WO2008007448A1 - Dye-sensitized solar cell, and electrode and laminated film therefor - Google Patents
Dye-sensitized solar cell, and electrode and laminated film therefor Download PDFInfo
- Publication number
- WO2008007448A1 WO2008007448A1 PCT/JP2006/314320 JP2006314320W WO2008007448A1 WO 2008007448 A1 WO2008007448 A1 WO 2008007448A1 JP 2006314320 W JP2006314320 W JP 2006314320W WO 2008007448 A1 WO2008007448 A1 WO 2008007448A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- titanium oxide
- crystalline titanium
- dye
- porous semiconductor
- semiconductor layer
- Prior art date
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- 229920002347 Polypropylene succinate Polymers 0.000 description 1
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- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical class [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
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- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229920002472 Starch Polymers 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
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- 125000005907 alkyl ester group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 150000001408 amides Chemical class 0.000 description 1
- VBIXEXWLHSRNKB-UHFFFAOYSA-N ammonium oxalate Chemical compound [NH4+].[NH4+].[O-]C(=O)C([O-])=O VBIXEXWLHSRNKB-UHFFFAOYSA-N 0.000 description 1
- 229910001870 ammonium persulfate Inorganic materials 0.000 description 1
- 239000012491 analyte Substances 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 229940058905 antimony compound for treatment of leishmaniasis and trypanosomiasis Drugs 0.000 description 1
- 150000001463 antimony compounds Chemical class 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- IFVTZJHWGZSXFD-UHFFFAOYSA-N biphenylene Chemical group C1=CC=C2C3=CC=CC=C3C2=C1 IFVTZJHWGZSXFD-UHFFFAOYSA-N 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
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- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
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- IRXRGVFLQOSHOH-UHFFFAOYSA-L dipotassium;oxalate Chemical compound [K+].[K+].[O-]C(=O)C([O-])=O IRXRGVFLQOSHOH-UHFFFAOYSA-L 0.000 description 1
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- 208000028659 discharge Diseases 0.000 description 1
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- 229920001971 elastomer Polymers 0.000 description 1
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- 150000002291 germanium compounds Chemical class 0.000 description 1
- 229940119177 germanium dioxide Drugs 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000009998 heat setting Methods 0.000 description 1
- 238000009775 high-speed stirring Methods 0.000 description 1
- 238000001027 hydrothermal synthesis Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000005470 impregnation Methods 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- NJWNEWQMQCGRDO-UHFFFAOYSA-N indium zinc Chemical compound [Zn].[In] NJWNEWQMQCGRDO-UHFFFAOYSA-N 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 150000002500 ions Chemical group 0.000 description 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
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- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229920000609 methyl cellulose Polymers 0.000 description 1
- 239000001923 methylcellulose Substances 0.000 description 1
- 235000010981 methylcellulose Nutrition 0.000 description 1
- RXOHFPCZGPKIRD-UHFFFAOYSA-N naphthalene-2,6-dicarboxylic acid Chemical compound C1=C(C(O)=O)C=CC2=CC(C(=O)O)=CC=C21 RXOHFPCZGPKIRD-UHFFFAOYSA-N 0.000 description 1
- 229920003052 natural elastomer Polymers 0.000 description 1
- 229920001194 natural rubber Polymers 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- ZAOCWQZQPKGTRN-UHFFFAOYSA-N nitrous acid;sodium Chemical compound [Na].ON=O ZAOCWQZQPKGTRN-UHFFFAOYSA-N 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- BAQNULZQXCKSQW-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical compound [O-2].[O-2].[O-2].[O-2].[Ti+4].[Ti+4] BAQNULZQXCKSQW-UHFFFAOYSA-N 0.000 description 1
- 229920001277 pectin Polymers 0.000 description 1
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- 239000008188 pellet Substances 0.000 description 1
- 235000011007 phosphoric acid Nutrition 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 239000011941 photocatalyst Substances 0.000 description 1
- 229920000075 poly(4-vinylpyridine) Chemical group 0.000 description 1
- 229920003227 poly(N-vinyl carbazole) Chemical group 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920002432 poly(vinyl methyl ether) polymer Polymers 0.000 description 1
- 229920002401 polyacrylamide Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000412 polyarylene Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
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- 229920001225 polyester resin Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229940117828 polylactic acid-polyglycolic acid copolymer Drugs 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920002215 polytrimethylene terephthalate Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 229920001290 polyvinyl ester Polymers 0.000 description 1
- 239000005033 polyvinylidene chloride Chemical group 0.000 description 1
- 229920002717 polyvinylpyridine Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 150000004032 porphyrins Chemical class 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- HKJYVRJHDIPMQB-UHFFFAOYSA-N propan-1-olate;titanium(4+) Chemical compound CCCO[Ti](OCCC)(OCCC)OCCC HKJYVRJHDIPMQB-UHFFFAOYSA-N 0.000 description 1
- NHARPDSAXCBDDR-UHFFFAOYSA-N propyl 2-methylprop-2-enoate Chemical compound CCCOC(=O)C(C)=C NHARPDSAXCBDDR-UHFFFAOYSA-N 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 230000002040 relaxant effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
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- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- DAJSVUQLFFJUSX-UHFFFAOYSA-M sodium;dodecane-1-sulfonate Chemical compound [Na+].CCCCCCCCCCCCS([O-])(=O)=O DAJSVUQLFFJUSX-UHFFFAOYSA-M 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000008107 starch Substances 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000009210 therapy by ultrasound Methods 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 150000003573 thiols Chemical class 0.000 description 1
- ANRHNWWPFJCPAZ-UHFFFAOYSA-M thionine Chemical compound [Cl-].C1=CC(N)=CC2=[S+]C3=CC(N)=CC=C3N=C21 ANRHNWWPFJCPAZ-UHFFFAOYSA-M 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 150000003609 titanium compounds Chemical class 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- STCOOQWBFONSKY-UHFFFAOYSA-N tributyl phosphate Chemical compound CCCCOP(=O)(OCCCC)OCCCC STCOOQWBFONSKY-UHFFFAOYSA-N 0.000 description 1
- DQWPFSLDHJDLRL-UHFFFAOYSA-N triethyl phosphate Chemical compound CCOP(=O)(OCC)OCC DQWPFSLDHJDLRL-UHFFFAOYSA-N 0.000 description 1
- WVLBCYQITXONBZ-UHFFFAOYSA-N trimethyl phosphate Chemical compound COP(=O)(OC)OC WVLBCYQITXONBZ-UHFFFAOYSA-N 0.000 description 1
- 239000006097 ultraviolet radiation absorber Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 239000001018 xanthene dye Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2027—Light-sensitive devices comprising an oxide semiconductor electrode
- H01G9/2031—Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2095—Light-sensitive devices comprising a flexible sustrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M14/00—Electrochemical current or voltage generators not provided for in groups H01M6/00 - H01M12/00; Manufacture thereof
- H01M14/005—Photoelectrochemical storage cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2059—Light-sensitive devices comprising an organic dye as the active light absorbing material, e.g. adsorbed on an electrode or dissolved in solution
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/542—Dye sensitized solar cells
Definitions
- the present invention relates to a dye-sensitized solar cell, an electrode therefor, and a laminated film. More specifically, a dye-sensitized solar cell electrode capable of producing a dye-sensitized solar cell having a high photovoltaic power generation performance while using a plastic substrate, a laminated film therefor, and the dye-sensitized solar cell P background technology
- Dye-sensitized solar cells have been proposed since the proposal of photoelectric conversion elements using dye-sensitized semiconductor fine particles (Nature, Vol. 3 5 3, 7 3 7-7 40, (1 9 9 1))), attracting attention as a new solar cell to replace silicon solar cells.
