WO2007105455A1 - ステージ装置 - Google Patents
ステージ装置 Download PDFInfo
- Publication number
- WO2007105455A1 WO2007105455A1 PCT/JP2007/053354 JP2007053354W WO2007105455A1 WO 2007105455 A1 WO2007105455 A1 WO 2007105455A1 JP 2007053354 W JP2007053354 W JP 2007053354W WO 2007105455 A1 WO2007105455 A1 WO 2007105455A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gantry
- guide
- substrate
- frame
- stage apparatus
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
- B23Q1/01—Frames, beds, pillars or like members; Arrangement of ways
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/682—Mask-wafer alignment
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70791—Large workpieces, e.g. glass substrates for flat panel displays or solar panels
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70975—Assembly, maintenance, transport or storage of apparatus
Definitions
- the present invention relates to a gantry moving stage device, and more specifically, for example, application of various base materials such as a sealant, a liquid crystal material, and a spacer-containing resin to a glass substrate for a liquid crystal panel, Alternatively, the present invention relates to a stage apparatus used for surface inspection using a camera or surface level difference measurement.
- a gantry moving type stage device is used in which a discharge nozzle for discharging a paste material or a camera is moved along two in-plane directions of a glass substrate (for example, see Patent Document 1 below).
- FIG. 9 is a plan view showing a schematic configuration of this type of conventional stage apparatus.
- the conventional stage apparatus 1 shown in the figure includes a mounting table 2 that supports a substrate to be processed in the XY plane, a pair of guide frames 3X that are installed so as to sandwich the mounting table 2, and extend in the X-axis direction.
- a gantry 3Y extending between a pair of guide frames and a substrate processing unit 4 provided in the gantry 3Y are provided.
- the gantry 3Y is attached to the guide frames 3X, 3X so as to be movable along the upper surfaces of the guide frames 3X, 3X.
- Substrate processing unit 4 is a discharge nozzle that discharges various paste materials such as sealants, liquid crystal materials, and spacer-containing grease1, and is composed of a camera unit that observes the substrate surface. Attached movably along the bottom surface of the gantry 3Y. The gantry 3Y and the substrate processing unit 4 are moved along the guide frame 3X and the gantry 3Y, respectively, by a drive source such as a linear motor.
- the substrate processing unit 4 is fed and moved so as to face the surface of the substrate to be processed supported on the mounting table 2. Processing substrate The above-mentioned various paste materials are applied to the surface or surface properties are photographed. Then, by moving the substrate processing unit 4 in the X-axis and Y-axis directions, a predetermined processing operation on the entire substrate to be processed by the substrate processing unit 4 is performed intermittently or continuously.
- the guide frame 3X is necessary for substrate processing in order to carry in / out a substrate to be processed with respect to the mounting table 2 or to maintain and inspect the substrate processing unit 4.
- a non-work area R2 for retracting the gantry 3Y from the position directly above the mounting table 2 is provided. That is, the guide frame 3X in the conventional stage apparatus 1 has a length that can form the work area R1 and the non-work area R2.
- Patent Document 1 Japanese Patent No. 3701882
- Patent Document 2 Japanese Patent Laid-Open No. 2006-12911
- the stage apparatus becomes larger, there is a problem that the stage apparatus cannot be transported.
- the stage device is required to have a short side of 3500mm or larger. .
- the present invention has been made in view of the above-described problems, and an object thereof is to provide a stage device that can be divided so as to be able to be transported by land and can ensure proper processing for a substrate to be processed.
- the stage apparatus of the present invention includes a substrate support surface that supports a substrate to be processed, a pair of guide frames that are disposed to face each other with the substrate support surface interposed therebetween, and the pair of guides
- a stage apparatus comprising: a gantry extending between frames and supported movably with respect to the pair of guide frames; and a substrate processing unit installed in the gantry.
- the guide frame includes the substrate processing unit.
