
- the magnetic field coupling interface IC7-B shown in the figure is a circuit for asynchronous communication.
- the difference from Fig. 16 is that it has a data transmitter and a data receiver without a clock receiver, does not have variable delay circuits 58 and 63, and employs a hysteresis comparator 57-B in the data receiver. Is different.
- Information transmission by magnetic coupling interface IC7-B is performed by a panoramic transmission method using magnetic coupling as described above.
- the gain of the data receiving amplifier 59 is made variable by the control data CDAT15, and the digital-analog conversion circuit 60 converts the control data CDAT16 into an analog signal.
- Hysteresis characteristics of hysteresis comparator 57-B can be changed by control data CDAT21.
- a data transmission driver 62 that generates a complementary node in accordance with transmission data TXD supplied from the debugger 3 and drives the data transmission coil 8-TXD is provided.
- the output power of the data transmission driver 62 can be adjusted by the control data CDAT18.
- the transmission operation of the transmission driver 62 is synchronized with the internal clock CLK2 of the debugger.
- the control circuit 31 B determines the communication conditions for data transmission and data reception using the control data CD.
- Register circuit (CREG) 31R—B that stores parameters to control by AT15, CDAT16, CDAT18, CDAT21, and logic circuit (LOG) 31L to control the operation sequence to set parameters in the register circuit — Has B.
- the logic circuit 31L-B has a function to detect the optimum values of various adjustment parameters.
- the register circuit 31R-B is accessible from the debugger 3 via the register interface (RIF).
- the register circuit 31R is a data transmission output parameter register (for setting the data transmission output power adjustment value (CDAT18) of the driver 62) and a data reception gain parameter register (for setting the gain adjustment value (CDAT15) of the data reception amplifier 59).
- Offset adjustment register for setting 60 input value (CDAT16) for offset adjustment
- offset adjustment control register control register for offset adjustment
- hysteresis adjustment register hysteresis value for receiving amplitude adjustment (CDAT21)
- the control circuit 31-B performs the same control as described above for automatic offset adjustment and measurement of the signal amplitude strength by the hysteresis comparator 57-B.
- FIG. 24 illustrates various processing procedures at the time of system start-up using asynchronous communication between the wireless communication interface circuit 24-A in FIG. 22 and the magnetic field coupling interface IC7-B in FIG.
- the difference from the processing procedure in Fig. 21 is that processing related to clock transmission adjustment is not required. Since the other processes are substantially the same as those described in FIG. 21, detailed description thereof is omitted.
- FIG. 25 to FIG. 31 illustrate variations of the package type and coil arrangement in the microcomputer.
- FIG. 25 and FIG. 26 illustrate coil arrangements when the package type is SOP (Small Outline Package), SSOP (Srink Small Outline Package), or DIP (Dual Inline Package).
- the coil 14 When the coil 14 is formed on the semiconductor integrated circuit chip as shown in FIG. 25, the coil 14 may be formed on the surface of the wiring layer or the uppermost layer in the semiconductor integrated circuit chip 13C.
- the bonding wire 13BY and the coil 14 cross or approach each other so that the coil signal and the lead signal do not interfere with each other.
- the coil 14 is arranged near the end surface without the lead 13L, and the power supply, the ground, the mode terminal, or the like is arranged on the lead 13L near the four corners of the package 13P without arranging a frequently changing signal.
- the laser 14 is not limited to being formed on the semiconductor integrated circuit chip 13C.
- the microcomputer 13 may be formed inside the package 13P and outside the semiconductor integrated circuit chip 13C.
- a coil pattern that is electrically insulated from the metal pattern of the die pad DP may be formed on a part of the die pad 13DP and used as the coil 14.
- FIG. 26 by arranging the coil 14 on the die pad, it is possible to eliminate variations in the coil position of each device and to easily fix the coil coordinate position with respect to the outside of the package.
- FIGS. 27 to 29 illustrate coil arrangements when the package type is QFP (Quad Flat Package) and QFN (Quad Fl at Non-leaded package).
- the coil 14 is formed on the semiconductor integrated circuit chip 13C as shown in FIG. 27, the bonding wire 13BY and the coil 14 cross or approach each other so that the coil signal and the lead signal do not interfere with each other.
- coils 14 are arranged at the four corners of the semiconductor integrated circuit chip, and signals that change frequently are not arranged at the leads 13L near the four corners of the package 13P.
- FIG. 28 by arranging the coil 14 on the die pad 13DP, it is possible to eliminate variations in the coil position for each device, and it is easy to fix the coil coordinate position with respect to the outside of the package 13P.
- the coil signal and lead signal should not interfere with each other when the bonding wire 13BY and coil 14 cross or approach each other.
- the coil 14 is arranged near the center of the semiconductor integrated circuit chip 13C so that a frequently changing signal is not assigned to the lead 13L near the coiner 14.