- Dye-sensitized solar cells using plastic substrates are attracting attention because they can be made flexible and lightweight.
- a dye-sensitized solar cell using a commonly used glass substrate in order to improve the binding property between oxide semiconductor particles and to form a porous structure for improving photoelectric conversion efficiency Execute high-temperature heat treatment.
- the temperature is generally 400 or more, and it is difficult to perform high-temperature heat treatment directly on a plastic substrate. Therefore, in Japanese Patent Application Laid-Open No. 1 1 1 2 8 8 7 4 5, a dye-sensitized solar cell using a plastic substrate is prepared by oxidizing a metal foil and further providing irregularities on the surface.
- Japanese Patent Laid-Open No. 20 0 1-1 6 0 4 2 6 a high temperature heat treatment of a metal oxide is once performed on a metal foil, and then the metal oxide layer is peeled off once on a plastic substrate. A method of fixing with a binder is described. However, the process is complicated and unsuitable for mass production.
- Japanese Patent Laid-Open No. 2 0 0 2-5 0 4 1 3 metal oxidation A method of forming a semiconductor metal oxide layer by coating physical particles on a plastic substrate is described.
- an electrospinning method as a method for producing a metal oxide.
- an oxide precursor containing a burnt component such as a polymer is discharged onto a substrate at a high aspect ratio, and then subjected to high-temperature heat treatment to obtain a metal oxide.
- An electrode for a dye-sensitized solar cell in which a metal oxide layer is provided on a glass substrate using this electrospinning method has already been known.
- dye-sensitized solar cells are disclosed in US 2 0 0 5 0 1 0 9 3 8 5 and Mi Y eon Song et al., Nanotechnology I, 2000, pl 8 6 1 to 1 8 6 is described in 5.
- the metal oxide precursor is ejected and deposited in a high aspect ratio state on the transparent conductive layer on the glass substrate, and then the metal oxide is oxidized by firing at a high temperature.
- the material layer is obtained.
- the metal oxide tends to peel from the transparent conductive layer due to the self-shrinkage of the metal oxide.
- the metal oxide firing process on the glass substrate itself is performed at 400 ° C or higher, it is difficult to apply this technology to dye-sensitized solar cell electrodes using plastic substrates. It is.
- the object of the present invention is to use a plastic substrate to adsorb a sufficient amount of dye to obtain a high charge transport efficiency, and to provide a substrate with good adhesion without peeling off the porous oxide film. It is an object of the present invention to provide a dye-sensitized solar cell electrode that can be laminated to produce a dye-sensitized solar cell with high photovoltaic performance.
- Another object of the present invention is to provide a laminated film using a plastic substrate for the electrode.
- Still another object of the present invention is to provide a dye-sensitized solar cell using the above electrode.
- the porous semiconductor layer is composed of a crystalline titanium oxide fiber and a crystalline titanium oxide fine particle, and the crystalline titanium oxide fiber and the crystalline titanium oxide fine particle are composed of a porous semiconductor layer, a transparent conductive layer, and a transparent plastic film.
- the anatase phase is substantially composed of an anatase phase and a rutile phase, and the anatase phase content ratio calculated from the integrated intensity ratio of X-ray diffraction is between 1.0 and 0.32, and the dye-sensitized solar Used for battery electrodes
- FIG. 1 is a schematic explanatory diagram of a discharge device used in the electrospinning method used in the examples. Explanation of symbols 1 Solution jet nozzle
- the porous semiconductor layer is composed of crystalline titanium oxide fibers and crystalline titanium oxide fine particles.
- An excellent porous structure and a high specific surface area can be obtained because the porous semiconductor layer is composed of crystalline titanium oxide fibers and crystalline titanium oxide fine particles.
- the crystalline titanium oxide fiber and the crystalline titanium oxide fine particle are substantially composed of an anaphase phase and a rutile phase, and a porous material composed of the crystalline titanium oxide fiber and the crystalline titanium oxide fine particle.
- the area ratio in the X-ray diffraction of the Anauze phase to the rutile phase of the semiconductor layer is between 1.00 and 0.32. The area ratio does not substantially exceed 1.0, and if it is less than 0.32, it is difficult to achieve high charge transport efficiency.
- the content ratio of the anatase phase calculated from the integrated intensity ratio of the X-ray diffraction is 20 x 25.3 ° and 27.4 ° in the X-ray profile with intensity correction.
- the integrated intensities IA (analyze phase) and IR (rutile phase) were estimated for each diffraction peak derived from the phase titanium oxide, and the content ratio was determined from the following equation.
- Anaisenze phase content ratio IA / (I A + IR)
- the crystalline titanium oxide fiber and the crystalline titanium oxide fine particles may have insufficient charge transport efficiency unless they are substantially composed of an anatase phase and a rutile phase. It's not good.
- the average crystallite size by X-ray diffraction of the analog phase in the porous semiconductor layer is preferably in the range of 10 to 100 nm, more preferably 20 to 100 nm. If it is less than 10 nm, it is not preferable because the electrical transport efficiency decreases due to an increase in the interface between crystals. If it exceeds 100 nm, the specific surface area of the porous semiconductor layer decreases, and sufficient power generation cannot be obtained. Therefore, it is not preferable.
- the average crystallite size is measured by X-ray diffraction.
- the X-ray diffraction measurement was performed by using a ROTA FLEX RU200 B manufactured by Rigaku Denki Co., Ltd., and a reflection method was adopted with a goniometer with a radius of 185 nm.
- the measurement sample used was obtained by adding high-purity silicon powder for X-ray diffraction standard as an internal standard to the obtained porous semiconductor.
- the intensity of the X-ray diffraction profile obtained above was corrected, and the diffraction angle 20 was corrected with the 11 1 1 diffraction peak of the internal standard silicon.
- the half width of the 1 1 1 1 diffraction peak of silicon was 0.15 ° or less.
- D KX ⁇ / ⁇ c o s ⁇
- ⁇ Form factor (S cherrer constant), where i3 is the internal standard silicon 1 1 1 diffraction peak from the half-value width B of the titanium oxide diffraction peak appearing around 25.3 ° to correct the spread of the optical system Half width of b
- the porous semiconductor layer is preferably a dispersion in which crystalline titanium oxide fibers and crystalline titanium oxide particles are dispersed in a dispersion medium on the transparent conductive layer of a transparent plastic film having a transparent conductive layer. It can be provided by applying a coating liquid) or by adding crystalline titanium oxide fine particles to a non-woven crystalline titanium oxide fiber and laminating them.