- a main frame part that forms a moving path of the gantry required for substrate processing by the substrate, and a moving path to a non-working position of the gantry that is connected to one or both ends in the length direction of the main frame part. It consists of a combination with the subframe part to be formed.
- the guide frame force for guiding the movement of the gantry has a divided structure of the main frame portion and the sub frame portion. It can be as short as possible.
- the guide frame division position does not exist on the work area of the gantry, it is possible to ensure an appropriate process for the substrate to be processed without the vibration or movement speed changing in the gantry. .
- the stage apparatus of the present invention it is sufficient if at least the area that forms the movement path of the gantry required for substrate processing is secured with a high level of movement feed accuracy. For this reason, the gantry's moving feed accuracy is designed to be higher than that of the main frame portion force subframe portion. As a result, it is not necessary to manufacture the entire guide frame with high accuracy, so that it is possible to reduce the manufacturing cost and installation work burden of the guide frame.
- a linear guide for guiding the straight movement of the gantry is laid on the guide frame, and the linear guide is spliced at a position different from the division position of the guide frame.
- a substrate to be processed is installed, and the gantry has a substrate to be processed.
- a first guide portion including a portion to be guided when moving on the plate, a second guide portion including a portion to be guided when the gantry moves on the substrate to be processed, and a substrate to be processed including the first guide portion.
- the first and second guide portions correspond to, for example, linear guides that guide the gantry to move straight forward.
- the first and second guide portions can be installed in pairs on the first and second frame portions, respectively.
- the stage device can be shortened to a length that allows land transportation.
- the guide frame is not divided on the work area of the gantry, it is possible to maintain an appropriate process on the substrate to be processed without the occurrence of vibration or movement speed change in the gantry.
- FIG. 1 is a schematic configuration diagram of a stage apparatus according to an embodiment of the present invention, in which A is an overall perspective view showing a state after assembly, and B is an overall perspective view showing a state before assembly.
- FIG. 2 is a cross-sectional view of a stage device according to an embodiment of the present invention when viewed in the X-axis direction
- FIG. 3 is a cross-sectional perspective view showing a schematic configuration of a movable part of the stage apparatus according to the embodiment of the present invention.
- FIG. 4 is a side view of the main part of the guide frame of the stage apparatus according to the embodiment of the present invention.
- FIG. 5 is a side view of the main part of the guide frame of the stage apparatus according to the embodiment of the present invention.
- FIG. 6 is a side view of an essential part showing a modification of the guide frame of the stage apparatus according to the embodiment of the present invention.
- FIG. 7 is a schematic plan view showing a modification of the stage apparatus according to the embodiment of the present invention.
- FIG. 8 is a schematic perspective view showing a modification of the stage apparatus according to the embodiment of the present invention.
- FIG. 9 is a schematic plan view showing a configuration of a conventional stage apparatus.
- FIG. 1A and 1B are general perspective views showing a schematic configuration of a stage apparatus 11 according to an embodiment of the present invention.
- A shows a state after assembly
- B shows a state before assembly.
- FIG. 2 is a cross-sectional view of the stage apparatus 11 when the X-axis direction force is also viewed.
- the stage apparatus 11 of the present embodiment includes a mounting table 12 that supports a substrate W to be processed such as a glass substrate, and a pair of guide frames that are installed so as to sandwich the mounting table 12 and extend in the X-axis direction. 13X, 13X and a pair of guide frames 13X, 13X And the substrate processing unit 14 provided on the gantry 13 side.
- the mounting table 12 has a substrate support surface that supports the substrate W to be processed within the surface.
- the mounting table 12 is installed on a gantry 16 for arranging a pair of guide frames 13X and 13X facing each other in parallel with each other at a predetermined interval.
- the pair of guide frames 13X and 13X are fixed integrally with each other via a mount 16.
- the mounting table 20 includes a mechanism for holding the substrate W to be processed on the substrate support surface by, for example, vacuum suction.
