WO2004112129A1 - Electronic device - Google Patents

Electronic device Download PDF

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Publication number
WO2004112129A1
WO2004112129A1 PCT/JP2004/008458 JP2004008458W WO2004112129A1 WO 2004112129 A1 WO2004112129 A1 WO 2004112129A1 JP 2004008458 W JP2004008458 W JP 2004008458W WO 2004112129 A1 WO2004112129 A1 WO 2004112129A1
Authority
WO
WIPO (PCT)
Prior art keywords
electronic device
circuit board
housing
electronic
substrate
Prior art date
Application number
PCT/JP2004/008458
Other languages
French (fr)
Japanese (ja)
Inventor
Takehide Yokozuka
Masahide Harada
Shiro Yamashita
Kaoru Uchiyama
Syuuji Eguchi
Masahiko Asano
Koji Sato
Isamu Yoshida
Original Assignee
Hitachi, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi, Ltd. filed Critical Hitachi, Ltd.
Publication of WO2004112129A1 publication Critical patent/WO2004112129A1/en

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H05K1/0203Cooling of mounted components
    • H05K1/0204Cooling of mounted components using means for thermal conduction connection in the thickness direction of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3677Wire-like or pin-like cooling fins or heat sinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19105Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09009Substrate related
    • H05K2201/09054Raised area or protrusion of metal substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227Other objects, e.g. metallic pieces
    • H05K2201/10416Metallic blocks or heatsinks completely inserted in a PCB
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10734Ball grid array [BGA]; Bump grid array
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0058Laminating printed circuit boards onto other substrates, e.g. metallic substrates
    • H05K3/0061Laminating printed circuit boards onto other substrates, e.g. metallic substrates onto a metallic substrate, e.g. a heat sink

Definitions

  • the present invention relates to an electronic device that requires a high heat dissipation structure, such as a electronic unit.
  • the two boards, the motherboard and the interposer board are sandwiched between the electronic component that is a heat source and the housing that is the heat radiation destination, the electronic components are mounted on a conventional motherboard.
  • the heat radiation is lower than that of the structure in which the device is directly mounted.
  • a metal core substrate in which a wiring layer and an insulating layer are formed on both sides of a metal plate as a core material is used for an interposer substrate.
  • the resin layer on both sides of the interposer substrate and a part of the wiring layer are removed, and the semiconductor device as an electronic component is directly mounted on the upper surface of the core material in a face-up manner, and the lower surface of the core material and the upper surface of the motherboard are removed.
  • the sides are connected by soldering and plating (Patent Document 1, FIG. 34).
  • a housing and an electronic board adhered to the housing are provided.
  • the electronic board includes a first circuit board (interposer board) on which electronic components are mounted, and the first circuit board.
  • the first circuit board and the second circuit board are provided. Can be arranged at the center of the second circuit board. That is, since the heat radiating member can be arranged directly below the electronic component as the heat radiating source, the heat radiating property is improved.
  • FIG. 2 is a perspective view of an ECU module.
  • FIG. 6 is a cross-sectional view of the electronic device.
  • FIG. 7 is a diagram showing a manufacturing process.
  • FIG. 8 is a cross-sectional view of the electronic device.
  • FIG. 9 is a cross-sectional view of the electronic device.
  • the ECU module is an aluminum housing on which a connector for inputting and outputting signals to and from the outside is formed.
  • FIG. 1 is a cross-sectional view of FIG.
  • the heat generated by the semiconductor device 1 causes the interposer substrate 11 to be confined.
  • Heat can be dissipated to the case with high heat conductivity through a short heat dissipation path formed of a material with high heat conductivity. For this reason, the heat dissipation of the electronic device can be improved.
  • a 5 mm square semiconductor device 1 is placed face-up on the surface of the interposer substrate 11 and die-bonded with solder or silver paste 5. After die bonding, the terminals of the semiconductor device 1 and the pads of the interposer substrate 11 are electrically connected by the bonding wires 3. Next, the electronic components 9 are mounted. Note that this connection method is appropriately selected according to the type of electronic component.
  • the semiconductor package 41 and the electronic component 21 are mounted in a predetermined position on the motherboard 15 in alignment with each other. At 240 ° C, the solder is melted for about 5 minutes, and reflow connection is performed (Fig. 3 ( c)). The size of the through hole was 7 mm square. Since the aluminum projection 29 is provided in the through hole 43 of the mother board 15, by making the opening larger than the size of the aluminum projection 29, the positioning accuracy of the board with respect to the housing 27 is improved. This is effective in alleviating the conditions described above and forming a space for storing an excess of the adhesive 31 for bonding the package 41 and the aluminum projection 29.
  • the interposer substrate is fixed to the housing via a member molded separately from the motherboard.
  • the above-described members are more thermally conductive than the resin layer of the motherboard. It is preferable to use one having a large conductivity.
  • a separately molded aluminum metal block 33 is bonded to the aluminum housing 27 using a silicone adhesive 35 containing a metal filler.
  • the substrate constituting the package is a metal core substrate 37.
  • the insulating resin on the front and back of the metal core substrate 37 is partially removed, and the high-heat-generating chip 1 is bonded face-up with silver paste 5 to the exposed part of the core metal 39, and packaged with chip 1 by wire bonding 3
  • the bonding pads on the board (interposer board) are electrically connected.
  • Other parts can also be mounted on the package substrate as needed and molded with resin 7 to improve handling.
  • the protruding portion 33 of the aluminum housing 27 is adhered to the exposed portion of the core metal on the back surface of the package with a silicone-based silver paste 31.
  • the connection from the high heat generating chip to the aluminum housing 27 having a large heat capacity can be connected without the insulating resin layer of the circuit board having low thermal conductivity, the heat radiation can be extremely enhanced. Also, By making at least one of the adhesive portions 31 and 35 an adhesive containing a non-conductive filler or an adhesive without a filler, it is also possible to maintain the insulation between the core metal 39 and the aluminum housing 27.
  • FIG. 6 is different from the above-described embodiment in that the connection between the core metal 39 and the aluminum protrusion 33 is performed by the solder ball 45.
  • the manufacturing process can be simplified by connecting the heat radiating part with solder balls. Although the total connection area that contributes to heat dissipation is reduced, the thermal conductivity of the solder itself is about 10 times greater than that of silver paste, so it is possible to keep the heat dissipation lower than in the previous embodiment. If the entire silver paste connection portion in the above-mentioned embodiment is connected by solder instead of the solder ball, the heat dissipation can be further improved.
  • a metal core substrate 37 is used as a package substrate.
  • the metal core substrate 37 is manufactured by a known method. However, it is necessary to remove the insulating resin portion of the metal core substrate 37, and this is performed by carbon dioxide laser processing. After the desmear treatment, a high heat-generating electronic component 1 of approximately 5 mm square is die-bonded to the surface of the core metal 39 face-up with solder or silver paste 5. Electrical connection is made by wire bonding 3. Mold with resin 7 to further improve handling and reliability. Pads for solder BGA connection are formed on the back of the package substrate.
  • These pads have a diameter of 0.6 mm and a pitch of 127 mm, for example, and are formed by nickel plating and further gold plating.
  • the BGA pad is not formed on the entire back surface of the substrate 37, and a part of a 5 mm square area for heat radiation is left.
  • An insulating resin removing portion (borebore portion) 46 having a diameter of 0.6 mm and a pitch of 1.27 mm is formed in the heat radiation area.
  • the counterbore portion 46 is formed by the same method as that of the chip mounting portion, that is, laser processing. Making the counterbore diameter about the same size as the other BGA pads allows the same solder ball size to be supplied, thus facilitating process control.
  • a protrusion 33 having a 5 mm square and a height of 1.7 mm is formed at a desired position on the ECU aluminum housing 27.
  • This projection 33 is formed by the method as in the above-described embodiment.
  • a metallization 38 for solder connection that is, a nickel metal with a thickness of 5 microns, and even a 0.5 micron To form a gold plating.
  • These metallizations 38 may be formed by any method as long as they react with the solder.
  • a silicone adhesive 25 is applied to the substrate mounting portion of the aluminum housing 27 having the projections, and the perforated substrate 15 is mounted and cured at 150 ° C. for one hour. From the hole 43 of the substrate 15, the protruding portion 33 formed on the aluminum housing 27 protrudes from the surface of the substrate 15 by about 0.2 mm.
