WO2006046399A1 - 振幅可変ドライバ回路、及び試験装置 - Google Patents
振幅可変ドライバ回路、及び試験装置 Download PDFInfo
- Publication number
- WO2006046399A1 WO2006046399A1 PCT/JP2005/018711 JP2005018711W WO2006046399A1 WO 2006046399 A1 WO2006046399 A1 WO 2006046399A1 JP 2005018711 W JP2005018711 W JP 2005018711W WO 2006046399 A1 WO2006046399 A1 WO 2006046399A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- amplitude
- differential amplifiers
- driver circuit
- signal
- output signal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/68—Combinations of amplifiers, e.g. multi-channel amplifiers for stereophonics
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/4508—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
- H03F3/45085—Long tailed pairs
- H03F3/45089—Non-folded cascode stages
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G1/00—Details of arrangements for controlling amplification
- H03G1/0005—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal
- H03G1/0017—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal the device being at least one of the amplifying solid state elements of the amplifier
- H03G1/0023—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal the device being at least one of the amplifying solid state elements of the amplifier in emitter-coupled or cascode amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G1/00—Details of arrangements for controlling amplification
- H03G1/0005—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal
- H03G1/0088—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal using discontinuously variable devices, e.g. switch-operated
Definitions
- the present invention relates to a variable amplitude driver circuit that outputs an output signal corresponding to an input signal, and a test apparatus that includes a variable amplitude driver circuit.
- the present invention relates to a variable amplitude driver circuit that outputs an output signal in which the amplitude of an input signal is changed.
- a circuit using a differential amplifier is known as a circuit for changing the amplitude of an input signal and outputting it.
- Such a circuit controls the amount of current flowing through the differential amplifier, and generates and outputs a potential of an output signal corresponding to the amount of current by a resistor provided in series with the differential amplifier.
- the transition frequency of the transistor depends on the current flowing through the transistor, the transition frequency is different between the large amplitude output and the small amplitude output.
- a transistor that can obtain the optimum transition frequency at the time of large amplitude output is selected, but in such a case, the transition frequency at the time of small amplitude output becomes small, and sufficient switching characteristics are obtained. In other words, the high-frequency waveform deteriorates.
- an object of the present invention is to provide a variable amplitude driver circuit and a test apparatus that can solve the above-described problems. This object is achieved by a combination of features described in the independent claims.
- the dependent claims define further advantageous specific examples of the present invention.
- variable amplitude driver circuit that outputs an output signal obtained by amplifying a given input signal, and the signal corresponding to the input signal is A plurality of differential amplifiers that are input in parallel to each other and that are input in parallel to each other, and a plurality of differential amplifiers that are provided in series, generate the potential of the output signal according to the total current flowing through the plurality of differential amplifiers.
- a variable amplitude driver circuit including a resistance section and an amplitude control transistor that is provided in series with a plurality of differential amplifiers and determines a total amount of current flowing through the plurality of differential amplifiers.
- variable amplitude driver circuit may further include an amplitude control unit that controls a total amount of current determined by the amplitude control transistor according to the amplitude of the output signal to be output.
- a drive control unit is further provided for controlling the current flowing through each differential amplifier based on the amplitude of the output signal to be output.
- the amplitude variable driver circuit is provided in a plurality corresponding to the plurality of differential amplifiers, and further includes a plurality of individual current control transistors provided in series with the corresponding differential amplifiers.
- the amount of current flowing through the differential amplifier corresponding to the individual current control transistor may be controlled by controlling the voltage applied to the base terminal of the individual current control transistor.
- the drive control unit may drive the number of differential amplifiers according to the amplitude of the output signal to be output. In addition, the drive control unit may control substantially the same current flowing through each driven differential amplifier.
- the variable amplitude driver circuit may further include a pre-driver circuit that controls the amplitude of the signal input to each base terminal of the plurality of differential amplifiers according to the amplitude of the output signal to be output. Further, a potential fixing transistor that is provided between the resistor portion and the plurality of differential amplifiers and that applies a constant voltage to the base terminal may be further provided.
- a test apparatus for testing an electronic device a pattern generation unit that generates a test pattern for testing the electronic device, and an input to the electronic device based on the test pattern
- the waveform shaping unit that generates the input signal to be processed, the variable amplitude driver circuit that inputs the output signal obtained by amplifying the input signal to the electronic device, the signal output from the electronic device, and the expected value signal that is given are compared.
- the variable amplitude driver circuit includes a plurality of differential units provided in parallel with each other, and a signal corresponding to the input signal is input to each base terminal.