- the mounting table 12 is not shown. Also, a part of the gantry 16 may constitute the substrate support surface.
- the gantry 13Y extends in a direction intersecting with the extending direction (X-axis direction) of the guide frames 13X and 13X, particularly in the direction orthogonal to the guide frame 13X (X-axis direction). Both leg portions of the gantry 13Y are supported by the guide frames 13X and 13X through the movable portion 20 so as to be movable along the upper surfaces of the guide frames 13X and 13X.
- the substrate processing unit 14 is a discharge nozzle that discharges various paste materials such as a sealant, a liquid crystal material, and a spacer-containing resin onto the surface of the substrate W to be processed supported on the mounting table 12. Consists of a camera unit that observes the substrate surface.
- the substrate processing unit 14 is supported movably along the lower surface of the gantry 13 13 with respect to the gantry 13 ⁇ .
- FIG. 3 shows an example of the structure of the movable part 20 installed between the guide frames 13 and 13 and the gantry 13. The following configuration is similarly applied between the gantry 13Y and the substrate processing unit 14.
- the movable part 20 includes a linear guide 17, a magnet 18, and an armature coil 19.
- the linear guide 17 includes a pair of guide shafts 17a and 17a laid on the upper surface of the guide frame 13X, and a pair of guide bearings 17b and 17b installed on the lower surface of the leg portion of the gantry 13Y.
- the magnet 18 is linearly installed between the pair of guide shafts 17a and 17a on the upper surface of the guide frame 13X.
- the armature coil 19 is attached to the lower surface of the leg portion of the gantry 13Y so as to face the magnet 18 with a gap. These magnet 18 and armature coil 19 constitute a linear motor.
- the movable unit 20 is further provided with a position detection sensor 21 for detecting the relative position of the gantry 13Y with respect to the guide frame 13X.
- the position detection sensor 21 detects the position of the gantry 13Y by optically detecting the linear scale 22 installed on the side surface of the guide frame 13X.
- the stage apparatus 11 includes a control unit that controls the movement of the gantry 13Y and the substrate processing unit 14 in response to the detection output of the position detection sensor having the above-described configuration. Omitted.
- the substrate processing unit 14 can be disposed opposite to the entire surface of the substrate in two directions in the XY plane.
- the stage apparatus 11 continuously performs a predetermined substrate processing operation on the substrate W to be processed by the substrate processing unit 14 (in this example, coating treatment or surface inspection of a sealing agent, a liquid crystal material, and a spacer-containing resin).
- it is configured as an XY stage that can be performed intermittently.
- the stage device 11 of the present embodiment the main frame portion (first frame portion) 15A and the sub-frame portion (second frame portion) divided in the extending direction of the guide frames 13X and 13X. Consists of a combination with 15B. Therefore, as shown in FIG. 1B, the stage device 11 can be divided between the guide frame 13X, 13X force main frame portion 15A and the sub-frame portion 15B. In this case, the substrate to be processed W is placed on the main frame 15A side.
- the stage device 11 can be transported in two parts in the X-axis direction. For example, even if the stage device 11 has a size of 5500 mm or more in the X-axis direction and 4500 mm or more in the Y-axis direction, the stage device 11 can be divided into two parts in the X-axis direction. It is possible to keep the length dimension in the X-axis direction within 3500 mm for each divided component unit. As a result, restrictions based on road conditions and the like are eliminated, and the stage device 11 can be transported by land.
- the dividing positions of the guide frames 13X and 13X that is, the boundary line D between the main frame portion 15A and the subframe portion 15B is the substrate processing on the guide frames 13X and 13X. It is set at a boundary position between a work area R1 that defines a moving path of the gantry 13Y that requires substrate processing by the unit 14 and a non-work area R2 that also retracts the gantry 13Y directly above the mounting table 12.