- a dispersion medium of the dispersion liquid for example, water or an organic solvent, and preferably an alcohol is used as the organic solvent.
- a dispersion aid may be added as necessary.
- the dispersion aid for example, surfactants, acids, and chelating agents can be used.
- a binder can be used to enhance the adhesion between the crystalline titanium oxide fiber and the crystalline titanium oxide fine particles.
- the crystalline titanium oxide fiber is preferably produced by an electrospinning method.
- a solution comprising a mixture of a titanium oxide precursor and a compound that forms a complex with the titanium oxide precursor, a solvent, and a high-aspect-forming solute is discharged onto a collection substrate and deposited and fired.
- crystalline titanium oxide fibers can be obtained.
- titanium oxide precursor for example, titanium tetramethoxide, titanium tetraoxide, titanium tetranormal propoxide, titanium tetraisopropoxide, titanium tetranormal butoxide, titanium tetratertiary butoxide can be used. Titanium tetraisopropoxide and titanium tetranormal butoxide are preferred from the viewpoint of the low viscosity.
- a coordinating compound such as carboxylic acid, amide, ester, ketone, phosphine, ether, alcohol, and thiol
- acetylacetone, acetic acid, Trahydrofuran is used.
- the amount of the compound that forms a complex with the titanium oxide precursor is, for example, 0.5 equivalents or more, preferably 1 to 10 equivalents, relative to the titanium oxide precursor.
- Solvents include, for example, aliphatic hydrocarbons such as hexane; aromatic hydrocarbons such as toluene and tetralin; alcohols such as n-butanol and ethylene glycol; ethers such as tetrahydrofuran and dioxane; dimethyl sulfoxide, N, N —Dimethylformamide, n-methylaminoviridine, and water can be used. Of these, N, N-dimethylformamide and water are preferred from the viewpoint of affinity for each solute.
- the solvents may be used alone or in combination.
- the amount of the solvent is preferably 0.5 to 30 times, more preferably 0.5 to 20 times the weight of the titanium oxide precursor.
- an organic polymer As a high aspect ratio-forming solute, it is preferable to use an organic polymer because of its handling and need to be removed by firing.
- an organic polymer for example, polyethylene oxide, polyvinyl alcohol, polyvinyl ester, polyvinyl ether, polyvinyl pyridine, polyacrylamide, ether cellulose, pectin, starch, polyvinyl chloride, polyacrylonitrile, polylactic acid, polydaricholic acid, polylactic acid-polyglycolic acid Copolymer, Poly force prolactone, Polypropylene succinate, Polyethylene succinate, Polystyrene, Polycarbonate, Polyhexamethylene carbonate, Polyarylene, Polyvinylisocyanate, Polybutylisocyanate, Polymethylmethacrylate Polymethyl methacrylate, Polynormal propyl methacrylate, Polynormal butyl methacrylate, Polymethyl acrylate, Polyacrylate, Libutylacrylate, Polyethylene terephthalate, Polytrim
- polyacrylonitrile polyethylene oxide, polyvinyl alcohol, polyvinyl acetate, poly (N_vinylpyrrolidone), polylactic acid, polyvinyl chloride, and cellulose triacetate are preferable from the viewpoint of solubility in solvents.
- the molecular weight of the organic polymer is too low, the amount of organic polymer added will increase, the amount of gas generated by firing will increase, and the possibility of defects in the metal oxide structure will increase. Since it is not preferable, it is set appropriately.
- preferred molecular weights are 10 0, 0 0 to 8, 0 0 0, 0 0 0, more preferably 1 0 0, 0 0 0 to 60 0, 0 0 0.
- the addition amount of the high aspect ratio-forming solute is preferably as small as possible in the concentration range where the high aspect ratio is formed from the viewpoint of improving the density of titanium oxide. It is preferably 0.1 to 200% by weight, more preferably 1 to L50% by weight based on the weight of the body.
- the electrospinning method itself is a known method, and a solution in which a substrate having a high aspect ratio is dissolved is discharged into an electrostatic field formed between the electrodes, and the solution is drawn toward the electrodes.
- This is a method for obtaining a discharge product of titanium oxide by accumulating the formed high-spectrum ratio product on the collection substrate.
- the titanium oxide ejected material is not only in a state in which the solvent in which the substrate having a high aspect ratio-forming property is dissolved is distilled off to form a laminate, but also in a state where the solvent is contained in the ejected material. The ratio is maintained.
- Electrospinning is usually done at room temperature, but the solvent is not sufficiently volatilized For example, the temperature of the spinning atmosphere may be controlled as necessary, or the temperature of the collection substrate may be controlled.
- any metal, inorganic, or organic material can be used as long as it exhibits conductivity, and a conductive metal, inorganic, or organic thin film is provided on an insulator. It may be a thing.
- the electrostatic field is formed between a pair or a plurality of electrodes, and a high voltage may be applied to any of the electrodes. This includes, for example, using two high voltage electrodes with different voltage values (for example, 15 kV and 10 kV) and a total of three electrodes connected to earth, or This includes the case of using more electrodes.
- the high-aspect-ratio titanium oxide ejected by the electrospinning method is ejected and deposited on the electrode as the collection substrate.
- the discharged titanium oxide is fired.
- a general electric furnace can be used for firing, but an electric furnace capable of replacing the gas in the furnace may be used as necessary.
- the firing temperature is preferably a condition that allows sufficient crystal growth and control.
- the firing is preferably performed at 300 to 900 ° C, more preferably at 500 to 800.
- the crystalline titanium oxide fiber thus obtained preferably has the following performance.
- the fiber diameter is 50 to 1,00 nm, and the fiber length Z fiber diameter is 5 or more, preferably 5 to 300.
- the fiber diameter is smaller than 50 nm, it is not preferable because handling becomes substantially difficult.
- the fiber diameter is larger than 1,00 nm, it is not preferable because the dye cannot be sufficiently adsorbed on the surface and power generation is not sufficient.
- the anaphase phase (anathesis phase + rutile phase) determined by the area ratio of the crystal phase in X-ray diffraction is 1.0 to 0.50. Less than 0.50 is not preferable because the charge transport efficiency is lowered.
- the crystallite size of the anatase phase in X-ray diffraction is from 10 to 200 nm.
- the charge transport efficiency decreases, which is not preferable. If it exceeds 200 nm, the specific surface area of the porous semiconductor layer decreases, and a sufficient amount of power generation cannot be obtained.
- the BET specific surface area is 0.:! ⁇ 1, 0 0 0 m 2 Z g. If it is less than 0 .lm 2 Z g, the dye cannot be adsorbed sufficiently, and it does not generate enough power, so this is not preferable, and if it exceeds 1, 00 m 2 Z g, it will be substantially difficult to handle. Absent.
