WO2006043343A1 - 薄膜形成装置及びその方法 - Google Patents
薄膜形成装置及びその方法 Download PDFInfo
- Publication number
- WO2006043343A1 WO2006043343A1 PCT/JP2005/000853 JP2005000853W WO2006043343A1 WO 2006043343 A1 WO2006043343 A1 WO 2006043343A1 JP 2005000853 W JP2005000853 W JP 2005000853W WO 2006043343 A1 WO2006043343 A1 WO 2006043343A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- film forming
- thin film
- substrate
- forming apparatus
- substrate tray
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 52
- 238000000034 method Methods 0.000 title claims description 17
- 239000000758 substrate Substances 0.000 claims abstract description 184
- 239000010408 film Substances 0.000 claims abstract description 71
- 239000013077 target material Substances 0.000 claims abstract description 49
- 230000007246 mechanism Effects 0.000 claims abstract description 14
- 230000007723 transport mechanism Effects 0.000 claims description 31
- 230000015572 biosynthetic process Effects 0.000 claims description 25
- 238000004544 sputter deposition Methods 0.000 claims description 16
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 230000003028 elevating effect Effects 0.000 claims description 2
- 238000007599 discharging Methods 0.000 claims 1
- 238000012423 maintenance Methods 0.000 abstract description 5
- 239000013078 crystal Substances 0.000 description 11
- 238000000151 deposition Methods 0.000 description 6
- 230000008021 deposition Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000007769 metal material Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 3
- 230000001965 increasing effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
- C23C14/566—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32743—Means for moving the material to be treated for introducing the material into processing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32752—Means for moving the material to be treated for moving the material across the discharge
- H01J37/32761—Continuous moving
- H01J37/32779—Continuous moving of batches of workpieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
Definitions
- the present invention relates to a thin film forming apparatus and a thin film forming method, and more particularly to formation of an electrode film of a piezoelectric element.
- the resonance frequency of a crystal resonator which is a typical piezoelectric element, is determined by the thickness of a crystal piece serving as a base plate and the thickness of a metal electrode formed on the surface thereof.
- a crystal piece is first cut out with a specified thickness, and then the surface is polished, and a metal electrode film is formed on the surface by sputtering deposition or the like.
- a plurality of crystal pieces are mounted on a moving body called a substrate tray or carrier, and this is set in a predetermined atmosphere.
- a method of forming an electrode film by sequentially supplying the region is generally used.
- Patent Document 1 Such an electrode film forming apparatus for continuous processing is disclosed in Patent Document 1, for example.
- a plurality of sputter cathodes having electrode materials are provided on both sides of a quartz substrate transport path, and a multilayer electrode film is formed at a time on both sides of the quartz substrate.
- a film forming apparatus for continuous processing has a configuration in which a substrate is sequentially carried into a film forming chamber to perform a film forming process, and processed substrates are sequentially carried out from the film forming chamber.
- the substrate can be transferred into and out of the film forming chamber, or the loading and unloading can be performed independently in separate chambers.
- Patent Document 2 relates to the formation of an optical multilayer film in a sputtering apparatus, but in the examples, a load lock type sputtering apparatus configured by a loading chamber for loading and unloading a substrate and a sputtering chamber is disclosed.
- FIG. 4 shows an example of a conventional electrode film forming apparatus.
- the figure shows a load-lock type apparatus equipped with a stocker 40 that accommodates a plurality of substrates 3, and automatically controls so that all the substrates 3 in the stocker 40 are processed in one step.
- FIG. 5 is a schematic perspective view of the substrate 3 and shows a state in which a plurality of crystal pieces 50 are mounted on the substrate 3.
- the substrate 3 in the stocker 40 is mounted on the substrate tray 42 moved to the loading / unloading chamber 1 and then sequentially transferred to the film forming chamber 41. After the film formation is completed, the stocker 40 passes through the loading / unloading chamber 1 again. Housed inside.