- the non-working area R2 defines a non-operating position that is a retracted position of the gantry 13Y during loading / unloading of the substrate W to / from the mounting table 12, maintenance / inspection of the substrate processing unit 14, and the like.
- the main frame portion 15A forms a moving path of the gantry 13Y required for substrate processing by the substrate processing unit 14.
- the subframe portion 15B is connected to one end side in the longitudinal direction of the main frame portion 15A, and forms a movement path to the non-working position of the gantry 13Y.
- the boundary D between the main frame portion 15A and the subframe portion 15B constituting the guide frames 13X and 13X is defined as the work area R1 and the non-work area R2 of the gantry 13Y on the guide frames 13X and 13X.
- a gantry moving stage device requires high-accuracy moving feed control of the gantry during substrate processing.
- the working area R1 of the gantry 13 Y It is only necessary to design the main frame portion 15A that delimits the structure so as to obtain a predetermined high level of moving feed accuracy. Accordingly, since the subframe portion 15B does not require strict moving feed accuracy compared to the main frame portion 15A, the manufacturing cost of the entire stage apparatus 11 can be reduced.
- the moving feed accuracy of the gantry 13Y requires the rigidity and flatness of the moving surface of the gantry 13Y, the constant velocity mobility of the gantry 13Y, etc.
- the guide frame has Highly accurate materials such as granite (dalanite) and marble such as marble and hard ceramics such as SiC are used.
- the main frame portion 15A can be made of such a material
- the subframe portion 15B can be made of a relatively inexpensive material to the extent that a certain moving feed accuracy can be obtained. It's a bit like making it.
- the gantry 13Y can be transported in the assembled state on the main frame 15A, so that the threading work of the movable part 20 at the site can be omitted.
- the installation workability of the device 11 can be improved.
- the stage device 11 can be shipped in a state in which the high assembly accuracy of the gantry 13Y with respect to the main frame portion 15A is ensured.
- the linear guide 17 that guides the movement of the gantry 13Y on the guide frame 13X is also divided in the same manner as the guide frames 13X and 13X.
- the guide frames 13X and 13X are divided.
- the linear guide 17 is spliced at a position different from the position.
- FIG. 4 is a side view showing the division position of the guide frame 13X.
- the guide frame 13X is configured by coupling the main frame portion 15A and the subframe portion 15B, and guide shafts (first and second guide portions) 17al and 17a2 of the linear guide 17 are arranged on the upper surfaces of the frame portions 15A and 15B. Each is laid.
- the first guide portion 17al is configured to include a portion (work area R1) that guides when the gantry 13Y moves on the substrate W to be processed.
- the second guide portion 17a2 is a portion that guides when the gantry 13Y moves on the substrate W to be processed. It is configured to include.
- the first and second guide portions 17al and 17a2 are laid on the same axis, and the joint d is set at a position different from the division position (boundary D) of the guide frame 13X. That is, as shown in FIG. 4, the first guide portion 17a 1 protrudes to the subframe portion 15b side from the main frame portion 15A, and the protruding first guide portion 17al portion is fixed on the subframe portion 15B. ing. The second guide portion 17a2 is joined to the protruding end of the first guide portion 17al on the subframe 15B, thereby constituting a continuous guide shaft 17a.
- the first and second guide portions 17al and 17a2 are fixed to the assembled guide frame 13X using the screw member 23 after the main frame portion 15A and the subframe portion 15B are connected.
- the linear scale 22 necessary for detecting the position of the gantry 13Y is also divided from the guide frame 13X. That is, as schematically shown in FIG. 5, the linear scale 22 is divided into a first scale 22a installed in the main frame portion 15A and a second scale 22b installed in the subframe portion 15B. . With this configuration, since accuracy deterioration due to thermal expansion does not occur when a long linear scale is used, the moving feed accuracy of the gantry 13Y can be improved.
- linear scale detectors for detecting the first and second scales 22a and 22b are arranged on the gantry 13Y in the traveling direction.