- the crystalline titanium oxide fine particles preferably have a particle diameter of 2 to 500 nm, more preferably 5 to 200 nm. If the particle diameter is smaller than 2 nm, the particle interface increases, and the electrification and transport efficiency decreases, which is not preferable. If it is larger than 50 Onm, the amount of adsorbed dye decreases, and a sufficient power generation amount cannot be obtained.
- the crystal form of the titanium oxide fine particles can be anatase or rutile, and the titanium oxide fine particles can also be used as a mixture of these crystal types.
- the porous semiconductor layer preferably contains 10% by weight or more of crystalline titanium oxide fibers and 15% by weight or more of crystalline titanium oxide fine particles. If the crystalline titanium oxide fiber is less than 10% by weight, it is not preferable because sufficient porosity cannot be obtained. If the crystalline titanium oxide fine particle is less than 15% by weight, it is not preferable because sufficient power generation cannot be obtained. .
- the more preferable contents of the crystalline titanium oxide fiber and the crystalline titanium oxide fine particles are 15 to 80% by weight and 20 to 85% by weight, respectively.
- Examples of the method for forming the porous semiconductor layer include a method of applying a coating liquid in which crystalline titanium oxide fibers and crystalline titanium oxide fine particles are dispersed, and adding crystalline titanium oxide fine particles to non-woven crystalline titanium oxide fibers. And laminating the layers.
- the porous semiconductor layer is formed by a method of applying a coating liquid in which crystalline titanium oxide fibers and crystalline titanium oxide fine particles are dispersed, the solid concentration of the dispersion is preferably 1 to 80% by weight. . If it is less than 1% by weight, the final porous semiconductor layer is undesirably thin. If it exceeds 80% by weight, the viscosity becomes so high that it is difficult to apply the coating. More preferably, it is 4 to 60% by weight.
- the coating liquid which is a dispersion can be prepared by dispersing crystalline titanium oxide fibers and crystalline titanium oxide fine particles in a dispersion medium.
- a dispersion medium for example, physical dispersion using a pole mill, a medium stirring mill, a homogenizer, etc., and ultrasonic treatment.
- a dispersion medium of this dispersion for example, water or an organic solvent, and preferably an alcohol can be used as the organic solvent.
- a titanium oxide fine particle binder may be further added to the dispersion.
- a titanium oxide precursor can be preferably used.
- titanium tetramethoxide, titanium tetraethoxide, titanium tetranormal propoxide, titanium tetraisopropoxide, titanium tetranormal butoxide, titanium tetratertiary butoxide and hydrolysates of these titanium oxide precursors may be used. it can. These may be used alone or in combination.
- the coating liquid onto the transparent conductive layer on the transparent plastic film can be carried out using any method conventionally used in coating processing.
- the roller method, the dave method, the air knife method, the blade method, the wire bar method, the slide hopper method, the extrusion method, and the curtain method can be applied.
- a general-purpose spin method or spray method may be used, and application may be performed using wet printing such as intaglio, rubber plate, and screen printing, as well as the three major printing methods of letterpress, offset, and Daravia.
- a preferred film forming method can be used according to the liquid viscosity and the wet thickness.
- the coating amount of the coating solution is preferably 0.5 to 20 g / m, more preferably 5 to 10 g Zm 2 per lm 2 of the support when dried.
- heat treatment is performed to form a porous semiconductor layer. This heat treatment may be performed in a drying process, or may be performed in a separate process after drying.
- the heat treatment is preferably from 100 to 2550 for from 1 to 120 minutes, more preferably from 1550 to 230, from 1 to 90 minutes, and particularly preferably from 180 to 220. 1 to 60 minutes. By performing this heat treatment, the resistance increase of the porous semiconductor layer can be reduced while preventing deformation of the film supporting the transparent conductive layer due to heating.
- the final thickness of the porous semiconductor layer is preferably 1 to 30 m, more preferably 2 to 10 m, and 2 to 6 m is particularly desirable for increasing transparency.
- the particles absorb strongly against the titanium oxide fine particles constituting the porous semiconductor layer.
- a treatment for strengthening physical bonding between the particles may be performed, such as irradiation with ultraviolet light or the like, or heating the fine particle layer by irradiation with microwaves.
- the method of laminating crystalline titanium oxide fine particles on a transparent conductive film on a transparent plastic film by adding crystalline titanium oxide fine particles and laminating them is, for example, pressing or roll pressing, bonding with a binder, or these. This can be done using a combination of methods.
- the activation method includes a method of activating the surface of the non-woven crystalline titanium oxide fiber with an acidic or alkaline solution, a method of activating by irradiating the surface of the thin film with ultraviolet rays or an electron beam, a corona treatment, A method of activating the surface by performing plasma treatment can be applied.
- a method of activating the surface with an acidic or alkaline solution or a method of activating the surface by performing plasma treatment may be applied.
- the binder used should not interfere with charge transfer.
- the body can be used.
- the bonding method using a binder is a method in which a binder or binder dispersion is applied on a transparent conductive layer or a non-woven crystalline titanium oxide fiber and then bonded, and a non-woven crystalline titanium oxide fiber is applied on a transparent conductive layer. After installation, a method of adding a binder or a dispersion containing a binder can be applied.
- crystalline titanium oxide fine particles are added to crystalline titanium oxide fibers in a nonwoven fabric state.
- the crystalline titanium oxide fine particles are added by a method in which a non-woven crystalline titanium oxide fiber is impregnated with a dispersion containing crystalline titanium oxide fine particles and then heat-treated, and a dispersion containing crystalline titanium oxide fine particles is applied by, for example, a spray method or the like.
- a method of forming fine particles by electron beam or UV treatment in the presence of a precursor, or a method of binding crystalline titanium oxide fine particles to a non-woven crystalline titanium oxide fiber by sputtering or the like can be used. These methods may be used in combination.
- a method of impregnating a crystalline titanium oxide fiber in a non-woven state with a dispersion containing crystalline titanium oxide fine particles, followed by a heat treatment, a dispersion containing crystalline titanium oxide fine particles, for example, spraying or barco It is preferable to use a method of applying to the transparent conductive layer or the crystalline titanium oxide fiber in the nonwoven fabric state or on the crystalline titanium oxide fiber in the nonwoven fabric state and the transparent conductive layer. Use of these methods is preferable because the crystalline titanium oxide fine particles can be introduced to the inside and is simple.
- the surface activation treatment described above may be applied, or a binder may be used.
- the impregnation or application of the crystalline titanium oxide fine particles to the crystalline titanium oxide fiber in the nonwoven fabric state may be performed before or after the crystalline titanium oxide fiber in the nonwoven fabric state is laminated on the transparent conductive layer. You may do it at the same time.
- a dispersion it is preferable to add a binder to the dispersion because adhesion to the transparent conductive layer and addition of fine particles can be performed simultaneously.
- a 3 ⁇ 4hichi precursor can be preferably used.