- FIG. 30 illustrates the coil arrangement when the package type is BGA (Ball Grid Array).
- the coil 14 When the coil 14 is formed on the semiconductor integrated circuit chip 13, the same consideration as in FIG. 29 may be taken. Instead of forming the coil 14 on the semiconductor integrated circuit chip 13C, the coil 14 may be formed on a substrate 13CB having a solder bump electrode on the back surface. By arranging the coil 14 on the board 13CB, it is possible to eliminate variations in the coil position for each device, and to easily fix the coil coordinate position with respect to the outside of the package 13P.
- FIG. 31 shows a specific pattern of the coil 14 at the tip 5TOP of FIG.
- Each coil 8—CLK, 8—TXD, 8—RXD is formed as a double coil on the front and back of the probe.
- Lu is the winding formed on the upper surface of the probe, and Ld is formed on the lower surface of the probe. The two windings are connected by through holes TH.
- FIG. 32 illustrates a pattern of the coil 14 of the microcomputer 13. By using the two wiring layers, there is no short circuit at the intersection.
- the coil shown in the figure is a coil pattern corresponding to one coil illustrated in FIG. 31 on the probe 5 side. For example, if one side of the coil 8 on the probe 5 side is 1 mm, one side of the coil 14 on the microcomputer side is 0.6 mm.
- the debugger and the microcomputer are interfaced by wireless communication, the external debugging terminals of the microcomputer can be reduced, and the number of terminals used by the user for system debugging can be increased.
- the pulse transmission method using magnetic field coupling is adopted for wireless communication, a small-size antenna can be configured on the chip, the transmitter / receiver circuit can be made small, low power consumption can be realized, and communication is not possible without proximity. Therefore, it is possible to freely set a relatively secure communication rate.
- the external communication operation and the trace output operation in the microcomputer are often used as they are or after being divided.
- the clock frequency varies depending on the type of microcomputer and the user. Even under these conditions, the communication rate can be set freely according to the operating clock frequency of the microcomputer, so that the wireless communication interface circuit 24 can have high versatility, and a so-called IP module design. It can be reused for various microcomputers as assets.
- the probe can be detachably fixed to the top of the package of the microcomputer with double-sided tape, tape, adhesive, etc., only during the period when the debugger is used, and it can be detached without using an expensive connector. Connection can be realized inexpensively and easily. [0103] Since a conventional debugger can be connected as it is via a probe, it is not necessary to purchase and prepare a new debugger or software.
- data transmission / reception may be performed by a plurality of bits, or a coil may be shared for transmission and reception.
- the present invention is applicable to uses other than system debugging.
- pulse communication wireless communication may be applied to interface a microcomputer having an electrically rewritable nonvolatile memory on-chip with a writing device such as an EPROM writer.
- EPROM writer a writing device
- application to other wireless communication interfaces is also possible.
- the present invention can be widely applied to interface technology using magnetic field coupling of coils, in particular, contactless non-contact interface technology, system debugging for evaluating a target system with a debugger, and the like.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Networks & Wireless Communication (AREA)
- Near-Field Transmission Systems (AREA)
- Microcomputers (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Debugging And Monitoring (AREA)
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008543120A JP4574714B2 (ja) | 2006-11-10 | 2007-11-08 | システムデバッグ方法、システムデバッグ装置、データプロセッサ及び無線通信インタフェースic、インタフェース方法 |
US12/514,023 US8423850B2 (en) | 2006-11-10 | 2007-11-08 | System debugging method, system debugging equipment, processor, wireless-communications interface IC and interface method thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006305299 | 2006-11-10 | ||