  • the package and other electronic components 21 are aligned and mounted at predetermined positions on the substrate 15, and the solder is melted at 240 ° C for about 5 minutes, and all solder joints are simultaneously reflow-connected. I do.
  • FIG. 8 shows the structure of another electronic device.
  • a minute gap is generated on the connection surface of the interposer substrate 11 due to the interposition of the adhesive 31 made of a resin adhesive or solder between the projection 29 and the interposer substrate 11.
  • the gap can be reduced by pressing the projections 100 against the interposer substrate 11 while securing the adhesive force in the grooves, thereby improving heat dissipation. be able to.
  • a difference from the electronic device of FIG. 4 is that minute grooves or protrusions 101 and 102 are provided on the upper surface and the lower surface of the metal block 33 ′.
  • the present invention is applicable to an electronic device that requires a high heat radiation structure typified by an engine control unit.

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Mounting Of Printed Circuit Boards And The Like (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Combinations Of Printed Boards (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

An object is to improve the heat radiation property of an electronic device, and particularly to improve the heat radiation property of an electronic device using an interposer substrate. The following construction is employed for an electronic device having a box and an electronic substrate. The electronic substrate comprises a first circuit board having electronic parts mounted thereon, and a second circuit board electrically connected to the first circuit board. The second circuit board of the electronic substrate is fixed to the box in a space where the first and second circuit boards do not become superposed on each other.

Description

技術分野  Technical field
[0001] 本発明は、 -ルユニットに代表される、高放熱構造が必要な電子 装置に関する。 背景技術  The present invention relates to an electronic device that requires a high heat dissipation structure, such as a electronic unit. Background art
[0002] 通常、電子装置については、出荷前に、熱サイクル試験を行うことにしている。特に 明  [0002] Normally, a thermal cycle test is performed on an electronic device before shipment. Especially Ming
、 ECU等の車載用電子制御装置は、エンジンのオンオフや環境温度の変化により 田  , ECUs and other in-vehicle electronic control devices
車体内の温度が大きく変化し、広い温度領域での熱サイクル (通常、 - 40度一 120度 :自動車用電子機器の環境試験通則 JASOD001)に耐える仕様を満たすことが要求 される。今般、 ECUをよりエンジン近くに配置する傾向があるため、この温度範囲の 上限の仕様をより高くする傾向がある。従って、車載用電子装置には、一般の電子装 置よりも高い放熱性が必要とされる。  It is required that the temperature inside the vehicle changes greatly and that it meets the specifications that can withstand the heat cycle in a wide temperature range (normally -40 degrees to 120 degrees: JASOD001, the general rule for environmental testing of automotive electronic devices). Nowadays, there is a tendency to place ECUs closer to the engine, so that the specifications at the upper end of this temperature range tend to be higher. Therefore, the on-vehicle electronic device is required to have a higher heat radiation property than a general electronic device.
[0003] 近年の電子装置には、半導体装置等の電子部品をインターポーザ基板 (中間回路 基板)に搭載し、そのインターポーザ基板をはんだバンプ等によりマザ一ボード (回路 基板)に搭載する構造が採用されることが多くなつてきた。  [0003] In recent years, electronic devices have adopted a structure in which electronic components such as semiconductor devices are mounted on an interposer substrate (intermediate circuit substrate), and the interposer substrate is mounted on a mother board (circuit substrate) by solder bumps or the like. Has become more and more.
[0004] 発熱源である電子部品から放熱先である筐体までの間にマザ一ボードとインターポ 一ザ基板との 2つの基板を挟み込む構造になるので、従来のマザ一ボードに電子部 品を直接搭載する構造に比べて放熱性は低くなる。  [0004] Since the two boards, the motherboard and the interposer board, are sandwiched between the electronic component that is a heat source and the housing that is the heat radiation destination, the electronic components are mounted on a conventional motherboard. The heat radiation is lower than that of the structure in which the device is directly mounted.
[0005] 放熱性を向上させる手法として、従来、以下の構造が知られている。この構造にお いては、コア材である金属板の両面に配線層と絶縁層とを形成したメタルコア基板が インターポーザ基板に用いられている。このインターポーザ基板の両面の樹脂層と配 線層の一部とが取り除かれ、コア材上面に、電子部品である半導体装置が直接フエ ースアップ方式で搭載され、コア材下面側と、マザ一ボード上面側とがはんだとメツキ で接続されている (特許文献 1、図 34)。  [0005] As a technique for improving heat dissipation, the following structure has been conventionally known. In this structure, a metal core substrate in which a wiring layer and an insulating layer are formed on both sides of a metal plate as a core material is used for an interposer substrate. The resin layer on both sides of the interposer substrate and a part of the wiring layer are removed, and the semiconductor device as an electronic component is directly mounted on the upper surface of the core material in a face-up manner, and the lower surface of the core material and the upper surface of the motherboard are removed. The sides are connected by soldering and plating (Patent Document 1, FIG. 34).
[0006] 特許文献 1 :特開 2003 - 46022号公報  Patent Document 1: Japanese Patent Application Laid-Open No. 2003-46022
発明の開示 発明が解決しょうとする課題 Disclosure of the invention Problems the invention is trying to solve
[0007] しかし、上記従来の技術では、筐体内に搭載されるインターポーザ基板とマザーボ ードとの間の放熱には着目されているが、筐体も含めた電子装置全体の放熱性を向 上させることが十分に検討されていない。  [0007] However, in the above-described conventional technology, attention is paid to heat radiation between the interposer substrate mounted in the housing and the motherboard, but the heat radiation of the entire electronic device including the housing is improved. It is not fully considered.
[0008] つまり、本発明の目的は、電子装置の放熱性を向上させることにある。  [0008] That is, an object of the present invention is to improve the heat dissipation of an electronic device.
課題を解決するための手段  Means for solving the problem
[0009] 本願には上記課題を解決することができる複数の発明が含まれ、以下にその代表 的なものを記載する。 [0009] The present application includes a plurality of inventions that can solve the above-mentioned problems, and representative ones will be described below.
[0010] 筐体と、筐体に接着されている電子基板とを備え、該電子基板は、電子部品が搭 載されている第 1の回路基板 (インターポーザ基板)と、該第 1の回路基板と電気的に 接続されているとともに、該筐体に固定されている第 2の回路基板 (マザ一ボード)とを 有する電子装置において、インターポーザ基板が、マザ一ボードと重畳しない空間 で該筐体に固定されている。このような構造とすることにより、固定に用いることができ る面積を大きくすることができるようになるので、次の効果がある。  [0010] A housing and an electronic board adhered to the housing are provided. The electronic board includes a first circuit board (interposer board) on which electronic components are mounted, and the first circuit board. And an electronic device having a second circuit board (mother board) electrically connected to the housing and fixed to the housing, wherein the interposer board is provided in a space not overlapping with the mother board. Fixed to. With such a structure, the area that can be used for fixing can be increased, and the following effects are obtained.
(1)接着面積が大きくなるということにより、落下等の強い衝撃が掛かったときでも、ィ ンターポーザ基板とマザ一ボードとの間の断線を抑制できる。  (1) By increasing the bonding area, even when a strong impact such as a drop is applied, disconnection between the interposer substrate and the motherboard can be suppressed.
(2)かかる空間を放熱経路として用いることにより、直接筐体へ通じる大きな放熱経路 を形成すること力 Sできる。  (2) By using such a space as a heat radiation path, it is possible to form a large heat radiation path directly leading to the housing.
[0011] また、上記態様の第 1の回路基板は、第 2の回路基板とは別に成形された部材を介 して該筐体に固定しておくようにすることが好ましい。  [0011] Further, it is preferable that the first circuit board of the above aspect is fixed to the housing via a member formed separately from the second circuit board.
[0012] メツキ等では、形成できる形状 (面積や厚み)に限界があるが、別部品として予め成 形しておけば、面積や厚みの限界はあまり気にしなくてもよくなり、低コストで大きな面 積の固定ができるようになる。また、力かる部材として、熱伝導係数の大きな部材を用 レ、ることで、大きな断面積を持つ放熱経路を確保することができる。  [0012] There is a limit to the shape (area and thickness) that can be formed with a plating or the like, but if it is formed in advance as a separate part, the limit of the area and thickness does not need to be considered so much, and the cost is low. Large area can be fixed. Further, by using a member having a large heat conduction coefficient as a strong member, a heat radiation path having a large cross-sectional area can be secured.