- titanium tetramethoxide, titanium tetraethoxide, titanium tetramalpropoxide, titanium tetrabutyl tributyloxide and hydrolysates of these titanium oxide precursors can be used. These may be used alone or in combination.
- the amount of the crystalline titanium oxide fine particles used in the dispersion is preferably 0.05 to 90% by weight, more preferably 1 to 70% by weight, Particularly preferred is 1 to 50% by weight. Less than 0.05% by weight If it is, since the thickness of the final porous semiconductor layer becomes thin, it is not preferable. If it exceeds 90% by weight, the viscosity becomes too high and it is difficult to apply the coating.
- the dispersion medium of the dispersion water or an organic solvent is used, and preferably alcohol is used as the organic solvent.
- a small amount of a dispersion aid may be added as necessary.
- the dispersion aid for example, surfactants, acids, and chelating agents can be used.
- a crystalline titanium oxide fine particle is added to a non-woven crystalline titanium oxide fiber on a transparent conductive layer on a transparent plastic film, and then heat treatment is performed. It is preferable to do so.
- This heat treatment may be performed in a drying process or may be performed in a separate process after drying.
- the heat treatment is preferably performed at 100 to 250 for 1 to 120 minutes, more preferably 150 to 230 at 1 to 90 minutes, particularly preferably 180 to 220 at 1 to 60 minutes.
- the metal oxide By irradiating the porous semiconductor layer to which the metal oxide fine particles are added with ultraviolet light or the like that the metal oxide absorbs strongly, or by irradiating the microwave with the microwave, the metal oxide is heated. You may perform the process which strengthens the physical junction between things.
- any of the methods for installing the porous semiconductor layer is previously coated on the transparent conductive layer.
- Layers can also be provided.
- This undercoat layer can be provided by, for example, a spray pie mouth lysis method described in Electrocim, Acta 40, 643 to 652 (1995), or a spattering method.
- the thickness of the undercoat layer is preferably 5 to 1,000 nm, more preferably 10 to 500 nm.
- a plastic film is used as a support for supporting the transparent conductive layer.
- a polyester film is preferable.
- the polyester constituting the polyester film is a linear saturated polyester synthesized from an aromatic dibasic acid or an ester-forming derivative thereof and a diol or an ester-forming derivative thereof.
- polyesters include polyethylene terephthalate, polyethylene isophthalate, polybutylene terephthalate, poly (1,4-cyclohexylene diethylene terephthalate), polyethylene 1,6-naphthalate, etc. I can list them. These copolymers or blends thereof with a small proportion of other resins may also be used. Of these polyesters, polyethylene terephthalate and polyethylene 1,6-naphthalene are preferred because of a good balance between mechanical properties and optical properties.
- polyethylene-1,6-naphthalate is the best because it is superior to polyethylene terephthalate in terms of mechanical strength, low heat shrinkage, and low generation of oligomer during heating. preferable.
- polyethylene terephthalate those having an ethylene terephthalate unit of preferably 90 mol% or more, more preferably 95 mol% or more, particularly preferably 97 mol% or more are used.
- polyethylene 1,6-naphthalate those having a polyethylene 1,2,6-naphthalate unit of preferably 90 mol% or more, more preferably 95 mol% or more, particularly preferably 97 mol% or more may be used.
- the polyester may be a homopolymer or a copolymer obtained by copolymerizing a third component, but a homopolymer is preferred.
- the intrinsic viscosity of the polyester is preferably 0.40 dl_ / g or more, and more preferably 0.40 to 0.90 dlZg. If the intrinsic viscosity is less than 0.40 dLZg, the process may be cut frequently, which is not preferable, and if it exceeds 0.90 d1 Zg, the melt viscosity is high and melt extrusion becomes difficult, and the polymerization time is long and uneconomic. Absent.
- Polyester can be obtained by a conventionally known method. For example, it can be obtained by a method of directly obtaining a low polymerization degree polyester by reaction of dicarboxylic acid and glycol. Also, transesterification reaction of lower alkyl ester of dicarboxylic acid and glycol After the reaction using a catalyst, it can be obtained by a method in which a polymerization reaction is carried out in the presence of a polymerization reaction catalyst.
- the transesterification reaction catalyst conventionally known compounds such as sodium, potassium, magnesium, calcium, zinc, strontium, titanium, zirconium, manganese, and cobalt can be used.
- polymerization reaction catalyst examples include conventionally known catalysts such as antimony compounds such as antimony trioxide and antimony pentoxide, germanium compounds such as germanium dioxide, tetraethyl titanate, tetrapropyl titanate, and tetraphenyl. Titanium compounds such as evening salt or partial hydrolysates thereof, titanyl ammonium oxalate, titanyl potassium oxalate, and titanium trisacetylacetonate can be used.
- antimony compounds such as antimony trioxide and antimony pentoxide
- germanium compounds such as germanium dioxide, tetraethyl titanate, tetrapropyl titanate, and tetraphenyl.
- Titanium compounds such as evening salt or partial hydrolysates thereof, titanyl ammonium oxalate, titanyl potassium oxalate, and titanium trisacetylacetonate can be used.
- phosphorus compounds such as trimethyl phosphate, triethyl phosphate, tri-n-butyl phosphate, and orthophosphoric acid are used for the purpose of deactivating the transesterification catalyst before the polymerization reaction.
- the content in the polyester as the phosphorus element is preferably 20 to 100 ppm from the viewpoint of thermal stability.
- the polyester may be converted into chips after melt polymerization and further solid phase polymerization may be performed under reduced pressure by heating or in an inert gas stream such as nitrogen.
- the polyester film preferably contains substantially no particles. If particles are contained, high transparency may be impaired, or the surface may become rough and it may be difficult to process the transparent conductive layer.
- the haze value of the film is preferably 1.5% or less, more preferably 1.0% or less, and particularly preferably 0.5% or less.
- the polyester film preferably has a light transmittance of 3% or less at a wavelength of 3700 nm and a light transmittance of 40% or more at 40000 nm.
- the light transmittance is a value measured using a spectrophotometer MPC3 100 manufactured by Shimadzu Corporation. This light transmittance can be obtained by using a polyester containing a monomer that absorbs ultraviolet rays, such as 2,6-naphthalenedicarboxylic acid, and by adding an ultraviolet absorber to the polyester.
- UV absorbers examples include 2,2'-p-phenylenediamine (3,1-benzoxazine 4-1one), 2,2,1-p-phenylenebis (6-methyl-3,1) 1,2 '—p-phenylenebis (6—black 1,3—benzoxazine 1,4-one), 2, 2 ′ — (4,4, diphenylene) Cyclic iminoester compounds such as bis (3,1-benzoxazine-4-one) and 2,2'-one (2,6-naphthylene) bis (3,1-benzoxazine-4-one) can be used.
- the polyester film has a three-dimensional centerline average roughness of preferably 0.0001 to 0.02 m on both sides, more preferably 0.0001 to 0.015 m, and particularly preferably 0.0001 to 0.001 xm. It is. In particular, if the three-dimensional centerline average roughness of at least one side is 0.0001 to 0.005, it is preferable because the transparent conductive layer is distorted. The most preferable surface roughness of at least one side is 0. 0005 to 0.04 ⁇ .