- a target material 6 disposed on the sputter cathode 7
- a transport mechanism 43 for the substrate tray 42 Inside the vacuum chamber are a plurality of sputter cathodes 7, a target material 6 disposed on the sputter cathode 7, a transport mechanism 43 for the substrate tray 42, a gear 45 that drives the transport mechanism 43, and a standby space for the substrate tray 42. 44, and a drive motor 14 for the gear 45 and a force sword power source 8 for the sputter cathode 7 are disposed outside the vacuum chamber.
- a roughing valve 9 and a main valve 10 are connected to each chamber.
- FIG. 6 is a schematic external view of the apparatus shown in FIG.
- the sputter cathode 7 is fixed by a plurality of bolts 60 from the outside of the film forming chamber 41. By removing the bolt 60, maintenance work such as replacement of the target material becomes possible.
- FIG. 7a is a schematic view of the substrate tray 42 and the transport mechanism 43 shown in FIG. 4, and FIG. 7b is a schematic cross-sectional view taken along the solid line YY ′ of FIG. 7a.
- the substrate tray 42 is designed so that one substrate 3 can be mounted, and the transport mechanism 43 includes a transport roller 70, a guide 72 that forms a transport path, and a bearing 71 that supports the substrate 3 from both sides.
- a plurality of transport rollers 70 are arranged in the transport path of the substrate tray 42, and the substrate tray 42 is transferred by rotating the transport roller 70 via the gear 45 by the drive motor 14.
- the drive motors 14 are installed independently in the preparation / extraction chamber 1 and the film formation chamber 41, and are driven and controlled in synchronization with each other.
- Patent Document 1 Japanese Patent No. 3261504
- Patent Document 2 Japanese Patent Application No. 2004-266450
- the continuous processing film forming apparatus as described above repeatedly turns on / off the power sword power supply and sequentially performs film forming processing on the substrate.
- the power sword power is turned on, and when the sputter discharge is stabilized, the substrate is loaded into the film formation region, and the electrode film is deposited through the front surface of the force sword.
- the power sword is turned off when it is unloaded. For this reason, even if the time for energizing the force sword is kept to a minimum, the time required for the discharge to stabilize and the time required for the first and last rows of the substrate to pass through the film formation region are the space where the substrate does not exist. In addition, the target material has been wasted.
- the utilization rate of the target material it is ideal to always turn on the power sword power supply and supply the substrate into the film formation area to be continuously maintained. It is not practical because it is necessary to enlarge the vacuum chamber, such as requiring a place to wait.
- the vacuum chamber is of a normal size, it is necessary to include a step of sequentially loading the substrate into the limited vacuum space from the atmosphere, and unloading the processed substrate to the atmosphere. It is inevitable that the material is wasted in the film formation chamber. If the target material is discharged in vain, the utilization rate of the target material is reduced, and if the maintenance cycle of the apparatus is shortened, it can be used as an excellent conductive material for the electrode film of a crystal resonator. Many expensive metal materials such as Au and Ag are wasted, and the cost is greatly affected.
- a first aspect of the present invention includes a vacuum chamber, a sputter cathode for holding a target material, a mounting means for mounting a substrate on which the sputtered target material is deposited, and a transport mechanism for the mounting means.
- a transport path is provided so that the substrate passes through the front surface of the target material in the transport mechanism
- the mounting means includes a substrate tray that can hold a plurality of substrates connected together.
- the transport mechanism was configured so that the substrate tray passed through the front surface of the sputtering cathode multiple times.
- the transport mechanism is configured so that the substrate tray passes through the front surface of the sputtering cathode multiple times by reciprocating motion, and a standby space for the substrate tray is provided in the vacuum chamber, and the shape of the cross section perpendicular to the transport path in the standby space is The shape is substantially similar to the shape defined by the substrate and the substrate tray, and the cross-sectional area is smaller than the cross-sectional area perpendicular to the transfer path in the portion of the vacuum chamber that is not the standby space.