- An amplifier a resistor provided in series with a plurality of differential amplifiers, a resistor that generates a potential of an output signal according to the total current flowing through the plurality of differential amplifiers, and a plurality of differential amplifiers Providing a test device having an amplitude control transistor for determining the total amount of current flowing through the plurality of differential amplifiers.
- FIG. 1 is a diagram showing an example of the configuration of a test apparatus 200 according to an embodiment of the present invention.
- FIG. 2 is a diagram showing an example of the configuration of an amplitude variable driver circuit 100.
- FIG. 3 is a diagram showing an example of the operation of the variable amplitude driver circuit 100 described in FIG.
- FIG. 4 is a diagram showing another example of the configuration of the variable amplitude driver circuit 100.
- FIG. 4 is a diagram showing another example of the configuration of the variable amplitude driver circuit 100.
- FIG. 5 is a diagram showing an example of the operation of the variable amplitude driver circuit 100 described in FIG. 4.
- 5A is a diagram illustrating an example of the operation of the pre-driver circuit 118
- FIG. 5B is a diagram illustrating an example of the operation of each differential amplifier 106.
- FIG. 1 is a diagram showing an example of the configuration of a test apparatus 200 according to an embodiment of the present invention.
- the test apparatus 200 is an apparatus for testing an electronic device 300 such as a semiconductor circuit, and includes a pattern generation unit 210, a waveform shaping unit 220, a timing generation unit 230, and an amplitude variable driver circuit 100.
- the pattern generator 210 generates a test pattern for testing the electronic device 300.
- the test pattern is a digital signal represented by a 1Z0 pattern, for example.
- the wave forming section 220 generates an input signal to be input to the electronic device 300 based on the test pattern. For example, an input signal that takes a voltage value corresponding to the test pattern is generated at each given timing.
- the timing generator 230 generates a timing clock having a desired frequency, and the waveform shaping unit 2
- the waveform shaping unit 220 generates a voltage corresponding to the test pattern according to the norse of the timing clock.
- the variable amplitude driver circuit 100 inputs an output signal corresponding to the input signal to the electronic device 300.
- the variable amplitude driver circuit 100 converts the amplitude of an input signal to an electronic device 3
- An output signal is generated by changing the amplitude according to the 00 specification.
- the determination unit 240 determines whether the electronic device 300 is good or bad by comparing a signal output from the electronic device 300 with a given expected value signal.
- the expected value signal is generated by the pattern generator 210 based on the test pattern.
- FIG. 2 is a diagram illustrating an example of the configuration of the variable amplitude driver circuit 100.
- the variable amplitude driver circuit 100 is a circuit that generates an output signal corresponding to an input signal.
- 102 potential-fixed transistors
- 103 potential-fixed transistors
- a plurality of differential amplifiers 106-1, 106-2,..., Hereinafter referred to as 106
- pre-driver circuit 118 drive controller 120
- amplitude controller 122 amplitude controller 122
- individual current control transistors 112-1, 112-2,..., Hereinafter collectively referred to as 112
- an amplitude control transistor 114 and a resistor 116.
- Each differential amplifier 106 includes transistors 108 and 110 provided in parallel, and a signal corresponding to an input signal is input to the base terminal of each transistor.
- the resistance unit 102 is provided in series with a plurality of differential amplifiers 106. In other words, each differential amplifier 106 is provided in series, and the resistor section 102-1 is connected to the collector terminal of the transistor 108 of each differential amplifier 106, and the resistor section 102-2 is It is connected to the collector terminal of the transistor 110 of each differential amplifier 106.
- the resistance unit 102 generates the potential of the output signal (Voutl, Vout2) according to the total current flowing through the plurality of differential amplifiers 106.
- the amplitude control transistor 114 is provided in series with each of the plurality of differential amplifiers 106, and defines the total amount of current flowing through the plurality of differential amplifiers 106. That is, the amplitude of the output signal is determined according to the voltage value applied to the base terminal of the amplitude control transistor 114. In this example, the amplitude control transistor 114 is connected to the emitter terminal of each differential amplifier 106 and grounded via the resistor 116.
- the amplitude controller 122 controls the total amount of current determined by the amplitude control transistor 114 in accordance with the amplitude of the output signal to be output. That is, the voltage value applied to the base terminal of the amplitude control transistor 114 is changed according to the amplitude of the output signal. By such control, an output signal having a desired amplitude is generated.