JP2006-305299 | 2006-11-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008056739A1 true WO2008056739A1 (fr) | 2008-05-15 |
Family
ID=39364550
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/071706 WO2008056739A1 (fr) | 2006-11-10 | 2007-11-08 | Procédé de débogage de système, appareil de débogage de système, processeur de données, ci d'interface de communication sans fil et procédé d'interface |
Country Status (3)
Country | Link |
---|---|
US (1) | US8423850B2 (ja) |
JP (1) | JP4574714B2 (ja) |
WO (1) | WO2008056739A1 (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010147557A (ja) * | 2008-12-16 | 2010-07-01 | Nec Corp | 信号伝送方法と受信器と送信器と半導体装置 |
JP2011170654A (ja) * | 2010-02-19 | 2011-09-01 | Renesas Electronics Corp | 情報処理装置、デバッグ装置、デバッグ方法 |
US8843095B2 (en) | 2010-03-12 | 2014-09-23 | Panasonic Corporation | Electronic circuit system, electronic circuit device, and wireless communication device in which antennas are selected to be paired for wireless communication and the selected antennas are connected to the electronic circuits |
JP2016143977A (ja) * | 2015-01-30 | 2016-08-08 | 株式会社東芝 | 受信回路及び通信システム |
WO2017037883A1 (ja) * | 2015-09-02 | 2017-03-09 | 株式会社PEZY Computing | 半導体装置 |
JP7524278B2 (ja) | 2022-09-02 | 2024-07-29 | ヒュンダイ・モービス・カンパニー・リミテッド | 絶縁通信時のセルフキャリブレーション装置および方法 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5743221B2 (ja) * | 2012-06-29 | 2015-07-01 | カシオ計算機株式会社 | 無線同期システム、無線装置、センサ装置、無線同期方法、及びプログラム |
KR20140065909A (ko) * | 2012-11-22 | 2014-05-30 | 에스케이하이닉스 주식회사 | 송신회로, 수신회로 및 송/수신 시스템 |
GB2506825B (en) * | 2014-02-12 | 2014-10-15 | Ultrasoc Technologies Ltd | Functional testing of an integrated circuit chip |
CN104375058A (zh) * | 2014-11-07 | 2015-02-25 | 国网上海市电力公司 | 电力线路故障自我诊断和定位的传感器自组网系统 |
US10963328B2 (en) * | 2018-09-05 | 2021-03-30 | Mikroelektronika D.O.O. | WiFi programmer and debugger for microcontroller and method thereof |
JP7105172B2 (ja) * | 2018-11-01 | 2022-07-22 | 富士フイルムヘルスケア株式会社 | 超音波探触子及び超音波診断装置 |
US11985014B2 (en) * | 2022-06-03 | 2024-05-14 | Renesas Electronics America Inc. | Digital demodulation for wireless power |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005182209A (ja) * | 2003-12-16 | 2005-07-07 | Mitsubishi Electric Corp | デバッグ機構 |
JP2005345802A (ja) * | 2004-06-03 | 2005-12-15 | Casio Comput Co Ltd | 撮像装置、この撮像装置に用いられる交換ユニット、交換ユニット使用制御方法及びプログラム |
JP2006051343A (ja) * | 2004-07-16 | 2006-02-23 | Semiconductor Energy Lab Co Ltd | 生体信号処理装置、無線メモリ、生体信号処理システム及び被制御装置の制御システム |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6301514B1 (en) * | 1996-08-23 | 2001-10-09 | Csi Technology, Inc. | Method and apparatus for configuring and synchronizing a wireless machine monitoring and communication system |
US7071824B2 (en) * | 1999-07-29 | 2006-07-04 | Micron Technology, Inc. | Radio frequency identification devices, remote communication devices, identification systems, communication methods, and identification methods |
US6466130B2 (en) * | 1999-07-29 | 2002-10-15 | Micron Technology, Inc. | Wireless communication devices, wireless communication systems, communication methods, methods of forming radio frequency identification devices, methods of testing wireless communication operations, radio frequency identification devices, and methods of forming radio frequency identification devices |
US20040197101A1 (en) * | 2001-02-05 | 2004-10-07 | Sasser Gary D. | Optical transceiver module with host accessible on-board diagnostics |
JP4442744B2 (ja) | 2001-06-22 | 2010-03-31 | 株式会社ルネサステクノロジ | プログラム開発方法及びプログラム開発装置 |
EP1329727A1 (en) * | 2001-10-18 | 2003-07-23 | Nsk Ltd | Rotation-speed sensor device |
US7185287B2 (en) * | 2002-07-03 | 2007-02-27 | National Instruments Corporation | Wireless deployment / distributed execution of graphical programs to smart sensors |
JP2005018703A (ja) | 2003-06-30 | 2005-01-20 | Renesas Technology Corp | 半導体集積回路装置およびデバッグシステム |
US7873321B2 (en) * | 2005-03-29 | 2011-01-18 | Qualcomm Incorporated | Apparatus and methods for determining network access performance of a wireless device |
US7509250B2 (en) * | 2005-04-20 | 2009-03-24 | Honeywell International Inc. | Hardware key control of debug interface |
US7669094B2 (en) * | 2005-08-05 | 2010-02-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and inspection method of semiconductor device and wireless chip |