- a plate gear is formed on the substrate tray, and the transport mechanism includes a spur gear that engages with the plate gear, and a drive unit that drives the spur gear.
- a configuration in which a plurality of spur gears are provided in the substrate tray conveyance path, and a pulley connected to the spur gear, at least one timing belt stretched between the pulleys, and a drive motor for driving at least one of the pulleys are provided.
- the transport mechanism also includes a guide that forms a transport path for the substrate tray, a plate gear disposed on the substrate tray, a roller that is disposed on the substrate tray and moves on the guide while receiving the load on the substrate tray, and the substrate that moves. It comprised with the bearing which supports.
- the sputter cathode is provided at a position opposed to the substrate tray with the conveyance path interposed therebetween.
- a clamp is provided for fixing the sputter cathode from the outside of the vacuum chamber.
- the thin film forming apparatus is composed of a charging / unloading chamber and a film forming chamber.
- a plate tray lifting mechanism was provided.
- a roughing pump was connected to the charging / unloading chamber, a main pump was connected to the deposition chamber, and one exhaust system was used.
- the substrate is equipped with a plurality of piezoelectric elements, and at least one target material is Au or Ag.
- the second aspect of the present invention provides at least one sputter cathode for holding a target material, a power source for a sputter cathode for sputter discharge of the target, and a substrate on which the target material released by sputter discharge is deposited.
- a thin film forming apparatus comprising a drive motor for driving at least one of the above, wherein the mounting means connects a plurality of substrates.
- a thin film forming apparatus comprising a substrate tray which can hold.
- a third aspect of the present invention is a thin film forming method for forming a film on a substrate in a thin film forming apparatus provided with a transport mechanism for passing the substrate through a film formation region of a target material disposed in a vacuum chamber.
- a plurality of substrates are connected in the transport direction and mounted on the substrate tray, and the substrate tray is loaded into the target material film formation area by the transport mechanism, and the substrate tray is fixed on the front surface of the target material. It is a thin film forming method that moves at a speed. Further, the plate gear provided in the substrate tray and the spur gear provided in the transport mechanism are engaged, and the spur gear is rotated so that the substrate tray is transported.
- the target material is disposed on the sputter cathode, and a voltage is applied to the sputter cathode to cause sputter discharge.
- a substrate tray is carried in front of the target material, and the target material is deposited on the substrate. The energization of the sputter cathode was stopped when the end of the connected substrate was removed from the sputter discharge area of the target material.
- the utilization rate of the target material is improved, the takt time is improved, the maintainability is improved, and the film formation accuracy is improved. It is effective for improvement.
- FIG. 1 is a schematic diagram of a thin film forming apparatus of the present invention.
- FIG. 2 Schematic diagram of substrate tray and transport mechanism of the present invention
- FIG.4 Schematic diagram of conventional thin film forming equipment
- FIG. 7 Schematic diagram of conventional substrate tray and transport mechanism
- FIG. 1 shows an example of an electrode film forming apparatus according to the present invention.
- the same reference numerals are given to the same parts as in the prior art, and the description thereof is omitted.
- the apparatus is composed of a charging / unloading chamber 1 and a film forming chamber 2.
- FIG. La shows a schematic view of each indoor portion viewed from above
- FIG. Lb shows a schematic view of each indoor portion viewed from the side.
- the stocker is omitted for the purpose of improving productivity and reducing the area occupied by the apparatus, but a stocker may be provided if necessary.
- the charging / unloading chamber 1 and the film formation chamber 2 are separated by a gate valve 11, and the film formation chamber 2 has a main Connect a roughing valve 9 to the charge take-out chamber 1.
- the main valve 10 By connecting the main valve 10 to a main pump (not shown) and the roughing valve 9 to a roughing pump (not shown), the exhaust system of the equipment is made one system, contributing to simplification of the equipment configuration.
- Each chamber may be equipped with both a roughing valve and a main valve.