- the drive control unit 120 controls the current flowing through each differential amplifier 106 based on the amplitude of the output signal to be output.
- individual current control transistors 112 are provided corresponding to the respective differential amplifiers, and the corresponding differential amplifiers are provided. Connected in series to the emitter terminal of the width device 106. Then, the drive control unit 120 controls the amount of current flowing through the differential amplifier 106 corresponding to the individual current control transistor 112 by controlling the voltage applied to the base terminal of each individual current control transistor 112.
- the drive control unit 120 should determine and drive the number of differential amplifiers 106 to be driven so that the current flowing through each differential amplifier 106 falls within a predetermined range.
- the individual current control transistor 112 corresponding to the differential amplifier 106 is controlled to be in an ON state.
- the range of the current flowing through the differential amplifier 106 is determined in advance so that the differential amplifier 106 can operate properly.
- each differential amplifier 106 can be set to a predetermined appropriate range, and the differential amplifier 106 can be used in an appropriate current region. For this reason, variation in waveform quality at the time of large amplitude output or small amplitude output can be reduced, and an output signal having a large variable amplitude range can be generated with high accuracy.
- the pre-driver circuit 118 controls the amplitude of the signal input to each base terminal of the plurality of differential amplifiers 106 according to the amplitude of the output signal to be output.
- the predriver circuit 118 receives an input signal, changes the amplitude of the input signal according to the amplitude of the output signal to be output, and inputs the input signal to the base terminal of the differential amplifier 106.
- the pre-driver circuit 118 inputs the current flowing through each differential amplifier 106 while changing the amplitude of the input signal so that the differential amplifier 106 operates properly.
- the pre-driver circuit 118 generates a signal to be supplied to the base terminal for each differential amplifier 106.
- the potential fixing transistor 103 is provided between the resistance unit 102 and the plurality of differential amplifiers 106, and a constant voltage is applied to the base terminal. Thereby, the potential of the collector terminal of the differential amplifier 106 can be kept substantially constant, and charging / discharging of the capacitance component due to the switching operation of the differential amplifier 106 can be prevented. For this reason, the differential amplifier 106 can operate at high speed and with high accuracy.
- the drive control unit 120 when the drive control unit 120 is within the predetermined appropriate current range of the current force differential amplifier 106 that flows through the amplitude control transistor 114, the single differential amplifier 10 Drive only 6 (in this example, differential amplifier 106-1). That is, the individual current control transistor 112-1 is controlled to be turned on, and the other individual current control transistors 112 are controlled to be turned off.
- FIG. 3 is a diagram illustrating an example of the operation of the variable amplitude driver circuit 100 described in FIG.
- the horizontal axis indicates the set value of the amplitude of the output signal
- the vertical axis indicates the value of the current flowing through each individual current control transistor 112.
- the drive control unit 120 divides the total current by the upper limit value of the appropriate current range when the total current force flowing through the amplitude control transistor 114 is larger than the appropriate current range of the differential amplifier 106.
- the number of differential amplifiers 106 is driven at the upper limit of the appropriate current range (the straight line portion of the current waveform in Fig. 3), and the remainder of the divided current is passed through the other differential amplifier 106 (current waveform in Fig. 3). Curve part). That is, the individual current control transistors 112 are controlled so that the tail current flows in order of one set of the differential amplifier 106 as the set amplitude of the output signal increases.
- the pre-driver circuit 118 supplies a signal corresponding to the input signal to the base terminal of the differential amplifier 106 to be driven.
- each differential amplifier 106 can be driven in an appropriate current range.
- FIG. 4 is a diagram showing another example of the configuration of the variable amplitude driver circuit 100. As shown in FIG. Except for the pre-driver circuit 118, the variable amplitude driver circuit 100 in this example has the same configuration as the variable amplitude driver circuit 100 described in FIG.
- the pre-driver circuit 118 in FIG. 2 generates a signal for each base terminal of each differential amplifier 106, but the pre-driver circuit 118 in this example is common to each differential amplifier 106.
- the signal is generated and supplied.
- the pre-driver circuit 118 inputs the input signal while changing the amplitude of each input signal so that each differential amplifier 106 operates properly. For example, the amplitude of the input signal is increased or decreased in proportion to the set amplitude of the output signal.
- the drive control unit 120 causes the tail current to flow sequentially for each pair of the differential amplifiers 106 as the set amplitude of the output signal increases.
- each individual current control transistor 112 is controlled.
- each differential amplifier 106 can be driven in an appropriate current range with simple control.