[0013] また、上記態様において、第 2の回路基板には貫通孔が形成され、該第 1の回路基 板と該筐体との間であって該貫通孔と重畳する空間に、該第 2の回路基板とは別に 成形された部材を備えるようにすることが好ましレ、。  [0013] In the above aspect, a through hole is formed in the second circuit board, and the second circuit board is provided in a space between the first circuit board and the housing and overlapping the through hole. It is preferable to provide a molded member separately from the circuit board of the second.
[0014] このように、貫通孔を第 2の基板に設けることで、第 1の回路基板と第 2の回路基板 との非重畳空間を第 2の回路基板の中央に配置できるようになる。つまり、放熱源で ある電子部品の直下に放熱部材を配置できるようになるので、放熱性が向上する。 [0014] By providing the through-hole in the second substrate as described above, the first circuit board and the second circuit board are provided. Can be arranged at the center of the second circuit board. That is, since the heat radiating member can be arranged directly below the electronic component as the heat radiating source, the heat radiating property is improved.
[0015] 当然、放熱性の観点から、上述した部材として、第 2の回路基板よりも熱伝導率が 大きレ、ものを用いることが好ましレ、。 [0015] Naturally, from the viewpoint of heat dissipation, it is preferable to use a member having a higher thermal conductivity than the second circuit board as the above-described member.
[0016] 自動車用途のような、高い信頼性を必要とする場合、第 1の基板と前記第 2の基板 とが重畳する空間にゲル状の絶縁物が充填することが好ましい。 [0016] When high reliability is required, such as in an automobile, it is preferable to fill a space where the first substrate and the second substrate overlap with each other with a gel-like insulator.
[0017] また、部材と第 1の回路基板の接着面の少なくとも一方、又は/及び、部材と筐体 の接着面のすくなくとも一方に、凹凸があることが好ましい。 [0017] It is preferable that at least one of the bonding surfaces of the member and the first circuit board and / or at least one of the bonding surfaces of the member and the housing have irregularities.
[0018] また、部材が、筐体の一部が成形された筐体の突起である場合には、接続に用い る接着層による熱伝導性の低下を防止できるので、放熱性の向上に寄与する。 Further, when the member is a projection of the housing in which a part of the housing is molded, it is possible to prevent a decrease in thermal conductivity due to an adhesive layer used for connection, thereby contributing to an improvement in heat dissipation. I do.
[0019] また、第 1の回路基板として、メタルコア基板を使う場合、裏面の一部で金属板を露 出させ、その部分と記筐体とを接着させるようにすることで、より放熱性を向上させるこ とができる。 In the case where a metal core substrate is used as the first circuit board, the metal plate is exposed at a part of the back surface and the part and the housing are bonded to each other, so that the heat radiation property is further improved. Can be improved.
なお、この出願は、 2003年 6月 16日付けで出願された日本国特許出願 2003-170 185号に基づくものであり、その開示内容が、全体として、参照により組み込まれる。 発明の効果  This application is based on Japanese Patent Application No. 2003-170185 filed on June 16, 2003, the disclosure of which is incorporated by reference in its entirety. The invention's effect
[0020] 本発明によれば、電子装置の放熱性を向上することができる。  According to the present invention, the heat dissipation of the electronic device can be improved.
図面の簡単な説明  BRIEF DESCRIPTION OF THE FIGURES
[0021] [図 1]図 1は、電子装置の断面図である。  FIG. 1 is a cross-sectional view of an electronic device.
[図 2]図 2は、 ECUモジュールの斜視図である。  FIG. 2 is a perspective view of an ECU module.
[図 3]図 3は、図 1の構造の製造プロセスを表す断面図である。  FIG. 3 is a cross-sectional view illustrating a manufacturing process of the structure in FIG. 1.
[図 4]図 4は、電子装置の断面図である。  FIG. 4 is a cross-sectional view of the electronic device.
[図 5]図 5は、電子装置の断面図である。  FIG. 5 is a cross-sectional view of the electronic device.
[図 6]図 6は、電子装置の断面図である。  FIG. 6 is a cross-sectional view of the electronic device.
[図 7]図 7は、製造プロセスを示す図である。  FIG. 7 is a diagram showing a manufacturing process.
[図 8]図 8は、電子装置の断面図である。  FIG. 8 is a cross-sectional view of the electronic device.
[図 9]図 9は、電子装置の断面図である。  FIG. 9 is a cross-sectional view of the electronic device.
符号の説明 [0022] 1…半導体装置、 3…ボンディングワイヤ、 5…樹脂接着剤、 7…モールド樹脂、 9· · · 電子部品、 11…インターポーザ基板、 13…回路層、 15…マザ一ボード、 17…回路 層、 19…はんだバンプ、 21…電子部品、 23…はんだ、 25…シリーコン接着斉 lj、 27 …アルミ筐体、 29…突起、 31…樹脂接着剤、 33…金属ブロック、 35…樹脂接着剤 、 37…メタルコア基板、 39…コアメタル (内層した金属板)、 41…半導体パッケージ、 43…貫通孔、 45…放熱用はんだボール Explanation of reference numerals [0022] 1 ... semiconductor device, 3 ... bonding wire, 5 ... resin adhesive, 7 ... mold resin, 9 ... electronic parts, 11 ... interposer board, 13 ... circuit layer, 15 ... mother board, 17 ... circuit Layer, 19: Solder bump, 21: Electronic component, 23: Solder, 25: Silicone adhesive lj, 27: Aluminum housing, 29: Projection, 31: Resin adhesive, 33: Metal block, 35: Resin adhesive, 37: Metal core board, 39: Core metal (inner metal plate), 41: Semiconductor package, 43: Through hole, 45: Solder ball for heat dissipation
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0023] 図 2に、電子装置の 1例である、エンジンコントロールユニット (ECU)モジュールの 蓋を外した斜視図を示す。  FIG. 2 shows a perspective view of an engine control unit (ECU) module, which is an example of the electronic device, with a lid removed.
[0024] ECUモジュールは、外部との信号の入出力を行うコネクタが形成されたアルミ筐体  [0024] The ECU module is an aluminum housing on which a connector for inputting and outputting signals to and from the outside is formed.
27(筐体 27の蓋は図示していない)と、コネクタと配線で電気的に接続され、アルミ筐 体 27上に搭載されたマザ一ボード (回路基板) 15と、マザ一ボード 15上に搭載された 半導体パッケージ 41と、筐体 27内部を満たすシリコーンゲル (不図示)と、を備えてい る。  27 (the lid of the housing 27 is not shown), a mother board (circuit board) 15 that is electrically connected to the connector and wiring, and is mounted on the aluminum housing 27, and on the mother board 15 A semiconductor package 41 is provided, and a silicone gel (not shown) filling the inside of the housing 27 is provided.
[0025] なお、シリコーンゲルはなくてもよレ、が、本例では信頼性向上の観点から充填して いる。  [0025] Note that the silicone gel may be omitted, but in this example, the silicone gel is filled from the viewpoint of improving reliability.
[0026] 図 1は、図 2の断面図である。  FIG. 1 is a cross-sectional view of FIG.
[0027] 半導体パッケージ 41は、樹脂層と回路層 13とを備えた回路基板 (インターポーザ基 板) 11と、このインターポーザ基板 11に接着剤 5でダイボンディングされ、ボンディン グワイヤ 3により回路層 13に電気的に接続されている電源 ICである半導体装置 1と、 この半導体装置 1、ボンディングワイヤ 3及び回路層とを封止するようにインターポー ザ基板 11上をモールドする樹脂 7を備えてレ、る。ダイボンディングに用いた接着剤 5 は、銀をフイラ一として樹脂に含有させた銀ペーストである。  The semiconductor package 41 includes a circuit board (interposer board) 11 having a resin layer and a circuit layer 13, and is die-bonded to the interposer board 11 with an adhesive 5, and is electrically connected to the circuit layer 13 by bonding wires 3. Device 1, which is a power supply IC, which is electrically connected, and a resin 7, which molds the interposer substrate 11 so as to seal the semiconductor device 1, the bonding wires 3, and the circuit layer. . The adhesive 5 used for die bonding is a silver paste containing silver as a filler in a resin.