- FIG. 2a is a schematic view of the substrate tray 4 and the transport mechanism 5 shown in FIG. 1, and FIG. 2b is a schematic cross-sectional view taken along a solid line ⁇ in FIG. 2a.
- the substrate tray 4 is designed so that a plurality of substrates 3 can be mounted continuously, and in the figure, five substrates 3 are mounted.
- the substrate 3 is adjacent to the conveyance direction without gaps. Since the amount of target material 6 that is wasted in a single film formation process is constant regardless of the number of substrates 3 to be mounted, increasing the number of substrates 3 to be mounted on the substrate tray 4 increases the amount of wasted material. It is possible to reduce the amount of one get material 1. For example, when five substrates 3 are mounted on the substrate tray 4, the waste target material 6 can be suppressed to 20% as compared with the case where one substrate 3 is mounted.
- the number of substrates 3 to be mounted can be selected appropriately according to conditions such as production volume or equipment installation space, etc.
- the substrate 3 can be continuously supplied into the deposition area, improving the utilization rate of the target material 6 It becomes possible to make it. In addition, processing multiple sheets simultaneously improves productivity and contributes to shortened tact time.
- the transport mechanism 5 includes a plate gear 20 and an axle 22 disposed on the substrate tray 4, rollers 23 attached to both ends of the axle 22, a spur gear 21 disposed to engage with the plate gear 20, and the substrate 3. It consists of bearings 24 arranged on both sides and guides 25 that form a transport path. The bearing 24 may be disposed on a force guide 25 that is to be disposed on the substrate tray 4.
- the spur gears 21 are arranged at a plurality of locations, and are rotated by a single drive motor 14 using a pulley 12 and a timing belt 13 and engaged with a plate gear 20 to move the substrate tray 4 straight.
- the power is transmitted by the pulley 12 and the timing belt 13, thereby omitting the synchronization of a plurality of drive sources, and contributing to the reduction of the area occupied by the drive system and the simplification of the device configuration.
- the axle 22 and the roller 23 smoothly transfer the substrate tray 4 while supporting the load on the substrate tray 4, reduce the load on the spur gear 21, and stably convey the substrate tray 4.
- the bearing 24 supports the substrate 3 without applying a load to the transport mechanism 5.
- plate gear 20 and spur teeth Although the wheel 21 is disposed on the lower surface of the substrate tray 4, the present invention is not limited to this.
- a spur gear may be disposed on the side of the substrate tray and may be driven in combination with the plate gear provided on the side surface of the substrate tray.
- the transport mechanism 5 of the embodiment employs a rack and pinion mechanism, it is possible to reliably transport the substrate tray 4 that is free from idling as seen in conventional transport rollers. As a result, the substrate position and the substrate speed can be accurately controlled, and the time for passing through the substrate tray 4 force S sputter region can be accurately controlled. Therefore, it contributes to the improvement of film thickness control accuracy.
- the loading / unloading chamber 1 is provided with a transport mechanism 5, a lifting / lowering mechanism 15 for the substrate tray 4, and a substrate heating mechanism 16 as necessary. Since the film forming chamber 2 is exposed to a high temperature, the substrate 3 and the substrate tray 4 are carried out of the film forming chamber 2 to the preparation / unloading chamber 1 while maintaining the high temperature. In the embodiment, by providing the raising / lowering mechanism 15 for the substrate tray 4 in the loading / unloading chamber 1, even the substrate 3 at a high temperature can be safely removed from the loading / unloading chamber 1. In the embodiment, the substrate 3 taken out is not stored in the stocker and can be sequentially sent out to the next process, which leads to improvement in productivity.
- the substrate 3 can be taken out from the loading / unloading chamber 1 either automatically or manually.
- a stocker may be provided, and the deposited substrates 3 may be taken out collectively.
- the mechanism for taking out the loading / unloading chamber 1 force substrate 3 is not limited to the lifting mechanism.