- the linear scale detection unit may be provided with two or more of the position detection sensors 21 described above, or one position detection sensor. Two detectors (elements) may be arranged side by side in the sensor 21. These detection units are arranged at a larger interval than the installation interval of the scales 22a and 22b, thereby enabling position detection across the scales 22a and 22b.
- one of the linear scale detectors detects the first scale 22a and the other detects the second scale 22b when passing through the connecting part of the gantry 13Y cane frame part 15A and the subframe part 15B.
- position correction at the frame connection is performed.
- the position of the one detection unit is obtained by calculation based on the other detection output and the arrangement interval between these detection units. This makes it possible to detect the position of the gantry 13Y with high accuracy even when the scales 22a and 22b are installed separately, and eliminates the need for high accuracy in the installation intervals of the scales 22a and 22b, thereby improving workability. Can do.
- the number of installed linear scale detectors is not limited to two, and the number may be increased. Further, the division position of the linear scale is not limited to the connection position of each frame portion.
- FIG. 6 shows an example in which the contact surfaces of the main frame portion 15A and the subframe portion 15B are formed obliquely with respect to the traveling direction of the gantry 13Y.
- the guide frames 13X and 13X of the stage device 11 are divided into two parts. As schematically shown in Fig. 7, the guide frames 13X and 13X may be made into a three parts structure. Is possible. In this example, a configuration in which the subframes 15B are connected to both ends of the main frame portion 15A is shown.
- FIG. 8 shows the configuration of a stage apparatus in which main frame portions 15A and subframe portions 15B are alternately connected. With this configuration, a plurality of substrates to be processed W can be processed in parallel on the same stage apparatus.
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Sustainable Development (AREA)
- Public Health (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Optics & Photonics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
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Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008505031A JPWO2007105455A1 (ja) | 2006-02-28 | 2007-02-23 | ステージ装置 |
US11/989,670 US20090173278A1 (en) | 2006-02-28 | 2007-02-23 | Stage apparatus |
KR1020077028589A KR100931590B1 (ko) | 2006-02-28 | 2007-02-23 | 스테이지 장치 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-051769 | 2006-02-28 | ||
JP2006051769 | 2006-02-28 |
Publications (1)
Publication Number | Publication Date |
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WO2007105455A1 true WO2007105455A1 (ja) | 2007-09-20 |
Family
ID=38509292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/053354 WO2007105455A1 (ja) | 2006-02-28 | 2007-02-23 | ステージ装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20090173278A1 (ja) |
JP (1) | JPWO2007105455A1 (ja) |
KR (1) | KR100931590B1 (ja) |
CN (1) | CN100590836C (ja) |
TW (1) | TW200737399A (ja) |
WO (1) | WO2007105455A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009147298A (ja) * | 2008-09-24 | 2009-07-02 | Sumitomo Heavy Ind Ltd | ステージ装置 |