[0028] マザ一ボード 15は、樹脂層と回路層 17とを備えた回路基板であり、はんだ 23で電 子部品 21が搭載され、 BGA (ボールグリッドアレイ)はんだ 19で半導体パッケージ 41 が搭載されている。  The mother board 15 is a circuit board including a resin layer and a circuit layer 17, on which electronic components 21 are mounted by solder 23, and a semiconductor package 41 is mounted by BGA (ball grid array) solder 19. ing.
[0029] また、マザ一ボード 15の、インターポーザ基板 11上の半導体装置 1が搭載された 領域と重畳する領域に貫通孔 43が形成されている。 [0030] 筐体 27は、突起 29を備え、この突起 29がマザ一ボード 15の貫通孔 43に嵌め込ま れており、その突起 29とインターポーザ基板 11が接着剤 31で固定されている。また 、突起 29以外の場所は接着剤 25でマザ一ボード 15に接着されている。なお、接着 剤 31には、シリコーンに銀のフィラーを含有させた樹脂接着剤 (銀ペースト) 31が用い られ、接着剤 25には、シリコーン接着剤 (銀ペースト)が用いられている。 Further, a through hole 43 is formed in a region of the mother board 15 that overlaps with a region on the interposer substrate 11 on which the semiconductor device 1 is mounted. The housing 27 has a projection 29, which is fitted in the through hole 43 of the motherboard 15, and the projection 29 and the interposer substrate 11 are fixed with an adhesive 31. In addition, portions other than the protrusion 29 are adhered to the motherboard 15 with an adhesive 25. As the adhesive 31, a resin adhesive (silver paste) 31 containing silicone containing a silver filler is used, and as the adhesive 25, a silicone adhesive (silver paste) is used.
[0031] このように、筐体 27の突起 29を、マザ一ボード 15の貫通孔 43を利用してインター ポーザ基板 11に接続することで、半導体装置 1の発する熱によりインターポーザ基 板 11にこもる熱を、高い熱導伝性の材料で形成された短かい放熱経路で、熱導伝 性の高い筐体へ逃がすことができる。このため、電子装置の放熱性を向上することが できている。  As described above, by connecting the projections 29 of the housing 27 to the interposer substrate 11 by using the through holes 43 of the motherboard 15, the heat generated by the semiconductor device 1 causes the interposer substrate 11 to be confined. Heat can be dissipated to the case with high heat conductivity through a short heat dissipation path formed of a material with high heat conductivity. For this reason, the heat dissipation of the electronic device can be improved.
[0032] なお、樹脂接着剤 31は、銀以外の金属又はアルミナ等の金属無機化合物といった 、樹脂よりも熱伝導率の高いフィラーを含有する樹脂ペーストや、回路基板の樹脂層 よりも熱伝導率の大きなはんだに変えることもできる。  [0032] The resin adhesive 31 is made of a resin paste containing a filler having a higher thermal conductivity than resin, such as a metal other than silver or a metal inorganic compound such as alumina, or a thermal conductivity higher than the resin layer of the circuit board. It can be changed to solder with a large size.
[0033] また、樹脂接着剤 31の樹脂は、接着性を確保することができれば、シリコーン以外 の材料を用いることもできる力 本例では、インターポーザ基板とマザ一ボードとの熱 膨張係数の差により生じる BGAはんだ接続部の熱疲労破壊、銀ペースト自体の破 壊及び界面剥離を抑制するために、 BGAはんだ接続部に用いたはんだ材料よりも ヤング率の小さいシリコーン系の樹脂ペーストを用いている。なお、シリコーン系の榭 脂のほかに、グリース、シートでも同様の効果を得ることができる。 [0033] In addition, the resin of the resin adhesive 31 can use a material other than silicone as long as the adhesive property can be secured. In this example, the difference in the thermal expansion coefficient between the interposer substrate and the mother board is used. In order to suppress the resulting thermal fatigue failure of the BGA solder joint, the destruction of the silver paste itself, and interface peeling, a silicone-based resin paste with a smaller Young's modulus than the solder material used for the BGA solder joint is used. The same effect can be obtained by using grease or sheet in addition to silicone resin.
[0034] 次に、図 1の ECUモジュールの製造プロセスを説明する。 Next, a manufacturing process of the ECU module of FIG. 1 will be described.
[0035] 図 3は、図 1の ECUモジュールの製造プロセスを示す図である。 FIG. 3 is a diagram showing a manufacturing process of the ECU module of FIG.
[0036] まず、半導体パッケージ 41の製造プロセスを説明する (図 3( )。 First, a manufacturing process of the semiconductor package 41 will be described (FIG. 3 ()).
[0037] インターポーザ基板 11の表面に、 5mm角の半導体装置 1を、フェースアップに配 置してはんだ又は銀ペースト 5でダイボンディングする。ダイボンディング後、ボンディ ングワイヤ 3で、半導体装置 1の端子とインターポーザ基板 11のパッドとを電気的に 接続する。次に、電子部品 9を搭載する。なお、この接続方式は電子部品の種類に 応じて適宜選択する。 A 5 mm square semiconductor device 1 is placed face-up on the surface of the interposer substrate 11 and die-bonded with solder or silver paste 5. After die bonding, the terminals of the semiconductor device 1 and the pads of the interposer substrate 11 are electrically connected by the bonding wires 3. Next, the electronic components 9 are mounted. Note that this connection method is appropriately selected according to the type of electronic component.
[0038] 次に、取り扱い性や信頼性を高めるために、樹脂 7でモールドする。次に、パッケ一 ジ基板 11の裏面に、はんだ BGA接続用のパッドを形成する。なお、 . は、直径 0. 6mm、ピッチ 1. 27mmで、ニッケルめっき、さらには金めつきを施すこと で形成した。また、これらのパッドは、半導体装置 1を搭載した位置の裏面の、半導体 装置 1の大きさより若干大きい領域 Aを除いた領域 Bに形成した。ノ ノドを形成すると 同時に、その除いた領域 Aに 5mm角程度の金属層を形成しておく。 BGA接続用パ ッドには、直径 0. 76mmの Sn3Ag0.5Cuはんだボーノレ 19を搭載、リフローし、はん だバンプを形成した。ァノレミ筐体 27には、 5mm角、高さ 2. Ommの突起部 29を、フ ライスによる機械加工で形成した。 Next, in order to enhance the handleability and reliability, the resin 7 is molded. Next, the package On the back surface of the substrate 11, pads for solder BGA connection are formed. Was formed by nickel plating and further gold plating with a diameter of 0.6 mm and a pitch of 1.27 mm. These pads were formed in a region B on the back surface of the position where the semiconductor device 1 was mounted, excluding a region A slightly larger than the size of the semiconductor device 1. At the same time as the formation of the nodes, a metal layer of about 5 mm square is formed in the area A excluding the nodes. The BGA connection pad was equipped with a 0.76 mm diameter Sn3Ag0.5Cu solder bonole 19 and reflowed to form solder bumps. A 5 mm square, 2. Omm high projection 29 was formed on the Anoremi housing 27 by rice milling.
[0039] 次に、マザ一ボード 15の製造プロセスを説明する。  Next, a manufacturing process of the motherboard 15 will be described.
[0040] 樹脂基板 (プリント基板、厚さ: 1. 5mm)を用意し、この基板の、所望の位置に、ル 一ター加工により貫通孔 43を形成してお 図 3(b》。 [0040] A resin substrate (printed substrate, thickness: 1.5 mm) was prepared, and through holes 43 were formed at desired positions on the substrate by router processing, as shown in Fig. 3 (b).
[0041] 次に、マザ一ボード 15と半導体パッケージ 41との接合について説明する。  Next, the joining between the motherboard 15 and the semiconductor package 41 will be described.
[0042] マザ一ボード 15上の所定の位置に、半導体パッケージ 41と電子部品 21を位置合 わせして搭載し、 240°Cで、 5分ほどはんだを溶融し、リフロー接続する (図 3(c))。な お、貫通孔のサイズは、 7mm角とした。マザ一ボード 15の貫通孔 43には、アルミの 突起 29が配されることになるので、開口部をアルミ突出部 29のサイズより大きくするこ とにより、基板の、筐体 27に対する位置合わせ精度の条件を緩和すると共に、パッケ ージ 41とアルミ突起部 29を接着する接着剤 31の余剰分を貯めるスペースの形成に 有効である。 [0042] The semiconductor package 41 and the electronic component 21 are mounted in a predetermined position on the motherboard 15 in alignment with each other. At 240 ° C, the solder is melted for about 5 minutes, and reflow connection is performed (Fig. 3 ( c)). The size of the through hole was 7 mm square. Since the aluminum projection 29 is provided in the through hole 43 of the mother board 15, by making the opening larger than the size of the aluminum projection 29, the positioning accuracy of the board with respect to the housing 27 is improved. This is effective in alleviating the conditions described above and forming a space for storing an excess of the adhesive 31 for bonding the package 41 and the aluminum projection 29.