- the thickness of the polyester film is preferably 10 to 500 m, more preferably 20 to 400 ⁇ , and particularly preferably 50 to 300 m.
- polyester film is melt-extruded polyester into a film, cooled and solidified with a casting drum to form an unstretched film, and this unstretched film is Tg ⁇ (Tg + 60) ° C once or twice in the longitudinal direction. Stretched so that the total magnification is 3 to 6 times, and then stretched with Tg to (Tg + 60) so that the magnification is 3 to 5 times in the width direction. It can be obtained by heat treatment at ° C for 1 to 60 seconds.
- the longitudinal direction can be increased in the heat treatment process as disclosed in JP-A-57-57628.
- a shrinking method, a method of relaxing heat treatment in a suspended state as disclosed in JP-A-11-275031, and the like can be used.
- transparent conductive layers examples include conductive metal oxides (fluorine-doped tin oxide, indium tin composite oxide (ITO), indium-zinc composite oxide ( ⁇ ⁇ ), metal thin films such as platinum, gold, silver, Using thin films such as copper and aluminum, and carbon materials Can.
- This transparent conductive layer may be a laminate of two or more types or a composite. Of these, ITO and IZO are particularly preferred because of their high light transmittance and low resistance.
- the surface resistance of the transparent conductive layer is preferably not more than 100 ⁇ , more preferably not more than 40 ⁇ . If it exceeds 100 ⁇ , the resistance in the battery becomes too large and the photovoltaic efficiency is lowered, which is not preferable.
- the thickness of the transparent conductive layer is preferably 100 to 500 nm. If it is less than 1 O O n m, the surface resistance cannot be sufficiently lowered, and if it exceeds 500 nm, the light transmittance is lowered and the transparent conductive layer is easily broken, which is not preferable.
- the surface tension of the transparent conductive layer is preferably 4 O mNZm or more, more preferably 65 mNZm or more. If the surface tension is less than 40 mNZm, the adhesion between the transparent conductive layer and the porous semiconductor may be inferior. If the surface tension is 65 mN / m or more, an aqueous coating solution in which the main component of the solvent is water is applied. It is more preferable because the forming power of the porous semiconductor layer is easily formed.
- a transparent conductive layer having the above properties can be obtained by forming a transparent conductive layer using, for example, ITO or IZO and processing it by any of the following methods.
- an easy adhesion layer can be provided between the polyester film and the transparent conductive layer.
- the thickness of the easy-adhesion layer is preferably 10 to 200 nm, and more preferably 20 to 150 nm. If the thickness of the easy-adhesion layer is less than 10 nm, the effect of improving the adhesion is poor, and if it exceeds 200 nm, cohesive failure of the easy-adhesion layer occurs and the adhesion may be lowered. .
- it is preferably provided by coating during the production process of the polyester film, and more preferably applied to the polyester film before orientation crystallization is completed.
- the polyester film before the crystal orientation is completed is an unstretched film, a uniaxially oriented film in which the unstretched film is oriented in either the longitudinal direction or the transverse direction, and further in the two directions of the longitudinal direction and the transverse direction.
- a low-stretch stretched and oriented film (a biaxially stretched film before it is finally re-stretched in the machine direction or the transverse direction to complete oriented crystallization).
- the easy-adhesion layer is made of a material that has excellent adhesion to both the polyester film and the transparent conductive layer.
- polyester resin acrylic resin, urethane acrylic resin, silicone acrylic resin, melamine resin Polysiloxane cocoon can be used. These resins may be used alone or as a mixture of two or more.
- a hard coat layer may be provided between the easy adhesion layer and the transparent conductive layer.
- the thickness of the hard coat layer is preferably 0.01 to 20 m, more preferably 1 to 10 m.
- a hard coat layer When a hard coat layer is provided, it is preferably provided by coating on a polyester film provided with an easy adhesion layer.
- the hard coat layer is preferably made of a material having excellent adhesion in both the easy adhesion layer and the transparent conductive layer.
- an acryl resin, a urethane resin, a silicon resin, a UV curable resin, an epoxy resin These resin components and a mixture of these and inorganic particles can be used.
- the inorganic particles for example, alumina, silica, My power particles can be used.
- an antireflection layer may be provided on the surface opposite to the transparent conductive layer for the purpose of increasing the light transmittance and enhancing the photovoltaic power generation efficiency.
- a method of providing the antireflection layer a method of laminating a material having a refractive index different from the refractive index of the polyester film into a single layer or two or more layers is preferable.
- a single layer structure it is better to use a material having a refractive index smaller than that of the base film.
- the layer adjacent to the laminated film is larger than the polyester film. It is preferable to select a material having a refractive index smaller than this as a material having a refractive index and a layer laminated thereon.
- the material constituting the antireflection layer may be any material that satisfies the above refractive index relationship, regardless of whether it is an organic material or an inorganic material.
- C a F 2 , Mg F 2 , N a A 1 F 4, S i 0 2, T h F 4, Z R_ ⁇ 2, n d 2 0 3, S N_ ⁇ 2, T I_ ⁇ 2, C e, ⁇ 2, Z n S, I n 2 ⁇ Use a dielectric selected from the group consisting of 3 .
- a dry coating method such as a vacuum deposition method, a sputtering method, a CVD method, or an ion plating method can be used.
- a wet coater such as a gravure method, a reverse method, or a die method can be used. Ing method can be used.
- pre-treatment such as corona discharge treatment, plasma treatment, sputtering etching treatment, electron beam irradiation treatment, ultraviolet irradiation treatment, primer treatment, and easy adhesion treatment may be performed.
- a known method can be used. Specifically, for example, it can be created by the following method.
- a dye is adsorbed on the porous semiconductor layer of the laminated film of the present invention.
- Organometallic complex dyes typified by ruthenium bipyridine complexes (ruthenium complexes), cyanine dyes, coumarin dyes, xanthene dyes, porphyrin dyes, etc.
- Dye is dissolved in a solvent such as alcohol or toluene to prepare a dye solution, and the porous semiconductor layer is immersed, or sprayed or applied to the porous semiconductor layer to form one electrode A.
- Electrode A and Electrode B above are overlapped by inserting a thermocompression-resistant polyethylene film frame spacer (thickness 20 m), and part of the spacer is heated to 120. Crimp the. Furthermore, the edge is sealed with an epoxy resin adhesive.
- the average fiber length and the average fiber diameter were calculated in the same manner as the particle diameter of the crystalline titanium oxide fine particles and the fiber diameter of the crystalline titanium oxide fibers, and the ratio was calculated.
- the specific surface area of the obtained metal oxide was measured by the BET method using nitrogen gas.
- the ROTA FLEX RU200B manufactured by Rigaku Denki Co., Ltd. was used, and the reflection method was adopted for the goniometer with a radius of 185 nm.