- the shape of the vacuum chamber of the standby space 17 is changed to a group of moving bodies including the substrate 3 and the substrate tray 4. It is characterized by being as close as possible to the shape of.
- the standby space 17 may be provided at a position in contact with the loading / unloading chamber 1 in the film formation chamber 2 where it is desirable to provide the folding position of the substrate tray that reciprocates.
- the volume in the film forming chamber 2 can be reduced, and the time for evacuation or release to atmospheric pressure can be reduced. Furthermore, it contributes to the reduction of the area occupied by the equipment.
- FIG. 3 a is an external view of the thin film forming apparatus shown in FIG. 1, and schematically shows only the arrangement part of the sputter cathode 7 for explanation.
- the sputter cathode 7 is arranged to be openable and closable with respect to the film forming chamber 2 by a clamp 30 and a hinge 31 arranged outside the film forming chamber 2.
- FIG. 3 b is a schematic perspective view of the clamp 30, showing a state in which the screw 34 is passed through a substantially elliptical hole 33 provided in the holding plate 32.
- Figures 3a and 3b show sputter cathode 7 deposited by clamp 30 Force showing how the interior is fixed in an airtight sealed state
- the holding plate 32 can be moved along the hole 33 by loosening the handle 35 of the screw 34.
- the substrate 3 is continuously set on the substrate tray 4 moved to the loading / unloading chamber 1, and the gate valve 11 is opened, and the vacuum is exhausted to a predetermined vacuum level.
- the substrate 3 is heated using the substrate heating mechanism 16 to prepare for film formation.
- Power is applied to the sputter cathode 7 on which the target material A to be deposited is disposed, and the substrate tray 4 is transferred from the loading / unloading chamber 1 to the deposition chamber 2 when the sputtering atmosphere is stabilized by the discharge.
- the target material A is deposited on the surface of the substrate 3 by transporting the substrate tray 4 at a constant speed and passing the front surface of the sputter cathode 7.
- the power sword power supply 8 is stopped, and power is applied to the sputter cathode 7 on which the target material B to be formed next is disposed. At this time, the substrate tray 4 is put on standby in a standby space 17.
- the substrate tray 4 is transported at a constant speed in the opposite direction to form a second electrode film on the substrate 3 surface. After the film formation, the substrate tray 4 is transferred to the loading / unloading chamber 1 and the gate valve 11 is closed to release the loading / unloading chamber 1 to the atmosphere.
- the elevating mechanism 15 is driven, and the film-formed substrate 3 is unloaded from the loading / unloading chamber 1.
- the undeposited substrate 3 is mounted on the emptied substrate tray 4, the gate valve 11 is opened after the roughing evacuation of the loading / unloading chamber 1 by the roughing valve 9, and the main valve 10 is evacuated to a predetermined vacuum level Then, after the substrate 3 is prepared, the film is formed in the same manner. The operation may be repeated and the film forming process may be sequentially performed on the substrate.
- a substrate in which a plurality of piezoelectric elements are mounted and the target materials A and B are Au and Ag can be cited.
- the embodiment contributes to downsizing of the apparatus by conveying the substrate tray in both directions
- Several kinds of metal materials may be arranged in the film formation chamber with an interval that does not overlap the film formation regions, and the substrate tray may be conveyed in one direction by providing the preparation chamber and the extraction chamber independently. Even when the substrate tray is transported in one direction, the effect of improving the utilization rate of the target material by increasing the number of substrates carried into the film forming chamber can be similarly obtained.
- the sputtering cathodes are arranged opposite to each other with the conveyance path interposed therebetween, and a thin film is formed on both surfaces of the substrate.
- the sputtering cathode is disposed only on one side of the conveyance path and the thin film is formed only on one side of the substrate. Good.
- a force sword is disposed on the side wall of the vacuum chamber and the substrate is conveyed with the substrate standing upright with respect to the vacuum chamber.
- a force sword is disposed on the top plate or the bottom plate of the vacuum chamber to You can transport the substrate while it is laid down.