[0043] 次に、インターポーザ基板 11を搭載したマザ一ボード 15をアルミ筐体 27に接着す るプロセスについて説明する。  Next, a process of bonding the motherboard 15 on which the interposer substrate 11 is mounted to the aluminum housing 27 will be described.
[0044] 突起部 29付きのアルミ筐体 27の基板搭載部分に、シリコーン接着剤 25を塗布す るとともに、突起部 29には、熱伝導率が高くてヤング率の小さいシリコーンを主成分と し、銀フイラ一を含有する銀ペースト 31を塗布する (図 3(d))。部品を搭載した、貫通孔 43あきのマザ一ボード (図 3(c))をアルミ筐体 27上に搭載し、 150°C、 1時間、接着剤 を硬化させる。マザ一ボード 15の穴 43からは、先のアルミ筐体 27に形成した突出部 29が、基板 15の表面より、 0. 5mmほど突き出ることになる。パッケージ 41と基板 15 を電気的に接続するはんだボール高さがおよそ 0. 4mm程度、基板 15の厚さが 1. 6 mm、シリコーン接着剤 25の厚さが 0· 1mm程度なので、トータノレ 2. 1mm程度とな る。銀ペースト 31の厚さを 0. 1mm程度とすればよい。 [0044] A silicone adhesive 25 is applied to the substrate mounting portion of the aluminum housing 27 with the protrusions 29, and the protrusions 29 are mainly made of silicone having a high thermal conductivity and a small Young's modulus. Then, a silver paste 31 containing a silver filler is applied (FIG. 3D). A mother board (Fig. 3 (c)) with through-holes 43 with components mounted thereon is mounted on an aluminum housing 27, and the adhesive is cured at 150 ° C for 1 hour. From the hole 43 of the motherboard 15, the protruding portion 29 formed on the aluminum housing 27 protrudes from the surface of the substrate 15 by about 0.5 mm. The height of the solder ball that electrically connects the package 41 and the board 15 is about 0.4 mm, and the thickness of the board 15 is 1.6 mm, the thickness of the silicone adhesive 25 is about 0.1 mm, so the total thickness is about 2.1 mm. The thickness of the silver paste 31 may be about 0.1 mm.
[0045] 以上の本態様の構造は、次の特徴を備えているといえる。 It can be said that the structure of the above embodiment has the following features.
[0046] まず、電子装置は、筐体と、筐体に接着されている電子基板とを備え、該電子基板 は、電子部品が搭載されているインターポーザ基板と、該インターポーザ基板と電気 的に接続されているとともに、該筐体に固定されている第マザ一ボードとを有する。こ の電子装置において、インターポーザ基板が、マザ一ボードと重畳しない空間で該 筐体に固定された構造となっている。  First, the electronic device includes a housing and an electronic substrate adhered to the housing. The electronic substrate is connected to an interposer substrate on which electronic components are mounted, and is electrically connected to the interposer substrate. And a first motherboard fixed to the housing. In this electronic device, the interposer substrate is fixed to the housing in a space that does not overlap with the motherboard.
[0047] このような構造は、インターポーザ基板とマザ一ボードの熱膨張係数の差による影 響を受けないので、より強い固定を得ることができる。マザ一ボードを介在させないこ とで、固定方式に制約がなくなり、接着面積を大きくできる。従って、接着面積の増加 により、落下等の強い衝撃が掛かったときでも、インターポーザ基板とマザ一ボードと の間の断線を抑制できるという効果がある。また、マザ一ボードを介在させずに放熱 できるので、直接筐体へ通じる大きな放熱経路を形成することもできる。  [0047] Such a structure is not affected by the difference in the thermal expansion coefficient between the interposer substrate and the mother board, so that a stronger fixing can be obtained. By not interposing a mother board, there is no restriction on the fixing method, and the bonding area can be increased. Accordingly, even when a strong impact such as a drop is applied due to an increase in the bonding area, there is an effect that disconnection between the interposer substrate and the mother board can be suppressed. In addition, since heat can be dissipated without the intervention of a motherboard, a large heat dissipation path directly leading to the housing can be formed.
[0048] また、インターポーザ基板は、マザ一ボードとは別に成形された部材を介して筐体 に固定しておくようにすることが好ましい。  [0048] It is preferable that the interposer substrate is fixed to the housing via a member molded separately from the motherboard.
[0049] メツキ等で形成できる形状 (面積や厚み)には限界があるが、別部品として予め成形 しておけば、面積や厚みの限界をあまり気にしなくてもよくなり、低コストで大きな面積 の固定ができるようになる。また、力かる部材として、熱伝導係数の大きな部材を用い ることで、大きな断面積を持つ放熱経路を確保することができるようになる。  [0049] There is a limit to the shape (area and thickness) that can be formed by plating and the like, but if it is molded in advance as a separate part, it is not necessary to worry too much about the limit of the area and thickness, and low cost and large The area can be fixed. In addition, by using a member having a large heat conduction coefficient as a force member, a heat radiation path having a large cross-sectional area can be secured.
[0050] また、マザ一ボードには貫通孔が形成されており、インターポーザ基板と該筐体と の間であって該貫通孔と重畳する空間に、該マザ一ボードとは別に成形された部材 を備えるようにすることが好ましい。  [0050] Further, a through hole is formed in the mother board, and a member formed separately from the mother board is provided in a space between the interposer substrate and the housing and overlapping with the through hole. It is preferable to provide
[0051] このように、貫通孔をマザ一ボードに設けることで、インターポーザ基板とマザーボ ードとの非重畳空間をマザ一ボードの中央に配置できるようになる。つまり、放熱源で ある電子部品の直下に放熱部材を配置できるようになるので、筐体までの経路の断 面積を大きくでき、放熱性が向上する。  As described above, by providing the through holes in the mother board, a non-overlapping space between the interposer substrate and the mother board can be arranged at the center of the mother board. That is, since the heat radiating member can be arranged directly below the electronic component as the heat radiating source, the cross-sectional area of the path to the housing can be increased, and the heat radiating property is improved.
[0052] 当然、放熱性の観点から、上述した部材として、マザ一ボードの樹脂層よりも熱伝 導率が大きいものを用いることが好ましい。 [0052] Naturally, from the viewpoint of heat dissipation, the above-described members are more thermally conductive than the resin layer of the motherboard. It is preferable to use one having a large conductivity.
[0053] 車載用電子装置では、インターポーザ基板とマザ一ボードとが重畳する空間にゲ ル状の絶縁物が充填されてレ、るので、上記構造は特に効果がある。  In the in-vehicle electronic device, the space in which the interposer substrate and the mother board overlap is filled with a gel-like insulator, so that the above structure is particularly effective.
[0054] また、部材が筐体の一部が成形された筐体の突起であるので、接続に用いる接着 層による熱伝導性の低下を防止できるので、放熱性の向上に寄与している。  Further, since the member is a projection of the housing in which a part of the housing is formed, a decrease in thermal conductivity due to an adhesive layer used for connection can be prevented, thereby contributing to an improvement in heat dissipation.
[0055] 次に、図 1と異なる他の構造について説明する。  Next, another structure different from FIG. 1 will be described.
[0056] 図 4は、図 1とは異なる ECUモジュールの断面図である。  FIG. 4 is a cross-sectional view of an ECU module different from FIG.
[0057] アルミ筐体 27の内面側はほとんど平板の状態とする。別途成形したアルミの金属ブ ロック 33を、アルミ筐体 27に、金属フィラーを含有したシリコーン接着剤 35を用いて 接着する。  [0057] The inner surface side of aluminum casing 27 is almost flat. A separately molded aluminum metal block 33 is bonded to the aluminum housing 27 using a silicone adhesive 35 containing a metal filler.