- the drive control unit 120 may control each individual current control transistor 112 so that substantially the same current flows through the differential amplifier 106 to be driven.
- the operation of the variable amplitude driver circuit 100 when substantially the same current is supplied to each differential amplifier 106 will be described.
- FIG. 5 is a diagram showing an example of the operation of the variable amplitude driver circuit 100 described in FIG.
- FIG. 5 (a) is a diagram illustrating an example of the operation of the pre-driver circuit 118
- FIG. 5 (b) is a diagram illustrating an example of the operation of each individual current control transistor 112.
- the horizontal axis represents the set value of the amplitude of the output signal
- the vertical axis represents the set value of the amplitude of the signal output from the pre-driver circuit 118.
- the horizontal axis represents the set value of the amplitude of the output signal
- the vertical axis represents the current flowing through each individual current control transistor 112.
- the drive control unit 120 drives only one differential amplifier 106 when the current force flowing through the amplitude control transistor 114 is within a predetermined appropriate current range of the differential amplifier 106 (in this example, Differential amplifier 106— 1). That is, the individual current control transistor 112-1 is controlled to be in the ON state, and the other individual current control transistor 112 is controlled to be in the OFF state.
- the pre-driver circuit 118 supplies a signal obtained by amplifying the input signal to the base terminal of each differential amplifier 106 in accordance with the set amplitude of the output signal.
- the current flowing through the differential amplifier 106-1 is equal to the current I flowing through the amplitude control transistor 114 U, and so on.
- the drive control unit 120 divides the total current by the upper limit value of the appropriate current range, and calculates the divided quotient.
- the number of differential amplifiers 106 rounded up is driven. That is, the individual current control transistor 112 corresponding to the differential amplifier 106 is controlled to be in the ON state. Then, control is performed so that the currents flowing in the driven differential amplifiers 106 are substantially the same. According to such control, since the fluctuation range of the current flowing through each differential amplifier 106 is reduced, an output signal with a large variable amplitude range can be generated with high accuracy.
- the pre-driver circuit maintains the continuity of the total current flowing through the driven differential amplifier 106 when the number of driven differential amplifiers 106 is switched. Similarly, the amplitude of the signal applied to the base terminal of the differential amplifier 106 to be driven is controlled.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Amplifiers (AREA)
- Control Of Amplification And Gain Control (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006542916A JP4939227B2 (ja) | 2004-10-27 | 2005-10-11 | 振幅可変ドライバ回路、及び試験装置 |
EP05793128A EP1811659A4 (en) | 2004-10-27 | 2005-10-11 | VARIABLE AMPLITUDE EXCITATION CIRCUIT AND TESTING APPARATUS |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/976,354 US7180310B2 (en) | 2004-10-27 | 2004-10-27 | Amplitude varying driver circuit and test apparatus |
US10/976,354 | 2004-10-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006046399A1 true WO2006046399A1 (ja) | 2006-05-04 |
Family
ID=36205657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/018711 WO2006046399A1 (ja) | 2004-10-27 | 2005-10-11 | 振幅可変ドライバ回路、及び試験装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7180310B2 (ja) |
EP (1) | EP1811659A4 (ja) |
JP (1) | JP4939227B2 (ja) |
KR (1) | KR20070069201A (ja) |
CN (1) | CN100511982C (ja) |
WO (1) | WO2006046399A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009171251A (ja) * | 2008-01-16 | 2009-07-30 | Sharp Corp | 可変利得増幅器 |