US7583625B2 (en) * | 2006-04-06 | 2009-09-01 | Broadcom Corporation | Access point multi-level transmission power and protocol control based on the exchange of characteristics |
US20080002691A1 (en) * | 2006-06-29 | 2008-01-03 | Qi Emily H | Device, system and method of multicast/broadcast communication |
-
2007
- 2007-11-08 WO PCT/JP2007/071706 patent/WO2008056739A1/ja active Application Filing
- 2007-11-08 US US12/514,023 patent/US8423850B2/en not_active Expired - Fee Related
- 2007-11-08 JP JP2008543120A patent/JP4574714B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005182209A (ja) * | 2003-12-16 | 2005-07-07 | Mitsubishi Electric Corp | デバッグ機構 |
JP2005345802A (ja) * | 2004-06-03 | 2005-12-15 | Casio Comput Co Ltd | 撮像装置、この撮像装置に用いられる交換ユニット、交換ユニット使用制御方法及びプログラム |
JP2006051343A (ja) * | 2004-07-16 | 2006-02-23 | Semiconductor Energy Lab Co Ltd | 生体信号処理装置、無線メモリ、生体信号処理システム及び被制御装置の制御システム |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010147557A (ja) * | 2008-12-16 | 2010-07-01 | Nec Corp | 信号伝送方法と受信器と送信器と半導体装置 |
JP2011170654A (ja) * | 2010-02-19 | 2011-09-01 | Renesas Electronics Corp | 情報処理装置、デバッグ装置、デバッグ方法 |
US8996918B2 (en) | 2010-02-19 | 2015-03-31 | Renesas Electronics Corporation | Information processing apparatus with debugging unit and debugging method therefor |
US9213615B2 (en) | 2010-02-19 | 2015-12-15 | Renesas Electronics Corporation | Information processing apparatus with debugging unit and debugging method therefor |
US8843095B2 (en) | 2010-03-12 | 2014-09-23 | Panasonic Corporation | Electronic circuit system, electronic circuit device, and wireless communication device in which antennas are selected to be paired for wireless communication and the selected antennas are connected to the electronic circuits |
JP2016143977A (ja) * | 2015-01-30 | 2016-08-08 | 株式会社東芝 | 受信回路及び通信システム |
WO2017037883A1 (ja) * | 2015-09-02 | 2017-03-09 | 株式会社PEZY Computing | 半導体装置 |
JPWO2017037883A1 (ja) * | 2015-09-02 | 2018-06-14 | 株式会社PEZY Computing | 半導体装置 |
US10396856B2 (en) | 2015-09-02 | 2019-08-27 | Pezy Computing K.K. | Semiconductor device |
JP7524278B2 (ja) | 2022-09-02 | 2024-07-29 | ヒュンダイ・モービス・カンパニー・リミテッド | 絶縁通信時のセルフキャリブレーション装置および方法 |
Also Published As
Publication number | Publication date |
---|---|
JP4574714B2 (ja) | 2010-11-04 |
JPWO2008056739A1 (ja) | 2010-02-25 |
US8423850B2 (en) | 2013-04-16 |
US20100040123A1 (en) | 2010-02-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4574714B2 (ja) | システムデバッグ方法、システムデバッグ装置、データプロセッサ及び無線通信インタフェースic、インタフェース方法 | |
US9742469B2 (en) | Positioning guidance for increasing reliability of near-field communications | |
US9413430B2 (en) | Measurement and reporting of received signal strength in NFC enabled devices | |
JP4412947B2 (ja) | メモリカード | |
JP5258343B2 (ja) | 半導体装置及び半導体集積回路 | |
EP2642372A1 (en) | Touch-controlled electronic device and method for reducing wireless signal interference to touch sensing function | |
JPH03209592A (ja) | チツプカード | |
US10204243B2 (en) | Card reader and method of operating the same | |
JP2005030877A (ja) | 無線制御テスト機能を備えた半導体集積回路装置 | |
US20100257313A1 (en) | Semiconductor device | |
US10609012B2 (en) | Method of operating a security token, computer program product and security token | |
CN104640023A (zh) | 可编程声传感器的多功能引脚 | |
US20080104458A1 (en) | Semiconductor memory, system, testing method for system | |
US9319883B2 (en) | Card device | |
JP2006024208A (ja) | モード検出を含むマルチモード集積回路装置及びそれの動作方法 | |
KR101260940B1 (ko) | 휴대단말기의 RF 안테나 장치와 접속되는 Micro-SD 메모리 | |
FR2888371B1 (fr) | Support de donnees pliable a puce sans contact tel qu'un passeport | |
US8854211B2 (en) | Integrated circuit card system and a data transmission method thereof | |
JP2002368830A (ja) | 信号受信部 | |
JP2007334660A (ja) | Icカード用マイクロコンピュータチップ、icカード用マイクロコンピュータ及びicカード | |
CN101729680A (zh) | 具有可间歇动作电路的装置 | |
KR20010048249A (ko) | 디폴트패드를 테스트패드와 공유하는 반도체 장치 | |
JP2003005994A (ja) | プログラム開発方法 | |
JP4906135B2 (ja) | メモリカード | |
JP2003078446A (ja) | 信号受信部 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 07831437 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2008543120 Country of ref document: JP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 12514023 Country of ref document: US |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 07831437 Country of ref document: EP Kind code of ref document: A1 |