- the measurement sample is the obtained ceramic A fiber added with high-purity silicon powder for X-ray diffraction standards as an internal standard was used.
- the intensity of the X-ray diffraction profile obtained above was corrected, and the diffraction angle 20 was corrected with the 11 1 1 diffraction peak of the internal standard silicon.
- the half width of the 1 1 1 1 diffraction peak of silicon was 0.15 ° or less.
- the crystallite size was calculated by the following formula of S c HER r err using the diffraction peak appearing around 25.3 °.
- the integral of each diffraction peak derived from rutile titanium oxide The strength IA (analyze phase) and IR (rutile phase) were estimated, and the content ratio was calculated from the following formula.
- Anatase phase content ratio IA / (IA + IR) (7)
- the light transmittance at wavelengths of 370 nm and 400 nm was measured using a spectrophotometer MP C 3100 manufactured by Shimadzu Corporation.
- a small piece of film is embedded in an epoxy resin (Epomount manufactured by Refinetech Co., Ltd.), and sliced to 5 Onm thickness with embedded embedding fat using Reic hert—Jung's Microtome 2050.
- the film thickness was measured with a transmission electron microscope (Topcon LEM-2000) at an acceleration voltage of 100 KV and a magnification of 100,000 times.
- a 100 mm 2 large dye-sensitized solar cell was formed, and the photovoltaic power generation efficiency was calculated by the following method. Simulated sunlight with an incident light intensity of 10 OmWZcm 2 was measured in an atmosphere at a temperature of 25 ° C and a humidity of 50% using Peccell Technologies Inc. Solar Chemillery Yuichi (PEC—L 10). Using a current / voltage measuring device (PECK 2400), By scanning the DC voltage applied to the system at a constant speed of 1 OmVZsec and measuring the photocurrent output from the device, we measured the photocurrent-voltage characteristics and calculated the photovoltaic efficiency.
- Polyethylene-2,6-naphthalenedicarboxylate pellets with an intrinsic viscosity of 0.63 and substantially free of particles are dried at 170 ° C for 6 hours and then fed to an extruder hopper, melting temperature 305 It was melted at, filtered through a stainless steel fine wire filter with an average opening of 17 m, extruded through a 3 mm slit die on a rotating cooling drum at a surface temperature of 60, and rapidly cooled to obtain an unstretched film .
- the unstretched film obtained in this way is preheated at 120, and further heated in the IR direction at 850 ° C from 15 mm above between low-speed and high-speed rolls 3.
- Stretched 1x The following coating agent A was applied on one side of the film after the longitudinal stretching with a roll coater overnight so that the thickness of the coating film after drying was 0.25 m to form an easy-contact layer.
- the obtained biaxially oriented film was heat-fixed at a temperature of 245 for 5 seconds to obtain a polyester film having an intrinsic viscosity of 0.58 dlZg and a thickness of 125 m. The film was then heat relaxed at a temperature of 205 ° C with a relaxation rate of 0.7% in a suspended state.
- 2,6-Naphthadiene dicarboxylate 66 parts Isophthalate dimethyl 47 parts, 5-Sodium sulfoisophthalate dimethyl 8 parts, Ethylene glycol 54 parts, Diethylene glycol 62 parts were charged into the reactor, and tetrabutoxy 0.05 part was added and the temperature was controlled at 23 or: under a nitrogen atmosphere, and the resulting methanol was distilled off to conduct a transesterification reaction. Next, the temperature of the reaction system was gradually raised to 255 ° C, and the inside of the system was depressurized to ImmHg to carry out a polycondensation reaction to obtain a polyester.
- NAROACTY N_70 an aqueous solution containing 0.3% by weight of the trade name NAROACTY N_70 manufactured by Kasei Co., Ltd.
- a coating agent A was prepared by mixing 8 parts by weight of the above-mentioned polyester aqueous dispersion, 7 parts by weight of the aqueous acrylic dispersion, and 85 parts by weight of the aqueous solution.
- a UV curable hard coat agent (Desolite R 7501 manufactured by JSR Corporation) was applied to this easy-contact layer side to a thickness of about 5 m, and UV cured to hard coat layer. Formed.
- the transparent conductive layer surface was subjected to plasma treatment in lmZ minutes under a nitrogen stream (60 LZ minutes). .
- the surface resistance value was 16 ⁇ and the surface tension was 71.5 mNZm.
- Y 2 On the surface opposite to the transparent conductive layer formed surface of the laminated film, Y 2 ⁇ three layers of refractive Oriritsu 1.89 with a thickness 75 nm, a refractive index 2.3 at a thickness 120 nm thereon T I_ ⁇ two layers, further S I_ ⁇ second refractive index 1.46 at a thickness of 90 nm thereon, and a film by respective high-frequency sputtering evening ring method, and a reflection preventing treatment layer.
- both the degree of vacuum was set to 1 X 10- 3 To rr, as the gas A r: 55 sc cm, 0 2: shed 5 sc cm.
- the substrate was kept at room temperature without heating or cooling during the film forming process.
- the solution 2 held in the solution holding tank 3 was jetted from the jet nozzle 1 toward the electrode 4. Meanwhile, a voltage of 15 kV was applied between the electrode 4 and the ejection nozzle 1 by a high voltage generator.
- the obtained fiber structure was heated to 600 ° C. for 10 hours in an air atmosphere using an electric furnace, and then held at 600 ° C. for 2 hours to produce a titania fiber.
- the obtained high-spectrum specific titanium oxide was observed with an electron microscope.
- the fiber diameter was 280 nm, the fiber length / fiber diameter was 50 or more, and the fiber diameter was within the field of view of the scanning electron microscope. Both ends are observed It wasn't.
- the area ratio in the X-ray diffraction of the anatase phase to the anatase phase and the rutile phase was 0.94.
- the anatase crystallite size was 22 nm.
- the BET specific surface area was 0.4 m 2 Z g.
- titanium oxide dispersion SP—200 produced by Showa Taiyumu
- crystalline titanium oxide fine particles titanium oxide content: 25% by weight
- Ethanol Wi-Fi Pure Chemical Industries, Ltd.
- Dispersion solution was prepared, and a dispersion having a solid concentration of 12% by weight was prepared and treated for 30 minutes under ultrasonic irradiation at 40.0 Hz. As a result, a coating liquid for a porous semiconductor layer was obtained.
- This coating solution was immediately applied onto the transparent conductive layer with a barco overnight, and heat treatment was performed in the atmosphere at 180 for 5 minutes to form a porous semiconductor layer having a thickness of 5 m. After the heat treatment, no peeling or brittleness of the porous semiconductor layer was observed, and an electrode of a dye-sensitized solar cell having good adhesion to the substrate was prepared.
- This electrode was immersed in a 30 M ethanol solution of ruthenium complex (Ru 5 35 bis TBA, manufactured by So 1 aronix) for 24 hours to adsorb the ruthenium complex on the surface of the photoactive electrode.