WO2009142133A1 (ja) * | 2008-05-19 | 2009-11-26 | 株式会社アルバック | ステージ |
JP2009279470A (ja) * | 2008-05-19 | 2009-12-03 | Ulvac Japan Ltd | ステージ |
WO2011059003A1 (ja) * | 2009-11-10 | 2011-05-19 | 株式会社アルバック | 検査装置 |
JP2019089316A (ja) * | 2017-11-10 | 2019-06-13 | パナソニックIpマネジメント株式会社 | 搬送ステージとそれを使用したインクジェット装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100969554B1 (ko) * | 2006-03-06 | 2010-07-12 | 가부시키가이샤 알박 | 스테이지 장치 |
KR101203982B1 (ko) * | 2007-08-28 | 2012-11-23 | 울박, 인크 | 스테이지 장치 조립 방법 |
KR101645718B1 (ko) * | 2014-04-02 | 2016-08-05 | 주식회사 남선기공 | 로드셀을 이용한 동기이송 오차 제어기능을 가지는 문형 기계장치 |
WO2023100395A1 (ja) * | 2021-12-01 | 2023-06-08 | 株式会社片岡製作所 | 光学機器用ステージ装置 |
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JPH07124831A (ja) * | 1993-06-11 | 1995-05-16 | Mori Seiki Co Ltd | リニアガイド装置 |
JP3701882B2 (ja) * | 2001-05-25 | 2005-10-05 | 株式会社 日立インダストリイズ | ペースト塗布機 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100600860B1 (ko) * | 2004-05-20 | 2006-07-14 | (주)브레인유니온시스템 | 액상형 물질 도포기의 승강 장치 |
US7939003B2 (en) * | 2004-08-11 | 2011-05-10 | Cornell Research Foundation, Inc. | Modular fabrication systems and methods |
US20060130767A1 (en) * | 2004-12-22 | 2006-06-22 | Applied Materials, Inc. | Purged vacuum chuck with proximity pins |
JP4664117B2 (ja) * | 2005-03-03 | 2011-04-06 | 住友重機械工業株式会社 | 搬送物浮上ユニット、搬送物浮上装置、及びステージ装置 |
JP4553376B2 (ja) * | 2005-07-19 | 2010-09-29 | 東京エレクトロン株式会社 | 浮上式基板搬送処理装置及び浮上式基板搬送処理方法 |
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2007
- 2007-02-23 WO PCT/JP2007/053354 patent/WO2007105455A1/ja active Application Filing
- 2007-02-23 JP JP2008505031A patent/JPWO2007105455A1/ja active Pending
- 2007-02-23 US US11/989,670 patent/US20090173278A1/en not_active Abandoned
- 2007-02-23 CN CN200780000636A patent/CN100590836C/zh active Active
- 2007-02-23 KR KR1020077028589A patent/KR100931590B1/ko active IP Right Grant
- 2007-02-27 TW TW096106638A patent/TW200737399A/zh not_active IP Right Cessation
Patent Citations (2)
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---|---|---|---|---|
JPH07124831A (ja) * | 1993-06-11 | 1995-05-16 | Mori Seiki Co Ltd | リニアガイド装置 |
JP3701882B2 (ja) * | 2001-05-25 | 2005-10-05 | 株式会社 日立インダストリイズ | ペースト塗布機 |
Cited By (8)
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WO2009142133A1 (ja) * | 2008-05-19 | 2009-11-26 | 株式会社アルバック | ステージ |
JP2009279470A (ja) * | 2008-05-19 | 2009-12-03 | Ulvac Japan Ltd | ステージ |
CN102037552B (zh) * | 2008-05-19 | 2013-01-23 | 株式会社爱发科 | 平台 |
US8783674B2 (en) | 2008-05-19 | 2014-07-22 | Ulvac, Inc. | Stage |
JP2009147298A (ja) * | 2008-09-24 | 2009-07-02 | Sumitomo Heavy Ind Ltd | ステージ装置 |
WO2011059003A1 (ja) * | 2009-11-10 | 2011-05-19 | 株式会社アルバック | 検査装置 |
JPWO2011059003A1 (ja) * | 2009-11-10 | 2013-04-04 | 株式会社アルバック | 検査装置 |
JP2019089316A (ja) * | 2017-11-10 | 2019-06-13 | パナソニックIpマネジメント株式会社 | 搬送ステージとそれを使用したインクジェット装置 |
Also Published As
Publication number | Publication date |
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CN101326626A (zh) | 2008-12-17 |
KR20080014836A (ko) | 2008-02-14 |
JPWO2007105455A1 (ja) | 2009-07-30 |
KR100931590B1 (ko) | 2009-12-14 |
TW200737399A (en) | 2007-10-01 |
CN100590836C (zh) | 2010-02-17 |
US20090173278A1 (en) | 2009-07-09 |
TWI347649B (ja) | 2011-08-21 |
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