[0058] 本実施例によれば、固定強度を向上させたり、放熱性を向上させることができるだ けでなく、基板の、筐体 27に対する位置合わせ精度の制限を緩和することができる。 接着剤 31は、熱伝導率の大きい銀やその他の金属あるいはアルミナ等の金属無機 化合物の粉体を含有する樹脂ペーストや、さらに熱伝導率の高いはんだであることが 、放熱特性上望ましい。  According to the present embodiment, not only the fixing strength can be improved and the heat radiation property can be improved, but also the restriction on the positioning accuracy of the substrate with respect to the housing 27 can be eased. The adhesive 31 is preferably a resin paste containing a powder of silver or other metal having a high thermal conductivity or a metal inorganic compound such as alumina, or a solder having a higher thermal conductivity in terms of heat radiation characteristics.
[0059] また、接着剤 31として、ヤング率の小さいシリコーン系の樹脂ペーストやグリース、 シートを用いることにより、 BGAはんだ接続部におよぼす熱疲労破壊を緩和し、また 銀ペースト自体の破壊や界面剥離を緩和できるので、接続信頼性上望ましレ、。  [0059] Also, by using a silicone-based resin paste, grease, or sheet having a small Young's modulus as the adhesive 31, thermal fatigue destruction to the BGA solder connection part is reduced, and destruction of the silver paste itself and interface peeling are also performed. So that connection reliability can be reduced.
[0060] 図 5は、図 1に示した実施例に対して、次の点で異なる実施例である。  FIG. 5 is an embodiment different from the embodiment shown in FIG. 1 in the following points.
[0061] パッケージを構成する基板がメタルコア基板 37である。このメタルコア基板 37の表 裏の絶縁樹脂が一部除去され、コアメタル 39が露出した部分に高発熱なチップ 1が フェースアップで銀ペースト 5で接着され、ワイヤボンディング 3で、チップ 1とパッケ一 ジ基板 (インタポーザ基板)上のボンディングパッドとが電気的に接続する。他の部品 も必要に応じてパッケージ基板上に搭載し、樹脂 7でモールドすることにより、取り扱 い性を向上できる。パッケージ裏面のコアメタル露出部分に対して、アルミ筐体 27の 突出部 33を、シリコーン系の銀ペースト 31で接着する。本実施例によれば、高発熱 チップから熱容量の大きいアルミニウム筐体 27までの間を、熱伝導率の低い回路基 板の絶縁樹脂層なしで接続できるため、放熱性を極めて高めることができる。また、 接着部 31及び 35の少なくとも一方を、非導電フィラー入りの接着剤もしくはフィラー なしの接着剤とすることにより、コアメタル 39とアルミ筐体 27との絶縁性を保つことも 可能である。 The substrate constituting the package is a metal core substrate 37. The insulating resin on the front and back of the metal core substrate 37 is partially removed, and the high-heat-generating chip 1 is bonded face-up with silver paste 5 to the exposed part of the core metal 39, and packaged with chip 1 by wire bonding 3 The bonding pads on the board (interposer board) are electrically connected. Other parts can also be mounted on the package substrate as needed and molded with resin 7 to improve handling. The protruding portion 33 of the aluminum housing 27 is adhered to the exposed portion of the core metal on the back surface of the package with a silicone-based silver paste 31. According to the present embodiment, since the connection from the high heat generating chip to the aluminum housing 27 having a large heat capacity can be connected without the insulating resin layer of the circuit board having low thermal conductivity, the heat radiation can be extremely enhanced. Also, By making at least one of the adhesive portions 31 and 35 an adhesive containing a non-conductive filler or an adhesive without a filler, it is also possible to maintain the insulation between the core metal 39 and the aluminum housing 27.
[0062] 図 6は、前述の実施例に対して、コアメタル 39とアルミ突出部 33の接続を、はんだ ボール 45で行っている点で異なる。放熱部分をはんだボール接続とすることにより、 製造プロセスを簡易化することができる。放熱に寄与する接続総面積は減少するが、 はんだ自体の熱伝導率は銀ペーストのそれより 10倍程度大きいため、前述の実施例 より放熱性を下げないことは可能である。はんだボールの代わりに、前述の実施例に おける銀ペースト接続部分全体をはんだで接続すれば、さらに放熱性は向上する。  FIG. 6 is different from the above-described embodiment in that the connection between the core metal 39 and the aluminum protrusion 33 is performed by the solder ball 45. The manufacturing process can be simplified by connecting the heat radiating part with solder balls. Although the total connection area that contributes to heat dissipation is reduced, the thermal conductivity of the solder itself is about 10 times greater than that of silver paste, so it is possible to keep the heat dissipation lower than in the previous embodiment. If the entire silver paste connection portion in the above-mentioned embodiment is connected by solder instead of the solder ball, the heat dissipation can be further improved.
[0063] 図 6に示した実施例を実現するための製造プロセスを、図 7に簡単に示し、以下に 説明する。  A manufacturing process for realizing the embodiment shown in FIG. 6 is briefly shown in FIG. 7, and will be described below.
[0064] まず、ノ ノケージ部分の製造方法を示す (図 7(c)上)。パッケージ基板としては、メタ ルコア基板 37を使用する。メタルコア基板 37の製造は、公知の方法で行う。ただし、 メタルコア基板 37の絶縁樹脂部分を除去する必要があり、これを炭酸レーザー加工 で行う。デスミア処理後、コアメタル 39の表面に、およそ 5mm角の高発熱な電子部 品 1を、フェースアップで、はんだや銀ペースト 5でダイボンディングする。電気的接続 は、ワイヤボンディング 3で行う。さらに取り扱い性や信頼性を高めるために、樹脂 7で モールドする。パッケージ基板裏面には、はんだ BGA接続用のパッドを形成する。こ れらのパッドは、例えば直径 0· 6mm、ピッチ 1 · 27mmで、ニッケルめっき、さらには 金めつきを施すことにより形成される。この BGA用パッドを基板 37の裏面全体には形 成せず、一部、放熱用の 5mm角の領域を残す。以上のプロセスは、図 5に記載の実 施例に対しても有効である。この放熱用の領域に、直径 0. 6mm、 1. 27mmピッチ の絶縁樹脂除去部 (ざぐり部) 46を形成する。このざぐり部 46は、チップ搭載部と同様 の方法すなわちレーザー加工により、形成される。このざぐり部の直径を、他の BGA パッドとほぼ同サイズにすると、供給はんだボールサイズを同じとすることができるの で、プロセス管理が容易になる。また、ざぐり部 46のピッチを小さくして数を増やす、 もしくはざぐり部 46の面積を大きくすることにより、放熱性を向上できる。 BGA接続用 パッドおよび放熱用ざぐり部 46に、それぞれ直径 0. 76mmの Sn3Ag0.5Cuはんだ ボール 19および 45を搭載、リフローし、はんだを形成しておく。 First, a method of manufacturing the nocage part will be described (FIG. 7 (c) top). A metal core substrate 37 is used as a package substrate. The metal core substrate 37 is manufactured by a known method. However, it is necessary to remove the insulating resin portion of the metal core substrate 37, and this is performed by carbon dioxide laser processing. After the desmear treatment, a high heat-generating electronic component 1 of approximately 5 mm square is die-bonded to the surface of the core metal 39 face-up with solder or silver paste 5. Electrical connection is made by wire bonding 3. Mold with resin 7 to further improve handling and reliability. Pads for solder BGA connection are formed on the back of the package substrate. These pads have a diameter of 0.6 mm and a pitch of 127 mm, for example, and are formed by nickel plating and further gold plating. The BGA pad is not formed on the entire back surface of the substrate 37, and a part of a 5 mm square area for heat radiation is left. The above process is also effective for the embodiment shown in FIG. An insulating resin removing portion (borebore portion) 46 having a diameter of 0.6 mm and a pitch of 1.27 mm is formed in the heat radiation area. The counterbore portion 46 is formed by the same method as that of the chip mounting portion, that is, laser processing. Making the counterbore diameter about the same size as the other BGA pads allows the same solder ball size to be supplied, thus facilitating process control. Further, the heat radiation can be improved by reducing the pitch of the counterbore 46 to increase the number thereof or by increasing the area of the counterbore 46. Solder 0.76mm diameter Sn3Ag0.5Cu solder to BGA connection pad and heat sink Mount balls 19 and 45 and reflow to form solder.