- the electrode film formation on the crystal piece has been described.
- the present invention is not limited to this as long as it is an apparatus for forming a thin film.
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2005800361422A CN101044260B (zh) | 2004-10-22 | 2005-01-24 | 薄膜形成装置及其方法 |
Applications Claiming Priority (2)
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JP2004308047A JP4665155B2 (ja) | 2004-10-22 | 2004-10-22 | 薄膜形成装置及びその方法 |
JP2004-308047 | 2004-10-22 |
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WO2006043343A1 true WO2006043343A1 (ja) | 2006-04-27 |
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PCT/JP2005/000853 WO2006043343A1 (ja) | 2004-10-22 | 2005-01-24 | 薄膜形成装置及びその方法 |
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JP (1) | JP4665155B2 (ja) |
KR (1) | KR100959009B1 (ja) |
CN (1) | CN101044260B (ja) |
WO (1) | WO2006043343A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011096393A (ja) * | 2009-10-27 | 2011-05-12 | Hitachi High-Technologies Corp | 有機elデバイス製造装置及びその製造方法並びに成膜装置及び成膜方法 |
WO2013098365A1 (de) * | 2011-12-29 | 2013-07-04 | Von Ardenne Anlagentechnik Gmbh | Vorrichtung und verfahren zur substratbehandlung in einem batch-prozess |
US9458535B2 (en) | 2013-12-13 | 2016-10-04 | Kabushiki Kaisha Toshiba | Semiconductor manufacturing device and semiconductor manufacturing method |
WO2019093473A1 (ja) * | 2017-11-13 | 2019-05-16 | Necエンベデッドプロダクツ株式会社 | 搬送システム、制御装置、制御方法及びプログラム |
WO2019093510A1 (ja) * | 2017-11-13 | 2019-05-16 | Necエンベデッドプロダクツ株式会社 | 搬送装置及び搬送方法 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20100100958A (ko) | 2007-12-27 | 2010-09-15 | 엑사테크 엘.엘.씨. | 멀티-패스 진공 코팅 시스템 |
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JP2011193288A (ja) * | 2010-03-15 | 2011-09-29 | Seiko Instruments Inc | パターン形成方法、パターン形成装置、圧電振動子、圧電振動子の製造方法、発振器、電子機器および電波時計 |
CN103119192B (zh) * | 2010-11-15 | 2015-08-05 | 株式会社爱发科 | 成膜装置 |
KR101968256B1 (ko) * | 2011-08-30 | 2019-04-12 | 신메이와 인더스트리즈,리미티드 | 진공 성막 장치 |
JP5939817B2 (ja) * | 2012-01-30 | 2016-06-22 | 株式会社アルバック | 成膜装置 |
JP2014028999A (ja) * | 2012-07-31 | 2014-02-13 | Ulvac Japan Ltd | 成膜装置 |
JP2014078601A (ja) * | 2012-10-10 | 2014-05-01 | Sumitomo Heavy Ind Ltd | 成膜装置用基板搬送トレイ、及び外部開閉駆動装置 |
JP6451030B2 (ja) * | 2015-01-26 | 2019-01-16 | 株式会社昭和真空 | 成膜装置 |
JP2019187143A (ja) * | 2018-04-12 | 2019-10-24 | 豊田合成株式会社 | 積層型誘電アクチュエータの製造方法 |
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JP2011096393A (ja) * | 2009-10-27 | 2011-05-12 | Hitachi High-Technologies Corp | 有機elデバイス製造装置及びその製造方法並びに成膜装置及び成膜方法 |
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Also Published As
Publication number | Publication date |
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CN101044260A (zh) | 2007-09-26 |
CN101044260B (zh) | 2010-05-12 |
JP2006118008A (ja) | 2006-05-11 |
JP4665155B2 (ja) | 2011-04-06 |
KR20070067147A (ko) | 2007-06-27 |
KR100959009B1 (ko) | 2010-05-20 |
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