WO2011045832A1 (ja) * | 2009-10-14 | 2011-04-21 | 株式会社アドバンテスト | 差動ドライバ回路およびそれを用いた試験装置 |
JP2014116785A (ja) * | 2012-12-10 | 2014-06-26 | Fujitsu Ltd | 合成回路及びこれを用いた駆動装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1947467A1 (en) * | 2006-03-17 | 2008-07-23 | Advantest Corporation | Testing apparatus and performance board |
US8194721B2 (en) * | 2008-05-23 | 2012-06-05 | Integrated Device Technology, Inc | Signal amplitude distortion within an integrated circuit |
US8179952B2 (en) * | 2008-05-23 | 2012-05-15 | Integrated Device Technology Inc. | Programmable duty cycle distortion generation circuit |
US8259888B2 (en) * | 2008-05-23 | 2012-09-04 | Integrated Device Technology, Inc. | Method of processing signal data with corrected clock phase offset |
Citations (4)
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JP2001057512A (ja) * | 1999-06-07 | 2001-02-27 | Advantest Corp | 電圧駆動回路、電圧駆動装置および半導体デバイス試験装置 |
JP2002330039A (ja) * | 2001-02-28 | 2002-11-15 | Sharp Corp | 可変利得増幅器 |
JP2004015409A (ja) * | 2002-06-06 | 2004-01-15 | Renesas Technology Corp | 通信用半導体集積回路および無線通信システム |
JP2004266309A (ja) * | 2003-01-14 | 2004-09-24 | Matsushita Electric Ind Co Ltd | 可変利得増幅回路及び無線通信装置 |
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DE3215518C1 (de) * | 1982-04-26 | 1983-08-11 | Siemens AG, 1000 Berlin und 8000 München | Verknuepfungsglied mit einem Emitterfolger als Eingangsschaltung |
JPS59212780A (ja) * | 1983-05-18 | 1984-12-01 | Toshiba Corp | レベル検出回路 |
US5001362A (en) * | 1989-02-14 | 1991-03-19 | Texas Instruments Incorporated | BiCMOS reference network |
US5184029A (en) * | 1991-10-15 | 1993-02-02 | Hewlett-Packard Company | Driver circuit for circuit tester |
US5613233A (en) * | 1994-09-30 | 1997-03-18 | Rockwell International Corp. | Apparatus with distortion cancelling feedback signal |
US6111716A (en) * | 1998-02-13 | 2000-08-29 | Vtc Inc. | Referenced magnetoresistives sensor band pass preamplifier |
US6294949B1 (en) | 1999-06-07 | 2001-09-25 | Advantest Corporation | Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus |
US6157257A (en) * | 1999-06-30 | 2000-12-05 | Conexant Systems, Inc. | Low power folding amplifier |
JP2004159221A (ja) * | 2002-11-08 | 2004-06-03 | Renesas Technology Corp | 通信用半導体集積回路および無線通信システム |
JP4377652B2 (ja) * | 2003-10-28 | 2009-12-02 | 三菱電機株式会社 | ドライバ回路 |
-
2004
- 2004-10-27 US US10/976,354 patent/US7180310B2/en not_active Expired - Fee Related
-
2005
- 2005-10-11 WO PCT/JP2005/018711 patent/WO2006046399A1/ja active Application Filing
- 2005-10-11 KR KR1020077010870A patent/KR20070069201A/ko not_active Application Discontinuation
- 2005-10-11 EP EP05793128A patent/EP1811659A4/en not_active Withdrawn
- 2005-10-11 JP JP2006542916A patent/JP4939227B2/ja not_active Expired - Fee Related
- 2005-10-11 CN CNB2005800346846A patent/CN100511982C/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2001057512A (ja) * | 1999-06-07 | 2001-02-27 | Advantest Corp | 電圧駆動回路、電圧駆動装置および半導体デバイス試験装置 |
JP2002330039A (ja) * | 2001-02-28 | 2002-11-15 | Sharp Corp | 可変利得増幅器 |
JP2004015409A (ja) * | 2002-06-06 | 2004-01-15 | Renesas Technology Corp | 通信用半導体集積回路および無線通信システム |
JP2004266309A (ja) * | 2003-01-14 | 2004-09-24 | Matsushita Electric Ind Co Ltd | 可変利得増幅回路及び無線通信装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009171251A (ja) * | 2008-01-16 | 2009-07-30 | Sharp Corp | 可変利得増幅器 |
WO2011045832A1 (ja) * | 2009-10-14 | 2011-04-21 | 株式会社アドバンテスト | 差動ドライバ回路およびそれを用いた試験装置 |
US8220947B2 (en) | 2009-10-14 | 2012-07-17 | Advantest Corporation | Differential driver circuit |
JPWO2011045832A1 (ja) * | 2009-10-14 | 2013-03-04 | 株式会社アドバンテスト | 差動ドライバ回路およびそれを用いた試験装置 |
JP2014116785A (ja) * | 2012-12-10 | 2014-06-26 | Fujitsu Ltd | 合成回路及びこれを用いた駆動装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20070069201A (ko) | 2007-07-02 |
JPWO2006046399A1 (ja) | 2008-05-22 |
EP1811659A1 (en) | 2007-07-25 |
CN101040435A (zh) | 2007-09-19 |
CN100511982C (zh) | 2009-07-08 |
EP1811659A4 (en) | 2009-08-12 |
JP4939227B2 (ja) | 2012-05-23 |
US7180310B2 (en) | 2007-02-20 |
US20060087328A1 (en) | 2006-04-27 |
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