[0065] 図 7(b)に示すように、 ECUアルミ筐体 27には、 5mm角、高さ 1 · 7mmの突起部 33 を所望の位置に形成しておく。この突起部 33は、前述の実施例のような方法にて形 成される。図 7(c)に示すように、突起部 33上には、パッケージ裏面の放熱用はんだ パターンに合うように、はんだ接続用のメタライズ 38、すなわち厚さ 5ミクロンのニッケ ノレさらには 0. 5ミクロンの金めつきを形成する。これらのメタライズ 38は、はんだと反 応すれば何でも良ぐ形成方法もスパッタ等、何でも良い。  As shown in FIG. 7 (b), a protrusion 33 having a 5 mm square and a height of 1.7 mm is formed at a desired position on the ECU aluminum housing 27. This projection 33 is formed by the method as in the above-described embodiment. As shown in Fig. 7 (c), on the protrusion 33, a metallization 38 for solder connection, that is, a nickel metal with a thickness of 5 microns, and even a 0.5 micron To form a gold plating. These metallizations 38 may be formed by any method as long as they react with the solder.
[0066] 基板 15は公知の技術による樹脂基板 (プリント基板、厚さ: 1. 5mm)とし、図 7(a)に 示すように、この基板 15の所望の位置にルーター加工により穴 43を形成しておく。 穴 43のサイズは、 6mm角とする。アルミ突出部 33のサイズより大きくすることにより、 基板 15の、筐体 27に対する位置合わせ精度の制約を緩和できる。  The board 15 is a resin board (printed board, thickness: 1.5 mm) by a known technique, and a hole 43 is formed at a desired position on the board 15 by a router process as shown in FIG. 7 (a). Keep it. The size of the hole 43 is 6 mm square. By making the size larger than the size of the aluminum protrusion 33, the restriction on the positioning accuracy of the substrate 15 with respect to the housing 27 can be relaxed.
[0067] 本実施例では、突起部付きのアルミ筐体 27の基板搭載部分にシリコーン接着剤 2 5を塗布して、この穴あきの基板 15を搭載し、 150°C、 1時間硬化させる。基板 15の 穴 43からは、先のアルミ筐体 27に形成した突出部 33が、基板 15の表面より、 0. 2m mほど突き出ることになる。  In the present embodiment, a silicone adhesive 25 is applied to the substrate mounting portion of the aluminum housing 27 having the projections, and the perforated substrate 15 is mounted and cured at 150 ° C. for one hour. From the hole 43 of the substrate 15, the protruding portion 33 formed on the aluminum housing 27 protrudes from the surface of the substrate 15 by about 0.2 mm.
[0068] 基板 15上の所定の位置に、先のパッケージやその他電子部品 21を位置合わせし て搭載し、 240°Cで 5分ほどはんだを溶融し、すべてのはんだ接続部を同時にリフロ 一接続する。  [0068] The package and other electronic components 21 are aligned and mounted at predetermined positions on the substrate 15, and the solder is melted at 240 ° C for about 5 minutes, and all solder joints are simultaneously reflow-connected. I do.
[0069] 放熱のための金属突起部 33および基板開口部は、上記実施例では搭載チップと ほぼ同サイズとした力 チップサイズより大きくすれば、放熱性をさらに向上できる。ま た、金属突起部 33および基板開口部 43がチップサイズより小さいと、基板 15の配線 可能な領域が増え、基板 15のサイズを小さくすることができる。また、放熱部は、その 水平断面形状が必ずしも正方形や長方形である必要はなぐ円形や、角が丸みを帯 びた形状であれば、位置合わせ性に重要な役割を果たす、溶融はんだまたは硬化 前の樹脂の表面張力によるセルファライメント機能をより効果的に発揮させることがで き、また応力集中を避けることによる信頼性向上が可能となる。  [0069] If the metal projections 33 for heat dissipation and the substrate opening are made larger than the size of the mounted chip in the above embodiment, the heat dissipation can be further improved. Further, if the metal projection 33 and the substrate opening 43 are smaller than the chip size, the area where the substrate 15 can be wired increases, and the size of the substrate 15 can be reduced. In addition, if the heat radiating section has a circular cross section that does not necessarily have to be a square or rectangular horizontal section, or if the corner has a rounded shape, molten solder or pre-curing plays an important role in alignment. The self-alignment function due to the surface tension of the resin can be more effectively exerted, and reliability can be improved by avoiding stress concentration.
[0070] 図 8に、他の電子装置の構造を示す。  FIG. 8 shows the structure of another electronic device.
[0071] 図 1の電子装置と異なるのは、突起 29の最上面に、微小な溝又は突起 100を設け ている点である。 The difference from the electronic device of FIG. 1 is that a minute groove or projection 100 is provided on the top surface of the projection 29. That is the point.
[0072] 図 1の構造では、樹脂接着剤又ははんだで構成された接着剤 31が突起 29とインタ 一ポーザ基板 11との間に介在することにより、微小な間隔がその接続面に生じるが、 図 8に示すように、微小突起 100を設けることにより、溝で接着力を確保しつつ、突起 100をインターポーザ基板 11に押し付けることで、これらの間隔を縮めることができる ので、放熱性を向上することができる。  In the structure shown in FIG. 1, a minute gap is generated on the connection surface of the interposer substrate 11 due to the interposition of the adhesive 31 made of a resin adhesive or solder between the projection 29 and the interposer substrate 11. As shown in FIG. 8, by providing the minute projections 100, the gap can be reduced by pressing the projections 100 against the interposer substrate 11 while securing the adhesive force in the grooves, thereby improving heat dissipation. be able to.
[0073] 図 9に、他の電子装置の構造を示す。  FIG. 9 shows the structure of another electronic device.
[0074] 図 4の電子装置と異なるのは、金属ブロック 33'の上面と下面に、微小な溝又は突 起 101,102を設けている点である。  A difference from the electronic device of FIG. 4 is that minute grooves or protrusions 101 and 102 are provided on the upper surface and the lower surface of the metal block 33 ′.
[0075] 図 4の構造では、樹脂接着剤又ははんだで構成された接着剤 31,35が、金属プロ ック 33と筐体 27との間及び金属ブロック 33とインターポーザ基板 11との間に介在す ることにより、微小な間隔がその接続面に生じる。しかし、図 9に示すように、金属プロ ック 33'の上面と下面とに微小突起 101, 102を設けることにより、溝で接着力を確保 しつつ、突起 101, 102をインターポーザ基板 11に押し付けることで、これらの間隔を 縮めることができるので、放熱性を向上することができる。  In the structure shown in FIG. 4, adhesives 31 and 35 made of a resin adhesive or solder are interposed between metal block 33 and housing 27 and between metal block 33 and interposer substrate 11. By doing so, a minute gap is created at the connection surface. However, as shown in FIG. 9, the protrusions 101 and 102 are pressed against the interposer substrate 11 while securing the adhesive force by the grooves by providing the minute protrusions 101 and 102 on the upper surface and the lower surface of the metal block 33 ′. By doing so, these intervals can be reduced, so that heat dissipation can be improved.
[0076] この突起と溝により形成された凹凸のある金属ブロック 33'を、図 5、 6の金属ブロッ ク 33に適用すると同様の効果がある。ただし、図 6の構造の金属ブロック 33の上面は はんだバンプとの接続であり、凹凸は無いほうが好ましレ、。  When the metal block 33 ′ having irregularities formed by the projections and the grooves is applied to the metal block 33 shown in FIGS. However, the upper surface of the metal block 33 having the structure shown in FIG. 6 is connected to solder bumps, and it is preferable that there is no unevenness.
[0077] なお、接着力を確保するための溝または突起は、突起部 29及びインタポーザ基板 11の接着面の少なくとも一方、金属ブロック 33'及びインタポーザ基板 11の接着面 の少なくとも一方、金属ブロック 33'及び筐体 27の接着面の少なくとも一方に形成さ れていればよい。  The groove or the protrusion for securing the adhesive force is at least one of the protrusion 29 and the bonding surface of the interposer substrate 11, at least one of the metal block 33 ′ and the bonding surface of the interposer substrate 11, and the metal block 33 ′. And at least one of the bonding surfaces of the housing 27.
産業上の利用可能性  Industrial applicability
[0078] エンジンコントロールユニットに代表される高放熱構造が必要な電子装置に適用可 能である。 [0078] The present invention is applicable to an electronic device that requires a high heat radiation structure typified by an engine control unit.