- a counter electrode was prepared by depositing a Pt film on the transparent conductive layer of the laminated film by sputtering. Thermocompression bonding of electrode and counter electrode Using a polyethylene film frame-type spacer (thickness 20 m), superimpose and heat part of the spacer to 120 to crimp both electrodes. Furthermore, the edge portion is sealed with an epoxy resin adhesive. An electrolyte solution (3-methoxypropionitrile solution containing 0.5 M lithium iodide, 0.05 M iodine and 0.5 M tert-butylviridine) was injected, and then sealed with an epoxy adhesive.
- the open-circuit voltage, short-circuit current density, and fill factor were 0.70 V, 8.25 mAZcm 2 , and 0.47, respectively.
- the photovoltaic power generation efficiency was 2.71%.
- Example 2 The same procedure as in Example 1 was used, except that 0.5 parts by weight of titanium tetranormal butoxide (manufactured by Wako Pure Chemical Industries, Ltd., first grade) in producing crystalline titanium oxide fibers was used. Table 1 shows the characteristics of each titanium oxide. Table 2 shows the characteristics of the porous semiconductor layer thus obtained and the battery evaluation results.
- Example 2 The same method as in Example 1 was used except for the preparation of crystalline titanium oxide fibers and formation of a porous semiconductor layer.
- Crystalline titanium oxide fiber (8.1 g Zm 2 ) in the above-mentioned non-woven fabric, titanium oxide dispersion SP—200 (produced by Showa Taiyumu Co., Ltd.) as crystalline titanium oxide fine particles (content of titanium oxide: 25 5 Transparent electrode so that 1% by weight of the anatase phase and some rutile phase) is 43.5% by weight in the total titanium oxide weight and 13% by weight in the total titanium oxide weight.
- a porous semiconductor layer was formed so as to have a thickness of 5 m by coating on the layer and subjecting to a heat treatment in the atmosphere at 1880 for 5 minutes. After the heat treatment, no peeling or brittleness of the porous semiconductor layer was observed, and an electrode of a dye-sensitized solar cell having good adhesion to the substrate was prepared. Table 2 shows the characteristics of the crystalline titanium oxide fiber thus obtained.
- a dye-sensitized solar cell was prepared in the same manner as in Example 1 using the porous semiconductor thus obtained.
- the battery performance evaluation results are shown in Table 2.
- a porous semiconductor layer was prepared in the same manner as in Example 1 except that the production of crystalline titanium oxide fibers was the same as in Example 4.
- the characteristics of each crystalline titanium oxide are as shown in Table 1.
- the characteristics of the porous semiconductor layer are as shown in Table 2.
- a dye-sensitized solar cell was prepared in the same manner as in Example 1 using the porous semiconductor thus obtained.
- the battery performance evaluation results are shown in Table 2.
- Example 1 except that the crystalline titanium oxide fine particles are not added during the formation of the porous semiconductor layer A porous semiconductor layer was obtained using the same method as described above, and a dye-sensitized solar cell using this was evaluated. By not adding fine particles, the short circuit current was reduced and the photoelectric conversion efficiency was reduced. Comparative Example 2
- a porous semiconductor layer was obtained using the same method as in Example 5 except that the crystalline titanium oxide fine particles were not added at the time of forming the porous semiconductor layer, and a dye-sensitized solar cell using this was evaluated. The results are shown in Table 2.
- a porous semiconductor layer was obtained using the same method as in Example 1 except that the crystalline titanium oxide fiber was not added at the time of forming the porous semiconductor layer, but peeling was partially confirmed. A dye-sensitized solar cell using this was evaluated. The results are shown in Table 2.
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AU2006346135A AU2006346135B2 (en) | 2006-07-13 | 2006-07-13 | Dye-sensitized solar cell, and electrode and laminated film therefor |
PCT/JP2006/314320 WO2008007448A1 (en) | 2006-07-13 | 2006-07-13 | Dye-sensitized solar cell, and electrode and laminated film therefor |
US12/373,027 US8835755B2 (en) | 2006-07-13 | 2006-07-13 | Dye-sensitized solar cell, and electrode and laminated film for the same |
EP06781287.5A EP2045868B1 (en) | 2006-07-13 | 2006-07-13 | Dye-sensitized solar cell, and electrode and laminated film therefor |
JP2006540060A JPWO2008007448A1 (ja) | 2006-07-13 | 2006-07-13 | 色素増感太陽電池およびそのための電極と積層フィルム |
CN2006800553319A CN101485035B (zh) | 2006-07-13 | 2006-07-13 | 染料敏化太阳能电池以及用于该电池的电极和层压薄膜 |
KR1020087029530A KR101257541B1 (ko) | 2006-07-13 | 2006-07-13 | 색소 증감 태양 전지 및 그것을 위한 전극과 적층 필름 |
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JP2008186659A (ja) * | 2007-01-29 | 2008-08-14 | Teijin Dupont Films Japan Ltd | 色素増感型太陽電池用電極 |
JP2009037779A (ja) * | 2007-07-31 | 2009-02-19 | Seiko Epson Corp | 光電変換素子、電子輸送層の製造方法、光電変換素子の製造方法および電子機器 |
US20110011459A1 (en) * | 2008-03-07 | 2011-01-20 | The University Of Tokyo | Hybrid and/or complex material, photoelectric conversion material, dye-sensitized solar cell, dye-sensitized solar cell device, manufacturing method of photoelectric conversion device, and method of analyzing titanium oxide crystal structure |
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KR100997843B1 (ko) | 2008-08-29 | 2010-12-01 | 주식회사 솔켐 | 전기방사법에 의해 제조된 고분자 전해질을 포함한 염료감응형 태양전지 소자 및 이의 제조방법 |
CN101894688B (zh) * | 2010-06-30 | 2011-10-05 | 彩虹集团公司 | 一种低温制备染料敏化太阳能电池电极的方法 |
TWI455334B (zh) * | 2011-06-01 | 2014-10-01 | Taiwan Textile Res Inst | 用於染料敏化太陽能電池之光陽極的製造方法 |
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TWI502792B (zh) * | 2012-12-27 | 2015-10-01 | Eternal Materials Co Ltd | 薄膜電極及其製法 |
CN104282442B (zh) * | 2014-10-17 | 2017-09-29 | 华中科技大学 | 一种染料敏化太阳能电池光阴极及其制备方法和应用 |
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AU2006346135B2 (en) | 2011-11-03 |
US8835755B2 (en) | 2014-09-16 |
EP2045868A1 (en) | 2009-04-08 |
EP2045868B1 (en) | 2015-12-02 |
EP2045868A4 (en) | 2014-08-13 |
KR20090031509A (ko) | 2009-03-26 |
CN101485035B (zh) | 2011-04-27 |
AU2006346135A1 (en) | 2008-01-17 |
US20100006150A1 (en) | 2010-01-14 |
CN101485035A (zh) | 2009-07-15 |
KR101257541B1 (ko) | 2013-04-23 |
JPWO2008007448A1 (ja) | 2009-12-10 |
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