Claims

請求の範囲 The scope of the claims
[1] 筐体と、前記筐体に接着されている電子基板と、を備え、  [1] a housing, and an electronic board adhered to the housing,
該電子基板は、  The electronic substrate is
前記電子部品が搭載されている第 1の回路基板と、  A first circuit board on which the electronic component is mounted,
該第 1の回路基板と電気的に接続されているとともに、該筐体に固定されている第 2の回路基板とを有する電子装置において、  An electronic device having a second circuit board electrically connected to the first circuit board and fixed to the housing,
該第 1の回路基板が、該第 2の回路基板と重畳しない空間で該筐体に固定されて いることを特徴とする電子装置。  The electronic device, wherein the first circuit board is fixed to the housing in a space that does not overlap with the second circuit board.
[2] 請求項 1記載の電子装置において、 [2] The electronic device according to claim 1,
該第 1の回路基板は、該第 2の回路基板とは別に成形された部材を介して該筐体 に固定されていることを特徴とする電子装置。  The electronic device, wherein the first circuit board is fixed to the housing via a member formed separately from the second circuit board.
[3] 請求項 1又は 2記載の電子装置において、 [3] The electronic device according to claim 1 or 2,
該第 2の回路基板には貫通孔が形成され、  A through-hole is formed in the second circuit board,
当該電子装置は、  The electronic device is
該第 1の回路基板と該筐体との間であって該貫通孔と重畳する空間に、該第 2の回 路基板とは別に成形された部材を備えることを特徴とする電子装置。  An electronic device comprising a member formed separately from the second circuit board in a space between the first circuit board and the housing and overlapping the through hole.
[4] 請求項 1から 3のいずれ力、 1項に記載の電子装置において、 [4] The electronic device according to any one of claims 1 to 3,
前記部材は、前記第 2の回路基板よりも熱伝導率が大きいことを特徴とする電子装 置。  The electronic device, wherein the member has a higher thermal conductivity than the second circuit board.
[5] 請求項 1から 4のいずれ力、 1項に記載の電子装置において、  [5] The electronic device according to any one of claims 1 to 4, wherein
前記第 1の基板と前記第 2の基板とが重畳する空間にゲル状の絶縁物が充填され ていることを特徴とする電子装置。  An electronic device, wherein a space in which the first substrate and the second substrate overlap with each other is filled with a gel-like insulator.
[6] 請求項 2から 5のいずれ力、 1項に記載の電子装置において、 [6] The electronic device according to any one of claims 2 to 5, wherein
前記部材と前記筐体とが、はんだ、又は、樹脂に該樹脂よりも熱伝導率の大きいフ イラ一が含有された樹脂接着剤により接着されている構造、及び、  A structure in which the member and the housing are bonded to each other with a solder or a resin adhesive containing a resin having a higher thermal conductivity than the resin, and
前記部材と前記第 1の回路基板とが、はんだ、又は、樹脂に該樹脂よりも熱導伝率 の大きなフィラーが含有された樹脂接着剤により接着されている構造、  A structure in which the member and the first circuit board are bonded to each other with a solder or a resin adhesive containing a filler having a higher thermal conductivity than the resin;
、の少なくとも一方の構造を有することを特徴とする電子装置。 An electronic device having at least one of the above structures.
[7] 請求項 2から 6のいずれか 1項に記載の電子装置において、 [7] The electronic device according to any one of claims 2 to 6,
前記部材と前記第 1の回路基板の接着面の少なくとも一方、又は、前記部材と前記 筐体の接着面のすくなくとも一方に、凹凸があることを特徴とする電子装置。  An electronic device, wherein at least one of an adhesive surface of the member and the first circuit board or at least one of an adhesive surface of the member and the housing has irregularities.
[8] 請求項 2から 5のいずれ力、 1項に記載の電子装置において、 [8] The electronic device according to any one of claims 2 to 5, wherein
前記部材は、前記筐体の一部が成形された、当該筐体の突起であることを特徴と する電子装置。  The electronic device according to claim 1, wherein the member is a protrusion of the housing in which a part of the housing is formed.
[9] 請求項 8において、 [9] In claim 8,
前記部材と前記第 1の回路基板とが、はんだ、又は、樹脂に該樹脂よりも熱伝導率 の大きなフィラーが含有された接着剤により接着されていることを特徴とする電子装 置。  An electronic device, wherein the member and the first circuit board are bonded by solder or an adhesive containing a resin and a filler having a higher thermal conductivity than the resin.
[10] 請求項 8又は 9記載の電子装置において、  [10] The electronic device according to claim 8 or 9,
前記部材と前記第 1の回路基板の接着面の少なくとも一方に、凹凸があることを特 徴とする電子装置。  An electronic device, characterized in that at least one of the bonding surfaces of the member and the first circuit board has irregularities.
[11] 請求項 2記載の電子装置において、 [11] The electronic device according to claim 2,
前記第 1の回路基板は、金属板の両面に樹脂層及び回路層が形成されているメタ ルコア基板であり、その裏面の一部で該金属板が露出しており、その露出している部 分と前記筐体が、前記部材を介して接続されてレ、ることを特徴とする電子装置。  The first circuit board is a metal core board in which a resin layer and a circuit layer are formed on both sides of a metal plate, and the metal plate is exposed on a part of the back surface, and the exposed portion is provided. An electronic device, wherein the housing and the housing are connected via the member.
[12] 請求項 11記載の電子装置において、 [12] The electronic device according to claim 11,
前記金属板は、前記部材との接続面に凹凸を有することを特徴とする電子装置。  An electronic device, wherein the metal plate has irregularities on a connection surface with the member.
[13] 請求項 3記載の電子装置において、 [13] The electronic device according to claim 3,
前記部材と前記貫通孔の側壁との間に間隔があることを特徴とする電子装置。  An electronic device, wherein there is a gap between the member and a side wall of the through hole.
[14] 請求項 2記載の電子装置において、 [14] The electronic device according to claim 2,
前記第 2の回路基板の表面の回路と前記第 1の回路基板の裏面の回路との接続に 用いたはんだのヤング率よりも、前記部材と前記第 1の回路基板との間の接着に用 レ、た接着剤のヤング率の方が小さいことを特徴とする電子装置。  The bonding strength between the member and the first circuit board is smaller than the Young's modulus of the solder used for connecting the circuit on the front side of the second circuit board and the circuit on the back side of the first circuit board. An electronic device, wherein the adhesive has a smaller Young's modulus.
[15] 請求項 11記載の電子装置において、 [15] The electronic device according to claim 11,
前記第 1の回路基板は、その表面に前記金属板が露出している領域を有し、その 領域の金属板上に前記電子部品がダイボンディングされ、ワイヤボンディングで前記 第 1の回路基板回路層と前記電子部品の端子が接合されていることを特徴とする電 The first circuit board has a region on the surface where the metal plate is exposed, the electronic component is die-bonded on the metal plate in that region, and the first component is bonded by wire bonding. A first circuit board circuit layer and a terminal of the electronic component are joined to each other;
[16] 請求項 2記載の電子装置において、 [16] The electronic device according to claim 2,
前記部材と前記第 1の回路基板との間が、シリコーンにフィラーを含有させた接着 剤で固定されていることを特徴とする電子装置。  An electronic device, wherein a space between the member and the first circuit board is fixed with an adhesive containing a filler in silicone.
[17] 請求項 2記載の電子装置において、  [17] The electronic device according to claim 2,
前記第 2の回路基板と前記第 1の回路基板との間が、 Snと Agを含む鉛フリーはん だで接続されてレ、ることを特徴とする電子装置。  An electronic device, wherein the second circuit board and the first circuit board are connected by a lead-free solder containing Sn and Ag.
[18] 筐体と、筐体に接着されている電子基板とを備え、  [18] a housing, and an electronic board adhered to the housing,
該電子基板は、  The electronic substrate is
電子部品が搭載されている第 1の回路基板と、  A first circuit board on which electronic components are mounted;
該第 1の回路基板と電気的に接続されているとともに、該筐体に固定されている第 2の回路基板とを有する電子装置において、  An electronic device having a second circuit board electrically connected to the first circuit board and fixed to the housing,
該第 1の回路基板が前記第 2の回路基板を介さずに前記筐体に固定されているこ とを特徴とする電子装置。  An electronic device, wherein the first circuit board is fixed to the housing without interposing the second circuit board.
PCT/JP2004/008458 2003-06-16 2004-06-16 Electronic device WO2004112129A1 (en)

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